A rapid test method for high-accelerated life test
By using a combination of continuously varying temperature and vibration stress, the operational and destructive limits of a product are first identified, thus solving the problems of long testing times and high costs associated with accelerated life testing and achieving a fast and economical testing method.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-06
- Publication Date
- 2026-03-17
AI Technical Summary
Existing accelerated life testing methods are time-consuming, costly, and require a large number of samples and liquid nitrogen, which cannot meet the rapidly evolving market demands, especially in the research and development of products with limited sample quantities or high costs.
By employing a combination of continuously varying temperature and vibration stress, and gradually increasing the stress until product failure, the operational limits are first identified, followed by the destructive limits, thus shortening the testing time and reducing liquid nitrogen consumption.
High-acceleration life testing can be completed in three to six hours, saving time and costs. Only a small number of samples are needed to complete the full test, and the test results are significantly improved.
Smart Images
Figure CN115855720B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to a rapid testing method for high-acceleration life testing, belonging to the field of reliability engineering technology for enhanced testing of electronic products. Background Technology
[0002] High Accelerated Life Testing (HALT) is a testing method used during product design to identify product defects and design margins. HALT technology assists in the design process, improves product design maturity, shortens the design testing cycle, and allows products to meet mature design requirements during the design phase, ensuring high-reliability and high-quality products are delivered to the market quickly.
[0003] The purpose of accelerated life testing is to identify the operating limits of a product by applying higher or lower temperatures and vibration stresses. It focuses on product failures or malfunctions as the main research object, and aims to improve reliability through the discovery, study, and improvement of failures and malfunctions.
[0004] To perform high-accelerated life testing, it is necessary to apply stepped stress in sequence and perform five major steps on the product separately: low-temperature stepped stress testing, high-temperature stepped stress testing, rapid temperature change stress testing, vibration stress testing, and combined stress testing.
[0005] Depending on the complexity of the product being tested, setting up a high-accelerated life testing environment, including the numerous equipment start-ups and shutdowns required during the test, involves completing the five major steps of high-accelerated life testing. Obtaining test results takes three to six days, making it a complex and challenging testing method. With the increasingly rapid pace of product updates in the market, the time allotted for design, development, and testing is being compressed, and the time required to complete high-accelerated life testing can no longer meet the speed demands of the market.
[0006] To perform high-accelerated life testing, at least a large number of samples are required to ensure the test can proceed as smoothly as possible. At the same time, a sufficient number of replacements for weak components must be prepared to successfully complete the five steps. Because high-accelerated life testing is a destructive test, the sample is usually damaged and cannot be reused after the test results are found in each step. If the number of samples is insufficient, a complete high-accelerated life test cannot be performed, which is a limitation of current high-accelerated life testing.
[0007] Many industries cannot provide many test samples during the product design phase; moreover, some products have high unit prices for R&D, such as products used in aviation or semiconductors. Therefore, if high-accelerated life testing is introduced, the current high-accelerated life testing program design needs to be implemented in five separate steps, and each step requires the use of new products for testing, which cannot meet the testing needs of this type.
[0008] Moreover, the cryogenic cooling function of high-accelerated life testing uses liquid nitrogen; completing a full high-accelerated life test requires more than 1,000 liters (L) of liquid nitrogen, costing approximately RMB 5,000. Existing high-accelerated life testing is a relatively expensive reliability testing program, which is also a limitation of high-accelerated life testing. Summary of the Invention
[0009] The technical problem to be solved by this invention is to provide a rapid testing method for high-accelerated life testing. This rapid testing method completes the high-accelerated life test by continuously varying temperature and vibration conditions with a fixed increase. The method starts by stimulating the optimal composite stress for product defects and is redesigned with continuous test conditions, which can quickly complete the high-accelerated life test and obtain test results. This shortens the test time to three to six hours, saves a lot of liquid nitrogen consumption, and saves a lot of time and cost in high-accelerated life testing.
[0010] To solve the above-mentioned technical problems, the technical solution adopted by the present invention is as follows:
[0011] A rapid testing method for accelerated life testing, characterized by: first identifying the product's operational limits, and then identifying the product's destructive limits, wherein...
[0012] (S1) Identify the operational limits of the product:
[0013] At the same time, temperature and vibration tests are conducted on the product. Temperature and vibration conditions are applied to the product in a continuously varying fixed increment until the product malfunctions. Then, the operating limits are confirmed, and the high temperature operating limit, low temperature operating limit, and vibration operating limit are determined.
[0014] (S2) Find the product's damage threshold:
[0015] Using the high temperature operating limit, low temperature operating limit, and vibration operating limit obtained in test (S1) as the initial set values, the temperature and vibration conditions are applied to the product in a continuously changing fixed increment until the product can no longer work normally. Then, the failure limit is confirmed and the high temperature failure limit, low temperature failure limit, and vibration failure limit are determined.
