Ripple voltage generation method, ripple power supply circuit and power supply ripple test system
By generating a frequency adjustable signal, the switch module controls the charging and discharging state and outputs a controllable ripple voltage, which solves the problem of PSRR measurement accuracy in the server background and realizes accurate testing of high-frequency LDO power supplies.
Patent Information
- Application Number
- CN202211235697.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-10-10
- Publication Date
- 2025-09-02
- Estimated Expiration
- 2042-10-10
AI Technical Summary
The prior art cannot meet the demand for PSRR measurement accuracy in the context of servers, especially in high frequency situations, PSRR testing of LDO power supplies is difficult to perform accurately.
By obtaining the frequency adjustable signal, the charging state and discharge state are switched by the switching module and the charging and discharge module, the square wave voltage with ripple is output, and the controllable generation of Ripple (Vin) is achieved, and the measurement difficulties are transferred to Ripple (Vin).
It improves the accuracy of PSRR measurement and the accuracy of testing, and improves the timeliness of the power supply quality of LDO chips.
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Figure CN115508735B_ABST
Abstract
Description
Technical Field
[0001] Embodiments of the present application relate to the field of electronic technology, and more particularly, to a method for generating a ripple voltage, a ripple power supply circuit, and a power supply ripple testing system. Background Art
[0002] At present, the high-performance servers that computing power development relies on have increasingly stringent power supply requirements. With the continuous improvement of chip manufacturing technology, the CPU has also been continuously iterated, and the power supply technology of the CPU and its peripheral chips has also tended to be low-voltage and high-current. The increase in CPU main frequency and the reduction in supply voltage mean that higher requirements are placed on the quality and voltage accuracy of the power supply. Generally speaking, there will be a certain amount of ripple in the output voltage of the power supply chip. This ripple may be AC interference from the 50Hz mains, or it may be switching noise generated by the DC-DC converter switch tube device or ripple voltage generated by ripple current. An important criterion for measuring power quality is the power supply ripple rejection ratio (PSRR), which is expressed as:
[0003]
[0004] Where Ripple Vin It is the power ripple size of the input VR chip (Voltage regulator chip, power supply voltage regulator chip). Vout This is the voltage ripple value output from the power supply VR. dB is the unit of ripple rejection ratio. In server development and design, a certain amount of LDO (Low Drop Out Regulator) power supplies are used.
[0005] LDOs are used because of their inherent low-noise advantage. Because the built-in MOS transistors in LDO power supplies operate in an amplifying state rather than a switching state, they prevent switching noise from reaching the load. Manufacturers typically provide PSRR data for LDO power supplies, but they may lack test data under specific conditions. Therefore, LDOs must be tested before designing server power supplies. PSRR testing involves measuring both input and output ripple.
[0006] Therefore, a lot of time is required for testing, and repeated tests are required to obtain the PSRR value. In previous tests, the voltage converted from the previous DC-DC converter was often used to power the LDO chip. However, the ripple amplitude and frequency of the DC-DC converter are actually uncontrollable. In the server working environment, the digital signal level flips very quickly and the load changes very quickly. This requires testing the LDO power supply's ability to suppress 10MHz ripple. The PSRR test involves the LDO input ripple generation circuit and the LDO output voltage ripple test circuit.
[0007] However, the existing technology cannot meet the demand for PSRR measurement accuracy in the server context. Summary of the Invention
[0008] The embodiments of the present application provide a ripple voltage generation method, a ripple power supply circuit, and a power supply ripple testing system to at least solve the problem that the related art cannot meet the requirements for PSRR measurement accuracy in the server context.
[0009] According to one embodiment of the present application, a method for generating a ripple voltage is provided, including: obtaining a first DC voltage and a second DC voltage; obtaining a frequency-adjustable signal, wherein the frequency-adjustable signal is alternately composed of a first level signal and a second level signal, and the first level signal and the second level signal are respectively a high level signal and a low level signal; and outputting a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0010] In an exemplary embodiment, a square wave voltage with ripple is output based on a first DC voltage, a second DC voltage, and a frequency-adjustable signal, including: switching between a charging state and a discharging state based on a first level signal and a second level signal; in the charging state, charging is performed using the first DC voltage to output a first supply voltage; in the discharging state, the first DC voltage and the second DC voltage are coupled to output a second supply voltage greater than the first supply voltage.
[0011] According to another embodiment of the present application, a ripple power supply circuit is provided, including: a DC power supply unit for providing a first DC voltage and a second DC voltage; a signal generating unit for generating a frequency-adjustable signal, wherein the frequency-adjustable signal is alternately composed of a first level signal and a second level signal, and the first level signal and the second level signal are respectively a high level signal and a low level signal; a ripple generating unit, electrically connected to the DC power supply unit and the signal generating unit, respectively, and configured to output a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0012] In an exemplary embodiment, the ripple generating unit includes a switching module and a charging and discharging module, wherein: the switching module is electrically connected to the charging and discharging module, and is used to control the charging and discharging module to switch between a charging state and a discharging state according to a first level signal and a second level signal; in the charging state, the charging and discharging module is used to charge through a first DC voltage and output a first supply voltage; in the discharging state, the charging and discharging module is used to couple the first DC voltage and the second DC voltage and output a second supply voltage greater than the first supply voltage.
