Invalid module identification method for smart meter integrated circuit

Abstract

The application discloses a kind of invalid module identification method of smart meter integrated circuit, obtains the netlist file of smart meter integrated circuit, bypass device is obtained first by direct analysis method, then device and network node are used to model analog circuit to obtain device-node matrix, based on adjacency matrix calculation to obtain the reachable matrix of device, finally analyze the device name in the output of all isolated circuits of reachable matrix, complete the identification of all invalid modules.The application identifies bypass device and isolated circuit in integrated circuit by analyzing smart meter integrated circuit, provides basis for simplifying fault injection of integrated circuit, saves fault injection time.

Description

Technical Field

[0001] This invention belongs to the field of smart meter technology, and more specifically, relates to a method for identifying invalid modules in a smart meter integrated circuit. Background Technology

[0002] Smart meters are intelligent terminals in smart grids. Besides the basic electricity metering functions of traditional meters, they also possess intelligent functions such as bidirectional multi-rate metering, user-end control, bidirectional data communication with multiple data transmission modes, and anti-theft features to adapt to smart grids and the use of new energy sources. Smart meters represent the future development direction of intelligent terminals for end users in energy-saving smart grids. Analog / mixed-signal integrated circuits are widely used in smart meters, which is crucial to their reliability. Failure of these integrated circuits can cause significant losses and serious impacts, making effective fault diagnosis methods urgently needed.

[0003] Currently, the industry widely uses fault coverage as an indicator to evaluate the quality of integrated circuit systems. Calculating this indicator requires extensive artificial fault injection into the integrated circuit devices. Fault coverage is calculated as the ratio of the number of faults detectable in a given circuit under a given fault model, based on a given test set, to the total number of faults in the circuit. However, large-scale integrated circuits contain numerous isolated modules, bypass modules, and other invalid circuit modules, resulting in significant waste of time on unnecessary fault injection and simulation. Furthermore, research on simplifying fault injection in China is still in its early stages, and related research results are relatively scarce. There is an urgent need for a method to identify invalid modules in smart meter integrated circuits to simplify fault injection. Summary of the Invention

[0004] The purpose of this invention is to overcome the shortcomings of the prior art and provide a method for identifying invalid modules in smart meter integrated circuits. By analyzing the smart meter integrated circuit, bypass devices and isolated circuits in the integrated circuit can be identified, providing a basis for simplifying fault injection in the integrated circuit and saving fault injection time.

[0005] To achieve the above-mentioned objective, the method for identifying invalid modules in a smart meter integrated circuit of the present invention includes the following steps:

[0006] S1: Mark network nodes in the analog / mixed signal integrated circuit of the smart meter according to the actual situation, and then build the netlist file of the integrated circuit. The netlist file contains all devices and device parameter values, as well as the connection relationship between each device and the preset network nodes.

[0007] S2: Traverse each device in the netlist file. If the device is a two-terminal device, compare whether the two network nodes connected to the device are the same. If they are the same, the device is a bypass device; otherwise, it is not a bypass device. If the device is a transistor, compare whether the network nodes connected to the emitter and collector of the device are the same. If they are the same, the device is a bypass device; otherwise, it is not a bypass device. If the device is a MOSFET, compare whether the network nodes connected to the source and drain of the device are the same. If they are the same, the device is a bypass device; otherwise, it is not a bypass device. All devices determined to be bypass devices constitute a bypass device set.

[0008] S3: Parse the netlist file, constructing a matrix with "device names" as rows and "node names" as columns. Then, compare the matrix with the netlist file; if a device and a node in the netlist are connected, mark the corresponding element in the matrix as "1"; otherwise, mark it as "0". Remove all zeros from the constructed matrix to obtain a matrix of size M×N, which is the device-node matrix S, where M represents the number of devices and N represents the number of nodes to retain.

[0009] S4: Construct an adjacency matrix A of size M×M between devices, where A[i][j] indicates whether the i-th device and the j-th device are reachable in one step, i,j=0,1,…,M-1. The value of A[i][j] is determined according to the device-node matrix S. Specifically, if the i-th device and the j-th device have the same value of 1 in a certain column in the device-node matrix S, then the two devices are directly connected, i.e., reachable in one step, and A[i][j]=1; otherwise, A[i][j]=0.