[0016] The aforementioned rapid testing method for high-accelerated life testing is characterized in that: in step (S1), when applying continuously varying temperature and vibration stress to the product in a continuously varying fixed increment manner, within the same cycle, half of the cycle is a continuous high-temperature zone and half of the cycle is a continuous low-temperature zone, and in the next cycle, the temperature increase in the high-temperature zone and the temperature decrease in the low-temperature zone are consistent. When confirming the operating limits, the following two situations apply:
[0017] (I) The product malfunction occurred in the high-temperature zone of one of the cycles:
[0018] (a) After turning off the vibration setting, continue to maintain the high temperature value within this cycle. If the product malfunction still exists, it means that the product malfunction is caused by high temperature stress. Reduce the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it means that the temperature value that caused the malfunction is the product's high temperature operating limit value. If it cannot recover, it means that the product's high temperature operating limit value and high temperature damage limit are both the temperature value that caused the malfunction.
[0019] (b) After turning off the vibration setting, continue to maintain the high temperature value within this cycle. If the product malfunction disappears at this time, it means that the product malfunction was caused by vibration stress. Set the temperature value to room temperature, reduce the vibration value by one amplitude, and observe whether the product malfunction recovers. If it recovers, it means that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it means that the product's vibration operation limit value and vibration damage limit are both the vibration value that caused the malfunction.
[0020] (II) The product malfunction occurred in the low-temperature zone of one of the cycles:
[0021] (i) After turning off the vibration setting, continue to maintain the low temperature value within this cycle. If the product malfunction still exists, it means that the product malfunction is caused by low temperature stress. Increase the temperature value by one level and observe whether the product malfunction is restored. If it is restored, it means that the temperature value that caused the malfunction is the product's low temperature operating limit value. If it cannot be restored, it means that the product's low temperature operating limit value and low temperature damage limit are both the temperature value that caused the malfunction.
[0022] (ii) After turning off the vibration setting, continue to maintain the low temperature value within this cycle. If the product malfunction disappears at this time, it means that the product malfunction was caused by vibration stress. Set the temperature value to room temperature, reduce the vibration value by one amplitude, and observe whether the product malfunction recovers. If it recovers, it means that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it means that both the product's vibration operation limit value and vibration damage limit are the vibration values that caused the malfunction.
[0023] The aforementioned rapid testing method for high-accelerated life testing is characterized in that: if the vibration operating limit is found first in situation (I) or situation (II), the vibration setting is turned off, and the product is continuously subjected to continuously varying temperature stress at a fixed increase until a product functional failure occurs.
[0024] If the product malfunction occurs in the high-temperature zone of this cycle, reduce the temperature by one increment and observe whether the malfunction recovers. If it recovers, the temperature at which the malfunction occurred is the product's high-temperature operating limit. If it does not recover, both the product's high-temperature operating limit and high-temperature damage limit are the temperature at which the malfunction occurred. In the next cycle, continue to reduce the temperature by applying low-temperature stress until the product malfunction occurs. Increase the temperature by one increment and observe whether the malfunction recovers. If it recovers, the temperature at which the malfunction occurred is the product's low-temperature operating limit. If it does not recover, both the product's low-temperature operating limit and low-temperature damage limit are the temperature at which the malfunction occurred.
[0025] If the product malfunction occurs in the low-temperature zone of this cycle, increase the temperature value by one increment and observe whether the malfunction is resolved. If it is resolved, the temperature value at which the malfunction occurred is the product's low-temperature operating limit. If it cannot be resolved, the product's low-temperature operating limit and low-temperature failure limit are both the temperature value at which the malfunction occurred. In the next cycle, only high-temperature stress is applied, and the temperature value is increased until the product malfunction occurs. Then, the temperature value is decreased by one increment, and the malfunction is observed whether it is resolved. If it is resolved, the temperature value at which the malfunction occurred is the product's high-temperature operating limit. If it cannot be resolved, the product's high-temperature operating limit and high-temperature failure limit are both the temperature value at which the malfunction occurred.
[0026] The aforementioned rapid testing method for high-accelerated life testing is characterized in that: in scenario (a), after confirming the high-temperature operating limit, only low-temperature stress and vibration stress tests are performed in the next cycle, and the temperature value continues to decrease while the vibration value is increased simultaneously until a product functional failure occurs.
[0027] After turning off the vibration setting, continue to maintain the temperature value within this cycle. If the product malfunction persists, it indicates that the malfunction is caused by low-temperature stress. Increase the temperature value by one increment and observe whether the malfunction recovers. If it recovers, it indicates that the temperature value that caused the malfunction is the product's low-temperature operating limit. If it cannot recover, it indicates that both the product's low-temperature operating limit and low-temperature damage limit are the temperature value that caused the malfunction. Set the temperature value to room temperature and continue to increase the vibration value until the product malfunction occurs. Decrease the vibration value by one increment and observe whether the malfunction recovers. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operating limit. If it cannot recover, it indicates that both the product's vibration operating limit and vibration damage limit are the vibration value that caused the malfunction.
