Fault device positioning method, apparatus, device, and storage medium

Abstract

The application provides a fault device positioning method, device and storage medium. The method comprises the following steps: in response to a multi-dimensional query instruction, querying a target execution machine list corresponding to the multi-dimensional query instruction, and reading a device cluster in the target execution machine list; obtaining each detection dimension information in the multi-dimensional query instruction, grouping the device cluster according to each detection dimension, and obtaining a device sub-cluster corresponding to each dimension detection information; for each device sub-cluster, generating a health detection instruction corresponding to the device sub-cluster according to device information and historical detection data of the device sub-cluster, and sending the health detection instruction to the device sub-cluster; receiving device feedback information in each device sub-cluster, and positioning a fault device in the device cluster according to the device feedback information. The method can accurately monitor each device cluster, quickly and efficiently position the fault device in the device cluster, and improve the fault device detection efficiency.

Description

Technical Field

[0001] The present application relates to the field of Internet of Things technology, and in particular to a method, apparatus, device and storage medium for locating a faulty device. Background Art

[0002] With the advancement of digital technology, many enterprises are deploying various business systems to execute various operations. Existing financial systems contain a variety of subsystems, each of which requires multiple physical or virtual devices to form a device cluster to operate together and execute its functions. However, in scenarios such as large-scale subsystem releases, application rollouts, and data center maintenance, operations and maintenance personnel struggle to quickly locate faulty devices, resulting in low maintenance efficiency. Summary of the Invention

[0003] The embodiments of the present application provide a method, apparatus, device, and storage medium for locating a faulty device, aiming to solve the technical problem in the prior art of being difficult to accurately locate a faulty device in a device cluster.

[0004] In one aspect, an embodiment of the present application provides a method for locating a faulty device, the method comprising the following steps:

[0005] In response to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list;

[0006] Acquire each detection dimension information in the multi-dimensional query instruction, group the device cluster according to each detection dimension information, and obtain a device sub-cluster corresponding to each dimension detection information;

[0007] For each device subcluster, generate a health detection instruction based on the device information of the device subcluster and the historical detection data of the device subcluster, and send the health detection instruction to the device subcluster;

[0008] Receive device feedback information from each of the device subclusters, and locate the faulty device according to the device feedback information.

[0009] In a possible implementation of the present application, responding to a multi-dimensional query instruction, querying a target execution machine list corresponding to the multi-dimensional query instruction, and reading a device cluster in the target execution machine list includes:

[0010] Accessing a preset content management system to obtain cluster address information of each execution machine list stored in the preset content management system;

[0011] Obtaining target address information of the multi-dimensional query instruction, comparing the target address information with each cluster address information, and obtaining cluster address similarity;

[0012] A target execution machine list whose cluster address similarity is greater than a preset similarity threshold is obtained, and the device clusters in the target execution machine list are read.

[0013] In a possible implementation of the present application, for each device subcluster, generating a health check instruction based on the device information of the device subcluster and the historical detection data of the device subcluster, and sending the health check instruction to the device subcluster includes:

[0014] For each device subcluster, obtain device information of the device subcluster and historical detection data of the device subcluster;

[0015] Read the dimension detection parameter corresponding to the target field in the historical detection data, generate a health detection instruction for the device subcluster according to the device information and the dimension detection parameter, and send the health detection instruction to the device subcluster.

[0016] In a possible implementation of the present application, the receiving device feedback information of each of the device subclusters and locating the faulty device in the device subclusters according to the device feedback information includes:

[0017] Detecting a preset data transmission interface to obtain device feedback information generated by each of the device subclusters based on the health detection instruction, and a device feedback time corresponding to the device feedback information;

[0018] The faulty device in the device sub-cluster is located according to the device feedback information and the device feedback time.

[0019] In a possible implementation of the present application, determining the faulty device in the device subcluster according to the device feedback information and the device feedback time includes:

[0020] Obtaining a verification code from the device feedback information, and matching the verification code with a preset verification code;

[0021] If the check code does not match the preset verification code and / or the device feedback time exceeds a preset feedback time threshold, a faulty device in the device subcluster corresponding to the device feedback information is determined.

[0022] In a possible implementation of the present application, the receiving device feedback information of each device sub-cluster and locating the faulty device in the device cluster according to the device feedback information includes:

[0023] receiving device feedback information of each of the device subclusters, and generating a cluster status image according to the device feedback information and a preset cluster image template;

[0024] Inputting the cluster state image into a preset cluster detection model for feature extraction to obtain cluster state features corresponding to the cluster state image;

[0025] An abnormal state detection is performed on the cluster state feature to obtain a faulty device feature in the cluster state feature, and a faulty device corresponding to the faulty device feature is located.

[0026] In a possible implementation of the present application, after locating the faulty device in the device sub-cluster according to the device feedback information, the method further includes:

[0027] Acquire multi-dimensional device information of the faulty device, wherein the multi-dimensional device information includes at least one of a device identifier, an application identifier, and a device subcluster identifier;

[0028] The preset alarm information is configured based on the multi-dimensional device information, fault alarm information of the faulty device is generated, and the fault alarm information is displayed on a preset display interface.