[0010] S5: Calculate the M×M reachable matrix R based on the adjacency matrix A. Specifically, calculate matrix Tmp = (A + I) based on the adjacency matrix A. M Where I represents the identity matrix, the elements R[i][j] in the M-step reachable matrix R are then determined using the following formula:

[0011]

[0012] S6: Based on the M-step reachability matrix R, the main circuit and isolated circuit device sets are obtained through analysis. The specific method is as follows:

[0013] 1) Initialize the isolated circuit index accu = 0, the main circuit block index main = 0, and the M-dimensional sub-circuit column vector subC = 0;

[0014] 2) Let i = 0;

[0015] 3) Determine whether the element subC[i] in the i-th row of the sub-circuit column vector subC is 0. If it is, proceed to step 4); otherwise, proceed to step 5.

[0016] 4) Let the isolated circuit number accu = accu + 1, and let subC[i] = accu;

[0017] 5) Let j = 1;

[0018] 6) Determine whether element R[i][j] in the M-step reachable matrix R is 1. If it is, let subC[j] = accu. Then further determine whether the j-th device is a power supply. If it is, let the main circuit block number main = accu. Do not perform any operation in other cases.

[0019] 7) Determine if j < M-1. If yes, set j = j + 1 and return to step 6); otherwise, proceed to step 8.

[0020] 8) Determine if i < M-1. If yes, let i = i + 1 and return to step 3); otherwise, proceed to step 9.

[0021] 9) Based on the main circuit block number main and the sub-circuit column vector subC, the device corresponding to the element subC[i] = main is taken as the main circuit device to form the main circuit device set. Then, for other devices, the devices with the same subC[i] are taken as the same isolated circuit device to form the isolated circuit device set.

[0022] This invention discloses a method for identifying invalid modules in smart meter integrated circuits. The method involves acquiring the netlist file of the smart meter integrated circuit, first identifying bypass devices through direct analysis, then modeling the analog circuit using devices and network nodes to obtain a device-node matrix, calculating the reachability matrix of the devices based on the adjacency matrix, and finally analyzing the reachability matrix to output the device names in all isolated circuits, thus completing the identification of all invalid modules. This invention identifies bypass devices and isolated circuits in smart meter integrated circuits through analysis, providing a basis for simplifying fault injection in integrated circuits and saving fault injection time. Attached Figure Description

[0023] Figure 1 This is a flowchart illustrating a specific implementation method for identifying invalid modules in a smart meter integrated circuit according to the present invention.

[0024] Figure 2 This is an example diagram of the netlist file for the analog / mixed-signal integrated circuits in a smart meter;

[0025] Figure 3 This is an example diagram of the circuit and netlist file of the example circuit in this embodiment;

[0026] Figure 4 This is a diagram showing the output results of the bypass device identification in this embodiment. Detailed Implementation

[0027] The specific embodiments of the present invention will now be described with reference to the accompanying drawings to enable those skilled in the art to better understand the invention. It should be particularly noted that in the following description, detailed descriptions of known functions and designs that might obscure the main content of the invention will be omitted here.

[0028] Example

[0029] Figure 1 This is a flowchart illustrating a specific implementation of the invalid module identification method for the smart meter integrated circuit of the present invention. Figure 1 As shown, the specific steps of the invalid module identification method for smart meter integrated circuits of the present invention include:

[0030] S101: Obtain the netlist file:

[0031] Based on the actual situation, network nodes are marked in the analog / mixed signal integrated circuits of the smart meter, and then the netlist file of the integrated circuit is constructed. The netlist file contains all devices and device parameter values, as well as the connection relationship between each device and the preset network nodes.

[0032] S102: Bypass device identification:

[0033] The identification approach for bypass devices in this invention is as follows: If two adjacent node numbers of a two-terminal device are the same, it indicates that the two adjacent nodes are connected, thus classifying the device as a bypass device. For three-terminal devices, such as MOSFETs, the short-circuit model involves directly connecting the source and drain. Since the three ports have a specific order in the netlist, the source column node number and the gate column node number in the netlist file are compared. If they are the same, the device is classified as a bypass device. Therefore, the specific method for identifying bypass devices in this invention is as follows:

[0034] For each device in the netlist file, if it is a two-terminal device, compare the two network nodes it is connected to. If they are the same, the device is a bypass device; otherwise, it is not. If it is a transistor, compare the network nodes connected to its emitter and collector. If they are the same, the device is a bypass device; otherwise, it is not. If it is a MOSFET, compare the network nodes connected to its source and drain. If they are the same, the device is a bypass device; otherwise, it is not. All devices determined to be bypass devices form a bypass device set.