[0013] In an exemplary embodiment, the switching module includes a first switching device and a second switching device connected in parallel, and the first switching device and the second switching device are electrically connected to a signal generating unit, wherein: when the signal generating unit generates a first level signal, the first switching device is turned on and the second switching device is turned off; when the signal generating unit generates a second level signal, the second switching device is turned on and the first switching device is turned off.
[0014] In an exemplary embodiment, the DC power supply unit includes: a first power supply for providing a first DC voltage; and a second power supply for providing a second DC voltage.
[0015] In an exemplary embodiment, the first level signal is a high level signal, and the second level signal is a low level signal; the first switching device is an N-type switching MOSFET, and the second switching device is a P-type switching MOSFET. The gate of the P-type switching MOSFET and the gate of the N-type switching MOSFET are electrically connected to the signal generating unit, the drain of the P-type switching MOSFET and the drain of the N-type switching MOSFET are electrically connected to the charging and discharging module, the source of the P-type switching MOSFET is electrically connected to the second power supply, and the source of the N-type switching MOSFET is grounded.
[0016] In an exemplary embodiment, the switch module further includes: a unidirectional device electrically connected to the source of the P-type switch MOSFET and the second power supply respectively.
[0017] In an exemplary embodiment, the charge and discharge module includes a first capacitor and a second capacitor connected in parallel, the first capacitor has a first end and a second end, and the second capacitor has a third end and a fourth end, wherein: the first end and the second end are electrically connected to the first power supply; and the third end and the fourth end are electrically connected to the switching module.
[0018] In an exemplary embodiment, the first DC voltage is greater than the second DC voltage.
[0019] According to another embodiment of the present application, a power supply ripple testing system is provided, including: a ripple power supply circuit as described above, electrically connected to the power supply chip to be tested, and used to provide a square wave voltage with ripple to the power supply chip to be tested; a voltage waveform extraction device, electrically connected to the power supply chip to be tested, and used to extract the waveform of the output square wave voltage of the power supply chip to be tested.
[0020] In an exemplary embodiment, the power ripple test system further includes: a ripple analysis unit electrically connected to the voltage waveform extraction device, configured to analyze the waveform of the output square wave voltage to obtain a power ripple rejection ratio of the power chip to be tested.
[0021] According to another embodiment of the present application, a computer-readable storage medium is provided, in which a computer program is stored. The computer program is configured to execute the steps of any of the above method embodiments when running.
[0022] According to another embodiment of the present application, an electronic device is provided, including a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in any one of the above method embodiments.
[0023] By using the present invention, since a frequency adjustable signal is obtained, the frequency adjustable signal is composed of a first level signal and a second level signal alternately, so that a square wave voltage with ripple can be output by coupling two voltage values of different levels, and the difficulty of PSRR testing is reduced from measuring Ripple (V out ) is transferred to generate Ripple(V in ), while ensuring the output load capacity of the circuit, the output ripple voltage amplitude is controllable. Therefore, the problem that the relevant technology cannot meet the demand for PSRR measurement accuracy in the server context can be solved, thereby achieving the effect of improving the timeliness of testing the power quality of the LDO chip in the server and improving the accuracy of the test. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] Figure 1 This is a hardware structure block diagram of a computer device according to a method for generating a ripple voltage according to an embodiment of the present application;
[0025] Figure 2 is a flow chart of a method for generating a ripple voltage according to an embodiment of the present application;
[0026] Figure 3 is a schematic diagram of a square wave voltage with ripples output by the above-mentioned generating method according to an embodiment of the present application;
[0027] Figure 4 is a structural schematic diagram of a ripple power supply circuit according to an embodiment of the present application;
[0028] Figure 5 is a structural block diagram of a ripple voltage generating device according to an embodiment of the present application;
[0029] Figure 6 This is a structural block diagram of a power supply ripple testing system according to an embodiment of the present application. DETAILED DESCRIPTION
[0030] The embodiments of the present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.
[0031] It should be noted that the terms "first", "second", etc. in the description and claims of this application and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence.
[0032] In the prior art, PSRR can be tested by using an addition circuit to superimpose DC and AC signals. An operational amplifier is used to design an addition circuit, and the DC voltage and AC voltage are superimposed at the output end. This signal is then used as the input of an LDO power supply chip.
[0033] However, the AC / DC power supply driving capability of the superimposed adding circuit is low, which is limited by the current-carrying capacity of the operational amplifier. In addition, the bandwidth of the operational amplifier does not meet the PSRR test requirements, and the output voltage range of the operational amplifier cannot fully cover the input voltage range of the LDO power supply.
