Method and apparatus for determining scope of relay protection defect diagnosis

Abstract

A method and device for determining a relay protection defect diagnosis range, the method comprising: collecting several pieces of substation relay protection abnormal information; obtaining several defect range closed loop paths according to the several pieces of substation relay protection abnormal information; wherein the defect range closed loop path is a closed loop path in which a defect point causing the occurrence of a single piece of substation relay protection abnormal information is located; obtaining an intersection of the several defect range closed loop paths to obtain a defect diagnosis range. Through the method and device provided in the embodiments of the present application, the problems of application scene limitation caused by isolated case analysis, inability to comprehensively analyze complex phenomena, poor timeliness and the like of the existing defect diagnosis are solved. Compared with directly obtaining the defect diagnosis range according to any one piece of abnormal information, the embodiments of the present application obtain the defect diagnosis range by obtaining the intersection of the defect ranges, are more targeted, are more likely to determine the main defect, and improve the efficiency of defect diagnosis.

Description

Technical Field

[0001] This invention relates to the field of relay protection operation and maintenance technology, and more specifically, to a method and apparatus for determining the diagnostic range of relay protection defects. Background Technology

[0002] Relay protection defect diagnosis is crucial for rapidly restoring device operation and improving the reliability of relay protection. Currently, relay protection defect diagnosis still relies heavily on on-site inspections or background message information, with insufficient application of online monitoring information and alarm information. Defect diagnosis and elimination also heavily depend on expert experience. Constructing an expert database is currently the primary method for defect diagnosis. Based on this expert database, an inference engine is built. Using user input data and the knowledge in the expert database, results are generated according to certain inference rules. For cases where rules are ambiguous, decision fusion (such as DS evidence theory) is employed. However, these cases summarize diagnostic methods for typical individual cases; that is, they diagnose based on a single anomaly. In reality, defects are often accompanied by multiple anomalies. Therefore, how to comprehensively apply multiple anomalies to provide a defect diagnosis method to improve the effectiveness and efficiency of defect diagnosis is an urgent problem to be solved. Summary of the Invention

[0003] In view of this, the present invention proposes a method and apparatus for determining the diagnostic range of relay protection defects, aiming to solve the problems of limited application scenarios and poor timeliness of existing relay protection defect diagnosis.

[0004] In a first aspect, embodiments of the present invention provide a method for determining the diagnostic range of relay protection defects, characterized in that the method includes: collecting several abnormal information items of substation relay protection; obtaining several closed-loop paths of defect ranges based on the several abnormal information items of substation relay protection; wherein, the closed-loop path of the defect range is the closed-loop path where the defect point that caused the occurrence of a single abnormal information item of the substation relay protection is located; and obtaining the defect diagnostic range by finding the intersection of the several closed-loop paths of the defect range.

[0005] Further, the step of finding the intersection of the several closed-loop paths of the defect range to obtain the defect diagnosis range includes: obtaining several related closed-loop paths of the defect range based on the correlation between the several closed-loop paths of the defect range; calculating the probability of occurrence of each defect point within the several related closed-loop paths of the defect range; fusing the probability of occurrence of each defect point to obtain the comprehensive probability of occurrence of each defect point; and sorting each defect point according to the comprehensive probability to obtain the defect diagnosis range.

[0006] Further, obtaining several related defect range closed-loop paths based on the correlation between the several defect range closed-loop paths includes: calculating the similarity between any two defect range closed-loop paths; if the similarity is greater than a preset similarity threshold, then the two defect range closed-loop paths are related defect range closed-loop paths; and traversing all defect range closed-loop paths to obtain all related defect range closed-loop paths.

[0007] Furthermore, the calculation of the probability of each defect point occurring within the closed-loop path of the plurality of related defect ranges includes: obtaining the probability of each defect point occurring based on the historical probability of each related defect range closed-loop path occurring, the historical probability of each defect point occurring, and the historical probability of each defect point and each related defect range closed-loop path occurring simultaneously.

[0008] Further, the process of fusing the probabilities of each defect point to obtain the comprehensive probability of each defect point includes: obtaining a matrix A of the probabilities of each defect point, with the number of closed-loop paths in the relevant defect range as rows and the number of all defect points as columns; obtaining an augmented uncertainty matrix M based on the matrix A; and obtaining a fused row vector h based on the augmented matrix M, where the first J columns of the row vector h represent the comprehensive probability of each defect point, and J is the number of all defect points.

[0009] Furthermore, the abnormal information of the substation relay protection includes alarm information of the relay protection device and indicator light information on the device panel.

[0010] Secondly, embodiments of the present invention also provide an apparatus for determining the diagnostic range of relay protection defects, characterized in that the apparatus comprises: an information collection unit for collecting several abnormal information items of substation relay protection; a defect range association unit for obtaining several closed-loop paths of defect ranges based on the several abnormal information items of substation relay protection; wherein the closed-loop path of the defect range is the closed-loop path where the defect point causing a single abnormal information item of the substation relay protection occurs; and a defect diagnosis range determination unit for finding the intersection of the several closed-loop paths of defect ranges to obtain the defect diagnosis range.

[0011] Furthermore, the defect diagnosis range determination unit includes: a correlation processing unit, used to obtain several related defect range closed-loop paths based on the correlation between the several related defect range closed-loop paths; a general probability calculation unit, used to calculate the probability of each defect point occurring within the several related defect range closed-loop paths; a comprehensive probability calculation unit, used to fuse the probability of each defect point occurring to obtain a comprehensive probability of each defect point occurring; and a sorting unit, used to sort each defect point according to the comprehensive probability to obtain the defect diagnosis range.

[0012] Furthermore, the correlation processing unit is also used to: calculate the similarity between any two closed-loop paths of defect ranges; if the similarity is greater than a preset similarity threshold, then the two closed-loop paths of defect ranges are related closed-loop paths of defect ranges; and traverse all closed-loop paths of defect ranges to obtain all related closed-loop paths of defect ranges.

[0013] Furthermore, the ordinary probability calculation unit is also used to: obtain the probability of each defect point occurring based on the historical probability of each related defect range closed-loop path occurring, the historical probability of each defect point occurring, and the historical probability of each defect point and each related defect range closed-loop path occurring simultaneously.

[0014] Furthermore, the comprehensive probability calculation unit is also used to: obtain a matrix A of the probability of occurrence of each defect point, with the number of closed-loop paths in the relevant defect range as rows and the number of all defect points as columns; obtain an augmented matrix M of uncertainty based on the matrix A; and obtain a fused row vector h based on the augmented matrix M, wherein the first J columns of the row vector h are the comprehensive probability of occurrence of each defect point, where J is the number of all defect points.

[0015] Furthermore, the abnormal information of the substation relay protection includes alarm information of the relay protection device and indicator light information on the device panel.

[0016] Thirdly, embodiments of the present invention also provide a computer-readable storage medium having a computer program stored thereon, characterized in that the program, when executed by a processor, implements the methods provided in the various embodiments of the present invention.

[0017] The method and apparatus for determining the diagnostic range of relay protection defects provided in this invention obtain a closed-loop path of the defect range based on abnormal relay protection information in substations, and then calculate the intersection of these closed-loop paths to obtain the defect diagnostic range. This provides a general method for determining the diagnostic range of defects, solving the problems of limited application scenarios, inability to comprehensively analyze complex phenomena, and poor timeliness caused by existing defect diagnosis methods that rely on isolated case analysis. Compared to directly obtaining the diagnostic range based on any single abnormal information, this invention obtains the diagnostic range by calculating the intersection of defect ranges, which is more targeted, makes it easier to identify the main defects, and improves the efficiency of defect diagnosis. When diagnosing relay protection defects, the method provided in this invention can prioritize determining the diagnostic range of relay protection defects, allowing operators to further determine the specific defect location and cause. This avoids the current problem of operators sequentially checking possible defect points, which involves many items and is time-consuming, greatly narrowing the diagnostic range of defects, significantly improving the efficiency of defect checking by operators, and enhancing the intelligence level of defect diagnosis. Attached Figure Description

[0018] Figure 1 A flowchart of a method for determining the diagnostic range of relay protection defects, provided as an exemplary embodiment of the present invention;

[0019] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention.

[0020] Figure 3 A flowchart illustrating a method for finding the intersection of closed-loop paths across several defect ranges, provided as an exemplary embodiment of the present invention;

[0021] Figure 4 A schematic diagram of a device for determining the diagnostic range of relay protection defects, provided as an exemplary embodiment of the present invention;

[0022] Figure 5 This is a schematic diagram of the defect diagnosis range determination unit provided in an exemplary embodiment of the present invention. Detailed Implementation

[0023] Exemplary embodiments of the invention will now be described with reference to the accompanying drawings. However, the invention may be embodied in many different forms and is not limited to the embodiments described herein. These embodiments are provided to fully and completely disclose the invention and to fully convey its scope to those skilled in the art. The terminology used in the exemplary embodiments illustrated in the drawings is not intended to limit the invention. In the drawings, the same units / elements are referred to by the same reference numerals.