[0035] S103: Generating Device-Node Matrix:

[0036] Parse the netlist file, constructing a matrix with "device names" as rows and "node names" as columns. Then, compare the matrix with the netlist file; if a device and a node in the netlist are connected, mark the corresponding element in the matrix as "1"; otherwise, mark it as "0". Remove all zeros from the constructed matrix (i.e., remove the corresponding node data), resulting in a matrix of size M×N, called the device-node matrix S, where M represents the number of devices and N represents the number of nodes to retain.

[0037] Figure 2 This is an example diagram of a netlist file for analog / mixed-signal integrated circuits in a smart meter. (Example:) Figure 2 As shown, in integrated circuits, nodes are labeled 1-4 to represent network nodes. In the constructed netlist file, the first column is the device name, the second and third columns are the network node numbers to which the device is connected, and the fourth column is the numerical value of the device. Table 1 is based on... Figure 2 The device-node matrix generated from the netlist file shown.

[0038] Node 1 Node 2 Node 3 Node 4 M3 1 1 1 0 R1 0 0 1 1 R2 0 1 0 1 R3 1 1 0 0

[0039] Table 1

[0040] As shown in Table 1, since there are no columns of all zeros in the generated matrix, there is no need to delete them. That is, the size of the generated device-node matrix S is 4*4.

[0041] S104: Generate the adjacency matrix:

[0042] Construct an adjacency matrix A of size M×M between devices, where A[i][j] represents whether the i-th device and the j-th device are reachable in one step, i,j=0,1,…,M-1. The value of A[i][j] is determined based on the device-node matrix S. Specifically, if the i-th device and the j-th device both have a value of 1 in a certain column of the device-node matrix S, then these two devices are directly connected, i.e., reachable in one step, and A[i][j]=1; otherwise, A[i][j]=0. According to the device-node matrix S shown in Table 1, the adjacency matrix A in this embodiment is:

[0043]

[0044] S105: Generate an M-step reachable matrix:

[0045] The M-step reachability matrix R of size M×M is calculated based on the adjacency matrix A. Specifically, the matrix Tmp = (A+I) is calculated from the adjacency matrix A. M Where I represents the identity matrix, the elements R[i][j] in the M-step reachable matrix R are then determined using the following formula:

[0046]

[0047] Research has shown that calculating intermediate matrices in actual computation does not necessarily require raising the value to the power of M. When calculating the reachability matrix, if the reachability matrix for the next step remains unchanged compared to the current reachability matrix, the update stops. This is because if two devices are reachable in m steps, then they are necessarily reachable in the (m+1)th step as well, eliminating the need for further calculation. Based on this idea, this embodiment proposes a more efficient method for calculating the M-step reachability matrix, as follows:

[0048] 1) Let m = 1, let matrix Tmp = A + I, initialize the reachable matrix change flag Flag = 0, and the 1-step reachable matrix Rs1 = A.

[0049] 2) Calculate the reachability matrix Rs in m+1 steps. m+1 The specific method is as follows:

[0050] Traversing the reachable matrix Rs in m steps m If Rs m If [i][j] = 1, it means that the i-th device and the j-th device are reachable in m steps. Therefore, they must be reachable in m+1 steps. Let Rs m+1 [i][j] = 1, if Rs m If [i][j] = 0, then the m-step reachability matrix Rs m Let Rs be the element of the i-th row vector in matrix Tmp, and let i′ = 0, 1, ..., M-1. If the result of the AND operation between any pair of elements is 1, then the i-th device and the j-th device are reachable in m+1 steps. m+1 [i][j] = 1, and since Rs at this time m [i][j]≠Rs m+1 If [i][j], the reachability matrix has changed; set the reachability matrix change flag Flag = 1. Otherwise, set Rs... m+1 [i][j] = 0.

[0051] 3) Determine if the reachable matrix change flag Flag = 1. If yes, proceed to step 4); otherwise, proceed to step 5.

[0052] 4) Determine if m < M. If yes, set m = m + 1 and return to step 2); otherwise, proceed to step 5.