[0034] In the existing technology, an oscilloscope can be used to measure PSRR. However, due to the limited resolution and sensitivity of the oscilloscope, the mainstream 10-bit ADC sampling rate oscilloscope can only measure up to the millivolt level, which cannot accurately test the PSRR of the power chip under normal working conditions. If the PSRR of the chip under test exceeds 40dB, the oscilloscope accuracy will not meet the test requirements.
[0035] In the existing technology, PSRR can also be tested using an audio analyzer (AP) and an amplifier. However, since the AP is an audio test device, it only supports a bandwidth from 20Hz to 80kHz, while the noise generated by the power switch is usually several hundred kHz. Obviously, this method cannot meet the needs of high-frequency PSRR measurement in the server context.
[0036] In this embodiment, a method for generating a ripple voltage is provided. The method embodiment provided in the embodiment of the present application can be executed in a computer device or a similar computing device. Taking running on a computer device as an example, Figure 1 This is a hardware structure block diagram of a computer device for a method of generating a ripple voltage according to an embodiment of the present application. Figure 1 As shown, the computer device may include one or more ( Figure 1 Only one is shown) a processor 102 (the processor 102 may include but is not limited to a microprocessor MCU or a programmable logic device FPGA and other processing devices) and a memory 104 for storing data, wherein the above-mentioned computer device may also include a transmission device 106 for communication functions and an input and output device 108. It will be understood by those skilled in the art that Figure 1 The structure shown is only for illustration and does not limit the structure of the above-mentioned computer device. For example, the computer device may also include Figure 1 More or fewer components than shown, or with Figure 1 Different configurations shown.
[0037] The memory 104 can be used to store computer programs, for example, software programs and modules of application software, such as the computer program corresponding to the method for generating ripple voltage in the embodiment of the present application. The processor 102 executes various functional applications and data processing by running the computer program stored in the memory 104, that is, implementing the above-mentioned method. The memory 104 may include a high-speed random access memory and may also include a non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory 104 may further include a memory remotely located relative to the processor 102, and these remote memories may be connected to the computer device via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.
[0038] The transmission device 106 is used to receive or send data via a network. A specific example of the aforementioned network may include a wireless network provided by a communications provider of a computer device. In one embodiment, the transmission device 106 includes a network interface controller (NIC), which can be connected to other network devices via a base station to enable communication with the Internet. In another embodiment, the transmission device 106 may be a radio frequency (RF) module, which is used to communicate with the Internet wirelessly.
[0039] In this embodiment, a method for generating a ripple voltage running on the above-mentioned computer device is provided. Figure 2 is a flow chart of a method for generating a ripple voltage according to an embodiment of the present application, such as Figure 2 As shown, the process includes the following steps:
[0040] Step S202, obtaining a first DC voltage and a second DC voltage;
[0041] Step S204, obtaining a frequency-adjustable signal, wherein the frequency-adjustable signal is composed of a first-level signal and a second-level signal alternately, wherein the first-level signal and the second-level signal are respectively a high-level signal and a low-level signal;
[0042] Step S206 : outputting a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0043] Through the above steps, we can output a square wave voltage with ripple by coupling two voltage values of different levels, and reduce the difficulty of PSRR testing from measuring Ripple (V out ) is transferred to generate Ripple(V in ), while ensuring the output load capacity of the circuit, the output ripple voltage amplitude is controllable. Therefore, the problem that the relevant technology cannot meet the demand for PSRR measurement accuracy in the server context can be solved, thereby achieving the effect of improving the timeliness of testing the power quality of the LDO chip in the server and improving the accuracy of the test.
[0044] The execution order of step S202 and step S204 can be interchanged, that is, step S204 can be executed first, and then step S202.
[0045] Specifically, in the above step S202, a DC power supply DC-3V can be used as the main power supply of the LDO power chip (including but not limited to 3V, depending on the input voltage of the LDO chip), and a DC power supply DC-0.5V (or a dual-channel DC power supply) can be used as the secondary power supply of the LDO power chip, and the first DC voltage and the second DC voltage are obtained from the main power supply and the secondary power supply in the LDO power chip respectively.
[0046] In the above step S204, a signal generator may be used to generate a high-low alternating level signal; in the above step S206, a ripple generating unit may be used to output a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency adjustable signal.
[0047] The ripple generating unit may include a switching module and a charging and discharging module, and the switching module is electrically connected to the charging and discharging module. In order to obtain the above-mentioned square wave voltage with ripple, in an exemplary embodiment, step S206 includes: the switching module switches the charging state and the discharging state of the charging and discharging module according to the first level signal and the second level signal; in the charging state, the charging and discharging module is charged by the first DC voltage and outputs a first supply voltage; in the discharging state, the charging and discharging module couples the first DC voltage and the second DC voltage to output a second supply voltage greater than the first supply voltage.