[0024] Unless otherwise stated, the terms used herein (including technical terms) have their common meaning as understood by one of ordinary skill in the art. Furthermore, it is understood that terms defined in commonly used dictionaries should be understood to have a meaning consistent with the context of their relevant field, and not to be interpreted as having an idealized or overly formal meaning.

[0025] Figure 1 This is a flowchart of a method for determining the diagnostic range of relay protection defects, provided as an exemplary embodiment of the present invention.

[0026] like Figure 1 As shown, the method includes:

[0027] Step S101: Collect several abnormal information of substation relay protection.

[0028] In this embodiment of the invention, the abnormal information of substation relay protection can be relay protection alarm information, device panel indicator information, and other abnormal information of substation relay protection within a preset time interval. There can be one item, two items, or more items, which can be used as the basis for analyzing the scope and cause of defects.

[0029] Furthermore, abnormal information regarding substation relay protection includes alarm information from relay protection devices and indicator light information from device panels.

[0030] Step S102: Based on several abnormal information of substation relay protection, obtain several closed-loop paths of defect range; wherein, the closed-loop path of defect range is the closed-loop path where the defect point that caused the occurrence of a single abnormal information of substation relay protection is located.

[0031] In this embodiment of the invention, the range of defect points that cause abnormal relay protection information in each individual substation can be considered as the defect range associated with that abnormal relay protection information. The defect range associated with the abnormal relay protection information of an individual substation generally starts from the device that issued the abnormal information (the abnormal object is an analog quantity, a digital quantity, etc.) and ends at the device that issued the abnormal information, covering the closed-loop path of the hardware / ports at both ends, intermediate devices / ports, secondary circuits, and channels.

[0032] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, based on the object classification of alarm information, taking the defect range of conventional substation relay protection as an example, the closed-loop path of the defect range associated with alarm information is generally as follows:

[0033] 1) When the object of the alarm information is voltage (e.g., TV disconnection alarm), the closed-loop path of the defect range associated with this alarm information is generally: voltage transformer secondary winding → voltage secondary circuit (via terminal box / control cabinet) → voltage paralleling device in the voltage paralleling panel (with an air switch at the inlet) → voltage secondary circuit (entering the terminal block of the protection panel) → voltage switching device (with an air switch at the outlet) → protection device sampling board → protection device CPU board; for bus protection devices, the above closed-loop path does not include the voltage switching device; when the collected voltage is the line voltage and the substation wiring configuration is 3 / 2 connection, the above closed-loop path does not include the voltage paralleling panel, voltage paralleling device, or voltage switching device, and is notated as:

[0034] 2) When the alarm information pertains to current (e.g., CT disconnection alarm), the closed-loop path of the associated defect range is generally: current transformer secondary winding → current secondary circuit (via terminal box / control cabinet) → current secondary circuit (entering the terminal block of the protection panel) → protection device sampling board → protection device CPU board, noted as:

[0035] 3) When the alarm information pertains to the contact potential of the control box (e.g., trip position abnormality alarm), the closed-loop path of the defect range associated with this alarm information is generally: control box contact → secondary circuit of switch quantity (via terminal box / control cabinet) → secondary circuit of switch quantity (entering the terminal block of the protection panel) → protection device input board → protection device CPU board, noted as:

[0036] 4) When the object of the alarm information is a switching signal of another protection device (e.g., a fault trip input abnormal alarm), the closed-loop path of the defect range associated with this alarm information is generally: source protection device CPU board → source protection device output board → switching secondary circuit (via the terminal block of the source protection panel) → switching secondary circuit (via the terminal box / control cabinet) → switching secondary circuit (terminal block of the receiving protection panel) → receiving protection device input board → receiving protection device CPU board, noted as:

[0037] 5) When the object of the alarm information is device hardware (e.g., plug-in abnormality alarm, RAM memory abnormality alarm), the closed-loop path of the defect range associated with the alarm information is generally: device hardware as the object of the alarm information → device CPU board, noted as:

[0038] 6) When the alarm information pertains to a device channel (e.g., channel abnormality alarm), the closed-loop path of the defect range associated with this alarm information is generally as follows (taking a multiplexed fiber optic channel as an example): CPU board of the opposite line protection device → management board of the opposite line protection device → secondary circuit → multiplexed interface device panel of the opposite side → coaxial cable → digital distribution frame of the opposite side → communication channel (including communication panels on both sides) → digital distribution frame of this side → coaxial cable → multiplexed interface device panel of this side → secondary circuit → management board of this side line protection device → CPU board of this side line protection device, noted as:

[0039] 7) When the alarm information pertains to a remote transmission or remote trip signal (e.g., a long-term remote input abnormality alarm), the closed-loop path of the defect range associated with this alarm information is generally (taking a multiplexed fiber optic channel as an example): CPU board of the opposite line protection device → Optical coupler board of the opposite line protection device → Secondary circuit → Multiplexed interface device panel of the opposite side → Coaxial cable → Digital distribution frame of the opposite side → Communication channel (including communication panels on both sides) → Digital distribution frame of this side → Coaxial cable → Multiplexed interface device panel of this side → Secondary circuit → Optical coupler board of this side line protection device → CPU board of this side line protection device, noted as:

[0040] 8) When the object of the alarm information is a time synchronization signal (e.g., a time synchronization anomaly alarm), the closed-loop path of the defect range associated with this alarm information is generally (taking B-code time synchronization as an example): Satellite → Antenna → Time Synchronization Source → Secondary Circuit → Protection Device Management Board → Protection Device CPU Board, noted as:

[0041] Step S103: Find the intersection of several closed-loop paths of defect ranges to obtain the defect diagnosis range.

[0042] In this embodiment of the invention, when new relay protection anomalies appear within a certain time interval or under the condition that historical anomalies have not been eliminated, the relay protection anomalies are correlated, indicating that these anomalies are caused by at least one identical defect, and the elimination of one or more defects means the recurrence of related anomalies. Each anomaly can be mapped to a closed-loop path of the defect range associated with it, and a fault at any node on the closed-loop path can cause the anomaly to occur. One or more defects are most likely to occur at the intersection of the defect ranges of the various relay protection anomalies. The intersection of the closed-loop paths of the defect ranges associated with each of the multiple relay protection anomalies is calculated to define the scope of defect diagnosis, and the set of these defect points is extracted as the priority scope for defect diagnosis.

[0043] In the above embodiments, by obtaining the closed-loop path of the defect range based on the abnormal information of the substation relay protection, and finding the intersection of the closed-loop paths of the defect range, the defect diagnosis range is obtained. This provides a general method for determining the defect diagnosis range, solving the problems of limited application scenarios, inability to comprehensively analyze complex phenomena, and poor timeliness caused by the analysis of isolated cases in existing defect diagnosis methods. Compared with directly obtaining the defect diagnosis range based on any abnormal information, the present invention obtains the defect diagnosis range by finding the intersection of defect ranges, which is more targeted, makes it easier to identify the main defects, and improves the efficiency of defect diagnosis. When diagnosing relay protection defects, the method provided by the present invention can prioritize the determination of the relay protection defect diagnosis range, allowing operators to further determine the specific defect location and cause. This avoids the current problem of operators checking possible defect points sequentially, which involves many items and is time-consuming. It greatly narrows the defect diagnosis range, significantly improves the efficiency of operators in defect checking, and enhances the intelligence level of defect diagnosis.

[0044] Figure 3 This is a flowchart illustrating a method for finding the intersection of closed-loop paths across several defect ranges, provided as an exemplary embodiment of the present invention. Figure 3 As shown, the method for finding the intersection of several closed-loop paths within a defect range, i.e., step S103, includes:

[0045] Step S1031: Based on the correlation between several closed-loop paths of defect ranges, obtain several related closed-loop paths of defect ranges.

[0046] In this embodiment of the invention, by judging the correlation between the information of each defect range closed-loop path and eliminating irrelevant defect information, the pertinence and accuracy of the defect diagnosis range determination can be improved.

[0047] Further, step S1031 includes:

[0048] Calculate the similarity between any two closed-loop paths of defect ranges. If the similarity is greater than a preset similarity threshold, then the two closed-loop paths of defect ranges are related closed-loop paths of defect ranges.

[0049] Traverse all closed-loop paths within the defect range to obtain all relevant closed-loop paths within the defect range.

[0050] Specifically, based on the closed-loop path of the defect range associated with relay protection anomaly information, the closed-loop path of the defect range is divided, and a defect diagnosis range set U is constructed. The elements in the defect diagnosis range are all defect points on all closed-loop paths. When the defect diagnosis range covers a certain defect point, the corresponding element u is... j =1, otherwise 0, where j is the sequence number of the defect point.