[0029] On the other hand, the present application provides a device for locating a faulty device, the device comprising:

[0030] An instruction acquisition module is configured to respond to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list;

[0031] a cluster reading module configured to obtain each detection dimension information in the multi-dimensional query instruction, group the device cluster according to each detection dimension information, and obtain a device sub-cluster corresponding to each dimension detection information;

[0032] The cluster grouping module is configured to generate, for each device sub-cluster, a health detection instruction corresponding to the device sub-cluster based on the device information and historical detection data of the device sub-cluster, and send the health detection instruction to the device sub-cluster;

[0033] The fault location module is configured to receive feedback information from devices in each of the device subclusters and locate a faulty device in the device cluster according to the device feedback information.

[0034] On the other hand, the present application also provides a faulty device locating device, the faulty device locating device comprising:

[0035] one or more processors;

[0036] Memory; and

[0037] One or more application programs, wherein the one or more application programs are stored in the memory and configured to be executed by the processor to implement the steps of the faulty device locating method.

[0038] On the other hand, the present application also provides a computer-readable storage medium on which a computer program is stored. The computer program is loaded by a processor to execute the steps in the faulty device locating method.

[0039] In this application, by responding to a multi-dimensional query instruction, querying the target execution machine list corresponding to the multi-dimensional query instruction, and reading the device clusters in the target execution machine list; obtaining each detection dimension information in the multi-dimensional query instruction, grouping the device clusters according to each detection dimension information, and obtaining the device sub-clusters corresponding to each dimension detection information; for each device sub-cluster, generating the health detection instruction corresponding to the device sub-cluster according to the device information and historical detection data of the device sub-cluster, and sending the health detection instruction to the device sub-cluster; receiving the device feedback information in each device sub-cluster, and locating the faulty device in the device cluster according to the device feedback information. Accurately monitor each device cluster, quickly and efficiently locate the faulty device in the device cluster, and improve the efficiency of faulty device detection. BRIEF DESCRIPTION OF THE DRAWINGS

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative work.

[0041] Figure 1 A schematic diagram of a scenario of a method for locating a faulty device according to an embodiment of the present application;

[0042] Figure 2 This is a flow chart of an embodiment of a method for locating a faulty device in an embodiment of the present application;

[0043] Figure 3 A flowchart of an embodiment of the method for locating a faulty device according to device feedback information and device feedback time in a device cluster provided in an embodiment of the present application;

[0044] Figure 4 A flowchart of an embodiment of the method for locating a faulty device according to device feedback information in an embodiment of the present application;

[0045] Figure 5This is a schematic structural diagram of an embodiment of a faulty equipment locating device provided in an embodiment of the present application;

[0046] Figure 6 This is a schematic structural diagram of an embodiment of a faulty device locating device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0047] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without making creative efforts shall fall within the scope of protection of the present invention.

[0048] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside" and the like indicate positions or positional relationships based on the positions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the said features. In the description of the present invention, the meaning of "multiple" is two or more, unless otherwise clearly and specifically defined.

[0049] In this application, the word "exemplary" is used to mean "serving as an example, illustration, or illustration." Any embodiment described in this application as "exemplary" is not necessarily to be construed as preferred or advantageous over other embodiments. The following description is given to enable any person skilled in the art to make and use the invention. In the following description, details are listed for the purpose of explanation. It should be understood that one of ordinary skill in the art will recognize that the invention can be practiced without these specific details. In other instances, well-known structures and processes are not described in detail to avoid obscuring the description of the invention with unnecessary detail. Therefore, the present invention is not intended to be limited to the embodiments shown, but is to be accorded the widest scope consistent with the principles and features disclosed herein.

[0050] With the advancement of digital technology, many enterprises are deploying various business systems to execute various operations. Existing financial systems contain a variety of subsystems, each of which requires multiple physical or virtual devices to form a device cluster to operate together and execute its functions. However, in scenarios such as large-scale subsystem releases, application rollouts, and data center maintenance, operations and maintenance personnel struggle to quickly locate faulty devices, resulting in low maintenance efficiency.

[0051] Based on this, the present application proposes a method, apparatus, device and computer-readable storage medium for locating a faulty device to solve the technical problem in the prior art that it is difficult to accurately locate a faulty device in a device cluster.

[0052] The faulty device locating method in an embodiment of the present invention is applied to a faulty device locating device, which is arranged in the faulty device locating device. The faulty device locating device is provided with one or more processors, memories, and one or more applications, wherein the one or more applications are stored in the memories and configured to be executed by the processor to implement the faulty device locating method; wherein the faulty device locating device can be an intelligent terminal, such as a mobile phone, a tablet computer, a smart TV, a network device, and a smart computer, etc.; optionally, the faulty device locating device can also be a single device, or a service cluster composed of multiple devices.

