Micro-logging screening method, device, computer equipment and storage medium

Abstract

The present application provides a method, device, computer equipment, and storage medium for screening micro-logging, belonging to the field of petroleum exploration technology. The method includes: obtaining velocity field value maps of multiple layers in a target work area, wherein the velocity field value map of each layer includes the current first velocity parameters of multiple micro-logging layers in the target work area; for each layer, screening multiple micro-logging layers based on the velocity field value map to obtain multiple first target micro-logging layers whose first velocity parameters are not within the first parameter range of the benchmark; based on the auxiliary data of each first target micro-logging layer, determining a second target micro-logging layer from the multiple first target micro-logging layers, wherein the auxiliary data of the second target micro-logging layer does not match the benchmark auxiliary data; removing the second target micro-logging layer from the multiple micro-logging layers to obtain multiple third target micro-logging layers in the target work area, wherein the logging data of the multiple third target micro-logging layers is used for geological structure imaging. This method improves the efficiency of screening micro-logging layers.

Description

Technical Field

[0001] The present application relates to the field of petroleum exploration technology, and in particular to a micro-well logging screening method, device, computer equipment and storage medium. Background Art

[0002] During oil and gas exploration, multiple micro-logs are typically deployed in the field, and the resulting data is used to image geological structures. Because micro-logs are typically deployed in the field, complex geographical environments can cause anomalies in the data. Therefore, it is necessary to screen out and remove those micro-logs with anomalies to prevent them from adversely affecting geological structure imaging.

[0003] In related technologies, each micro-logging data point, representing lithology, topography, and other information, is typically screened individually to identify those with abnormal logging data. This time-consuming and labor-intensive process significantly prolongs the micro-logging screening cycle, reducing its efficiency. Summary of the Invention

[0004] The present invention provides a method, device, computer equipment and storage medium for screening micro-well logging, which can improve the efficiency of screening micro-well logging. The technical solution is as follows:

[0005] In one aspect, a micro-well logging screening method is provided, comprising:

[0006] Acquire velocity field value maps of multiple layers in the target work area, wherein the velocity field value map of each layer includes the current first velocity parameters of multiple micro-logging wells in the target work area at the layer;

[0007] For each layer, based on the velocity field value map, the plurality of micro-well logs are screened to obtain a plurality of first target micro-well logs, wherein the first velocity parameter of the first target micro-well log is not within the first parameter range of the benchmark;

[0008] Acquire auxiliary data of each first target micro-logging, wherein the auxiliary data is data that assists the first target micro-logging in screening;

[0009] determining a second target micro-log from the plurality of first target micro-logs based on the auxiliary data of each first target micro-log, the auxiliary data of the second target micro-log not matching the baseline auxiliary data;

[0010] The second target micro-logging in the plurality of micro-logging is removed to obtain a plurality of third target micro-logging in the target work area, and the logging data of the plurality of third target micro-logging are used for geological structure imaging.

[0011] In a possible implementation, the velocity field value map further includes coordinate parameters of the multiple micro-logging points, coordinate parameters of multiple interpolation points, and current first velocity parameters of the multiple interpolation points;

[0012] The method of obtaining velocity field value maps of multiple layers in the target work area includes:

[0013] Acquire coordinate parameters of the plurality of micro-logs and second velocity parameters of the plurality of micro-logs at each layer, where the second velocity parameters are original velocity parameters of the micro-logs;

[0014] For each horizon, generating a first velocity point value map of the horizon based on the coordinate parameters of the plurality of micro-well logs and the second velocity parameters of the plurality of micro-well logs at the horizon;

[0015] Performing node extrapolation and node interpolation on the first velocity point value graph to obtain a second velocity point value graph, wherein the second velocity point value graph includes coordinate parameters of the plurality of micro-well loggings, second velocity parameters of the plurality of micro-well loggings at the layers, coordinate parameters of the plurality of interpolation points, and second velocity parameters of the plurality of interpolation points;

[0016] Node smoothing is performed on the second velocity point value graph to obtain the velocity field value graph.

[0017] In a possible implementation, the velocity field value map further includes first velocity parameters of multiple interpolation points. The screening of the multiple micro-well logs based on the velocity field value map to obtain multiple first target micro-well logs includes:

[0018] generating a normal distribution curve of the first velocity parameter based on a plurality of first velocity parameters of micro-logging points and a plurality of first velocity parameters of interpolation points in the velocity field value map;

[0019] Determining a first parameter range of the first speed parameter based on the normal distribution curve and the preset interval area, where the first parameter range is a range of the first speed parameter corresponding to the preset interval area;

[0020] The micro-well log having a first velocity parameter not within the first parameter range is determined as the first target micro-well log.

[0021] In one possible implementation, the baseline auxiliary data includes a plurality of first baseline auxiliary data and a plurality of second baseline auxiliary data, wherein the first baseline auxiliary data corresponds to a first baseline micro-log, which is a micro-log remaining after removing the plurality of first target micro-logs from the plurality of micro-logs, and the second baseline auxiliary data corresponds to a second baseline micro-log, which is a micro-log having a depth greater than that of the first target micro-log.

[0022] The determining of the second target micro-log from the plurality of first target micro-logs based on the auxiliary data of each first target micro-log includes at least one of the following implementations:

[0023] determining a second target micro-log from the plurality of first target micro-logs based on the plurality of first reference auxiliary data and the auxiliary data of each first target micro-log, the auxiliary data of the second target micro-log not matching any of the plurality of first reference auxiliary data; or

[0024] A second target microlog is determined from the plurality of first target micrologs based on the plurality of second baseline auxiliary data and the auxiliary data of each first target microlog, the auxiliary data of the second target microlog not matching any of the plurality of second baseline auxiliary data.

[0025] In one possible implementation, the auxiliary data includes a first micro-logging curve, a first elevation parameter, a first velocity smoothing parameter, and a first lithologic parameter; the first benchmark auxiliary data includes multiple second elevation parameters and multiple second velocity smoothing parameters of the multiple first benchmark micro-logging curves, multiple second micro-logging curves of multiple first benchmark micro-logging curves within a target terrain area, and multiple second lithologic parameters of multiple first benchmark micro-logging curves within a target lithologic area; the target terrain area is an area within the target work area having the same terrain as that of the area where the first target micro-logging curve is located; and the target lithologic area is an area within the target work area having the same lithology as that of the area where the first target micro-logging curve is located.

[0026] The determining of the second target micro-log from the plurality of first target micro-logs based on the plurality of first reference auxiliary data and the auxiliary data of each first target micro-log includes at least one of the following implementations:

[0027] Determining a second target micro-log from the plurality of first target micro-logs based on the plurality of second micro-logging curves and the first micro-logging curve of each first target micro-log, wherein the strike trend of the first micro-logging curve of the second target micro-log does not match the strike trend of the plurality of second micro-logging curves; or

[0028] Based on the multiple second elevation parameters, a second parameter range of a benchmark is formed; based on the second parameter range and the first elevation parameter of each first target micro-log, a second target micro-log is determined from the multiple first target micro-logs, and the first elevation parameter of the second target micro-log is not within the second parameter range; or

[0029] A third parameter range of a benchmark is formed based on the multiple second velocity smoothing parameters; a second target micro-log is determined from the multiple first target micro-logs based on the third parameter range and the first velocity smoothing parameter of each first target micro-log, where the first elevation parameter of the second target micro-log is not within the third parameter range, and the velocity smoothing parameter is used to represent the difference between the original velocity parameter before and after node smoothing; or

[0030] Based on the multiple second lithologic parameters, a fourth parameter range of a benchmark is formed; based on the fourth parameter range and the first lithologic parameter of each first target micro-logging, a second target micro-logging is determined from the multiple first target micro-loggings, the first lithologic parameter of the second target micro-logging is not within the fourth parameter range, and the lithologic parameter is used to represent the distribution of the original velocity parameter of the micro-logging in the target lithologic area.

[0031] In one possible implementation, the second reference auxiliary data includes a plurality of third micro-logging curves of a plurality of second reference micro-logging curves within a target terrain region, where the target terrain region is an area within the target work area having the same terrain as that of the area where the first target micro-logging curves are located;

[0032] The determining of the second target micro-log from the plurality of first target micro-logs based on the plurality of second reference auxiliary data and the auxiliary data of each first target micro-log comprises:

[0033] Based on the multiple third micro-logging curves and the first micro-logging curve of each first target micro-logging curve, a second target micro-logging curve is determined from the multiple first target micro-logging curves, and the trend of the first micro-logging curve of the second target micro-logging curve does not match the trend of the multiple third micro-logging curves.

[0034] In a possible implementation, the method further includes:

[0035] generating a first structural map and a second structural map of the target work area based on the well logging data of the plurality of micro-logs and the well logging data of the plurality of third target micro-logs respectively;

[0036] The first structural map and the second structural map are compared to determine a comparison result, and the comparison result is used to verify the screening effect of the plurality of micro-well logs.

[0037] In another aspect, a micro-well logging screening device is provided, comprising:

[0038] A first acquisition module is configured to acquire velocity field value maps of multiple layers in a target work area, wherein the velocity field value map of each layer includes a first velocity parameter of multiple micro-well loggings in the target work area at the layer;

[0039] a screening module configured to screen the plurality of micro-well logs for each horizon based on the velocity field value map to obtain a plurality of first target micro-well logs, wherein the first velocity parameter of the first target micro-well logs is not within a first parameter range of a benchmark;

[0040] A second acquisition module is configured to acquire auxiliary data of each first target micro-logging well, wherein the auxiliary data is data that assists the first target micro-logging well in screening;

[0041] a determining module for determining a second target micro-log from the plurality of first target micro-logs based on the auxiliary data of each first target micro-log, the auxiliary data of the second target micro-log not matching the baseline auxiliary data;

[0042] A removal module is used to remove the second target micro-logs of multiple layers in the multiple micro-logs to obtain multiple third target micro-logs in the target work area. The logging data of the multiple third target micro-logs are used for geological structure imaging.