[0051] If there is one abnormal relay protection information from a substation, select any two closed-loop paths within the defect range. a f b Calculate their similarity s ab . byU a U b Calculate s ab The formula is as follows:

[0052]

[0053] Set a similarity threshold s min If s ab ≥s min If the two substation relay protection anomaly messages are related, denoted as f. a ∽f b u ai u bj These refer to the closed-loop path f of the defect range. a Does it cover defect point i and the closed-loop path f of the defect range? b Whether defect point j is covered is determined by 1 (1 indicates coverage) and 0 (0 indicates non-coverage). By calculating the similarity between all closed-loop paths of defect ranges, all relevant closed-loop paths of defect ranges can be obtained, and thus all defect points associated with substation relay protection anomaly information can be obtained.

[0054] Step S1032: Calculate the probability of each defect point occurring within the closed-loop path of several related defect ranges.

[0055] In this embodiment of the invention, each related defect range closed-loop path includes several defect points, and the probability of each defect point occurring is calculated.

[0056] Further, step S1032 includes:

[0057] Based on the historical probability of each related defect range closed-loop path occurring, the historical probability of each defect point occurring, and the historical probability of each defect point and each related defect range closed-loop path occurring simultaneously, the probability of each defect point occurring is obtained.

[0058] Specifically, defect points and relay protection anomaly information are extracted from historical defect information, and the conditional probability P(u) of the defect point when the relay protection anomaly occurs is calculated. j |f i P(u) can be used. j |f i )=P(f i |u j )P(u j ) / P(f i ) Calculation. Where, P(f iP(u) represents the ratio of the number of relay protection anomalies occurring in the historical defects to the total defect statistics. j ) represents the proportion of defect point j to the total defect statistic, and the conditional probability P(f) is given by... i |u j ) represents the conditional probability that there is an i-th relay protection anomaly when the defect point is j.

[0059] Step S1033: Combine the probabilities of each defect point to obtain the comprehensive probability of each defect point occurring.

[0060] Further, step S1033 includes:

[0061] Using the number of closed-loop paths within the relevant defect range as rows and the number of all defect points as columns, we obtain matrix A, which represents the probability of each defect point occurring.

[0062] Based on matrix A, the augmented matrix M for uncertainty is obtained;

[0063] Based on the augmented matrix M, the fused row vector h is obtained. The first J columns of the row vector h contain the combined probability of each defect point occurring, where J is the total number of all defect points.

[0064] Specifically, if I relay protection abnormal information f1, f2, ..., f I For J defect points, we can obtain a matrix A = [a] with I rows and J columns. ij ] I×J , representing the probability of a defect point that can be inferred from any relay protection anomaly information, is given by a. ij =P(u j |f i Composed of A. The augmented matrix M, which accounts for uncertainty, can be calculated from A. The relevant parameters of M are then calculated:

[0065] α i =max j {a ij}, i = 1, 2, ..., I;

[0066]

[0067]

[0068] M has one more column than A, that is, m J+1 The meaning is the uncertainty of abnormal information of relay protection.

[0069] Among them, W i W is the uncertain weighting coefficient of relay protection anomaly information i, with a value range of [0,1]. The larger the value, the higher the availability of this relay protection anomaly information, that is, the lower the probability of false alarm and the stronger the diagnostic targeting.i Higher; α i β is the maximum correlation coefficient of relay protection abnormal information i; i It is the relevant assigned value of relay protection abnormal information i; R i This is the reliability coefficient of the relay protection abnormal information i. Then, the element value m in the intermediate matrix M... ij The calculation method is as follows:

[0070]

[0071] The uncertainty measure of relay protection abnormal information i is:

[0072] C is used to represent the sum of probabilities of completely conflicting defect points. The first J columns M' of matrix M are taken as the defect point diagnosis probability matrix obtained from I anomaly information. The sum of the elements in different columns of different rows in M' is taken as C, i.e.

[0073] Using M, we obtain the fused row vector h, where the first J columns represent the probabilities of defect points, i.e.:

[0074] In the formula, 1≤j≤J;

[0075] The (J+1)th column represents the uncertainty probability, and the formula is:

[0076]

[0077] Step S1034: Sort each defect point according to the comprehensive probability to obtain the defect diagnosis range.

[0078] In this embodiment of the invention, each defect point can be sorted from largest to smallest based on the comprehensive probability value, thereby obtaining a set of defect points with a degree of correlation with relay protection abnormal information from largest to smallest. This set can be used as a defect diagnosis range to provide operators with further specific defect diagnosis.

[0079] In the above embodiments, by optimizing and calculating the defect points and their probabilities in the closed-loop path of the defect range, a set of defect points related to the abnormal information of substation relay protection is finally obtained as the defect diagnosis range. This provides a general method for determining the defect diagnosis range, solving the problems of limited application scenarios, inability to comprehensively analyze complex phenomena, and poor timeliness caused by the analysis of isolated cases in existing defect diagnosis methods. Compared with directly obtaining the defect diagnosis range based on any one abnormal information, the embodiments of the present invention obtain the defect diagnosis range by finding the intersection of the defect ranges, which is more targeted, makes it easier to identify the main defects, and improves the efficiency of defect diagnosis. When diagnosing relay protection defects, the method provided by the embodiments of the present invention can prioritize the determination of the relay protection defect diagnosis range, so that operators can further determine the specific defect location and cause. This avoids the current problem of operators checking possible defect points one by one, which involves many items and is time-consuming. It greatly narrows the defect diagnosis range, significantly improves the efficiency of operators in defect checking, and enhances the intelligence level of defect diagnosis.

[0080] Example 1

[0081] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 (denoted as protection device 1) reports a long-term start-up abnormality alarm. Analysis of possible causes for the long-term start-up of the protection device (including bus protection device start-up failure inputs, voltage sampling, current sampling, etc.) reveals that the cause of the long-term start-up alarm is that the voltage sampling has reached the protection low-voltage start-up setting. Since the alarm information pertains to voltage, the associated defect range closed-loop path is taken as the voltage loop and the protection device sampling / CPU board. In order to sample the voltage circuit and protection device abstracted in the previous text / CPU board To specify, the notation "①a" represents the specific defect range closed-loop path associated with the long-term start abnormal alarm of line protection device 1. Within the same time interval as the long-term start abnormal alarm reported by line protection device 1, the first protection device (referred to as protection device 2) on another branch located on the same busbar as the line reports a TV disconnection alarm. The object of the alarm information is also voltage, and the specific defect range closed-loop path associated with it is represented by the notation "①b".

[0082] 1) Correlation analysis between alarm information

[0083] In this example, the defect point set j = 1 to 7 represents the secondary circuit from the TV secondary winding to the parallel screen, the secondary circuit from the parallel screen to protection device 1, the sampling board of protection device 1, the CPU board of protection device 1, the secondary circuit from the parallel screen to protection device 2, the sampling board of protection device 2, and the CPU board of protection device 2, respectively. The defect point j = 1, "the secondary circuit from the TV secondary winding to the parallel screen," is a common part of both protection devices. i = 1 and 2 represent the long-term start-up abnormal alarm of protection device 1 and the TV disconnection alarm of protection device 2, respectively. U1 = [1,1,1,1,0,0,0], U2 = [1,0,0,0,1,1,1], s 12 =0.25>s min =0.1, so the two alarms are related.

[0084] 2) Obtain the conditional probability of the defect diagnosis result when the alarm information occurs.

[0085] By analyzing historical data, the conditional probability of the defect point when the device alarm occurs can be obtained, resulting in matrix A:

[0086]

[0087] In the first line, since the object of the alarm information is determined to be voltage, the set of defect points corresponding to the occurrence of "long-term start-up abnormal alarm" only retains the part of voltage circuit and protection device, and is converted to 1, as shown in the first line of A.

[0088] 3) By integrating multiple alarm messages, the probability of different defects is determined, guiding the determination of the order of defect diagnosis. Specifically, this includes:

[0089] ① Calculate the augmented intermediate matrix M to characterize the uncertainty in inferring defect points from alarms and panel indicator lights.

[0090] Let W1 = W2 = 0.5, α1 and α2 be the maximum values ​​of the first and second rows of A, respectively, both 0.3, β1 and β2 can be calculated to be 0.25, and R1 and R2 are both 0.5. Using the formula... Calculate the unaugmented portion of M corresponding to A using the formula. Calculating the augmented portion of M, we can obtain:

[0091]

[0092] ② Integration of alarm information

[0093] C represents the sum of probabilities of completely conflicting defect points. Therefore, C = 0.2363

[0094] Using formula and

[0095] have to

[0096] h=[0.2269,0.0982,0.0327,0.0982,0.0982,0.0327,0.0982,0.3150]

[0097] The first seven columns represent the probabilities of the defect points: the secondary circuit from the TV secondary winding to the parallel screen, the secondary circuit from the parallel screen to protection device 1, the sampling board of protection device 1, the CPU board of protection device 1, the secondary circuit from the parallel screen to protection device 2, the sampling board of protection device 2, and the CPU board of protection device 2. The probabilities of these seven defect points are 0.2269, 0.0982, 0.0327, 0.0982, 0.0982, 0.0327, and 0.0982, respectively, with an uncertainty probability of 0.3150. It is evident that the defect point "the secondary circuit from the TV secondary winding to the parallel screen" has the highest probability and should be prioritized for defect diagnosis. The uncertainty of 0.3150 originates partly from the abstract mathematical concept, indicating that this data fusion method has a certain degree of uncertainty; another part stems from the simultaneous occurrence of multiple defects, meaning the defect point is not unique.