[0048] In order to implement the above step S206, the above ripple generating unit may include a switch module and a charge-discharge module.
[0049] In an exemplary embodiment, the above-mentioned switching module includes a first switching device and a second switching device connected in parallel, and the first switching device and the second switching device are electrically connected to the signal generating unit, wherein: when the signal generating unit generates a first level signal, the first switching device is turned on and the second switching device is turned off; when the signal generating unit generates a second level signal, the second switching device is turned on and the first switching device is turned off.
[0050] In an exemplary embodiment, the charging and discharging module includes a first capacitor and a second capacitor connected in parallel, the first capacitor having a first end and a second end, and the second capacitor having a third end and a fourth end, wherein: the first end and the second end are electrically connected to the first power supply; and the third end and the fourth end are electrically connected to the switching module.
[0051] When the first level signal is a high level signal and the second level signal is a low level signal, the first switching device may be an N-type switching MOSFET, the second switching device may be a P-type switching MOSFET, the gate of the P-type switching MOSFET and the gate of the N-type switching MOSFET are electrically connected to the signal generating unit, the drain of the P-type switching MOSFET and the drain of the N-type switching MOSFET are electrically connected to the charging and discharging module, the source of the P-type switching MOSFET is electrically connected to the second power supply, and the source of the N-type switching MOSFET is grounded.
[0052] Specifically, a signal generator is used to generate high and low positive and negative level drives. When the N-type switch MOS tube is driven to turn on, the DC power supply DC-3V charges the first capacitor and the second capacitor through the N-type switch MOS tube loop. When the P-type switch MOS tube is turned on, the N-type switch MOS tube is already turned off. At this time, the DC power supply DC-0.5V is turned on, thereby generating a bootstrap effect of the capacitor. The voltage of 0.5V passes through the first capacitor and the second capacitor, and the voltage V out It is raised to 3.5V. Since the frequency of the signal generator is adjustable, the voltages of the DC power supply DC-3V and DC power supply DC-0.5V can also be adjusted, thus generating a ripple-controllable power supply. The power supply itself is mainly generated by DC-3V, so the load capacity of the power supply can fully support various working states of the VR power chip.
[0053] Through the description of the above implementation methods, those skilled in the art can clearly understand that the method according to the above embodiment can be implemented by means of software plus the necessary general hardware platform, and of course it can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present application, or the part that contributes to the prior art, can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes a number of instructions for enabling a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present application.
[0054] In this embodiment, a ripple power supply circuit is also provided, including: a DC power supply unit, used to provide a first DC voltage and a second DC voltage; a signal generating unit, used to generate a frequency-adjustable signal, wherein the frequency-adjustable signal is alternately composed of a first level signal and a second level signal, and the first level signal and the second level signal are respectively a high level signal and a low level signal; a ripple generating unit, electrically connected to the DC power supply unit and the signal generating unit, respectively, and used to output a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0055] Through the above circuit, since a frequency-adjustable signal is generated, the frequency-adjustable signal is composed of a first-level signal and a second-level signal alternately, so that a square wave voltage with ripple can be output by coupling two voltage values of different levels, and the difficulty of PSRR testing is reduced from measuring Ripple (V out ) is transferred to generate Ripple(V in ), while ensuring the output load capacity of the circuit, the output ripple voltage amplitude is controllable. Therefore, the problem that the relevant technology cannot meet the demand for PSRR measurement accuracy in the server context can be solved, thereby achieving the effect of improving the timeliness of testing the power quality of the LDO chip in the server and improving the accuracy of the test.
[0056] In an exemplary embodiment, the ripple generating unit includes a switching module and a charging and discharging module, wherein: the switching module is electrically connected to the charging and discharging module, and is used to control the charging and discharging module to switch between a charging state and a discharging state according to a first level signal and a second level signal; in the charging state, the charging and discharging module is used to charge through a first DC voltage and output a first supply voltage; in the discharging state, the charging and discharging module is used to couple the first DC voltage and the second DC voltage and output a second supply voltage greater than the first supply voltage.
[0057] In the above embodiment, since the voltage value of the second supply voltage is greater than the voltage value of the first supply voltage, and the first supply voltage and the second supply voltage are alternately generated according to the frequencies of the first level signal and the second level signal, a square wave voltage with ripples is formed, such as Figure 3 As shown, the first DC voltage not coupled with the second DC voltage is used as the reference voltage, and the second DC voltage is coupled with the first DC voltage to form a ripple voltage.
[0058] In one exemplary embodiment, the switching module includes a first switching device and a second switching device connected in parallel. The first switching device and the second switching device are electrically connected to a signal generating unit. When the signal generating unit generates a first-level signal, the first switching device is turned on and the second switching device is turned off. When the signal generating unit generates a second-level signal, the second switching device is turned on and the first switching device is turned off. Because the waveform generated by the signal generating unit has a controllable frequency and duty cycle, the dead time can also be controlled, thereby preventing the two switching devices from being turned on simultaneously.