[0043] In a possible implementation, the velocity field value map further includes coordinate parameters of the multiple micro-logging points, coordinate parameters of multiple interpolation points, and current first velocity parameters of the multiple interpolation points; and the first acquisition module is configured to:

[0044] Acquire coordinate parameters of the plurality of micro-logs and second velocity parameters of the plurality of micro-logs at each layer, where the second velocity parameters are original velocity parameters of the micro-logs;

[0045] For each horizon, generating a first velocity point value map of the horizon based on the coordinate parameters of the plurality of micro-well logs and the second velocity parameters of the plurality of micro-well logs at the horizon;

[0046] Performing node extrapolation and node interpolation on the first velocity point value graph to obtain a second velocity point value graph, wherein the second velocity point value graph includes coordinate parameters of the plurality of micro-well loggings, second velocity parameters of the plurality of micro-well loggings at the layers, coordinate parameters of the plurality of interpolation points, and second velocity parameters of the plurality of interpolation points;

[0047] Node smoothing is performed on the second velocity point value graph to obtain the velocity field value graph.

[0048] In a possible implementation, the velocity field value map further includes first velocity parameters of multiple interpolation points, and the screening module is configured to:

[0049] generating a normal distribution curve of the first velocity parameter based on a plurality of first velocity parameters of micro-logging points and a plurality of first velocity parameters of interpolation points in the velocity field value map;

[0050] Determining a first parameter range of the first speed parameter based on the normal distribution curve and the preset interval area, where the first parameter range is a range of the first speed parameter corresponding to the preset interval area;

[0051] The micro-well log having a first velocity parameter not within the first parameter range is determined as the first target micro-well log.

[0052] In one possible implementation, the baseline auxiliary data includes a plurality of first baseline auxiliary data and a plurality of second baseline auxiliary data, wherein the first baseline auxiliary data corresponds to a first baseline micro-log, which is a micro-log remaining after removing the plurality of first target micro-logs from the plurality of micro-logs, and the second baseline auxiliary data corresponds to a second baseline micro-log, which is a micro-log having a depth greater than that of the first target micro-log.

[0053] The determining module includes at least one of the following units:

[0054] a first determining unit configured to determine, based on the plurality of first reference auxiliary data and the auxiliary data of each first target micro-log, a second target micro-log from the plurality of first target micro-logs, wherein the auxiliary data of the second target micro-log does not match any of the plurality of first reference auxiliary data; or

[0055] A second determining unit is configured to determine a second target micro-log from the plurality of first target micro-logs based on the plurality of second benchmark auxiliary data and the auxiliary data of each first target micro-log, wherein the auxiliary data of the second target micro-log does not match any of the plurality of second benchmark auxiliary data.

[0056] In one possible implementation, the auxiliary data includes a first micro-logging curve, a first elevation parameter, a first velocity smoothing parameter, and a first lithologic parameter; the first benchmark auxiliary data includes multiple second elevation parameters and multiple second velocity smoothing parameters of the multiple first benchmark micro-logging curves, multiple second micro-logging curves of multiple first benchmark micro-logging curves within a target terrain area, and multiple second lithologic parameters of multiple first benchmark micro-logging curves within a target lithologic area; the target terrain area is an area within the target work area having the same terrain as that of the area where the first target micro-logging curve is located; and the target lithologic area is an area within the target work area having the same lithology as that of the area where the first target micro-logging curve is located.

[0057] The first determining unit is configured to:

[0058] Determining a second target micro-log from the plurality of first target micro-logs based on the plurality of second micro-logging curves and the first micro-logging curve of each first target micro-log, wherein the strike trend of the first micro-logging curve of the second target micro-log does not match the strike trend of the plurality of second micro-logging curves; or

[0059] Based on the multiple second elevation parameters, a second parameter range of a benchmark is formed; based on the second parameter range and the first elevation parameter of each first target micro-log, a second target micro-log is determined from the multiple first target micro-logs, and the first elevation parameter of the second target micro-log is not within the second parameter range; or

[0060] A third parameter range of a benchmark is formed based on the multiple second velocity smoothing parameters; a second target micro-log is determined from the multiple first target micro-logs based on the third parameter range and the first velocity smoothing parameter of each first target micro-log, where the first elevation parameter of the second target micro-log is not within the third parameter range, and the velocity smoothing parameter is used to represent the difference between the original velocity parameter before and after node smoothing; or

[0061] Based on the multiple second lithologic parameters, a fourth parameter range of a benchmark is formed; based on the fourth parameter range and the first lithologic parameter of each first target micro-logging, a second target micro-logging is determined from the multiple first target micro-loggings, the first lithologic parameter of the second target micro-logging is not within the fourth parameter range, and the lithologic parameter is used to represent the distribution of the original velocity parameter of the micro-logging in the target lithologic area.

[0062] In one possible implementation, the second reference auxiliary data includes a plurality of third micro-logging curves of a plurality of second reference micro-logging curves within a target terrain region, where the target terrain region is an area within the target work area having the same terrain as that of the area where the first target micro-logging curves are located;

[0063] The second determining unit is configured to:

[0064] Based on the multiple third micro-logging curves and the first micro-logging curve of each first target micro-logging curve, a second target micro-logging curve is determined from the multiple first target micro-logging curves, and the trend of the first micro-logging curve of the second target micro-logging curve does not match the trend of the multiple third micro-logging curves.

[0065] In a possible implementation, the apparatus further includes:

[0066] a generating module, configured to generate a first structural map and a second structural map of the target work area based on the well logging data of the plurality of micro-logs and the well logging data of the plurality of third target micro-logs respectively;

[0067] A comparison module is used to compare the first structural map and the second structural map to determine a comparison result, and the comparison result is used to verify the screening effect of the multiple micro-well logs.

[0068] On the other hand, a computer device is provided, comprising one or more processors and one or more memories, wherein the one or more memories store at least one instruction, and the at least one instruction is loaded and executed by the one or more processors to implement the operations performed by the micro-logging screening method described in any of the above-mentioned implementations.

[0069] On the other hand, a computer-readable storage medium is provided, wherein at least one instruction is stored in the computer-readable storage medium, and the at least one instruction is loaded and executed by a processor to implement the operations performed by the micro-logging screening method described in any of the above implementations.

[0070] In another aspect, a computer program product or computer program is provided. The computer program product or computer program includes computer program code stored in a computer-readable storage medium. A processor of a computer device reads the computer program code from the computer-readable storage medium and executes the computer program code, causing the computer device to perform the operations performed by the above-described micro-well logging screening method.

[0071] The beneficial effects of the technical solutions provided by the embodiments of the present application include at least:

[0072] The present application provides a method for screening micro-logs. This method first uses a velocity field value diagram to identify a first target micro-log whose first velocity parameter is not within a reference first parameter range, thereby quickly and effectively narrowing the screening range of the micro-logs. Second target micro-logs to be removed are then screened based on the screened first target micro-logs, effectively improving the efficiency of screening the second target micro-logs. This method effectively avoids the waste of manpower and material resources caused by individually screening each piece of logging data from multiple micro-logs, thereby improving the efficiency of micro-log screening. BRIEF DESCRIPTION OF THE DRAWINGS

[0073] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0074] Figure 1 This is a flow chart of a micro-well logging screening method provided in an embodiment of the present application;

[0075] Figure 2 This is a surface landform distribution characteristic map of a target work area provided in an embodiment of the present application;

[0076] Figure 3 This is a micro-logging distribution map of a target work area provided in an embodiment of the present application;

[0077] Figure 4 is a normal distribution curve diagram of a first speed parameter provided in an embodiment of the present application;

[0078] Figure 5 is a normal distribution curve diagram of a first speed parameter provided in an embodiment of the present application;

[0079] Figure 6 is a normal distribution curve diagram of a first speed parameter provided in an embodiment of the present application;

[0080] Figure 7 This is a distribution map of a first target micro-logging in a target work area provided by an embodiment of the present application;

[0081] Figure 8 This is a micro-logging curve comparison diagram provided in an embodiment of the present application;

[0082] Figure 9 This is a micro-logging curve comparison diagram provided in an embodiment of the present application;

[0083] Figure 10 This is a distribution map of the second target micro-logging in a target work area provided by an embodiment of the present application;

[0084] Figure 11 This is a distribution map of micro-well logging within a test area of a target work area provided in an embodiment of the present application;

[0085] Figure 12 This is a distribution map of the second target micro-logging within a test area of a target work area provided in an embodiment of the present application;

[0086] Figure 13 This is a structural diagram comparison diagram of a target work area provided in an embodiment of the present application;

[0087] Figure 14 This is a velocity field comparison diagram of a target work area provided in an embodiment of the present application;

[0088] Figure 15 is a schematic diagram of a first inversion velocity field provided in an embodiment of the present application;

[0089] Figure 16 is a schematic diagram of a second inversion velocity field provided in an embodiment of the present application;

[0090] Figure 17 is a schematic diagram of a third inversion velocity field provided in an embodiment of the present application;

[0091] Figure 18 is a schematic diagram of a fourth inversion velocity field provided in an embodiment of the present application;

[0092] Figure 19 This is a cross-sectional diagram of a well connection calibration for ultra-deep micro-well logging provided in an embodiment of the present application;

[0093] Figure 20 This is a well connection velocity curve for ultra-deep micro-well logging provided in an embodiment of the present application;

[0094] Figure 21 This is a block diagram of a micro-well logging screening device provided in an embodiment of the present application;

[0095] Figure 22 This is a block diagram of a computer device provided in an embodiment of the present application. DETAILED DESCRIPTION

[0096] In order to make the objectives, technical solutions and advantages of this application clearer, the implementation methods of this application will be further described in detail below with reference to the accompanying drawings.

[0097] The terms "first," "second," "third," and "fourth," etc. in the specification and claims of this application and the accompanying drawings are used to distinguish different objects, not to describe a specific order. In addition, the terms "including" and "having," and any variations thereof, are intended to cover non-exclusive inclusions. For example, a process, method, system, product, or apparatus comprising a series of steps or elements is not limited to the listed steps or elements, but may optionally include steps or elements not listed, or may optionally include other steps or elements inherent to the process, method, product, or apparatus.