[0098] The defect point with the highest probability obtained above—"the secondary loop from the TV secondary winding to the parallel screen"—is the result of taking the intersection of the closed-loop paths "①a" and "①b" within the defect range, as shown in the figure. Figure 2 As shown, this represents the intersection of the voltage circuit and sampling / CPU board of line protection device 1, and the voltage circuit and sampling / CPU board of the first protection device on another branch located on the same busbar of the same line. Specifically, it includes: voltage transformer secondary winding → voltage secondary circuit (via terminal box / control cabinet) → voltage paralleling device in the voltage paralleling panel (with an air switch at the inlet), as shown. Figure 2 The interval “①a, ①b” can be simplified to “the secondary circuit from the TV secondary winding to the parallel screen”. The method of this invention effectively utilizes multiple anomaly information, extracting the information contained in multiple anomaly alarms and device panel indicator lights to the greatest extent possible, resulting in the most probable and smallest set of defect points. Specifically, in this example, the original method requires sequentially checking the voltage circuits of two sets of protection devices and the protection device sampling / CPU board. Applying the method of this invention can narrow the defect investigation scope to a portion of the voltage circuit, thereby reducing the workload of operators analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0099] Example 2

[0100] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2As shown, line protection device 1 reports a PT disconnection alarm. Since the alarm information pertains to voltage, the notation "②a" represents the specific defect range closed-loop path associated with the PT disconnection alarm of line protection device 1. Within the same time interval as line protection device 1 reporting the PT disconnection alarm, the first protection device on another branch located on the same busbar of this line also reports a PT disconnection alarm. The alarm information pertains to voltage as well, and the associated defect range closed-loop path is specifically represented by the notation "②b". Taking the intersection of defect range closed-loop paths "②a" and "②b" yields the following result: Figure 2 As shown, this represents the intersection of the voltage circuit and sampling / CPU board of line protection device 1, and the voltage circuit and sampling / CPU board of the first protection device on another branch located on the same busbar of the same line. Specifically, it includes: voltage transformer secondary winding → voltage secondary circuit (via terminal box / control cabinet) → voltage paralleling device in the voltage paralleling panel (with an air switch at the inlet), as shown. Figure 2 The interval “②a, ②b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the voltage circuits of two sets of protection devices and the protection device sampling / CPU board. Applying the method of this invention can narrow the defect investigation scope to a portion of the voltage circuit, thereby reducing the workload of operators analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0101] Example 3

[0102] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports a time synchronization error alarm. Since the alarm information pertains to the time synchronization signal, the associated defect range closed-loop path is the time synchronization circuit and the protection device management / CPU board. To explain the abstract time synchronization circuit and protection device management / CPU board mentioned earlier To specify, the notation "③a" represents the specific defect range closed-loop path associated with the time synchronization anomaly alarm of line protection device 1. Within the same time interval as the time synchronization anomaly alarm reported by line protection device 1, the first protection device of another branch on the same busbar as this line, and the substation busbar protection device 1, also report time synchronization anomaly alarms. The object of the alarm information is the same: the time synchronization signal. The specific defect range closed-loop paths associated with these alarms are represented by notations "③b" and "③c". Taking the intersection of the defect range closed-loop paths "③a", "③b", and "③c" yields the following result: Figure 2As shown, this represents the intersection of the time synchronization circuit and protection device management / CPU board of line protection device 1, the time synchronization circuit and protection device management / CPU board of the first protection device of another branch located on the same busbar as this line, and the time synchronization circuit and protection device management / CPU board of the substation busbar protection device 1. Specifically, it includes: satellite → antenna → time synchronization source, such as... Figure 2 The intervals “③a, ③b, ③c” are shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the time synchronization circuits of three sets of protection devices and the protection device management / CPU board. Applying the method of this invention can narrow the defect investigation scope to a portion of the time synchronization circuit, thereby reducing the workload of operators analyzing multiple alarms occurring in a short period and improving the efficiency of defect diagnosis.

[0103] Example 4

[0104] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports an abnormal trip position alarm. Since the alarm information pertains to the contact potential of the control box, the associated defect range closed-loop path includes the control box contacts, the switching circuit, and the protection device's input / CPU board. In order to integrate the abstract control box contacts, switch circuits, and protection devices into the CPU board mentioned above... Specifically, the notation "④a" is used to represent the specific defect range closed-loop path associated with the trip position abnormality alarm of line protection device 1. Within the same time interval as the trip position abnormality alarm reported by line protection device 1, if line protection device 1 reports a failure-interlocking trip input abnormality alarm, the object of the alarm information is the output of bus protection device 1, and the associated defect range closed-loop path includes the CPU / output board of bus protection device 1, the switch quantity circuit, and the input / CPU board of line protection device 1. The associated closed-loop path of the defect range is specifically represented by the notation "④b". Taking the intersection of the closed-loop paths "④a" and "④b" of the defect range yields the following result: Figure 2 The diagram shows the intersection of "Operating box contacts, line protection device 1 switch quantity (operating box contacts) circuit and protection device input / CPU board" and "bus protection device 1 CPU / output board, switch quantity (bus protection device 1 output contacts) circuit and protection device input / CPU board", specifically including: line protection device 1 input board → protection device CPU board, as shown. Figure 2The interval “④a, ④b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the operating box contacts, the CPU / output board of the bus protection device 1, the switching circuits of the line protection device 1 (including the switching circuits connected to the operating box and the bus protection device 1), and the input / CPU board of the line protection device 1. Applying the method of this invention can narrow the defect investigation scope to the input / CPU board of the line protection device 1, thereby reducing the workload of operators in analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0105] Example 5

[0106] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports a RAM error alarm. Since the alarm information pertains to the memory (device hardware), the closed-loop path of the associated defect range is taken from the CPU board. The notation "⑤a" represents the specific defect range closed-loop path associated with the RAM error alarm of line protection device 1. Within the same time interval as the RAM error alarm reported by line protection device 1, if line protection device 1 reports a current transformer (CT) disconnection alarm, the object of the alarm information is current, and the associated defect range closed-loop path is specifically represented by the notation "⑤b". Taking the intersection of the defect range closed-loop paths "⑤a" and "⑤b" yields the following result: Figure 2 As shown, this represents the intersection of the CPU board of line protection device 1, the current loop of line protection device 1, and the sampling / CPU board of the protection device. Specifically, it includes the CPU board of line protection device 1, as shown below. Figure 2 The interval “⑤a, ⑤b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the current loop of line protection device 1 and the protection device sampling / CPU board. Applying the method of this invention can narrow the defect investigation scope to the CPU board of line protection device 1, thereby reducing the workload of operators analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0107] Example 6

[0108] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2As shown, line protection device 1 reports a channel abnormality alarm. Since the alarm information pertains to the protection channel, the closed-loop path of the associated defect range includes the CPU / management board of the protection devices on both sides, the communication channel, and auxiliary devices. The notation "⑥a" is used to represent the specific defect range closed-loop path associated with the abnormal alarm of channel 1 of line protection device 1. Within the same time interval as the abnormal alarm reported by line protection device 1, if line protection device 1 reports a remote trip input abnormal alarm, the object of the alarm information is the remote transmission signal, and the associated defect range closed-loop path includes the CPU / optical coupler board of both protection devices, the communication channel, and auxiliary devices. The associated closed-loop path of the defect range is specifically represented by the notation "⑥b". Taking the intersection of the closed-loop paths "⑥a" and "⑥b" of the defect range yields the following result: Figure 2 The diagram shows the intersection of "CPU / management board, communication channel and auxiliary devices for both protection devices" and "CPU / optical coupler board, communication channel and auxiliary devices for both protection devices," specifically including: CPU board, communication channel and auxiliary devices for both protection devices, such as... Figure 2 The interval “⑥a, ⑥b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple anomaly information to extract the maximum amount of information contained in multiple relay protection anomaly alarms and device panel indicator lights, obtaining the most probable and smallest set of defect points. Specifically, in this example, the original method requires sequentially checking the CPU / optical coupler / management board, communication channel, and auxiliary devices of both protection devices. Applying the method of this invention can narrow the defect investigation scope to the CPU board, communication channel, and auxiliary devices of both protection devices, thereby reducing the workload of operators analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0109] Example 7

