Simulation test method for tracking miss-target distance of optoelectronic platform based on embedded software

Abstract

This solution discloses a simulation test method for tracking miss distance of an optoelectronic platform based on embedded software, comprising the following steps: presetting target motion curve information in a host computer, then calculating the tracking angle deviation value and the pixel deviation corresponding to the tracking angle deviation value by the host computer and generating a simulated miss distance, and inputting the simulated miss distance as an input instruction into the optoelectronic platform in the simulation tracking mode; the optoelectronic platform simulates the trajectory of the target motion curve and inputs the real-time simulated tracking performance data of the entire tracking process to the host computer; repeating the above steps, analyzing multiple sets of simulated tracking performance data, and obtaining the tracking accuracy of the optoelectronic platform. This application uses embedded software to generate image miss distance simulation signals, which reduces the test cost and facilitates testing under laboratory conditions; at the same time, the amplitude and frequency of the target motion curve and the focal length of the simulated tracking field of view can be set according to actual needs, which is convenient for adjustment to meet the tracking test requirements of different moving targets and different focal lengths.

Description

Technical Field

[0001] The present disclosure generally relates to the field of optoelectronic platform tracking performance testing, and in particular to a simulation test method for optoelectronic platform tracking miss distance based on embedded software. Background Art

[0002] The tracking capability of an optoelectronic platform is affected by a variety of factors, including the imaging detector frame rate, circuit transmission delays, image tracking processing algorithms, and platform control algorithms. During system-level tracking capability testing, the interconnectedness of multiple subsystems makes it impossible to accurately measure the platform's tracking and control performance.

[0003] When testing the image tracking performance of an optoelectronic platform, the entire platform is typically fixed in place, the detector powered on, and an image is generated externally. The target is then tracked by manipulating the image displayed on the host computer interface. When faced with detector fields of view at varying focal lengths, it can be difficult to find a target that meets any field of view. Furthermore, this testing method requires the detector to be powered on for extended periods of time and imposes certain requirements on the test environment. Furthermore, testing the optoelectronic platform's ability to track different target motion trajectories requires the actual target to exhibit different motion patterns, further complicating the testing method. Therefore, we provide a simulation test method for tracking miss distances for optoelectronic platforms based on embedded software. Summary of the Invention

[0004] In view of the above-mentioned defects or deficiencies in the prior art, it is desired to provide a simulation test method for tracking miss distance of an optoelectronic platform based on embedded software with high precision, low test cost and strong versatility.

[0005] In a first aspect, the present application discloses a simulation test method for tracking miss distance on an optoelectronic platform based on embedded software, comprising the following steps:

[0006] S1, pre-set target motion curve information;

[0007] S2. Calculate a tracking angle deviation value, where the tracking angle deviation value is calculated based on the initial angle value of the photoelectric platform and the target motion curve information;

[0008] S3, calculating the pixel deviation corresponding to the tracking angle deviation value;

[0009] S4, generating a simulated miss distance instruction and inputting it into a control terminal of the photoelectric platform; the simulated miss distance instruction is generated by delaying the pixel deviation;

[0010] S5. The optoelectronic platform simulates the target motion curve trajectory, and collects and outputs simulated tracking performance data through the test end; the simulated tracking performance data includes the simulated miss distance.

[0011] S6. Repeat steps S1 to S5, changing the preset target motion curve information to obtain multiple sets of simulated tracking performance data;

[0012] S7. Analyze multiple sets of simulated tracking performance data to obtain tracking performance indicators of the optoelectronic platform.

[0013] According to the technical solution provided in the embodiment of the present application, in step S2, the tracking angle deviation value is calculated according to the following formula:

[0014] θ goal =θ0-Amp*A(2*PI*frp_goal*time_cnt) (1)

[0015] Among them, A(2*PI*frp_goal*time_cnt) is the preset target motion curve trajectory type; θ goal is the tracking angle deviation value; θ0 is the initial angle of the photoelectric platform; Amp is the amplitude of the target motion curve; PI is π; frp_goal is the target frequency value; time_cnt is the counter value that accumulates in increments of the control period.

[0016] According to the technical solution provided in the embodiment of the present application, in step S3, the pixel deviation corresponding to the tracking angle deviation value is calculated according to the following formula:

[0017]

[0018] Among them, Pixel_err is the pixel deviation; A is the conversion coefficient; Zoom real To simulate the focal length of the detector; Zoom min is the minimum focal length of the simulated detector.