[0098] The present application provides a micro-well logging screening method, see Figure 1 , methods include:

[0099] Step 101: A computer device obtains velocity field value maps of multiple layers in a target work area.

[0100] The target work area is the work area to be studied, which may include deserts, farmlands, public welfare forests, grasslands, mountains and other landform types. Figure 2 , Figure 2 This is a three-dimensional surface landform distribution feature map of a target work area in a depression in the west. It can be seen that the target work area includes a variety of complex landform types. Figure 3 , Figure 3 This is the micro-logging distribution map of the target work area. It can be seen from the map that micro-logging is widely distributed in the target work area and there are many of them.

[0101] The velocity field value map for each layer includes the current first velocity parameters of multiple micro-logging wells in the target work area, the coordinate parameters of multiple micro-logging wells, the coordinate parameters of multiple interpolation points, and the current first velocity parameters of multiple interpolation points. The multiple micro-logging wells include all micro-logging wells in the target work area. The coordinate parameters of the micro-logging well are the geodetic coordinates of the location of the micro-logging well, including horizontal and vertical coordinates. The current first velocity parameter of the micro-logging well is the velocity parameter after node smoothing of the original velocity parameter of the micro-logging well. The original velocity parameter is the interval velocity of the formation measured by the micro-logging well at the location of the layer. The horizontal and vertical coordinates of the velocity field value map are the horizontal and vertical coordinates of the geodetic coordinates, respectively. The first velocity parameter of each micro-logging well can be interactively displayed at the location of the micro-logging well in the velocity field value map, and the first velocity parameter of each interpolation point can be interactively displayed at the location of the interpolation point in the velocity field value map. The interactive display method is that when the computer device detects a click operation on the micro-logging well or interpolation point, the first velocity parameter of the micro-logging well or the interpolation point is displayed in the velocity point value map. In another possible implementation, the first velocity parameter of the micro-logging point or the interpolation point is directly displayed at the position of the micro-logging point or the interpolation point in the velocity field value map.

[0102] It should be noted that the depth of the micro-logging is equal to the thickness of the near-surface formation comprising the multiple layers, meaning that the micro-logging penetrates the multiple layers. The number of layers can be divided based on the different original velocity parameters of each layer. For example, the near-surface formation can be divided into three layers based on the different original velocity parameters of the near-surface formation, and the original velocity parameters of each of the three layers are different.

[0103] In the embodiment of the present application, obtaining velocity field value maps of multiple layers in the target work area can be achieved by following the steps (1)-(4):

[0104] (1) The computer device obtains the coordinate parameters of multiple micro-logging and the second velocity parameters of multiple micro-logging at each layer, where the second velocity parameters are the original velocity parameters of the micro-logging.

[0105] In an embodiment of the present application, the coordinate parameters and the second velocity parameters are obtained from the logging data of the target work area, and the logging data can be presented in the form of a micro-logging acquisition information table. The data in the micro-logging acquisition information table is sorted to obtain data presented in text form for each layer, and each text includes the well names, coordinate parameters, second velocity parameters and layer thickness parameters of multiple micro-logging wells. In response to the storage instruction for the text, the text is saved as a comma-separated CSV (Comma-Separated Values) text format file. In response to the text format conversion instruction for the CSV file, the text format of the CSV file is converted using an awk (a programming language) statement, so that the CSV file is converted into a target text of a text format type that can be recognized by Paradigm18 software (a data processing software), and the target text includes the well names, coordinate parameters, second velocity parameters and layer thickness parameters of multiple micro-logging wells.

[0106] In an embodiment of the present application, by organizing the logging data and converting the text format, a target text that can be recognized by the Paradigm18 software is obtained, and then the Paradigm18 software can quickly process the target text containing the well name, coordinate parameters, second velocity parameters and layer thickness parameters of the micro-logging.

[0107] (2) For each layer, the computer device generates a first velocity point value diagram of the layer based on the coordinate parameters of the multiple micro-logging and the second velocity parameters of the multiple micro-logging at the layer.

[0108] In an embodiment of the present application, a first speed point value graph is generated by Paradigm18 software; in Paradigm18 software, a target text is loaded in the same manner as loading text, and a first speed point value graph is generated in Paradigm18 software based on the loaded target text.

[0109] The abscissa and ordinate in the first velocity point value diagram are the abscissa and ordinate of the geodetic coordinates respectively, and the second velocity parameter of the micro-logging well can be displayed interactively or directly at the position of the micro-logging well in the first velocity point value diagram.

[0110] (3) The computer device performs node extrapolation and node interpolation on the first speed point value graph to obtain a second speed point value graph.

[0111] The second velocity point value map includes the coordinate parameters of multiple micro-logging wells, the second velocity parameters of the multiple micro-logging wells at the layer, the coordinate parameters of multiple interpolation points, and the second velocity parameters of multiple interpolation points. The abscissa and ordinate in the second velocity point value map are the abscissa and ordinate of the geodetic coordinates, respectively. The second velocity parameters of the micro-logging wells can be displayed interactively or directly at the position of the micro-logging wells in the second velocity point value map. The second velocity parameters of the interpolation points can be displayed interactively or directly at the position of the interpolation points in the second velocity point value map.

[0112] In an embodiment of the present application, the first velocity point value graph is subjected to node extrapolation and node interpolation using Paradigm18 software. It should be noted that, due to economic cost constraints and the limitations of the topography within the target work area, the number of micro-logging wells established within the target work area is limited, that is, the distribution density of micro-logging wells is relatively low, resulting in a relatively small amount of data for the measured second velocity parameter. In an embodiment of the present application, by performing node extrapolation and node interpolation on the first velocity point value graph, the second velocity parameters of multiple interpolation points can be obtained, thereby increasing the number of second velocity parameters. In this way, the accuracy of node smoothing of the second velocity point value graph can be improved by using a sufficient number of second velocity parameters.

[0113] (4) The computer device performs node smoothing on the second velocity point value graph to obtain a velocity field value graph.

[0114] In the embodiment of the present application, the second speed point value graph is node smoothed using Paradigm18 software.

[0115] It should be noted that during micro-logging, due to factors such as noise interference and logging errors, some of the multiple measured second velocity parameters often experience sudden changes. For example, a second velocity parameter may suddenly increase or decrease relative to surrounding second velocity parameters. However, in the present embodiment, by performing node smoothing on the second velocity point value graph, sudden changes in the second velocity parameter can be corrected to align with the surrounding second velocity parameters, thereby effectively improving the accuracy of the velocity field value graph.

[0116] Step 102: The computer device screens multiple micro-well logs for each layer based on the velocity field value map to obtain multiple first target micro-well logs.

[0117] The first target micro-logging is a micro-logging whose first velocity parameter does not meet a preset condition.

[0118] This step can be achieved by following the steps (1)-(3):

[0119] (1) The computer device generates a normal distribution curve of the first velocity parameter based on the first velocity parameters of multiple micro-logging points in the velocity field value diagram and the first velocity parameters of multiple interpolation points.

[0120] The horizontal axis of the normal distribution curve is the first velocity parameter, and the vertical axis is the frequency. Figure 4 ,This figure is a normal distribution curve of the first velocity parameter of the velocity field value diagram. The normal distribution curve is presented in the form of a bell curve. The frequencies corresponding to the first velocity parameters on the left and right sides are low, and the frequencies corresponding to the first velocity parameters in the middle part are high.

[0121] (2) The computer device determines a first parameter range of the first speed parameter based on the normal distribution curve and the preset interval area, where the first parameter range is the first speed parameter range corresponding to the preset interval area.

[0122] Among them, the first speed parameter corresponding to the maximum frequency in the normal distribution curve is used as the boundary to divide it into a left area and a right area. For the left area, from the boundary to the left, when the area of the left area reaches the preset interval area, the left target area is obtained. The first speed parameter corresponding to the left endpoint of the left target area is used as the minimum value of the first parameter range. For the right area, from the boundary to the right, when the area of the right area reaches the preset interval area, the right target area is obtained, and the first speed parameter corresponding to the right endpoint of the right target area is used as the maximum value of the first parameter range. The size of the preset interval area can be set and changed as needed; for example, the preset interval area accounts for 95% of the area of the left area in the normal distribution curve, and 95% of the area of the right area.

[0123] Continuing with the target work area in a depression in the west as an example, see Figure 5 , This figure is a normal distribution curve of the first speed parameter. The framed area in the figure is the area that is neither in the left target area nor in the right target area; the area outside the frame line is the area consisting of the left target area and the right target area. The first speed parameters corresponding to the left and right endpoints of this area are the minimum and maximum values of the first parameter range respectively. Figure 6This figure shows the normal distribution curve of the first speed parameter. The framed area in the figure is the area consisting of the left target area and the right target area. The left and right endpoints of this area correspond to the minimum and maximum values of the first speed parameters in the first parameter range, respectively. The area outside the frame is not within the left target area or the right target area.

[0124] (3) The computer device determines the micro-logging whose first velocity parameter is not within the first parameter range as the first target micro-logging.

[0125] Continuing with the target work area in a depression in the west as an example, see Figure 7 , Figure 7 It is a distribution diagram of multiple first target micro-loggings screened in the target work area, and the first velocity parameter is directly displayed on the distribution diagram.

[0126] In the embodiment of the present application, by establishing a normal distribution curve for the first velocity parameter in the velocity field value diagram, the distribution of the first velocity parameter can be intuitively obtained according to the normal distribution curve, and then the first velocity parameter with low frequency can be screened out by the preset interval area; and the first velocity parameter with low frequency generally has a low frequency due to the presence of data anomalies. Therefore, the first parameter range of the benchmark is determined by the normal distribution curve, and the determined first parameter range has high accuracy; and then the micro-logging whose first velocity parameter is not within the first parameter range is determined as the first target micro-logging, which conforms to the screening rule for micro-logging. Moreover, the first target micro-logging is determined by the normal distribution curve; and then the screening of micro-logging is concentrated on the screening of the first target micro-logging, which narrows the screening range of micro-logging, saves manpower and material resources, and avoids the waste of manpower and material resources caused by screening each micro-logging one by one.

[0127] Step 103: The computer device obtains auxiliary data of each first target micro-logging.