[0110] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports a failure tripping alarm. Since the alarm information pertains to the output of bus protection device 1, the associated defect range closed-loop path includes the CPU / output board of bus protection device 1, the switch circuit, and the input / CPU board of line protection device 1. The associated defect range closed-loop path is specifically represented by the symbol "⑦a". Within the same time interval as the line protection device 1 reporting a failure trip alarm, the first protection device on another branch located on the same busbar as this line also reports a failure trip alarm. Figure 2(Not shown in the diagram), the associated defect range closed-loop path is taken as the bus protection device 1 CPU / outgoing board, the switching circuit, and the protection device's incoming / CPU board. The intersection of the defect range closed-loop paths is the bus protection device 1 CPU / outgoing board and the switching circuit (from the bus protection device 1 terminal box to the bus protection device 1 section). The method provided by this embodiment effectively applies multiple relay protection abnormal information, extracts the information covered by multiple abnormal alarms and device panel indicator lights to the greatest extent, and obtains the most likely and smallest set of defect points. Specifically, in this example, the original method requires sequentially checking the bus protection device 1 CPU / outgoing board, the switching circuit, the line protection device 1 incoming / CPU board, and the first set of protection device incoming / CPU boards of another branch located on the same bus as the line. Applying the method of this invention can narrow the defect investigation scope to the bus protection device 1 CPU / outgoing board and the switching circuit (from the bus protection device 1 terminal box to the bus protection device 1 section), thereby reducing the workload of operators in analyzing multiple alarms that occur in a short time and improving the efficiency of defect diagnosis.

[0111] Figure 4 This is a schematic diagram of a device for determining the diagnostic range of relay protection defects, provided as an exemplary embodiment of the present invention.

[0112] like Figure 4 As shown, the device includes:

[0113] Information collection unit 401 is used to collect several abnormal information of substation relay protection.

[0114] In this embodiment of the invention, the abnormal information of substation relay protection can be relay protection alarm information, device panel indicator information, and other abnormal information of substation relay protection within a preset time interval. There can be one item, two items, or more items, which can be used as the basis for analyzing the scope and cause of defects.

[0115] Furthermore, abnormal information regarding substation relay protection includes alarm information from relay protection devices and indicator light information from device panels.

[0116] The defect range association unit 402 is used to obtain several defect range closed-loop paths based on several substation relay protection abnormal information; wherein, the defect range closed-loop path is the closed-loop path where the defect point that caused the occurrence of a single substation relay protection abnormal information is located.

[0117] In this embodiment of the invention, the range of defect points that cause abnormal relay protection information in each individual substation can be considered as the defect range associated with that abnormal relay protection information. The defect range associated with the abnormal relay protection information of an individual substation generally starts from the device that issued the abnormal information (the abnormal object is an analog quantity, a digital quantity, etc.) and ends at the device that issued the abnormal information, covering the closed-loop path of the hardware / ports at both ends, intermediate devices / ports, secondary circuits, and channels.

[0118] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, based on the object classification of alarm information, taking the defect range of conventional substation relay protection as an example, the closed-loop path of the defect range associated with alarm information is generally as follows:

[0119] 1) When the object of the alarm information is voltage (e.g., TV disconnection alarm), the closed-loop path of the defect range associated with this alarm information is generally: voltage transformer secondary winding → voltage secondary circuit (via terminal box / control cabinet) → voltage paralleling device in the voltage paralleling panel (with an air switch at the inlet) → voltage secondary circuit (entering the terminal block of the protection panel) → voltage switching device (with an air switch at the outlet) → protection device sampling board → protection device CPU board; for bus protection devices, the above closed-loop path does not include the voltage switching device; when the collected voltage is the line voltage and the substation wiring configuration is 3 / 2 connection, the above closed-loop path does not include the voltage paralleling panel, voltage paralleling device, or voltage switching device, and is notated as:

[0120] 2) When the alarm information pertains to current (e.g., CT disconnection alarm), the closed-loop path of the associated defect range is generally: current transformer secondary winding → current secondary circuit (via terminal box / control cabinet) → current secondary circuit (entering the terminal block of the protection panel) → protection device sampling board → protection device CPU board, noted as:

[0121] 3) When the alarm information pertains to the contact potential of the control box (e.g., trip position abnormality alarm), the closed-loop path of the defect range associated with this alarm information is generally: control box contact → secondary circuit of switch quantity (via terminal box / control cabinet) → secondary circuit of switch quantity (entering the terminal block of the protection panel) → protection device input board → protection device CPU board, noted as:

[0122] 4) When the object of the alarm information is a switching signal of another protection device (e.g., a fault trip input abnormal alarm), the closed-loop path of the defect range associated with this alarm information is generally: source protection device CPU board → source protection device output board → switching secondary circuit (via the terminal block of the source protection panel) → switching secondary circuit (via the terminal box / control cabinet) → switching secondary circuit (terminal block of the receiving protection panel) → receiving protection device input board → receiving protection device CPU board, noted as:

[0123] 5) When the object of the alarm information is device hardware (e.g., plug-in abnormality alarm, RAM memory abnormality alarm), the closed-loop path of the defect range associated with the alarm information is generally: device hardware as the object of the alarm information → device CPU board, noted as:

[0124] 6) When the alarm information pertains to a device channel (e.g., channel abnormality alarm), the closed-loop path of the defect range associated with this alarm information is generally as follows (taking a multiplexed fiber optic channel as an example): CPU board of the opposite line protection device → management board of the opposite line protection device → secondary circuit → multiplexed interface device panel of the opposite side → coaxial cable → digital distribution frame of the opposite side → communication channel (including communication panels on both sides) → digital distribution frame of this side → coaxial cable → multiplexed interface device panel of this side → secondary circuit → management board of this side line protection device → CPU board of this side line protection device, noted as:

[0125] 7) When the alarm information pertains to a remote transmission or remote trip signal (e.g., a long-term remote input abnormality alarm), the closed-loop path of the defect range associated with this alarm information is generally (taking a multiplexed fiber optic channel as an example): CPU board of the opposite line protection device → Optical coupler board of the opposite line protection device → Secondary circuit → Multiplexed interface device panel of the opposite side → Coaxial cable → Digital distribution frame of the opposite side → Communication channel (including communication panels on both sides) → Digital distribution frame of this side → Coaxial cable → Multiplexed interface device panel of this side → Secondary circuit → Optical coupler board of this side line protection device → CPU board of this side line protection device, noted as:

[0126] 8) When the object of the alarm information is a time synchronization signal (e.g., a time synchronization anomaly alarm), the closed-loop path of the defect range associated with this alarm information is generally (taking B-code time synchronization as an example): Satellite → Antenna → Time Synchronization Source → Secondary Circuit → Protection Device Management Board → Protection Device CPU Board, noted as:

[0127] The defect diagnosis range determination unit 403 is used to find the intersection of several closed-loop paths of defect ranges to obtain the defect diagnosis range.

[0128] In this embodiment of the invention, when new relay protection anomalies appear within a certain time interval or under the condition that historical anomalies have not been eliminated, the relay protection anomalies are correlated, indicating that these anomalies are caused by at least one identical defect, and the elimination of one or more defects means the recurrence of related relay protection anomalies. Each relay protection anomaly can be used to draw a closed-loop path of the defect range associated with it, and a fault at any node on the closed-loop path can cause the anomaly to occur. One or more defects are most likely to occur at the intersection of the defect ranges of the various relay protection anomalies. The intersection of the closed-loop paths of the defect ranges associated with each of the multiple relay protection anomalies is calculated to define the scope of defect diagnosis, and the set of these defect points is extracted as the scope for priority defect diagnosis.

[0129] In the above embodiments, by obtaining the closed-loop path of the defect range based on the abnormal information of the substation relay protection, and finding the intersection of the closed-loop paths of the defect range, the defect diagnosis range is obtained. This provides a general method for determining the defect diagnosis range, solving the problems of limited application scenarios, inability to comprehensively analyze complex phenomena, and poor timeliness caused by the analysis of isolated cases in existing defect diagnosis methods. Compared with directly obtaining the defect diagnosis range based on any abnormal information, the present invention obtains the defect diagnosis range by finding the intersection of defect ranges, which is more targeted, makes it easier to identify the main defects, and improves the efficiency of defect diagnosis. When diagnosing relay protection defects, the method provided by the present invention can prioritize the determination of the relay protection defect diagnosis range, allowing operators to further determine the specific defect location and cause. This avoids the current problem of operators checking possible defect points sequentially, which involves many items and is time-consuming. It greatly narrows the defect diagnosis range, significantly improves the efficiency of operators in defect checking, and enhances the intelligence level of defect diagnosis.

[0130] Figure 5 This is a schematic diagram of the defect diagnosis range determination unit 403 provided in an exemplary embodiment of the present invention. Figure 5 As shown, the defect diagnosis range determination unit 403 includes:

[0131] The correlation processing unit 4031 is used to obtain several related defect range closed-loop paths based on the correlation between several defect range closed-loop paths.

[0132] In this embodiment of the invention, by judging the correlation between the information of each defect range closed-loop path and eliminating irrelevant defect information, the pertinence and accuracy of the defect diagnosis range determination can be improved.