[0019] According to the technical solution provided in the embodiment of the present application, generating the simulated miss amount includes the following steps:

[0020] S41, obtaining a pixel deviation corresponding to the tracking angle deviation value;

[0021] S42, obtaining the delay time of the photoelectric platform tracking system and the detector frame rate time, and calculating the ratio between the two to obtain the delayed frame rate number;

[0022] S43, delaying the pixel difference according to the delayed frame frequency based on the frame frequency to obtain the simulated miss distance.

[0023] According to the technical solution provided in the embodiment of the present application, analyzing multiple sets of simulation tracking performance data includes the following steps:

[0024] S71, traversing multiple sets of simulation tracking performance data;

[0025] S72. Construct an XY curve, wherein X is a sampling point and Y is the tracking performance data type;

[0026] S73. Compare the values of various types of values in the tracking performance data at different sampling points to obtain a tracking performance index.

[0027] According to the technical solution provided in the embodiment of the present application, the simulated tracking performance data is received and stored by the host computer, and the types of simulated tracking performance data include: optical platform angle, gyroscope angular velocity value, and simulated miss distance pixels and angle.

[0028] In summary, the present technical solution specifically discloses a simulation test method for the miss distance of an optoelectronic platform tracking based on embedded software, comprising the following steps: setting target motion curve information in the host computer software, and obtaining a simulated miss distance by calculating the tracking angle deviation value and the corresponding pixel deviation. This calculation method forms a simulated miss distance instruction as an input value in the simulated tracking mode of the optoelectronic platform, thereby obtaining real-time miss distance data in the simulated tracking mode of the optoelectronic platform; subsequently, changing the preset target motion curve information to obtain multiple sets of simulated tracking performance data, analyzing the multiple sets of simulated tracking performance data, and obtaining the tracking accuracy of the optoelectronic platform.

[0029] This application uses the host computer software to set the amplitude and frequency of the simulated target motion curve, the focal length of the simulated detector, the working mode of the optoelectronic platform, and other information, so as to realize the tracking performance test of the optoelectronic platform under various conditions. In addition, the host computer software is used to generate an image off-target amount simulation signal, which can remove the influence of the platform system-level tracking link, reduce the test cost, and facilitate testing under laboratory conditions. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] Other features, objects and advantages of the present application will become more apparent upon reading the detailed description of non-limiting embodiments made with reference to the following drawings:

[0031] Figure 1 The figure is a flowchart of a simulation test method for tracking miss-target distance on an optoelectronic platform based on embedded software.

[0032] Figure 2 The invention relates to a system composition of a simulation test method for tracking miss-target distance of an optoelectronic platform based on embedded software.

[0033] Figure 3 A simulated target motion curve trajectory is generated by a simulation test method for tracking miss distance of an optoelectronic platform based on embedded software.

[0034] Figure 4 This is the second test result of a simulation test method for tracking miss-target distance of an optoelectronic platform based on embedded software.

[0035] Figure 5 This is the third test result of a simulation test method for tracking miss-target distance of an optoelectronic platform based on embedded software.

[0036] Figure 6 This is the fourth test result of a simulation test method for tracking miss-target distance of an optoelectronic platform based on embedded software.

[0037] Figure 7 This is the first test result of a traditional method of testing the actual system of detector power-on in a simulation test method of tracking miss distance of an optoelectronic platform based on embedded software.

[0038] Figure 8 This is the second test result of the actual system test method of detector power-on in the traditional way in a simulation test method of tracking miss distance of an optoelectronic platform based on embedded software.

[0039] Figure 9 This is the third test result of the actual system test method of detector power-on in the traditional way in a simulation test method of tracking miss distance of an optoelectronic platform based on embedded software. DETAILED DESCRIPTION

[0040] The present application will be further described in detail below with reference to the accompanying drawings and examples. It should be understood that the specific embodiments described herein are merely for the purpose of explaining the relevant invention and are not intended to limit the invention. It should also be noted that, for ease of description, only portions relevant to the invention are shown in the accompanying drawings.

[0041] It should be noted that, in the absence of conflict, the embodiments and features of the embodiments in this application can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0042] Example 1

[0043] Please refer to Figure 1 The flowchart of a simulation test method for tracking miss-target distance on an optoelectronic platform based on embedded software provided by the present application is shown, comprising the following steps:

[0044] In this embodiment, if Figure 2 As shown, the system of the present detection method includes a host computer software and an optoelectronic platform, wherein the optoelectronic platform is controlled by the servo control software, and the servo control software forms the control end of the optoelectronic platform; at the same time, the host computer has a communication serial port for sending target motion curve information to the control end of the optoelectronic platform, and the test serial port can transmit the simulated tracking performance data of the optoelectronic platform in the process of simulating the target motion curve to the host computer for storage and subsequent analysis. Here, the test serial port forms the test end of the optoelectronic platform;