[0053] like Figure 1 As shown, Figure 1 This is a scenario diagram of the faulty device locating method according to an embodiment of the present application. The faulty device locating scenario in the embodiment of the present invention includes a faulty device locating device 100 (a faulty device locating device is integrated in the faulty device locating device 100) and a device cluster 200. A computer-readable storage medium corresponding to the faulty device locating method is running in the faulty device locating device 100 to execute the steps of the faulty device locating method. The device cluster 200 can be a server cluster or an intelligent terminal cluster composed of multiple servers or devices.

[0054] It is understandable that Figure 1 The faulty device locating device in the faulty device locating method scenario shown, or the devices included in the faulty device locating device, does not constitute a limitation on the embodiments of the present invention. That is, the number of devices and types of devices included in the faulty device locating device scenario of the faulty device locating method, or the number and types of devices included in each device, do not affect the overall implementation of the technical solution in the embodiments of the present invention, and can all be regarded as equivalent replacements or derivatives of the technical solution claimed to be protected in the embodiments of the present invention.

[0055] In the embodiment of the present invention, the faulty device locating device 100 is mainly used for: responding to a multi-dimensional query instruction, querying a target execution machine list corresponding to the multi-dimensional query instruction, and reading a device cluster in the target execution machine list; obtaining each detection dimension information in the multi-dimensional query instruction, grouping the device cluster according to each detection dimension information, and obtaining a device sub-cluster corresponding to each dimension detection information; for each device sub-cluster, generating a health detection instruction corresponding to the device sub-cluster according to the device information and historical detection data of the device sub-cluster, and sending the health detection instruction to the device sub-cluster; receiving device feedback information in each device sub-cluster, and locating the faulty device in the device cluster according to the device feedback information.

[0056] The faulty device locating device 100 in the embodiment of the present invention can be an independent faulty device locating device, such as a smart terminal such as a mobile phone, tablet computer, smart TV, network device, device and smart computer, or it can be a faulty device locating network or faulty device locating cluster composed of multiple faulty device locating devices.

[0057] The embodiments of the present application provide a method, apparatus, device, and computer-readable storage medium for locating a faulty device, which are described in detail below.

[0058] It will be understood by those skilled in the art that Figure 1 The application environment shown in is only one of the application scenarios related to the present application solution and does not constitute a limitation on the application scenario of the present application solution. Other application environments may also include Figure 1 More or fewer faulty device locating devices, or faulty device locating network connection relationships, are shown, e.g. Figure 1 Only one faulty device locating device is shown. It can be understood that the scenario of the faulty device locating method can also include one or more faulty device locating devices, which is not specifically limited here; the faulty device locating device 100 can also include a memory for storing an execution machine list and other data.

[0059] It should be noted that Figure 1 The scenario diagram of the faulty device locating method shown is only an example. The scenario of the faulty device locating method described in the embodiment of the present invention is to more clearly illustrate the technical solution of the embodiment of the present invention and does not constitute a limitation on the technical solution provided by the embodiment of the present invention.

[0060] Based on the scenario of the above-mentioned faulty device locating method, various embodiments of the faulty device locating method disclosed in the present invention are proposed.

[0061] like Figure 2 As shown, Figure 2This is a flow chart of an embodiment of a method for locating a faulty device in an embodiment of the present application. The method for locating a faulty device includes the following steps 201 to 204:

[0062] 201. Respond to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list;

[0063] The faulty device locating method in this embodiment is applied to a faulty device locating device. The type and quantity of the faulty device locating device are not specifically limited. That is, the faulty device locating device can be one or more smart terminals or devices. In a specific embodiment, the faulty device locating device is a smart computer.

[0064] Specifically, the faulty device locating device is configured to respond to multi-dimensional query instructions, obtain the device cluster corresponding to the multi-dimensional query instruction, generate health check instructions for each device sub-cluster within the device cluster, and use the health check instructions to locate the faulty device in the device cluster. The device cluster is a virtual server cluster or physical server cluster set up in each business system to support the operation of the business system.

[0065] Specifically, during operation, the faulty device locating device receives a multi-dimensional query instruction and queries the device cluster corresponding to the multi-dimensional query instruction. The triggering method of the multi-dimensional query instruction is not specifically limited here, that is, the multi-dimensional query instruction can be actively triggered by the user. For example, in one embodiment, the user is an operation and maintenance personnel of the business system, and actively triggers the multi-dimensional query instruction by inputting multi-dimensional information into the faulty device locating device. Optionally, the multi-dimensional query instruction can also be automatically triggered by the faulty device locating device. For example, the faulty device locating device pre-sets a timed detection process, and automatically generates a multi-dimensional query instruction based on the preset multi-dimensional information within a specific time period.

[0066] Specifically, after receiving a multi-dimensional query command, the faulty device locating device responds to the multi-dimensional query command and obtains the target address information in the multi-dimensional query command. Using the target address information, the device queries the execution machine list to obtain the target execution machine list corresponding to the multi-dimensional query command, and then reads the device clusters in the target execution machine list. The execution machine list is a device list that records the service servers currently running each service system.

[0067] Specifically, the faulty device location device accesses a preset content management system to obtain cluster address information of each execution machine list stored in the preset content management system, and compares the cluster address information with the target address information in the multi-dimensional query instruction to obtain cluster address similarity.