[0133] Furthermore, the correlation processing unit 4031 is also used for:

[0134] Calculate the similarity between any two closed-loop paths of defect ranges. If the similarity is greater than a preset similarity threshold, then the two closed-loop paths of defect ranges are related closed-loop paths of defect ranges.

[0135] Traverse all closed-loop paths within the defect range to obtain all relevant closed-loop paths within the defect range.

[0136] Specifically, based on the closed-loop path of the defect range associated with relay protection anomaly information, the closed-loop path of the defect range is divided, and a defect diagnosis range set U is constructed. The elements in the defect diagnosis range are all defect points on all closed-loop paths. When the defect diagnosis range covers a certain defect point, the corresponding element u is... j =1, otherwise 0, where j is the sequence number of the defect point.

[0137] If there is one abnormal relay protection information from a substation, select any two closed-loop paths within the defect range. a f b Calculate their similarity s ab . byU a U b Calculate s ab The formula is as follows:

[0138]

[0139] Set a similarity threshold s min If s ab ≥s min If the two substation relay protection anomaly messages are related, denoted as f. a ∽f b u ai u bj These refer to the closed-loop path f of the defect range. a Does it cover defect point i and the closed-loop path f of the defect range? b Whether defect point j is covered is determined by 1 (1 indicates coverage) and 0 (0 indicates non-coverage). By calculating the similarity between all closed-loop paths of defect ranges, all relevant closed-loop paths of defect ranges can be obtained, and thus all defect points associated with substation relay protection anomaly information can be obtained.

[0140] The ordinary probability calculation unit 4032 is used to calculate the probability of each defect point occurring within a closed-loop path of several related defect ranges.

[0141] In this embodiment of the invention, each related defect range closed-loop path includes several defect points, and the probability of each defect point occurring is calculated.

[0142] Furthermore, the general probability calculation unit 4032 is also used for:

[0143] Based on the historical probability of each related defect range closed-loop path occurring, the historical probability of each defect point occurring, and the historical probability of each defect point and each related defect range closed-loop path occurring simultaneously, the probability of each defect point occurring is obtained.

[0144] Specifically, defect points and relay protection anomaly information are extracted from historical defect information, and the conditional probability P(u) of the defect point when the relay protection anomaly occurs is calculated. j |f i P(u) can be used. j |f i )=P(f i |u j )P(u j ) / P(f i ) Calculation. Where, P(f i P(u) represents the ratio of the number of relay protection anomalies occurring in the historical defects to the total defect statistics. j ) represents the proportion of defect point j to the total defect statistic, and the conditional probability P(f) is given by... i |u j ) represents the conditional probability that there is an i-th relay protection anomaly when the defect point is j.

[0145] The comprehensive probability calculation unit 4033 is used to fuse the probability of each defect point to obtain the comprehensive probability of each defect point.

[0146] Furthermore, the comprehensive probability calculation unit 4033 is also used for:

[0147] Using the number of closed-loop paths within the relevant defect range as rows and the number of all defect points as columns, we obtain matrix A, which represents the probability of each defect point occurring.

[0148] Based on matrix A, the augmented matrix M for uncertainty is obtained;

[0149] Based on the augmented matrix M, the fused row vector h is obtained. The first J columns of the row vector h contain the combined probability of each defect point occurring, where J is the total number of all defect points.

[0150] Specifically, if I relay protection abnormal information f1, f2, ..., f I For J defect points, we can obtain a matrix A = [a] with I rows and J columns. ij ] I×J , representing the probability of a defect point that can be inferred from any relay protection anomaly information, is given by a. ij =P(u j |f i Composed of A. The augmented matrix M, which accounts for uncertainty, can be calculated from A. The relevant parameters of M are then calculated:

[0151] α i =max j {a ij}, i = 1, 2, ..., I;

[0152]

[0153]

[0154] M has one more column than A, that is, m J+1 , which means the uncertainty of abnormal information of relay protection.

[0155] Among them, W i W is the uncertain weighting coefficient of relay protection anomaly information i, with a value range of [0,1]. The larger the value, the higher the availability of this relay protection anomaly information, that is, the lower the probability of false alarm and the stronger the diagnostic targeting. i Higher; α i β is the maximum correlation coefficient of relay protection abnormal information i; i It is the relevant allocation value of the abnormal relay protection information i; R i This is the reliability coefficient of the relay protection abnormal information i. Then, the element value m in the intermediate matrix M... ij The calculation method is as follows:

[0156]

[0157] The uncertainty measure of relay protection abnormal information i is:

[0158] C is used to represent the sum of probabilities of completely conflicting defect points. The first J columns M' of matrix M are taken as the defect point diagnosis probability matrix obtained from I anomaly information. The sum of the elements in different columns of different rows in M' is taken as C, i.e.

[0159] Using M, we obtain the fused row vector h, where the first J columns represent the probabilities of defect points, i.e.:

[0160] In the formula, 1≤j≤J;

[0161] The (J+1)th column represents the uncertainty probability, and the formula is:

[0162]

[0163] The sorting unit 4034 is used to sort each defect point according to the comprehensive probability to obtain the defect diagnosis range.

[0164] In this embodiment of the invention, each defect point can be sorted from largest to smallest based on the comprehensive probability value, thereby obtaining a set of defect points with a degree of correlation with relay protection abnormal information from largest to smallest. This set can be used as a defect diagnosis range to provide operators with further specific defect diagnosis.

[0165] In the above embodiments, by optimizing and calculating the defect points and their probabilities in the closed-loop path of the defect range, a set of defect points related to the abnormal information of substation relay protection is finally obtained as the defect diagnosis range. This provides a general method for determining the defect diagnosis range, solving the problems of limited application scenarios, inability to comprehensively analyze complex phenomena, and poor timeliness caused by the analysis of isolated cases in existing defect diagnosis methods. Compared with directly obtaining the defect diagnosis range based on any one abnormal information, the embodiments of the present invention obtain the defect diagnosis range by finding the intersection of the defect ranges, which is more targeted, makes it easier to identify the main defects, and improves the efficiency of defect diagnosis. When diagnosing relay protection defects, the method provided by the embodiments of the present invention can prioritize the determination of the relay protection defect diagnosis range, so that operators can further determine the specific defect location and cause. This avoids the current problem of operators checking possible defect points one by one, which involves many items and is time-consuming. It greatly narrows the defect diagnosis range, significantly improves the efficiency of operators in defect checking, and enhances the intelligence level of defect diagnosis.

[0166] Example 8

[0167] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 (denoted as protection device 1) reports a long-term start-up abnormality alarm. Analysis of possible causes for the long-term start-up of the protection device (including bus protection device start-up failure inputs, voltage sampling, current sampling, etc.) reveals that the cause of the long-term start-up alarm is that the voltage sampling has reached the protection low-voltage start-up setting. Since the alarm information pertains to voltage, the associated defect range closed-loop path is taken as the voltage loop and the protection device sampling / CPU board. In order to sample the voltage circuit and protection device abstracted in the previous text / CPU board To specify, the notation "①a" represents the specific defect range closed-loop path associated with the long-term start abnormal alarm of line protection device 1. Within the same time interval as the long-term start abnormal alarm reported by line protection device 1, the first protection device (referred to as protection device 2) on another branch located on the same busbar as the line reports a TV disconnection alarm. The object of the alarm information is also voltage, and the specific defect range closed-loop path associated with it is represented by the notation "①b".

[0168] 1) Correlation analysis between alarm information

[0169] In this example, the defect point set j = 1 to 7 represents the secondary circuit from the TV secondary winding to the parallel screen, the secondary circuit from the parallel screen to protection device 1, the sampling board of protection device 1, the CPU board of protection device 1, the secondary circuit from the parallel screen to protection device 2, the sampling board of protection device 2, and the CPU board of protection device 2, respectively. The defect point j = 1, "the secondary circuit from the TV secondary winding to the parallel screen," is a common part of both protection devices. i = 1 and 2 represent the long-term start-up abnormal alarm of protection device 1 and the TV disconnection alarm of protection device 2, respectively. U1 = [1,1,1,1,0,0,0], U2 = [1,0,0,0,1,1,1], s 12 =0.25>s min =0.1, so the two alarms are related.

[0170] 2) Obtain the conditional probability of the defect diagnosis result when the alarm information occurs.

[0171] By analyzing historical data, the conditional probability of the defect point when the device alarm occurs can be obtained, resulting in matrix A:

[0172]

[0173] In the first line, since the object of the alarm information is determined to be voltage, the set of defect points corresponding to the occurrence of "long-term start-up abnormal alarm" only retains the part of voltage circuit and protection device, and is converted to 1, as shown in the first line of A.

[0174] 3) By integrating multiple alarm messages, the probability of different defects is determined, guiding the determination of the order of defect diagnosis. Specifically, this includes:

[0175] ① Calculate the augmented intermediate matrix M to characterize the uncertainty in inferring defect points from alarms and panel indicator lights.

