A high-speed serial bus margin test method, device, equipment and medium

Abstract

The present invention discloses a margin test method, device, equipment and medium for a high-speed serial bus, including: using a high-speed serial bus through a device under test, sending multiple original data signals to an oscilloscope in sequence, and applying a matching target loss value to the high-speed serial bus through the oscilloscope during the sending process of each original data signal; receiving target data signals corresponding to each target loss value through the oscilloscope; and determining the margin test result corresponding to the high-speed serial bus according to each target data signal through the oscilloscope. The technical solution of the embodiment of the present invention can ensure the accuracy of the margin test result of the high-speed serial bus and improve the test efficiency of the bus.

Description

Technical Field

[0001] The present invention relates to the field of communication technology, and in particular to a margin test method, device, equipment and medium for a high-speed serial bus. Background Art

[0002] In the field of communications, in order to avoid data signal loss and transmission bandwidth reduction during data transmission between devices, it is usually necessary to perform margin testing on the high-speed serial bus between devices.

[0003] In the prior art, when testing the margin of a high-speed serial bus, the high-speed serial bus connected to the device mainboard is usually tested according to a preset protocol specification. If the limit margin of the high-speed serial bus is detected and meets the margin specified in the protocol specification, it is considered that the high-speed serial bus meets the transmission requirements.

[0004] However, the prior art has the following technical defects: since the standard margin threshold specified in the protocol specification is relatively high, if the margin of the high-speed serial bus connected to the device mainboard meets the protocol requirements, but the high-speed serial bus of the external board does not meet the transmission requirements, it will also cause the bandwidth of the entire transmission link corresponding to the device mainboard to decrease, and data loss is very likely to occur. Summary of the invention

[0005] The present invention provides a high-speed serial bus margin test method, device, equipment and medium, which can ensure the accuracy of the high-speed serial bus margin test result and improve the test efficiency of the bus.

[0006] According to one aspect of the present invention, there is provided a margin test method for a high-speed serial bus, comprising:

[0007] Using a high-speed serial bus through the device under test, multiple original data signals are sequentially sent to the oscilloscope, and in the process of sending each original data signal, a matching target loss value is applied to the high-speed serial bus through the oscilloscope;

[0008] Receiving target data signals corresponding to each target loss value through the oscilloscope;

[0009] The oscilloscope is used to determine a margin test result corresponding to the high-speed serial bus according to each target data signal.

[0010] Optionally, before the device under test uses a high-speed serial bus to sequentially send a plurality of raw data signals to the oscilloscope, the method further includes:

[0011] In response to a loss range determination request, determining an initial loss value and a test step length according to the loss range, and applying the initial loss value and the test step length to a test module in the oscilloscope;

[0012] Sending a loss value measurement request to a network analyzer through the test module;

[0013] After receiving the loss value measurement request, the network analyzer determines multiple target loss values ​​according to the initial loss value and the test step length, and sends the multiple target loss values ​​to the oscilloscope.

[0014] Optionally, the network analyzer is used to determine a plurality of target loss values ​​according to the initial loss value and the test step length, including:

[0015] By means of the network analyzer, the test module is tested according to a preset transmission link to obtain a unit loss value corresponding to the test module;

[0016] The network analyzer is used to determine a plurality of target loss values ​​according to the initial loss value, the test step length, and the unit loss value.

[0017] Optionally, during the transmission of each original data signal, a matching target loss value is applied to the high-speed serial bus through an oscilloscope, including:

[0018] During the transmission of each original data signal, each target loss value is sequentially applied to the high-speed serial bus in an increasing loss value manner through an oscilloscope.

[0019] Optionally, receiving target data signals corresponding to each target loss value respectively through the oscilloscope includes:

[0020] By means of the oscilloscope, according to the order in which the target data signals are received, one target data signal is sequentially acquired from the plurality of target data signals as the current target data signal;

[0021] Obtaining a code pattern matched by the current target data signal, and displaying the code pattern in a visual interface;

[0022] Analyze the code pattern matched by the current target data signal, and determine whether the current target data signal is tested successfully according to the analysis result;

[0023] If yes, then return to execute the operation of applying the matching target loss value to the high-speed serial bus through the oscilloscope during the transmission process of each original data signal until it is detected that all the target loss values ​​have been applied;

[0024] If not, the process continues to return to the operation of obtaining the code pattern that matches the current target data signal until it is detected that the number of times the current target data signal test fails reaches a preset threshold and all target loss values ​​are applied.