[0059] In an exemplary embodiment, Figure 4 As shown, the DC power supply unit includes a first power supply 10 and a second power supply 20, wherein: the first power supply 10 is used to provide a first DC voltage; the second power supply 20 is used to provide a second DC voltage.
[0060] In the above embodiment, the first DC voltage can be greater than the second DC voltage, and the second DC voltage can be smaller, so that the rippled square wave voltage generated by the ripple generating unit is closer to the ripple voltage actually generated by AC interference from the mains, or the ripple voltage generated by switching noise or ripple current generated by the DC-DC converter switching tube device. For example, the first DC voltage output by the above first power supply 10 is 3V, and the second DC voltage output by the above second power supply 20 is 0.5V.
[0061] In order to obtain the above-mentioned square wave voltage with ripples, the first level signal can be a high level signal and the second level signal can be a low level signal; in this case, Figure 4 As shown, the first switching device is an N-type switching MOSFET 50, and the second switching device is a P-type switching MOSFET 40. The gate of the P-type switching MOSFET 40 and the gate of the N-type switching MOSFET 50 are electrically connected to the signal generating unit 30, the drain of the P-type switching MOSFET 40 and the drain of the N-type switching MOSFET 50 are electrically connected to the charging and discharging module, the source of the P-type switching MOSFET 40 is electrically connected to the second power supply 20, and the source of the N-type switching MOSFET 50 is grounded.
[0062] In an exemplary embodiment, Figure 4 As shown, the switch module further includes a unidirectional device, which is electrically connected to the source of the P-type switch MOSFET 40 and the second power supply 20. The unidirectional device acts as an anti-reverse diode to prevent the current of the first power supply 10 from flowing back into the second power supply 20.
[0063] In an exemplary embodiment, Figure 4As shown, the above-mentioned charging and discharging module includes a first capacitor 60 and a second capacitor 70 connected in parallel, the first capacitor 60 has a first end and a second end, and the second capacitor 70 has a third end and a fourth end, wherein: the first end and the second end are electrically connected to the first power supply 10; the third end and the fourth end are electrically connected to the switching module.
[0064] Specifically, the signal generating unit 30 is used to generate high and low positive and negative levels for driving. When the N-type switch MOS tube 50 is driven to turn on, the first power supply 10 (DC power supply DC-3V) charges the first capacitor and the second capacitor through the loop of the N-type switch MOS tube 50. When the P-type switch MOS tube is turned on, the N-type switch MOS tube is already turned off. At this time, the second power supply 20 (DC power supply DC-0.5V) is turned on, thereby generating a bootstrap effect of the capacitor. The voltage of 0.5V passes through the first capacitor 60 and the second capacitor 70, and the voltage V out It is raised to 3.5V. Since the frequency of the signal generator is adjustable, the voltages of the DC power supply DC-3V and the DC power supply DC-0.5V can also be adjusted. This creates a ripple-controllable power supply that can output a rippled square wave voltage from the output terminal 80. The power supply itself is mainly generated by DC-3V, so the load capacity of the power supply can fully support various working states of the VR power chip.
[0065] In the above embodiment, two pairs of switching tubes PMOS and NMOS with opposite characteristics are used as switches to control the charging and discharging of the bootstrap capacitor. Only one signal generator is used to drive the two switching tubes, thereby isolating the signal from the power supply. Simple capacitors are used to construct the bootstrap boost circuit, and the output ripple voltage amplitude is controllable while ensuring the circuit output load capacity.
[0066] The above-mentioned switching tubes PMOS and NMOS can be selected as devices with a period of the four parts of the turn-on delay time, turn-on time, turn-off delay time and turn-off time less than 100ns, that is, devices with a theoretical switching frequency higher than 10MHz, to ensure that the generated power supply has sufficient power ripple size (Ripple) under normal low current load.
[0067] In addition to the above-mentioned switching tubes PMOS and NMOS, the switching devices in this embodiment can also be replaced by high-switching frequency power devices such as GaN and SiC. This embodiment can also be used to test the PSRR of all chips that work in the amplification region of the switching tube.
[0068] The following will be combined Figure 4, specifically describe the above-mentioned ripple power supply circuit in this embodiment, the DC power supply unit in the ripple power supply circuit includes a first power supply 10 and a second power supply 20, the first power supply 10 is a DC power supply DC-3V, and the second power supply is a DC power supply DC-0.5V; the signal generating unit 30 generates a frequency-adjustable signal, and the frequency-adjustable signal is composed of a first level signal and a second level signal alternately, the first level signal is a high level signal, and the second level signal is a low level signal; the first switching device is an N-type switching MOSFET 50, and the second switching device is a P-type switching MOSFET 40, and the P-type switching MOSFET is a low level signal. The gate of the off-MOSFET 40 and the gate of the N-type switching MOSFET 50 are electrically connected to the signal generating unit 30, the drain of the P-type switching MOSFET 40 and the drain of the N-type switching MOSFET 50 are electrically connected to the charge and discharge module, the source of the P-type switching MOSFET 40 is electrically connected to the second power supply 20, and the source of the N-type switching MOSFET 50 is grounded; the first capacitor 60 and the second capacitor 70 are connected in parallel, the first capacitor 60 has a first end and a second end, and the second capacitor 70 has a third end and a fourth end, wherein: the first end and the second end are electrically connected to the first power supply 10; the third end and the fourth end are electrically connected to the switching module.