[0176] Let W1 = W2 = 0.5, α1 and α2 be the maximum values ​​of the first and second rows of A, respectively, both 0.3, β1 and β2 can be calculated to be 0.25, and R1 and R2 are both 0.5. Using the formula... Calculate the unaugmented portion of M corresponding to A using the formula. Calculating the augmented portion of M, we can obtain:

[0177]

[0178] ② Integration of alarm information

[0179] C represents the sum of probabilities of completely conflicting defect points. Therefore, C = 0.2363

[0180] Using formula and

[0181] have to

[0182] h=[0.2269,0.0982,0.0327,0.0982,0.0982,0.0327,0.0982,0.3150]

[0183] The first seven columns represent the probabilities of the defect points: the secondary circuit from the TV secondary winding to the parallel screen, the secondary circuit from the parallel screen to protection device 1, the sampling board of protection device 1, the CPU board of protection device 1, the secondary circuit from the parallel screen to protection device 2, the sampling board of protection device 2, and the CPU board of protection device 2. The probabilities of these seven defect points are 0.2269, 0.0982, 0.0327, 0.0982, 0.0982, 0.0327, and 0.0982, respectively, with an uncertainty probability of 0.3150. It is evident that the defect point "the secondary circuit from the TV secondary winding to the parallel screen" has the highest probability and should be prioritized for defect diagnosis. The uncertainty of 0.3150 originates partly from the abstract mathematical concept, indicating that this data fusion method has a certain degree of uncertainty; another part stems from the simultaneous occurrence of multiple defects, meaning the defect point is not unique.

[0184] The defect point with the highest probability obtained above—"the secondary loop from the TV secondary winding to the parallel screen"—is the result of taking the intersection of the closed-loop paths "①a" and "①b" within the defect range, as shown in the figure. Figure 2 As shown, this represents the intersection of the voltage circuit and sampling / CPU board of line protection device 1, and the voltage circuit and sampling / CPU board of the first protection device on another branch located on the same busbar of the same line. Specifically, it includes: voltage transformer secondary winding → voltage secondary circuit (via terminal box / control cabinet) → voltage paralleling device in the voltage paralleling panel (with an air switch at the inlet), as shown. Figure 2 The interval “①a, ①b” can be simplified to “the secondary circuit from the TV secondary winding to the parallel screen”. The method provided in this invention effectively utilizes multiple relay protection anomaly information, extracting the information contained in the multiple relay protection anomaly alarms and device panel indicator lights to the greatest extent possible, resulting in the most probable and smallest set of defect points. Specifically, in this example, the original method requires sequentially checking the voltage circuits of two sets of protection devices and the protection device sampling / CPU board. Applying the method of this invention can narrow the defect investigation scope to a portion of the voltage circuit, thereby reducing the workload of operators analyzing multiple alarms occurring in a short period and improving the efficiency of defect diagnosis.

[0185] Example 9

[0186] Figure 2This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports a PT disconnection alarm. Since the alarm information pertains to voltage, the notation "②a" represents the specific defect range closed-loop path associated with the PT disconnection alarm of line protection device 1. Within the same time interval as line protection device 1 reporting the PT disconnection alarm, the first protection device on another branch located on the same busbar of this line also reports a PT disconnection alarm. The alarm information pertains to voltage as well, and the associated defect range closed-loop path is specifically represented by the notation "②b". Taking the intersection of defect range closed-loop paths "②a" and "②b" yields the following result: Figure 2 As shown, this represents the intersection of the voltage circuit and sampling / CPU board of line protection device 1, and the voltage circuit and sampling / CPU board of the first protection device on another branch located on the same busbar of the same line. Specifically, it includes: voltage transformer secondary winding → voltage secondary circuit (via terminal box / control cabinet) → voltage paralleling device in the voltage paralleling panel (with an air switch at the inlet), as shown. Figure 2 The interval “②a, ②b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the voltage circuits of two sets of protection devices and the protection device sampling / CPU board. Applying the method of this invention can narrow the defect investigation scope to a portion of the voltage circuit, thereby reducing the workload of operators analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0187] Example 10

[0188] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports a time synchronization error alarm. Since the alarm information pertains to the time synchronization signal, the associated defect range closed-loop path is the time synchronization circuit and the protection device management / CPU board. To explain the abstract time synchronization circuit and protection device management / CPU board mentioned earlier To specify, the notation "③a" represents the specific defect range closed-loop path associated with the time synchronization anomaly alarm of line protection device 1. Within the same time interval as the time synchronization anomaly alarm reported by line protection device 1, the first protection device of another branch on the same busbar as this line, and the substation busbar protection device 1, also report time synchronization anomaly alarms. The object of the alarm information is the same: the time synchronization signal. The specific defect range closed-loop paths associated with these alarms are represented by notations "③b" and "③c". Taking the intersection of the defect range closed-loop paths "③a", "③b", and "③c" yields the following result: Figure 2 As shown, this represents the intersection of the time synchronization circuit and protection device management / CPU board of line protection device 1, the time synchronization circuit and protection device management / CPU board of the first protection device of another branch located on the same busbar as this line, and the time synchronization circuit and protection device management / CPU board of the substation busbar protection device 1. Specifically, it includes: satellite → antenna → time synchronization source, such as... Figure 2 The intervals “③a, ③b, ③c” are shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the time synchronization circuits of three sets of protection devices and the protection device management / CPU board. Applying the method of this invention can narrow the defect investigation scope to a portion of the time synchronization circuit, thereby reducing the workload of operators analyzing multiple alarms occurring in a short period and improving the efficiency of defect diagnosis.

[0189] Example 11

[0190] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports an abnormal trip position alarm. Since the alarm information pertains to the contact potential of the control box, the associated defect range closed-loop path includes the control box contacts, the switching circuit, and the protection device's input / CPU board. In order to integrate the abstract control box contacts, switch circuits, and protection devices into the CPU board mentioned above... Specifically, the notation "④a" is used to represent the specific defect range closed-loop path associated with the trip position abnormality alarm of line protection device 1. Within the same time interval as the trip position abnormality alarm reported by line protection device 1, if line protection device 1 reports a failure-interlocking trip input abnormality alarm, the object of the alarm information is the output of bus protection device 1, and the associated defect range closed-loop path includes the CPU / output board of bus protection device 1, the switch quantity circuit, and the input / CPU board of line protection device 1. The associated closed-loop path of the defect range is specifically represented by the notation "④b". Taking the intersection of the closed-loop paths "④a" and "④b" of the defect range yields the following result: Figure 2 The diagram shows the intersection of "Operating box contacts, line protection device 1 switch quantity (operating box contacts) circuit and protection device input / CPU board" and "bus protection device 1 CPU / output board, switch quantity (bus protection device 1 output contacts) circuit and protection device input / CPU board", specifically including: line protection device 1 input board → protection device CPU board, as shown. Figure 2 The interval “④a, ④b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the operating box contacts, the CPU / output board of the bus protection device 1, the switching circuits of the line protection device 1 (including the switching circuits connected to the operating box and the bus protection device 1), and the input / CPU board of the line protection device 1. Applying the method of this invention can narrow the defect investigation scope to the input / CPU board of the line protection device 1, thereby reducing the workload of operators in analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0191] Example 12

[0192] Figure 2 This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports a RAM error alarm. Since the alarm information pertains to the memory (device hardware), the closed-loop path of the associated defect range is taken from the CPU board. The notation "⑤a" represents the specific defect range closed-loop path associated with the RAM error alarm of line protection device 1. Within the same time interval as the RAM error alarm reported by line protection device 1, if line protection device 1 reports a current transformer (CT) disconnection alarm, the object of the alarm information is current, and the associated defect range closed-loop path is specifically represented by the notation "⑤b". Taking the intersection of defect range closed-loop paths "⑤a" and "⑤b", the result is shown in the attached figure. This intersection represents the intersection of the CPU board of line protection device 1, the current loop of line protection device 1, and the sampling / CPU board of the protection device. Specifically, it includes: the CPU board of line protection device 1, as shown in the attached figure. Figure 2The interval “⑤a, ⑤b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the current loop of line protection device 1 and the protection device sampling / CPU board. Applying the method of this invention can narrow the defect investigation scope to the CPU board of line protection device 1, thereby reducing the workload of operators analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0193] Example 13

[0194] Figure 2 This invention provides an exemplary embodiment of a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection. (See diagram below.) Figure 2 As shown, line protection device 1 reports a channel abnormality alarm. Since the alarm information pertains to the protection channel, the closed-loop path of the associated defect range includes the CPU / management board of the protection devices on both sides, the communication channel, and auxiliary devices. The notation "⑥a" is used to represent the specific defect range closed-loop path associated with the abnormal alarm of channel 1 of line protection device 1. Within the same time interval as the abnormal alarm reported by line protection device 1, if line protection device 1 reports a remote trip input abnormal alarm, the object of the alarm information is the remote transmission signal, and the associated defect range closed-loop path includes the CPU / optical coupler board of both protection devices, the communication channel, and auxiliary devices. The associated closed-loop path of the defect range is specifically represented by the notation "⑥b". Taking the intersection of the closed-loop paths "⑥a" and "⑥b" of the defect range yields the following result: Figure 2 The diagram shows the intersection of "CPU / management board, communication channel and auxiliary devices for both protection devices" and "CPU / optical coupler board, communication channel and auxiliary devices for both protection devices," specifically including: CPU board, communication channel and auxiliary devices for both protection devices, such as... Figure 2 The interval “⑥a, ⑥b” is shown. The method provided in this embodiment of the invention effectively utilizes multiple relay protection anomaly information, extracting the information covered by multiple anomaly alarms and indicator lights on the device panel to the greatest extent possible, resulting in the set of the most likely and smallest possible defect points. Specifically, in this example, the original method requires sequentially checking the CPU / optical coupler / management board, communication channel, and auxiliary devices of both protection devices. Applying the method of this invention can narrow the defect investigation scope to the CPU board, communication channel, and auxiliary devices of both protection devices, thereby reducing the workload of operators analyzing multiple alarms that occur in a short period and improving the efficiency of defect diagnosis.