[0025] Optionally, determining, by the oscilloscope, a margin test result corresponding to the high-speed serial bus according to each target data signal, includes:

[0026] Generate a test report corresponding to the high-speed serial bus according to the test results corresponding to each target data signal through the oscilloscope;

[0027] According to the test report and the test eye diagram corresponding to each target data signal, a margin test result corresponding to the high-speed serial bus is determined.

[0028] Optionally, obtaining a code pattern matched by the current target data signal and displaying the code pattern in a visual interface includes:

[0029] Through the oscilloscope, the voltage scale value preset in the oscilloscope is adjusted according to the actual voltage value of the target data signal, and the code pattern is displayed in a visual interface according to the adjustment result.

[0030] According to another aspect of the present invention, a high-speed serial bus margin test device is provided, the device comprising:

[0031] A loss value applying module is used to sequentially send a plurality of original data signals to the oscilloscope through the device under test using a high-speed serial bus, and to apply a matching target loss value to the high-speed serial bus through the oscilloscope during the sending process of each original data signal;

[0032] A signal receiving module, used for receiving target data signals corresponding to each target loss value through the oscilloscope;

[0033] The margin test module is used to determine the margin test result corresponding to the high-speed serial bus according to each target data signal through the oscilloscope.

[0034] According to another aspect of the present invention, an electronic device is provided, the electronic device comprising:

[0035] at least one processor; and

[0036] a memory communicatively connected to the at least one processor; wherein,

[0037] The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can execute the margin test method for the high-speed serial bus described in any embodiment of the present invention.

[0038] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, wherein the computer instructions are used to enable a processor to implement the margin test method for a high-speed serial bus described in any embodiment of the present invention when executed.

[0039] According to another aspect of the present invention, a computer program product is provided. The computer program product includes a computer program. When the computer program is executed by a processor, the margin test method for a high-speed serial bus according to any embodiment of the present invention is implemented.

[0040] The technical solution provided by the embodiment of the present invention uses a high-speed serial bus through the device under test to send multiple original data signals to the oscilloscope in sequence, and in the process of sending each original data signal, applies a matching target loss value to the high-speed serial bus through the oscilloscope, receives the target data signals corresponding to each target loss value through the oscilloscope, and determines the technical means of the margin test result corresponding to the high-speed serial bus according to each target data signal through the oscilloscope. The test efficiency of the bus can be improved, the accuracy of the margin test result can be ensured, the authenticity of the target loss value can be improved, the clarity of the code type of the target data signal in the oscilloscope interface can be ensured, the interface utilization of the oscilloscope can be improved, and the automation of the bus margin test can be realized.

[0041] It should be understood that the contents described in this section are not intended to identify the key or important features of the embodiments of the present invention, nor are they intended to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0043] Figure 1 is a flow chart of a high-speed serial bus margin testing method provided according to an embodiment of the present invention;

[0044] Figure 2 is a flow chart of another high-speed serial bus margin testing method provided according to an embodiment of the present invention;

[0045] Figure 3 is a flow chart of another high-speed serial bus margin testing method provided according to an embodiment of the present invention;

[0046] Figure 4is a structural schematic diagram of a high-speed serial bus margin test device provided according to an embodiment of the present invention;

[0047] Figure 5 The invention is a schematic structural diagram of an electronic device for implementing the margin test method of a high-speed serial bus according to an embodiment of the present invention. DETAILED DESCRIPTION

[0048] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0049] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0050] Figure 1 A flowchart of a high-speed serial bus margin test method provided by an embodiment of the present invention. This embodiment is applicable to the case of testing the margin of a high-speed serial bus. The method can be performed by a high-speed serial bus margin test device. The high-speed serial bus margin test device can be implemented in the form of hardware and / or software. The high-speed serial bus margin test device can be configured in an electronic device with data processing function (such as a terminal or server). Figure 1 As shown, the method includes:

[0051] Step 110: The device under test uses a high-speed serial bus to sequentially send multiple original data signals to the oscilloscope, and during the transmission of each original data signal, a matching target loss value is applied to the high-speed serial bus through the oscilloscope.

[0052] In this embodiment, the device under test (DUT) may be an electronic device with data transceiver function, used to test the margin of a high-speed serial bus, and the high-speed serial bus may be a bus for serial transmission of high-speed signals. Specifically, the signal may include a high-speed serial computer expansion bus standard (Peripheral Component Interconnect express, PCIe) signal, a serial advanced technology attachment (Serial Advanced Technology Attachment, SATA) signal, a serial attached small computer system interface (Serial Attached Small Computer System Interface, SAS) signal, and a universal serial bus (Universal Serial Bus, USB) signal, etc.