[0128] The auxiliary data is data that assists the first target micro-logging in screening. The auxiliary data includes a first micro-logging curve, a first elevation parameter, a first velocity smoothing parameter, and a first lithology parameter. The auxiliary data can be obtained from the logging data of the target work area.

[0129] It should be noted that the first elevation parameter is the elevation value of the first target micro-logging well; the first velocity smoothing parameter is the difference between the first velocity parameter of the first target micro-logging well after node smoothing and the second velocity parameter before node smoothing, which is used to indicate the difference between the original velocity parameter before and after node smoothing; the first lithology parameter is the layer velocity of the first target micro-logging well at the lithology position where it is located, which is used to indicate the distribution of the original velocity parameter of the micro-logging well in the target lithology area.

[0130] Step 104: The computer device determines a second target micro-well log from a plurality of first target micro-well logs based on the auxiliary data of each first target micro-well log.

[0131] The auxiliary data for the second target micro-log does not match the baseline auxiliary data. The baseline auxiliary data includes multiple first baseline auxiliary data and multiple second baseline auxiliary data. The first baseline auxiliary data corresponds to the first baseline micro-log, which is the micro-log remaining after removing the multiple first target micro-logs from the multiple micro-logs. The second baseline auxiliary data corresponds to the second baseline micro-log, which is a micro-log with a depth greater than that of the first target micro-log. The second baseline micro-log is a deep micro-log. The first and second baseline auxiliary data can be obtained from the well logging data of the target work area.

[0132] This step includes at least one of the following two implementation methods (1)-(2):

[0133] (1) The computer device determines a second target micro-log from the plurality of first target micro-logs based on the plurality of first baseline auxiliary data and the auxiliary data of each first target micro-log, wherein the auxiliary data of the second target micro-log does not match any of the plurality of first baseline auxiliary data.

[0134] Among them, the first benchmark auxiliary data includes multiple second elevation parameters and multiple second velocity smoothing parameters of multiple first benchmark micro-logging curves of multiple first benchmark micro-logging curves in the target terrain area and multiple second lithologic parameters of multiple first benchmark micro-logging curves in the target lithologic area. The target terrain area is an area in the target work area with the same terrain as the area where the first target micro-logging curve is located, and the target lithologic area is an area in the target work area with the same lithology as the area where the first target micro-logging curve is located.

[0135] The implementation includes at least one of the following implementations:

[0136] A1: The computer device determines the second target micro-logging from the multiple first target micro-logging curves based on the multiple second micro-logging curves and the first micro-logging curve of each first target micro-logging curve, and the strike trend of the first micro-logging curve of the second target micro-logging does not match the strike trend of the multiple second micro-logging curves.

[0137] The horizontal coordinates of the first micro-logging curve and the second micro-logging curve are depth and the vertical coordinates are interval velocity. Strike trend matching means the strike trend is the same or similar. Figure 8 , Figure 8This includes the first micro-logging curve of the first target micro-logging curve W16 within the target terrain, and the second micro-logging curves of multiple first reference micro-logging curves, such as W10 and W11. As can be seen from the figure, the first micro-logging curve of the first target micro-logging curve W16 shows a trend of decreasing layer velocity with increasing depth, while the second micro-logging curves of the first reference micro-logging curves in the surrounding same terrain show a trend of increasing and then decreasing layer velocity with increasing depth, or increasing layer velocity with increasing depth. The trend of the first micro-logging curve is different from the trend of the multiple second micro-logging curves; therefore, the first target micro-logging curve W16 is determined to be the second target micro-logging curve.

[0138] It should be noted that the trend of the first micro-logging curve of the micro-logging within the same terrain should be matched, that is, the same or similar; therefore, in the embodiment of the present application, by matching the micro-logging curves within the same terrain, the second target micro-logging with abnormal logging data in the first target micro-logging can be effectively screened out with high accuracy.

[0139] A2: The computer device forms a second parameter range of a benchmark based on multiple second elevation parameters; the computer device determines a second target micro-log from multiple first target micro-logs based on the second parameter range and the first elevation parameter of each first target micro-log, and the first elevation parameter of the second target micro-log is not within the second parameter range.

[0140] In this implementation, the computer device determines a second parameter range consisting of multiple second elevation parameters. If the first elevation parameter of the first target micro-well logging is not within the second parameter range, the computer device determines that the first elevation parameter does not match the multiple second elevation parameters, and the first target micro-well logging is determined to be the second target micro-well logging. For example, if the second parameter range is 300-800 meters and the first elevation parameter of the first target micro-well logging is 1000 meters, then the first elevation parameter does not match the multiple second elevation parameters, and the first target micro-well logging is determined to be the second target micro-well logging.

[0141] The maximum value and the minimum value of the plurality of second elevation parameters are the upper limit and the lower limit of the second parameter range, respectively.

[0142] In another possible implementation, the computer device may further generate an elevation point value map based on the plurality of first elevation parameters and the plurality of second elevation parameters. The first elevation parameter of the first target micro-log and the second elevation parameter of the first reference micro-log may be directly displayed at the positions of the first target micro-log and the first reference micro-log, respectively, on the elevation point value map. From the elevation point value map, it is possible to intuitively identify first target micro-logs whose first elevation parameter is not within the range of the second parameter.

[0143] It should be noted that the first elevation parameter in the same target work area should be within the range of a second parameter; therefore, in the embodiment of the present application, by matching the elevation parameters of the same target work area, the second target micro-logging with abnormal logging data in the first target micro-logging can be effectively screened out, and the screening accuracy is high.

[0144] A3: The computer device forms a benchmark third parameter range based on multiple second velocity smoothing parameters; the computer device determines a second target micro-log from multiple first target micro-logs based on the third parameter range and the first velocity smoothing parameter of each first target micro-log, and the first elevation parameter of the second target micro-log is not within the third parameter range.

[0145] In this implementation, a computer device determines a third parameter range consisting of multiple second velocity smoothing parameters. If the first velocity smoothing parameter of the first target micro-log is not within the third parameter range, the computer device determines that the first velocity smoothing parameter does not match the multiple second velocity smoothing parameters, and determines that the first target micro-log is the second target micro-log. The maximum and minimum values of the multiple second smoothing parameters are the upper and lower limits of the third parameter range, respectively.

[0146] In another possible implementation, the computer device can also generate a smoothed speed point value graph based on multiple first speed smoothing parameters and multiple second speed smoothing parameters. The first speed smoothing parameter of the first target micro-logging and the second speed smoothing parameter of the first reference micro-logging can be directly displayed at the positions of the first target micro-logging and the first reference micro-logging in the smoothed speed point value graph; from the smoothed speed point value graph, it can be intuitively obtained that the first target micro-logging whose first speed smoothing parameter is not within the range of the third parameter.

[0147] It should be noted that if the second velocity parameter of the first target micro-log, that is, the original velocity parameter, differs significantly from the second velocity parameter of the first reference micro-log, then the difference between the first velocity parameter and the second velocity parameter obtained after node smoothing of the second velocity parameter of the first target micro-log is large, and does not match the second velocity smoothing parameter of the first reference micro-log in the target work area. Thus, in the embodiment of the present application, by matching the velocity smoothing parameters within the same target work area, the second target micro-log with abnormal logging data in the first target micro-log can be effectively screened out, thereby improving the accuracy of the screening.

[0148] A4: The computer device forms a fourth parameter range of a benchmark based on multiple second lithologic parameters; the computer device determines a second target micro-log from multiple first target micro-logs based on the fourth parameter range and the first lithologic parameter of each first target micro-log, and the first lithologic parameter of the second target micro-log is not within the fourth parameter range.

[0149] In this implementation, the computer device determines a fourth parameter range consisting of multiple second lithologic parameters; if the first lithologic parameter of the first target micro-logging is not within the fourth parameter range, it is determined that the first lithologic parameter does not match the multiple second lithologic parameters, and the first target micro-logging is determined to be the second target micro-logging.

[0150] It should be noted that the velocity of seismic waves propagating through a formation is affected by the lithology of the formation; for example, the velocity of seismic waves propagating through a formation characterized by marl is greater than that through a shaly shale. Therefore, the interval velocities measured in formations with different lithologies differ. In this embodiment of the present application, by matching lithologic parameters within the same target lithologic region, micro-logs with abnormal logging data within the first target micro-log can be effectively screened out, thereby improving the accuracy of the screening.

[0151] (2) The computer device determines a second target micro-log from the plurality of first target micro-logs based on the plurality of second reference auxiliary data and the auxiliary data of each first target micro-log.

[0152] The second reference auxiliary data includes a plurality of third micro-logging curves of a plurality of second reference micro-logging curves within a target terrain area, and the target terrain area is an area within the target work area having the same terrain as the area where the first target micro-logging curve is located.

[0153] In this implementation, the computer device determines a second target micro-log from the plurality of first target micro-logs based on the plurality of third micro-log curves and the first micro-log curve of each first target micro-log, wherein the strike trend of the first micro-log of the second target micro-log does not match the strike trends of the plurality of third micro-log curves. Strike trend matching means that the strike trends are identical or similar.

[0154] The horizontal coordinates of the first micro-logging curve and the third micro-logging curve are depth and the vertical coordinates are interval velocity. Figure 9 The figure includes the first micro-logging curve of the first target micro-logging curve Q within the target terrain and the third micro-logging curves of the second reference micro-logging curve A, the second reference micro-logging curve B, and so on. As can be seen from the figure, the strike trend of the first micro-logging curve of the first target micro-logging curve Q and the strike trend of the third micro-logging curves of the second reference micro-logging curve A and the second reference micro-logging curve B all show a strike trend in which the interval velocity remains basically unchanged with increasing depth, indicating that the strike trends of the two are the same. That is, the strike trend of the first micro-logging curve of the first target micro-logging curve Q matches the strike trend of the third micro-logging curves of the second reference micro-logging curve A and the second reference micro-logging curve B. Therefore, it is determined that the first target micro-logging curve Q is not the second target micro-logging curve.