[0069] This embodiment also provides a ripple voltage generating device for implementing the above-mentioned embodiments and preferred embodiments. Details already described will not be repeated here. As used below, the term "module" may refer to a combination of software and / or hardware that implements a predetermined function. Although the devices described in the following embodiments are preferably implemented in software, implementation using hardware, or a combination of software and hardware, is also possible and contemplated.
[0070] Figure 5 is a structural block diagram of a ripple voltage generating device according to an embodiment of the present application, such as Figure 5 As shown, the device includes: a first acquisition module 32, used to obtain a first DC voltage and a second DC voltage; a second acquisition module 34, used to obtain a frequency-adjustable signal, wherein the frequency-adjustable signal is alternately composed of a first level signal and a second level signal, and the first level signal and the second level signal are respectively a high level signal and a low level signal; an output module 36, used to output a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0071] In an exemplary embodiment, the output module 36 includes: a switching module for switching between a charging state and a discharging state according to a first level signal and a second level signal; a first output module for charging through a first DC voltage in the charging state and outputting a first supply voltage; and a second output module for coupling the first DC voltage and the second DC voltage in the discharging state and outputting a second supply voltage greater than the first supply voltage.
[0072] It should be noted that the above modules can be implemented through software or hardware. For the latter, it can be implemented in the following ways, but not limited to: the above modules are all located in the same processor; or the above modules are located in different processors in any combination.
[0073] In this embodiment, a power supply ripple test system is also provided. Figure 6 As shown, it includes: the above-mentioned ripple power supply circuit 41, which is electrically connected to the power supply chip 42 to be tested, and is used to provide a square wave voltage with ripple to the power supply chip 42 to be tested; a voltage waveform extraction device 43, which is electrically connected to the power supply chip 42 to be tested, and is used to extract the waveform of the output square wave voltage of the power supply chip 42 to be tested.
[0074] Through the above system, since the ripple power supply circuit generates a frequency-adjustable signal, the frequency-adjustable signal is composed of a first-level signal and a second-level signal alternately, so that a square wave voltage with ripple can be output by coupling two voltage values of different levels, and the difficulty of PSRR testing is reduced from measuring Ripple (V out ) is transferred to generate Ripple(V in ), while ensuring the output load capacity of the circuit, the output ripple voltage amplitude is controllable. Therefore, the problem that the relevant technology cannot meet the demand for PSRR measurement accuracy in the server context can be solved, thereby achieving the effect of improving the timeliness of testing the power quality of the LDO chip in the server and improving the accuracy of the test.
[0075] In an exemplary embodiment, the ripple generating unit in the above-mentioned ripple power supply circuit 41 includes a switching module and a charging and discharging module, wherein: the switching module is electrically connected to the charging and discharging module, and is used to control the charging and discharging module to switch between the charging state and the discharging state according to the first level signal and the second level signal; in the charging state, the charging and discharging module is used to charge through the first DC voltage and output the first supply voltage; in the discharging state, the charging and discharging module is used to couple the first DC voltage and the second DC voltage and output a second supply voltage greater than the first supply voltage.
[0076] In one exemplary embodiment, the switching module includes a first switching device and a second switching device connected in parallel. The first switching device and the second switching device are electrically connected to a signal generating unit. When the signal generating unit generates a first-level signal, the first switching device is turned on and the second switching device is turned off. When the signal generating unit generates a second-level signal, the second switching device is turned on and the first switching device is turned off. Because the waveform generated by the signal generating unit has a controllable frequency and duty cycle, the dead time can also be controlled, thereby preventing the two switching devices from being turned on simultaneously.
[0077] In an exemplary embodiment, the DC power supply unit in the ripple power supply circuit 41 includes a first power supply and a second power supply, wherein: the first power supply is used to provide a first DC voltage; the second power supply is used to provide a second DC voltage.
[0078] Illustratively, the first DC voltage output by the first power supply 10 is 3V, and the second DC voltage output by the second power supply 20 is 0.5V.