[0053] In this step, a plurality of original data signals may be sequentially sent to the oscilloscope through the device under test. During the sending process of each original data signal, the oscilloscope may apply a target loss value matching the original data signal to the high-speed serial bus.

[0054] In a specific embodiment, before the device under test sends the original data signal to the oscilloscope, multiple target loss values ​​can be randomly selected in advance. During the transmission of each original data signal, the oscilloscope can sequentially apply the matching target loss values ​​to the high-speed serial bus according to the selection order of the target loss values.

[0055] In one implementation of this embodiment, when the device under test is connected to the oscilloscope, the first channel (CH1) and the third channel (CH3) of the oscilloscope can be connected to the CK+ and CK- interfaces of the device under test, respectively, and the second channel (CH2) and the fourth channel (CH4) of the oscilloscope can be connected to the D+ and D- interfaces of the device under test, respectively, and finally the control signal interface of the device under test is connected to the signal receiving interface of the oscilloscope.

[0056] Step 120: Receive target data signals corresponding to each target loss value through the oscilloscope.

[0057] In this embodiment, each time the oscilloscope applies a target loss value to the high-speed serial bus, the oscilloscope may receive a data signal (ie, a target data signal) at the target loss value.

[0058] Step 130: Determine a margin test result corresponding to the high-speed serial bus according to each target data signal through the oscilloscope.

[0059] In this embodiment, when the device under test has completed sending all original data signals, that is, when the oscilloscope has completed receiving each target data signal, the margin test result corresponding to the high-speed serial bus can be determined according to all target data signals.

[0060] In a specific embodiment, after the oscilloscope receives all the target data signals, it can determine the transmission performance of the high-speed serial bus according to the change trend of different target data signals under different loss values, and then calculate the corresponding margin test result of the high-speed serial bus according to the transmission performance and a preset linear or nonlinear algorithm.

[0061] Optionally, in order to quickly analyze the target data signal, the oscilloscope can save some parameters (such as voltage value) of the target data signal after receiving the target data signal. After receiving all the target data signals, the transmission performance of the high-speed serial bus can be determined according to the voltage value change trend of each target data signal.

[0062] In another specific embodiment, after the oscilloscope receives all target data signals, each target data signal can be compared with the original data signal, and the transmission performance of the high-speed serial bus can be determined based on the comparison result, and finally the margin test result corresponding to the high-speed serial bus can be determined based on the transmission performance.

[0063] Optionally, after obtaining the margin test result, the oscilloscope can compare the margin test result with the preset margin, and judge whether the high-speed serial bus meets the transmission requirements according to the comparison result. The preset margin can be a pre-set margin threshold corresponding to the high-speed serial bus connected to the mainboard of the device under test.

[0064] In practical applications, the prior art usually tests the high-speed serial bus connected to the mainboard of the device under test according to the preset protocol specification. Assuming that the standard margin threshold specified in the protocol specification is 20K, as long as the margin of the high-speed serial bus connected to the mainboard is less than 20K, it can be considered that the high-speed serial bus meets the transmission requirements. However, since the standard margin threshold specified in the protocol specification is relatively high, if the margin of the high-speed serial bus connected to the mainboard of the device meets the protocol requirements, but the high-speed serial bus of the external board does not meet the transmission requirements, it will also cause the bandwidth of the entire transmission link corresponding to the mainboard of the device to decrease, and it is very likely that data will be lost. Compared with the prior art, this embodiment can quantify the margin test results of the high-speed serial bus connected to the mainboard of the device under test, and combine the specific quantization results and the margin threshold corresponding to the high-speed serial bus connected to the mainboard (the margin threshold is less than the standard margin threshold in the protocol specification) to jointly determine whether the high-speed serial bus meets the transmission requirements, which can avoid the bandwidth decrease and data loss of the overall transmission link corresponding to the device under test.

[0065] In this embodiment, by applying multiple target loss values ​​to the high-speed serial bus and obtaining the target data signal under each target loss value through the oscilloscope, the oscilloscope can effectively measure the margin of the high-speed serial bus according to the reception results of different target data signals corresponding to different loss values. Compared with the method of testing the high-speed serial bus according to the protocol specification in the prior art, this embodiment can improve the accuracy of the margin test results; secondly, by automatically applying the matching target loss value to the high-speed serial bus through the oscilloscope, it can be achieved that during the margin test process, there is no need to frequently manually switch the bus loss value, thereby reducing damage to the adapter and cable and improving the test efficiency of the bus.