[0053] 5) Convert the currently obtained reachability matrix Rs m R is the M-step reachable matrix.

[0054] S106: Analysis yields the main circuit and isolated circuit:

[0055] Next, based on the M-step reachability matrix R, the main circuit and isolated circuit device sets are analyzed and obtained. The specific method is as follows:

[0056] 1) Initialize the isolated circuit number accu = 0, the main circuit block number main = 0, and the M-dimensional sub-circuit column vector subC = 0.

[0057] 2) Let i = 0.

[0058] 3) Determine if the element subC[i] in the i-th row of the sub-circuit column vector subC is 0. If it is, proceed to step 4); otherwise, proceed to step 5.

[0059] 4) Let the isolated circuit number accu = accu + 1, and let subC[i] = accu.

[0060] 5) Let j = 1.

[0061] 6) Determine if element R[i][j] in the M-step reachability matrix R is 1. If it is, let subC[j] = accu. Then, further determine if the j-th device is a power supply. If it is, let the main circuit block number main = accu. Otherwise, do not perform any operation. Because the power supply in an integrated circuit is the main power supply, and there is usually only one, the circuit connected to the power supply is regarded as the main circuit.

[0062] 7) Determine if j < M-1. If yes, set j = j + 1 and return to step 6); otherwise, proceed to step 8.

[0063] 8) Determine if i < M-1. If yes, let i = i + 1 and return to step 3); otherwise, proceed to step 9.

[0064] 9) Based on the main circuit block number main and the sub-circuit column vector subC, the device corresponding to the element subC[i] = main is taken as the main circuit device to form the main circuit device set. Then, for other devices, the devices with the same subC[i] are taken as the same isolated circuit device to form the isolated circuit device set.

[0065] To better illustrate the specific process of this invention, an example circuit is used for experimental verification. Since the overall circuit of a smart meter is too complex, this embodiment uses a self-drawn circuit as an example for explanation. Figure 3 This is an example diagram of the circuit and netlist file of the example circuit in this embodiment.

[0066] First, bypass device identification is performed. Figure 4 This is a diagram showing the output results of the bypass device identification in this embodiment. For example... Figure 4 As shown, Short_M is a set of bypass devices, including R10, M2, Q2, and Q3.

[0067] Generate an initial device-node matrix from the netlist file, and then delete all zero columns to obtain the device-node matrix.

[0068] Table 1 is the device-node matrix in this embodiment.

[0069]

[0070] Table 1

[0071] Then, the adjacency matrix is ​​calculated, and the M-step reachability matrix is ​​calculated based on the adjacency matrix. Table 2 shows the adjacency matrix in this embodiment. Table 3 shows the M-step reachability matrix in this embodiment.

[0072]

[0073]

[0074] Table 2

[0075] Devices 0 VCC R2 R3 R5 L1 R6 R8 R9 C1 C2 R10 M2 Q1 Q2 Q3 0 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 VCC 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 R2 0 0 1 0 0 0 0 0 0 1 0 0 0 0 0 0 R3 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 R5 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 L1 0 0 0 0 0 1 0 0 0 0 1 0 0 0 0 1 R6 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 R8 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 R9 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 C1 0 0 1 0 0 0 0 0 0 1 0 0 0 0 0 0 C2 0 0 0 0 0 1 0 0 0 0 1 0 0 0 0 1 R10 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 M2 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 Q1 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 Q2 1 1 0 1 1 0 1 1 1 0 0 1 1 1 1 0 Q3 0 0 0 0 0 1 0 0 0 0 1 0 0 0 0 1

[0076] Table 3

[0077] The reachability matrix is ​​analyzed, and the matrix vector subC is calculated. From this, the main circuit and isolated circuit are obtained. Table 4 shows the matrix vectors and corresponding devices in this embodiment.

[0078]

[0079] Table 4

[0080] As shown in Table 4, in subC, rows with the same keyName correspond to the same module; otherwise, they are different. In this embodiment, since the power supply number is 1, the row with element "1" in subC corresponds to the main circuit device, and the rest are isolated circuit devices, i.e., invalid module devices. The results are then processed to obtain the main circuit module and all isolated circuit device sets (the set not marked as the main circuit is the isolated device set), and the output is as follows:

[0081] [['Main Circuit'],'0','VCC','R3','R5','R6','R8','R9','R10','M2','Q1','Q2']

[0082] ['R2','C1']

[0083] ['L1','C2','Q3']

[0084] By comparing the bypass device identification results and isolated circuit identification results with the specific structure of the circuit diagram, it can be seen that this algorithm accurately and quickly identified all bypass circuits and isolated circuits, thus completing the identification of invalid modules in the integrated circuit.