[0068] After obtaining the cluster address similarity, the faulty device locating device compares the cluster address similarity with a preset similarity threshold, thereby obtaining a target execution machine list whose cluster address similarity is greater than the preset similarity threshold, and reads the device cluster in the target execution machine list.

[0069] 202. Obtain each detection dimension information in the multi-dimensional query instruction, group the device clusters according to each detection dimension information, and obtain device subclusters corresponding to each dimension detection information;

[0070] After obtaining the device cluster in the target execution machine list, the fault device locating device also obtains each detection dimension information in the multi-dimensional query instruction, groups the device cluster according to the detection dimension information, and obtains the device sub-cluster corresponding to each dimension detection information.

[0071] Specifically, the faulty device locating device parses the multi-dimensional query instruction to obtain each detection dimension information in the multi-dimensional query instruction, where the detection dimension information includes at least one of an application identifier, device environment information, device room information, and a storage space identifier. The faulty device locating device groups device clusters based on the at least one detection dimension information, thereby obtaining device subclusters that contain at least one piece of detection dimension information in the same dimension.

[0072] After obtaining the device subclusters corresponding to the detection information of each dimension, the faulty device locating device further locates the faulty device in each device subcluster, thereby determining the faulty device that is operating abnormally in each device subcluster.

[0073] 203. For each device subcluster, generate a health check instruction based on the device information of the device subcluster and the historical detection data of the device subcluster, and send the health check instruction to the device subcluster;

[0074] After acquiring each device sub-cluster, the faulty device locating device generates a health detection instruction corresponding to each device sub-cluster, and transmits the health detection instruction to each cluster device in the device sub-cluster for device health detection.

[0075] Specifically, the faulty device locating device obtains device information of each device subcluster and historical detection data of each device subcluster, identifies a preset target field in the historical detection data, and reads the dimension detection parameter corresponding to the target field.

[0076] After obtaining the device information and dimension detection parameters of the device subcluster, the faulty device locating device inputs the device information and dimension detection parameters into a preset instruction template to generate a health detection instruction for the device subcluster.

[0077] After generating health detection instructions for each device subcluster, the faulty device locating device also obtains the protocol address of each device subcluster, and sends the health detection instructions to the corresponding device subcluster through the protocol address for health detection, thereby determining the faulty device in each device subcluster.

[0078] 204. Receive feedback information from devices in each of the device subclusters, and locate a faulty device in the device subclusters according to the device feedback information.

[0079] Specifically, after sending a health check instruction to each execution server in each device subcluster, the faulty device locating device also detects a preset data transmission interface, obtains device feedback information returned by each device subcluster based on the health check instruction, and calculates the device feedback time for each device subcluster to return the device feedback information. The device feedback time is the time from when the faulty device locating device sends the health check instruction to when the faulty device locating device receives the device feedback information, or from when the faulty device locating device sends the health check instruction to when the preset feedback time threshold is exceeded.

[0080] Specifically, after receiving device feedback information from each device sub-cluster and counting the device feedback time corresponding to the device feedback information, the device fault location device locates the faulty device in the device cluster based on the device feedback information and the device feedback time.

[0081] In this embodiment, the faulty device locating device responds to a multi-dimensional query instruction, queries the target execution machine list corresponding to the multi-dimensional query instruction, and reads the device clusters in the target execution machine list; obtains each detection dimension information in the multi-dimensional query instruction, groups the device clusters according to each detection dimension information, and obtains the device subclusters corresponding to each dimension detection information; for each device subcluster, generates a health detection instruction corresponding to the device subcluster based on the device information and historical detection data of the device subcluster, and sends the health detection instruction to the device subcluster; receives device feedback information from each device subcluster, and locates the faulty device in the device cluster based on the device feedback information. This achieves accurate monitoring of each device cluster, and can quickly and efficiently locate the faulty device in the device cluster, thereby improving the efficiency of faulty device detection.

[0082] like Figure 3 As shown, Figure 3 This is a flow chart of an embodiment of the method for locating a faulty device in a device cluster according to device feedback information and device feedback time in the faulty device locating method provided in an embodiment of the present application, specifically including steps 301 to 302:

[0083] 301. Obtain a verification code in the feedback information of the device, and match the verification code with a preset verification code;

[0084] 302. If the check code does not match the preset verification code and / or the device feedback time exceeds a preset feedback time threshold, determine a faulty device in the device subcluster corresponding to the device feedback information.

[0085] Based on the above embodiment, in this embodiment, after obtaining the device feedback information returned by the cluster device in the device sub-cluster based on the health detection instruction, the faulty device locating device determines whether the cluster device is a faulty device in the device sub-cluster through the device feedback information and the device feedback time.

[0086] Specifically, the faulty device locating device parses the device feedback information, obtains a check code in the device feedback information, and matches the check code with a preset verification code to obtain a matching result.

[0087] Optionally, if the matching result is a matching failure, that is, the check code does not match the preset verification code, then the cluster device is determined to be a faulty device in the device sub-cluster.