[0066] In this embodiment, a high-speed serial bus is used by the device under test to send multiple original data signals to the oscilloscope in sequence, and during the transmission of each original data signal, a matching target loss value is applied to the high-speed serial bus through the oscilloscope, and the target data signals corresponding to each target loss value are received by the oscilloscope. The oscilloscope determines the technical means of the margin test result corresponding to the high-speed serial bus according to each target data signal, which can ensure the accuracy of the high-speed serial bus margin test result and improve the test efficiency of the bus.

[0067] Figure 2 A flowchart of another high-speed serial bus margin test method provided by an embodiment of the present invention, such as Figure 2 As shown, the method includes:

[0068] Step 210: In response to the loss range determination request, determine an initial loss value and a test step length according to the loss range, and apply the initial loss value and the test step length to a test module in the oscilloscope.

[0069] In this embodiment, before the device under test sends the raw data signal to the oscilloscope, a user interface (User Interface, UI) can be provided to the user so that the user can fill in the loss range through the interface. After detecting that the user has completed filling in the loss range, that is, detecting that the user has triggered a loss range determination request, the initial loss value and the test step length can be determined according to the loss range filled in by the user, and the initial loss value and the test step length can be applied to the test module in the oscilloscope.

[0070] In a specific embodiment, the initial loss value may be a preset value. After the loss range and the initial loss value are acquired, the test step length may be calculated according to the maximum loss value defined in the loss range.

[0071] Step 220: Send a loss value measurement request to the network analyzer through the test module.

[0072] Step 230: After receiving the loss value measurement request, the network analyzer determines a plurality of target loss values ​​according to the initial loss value and the test step length, and sends the plurality of target loss values ​​to the oscilloscope.

[0073] In this step, optionally, after receiving the loss value measurement request, the network analyzer can sequentially increase the initial loss value according to the test step length to obtain multiple target loss values, and send the multiple target loss values ​​to the oscilloscope.

[0074] The advantage of this setting is that by determining multiple target loss values ​​according to the loss range filled in by the user, the test process of the high-speed serial bus can be ensured to be more in line with the actual application scenario, thereby improving the accuracy and effectiveness of the margin test results.

[0075] In one implementation of the present embodiment, the network analyzer is used to determine multiple target loss values ​​based on the initial loss value and the test step, including: the network analyzer is used to test the test module according to a preset transmission link to obtain a unit loss value corresponding to the test module; the network analyzer is used to determine multiple target loss values ​​based on the initial loss value, the test step and the unit loss value.

[0076] In this embodiment, after receiving the loss value measurement request through the network analyzer, multiple transmission links can be constructed through the preset sending device, the test module and the receiving device, and then the sending signal and the receiving signal of the transmission link are detected by the network analyzer respectively, and the unit loss value corresponding to the test module is calculated according to the sending signal, the receiving signal and the link length. The sending signal is the signal sent by the sending device, and the receiving signal is the signal received by the receiving device.

[0077] In a specific embodiment, assuming that the length of the transmission link is L1, the transmitted signal is a1, and the received signal is b1, the first loss S corresponding to the transmission link can be calculated according to the following formula: L1 :

[0078]

[0079] Assuming that the length of the transmission link is L2, the transmitted signal is a2, and the received signal is b2, the second loss S corresponding to the transmission link can be calculated according to the following formula: L2 :

[0080]

[0081] After calculating the first loss and the second loss corresponding to the above-mentioned different transmission links, the unit loss value S corresponding to the test module can be calculated according to the following formula: inch :

[0082] S inch =(S L1 -S L2 ) / (L1-L2)

[0083] In one implementation of this embodiment, after obtaining the unit loss value S inch After that, the target loss value S can be determined according to the following formula:

[0084] S=S IC +L*S inch

[0085] Among them, S IC is the initial loss value, and L is the test step length.

[0086] The advantage of this setting is that by testing the test module according to the preset transmission link through the network analyzer, the authenticity of the target loss value can be improved and the accuracy of the margin test result can be ensured.

[0087] In a specific embodiment, after the network analyzer determines multiple target loss values, each target loss value can be stored through Scatter parameters (S parameters). In order to enable the oscilloscope to effectively identify the target loss value, the network analyzer can also convert each S parameter into a filter file and send the filter file to the oscilloscope, so that the oscilloscope can quickly obtain each target loss value according to the filter file.

[0088] Step 240: Use a high-speed serial bus through the device under test to send multiple raw data signals to the oscilloscope in sequence.

[0089] Step 250: During the transmission of each original data signal, each target loss value is sequentially applied to the high-speed serial bus in an increasing loss value manner through an oscilloscope.