[0155] It should be noted that since the second reference micro-logging is a deep micro-logging with a depth greater than the depth of the micro-logging, and the third logging curve of the deep micro-logging has a high accuracy; therefore, in the embodiment of the present application, by matching the first micro-logging curve with the third logging curve of the deep micro-logging, the accuracy of determining the second target micro-logging can be improved.

[0156] In the embodiments of the present application, the above-mentioned implementations can be used individually or in combination. When used in combination, the implementations can be combined arbitrarily. If any of the implementations in the combination can determine the first target micro-logging as the second target micro-logging, then the first target micro-logging is determined to be the second target micro-logging.

[0157] In the embodiments of the present application, the computer device can not only determine the second target micro-log within the target work area, but also determine the second target micro-log within a test area within the target work area. After the computer device determines the scope of the test area, it uses the method provided in the embodiments of the present application to determine the second target micro-log within the test area.

[0158] Continuing with the target work area in a depression in the west as an example, see Figure 10 , Figure 10 This is the distribution map of the second target micro-logging in the target work area. Figure 11 , Figure 11 This is the distribution map of all micro-logging wells in the 100 square kilometers test area of the target work area. Figure 12 , Figure 12 The distribution map of the second target micro-logging in the test area determined by the method provided in the embodiment of the present application. Figure 10 and Figure 12 It can be seen that the distribution of the second target micro-logging in the test area is consistent with the distribution of the second target micro-logging in the target work area in the test area, indicating that the method provided in the embodiment of the present application has high repeatability and accuracy in determining the second target micro-logging.

[0159] Step 105: The computer device removes the second target micro-logs of multiple layers in the multiple micro-logs to obtain multiple third target micro-logs in the target work area.

[0160] The logging data of multiple third target micro-logs are used for geological structure imaging.

[0161] It should be noted that when the third target micro-logging is used for geological structure imaging, the first arrival wave tomographic inversion method constrained by micro-logging is used to perform geological structure imaging. This method establishes a near-surface model based on the logging data of the third target micro-logging, uses the near-surface model as a constraint condition, and combines it with the travel time residual in the seismic data to form an objective function; the least squares solution of the objective function is determined based on the Lagrangian constraint method, and geological structure imaging is performed based on the data of the least squares solution. In an embodiment of the present application, by screening out the second target micro-logging with abnormal logging data and retaining the third target micro-logging with normal logging data, the accuracy of the near-surface model obtained by the logging data of the normal third target micro-logging is high, and then based on the near-surface model, the weight coefficient value of the optimal constraint constrained by the Lagrangian constraint method on the objective function can be improved to improve the effect of geological structure imaging; wherein, the geological structure imaging can be depth domain imaging.

[0162] In the embodiment of the present application, multiple third target micro-logs with normal logging data in the target work area are obtained through the above steps 101-105, and the screening effect of the multiple micro-logs is verified through the following steps 106-107.

[0163] Step 106: The computer device generates a first structural map and a second structural map of the target work area based on the well logging data of the plurality of micro-logs and the well logging data of the plurality of third target micro-logs.

[0164] The computer device inverts the logging data of the plurality of third target micro-logs to obtain a first near-surface model of the target work area; performs depth-domain imaging of the target work area based on the first near-surface model to generate a first structural map. The computer device inverts the logging data of the plurality of micro-logs to obtain a second near-surface model of the target work area; performs depth-domain imaging of the target work area based on the second near-surface model to generate a second structural map.

[0165] Step 107: The computer device compares the first structural map and the second structural map to determine a comparison result, which is used to verify the screening effect of the multiple micro-well logging.

[0166] The comparison result includes a first comparison result and a second comparison result. The first comparison result is that the accuracy of the first structural diagram is less than the accuracy of the second structural diagram. The second comparison result is that the accuracy of the first structural diagram is greater than the second structural diagram.

[0167] If the comparison result is the first comparison result, it indicates that the accuracy of the third target micro-log is high, that is, the accuracy of the second target micro-log that has been screened out is high. If the comparison result is the second comparison result, it indicates that the accuracy of the third target micro-log is low, that is, the accuracy of the second target micro-log that has been screened out is low.

[0168] Continuing with the target work area in a depression in the west as an example, see Figure 13 , the left side of the figure is Figure 13 The longitudinal section shown in the lower right corner corresponds to the first structural map, and the right side of the map is the second structural map corresponding to the same longitudinal section. By comparison, it can be seen that the details of the second structural map are more refined and rich, indicating that the accuracy of the first structural map is less than that of the second structural map. The comparison result is determined to be the first comparison result, that is, the accuracy of the third target micro-logging obtained is high, and the accuracy of the abnormal second target micro-logging screened out is high.

[0169] In the embodiment of the present application, the screening effect of the micro-logging is verified by the first structural map and the second structural map, which can effectively illustrate the screening effect of the micro-logging, and by screening out the logging data of the third target micro-logging of the second target micro-logging with abnormal logging data, a highly accurate structural map can also be generated.

[0170] It should be noted that if the comparison result is the second comparison result, that is, the accuracy of the first structural map is greater than the accuracy of the second structural map, the above steps 101 to 105 need to be repeated to re-screen the micro-well logging.

[0171] In the embodiment of the present application, in addition to verifying the screening effect of multiple micro-well logging through the construction diagram, the screening effect of multiple micro-well logging through the method provided by the embodiment of the present application is also verified through at least one of the following implementation methods.

[0172] (1) The computer device performs inversion based on the logging data of multiple micro-logs to obtain a first near-surface model of the target work area, generates a first velocity field of the target work area based on the first near-surface model, and performs inversion based on the logging data of multiple third target micro-logs to obtain a second near-surface model of the target work area, and generates a second velocity field of the target work area based on the second near-surface model. The first velocity field is compared with the second velocity field; if the smoothness of the first velocity field is less than that of the second velocity field, it is determined that the accuracy of the obtained third target micro-log is high, that is, the accuracy of the second target micro-log with abnormal logging data is high. The smoothness is used to indicate whether the near-surface velocity transition between different formations is smooth.

[0173] Continuing with the target work area in a depression in the west as an example, see Figure 14 , the left side of the figure is Figure 14The schematic diagram of the first velocity field corresponding to the longitudinal section shown in the lower right corner, and the schematic diagram of the first velocity field corresponding to the same longitudinal section on the right side of the figure; the horizontal axis of the figure is the common center point number, the vertical axis is the near-surface velocity, and the same filled figure represents the same near-surface velocity. Comparing the first velocity field and the second velocity field, it can be seen that the trend of the near-surface velocity in the second velocity field is smoother than the trend of the near-surface velocity in the first velocity field, and the transition of the near-surface velocity between different strata is smoother, which is more consistent with the changes in the geological conditions in the strata. This further indicates that the accuracy of the second velocity field is higher, and the accuracy of the third target micro-logging is high, that is, the accuracy of the second target micro-logging with abnormal logging data is high. Since the accuracy of the micro-logging well logging data has a significant impact on the accuracy of the velocity field, the screening effect of the micro-logging is verified by the first and second velocity fields in the embodiment of the present application, which can effectively illustrate the screening effect of the micro-logging, and the well logging data of the third target micro-logging that screens out the abnormal logging data of the second target micro-logging can also generate a high-accuracy velocity field.

[0174] In another possible implementation, if the smoothness of the strike trend of the first velocity field is higher than the smoothness of the strike trend of the second velocity field, it indicates that the accuracy of the obtained third target micro-well logging is low, that is, the accuracy of the abnormal second target micro-well logging screened out is low, and the above steps 101-105 need to be repeated to re-screen the micro-well logging.

[0175] (2) The computer device generates a first inversion velocity field constrained by micro-logging based on the logging data of multiple third-target micro-logs; generates a second inversion velocity field constrained by micro-logging based on the logging data of multiple micro-logs; generates a third inversion velocity field constrained by micro-logging based on the logging data of multiple third-target micro-logs and a second-target micro-log with a significant anomaly in the layer velocity; and generates a fourth inversion velocity field without micro-logging constraints. By comparing the first inversion velocity field, the second inversion velocity field, the third inversion velocity field, and the fourth inversion velocity field, the influence of the selected logging data of the third-target micro-log on the inversion velocity field is explained.

[0176] Continuing to take the target work area of a depression in the west as an example, the first inversion velocity field, the second inversion velocity field, the third inversion velocity field and the fourth inversion velocity field are respectively as follows: Figure 15 、 Figure 16 、 Figure 17 and Figure 18As shown, the horizontal axis of the inverted velocity field represents the common center point number, and the vertical axis represents the velocity. The velocities of the first, second, third, and fourth inverted velocity fields are 1400.61 m / s, 1365.33 m / s, 1098.91 m / s, and 1453.90 m / s, respectively, representing the shallow velocities in the target area. A comparison shows that the first inverted velocity field, constrained by multiple third-target micrologs, exhibits a lower velocity than the fourth inverted velocity field without microlog constraints. This change is due to the application of the ray tracing algorithm in generating the inverted velocity field and is reasonable. The third inverted velocity field, constrained by multiple third-target micrologs and one second-target microlog, exhibits a significantly lower velocity than the first inverted velocity field, indicating that the accuracy of the microlog data significantly influences the generated inverted velocity field. Compared with the first inversion velocity field, the third inversion velocity field constrained by multiple unscreened micrologs has a lower velocity and a change in the position of the top interface of the high-speed layer, indicating that the accuracy of the micrologging data not only affects the velocity of the generated inversion velocity field, but also affects other aspects of the inversion velocity field.

[0177] In the embodiment of the present application, by comparing multiple inversion velocity fields, the impact of the logging data of the micro-logging with abnormal logging data on the inversion velocity field is effectively explained, which can guide the staff to generate a high-accuracy inversion velocity field by screening out the logging data of the third target micro-logging of the abnormal second target micro-logging.

