Method of manufacturing a semiconductor structure, semiconductor structure and semiconductor memory
By forming columnar and cup-shaped conductive structures in the lower electrode of the DRAM capacitor structure, the problem of balancing storage capacity and stability under high aspect ratio capacitors is solved, thereby improving both storage capacity and structural stability.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- CHANGXIN MEMORY TECH INC
- Filing Date
- 2021-07-20
- Publication Date
- 2026-07-17
AI Technical Summary
In high aspect ratio DRAM capacitor structures, it is difficult to maintain both sufficient capacitor storage capacity and stability at the same time.
A semiconductor structure is formed by forming bit line structures, active pillars, and word line structures on a substrate, and forming pillar-shaped conductive structures and cup-shaped conductive structures on the active pillars to form a lower electrode, which is then combined with a dielectric layer and an upper electrode.
While increasing the storage capacity of the capacitor, the stability of the semiconductor structure is improved, read/write interference is reduced, and the overall stability of the structure is enhanced.
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Figure CN115643753B_ABST