[0088] Optionally, if the matching result is a successful match, that is, the verification code matches the preset verification code, the faulty device locating device further obtains the device feedback time corresponding to the device feedback information. If the device feedback time does not exceed the preset feedback time threshold, it is determined that the cluster device corresponding to the device feedback information is a normal cluster device in the device sub-cluster.

[0089] Optionally, if the device feedback time exceeds the preset feedback time threshold, that is, the check code in the device feedback information matches the preset verification code, but the device feedback time of the device feedback information exceeds the preset feedback time threshold, then the faulty device locating device determines that the cluster device corresponding to the device feedback information is the faulty device in the device sub-cluster.

[0090] Optionally, in other embodiments, the faulty device locating device can also set a corresponding dimension detection threshold based on the dimension detection parameter, and evaluate each dimension feedback information in the device feedback information through the dimension detection threshold, thereby determining in multiple dimensions whether the cluster device corresponding to the device feedback information is a faulty device.

[0091] In this embodiment, the faulty device locating device obtains the check code in the device feedback information and matches it with a preset verification code. If the check code and the preset verification code do not match and / or the device feedback time exceeds a preset feedback time threshold, the cluster device corresponding to the device feedback information is determined to be a faulty device. This implements a multi-dimensional health check of the cluster devices in the device cluster, thereby locating the faulty device in the device cluster.

[0092] like Figure 4 As shown, Figure 4 This is a flow chart of an embodiment of determining a faulty device in a device cluster based on device feedback information in a faulty device locating method provided in an embodiment of the present application, specifically including steps 401 to 403:

[0093] 401. Receive device feedback information from each of the device subclusters, and generate a cluster status image based on the device feedback information and a preset cluster image template;

[0094] 402. Input the cluster state image into a preset cluster detection model to perform feature extraction to obtain cluster state features corresponding to the cluster state image;

[0095] 403 : Perform abnormal state detection on the cluster state feature, obtain a faulty device feature in the cluster state feature, and locate a faulty device corresponding to the faulty device feature.

[0096] Based on the above embodiment, in this embodiment, after receiving device feedback information from each device sub-cluster, the faulty device locating device further generates a cluster status image for the device cluster based on the device feedback information. Optionally, the device feedback information may also be historical device feedback information generated by previous health checks on the device cluster.

[0097] Specifically, the faulty device locating device parses the device feedback information, uses the cluster devices in each device cluster as connection nodes, and uses the device feedback information to determine the connection relationships between each cluster device and each cluster device, and between each cluster device and the faulty device locating device. The device then populates these connection nodes and connection relationships into a preset cluster image template, thereby generating a cluster status image. The cluster status image is a node connection image that represents the operational connection relationships between each cluster device in the device cluster. The connection relationships represent the ability for interactive communication operations between each cluster device and each cluster device, and between each cluster device and the faulty device locating device. Optionally, the cluster status image can also be displayed in the form of an adjacency matrix.

[0098] After generating the cluster state image, the faulty device locating device inputs the cluster state image into a preset cluster detection model for feature extraction, thereby obtaining cluster state features corresponding to the cluster state image. The cluster detection model may be a feature extraction model. The faulty device locating device inputs the cluster state image into the cluster detection model, and uses the cluster detection model to extract features from the adjacency matrix in the cluster state image, thereby obtaining cluster state features for the cluster state image.

[0099] After acquiring the cluster state feature, the faulty device locating device further performs abnormal state detection on the cluster state feature, thereby obtaining the faulty device feature in the cluster state feature, and locates the corresponding faulty device based on the faulty device feature.

[0100] Specifically, the faulty device locating device inputs the cluster state features into a preset analysis model for abnormal state detection. Optionally, the analysis model may be a combination of a fully connected layer and a feature classification model. The faulty device locating device uses the analysis model to pool and classify the cluster state features to obtain a faulty device feature from the reporter state features, wherein the faulty device feature is a feature indicating abnormal cluster device connectivity within the cluster state features. After obtaining the faulty device feature, the faulty device locating device parses the faulty device feature to obtain a faulty device identifier corresponding to the faulty device feature, and locates the corresponding faulty device using the faulty device identifier.

[0101] In this embodiment, the faulty device locating device receives device feedback information from each device sub-cluster and generates a cluster status image for the device cluster based on the device feedback information and a preset cluster image template. The cluster status image is then input into a preset cluster detection model for feature extraction to obtain cluster status features corresponding to the cluster status image. The cluster status features are then tested for abnormalities to obtain faulty device features within the cluster status features, and the faulty device corresponding to the faulty device features is located. This allows for accurate assessment of faulty devices in a device cluster, improving the accuracy and efficiency of faulty device location.