[0178] (3) The computer equipment determines the well-connected velocity curves of multiple ultra-deep micro-logging wells respectively, and the well-connected velocity curves include a first velocity curve, a second velocity curve, and a third velocity curve; the first velocity curve is a velocity curve with conventional constraints, the second velocity curve is a velocity curve with logging data constraints of the third target micro-logging well, and the third velocity curve is a velocity curve with logging data constraints and conventional constraints of the ultra-deep micro-logging well. By comparing the first velocity curve, the second velocity curve, and the third velocity curve, the influence of the well-logging data of the selected third target micro-logging well on the velocity curve is explained. Among them, the ultra-deep micro-logging well is a micro-logging well with a depth greater than that of the deep micro-logging well, and the third velocity curve of the ultra-deep micro-logging well has a higher accuracy. The second velocity curve with conventional constraints is a velocity curve with logging data without micro-logging wells and logging data constraints without ultra-deep micro-logging wells.

[0179] See also Figure 19 , Figure 19The following are the calibration profiles of six connected wells from ultra-deep micrologs. The left side shows the first profile obtained using conventional constraints, and the right side shows the second profile obtained using both the ultra-deep microlog's logging data and conventional constraints. Comparing the first and second profiles, we can see that the second profile, obtained using the highly accurate ultra-deep microlog's logging data constraints, depicts more refined and richer details in the mid-depth layer. This indicates that the second profile is more accurate, indicating the high accuracy of the ultra-deep microlog's logging data, and thus the high accuracy of the third velocity curve constrained by the ultra-deep microlog's logging data.

[0180] See also Figure 20 , Figure 20 The figure shows the velocity curves for the six ultra-deep micro-logs. As can be seen from the figure, the trend of the second velocity curve is more consistent with the trend of the third velocity curve than the first. Since the third velocity curve for the ultra-deep micro-log is a highly accurate velocity curve, this indicates that the accuracy of the first velocity curve for the third target micro-log is higher than that of the conventionally constrained second velocity curve. Furthermore, the position of the high-speed top line connecting the six ultra-deep micro-logs in the figure indicates that the depth of the third target micro-log has reached the high-speed top position, indicating that the construction depth of the third target micro-log is reasonable.

[0181] In the embodiment of the present application, by comparing multiple velocity curves, the influence of the logging data of the third target micro-logging that screens out abnormal micro-logging on the velocity curve is effectively explained, which can guide the staff to generate a high-accuracy velocity curve by screening out the logging data of the third target micro-logging that screens out abnormal logging data.

[0182] In the embodiments of the present application, the method provided in the embodiments of the present application is used to screen micro-wells within the target work area, thereby avoiding the adverse effects of not screening all micro-wells and using them for geological structure imaging. It also avoids the waste of manpower and material resources caused by screening micro-wells one by one. The method provided in the embodiments of the present application is applicable to work areas where screening is difficult, such as work areas with a long span of years for logging data collection, complex surface conditions in the work area, a large number of micro-wells, and a wide distribution of micro-wells.

[0183] The screening method provided in the embodiment of the present application is used to screen the micro-wells in the target work area, which requires one worker to complete within one working day. Compared with the traditional screening of micro-wells one by one, which originally required three workers to complete the screening work within one working day, the efficiency is improved by more than 90%.

[0184] The present application provides a method for screening micro-logs. This method first uses a velocity field value diagram to identify a first target micro-log whose first velocity parameter is not within a reference first parameter range, thereby quickly and effectively narrowing the screening range of the micro-logs. Second target micro-logs to be removed are then screened based on the screened first target micro-logs, effectively improving the efficiency of screening the second target micro-logs. This method effectively avoids the waste of manpower and material resources caused by individually screening each piece of logging data from multiple micro-logs, thereby improving the efficiency of micro-log screening.

[0185] The present application also provides a micro-well logging screening device, see Figure 21 , the device comprises:

[0186] The first acquisition module 2101 is used to obtain velocity field value maps of multiple layers in the target work area, where the velocity field value map of each layer includes the current first velocity parameters of multiple micro-logging layers in the target work area;

[0187] A screening module 2102 is configured to screen, for each layer, multiple micro-well logs based on the velocity field value map to obtain multiple first target micro-well logs, wherein the first velocity parameter of the first target micro-well log is not within the first parameter range of the benchmark;

[0188] The second acquisition module 2103 is used to acquire auxiliary data of each first target micro-logging well, where the auxiliary data is data that assists the first target micro-logging well in screening;

[0189] a determination module 2104 for determining, based on the auxiliary data of each first target micro-log, a second target micro-log from the plurality of first target micro-logs, the auxiliary data of the second target micro-log not matching the baseline auxiliary data;

[0190] The removal module 2105 is used to remove the second target micro-logs in multiple layers of the multiple micro-logs to obtain multiple third target micro-logs in the target work area. The logging data of the multiple third target micro-logs are used for geological structure imaging.

[0191] In a possible implementation, the velocity field value map further includes coordinate parameters of multiple micro-logging points, coordinate parameters of multiple interpolation points, and first velocity parameters of multiple interpolation points; the first acquisition module 2101 is used to:

[0192] Acquire coordinate parameters of multiple micro-logging wells and second velocity parameters of multiple micro-logging wells at each layer, where the second velocity parameters are original velocity parameters of the micro-logging wells;

[0193] For each layer, based on the coordinate parameters of the plurality of micro-logging wells and the second velocity parameters of the plurality of micro-logging wells at the layer, a first velocity point value map of the layer is generated;

[0194] Performing node extrapolation and node interpolation on the first velocity point value graph to obtain a second velocity point value graph, wherein the second velocity point value graph includes coordinate parameters of multiple micro-logging wells, second velocity parameters of multiple micro-logging wells at layers, coordinate parameters of multiple interpolation points, and second velocity parameters of multiple interpolation points;

[0195] Perform node smoothing on the second velocity point value graph to obtain a velocity field value graph.

[0196] In a possible implementation, the velocity field value map further includes first velocity parameters of multiple interpolation points, and the screening module 2102 is configured to:

[0197] generating a normal distribution curve of the first velocity parameter based on the first velocity parameters of the plurality of micro-logging points and the first velocity parameters of the plurality of interpolation points in the velocity field value graph;

[0198] Determine a first parameter range of the first speed parameter based on the normal distribution curve and the preset interval area, where the first parameter range is a range of the first speed parameter corresponding to the preset interval area;

[0199] The micro-well log having the first velocity parameter not within the first parameter range is determined as a first target micro-well log.

[0200] In one possible implementation, the baseline auxiliary data includes a plurality of first baseline auxiliary data and a plurality of second baseline auxiliary data, the first baseline auxiliary data corresponding to a first baseline micro-log, which is a micro-log remaining after removing a plurality of first target micro-logs from the plurality of micro-logs, and the second baseline auxiliary data corresponding to a second baseline micro-log, which is a micro-log having a depth greater than a depth of the first target micro-log.

[0201] The determination module 2104 includes at least one of the following units:

[0202] a first determining unit configured to determine, from the plurality of first target micro-logs, based on the plurality of first reference auxiliary data and the auxiliary data of each first target micro-log, a second target micro-log, wherein the auxiliary data of the second target micro-log does not match any of the plurality of first reference auxiliary data; or

[0203] The second determining unit is configured to determine a second target micro-log from the plurality of first target micro-logs based on the plurality of second benchmark auxiliary data and the auxiliary data of each first target micro-log, wherein the auxiliary data of the second target micro-log does not match any of the plurality of second benchmark auxiliary data.

[0204] In one possible implementation, the auxiliary data includes a first micro-logging curve, a first elevation parameter, a first velocity smoothing parameter, and a first lithologic parameter; the first benchmark auxiliary data includes multiple second elevation parameters and multiple second velocity smoothing parameters of multiple first benchmark micro-logging curves within a target terrain area, and multiple second lithologic parameters of multiple first benchmark micro-logging curves within a target terrain area; the target terrain area is an area within the target work area having the same terrain as the area where the first target micro-logging curve is located; and the target lithologic area is an area within the target work area having the same lithology as the area where the first target micro-logging curve is located.

[0205] The first determining unit is configured to:

[0206] Determining a second target micro-log from the plurality of first target micro-logs based on the plurality of second micro-log curves and the first micro-log curve of each first target micro-log, wherein the strike trend of the first micro-log curve of the second target micro-log does not match the strike trend of the plurality of second micro-log curves; or

[0207] Based on the plurality of second elevation parameters, a second parameter range of a benchmark is formed; based on the second parameter range and the first elevation parameter of each first target micro-log, a second target micro-log is determined from the plurality of first target micro-logs, the first elevation parameter of the second target micro-log not being within the second parameter range; or

[0208] Based on multiple second velocity smoothing parameters, a third parameter range of a benchmark is formed; based on the third parameter range and the first velocity smoothing parameter of each first target micro-log, a second target micro-log is determined from the multiple first target micro-logs, the first elevation parameter of the second target micro-log is not within the third parameter range, and the velocity smoothing parameter is used to represent the difference between the original velocity parameter before and after node smoothing; or,

[0209] Based on multiple second lithologic parameters, a fourth parameter range of the benchmark is composed; based on the fourth parameter range and the first lithologic parameter of each first target micro-logging, the second target micro-logging is determined from multiple first target micro-loggings, and the first lithologic parameter of the second target micro-logging is not within the fourth parameter range. The lithologic parameter is used to represent the distribution of the original velocity parameter of the micro-logging in the target lithologic area.

[0210] In one possible implementation, the second reference auxiliary data includes a plurality of third micro-logging curves of a plurality of second reference micro-logging curves within a target terrain region, where the target terrain region is an area within the target work area having the same terrain as the area where the first target micro-logging curve is located;

[0211] The second determining unit is configured to:

[0212] Based on multiple third micro-logging curves and the first micro-logging curve of each first target micro-logging curve, a second target micro-logging curve is determined from the multiple first target micro-logging curves, and the trend of the first micro-logging curve of the second target micro-logging curve does not match the trend of the multiple third micro-logging curves.

[0213] In a possible implementation, the apparatus further includes:

[0214] a generating module for generating a first structural map and a second structural map of the target work area based on the well logging data of the plurality of micro-logs and the well logging data of the plurality of third target micro-logs respectively;

[0215] The comparison module is used to compare the first structural map and the second structural map to determine a comparison result, and the comparison result is used to verify the screening effect of the multiple micro-well logging.