[0079] In order to obtain the above-mentioned square wave voltage with ripple, the first level signal can be made a high level signal and the second level signal can be made a low level signal; at this time, the first switching device is an N-type switching MOSFET, the second switching device is a P-type switching MOSFET, the gate of the P-type switching MOSFET and the gate of the N-type switching MOSFET are electrically connected to the signal generating unit, the drain of the P-type switching MOSFET and the drain of the N-type switching MOSFET are electrically connected to the charging and discharging module, the source of the P-type switching MOSFET is electrically connected to the second power supply, and the source of the N-type switching MOSFET is grounded.
[0080] In an exemplary embodiment, the switch module further includes a unidirectional device electrically connected to the source of the P-type switching MOSFET and the second power supply. The unidirectional device acts as an anti-reverse diode to prevent current from the first power supply from flowing back into the second power supply.
[0081] In an exemplary embodiment, the charging and discharging module includes a first capacitor and a second capacitor connected in parallel, the first capacitor has a first end and a second end, and the second capacitor has a third end and a fourth end, wherein: the first end and the second end are electrically connected to the first power supply; and the third end and the fourth end are electrically connected to the switching module.
[0082] Specifically, a signal generating unit is used to generate high and low positive and negative levels for driving. When the N-type switch MOS tube is driven to turn on, the first power supply charges the first capacitor and the second capacitor through the loop of the N-type switch MOS tube. When the P-type switch MOS tube is turned on, the N-type switch MOS tube is already turned off. At this time, the second power supply is turned on, thereby generating a bootstrap effect of the capacitor. The voltage of the second power supply passes through the first capacitor and the second capacitor, and the voltage V out Lifting, since the frequency of the signal generator is adjustable, the voltages of the first power supply and the second power supply can also be adjusted, thus generating a ripple-controllable power supply that can output a square wave voltage with ripple.
[0083] In an exemplary embodiment, the voltage waveform extraction device 43 can be an oscilloscope. The ripple power supply circuit 41 is electrically connected to the power supply chip 42 to be tested, and powered on for testing. The oscilloscope is used to capture the output waveform of the power supply chip 42 to be tested, so that the signal generating unit in the ripple power supply circuit 41 outputs square waves of different frequencies, and the output waveform is tested.
[0084] In an exemplary embodiment, the power ripple test system further includes: a ripple analysis unit electrically connected to the voltage waveform extraction device, configured to analyze the waveform of the output square wave voltage to obtain a power ripple rejection ratio of the power chip to be tested.
[0085] The power supply ripple test system uses the ripple power supply circuit to perform PSRR testing, which may include the following steps:
[0086] 1) First, analyze the main LDO chips targeted by the power ripple test system, and count the input voltage range and maximum load current capability of the LDO chips;
[0087] 2) According to Figure 4 The ripple power supply circuit shown in the figure draws the test fixture schematic diagram, which reserves the input terminals of the two-channel DC power supply (i.e., the first power supply 10 and the second power supply 20). According to the test frequency and load current, appropriate switching devices (i.e., the first switching device and the second switching device), protection devices (such as unidirectional devices) and capacitors (i.e., the first capacitor 60 and the second capacitor 70) are selected;
[0088] 3) After making the PCB according to the schematic diagram in step 2), power it on and test it. Use an oscilloscope to capture the output waveform. Make the signal generator output square waves of different frequencies and test the output waveform. To prevent output waveform distortion, ensure that the bootstrap capacitor is fully charged within one turn-on cycle.
[0089] 4) Test the load capacity of the ripple power supply circuit to ensure that it can adapt to different test requirements when supplying LDO power.
[0090] An embodiment of the present application also provides a computer-readable storage medium, which stores a computer program, wherein the computer program is configured to execute the steps in the above method embodiment when running: obtaining a first DC voltage and a second DC voltage; obtaining a frequency-adjustable signal, wherein the frequency-adjustable signal is alternately composed of a first level signal and a second level signal, and the first level signal and the second level signal are respectively a high level signal and a low level signal; and outputting a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0091] The computer program is configured to further execute the following steps when it is run: outputting a square wave voltage with ripples according to a first DC voltage, a second DC voltage, and a frequency-adjustable signal, including: switching between a charging state and a discharging state according to a first level signal and a second level signal; in the charging state, charging with the first DC voltage and outputting a first supply voltage; in the discharging state, coupling the first DC voltage and the second DC voltage and outputting a second supply voltage greater than the first supply voltage.
[0092] In an exemplary embodiment, the computer-readable storage medium may include, but is not limited to, various media that can store computer programs, such as a USB flash drive, a read-only memory (ROM), a random access memory (RAM), a mobile hard disk, a magnetic disk, or an optical disk.
[0093] An embodiment of the present application also provides an electronic device, including a memory and a processor, wherein a computer program is stored in the memory, and the processor is configured to run the computer program to execute the steps in the above method embodiment: obtaining a first DC voltage and a second DC voltage; obtaining a frequency-adjustable signal, wherein the frequency-adjustable signal is alternately composed of a first level signal and a second level signal, and the first level signal and the second level signal are respectively a high level signal and a low level signal; and outputting a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0094] The above-mentioned processor can be a ripple generating unit, which is electrically connected to the DC power supply unit and the signal generating unit respectively, obtains the first DC voltage and the second DC voltage provided by the DC power supply unit, and obtains the frequency-adjustable signal generated by the signal generating unit, and outputs a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal.