[0102] In order to better implement the faulty device locating method in the embodiment of the present application, based on the faulty device locating method, the embodiment of the present application also provides a faulty device locating device, such as Figure 5 As shown, Figure 5 : is a schematic structural diagram of an embodiment of a faulty device locating device provided in an embodiment of the present application. The faulty device locating device 500 includes:

[0103] The instruction acquisition module 501 is configured to respond to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list;

[0104] The cluster reading module 502 is configured to obtain each detection dimension information in the multi-dimensional query instruction, group the device cluster according to each detection dimension information, and obtain the device sub-cluster corresponding to each dimension detection information;

[0105] The cluster grouping module 503 is configured to generate a health detection instruction for each device sub-cluster based on the device information of the device sub-cluster and the historical detection data of the device sub-cluster, and send the health detection instruction to the device sub-cluster;

[0106] The fault location module 504 is configured to receive feedback information from devices in each of the device sub-clusters, and locate a faulty device in the device cluster according to the device feedback information.

[0107] In some embodiments of the present application, the faulty device locating apparatus responds to a multi-dimensional query instruction, queries a target execution machine list corresponding to the multi-dimensional query instruction, and reads a device cluster in the target execution machine list, including:

[0108] Accessing a preset content management system to obtain cluster address information of each execution machine list stored in the preset content management system;

[0109] Obtaining target address information of the multi-dimensional query instruction, comparing the target address information with each cluster address information, and obtaining cluster address similarity;

[0110] A target execution machine list whose cluster address similarity is greater than a preset similarity threshold is obtained, and the device clusters in the target execution machine list are read.

[0111] In some embodiments of the present application, the faulty device locating apparatus generates, for each device subcluster, a health check instruction based on device information of the device subcluster and historical detection data of the device subcluster, and sends the health check instruction to the device subcluster, including:

[0112] For each device subcluster, obtain device information of the device subcluster and historical detection data of the device subcluster;

[0113] Read the dimension detection parameter corresponding to the target field in the historical detection data, generate a health detection instruction for the device subcluster according to the device information and the dimension detection parameter, and send the health detection instruction to the device subcluster.

[0114] In some embodiments of the present application, the faulty device locating apparatus receives device feedback information of each of the device subclusters and locates the faulty device in the device cluster according to the device feedback information, including:

[0115] Detecting a preset data transmission interface to obtain device feedback information generated by each of the device subclusters based on the health detection instruction, and a device feedback time corresponding to the device feedback information;

[0116] The faulty device in the device sub-cluster is located according to the device feedback information and the device feedback time.

[0117] In some embodiments of the present application, the faulty device locating apparatus determines the faulty device in the device subcluster according to the device feedback information and the device feedback time, including:

[0118] Obtaining a verification code from the device feedback information, and matching the verification code with a preset verification code;

[0119] If the check code does not match the preset verification code and / or the device feedback time exceeds a preset feedback time threshold, a faulty device in the device subcluster corresponding to the device feedback information is determined.

[0120] In some embodiments of the present application, the faulty device locating apparatus receives device feedback information of each of the device subclusters and locates the faulty device in the device cluster according to the device feedback information, including:

[0121] receiving device feedback information of each of the device subclusters, and generating a cluster status image according to the device feedback information and a preset cluster image template;

[0122] Inputting the cluster state image into a preset cluster detection model for feature extraction to obtain cluster state features corresponding to the cluster state image;

[0123] An abnormal state detection is performed on the cluster state feature to obtain a faulty device feature in the cluster state feature, and a faulty device corresponding to the faulty device feature is located.

[0124] In some embodiments of the present application, after locating the faulty device in the device cluster according to the device feedback information, the apparatus further includes:

[0125] Acquire multi-dimensional device information of the faulty device, wherein the multi-dimensional device information includes at least one of a device identifier, an application identifier, and a device subcluster identifier;

[0126] The preset alarm information is configured based on the multi-dimensional device information, fault alarm information of the faulty device is generated, and the fault alarm information is displayed on a preset display interface.

[0127] In this embodiment, the faulty device locating device responds to a multi-dimensional query instruction, queries the target execution machine list corresponding to the multi-dimensional query instruction, and reads the device clusters in the target execution machine list; obtains each detection dimension information in the multi-dimensional query instruction, groups the device clusters according to each detection dimension information, and obtains the device subclusters corresponding to each dimension detection information; for each device subcluster, generates a health detection instruction corresponding to the device subcluster based on the device information and historical detection data of the device subcluster, and sends the health detection instruction to the device subcluster; receives device feedback information from each device subcluster, and locates the faulty device in the device cluster based on the device feedback information. This achieves accurate monitoring of each device cluster, and can quickly and efficiently locate the faulty device in the device cluster, thereby improving the efficiency of faulty device detection.

[0128] The embodiment of the present invention also provides a faulty device locating device, such as Figure 6 As shown, Figure 6 This is a schematic diagram of the structure of an embodiment of a faulty device locating device provided in an embodiment of the present application.

[0129] The faulty device locating device integrates any of the faulty device locating devices provided in the embodiments of the present invention, and the faulty device locating device includes:

[0130] one or more processors;

[0131] Memory; and

[0132] One or more applications, wherein the one or more applications are stored in the memory and configured to enable the processor to execute the steps of the faulty device locating method described in any of the above-mentioned faulty device locating method embodiments.