[0216] Figure 22 The following is a block diagram of a computer device 2200 according to an exemplary embodiment of the present application. Computer device 2200 may be a portable mobile computer device, such as a smartphone, a tablet computer, an MP3 player (Moving Picture Experts Group Audio Layer III), an MP4 player (Moving Picture Experts Group Audio Layer IV), a laptop computer, or a desktop computer. Computer device 2200 may also be referred to as a user device, a portable computer device, a laptop computer device, a desktop computer device, or other similar names.

[0217] Typically, the computer device 2200 includes a processor 2201 and a memory 2202 .

[0218] The processor 2201 may include one or more processing cores, such as a 4-core processor, an 8-core processor, etc. The processor 2201 may be implemented in at least one hardware form of DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), or PLA (Programmable Logic Array). The processor 2201 may also include a main processor and a coprocessor. The main processor is a processor for processing data in the awake state, also known as a CPU (Central Processing Unit); the coprocessor is a low-power processor for processing data in the standby state. In some embodiments, the processor 2201 may be integrated with a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content to be displayed on the display screen. In some embodiments, the processor 2201 may also include an AI (Artificial Intelligence) processor, which is used to process computing operations related to machine learning.

[0219] Memory 2202 may include one or more computer-readable storage media, which may be non-transitory. Memory 2202 may also include high-speed random access memory and non-volatile memory, such as one or more disk storage devices and flash memory storage devices. In some embodiments, the non-transitory computer-readable storage medium in memory 2202 is used to store at least one instruction, which is executed by processor 2201 to implement the micro-logging screening method provided in the method embodiment of the present application.

[0220] In some embodiments, computer device 2200 may optionally include a peripheral device interface 2203 and at least one peripheral device. Processor 2201, memory 2202, and peripheral device interface 2203 may be connected via a bus or signal lines. Each peripheral device may be connected to peripheral device interface 2203 via a bus, signal lines, or circuit boards. Specifically, the peripheral device may include at least one of a radio frequency circuit 2204, a display screen 2205, a camera assembly 2206, an audio circuit 2207, a positioning assembly 2208, and a power supply 2209.

[0221] The peripheral device interface 2203 can be used to connect at least one I / O (Input / Output)-related peripheral device to the processor 2201 and the memory 2202. In some embodiments, the processor 2201, the memory 2202, and the peripheral device interface 2203 are integrated on the same chip or circuit board; in some other embodiments, any one or two of the processor 2201, the memory 2202, and the peripheral device interface 2203 can be implemented on separate chips or circuit boards, which is not limited in this embodiment.

[0222] The RF circuit 2204 is used to receive and transmit RF (Radio Frequency) signals, also known as electromagnetic signals. The RF circuit 2204 communicates with communication networks and other communication devices via electromagnetic signals. The RF circuit 2204 converts electrical signals into electromagnetic signals for transmission, or converts received electromagnetic signals into electrical signals. Optionally, the RF circuit 2204 includes an antenna system, an RF transceiver, one or more amplifiers, a tuner, an oscillator, a digital signal processor, a codec chipset, a user identity module card, and the like. The RF circuit 2204 can communicate with other computer devices via at least one wireless communication protocol. Such wireless communication protocols include, but are not limited to, the World Wide Web, metropolitan area networks, intranets, various generations of mobile communication networks (2G, 3G, 4G, and 5G), wireless local area networks, and / or WiFi (Wireless Fidelity) networks. In some embodiments, the RF circuit 2204 may also include circuitry related to Near Field Communication (NFC), which is not limited in this application.

[0223] The display screen 2205 is used to display a UI (User Interface). The UI may include graphics, text, icons, videos, and any combination thereof. When the display screen 2205 is a touch screen display, the display screen 2205 also has the ability to collect touch signals on the surface or above the surface of the display screen 2205. The touch signal can be input as a control signal to the processor 2201 for processing. At this time, the display screen 2205 can also be used to provide virtual buttons and / or virtual keyboards, also known as soft buttons and / or soft keyboards. In some embodiments, there can be one display screen 2205, which is set on the front panel of the computer device 2200; in other embodiments, there can be at least two display screens 2205, which are respectively set on different surfaces of the computer device 2200 or in a folding design; in other embodiments, the display screen 2205 can be a flexible display screen, which is set on the curved surface or folding surface of the computer device 2200. Even more, the display screen 2205 can be set to a non-rectangular irregular shape, that is, a special-shaped screen. The display screen 2205 can be made of materials such as LCD (Liquid Crystal Display) and OLED (Organic Light-Emitting Diode).

[0224] The camera assembly 2206 is used to capture images or videos. Optionally, the camera assembly 2206 includes a front camera and a rear camera. Typically, the front camera is set on the front panel of the computer device, and the rear camera is set on the back of the computer device. In some embodiments, there are at least two rear cameras, which are any one of a main camera, a depth of field camera, a wide-angle camera, and a telephoto camera, so as to realize the fusion of the main camera and the depth of field camera to realize the background blur function, the fusion of the main camera and the wide-angle camera to realize panoramic shooting and VR (Virtual Reality) shooting function or other fusion shooting functions. In some embodiments, the camera assembly 2206 may also include a flash. The flash can be a single-color temperature flash or a dual-color temperature flash. A dual-color temperature flash refers to a combination of a warm light flash and a cold light flash, which can be used for light compensation under different color temperatures.

[0225] The audio circuit 2207 may include a microphone and a speaker. The microphone is used to collect sound waves from the user and the environment, and convert the sound waves into electrical signals that are input into the processor 2201 for processing, or input into the radio frequency circuit 2204 to achieve voice communication. For the purpose of stereo sound collection or noise reduction, there may be multiple microphones, each located in different parts of the computer device 2200. The microphone may also be an array microphone or an omnidirectional collection microphone. The speaker is used to convert electrical signals from the processor 2201 or the radio frequency circuit 2204 into sound waves. The speaker may be a traditional thin film speaker or a piezoelectric ceramic speaker. When the speaker is a piezoelectric ceramic speaker, it can not only convert electrical signals into sound waves audible to humans, but also convert electrical signals into sound waves inaudible to humans for purposes such as distance measurement. In some embodiments, the audio circuit 2207 may also include a headphone jack.

[0226] Positioning component 2208 is used to locate the current geographic location of computer device 2200 to implement navigation or LBS (Location Based Service). Positioning component 2208 can be a positioning component based on the US GPS (Global Positioning System), China's Beidou system, or Russia's Galileo system.

[0227] Power supply 2209 is used to power various components in computer device 2200. Power supply 2209 can be AC power, DC power, a disposable battery, or a rechargeable battery. When power supply 2209 includes a rechargeable battery, the rechargeable battery can be a wired rechargeable battery or a wireless rechargeable battery. A wired rechargeable battery is a battery that is charged via a wired line, while a wireless rechargeable battery is a battery that is charged via a wireless coil. The rechargeable battery can also be used to support fast charging technology.

[0228] In some embodiments, the computer device 2200 further includes one or more sensors 2210 , including but not limited to an acceleration sensor 2211 , a gyroscope sensor 2212 , a pressure sensor 2213 , a fingerprint sensor 2214 , an optical sensor 2215 , and a proximity sensor 2216 .

[0229] The accelerometer 2211 can detect the magnitude of acceleration along the three coordinate axes of the coordinate system established by the computer device 2200. For example, the accelerometer 2211 can be used to detect the components of gravity acceleration along the three coordinate axes. The processor 2201 can control the display screen 2205 to display the user interface in a landscape or portrait view based on the gravity acceleration signal collected by the accelerometer 2211. The accelerometer 2211 can also be used to collect game or user motion data.

[0230] The gyroscope sensor 2212 can detect the orientation and rotation angle of the computer device 2200. It can also work with the accelerometer 2211 to collect 3D motions of the user on the computer device 2200. Based on the data collected by the gyroscope sensor 2212, the processor 2201 can implement the following functions: motion sensing (e.g., changing the UI based on the user's tilt), image stabilization during shooting, game control, and inertial navigation.

[0231] The pressure sensor 2213 can be installed on the side frame of the computer device 2200 and / or below the display screen 2205. When the pressure sensor 2213 is installed on the side frame of the computer device 2200, it can detect the user's grip signal on the computer device 2200. The processor 2201 can perform left and right hand recognition or shortcut operations based on the grip signal collected by the pressure sensor 2213. When the pressure sensor 2213 is installed below the display screen 2205, the processor 2201 controls the operational controls on the UI interface based on the user's pressure operation on the display screen 2205. The operational controls include at least one of a button control, a scroll bar control, an icon control, and a menu control.

[0232] Fingerprint sensor 2214 is used to collect the user's fingerprint. Processor 2201 identifies the user's identity based on the fingerprint collected by fingerprint sensor 2214, or the fingerprint sensor 2214 identifies the user's identity based on the collected fingerprint. When the user's identity is recognized as a trusted identity, processor 2201 authorizes the user to perform relevant sensitive operations, such as unlocking the screen, viewing encrypted information, downloading software, making payments, and changing settings. Fingerprint sensor 2214 can be set on the front, back, or side of computer device 2200. When physical buttons or manufacturer logos are provided on computer device 2200, fingerprint sensor 2214 can be integrated with the physical buttons or manufacturer logos.

[0233] Optical sensor 2215 is used to detect ambient light intensity. In one embodiment, processor 2201 can control the display brightness of display screen 2205 based on the ambient light intensity detected by optical sensor 2215. Specifically, when the ambient light intensity is high, the display brightness of display screen 2205 is increased; when the ambient light intensity is low, the display brightness of display screen 2205 is decreased. In another embodiment, processor 2201 can also dynamically adjust the shooting parameters of camera assembly 2206 based on the ambient light intensity detected by optical sensor 2215.

[0234] Proximity sensor 2216, also known as a distance sensor, is typically located on the front panel of computer device 2200. Proximity sensor 2216 is used to detect the distance between the user and the front of computer device 2200. In one embodiment, when proximity sensor 2216 detects that the distance between the user and the front of computer device 2200 is gradually decreasing, processor 2201 controls display screen 2205 to switch from the screen-on state to the screen-off state. When proximity sensor 2216 detects that the distance between the user and the front of computer device 2200 is gradually increasing, processor 2201 controls display screen 2205 to switch from the screen-off state to the screen-on state.