[0085] Although the illustrative specific embodiments of the present invention have been described above to enable those skilled in the art to understand the invention, it should be understood that the invention is not limited to the scope of the specific embodiments. For those skilled in the art, various changes are obvious as long as they are within the spirit and scope of the invention as defined and determined by the appended claims, and all inventions utilizing the concept of the present invention are protected.

Claims

1. A method for identifying invalid modules in a smart meter integrated circuit, characterized in that, Includes the following steps: S1: Mark network nodes in the analog / mixed signal integrated circuit of the smart meter according to the actual situation, and then build the netlist file of the integrated circuit. The netlist file contains all devices and device parameter values, as well as the connection relationship between each device and the preset network nodes. S2: Traverse each device in the netlist file. If the device is a two-terminal device, compare whether the two network nodes connected to the device are the same. If they are the same, the device is a bypass device; otherwise, it is not a bypass device. If the device is a transistor, compare whether the network nodes connected to the emitter and collector of the device are the same. If they are the same, the device is a bypass device; otherwise, it is not a bypass device. If the device is a MOSFET, compare whether the network nodes connected to the source and drain of the device are the same. If they are the same, the device is a bypass device; otherwise, it is not a bypass device. All devices determined to be bypass devices constitute a bypass device set. S3: Parse the netlist file, constructing a matrix with "device names" as rows and "node names" as columns. Then, compare the matrix with the netlist file; if a device and a node in the netlist are connected, mark the corresponding element in the matrix as "1"; otherwise, mark it as "0". Remove all zeros from the constructed matrix to obtain a matrix of size [size missing]. The matrix is ​​used as the device-node matrix. ,in Indicates the number of components. Indicates the number of nodes to be retained; S4: Build size is Adjacency matrix between devices ,in Indicates the first The device and the first Is each device achievable in one step? , The value is determined based on the device-node matrix. To determine this, the specific method is as follows: if in the device-node matrix In the middle, the first The device and the first If two devices both have a value of 1 in a certain column, then these two devices can be directly connected, meaning they can be reached in one step. Let... ,otherwise ; S5: Based on the adjacency matrix The computation size is of Step reachability matrix The specific method is as follows: 1) Order Let the matrix Initialize reachability matrix change flags A matrix that can be reached in one step ; 2) Calculation Step reachability matrix The specific method is as follows: Traversal Step reachability matrix ,if This indicates that the first The device and the first individual devices If it is within walking distance, then The step must be reachable, so that ,if Then Step reachability matrix The Middle The first row in the row vector Elements and Matrices The Middle The first column in the column vector Perform a bitwise AND operation on each element. If the AND operation of any pair of elements results in 1, then the first element is... The device and the first individual devices It is within walking distance, making And let the reachability matrix change identifier Otherwise ; 3) Determine if the reachability matrix change flag is valid. If yes, proceed to step 4; otherwise, proceed to step 5. 4) Determine if If so, let (Return to step 2), otherwise proceed to step 5). 5) The currently obtained reachability matrix As Step reachability matrix ; S6: Based on Step reachability matrix The analysis yields the main circuit and isolated circuit device sets, using the following specific method: 1) Initialize the isolated circuit number Main circuit block number , dimensional circuit column vector ; 2) Order ; 3) Determine the column vector of the sub-circuit The Middle row element Is it 0? If yes, proceed to step 4; otherwise, proceed to step 5. 4) Let the isolated circuit number ,make ; 5) Order ; 6) Judgment Step reachability matrix medium elements Is it 1? If so, let Then further determine whether it is the first If a device is a power source, then set the main circuit block number. No action is taken in other cases; 7) Determine if If so, let (Return to step 6); otherwise proceed to step 8. 8) Determine whether If so, let (Return to step 3); otherwise proceed to step 9). 9) According to the main circuit block number and sub-circuit column vector , will elements The corresponding devices form the main circuit device set as the main circuit devices, and then for other devices, Identical devices constitute a set of isolated circuit devices when they are treated as the same isolated circuit device.

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