[0133] Specifically, the faulty device locating device may include one or more processing core processors 601, one or more computer-readable storage media memories 602, a power supply 603, an input unit 604, and other components. Those skilled in the art will appreciate that Figure 6 The structure of the faulty device locating device shown in the figure does not constitute a limitation on the faulty device locating device, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0134] Processor 601 is the control center of the faulty device locating device. It utilizes various interfaces and circuits to connect the various components of the faulty device locating device. By running or executing software programs and / or modules stored in memory 602 and accessing data stored in memory 602, it performs various functions of the faulty device locating device and processes data, thereby providing overall monitoring of the faulty device locating device. Optionally, processor 601 may include one or more processing cores; preferably, processor 601 may integrate an application processor and a modem processor, wherein the application processor primarily processes the operating system, user interface, and application programs, while the modem processor primarily handles wireless communications. It is understood that the modem processor may not be integrated into processor 601.

[0135] Memory 602 can be used to store software programs and modules. Processor 601 executes various functional applications and data processing by running the software programs and modules stored in memory 602. Memory 602 may primarily include a program storage area and a data storage area. The program storage area may store an operating system and at least one application required for a function (such as a sound playback function, an image playback function, etc.); the data storage area may store data created based on the use of the fault device locating device. Furthermore, memory 602 may include high-speed random access memory and non-volatile memory, such as at least one disk storage device, flash memory device, or other volatile solid-state storage device. Accordingly, memory 602 may also include a memory controller to provide processor 601 with access to memory 602.

[0136] The faulty device locating device also includes a power supply 603 for supplying power to various components. Preferably, the power supply 603 can be logically connected to the processor 601 via a power management system, thereby enabling the power management system to manage charging, discharging, and power consumption. The power supply 603 can also include one or more DC or AC power supplies, a recharging system, a power fault detection circuit, a power converter or inverter, a power status indicator, and other arbitrary components.

[0137] The faulty device locating device may further include an input unit 604, which may be used to receive input digital or character information and generate keyboard, mouse, joystick, optical or trackball signal input related to user settings and function control.

[0138] Although not shown, the faulty device locating device may also include a display unit, etc., which will not be described in detail here. Specifically, in this embodiment, the processor 601 in the faulty device locating device will load the executable files corresponding to one or more application processes into the memory 602 according to the following instructions, and the processor 601 will run the application stored in the memory 602 to implement various functions as follows:

[0139] In response to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list;

[0140] Obtaining each detection dimension information in the multi-dimensional query instruction, grouping the device cluster according to each detection dimension information, and obtaining a device sub-cluster corresponding to each dimension detection information;

[0141] For each device subcluster, generate a health detection instruction corresponding to the device subcluster based on the device information and historical detection data of the device subcluster, and send the health detection instruction to the device subcluster;

[0142] Receive feedback information from devices in each of the device subclusters, and locate a faulty device in the device cluster according to the device feedback information.

[0143] Those skilled in the art will appreciate that all or part of the steps in the various methods of the above embodiments may be accomplished by instructions, or by controlling related hardware through instructions. The instructions may be stored in a computer-readable storage medium and loaded and executed by a processor.

[0144] To this end, an embodiment of the present invention provides a computer-readable storage medium, which may include a read-only memory (ROM), random access memory (RAM), a disk, or an optical disk. A computer program is stored on the computer-readable storage medium, which is loaded by a processor to execute the steps of any of the faulty device locating methods provided in the embodiments of the present invention. For example, the computer program loaded by the processor may execute the following steps:

[0145] In response to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list;

[0146] Obtaining each detection dimension information in the multi-dimensional query instruction, grouping the device cluster according to each detection dimension information, and obtaining a device sub-cluster corresponding to each dimension detection information;

[0147] For each device subcluster, generate a health detection instruction corresponding to the device subcluster based on the device information and historical detection data of the device subcluster, and send the health detection instruction to the device subcluster;

[0148] Receive feedback information from devices in each of the device subclusters, and locate a faulty device in the device cluster according to the device feedback information.

[0149] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described in detail in a certain embodiment, please refer to the detailed description of other embodiments above and will not be repeated here.

[0150] In specific implementation, the above units or structures can be implemented as independent entities, or can be arbitrarily combined to implement as the same or several entities. The specific implementation of the above units or structures can refer to the previous method embodiments and will not be repeated here.

[0151] The above is a detailed introduction to a method for locating a faulty device provided in an embodiment of the present application. The description of the above embodiment is only used to help understand the method of the present invention and its core idea; at the same time, for technical personnel in this field, based on the idea of ​​the present invention, there will be changes in the specific implementation method and application scope. In summary, the content of this specification should not be understood as limiting the present invention.