[0045] S1. Use the host computer software to pre-set the target motion curve information, and send the target motion curve information to the control terminal of the photoelectric platform through the communication serial port;

[0046] The target motion curve information includes: the amplitude and frequency of the motion curve, the focal length of the detector, and the working mode of the optoelectronic platform. This allows the optoelectronic platform to simulate a variety of curved motions, such as sine or cosine, uniform linear motion, uniform acceleration curve motion, and variable acceleration curve motion. The amplitude and frequency of the target motion curve and the focal length of the simulated tracking field of view can be set according to actual needs, making it easy to adjust and able to meet tracking tests for different motion targets and different focal lengths. It has strong versatility and does not require the detector to be powered on, which reduces the impact on control system debugging and improves the debugging efficiency of the control system tracking function.

[0047] S2. Calculate the tracking angle deviation value according to formula (1). The tracking angle deviation value is calculated based on the initial angle value of the photoelectric platform and the target motion curve information. Here, the initial angle of the photoelectric platform is the current angle value of the photoelectric platform before the photoelectric platform tracking mode is started.

[0048] S3. Calculate the pixel deviation corresponding to the tracking angle deviation value according to formula (3), and use the pixel deviation to generate a simulated miss distance.

[0049] S4. Generate a simulated miss distance and input it to the control terminal of the optoelectronic platform; the simulated miss distance is generated based on the delayed pixel deviation; since the optoelectronic platform has an electric lock mode and a simulated tracking mode, the optoelectronic platform enters the electric lock mode and waits for instructions to simulate the target motion curve trajectory;

[0050] S5: The host computer controls the optoelectronic platform to enter the simulation tracking mode and uses the simulated miss distance as the input value in the simulation tracking mode. Subsequently, under the closed-loop control, the optoelectronic platform motor is driven to simulate the target motion curve trajectory to complete the tracking requirement of the target motion curve.

[0051] During the tracking process, the test serial port of the optoelectronic platform can transmit real-time simulated tracking performance data such as the turntable angle value of the tested axis (pitch, azimuth or two axes), the corresponding gyroscope angular velocity value and the simulated miss value to the host computer for storage and analysis.

[0052] S6. Repeat steps S1 to S5 to obtain multiple sets of simulated tracking performance data by changing the preset target motion curve information. By obtaining multiple sets of test data, the tracking accuracy under different target motion trajectories, different gyro speeds, and different focal length fields of view can be obtained, and the tracking performance of the optoelectronic platform control system can be further analyzed.

[0053] S7, such as Figure 5As shown, multiple sets of simulated tracking performance data are analyzed to obtain the tracking performance indicators of the optoelectronic platform.

[0054] Specifically, in step S2, the tracking angle deviation value is calculated according to the following formula:

[0055] θ goal =θ0-Amp*A(2*PI*frp_goal*time_cnt) (1)

[0056] Wherein, A(2*PI*frp_goal*time_cnt) is the preset target motion curve trajectory type. Optionally, the target motion curve type is a sine curve or a cosine curve; θ goal is the tracking angle deviation value; θ0 is the initial angle of the photoelectric platform; Amp is the amplitude of the target motion curve; PI is π; frp_goal is the target frequency value; time_cnt is the counter value that accumulates in increments of the control period.

[0057] Specifically, in step S3, the pixel deviation corresponding to the tracking angle deviation value is calculated according to the following formula:

[0058]

[0059] Among them, Pixel_err is the pixel deviation; A is the conversion coefficient; Zoom real To simulate the focal length of the detector; Zoom min is the minimum focal length of the simulated detector.

[0060] Specifically, generating a simulated off-target amount includes the following steps:

[0061] S41, obtaining a pixel deviation corresponding to the tracking angle deviation value;

[0062] S42, obtaining the delay time of the photoelectric platform tracking system and the detector frame rate time, and calculating the ratio between the two to obtain the delayed frame rate number;

[0063] S43, delaying the pixel difference according to the delayed frame frequency based on the frame frequency, and obtaining a simulated miss distance as an instruction input to the photoelectric platform, so as to facilitate the acquisition of the simulated miss distance when the photoelectric platform simulates the target curve motion trajectory;

[0064] Specifically, analyzing multiple sets of simulated tracking performance data includes the following steps:

[0065] S71, traversing multiple sets of real-time simulation tracking performance data;

[0066] S72. Construct an XY curve based on the simulated tracking performance data; wherein X is the time at which the sampling point is located; and Y is the type of tracking performance data.