[0090] In this embodiment, optionally, before sending the original data signal to the oscilloscope through the device under test, multiple target loss values ​​can be pre-arranged in order from small to large, and a mapping relationship between each original data signal and the target loss value is established according to the sending order of each original data signal and the arrangement order of the target loss value, so that the oscilloscope can apply each target loss value to the high-speed serial bus in sequence according to the mapping relationship and in an increasing order of loss value.

[0091] The advantage of such a setting is that by acquiring each target data signal in a loss-increasing manner, the accuracy and reliability of subsequent margin test results can be improved.

[0092] Step 260: Receive target data signals corresponding to each target loss value through the oscilloscope.

[0093] Step 270: Determine, by means of the oscilloscope, a margin test result corresponding to the high-speed serial bus according to each target data signal.

[0094] The technical solution provided by the embodiment of the present invention determines an initial loss value and a test step length according to a loss range in response to a loss range determination request, applies the initial loss value and the test step length to a test module in an oscilloscope, sends a loss value measurement request to a network analyzer through the test module, determines multiple target loss values ​​according to the initial loss value and the test step length through the network analyzer, and sends the multiple target loss values ​​to the oscilloscope. A high-speed serial bus is used by the device under test to sequentially send multiple original data signals to the oscilloscope. During the sending process of each original data signal, each target loss value is sequentially applied to the high-speed serial bus by the oscilloscope in an increasing manner according to the loss value. The target data signals corresponding to each target loss value are received by the oscilloscope. A technical means for determining a margin test result corresponding to the high-speed serial bus according to each target data signal can ensure the accuracy of the margin test result of the high-speed serial bus and improve the test efficiency of the bus.

[0095] Figure 3 A flowchart of another high-speed serial bus margin test method provided by an embodiment of the present invention, such as Figure 3 As shown, the method includes:

[0096] Step 301: Use a high-speed serial bus through the device under test to send multiple original data signals to the oscilloscope in sequence, and during the transmission of each original data signal, apply a matching target loss value to the high-speed serial bus through the oscilloscope.

[0097] Step 302: Using the oscilloscope, sequentially acquire one target data signal from a plurality of target data signals as the current target data signal according to the order in which the target data signals are received.

[0098] Step 303: Obtain a code pattern that matches the current target data signal, and display the code pattern in a visual interface.

[0099] In this step, optionally, after the oscilloscope acquires the current target data signal, it can sample the current target data signal to obtain a code pattern that matches the current target data signal.

[0100] In one implementation of the present embodiment, a code pattern matching the current target data signal is obtained, and the code pattern is displayed in a visual interface, including: adjusting, through the oscilloscope, a preset voltage scale value in the oscilloscope according to the actual voltage value of the target data signal, and displaying the code pattern in the visual interface according to the adjustment result.

[0101] In this embodiment, the oscilloscope can optionally adjust the preset voltage scale value according to the actual voltage value of the current target data signal and the preset ratio to ensure that the proportion of the code type of the target data signal in the oscilloscope interface meets the preset threshold. The threshold can be set to 80%, and the specific value can be preset according to the actual situation, which is not limited in this embodiment.

[0102] The advantage of this setting is that it can ensure the clarity of the code type of the target data signal in the oscilloscope interface and improve the interface utilization of the oscilloscope.

[0103] Step 304 , analyzing the code pattern matched by the current target data signal, and judging whether the current target data signal is tested successfully according to the analysis result, if so, executing step 305 , if not, executing step 308 .

[0104] In this step, the oscilloscope can optionally call Sigtest software to analyze the code pattern matched by the current target data signal, and determine whether the current target data signal is tested successfully based on the analysis result. Specifically, the Sigtest software can compare the analysis result of the code pattern with the analysis result of the standard code pattern corresponding to the original data signal, and determine whether the current target data signal is tested successfully based on the comparison result.

[0105] The advantage of such a setting is that by analyzing the code pattern matched by the target data signal, the accuracy of the target data signal test result can be improved, thereby ensuring the reliability of the high-speed serial bus margin test result.

[0106] Step 305, determine whether all target loss values ​​have been applied. If so, execute step 306. If not, return to execute step 301 to apply the matching target loss value to the high-speed serial bus through the oscilloscope during the transmission of each original data signal until it is detected that all target loss values ​​have been applied.

[0107] Step 306: Generate a test report corresponding to the high-speed serial bus according to the test results corresponding to each target data signal through the oscilloscope.

[0108] In this embodiment, after detecting that all target loss values ​​have been applied (that is, all original data signals have been sent), a test report corresponding to the high-speed serial bus can be generated based on the test results corresponding to all target data signals (such as test success or test failure).