[0195] Example 14

[0196] Figure 2This is a schematic diagram illustrating the relay protection configuration of a line bay in a conventional substation with a double busbar connection, provided as an exemplary embodiment of the present invention. Figure 2 As shown, line protection device 1 reports a failure tripping alarm. Since the alarm information pertains to the output of bus protection device 1, the associated defect range closed-loop path includes the CPU / output board of bus protection device 1, the switch circuit, and the input / CPU board of line protection device 1. The associated defect range closed-loop path is specifically represented by the symbol "⑦a". Within the same time interval as the line protection device 1 reporting a failure trip alarm, the first protection device on another branch located on the same busbar as this line also reports a failure trip alarm. Figure 2 (Not shown in the diagram), the associated defect range closed-loop path is taken as the bus protection device 1 CPU / outgoing board, the switching circuit, and the protection device's incoming / CPU board. The intersection of the defect range closed-loop paths is the bus protection device 1 CPU / outgoing board and the switching circuit (from the bus protection device 1 terminal box to the bus protection device 1 section). The method provided by this embodiment effectively applies multiple relay protection abnormal information, extracts the information covered by multiple abnormal alarms and device panel indicator lights to the greatest extent, and obtains the most likely and smallest set of defect points. Specifically, in this example, the original method requires sequentially checking the bus protection device 1 CPU / outgoing board, the switching circuit, the line protection device 1 incoming / CPU board, and the first set of protection device incoming / CPU boards of another branch located on the same bus as the line. Applying the method of this invention can narrow the defect investigation scope to the bus protection device 1 CPU / outgoing board and the switching circuit (from the bus protection device 1 terminal box to the bus protection device 1 section), thereby reducing the workload of operators in analyzing multiple alarms that occur in a short time and improving the efficiency of defect diagnosis.

[0197] The present invention also provides a computer-readable storage medium storing one or more programs that, when executed by one or more processors, implement any of the above-described methods for determining the diagnostic range of relay protection defects.

[0198] The invention has been described with reference to a few embodiments. However, as will be known to those skilled in the art, and as defined in the appended claims, other embodiments besides those disclosed above fall equivalently within the scope of the invention.

[0199] Generally, all terms used in the claims are to be interpreted according to their ordinary meaning in the art, unless otherwise expressly defined herein. All references to “a / the / the [device, component, etc.]” ​​are openly interpreted as at least one instance of said device, component, etc., unless otherwise expressly stated. The steps of any method disclosed herein need not be performed in the exact order disclosed unless explicitly stated otherwise.

[0200] Those skilled in the art will understand that embodiments of the present invention can be provided as methods, systems, or computer program products. Therefore, the present invention can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the present invention can take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0201] This invention is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program products according to embodiments of the invention. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart illustrations and / or block diagrams. Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0202] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0203] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0204] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention and not to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that modifications or equivalent substitutions can still be made to the specific implementation of the present invention. Any modifications or equivalent substitutions that do not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. A method for determining the diagnostic range of relay protection defects, characterized in that, The method includes: Collect several abnormal information items of substation relay protection; wherein, the abnormal information of substation relay protection includes alarm information of relay protection device and indicator light information of device panel; Based on the aforementioned substation relay protection anomaly information, several defect range closed-loop paths are obtained; wherein, the defect range closed-loop path is the closed-loop path where the defect point that caused the occurrence of a single substation relay protection anomaly information is located, taking the object that issued the anomaly information as the starting point, and covering the closed-loop path of the hardware / ports of both ends, intermediate devices / ports, secondary circuits, and channels. The intersection of the closed-loop paths of the aforementioned defect ranges is used to obtain the defect diagnosis range. The step of finding the intersection of the closed-loop paths of the plurality of defect ranges to obtain the defect diagnosis range includes: Based on the correlation between the closed-loop paths of the aforementioned defect ranges, several related closed-loop paths of defect ranges are obtained. Calculate the probability of each defect point occurring within the closed-loop path of the aforementioned related defect ranges; The probability of each defect point occurring is fused to obtain the comprehensive probability of each defect point occurring. Based on the comprehensive probability, each defect point is sorted to obtain the defect diagnosis range; The step of obtaining several related defect range closed-loop paths based on the correlation between the several defect range closed-loop paths includes: Calculate the similarity between any two closed-loop paths of defect ranges. If the similarity is greater than a preset similarity threshold, then the two closed-loop paths of defect ranges are related closed-loop paths of defect ranges. Traverse all closed-loop paths within the defect range to obtain all relevant closed-loop paths within the defect range; The calculation of the probability of occurrence of each defect point within the closed-loop path of the plurality of related defect ranges includes: Based on the historical probability of the occurrence of each related defect range closed loop path, the historical probability of the occurrence of each defect point, and the historical probability of the simultaneous occurrence of each defect point and each related defect range closed loop path, the probability of each defect point occurring is obtained. The step of fusing the probability of occurrence of each defect point to obtain the comprehensive probability of occurrence of each defect point includes: Using the number of closed-loop paths within the relevant defect range as rows and the number of all defect points as columns, a matrix is ​​obtained showing the probability of occurrence for each defect point. A ; According to the matrix A This yields an augmented matrix with uncertainty. M ; According to the augmented matrix M The merged row vectors are obtained. h The row vector h Center front J The column elements represent the combined probability of each defect occurring, where J This represents the total number of defects.

2. A device for determining the diagnostic range of relay protection defects, characterized in that, The device includes: The information collection unit is used to collect several abnormal information of substation relay protection; wherein, the abnormal information of substation relay protection includes alarm information of relay protection device and indicator light information of device panel; The defect range association unit is used to obtain several defect range closed-loop paths based on the aforementioned substation relay protection abnormal information; wherein, the defect range closed-loop path is the closed-loop path where the defect point that caused the occurrence of a single substation relay protection abnormal information is located, taking the object that issued the abnormal information as the starting point, and covering the closed-loop path of the hardware / ports of both ends, intermediate devices / ports, secondary circuits, and channels. The defect diagnosis range determination unit is used to find the intersection of the closed-loop paths of the plurality of defect ranges to obtain the defect diagnosis range. The defect diagnosis range determination unit includes: The correlation processing unit is used to obtain several related defect range closed-loop paths based on the correlation between the several defect range closed-loop paths. A general probability calculation unit is used to calculate the probability of each defect point occurring within the closed-loop path of the several related defect ranges; The comprehensive probability calculation unit is used to fuse the probability of each defect point occurring to obtain the comprehensive probability of each defect point occurring; The sorting unit is used to sort each defect point according to the comprehensive probability to obtain the defect diagnosis range; The correlation processing unit is further configured to: Calculate the similarity between any two closed-loop paths of defect ranges. If the similarity is greater than a preset similarity threshold, then the two closed-loop paths of defect ranges are related closed-loop paths of defect ranges. Traverse all closed-loop paths within the defect range to obtain all relevant closed-loop paths within the defect range; The ordinary probability calculation unit is further used for: Based on the historical probability of the occurrence of each related defect range closed loop path, the historical probability of the occurrence of each defect point, and the historical probability of the simultaneous occurrence of each defect point and each related defect range closed loop path, the probability of each defect point occurring is obtained. The comprehensive probability calculation unit is further used for: Using the number of closed-loop paths within the relevant defect range as rows and the number of all defect points as columns, a matrix is ​​obtained showing the probability of occurrence for each defect point. A ; According to the matrix A This yields an augmented matrix with uncertainty. M ; According to the augmented matrix M The merged row vectors are obtained. h The row vector h Center front J The column elements represent the combined probability of each defect occurring, where J This represents the total number of defects.

3. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the method as described in claim 1.

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