[0067] Among them, take the target motion curve as a sinusoidal motion as an example, Figure 3-Figure 9 As shown, the following data curve will be obtained;

[0068] in, Figure 3 is the generated simulated target motion curve trajectory;

[0069] Figure 4-Figure 6 The gyro velocity, miss distance pixels and miss distance angle of the azimuth axis in the optoelectronic platform tracking mode respectively;

[0070] In the traditional method, it is necessary to use the actual detector at the test axis to power on and work, such as Figure 7-Figure 9 The test results of the actual system test method for the detector power-on operation at a focal length of 140mm are shown in the three figures, which are the gyro angular velocity of the test axis (azimuth axis and pitch axis), the miss distance pixel, and the miss distance angle; Figure 4-Figure 6 By comparison, the test results of this method are basically consistent with those of the traditional method (only the X-axis values are inconsistent), which means that this solution can replace the traditional method.

[0071] S73. Compare the values of various types of values in the tracking performance data at different sampling points to obtain a tracking performance index.

[0072] The above description is merely a preferred embodiment of the present application and an illustration of the technical principles employed. Those skilled in the art should understand that the scope of the invention herein is not limited to the technical solutions formed by the specific combination of the above-mentioned technical features, but also encompasses other technical solutions formed by any combination of the above-mentioned technical features or their equivalents without departing from the inventive concept. For example, a technical solution formed by replacing the above-mentioned features with (but not limited to) technical features having similar functions disclosed in this application.

Claims

1. A simulation test method for tracking miss distance of an optoelectronic platform based on embedded software, characterized in that: The following steps are involved: S1, pre-set target motion curve information; S2. Calculate a tracking angle deviation value, where the tracking angle deviation value is calculated based on the initial angle value of the photoelectric platform and the target motion curve information; S3, calculating the pixel deviation corresponding to the tracking angle deviation value; S4, generating a simulated miss distance instruction and inputting it to the control terminal of the photoelectric platform; the simulated miss distance is generated by delaying the pixel deviation; S5. The optoelectronic platform simulates the target motion curve trajectory, and collects and outputs simulated tracking performance data through the test terminal; the simulated tracking performance data includes the simulated miss distance; S6. Repeat steps S1 to S5, changing the preset target motion curve information to obtain multiple sets of simulated tracking performance data; S7. Analyze multiple sets of simulated tracking performance data to obtain tracking performance indicators of the optoelectronic platform.

2. The method for simulating the test of the photoelectric platform for tracking the miss distance based on embedded software according to claim 1, characterized in that: In step S2, the tracking angle deviation value is calculated according to the following formula: θ goal =θ0-Amp*A(2*PI*frp_goal*time_cnt) (1) Among them, A(2*PI*frp_goal*time_cnt) is the preset target motion curve trajectory type; θ goal is the tracking angle deviation value; θ0 is the initial angle of the photoelectric platform; Amp is the amplitude of the target motion curve; PI is π; frp_goal is the target frequency value; time_cnt is the counter value that accumulates in increments of the control period.

3. The method for simulating the test of the photoelectric platform for tracking the miss distance based on embedded software according to claim 2, characterized in that: In step S3, the pixel deviation corresponding to the tracking angle deviation value is calculated according to the following formula: Among them, Pixel_err is the pixel deviation; A is the conversion coefficient; Zoom real To simulate the focal length of the detector; Zoom min is the minimum focal length of the simulated detector.

4. The method for simulating the test of the photoelectric platform for tracking the miss distance based on embedded software according to claim 1, characterized in that: The generation of the simulated off-target amount comprises the following steps: S41, obtaining a pixel deviation corresponding to the tracking angle deviation value; S42, obtaining the delay time of the photoelectric platform tracking system and the detector frame rate time, and calculating the ratio between the two to obtain the delayed frame rate number; S43, delaying the pixel difference according to the delayed frame frequency based on the frame frequency to obtain the simulated miss distance.

5. The method for simulating the test of the photoelectric platform tracking the miss distance based on embedded software according to claim 1, characterized in that: Analyzing multiple sets of simulation tracking performance data includes the following steps: S71, traversing multiple sets of simulation tracking performance data; S72. Construct an XY curve based on the simulated tracking performance data, wherein X is a sampling point and Y is the type of tracking performance data. S73. Compare the values of various types of values in the tracking performance data at different sampling points to obtain a tracking performance index.

6. The method for simulating the test of the photoelectric platform tracking the miss distance based on embedded software according to claim 5, characterized in that: The simulated tracking performance data is received and stored by the host computer, and the types of the simulated tracking performance data include: optical platform angle, gyro angular velocity value, and simulated miss distance pixels and angle.

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