[0109] Step 307: Determine a margin test result corresponding to the high-speed serial bus according to the test report and the test eye diagram corresponding to each target data signal.

[0110] In this step, the test report and the test eye diagram can be imported into a file of a preset format, and then the transmission performance of the high-speed serial bus can be determined according to the test report and the test eye diagram, and the margin test result corresponding to the high-speed serial bus can be calculated according to the transmission performance and a preset linear or nonlinear algorithm. The file of the preset format can be an Excel file, a TXT file, etc.

[0111] The advantage of such a setting is that by determining the margin test result corresponding to the high-speed serial bus according to the test report and the test eye diagram, the automation of the bus margin test can be realized, thereby improving the accuracy of the margin test result.

[0112] Step 308, determine whether the number of failures in the current target data signal test reaches the preset threshold. If so, execute step 305. If not, return to execute the operation of obtaining the code type matching the current target data signal in step 303 until it is detected that the number of failures in the current target data signal test reaches the preset threshold and all target loss values ​​are applied.

[0113] In this embodiment, optionally, if the current target data signal test fails, the number of times the current target data signal test fails can be counted by an oscilloscope, and it can be determined whether the statistical result reaches a preset threshold value. If so, the remaining target data signals are continued to be received; if not, a request can be sent to transmit a matching original data signal to the device under test to reacquire the code pattern matching the current target data signal. The threshold value can be set to 3, and the specific value can be preset according to the actual situation, which is not limited in this embodiment.

[0114] The advantage of this setting is that by setting a threshold for the number of test failures, multiple retest processes can be implemented to eliminate the uniqueness of the data and improve the accuracy of the test results.

[0115] The technical solution provided by the embodiment of the present invention adopts a high-speed serial bus through the device under test to send multiple original data signals to the oscilloscope in sequence, and in the process of sending each original data signal, the oscilloscope applies a matching target loss value to the high-speed serial bus, and the oscilloscope sequentially obtains a target data signal from multiple target data signals as the current target data signal according to the receiving order of the target data signal, obtains the code pattern matching the current target data signal, and displays the code pattern in a visual interface, analyzes the code pattern matching the current target data signal, and judges whether the current target data signal is tested successfully according to the analysis result. If so, judge whether all the target loss values ​​are applied. If so, the oscilloscope generates a test report corresponding to the high-speed serial bus according to the test results corresponding to each target data signal, and determines the technical means of the margin test result corresponding to the high-speed serial bus according to the test report and the test eye diagram corresponding to each target data signal, which can ensure the accuracy of the margin test result of the high-speed serial bus and improve the test efficiency of the bus.

[0116] Figure 4 A schematic diagram of the structure of a high-speed serial bus margin test device provided by an embodiment of the present invention is shown in FIG. Figure 4 As shown, the device includes: a loss value applying module 410 , a signal receiving module 420 and a margin testing module 430 .

[0117] The loss value applying module 410 is used to sequentially send multiple original data signals to the oscilloscope using a high-speed serial bus through the device under test, and apply a matching target loss value to the high-speed serial bus through the oscilloscope during the sending process of each original data signal;

[0118] The signal receiving module 420 is used to receive the target data signals corresponding to each target loss value through the oscilloscope;

[0119] The margin test module 430 is used to determine the margin test result corresponding to the high-speed serial bus according to each target data signal through the oscilloscope.

[0120] The technical solution provided by the embodiment of the present invention uses a high-speed serial bus through the device under test to send multiple original data signals to the oscilloscope in sequence, and in the process of sending each original data signal, applies a matching target loss value to the high-speed serial bus through the oscilloscope, receives the target data signals corresponding to each target loss value through the oscilloscope, and determines the margin test result corresponding to the high-speed serial bus according to each target data signal through the oscilloscope. The technical means can ensure the accuracy of the margin test result of the high-speed serial bus and improve the test efficiency of the bus.

[0121] Based on the above embodiment, the device further includes:

[0122] An initial loss value applying module, for responding to a loss range determination request, determining an initial loss value and a test step length according to the loss range, and applying the initial loss value and the test step length to a test module in the oscilloscope;

[0123] A measurement request sending module, used to send a loss value measurement request to the network analyzer through the test module;

[0124] The loss value determination module is used to determine multiple target loss values ​​according to the initial loss value and the test step length after receiving a loss value measurement request through the network analyzer, and send the multiple target loss values ​​to the oscilloscope.