[0095] The above-mentioned ripple generating unit may include a switching module and a charging and discharging module, and the switching module is electrically connected to the charging and discharging module. In order to obtain the above-mentioned square wave voltage with ripple, optionally, the above-mentioned processor can also execute the program code of the following steps: outputting a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal, including: the switching module switches the charging state and the discharging state according to the first level signal and the second level signal; in the charging state, the charging and discharging module charges through the first DC voltage and outputs the first supply voltage; in the discharging state, the charging and discharging module couples the first DC voltage and the second DC voltage and outputs a second supply voltage greater than the first supply voltage.
[0096] In an exemplary embodiment, the electronic device may further include a transmission device and an input / output device, wherein the transmission device is connected to the processor, and the input / output device is connected to the processor.
[0097] For specific examples in this embodiment, reference may be made to the examples described in the above embodiments and exemplary implementation modes, and this embodiment will not be described in detail here.
[0098] Obviously, those skilled in the art should understand that the modules or steps of the present application described above can be implemented using a general-purpose computing device, they can be concentrated on a single computing device, or distributed across a network composed of multiple computing devices, they can be implemented using program code executable by the computing device, and thus, they can be stored in a storage device and executed by the computing device, and in some cases, the steps shown or described can be performed in a different order than herein, or they can be fabricated into separate integrated circuit modules, or multiple modules or steps can be fabricated into a single integrated circuit module for implementation. Thus, the present application is not limited to any specific combination of hardware and software.
[0099] The above description is merely a preferred embodiment of the present application and is not intended to limit the present application. Various modifications and variations are possible for those skilled in the art. Any modifications, equivalent substitutions, improvements, etc. made within the principles of the present application shall be included within the scope of protection of the present application.
Claims
1. A ripple power supply circuit, characterized in that: include: a DC power supply unit comprising a first power supply for providing a first DC voltage and a second power supply for providing a second DC voltage; a signal generating unit, configured to generate a frequency-adjustable signal, wherein the frequency-adjustable signal is composed of a first-level signal and a second-level signal alternately, wherein the first-level signal and the second-level signal are respectively a high-level signal and a low-level signal; a ripple generating unit, electrically connected to the DC power supply unit and the signal generating unit, respectively, for outputting a square wave voltage with ripple according to the first DC voltage, the second DC voltage and the frequency-adjustable signal, wherein: The ripple generating unit includes a charge and discharge module. In the charging state, the charge and discharge module is used to charge with the first DC voltage and output a first supply voltage; in the discharging state, the charge and discharge module is used to couple the first DC voltage and the second DC voltage to output a second supply voltage greater than the first supply voltage. The ripple generating unit also includes a first switching device and a second switching device connected in parallel, the first switching device and the second switching device are electrically connected to the signal generating unit, the first level signal is a high level signal, and the second level signal is a low level signal; the first switching device is an N-type switching MOSFET, and the second switching device is a P-type switching MOSFET, the gate of the P-type switching MOSFET and the gate of the N-type switching MOSFET are electrically connected to the signal generating unit, the drain of the P-type switching MOSFET and the drain of the N-type switching MOSFET are electrically connected to the charging and discharging module, the source of the P-type switching MOSFET is electrically connected to the second power supply, and the source of the N-type switching MOSFET is grounded.
2. The ripple power supply circuit according to claim 1, characterized in that: The switch module further includes: A unidirectional device is electrically connected to the source of the P-type switch MOS tube and the second power supply respectively.
3. The ripple power supply circuit according to claim 1, wherein: The charge and discharge module includes a first capacitor and a second capacitor connected in parallel, the first capacitor has a first end and a second end, and the second capacitor has a third end and a fourth end, wherein: The first end and the second end are electrically connected to the first power source; The third end and the fourth end are electrically connected to the switch module.
4. The ripple power supply circuit according to any one of claims 1 to 3, characterized in that: The first DC voltage is greater than the second DC voltage.
5. A power ripple test system, characterized in that: include: The ripple power supply circuit according to any one of claims 1 to 3, electrically connected to a power supply chip to be tested, and configured to provide a square wave voltage with a ripple to the power supply chip to be tested; The voltage waveform extraction device is electrically connected to the power chip to be tested and is used to extract the waveform of the output square wave voltage of the power chip to be tested.
6. The power ripple test system according to claim 5, characterized in that: Also includes: The ripple analysis unit is electrically connected to the voltage waveform extraction device and is used to analyze the waveform of the output square wave voltage to obtain the power ripple suppression ratio of the power chip to be tested.
Citation Information
Patent Citations
Testing device for power supply chip
CN215449506U