Claims

1. A method for locating a faulty device, characterized in that: The faulty device locating method includes: In response to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list; Obtaining each detection dimension information in the multi-dimensional query instruction, grouping the device cluster according to each detection dimension information, and obtaining a device sub-cluster corresponding to each detection dimension information; For each device subcluster, generate a health detection instruction based on the device information of the device subcluster and the historical detection data of the device subcluster, and send the health detection instruction to the device subcluster; receiving device feedback information of each of the device subclusters, and locating the faulty device according to the device feedback information; The responding to the multi-dimensional query instruction, querying the target execution machine list corresponding to the multi-dimensional query instruction, and reading the device cluster in the target execution machine list include: Accessing a preset content management system to obtain cluster address information of each execution machine list stored in the preset content management system; Obtaining target address information of the multi-dimensional query instruction, comparing the target address information with each cluster address information, and obtaining cluster address similarity; Obtain a target execution machine list whose cluster address similarity is greater than a preset similarity threshold, and read the device cluster in the target execution machine list; The step of generating, for each device subcluster, a health detection instruction based on device information of the device subcluster and historical detection data of the device subcluster, and sending the health detection instruction to the device subcluster includes: For each device subcluster, obtain device information of the device subcluster and historical detection data of the device subcluster; Reading a dimension detection parameter corresponding to a target field in the historical detection data, generating a health detection instruction for the device subcluster according to the device information and the dimension detection parameter, and sending the health detection instruction to the device subcluster; The receiving device feedback information of each device sub-cluster and locating the faulty device in the device sub-cluster according to the device feedback information includes: receiving device feedback information of each of the device subclusters, and generating a cluster status image according to the device feedback information and a preset cluster image template; Inputting the cluster state image into a preset cluster detection model for feature extraction to obtain cluster state features corresponding to the cluster state image; An abnormal state detection is performed on the cluster state feature to obtain a faulty device feature in the cluster state feature, and a faulty device corresponding to the faulty device feature is located.

2. The method for locating a faulty device according to claim 1, wherein: The receiving device feedback information of each device sub-cluster and locating the faulty device in the device sub-cluster according to the device feedback information includes: Detecting a preset data transmission interface to obtain device feedback information generated by each of the device subclusters based on the health detection instruction, and a device feedback time corresponding to the device feedback information; The faulty device in the device sub-cluster is located according to the device feedback information and the device feedback time.

3. The method for locating a faulty device according to claim 2, wherein: The determining the faulty device in the device subcluster according to the device feedback information and the device feedback time includes: Obtaining a verification code from the device feedback information, and matching the verification code with a preset verification code; If the check code does not match the preset verification code and / or the device feedback time exceeds a preset feedback time threshold, a faulty device in the device subcluster corresponding to the device feedback information is determined.

4. The method for locating a faulty device according to any one of claims 1 to 3, wherein: After locating the faulty device in the device sub-cluster according to the device feedback information, the method further includes: Acquire multi-dimensional device information of the faulty device, wherein the multi-dimensional device information includes at least one of a device identifier, an application identifier, and a device subcluster identifier; The preset alarm information is configured based on the multi-dimensional device information, fault alarm information of the faulty device is generated, and the fault alarm information is displayed on a preset display interface.

5. A faulty equipment locating device, characterized in that: The faulty equipment locating device comprises: An instruction acquisition module is configured to respond to a multi-dimensional query instruction, query a target execution machine list corresponding to the multi-dimensional query instruction, and read a device cluster in the target execution machine list; a cluster reading module configured to obtain each detection dimension information in the multi-dimensional query instruction, group the device cluster according to each detection dimension information, and obtain a device sub-cluster corresponding to each detection dimension information; a cluster grouping module configured to generate, for each device subcluster, a health detection instruction based on device information of the device subcluster and historical detection data of the device subcluster, and send the health detection instruction to the device subcluster; a fault locating module configured to receive device feedback information of each of the device subclusters and locate a faulty device in the device cluster according to the device feedback information; The instruction acquisition module is further configured to access a preset content management system, obtain cluster address information of each execution machine list stored in the preset content management system; obtain target address information of the multi-dimensional query instruction, compare the target address information with each cluster address information, and obtain cluster address similarity; obtain a target execution machine list whose cluster address similarity is greater than a preset similarity threshold, and read the device cluster in the target execution machine list; The cluster grouping module is further configured to obtain, for each device subcluster, device information of the device subcluster and historical detection data of the device subcluster; read dimension detection parameters corresponding to target fields in the historical detection data, generate a health detection instruction for the device subcluster based on the device information and the dimension detection parameters, and send the health detection instruction to the device subcluster; The fault location module is further configured to receive device feedback information from each of the device subclusters, generate a cluster status image based on the device feedback information and a preset cluster image template, input the cluster status image into a preset cluster detection model for feature extraction, and obtain cluster status features corresponding to the cluster status image; perform abnormal state detection on the cluster status features, obtain faulty device features in the cluster status features, and locate the faulty device corresponding to the faulty device features.

6. A faulty equipment locating device, characterized in that: The faulty equipment locating device comprises: one or more processors; Memory; and One or more application programs, wherein the one or more application programs are stored in the memory and configured to be executed by the processor to implement the steps of the faulty device locating method according to any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that A computer program is stored thereon, and the computer program is loaded by a processor to execute the steps of the faulty equipment locating method according to any one of claims 1 to 4.

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