[0125] Wherein, the loss value determination module includes:

[0126] A unit loss value determination unit, configured to test the test module according to a preset transmission link through the network analyzer to obtain a unit loss value corresponding to the test module;

[0127] The target loss value determination unit is used to determine a plurality of target loss values ​​according to the initial loss value, the test step length and the unit loss value through the network analyzer.

[0128] The loss value applying module 410 includes:

[0129] The target loss value applying unit is used to apply each target loss value to the high-speed serial bus in sequence in an increasing loss value manner through an oscilloscope during the transmission process of each original data signal.

[0130] The signal receiving module 420 includes:

[0131] a signal acquisition unit, configured to sequentially acquire one target data signal from a plurality of target data signals as a current target data signal according to a receiving order of the target data signals through the oscilloscope;

[0132] A code pattern display unit, used to obtain a code pattern matched by the current target data signal and display the code pattern in a visual interface;

[0133] A code pattern analysis unit is used to analyze the code pattern matched by the current target data signal, and determine whether the current target data signal is tested successfully according to the analysis result. If so, return to execute the operation of applying the matched target loss value to the high-speed serial bus through the oscilloscope during the transmission of each original data signal until it is detected that all the target loss values ​​have been applied; if not, continue to return to execute the operation of obtaining the code pattern matched by the current target data signal until it is detected that the number of times the current target data signal fails to test reaches a preset threshold and all the target loss values ​​have been applied;

[0134] The voltage scale adjustment unit is used to adjust the voltage scale value preset in the oscilloscope according to the actual voltage value of the target data signal through the oscilloscope, and display the code type in a visual interface according to the adjustment result.

[0135] The margin test module 430 includes:

[0136] A test report generating unit, configured to generate a test report corresponding to the high-speed serial bus according to the test results corresponding to each target data signal through the oscilloscope;

[0137] The margin result determining unit is used to determine the margin test result corresponding to the high-speed serial bus according to the test report and the test eye diagram corresponding to each target data signal.

[0138] The above device can execute the methods provided by all the above embodiments of the present invention, and has the corresponding functional modules and beneficial effects of executing the above methods. For technical details not fully described in the embodiments of the present invention, please refer to the methods provided by all the above embodiments of the present invention.

[0139] Figure 5 A schematic diagram of the structure of an electronic device 10 that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or required herein.

[0140] like Figure 5As shown, the electronic device 10 includes at least one processor 11, and a memory connected to the at least one processor 11, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., wherein the memory stores a computer program that can be executed by at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 to the random access memory (RAM) 13. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected to each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0141] A number of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network such as the Internet and / or various telecommunication networks.

[0142] The processor 11 may be a variety of general and / or special processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as a margin test method for a high-speed serial bus.

[0143] In some embodiments, the margin test method of the high-speed serial bus can be implemented as a computer program, which is tangibly contained in a computer-readable storage medium, such as a storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the margin test method of the high-speed serial bus described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to execute the margin test method of the high-speed serial bus in any other appropriate manner (for example, by means of firmware).

[0144] Various implementations of the systems and techniques described above herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), systems on chips (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various implementations can include: being implemented in one or more computer programs that can be executed and / or interpreted on a programmable system including at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0145] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, so that when the computer program is executed by the processor, the functions / operations specified in the flow chart and / or block diagram are implemented. The computer program may be executed entirely on the machine, partially on the machine, partially on the machine and partially on a remote machine as a stand-alone software package, or entirely on a remote machine or server.

[0146] In the context of the present invention, a computer-readable storage medium may be a tangible medium that may contain or store a computer program for use by or in combination with an instruction execution system, device or equipment. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. A more specific example of a machine-readable storage medium may include an electrical connection based on one or more lines, a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0147] To provide interaction with a user, the systems and techniques described herein may be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices may also be used to provide interaction with the user; for example, the feedback provided to the user may be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form (including acoustic input, voice input, or tactile input).

[0148] The systems and techniques described herein may be implemented in a computing system that includes backend components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes frontend components (e.g., a user computer with a graphical user interface or a web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such backend components, middleware components, or frontend components. The components of the system may be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0149] A computing system may include a client and a server. The client and the server are generally remote from each other and usually interact through a communication network. The client and server relationship is generated by computer programs running on the corresponding computers and having a client-server relationship with each other. The server may be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system to solve the defects of difficult management and weak business scalability in traditional physical hosts and VPS services.

[0150] It should be understood that the various forms of processes shown above can be used to reorder, add or delete steps. For example, the steps described in the present invention can be executed in parallel, sequentially or in different orders, as long as the desired results of the technical solution of the present invention can be achieved, and this document does not limit this.