[0235] Those skilled in the art will understand that Figure 22 The structure shown in the figure does not constitute a limitation on the computer device 2200, and the computer device 2200 may include more or fewer components than shown in the figure, or combine some components, or adopt a different component arrangement.

[0236] An embodiment of the present application further provides a computer-readable storage medium, in which at least one instruction is stored. The at least one instruction is loaded and executed by a processor to implement the operations performed by the micro-logging screening method of any of the above-mentioned implementations.

[0237] The present application also provides a computer program product or computer program, which includes computer program code stored in a computer-readable storage medium. A processor of a computer device reads the computer program code from the computer-readable storage medium and executes the computer program code, causing the computer device to perform the operations performed by the aforementioned micro-logging screening method.

[0238] In some embodiments, the computer program involved in the embodiments of the present application may be deployed and executed on a computer device, or on multiple computer devices located at one location, or on multiple computer devices distributed at multiple locations and interconnected through a communication network. Multiple computer devices distributed at multiple locations and interconnected through a communication network may constitute a blockchain system.

[0239] The present application provides a method for screening micro-logs. This method first uses a velocity field value diagram to identify a first target micro-log whose first velocity parameter is not within a reference first parameter range, thereby quickly and effectively narrowing the screening range of the micro-logs. Second target micro-logs to be removed are then screened based on the screened first target micro-logs, effectively improving the efficiency of screening the second target micro-logs. This method effectively avoids the waste of manpower and material resources caused by individually screening each piece of logging data from multiple micro-logs, thereby improving the efficiency of micro-log screening.

[0240] The above are only optional embodiments of the present application and are not intended to limit the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application should be included in the scope of protection of the present application.

Claims

1. A micro-well logging screening method, characterized in that: The method comprises: Acquire velocity field value maps of multiple layers in the target work area, wherein the velocity field value map of each layer includes the current first velocity parameters of multiple micro-logging wells in the target work area at the layer; For each layer, based on the velocity field value map, the plurality of micro-well logs are screened to obtain a plurality of first target micro-well logs, wherein the first velocity parameter of the first target micro-well log is not within the first parameter range of the benchmark; Acquire auxiliary data of each first target micro-logging, wherein the auxiliary data is data that assists the first target micro-logging in screening; determining a second target micro-log from the plurality of first target micro-logs based on the auxiliary data of each first target micro-log, the auxiliary data of the second target micro-log not matching the baseline auxiliary data; The second target micro-logging in the plurality of micro-logging is removed to obtain a plurality of third target micro-logging in the target work area, and the logging data of the plurality of third target micro-logging are used for geological structure imaging.

2. The micro-well logging screening method according to claim 1, characterized in that: The velocity field value map also includes the coordinate parameters of the multiple micro-logging points, the coordinate parameters of the multiple interpolation points, and the current first velocity parameters of the multiple interpolation points; The method of obtaining velocity field value maps of multiple layers in the target work area includes: Acquire coordinate parameters of the plurality of micro-logs and second velocity parameters of the plurality of micro-logs at each layer, where the second velocity parameters are original velocity parameters of the micro-logs; For each horizon, generating a first velocity point value map of the horizon based on the coordinate parameters of the plurality of micro-well logs and the second velocity parameters of the plurality of micro-well logs at the horizon; Performing node extrapolation and node interpolation on the first velocity point value graph to obtain a second velocity point value graph, wherein the second velocity point value graph includes coordinate parameters of the plurality of micro-well loggings, second velocity parameters of the plurality of micro-well loggings at the layers, coordinate parameters of the plurality of interpolation points, and second velocity parameters of the plurality of interpolation points; Node smoothing is performed on the second velocity point value graph to obtain the velocity field value graph.

3. The micro-well logging screening method according to claim 1, characterized in that: The velocity field value map further includes first velocity parameters of multiple interpolation points. The multiple micro-well logs are screened based on the velocity field value map to obtain multiple first target micro-well logs, including: generating a normal distribution curve of the first velocity parameter based on a plurality of first velocity parameters of micro-logging points and a plurality of first velocity parameters of interpolation points in the velocity field value map; Determining a first parameter range of the first speed parameter based on the normal distribution curve and the preset interval area, where the first parameter range is a range of the first speed parameter corresponding to the preset interval area; The micro-well log having a first velocity parameter not within the first parameter range is determined as the first target micro-well log.

4. The micro-well logging screening method according to claim 1, characterized in that: The benchmark auxiliary data includes a plurality of first benchmark auxiliary data and a plurality of second benchmark auxiliary data, wherein the first benchmark auxiliary data corresponds to a first benchmark micro-log, which is a micro-log remaining after removing the plurality of first target micro-logs from the plurality of micro-logs, and the second benchmark auxiliary data corresponds to a second benchmark micro-log, which is a micro-log having a depth greater than that of the first target micro-log. The determining of the second target micro-log from the plurality of first target micro-logs based on the auxiliary data of each first target micro-log includes at least one of the following implementations: determining a second target micro-log from the plurality of first target micro-logs based on the plurality of first reference auxiliary data and the auxiliary data of each first target micro-log, the auxiliary data of the second target micro-log not matching any of the plurality of first reference auxiliary data; or A second target microlog is determined from the plurality of first target micrologs based on the plurality of second baseline auxiliary data and the auxiliary data of each first target microlog, the auxiliary data of the second target microlog not matching any of the plurality of second baseline auxiliary data.

5. The micro-well logging screening method according to claim 4, characterized in that: The auxiliary data includes a first micro-logging curve, a first elevation parameter, a first velocity smoothing parameter, and a first lithologic parameter; the first benchmark auxiliary data includes a plurality of second elevation parameters and a plurality of second velocity smoothing parameters of the plurality of first benchmark micro-logging curves, a plurality of second micro-logging curves of a plurality of first benchmark micro-logging curves within a target terrain region, and a plurality of second lithologic parameters of a plurality of first benchmark micro-logging curves within a target lithologic region; the target terrain region is an area within the target work area having the same terrain as that of the area where the first target micro-logging curve is located; and the target lithologic region is an area within the target work area having the same lithology as that of the area where the first target micro-logging curve is located. The determining of the second target micro-log from the plurality of first target micro-logs based on the plurality of first reference auxiliary data and the auxiliary data of each first target micro-log includes at least one of the following implementations: determining a second target micro-log from the plurality of first target micro-logs based on the plurality of second micro-log curves and the first micro-log curve of each first target micro-log, wherein a strike trend of the first micro-log curve of the second target micro-log does not match a strike trend of the plurality of second micro-log curves; or, Based on the multiple second elevation parameters, a second parameter range of a benchmark is formed; based on the second parameter range and the first elevation parameter of each first target micro-log, a second target micro-log is determined from the multiple first target micro-logs, and the first elevation parameter of the second target micro-log is not within the second parameter range; or A third parameter range of a benchmark is formed based on the multiple second velocity smoothing parameters; a second target micro-log is determined from the multiple first target micro-logs based on the third parameter range and the first velocity smoothing parameter of each first target micro-log, where the first elevation parameter of the second target micro-log is not within the third parameter range, and the velocity smoothing parameter is used to represent the difference between the original velocity parameter before and after node smoothing; or Based on the multiple second lithologic parameters, a fourth parameter range of a benchmark is formed; based on the fourth parameter range and the first lithologic parameter of each first target micro-logging, a second target micro-logging is determined from the multiple first target micro-loggings, the first lithologic parameter of the second target micro-logging is not within the fourth parameter range, and the lithologic parameter is used to represent the distribution of the original velocity parameter of the micro-logging in the target lithologic area.

6. The micro-logging screening method according to claim 4, characterized in that: The second reference auxiliary data includes a plurality of third micro-logging curves of a plurality of second reference micro-logging curves within a target terrain region, wherein the target terrain region is an area within the target work area having the same terrain as the area where the first target micro-logging curves are located; The determining of the second target micro-log from the plurality of first target micro-logs based on the plurality of second reference auxiliary data and the auxiliary data of each first target micro-log comprises: Based on the multiple third micro-logging curves and the first micro-logging curve of each first target micro-logging curve, a second target micro-logging curve is determined from the multiple first target micro-logging curves, and the trend of the first micro-logging curve of the second target micro-logging curve does not match the trend of the multiple third micro-logging curves.

7. The micro-well logging screening method according to claim 1, characterized in that: The method further comprises: generating a first structural map and a second structural map of the target work area based on the well logging data of the plurality of micro-logs and the well logging data of the plurality of third target micro-logs respectively; The first structural map and the second structural map are compared to determine a comparison result, and the comparison result is used to verify the screening effect of the plurality of micro-well logs.

8. A micro-well logging screening device, characterized in that: The device comprises: A first acquisition module is configured to acquire velocity field value maps of multiple layers in a target work area, wherein the velocity field value map of each layer includes a first velocity parameter of multiple micro-well loggings in the target work area at the layer; a screening module configured to screen the plurality of micro-well logs for each horizon based on the velocity field value map to obtain a plurality of first target micro-well logs, wherein the first velocity parameter of the first target micro-well logs is not within a first parameter range of a benchmark; A second acquisition module is configured to acquire auxiliary data of each first target micro-logging well, wherein the auxiliary data is data that assists the first target micro-logging well in screening; a determining module for determining a second target micro-log from the plurality of first target micro-logs based on the auxiliary data of each first target micro-log, the auxiliary data of the second target micro-log not matching the baseline auxiliary data; A removal module is used to remove the second target micro-logs of multiple layers in the multiple micro-logs to obtain multiple third target micro-logs in the target work area. The logging data of the multiple third target micro-logs are used for geological structure imaging.

9. A computer device, characterized in that: The computer device includes one or more processors and one or more memories, wherein at least one instruction is stored in the one or more memories, and the at least one instruction is loaded and executed by the one or more processors to implement the operations performed by the micro-logging screening method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that The storage medium stores at least one instruction, and the at least one instruction is loaded and executed by the processor to implement the operation performed by the micro-logging screening method according to any one of claims 1 to 7.

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