[0151] The above specific implementations do not constitute a limitation on the protection scope of the present invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions can be made according to design requirements and other factors. Any modification, equivalent substitution and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A margin test method for a high-speed serial bus, characterized in that: include: Using a high-speed serial bus through the device under test, multiple original data signals are sequentially sent to the oscilloscope, and in the process of sending each original data signal, a matching target loss value is applied to the high-speed serial bus through the oscilloscope; Receiving target data signals corresponding to each target loss value through the oscilloscope; Determining, by the oscilloscope, a margin test result corresponding to the high-speed serial bus according to each of the target data signals; Among them, according to each of the target data signals, determining the margin test result corresponding to the high-speed serial bus includes: comparing each of the target data signals with the original data signal, and determining the transmission performance of the high-speed serial bus according to the comparison result; determining the margin test result corresponding to the high-speed serial bus according to the transmission performance.

2. The method according to claim 1, characterized in that Before sending multiple raw data signals to the oscilloscope in sequence through the device under test using a high-speed serial bus, it also includes: In response to a loss range determination request, determining an initial loss value and a test step length according to the loss range, and applying the initial loss value and the test step length to a test module in the oscilloscope; Sending a loss value measurement request to a network analyzer through the test module; After receiving the loss value measurement request, the network analyzer determines multiple target loss values ​​according to the initial loss value and the test step length, and sends the multiple target loss values ​​to the oscilloscope.

3. The method according to claim 2, characterized in that Determining multiple target loss values ​​by the network analyzer according to the initial loss value and the test step length, including: By means of the network analyzer, the test module is tested according to a preset transmission link to obtain a unit loss value corresponding to the test module; The network analyzer is used to determine a plurality of target loss values ​​according to the initial loss value, the test step length, and the unit loss value.

4. The method according to claim 1, characterized in that: During the transmission of each original data signal, a matching target loss value is applied to the high-speed serial bus through an oscilloscope, including: During the transmission of each original data signal, each target loss value is sequentially applied to the high-speed serial bus in an increasing loss value manner through an oscilloscope.

5. The method according to claim 1, characterized in that Receiving target data signals corresponding to each target loss value through the oscilloscope, including: By means of the oscilloscope, according to the order in which the target data signals are received, one target data signal is sequentially acquired from the plurality of target data signals as the current target data signal; Obtaining a code pattern matched by the current target data signal, and displaying the code pattern in a visual interface; Analyze the code pattern matched by the current target data signal, and determine whether the current target data signal is tested successfully according to the analysis result; If yes, then return to execute the operation of applying the matching target loss value to the high-speed serial bus through the oscilloscope during the transmission process of each original data signal until it is detected that all the target loss values ​​have been applied; If not, the process continues to return to the operation of obtaining the code pattern that matches the current target data signal until it is detected that the number of times the current target data signal test fails reaches a preset threshold and all target loss values ​​are applied.

6. The method according to claim 5, characterized in that Determining, by the oscilloscope, a margin test result corresponding to the high-speed serial bus according to each of the target data signals, including: Generate a test report corresponding to the high-speed serial bus according to the test results corresponding to each target data signal through the oscilloscope; According to the test report and the test eye diagram corresponding to each target data signal, a margin test result corresponding to the high-speed serial bus is determined.

7. The method according to claim 5, characterized in that Obtain the code pattern matched by the current target data signal and display the code pattern in a visual interface, including: Through the oscilloscope, the voltage scale value preset in the oscilloscope is adjusted according to the actual voltage value of the target data signal, and the code pattern is displayed in a visual interface according to the adjustment result.

8. A high-speed serial bus margin test device, characterized in that: include: A loss value applying module is used to sequentially send a plurality of original data signals to the oscilloscope through the device under test using a high-speed serial bus, and to apply a matching target loss value to the high-speed serial bus through the oscilloscope during the sending process of each original data signal; A signal receiving module, used for receiving target data signals corresponding to each target loss value through the oscilloscope; A margin test module, used to determine a margin test result corresponding to the high-speed serial bus according to each of the target data signals through the oscilloscope; Among them, according to each of the target data signals, determining the margin test result corresponding to the high-speed serial bus includes: comparing each of the target data signals with the original data signal, and determining the transmission performance of the high-speed serial bus according to the comparison result; determining the margin test result corresponding to the high-speed serial bus according to the transmission performance.

9. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor so that the at least one processor can perform the margin test method for a high-speed serial bus according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the margin test method for a high-speed serial bus according to any one of claims 1 to 7 when executed.

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