[0028] After turning off the vibration setting, maintain the temperature value within the cycle. If the product malfunction disappears, it indicates that the malfunction was caused by vibration stress. Set the temperature to room temperature, turn on the vibration setting, and reduce the vibration value by one level. Observe whether the product malfunction recovers. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it indicates that both the product's vibration operation limit value and vibration damage limit are the vibration value that caused the malfunction. After turning off the vibration setting, continue to reduce the temperature value until the product malfunction occurs. Increase the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the temperature value that caused the malfunction is the product's low-temperature operation limit value. If it cannot recover, it indicates that both the product's low-temperature operation limit value and low-temperature damage limit are the temperature value that caused the malfunction.
[0029] The aforementioned rapid testing method for high-accelerated life testing is characterized in that: in scenario (i), after confirming the low-temperature operating limit, only high-temperature stress and vibration stress tests are performed in the next cycle, and the temperature value is continued to increase while the vibration value is increased simultaneously until a product functional failure occurs.
[0030] After turning off the vibration setting, continue to maintain the temperature value within this cycle. If the product malfunction persists, it indicates that the malfunction is caused by high-temperature stress. Reduce the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the temperature value that caused the malfunction is the product's high-temperature operating limit. If it cannot recover, it indicates that both the product's high-temperature operating limit and high-temperature damage limit are the temperature value that caused the malfunction. Set the temperature value to room temperature and continue to increase the vibration value until the product malfunction occurs. Reduce the vibration value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operating limit. If it cannot recover, it indicates that both the product's vibration operating limit and vibration damage limit are the vibration value that caused the malfunction.
[0031] After turning off the vibration setting, continue to maintain the temperature value within this cycle. If the product malfunction disappears, it indicates that the malfunction was caused by vibration stress. Set the temperature value to room temperature, reduce the vibration value by one level, and observe whether the product malfunction recovers. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it indicates that both the product's vibration operation limit value and vibration damage limit are the vibration value that caused the malfunction. After turning off the vibration setting, continue to increase the temperature value until the product malfunction occurs. Reduce the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the temperature value that caused the malfunction is the product's high-temperature operation limit value. If it cannot recover, it indicates that both the product's high-temperature operation limit value and high-temperature damage limit are the temperature value that caused the malfunction.
[0032] The aforementioned rapid testing method for high-accelerated life testing is characterized in that: in step (S2), when applying continuously varying temperature and vibration stress to the product in a continuously varying fixed increment manner, within the same cycle, half of the cycle is a continuous high-temperature zone and half of the cycle is a continuous low-temperature zone, and in the next cycle, the temperature increase in the high-temperature zone and the temperature decrease in the low-temperature zone are consistent. When confirming the operating limits, the following two situations apply:
[0033] (a) The product malfunctions during the high-temperature zone of one of the cycles:
[0034] Keep the temperature constant while reducing the vibration value by one amplitude. Test the new product after replacement. If the product still fails to work properly, it indicates that the temperature is the high temperature damage limit. If the product works properly, it indicates that the vibration value at which the product fails to work properly is the vibration damage limit.
[0035] (ii) The product malfunctions during the low-temperature zone of one of the cycles:
[0036] Keep the temperature constant while reducing the vibration value by one amplitude. Test the new product after replacement. If the product still fails to work properly, it indicates that the temperature is the low-temperature damage limit; if the product works properly, it indicates that the vibration value at which the product fails to work properly is the vibration damage limit.
[0037] The aforementioned rapid testing method for high-accelerated life testing is characterized in that: in scenario (i), if the high-temperature failure limit is determined first, then in the next cycle, only low-temperature stress and vibration stress tests are performed. The temperature value is continued to decrease while the vibration value is simultaneously increased to test the replaced new product until the product fails to function properly. Then, the temperature is kept constant while the vibration value is reduced by a certain amplitude to test another replaced new product.
[0038] If the product still fails to work properly, it indicates that the temperature is the low-temperature damage limit. At room temperature, continue to increase the vibration value and test another new product until the product fails to work properly, indicating that the vibration value is the vibration damage limit.
[0039] If the product can work normally, it indicates that the vibration value at which the product cannot work normally is the vibration damage limit. Turn off the vibration setting and continue to lower the temperature value to test another new product until the product cannot work normally, indicating that the temperature value is the low temperature damage limit.
[0040] The beneficial effects of this invention are:
[0041] 1. The temperature and vibration tests are combined and carried out simultaneously from the beginning of the test. The combined stress test is performed directly. The temperature and vibration stress are gradually increased until the product fails or malfunctions. This is a process of limit discovery, which saves test time. 2. The combined stress of vibration and temperature is the best combination to induce product defects, making the test results more significant and improving the test speed.
[0042] 2. Gradually apply temperature and vibration stress until the product fails or malfunctions; first find the product's operating limits, then find the product's failure limits. This order is to allow the product to continue to perform the test, because the product has not yet failed when its operating limits are found. When the stress is reduced or removed, the product can resume normal output. This test method is designed so that a maximum of 5 samples are needed to perform a complete high-accelerated life test. Attached Figure Description
[0043] Figure 1 This is a stress diagram illustrating the rapid testing method for high-accelerated life testing according to the present invention when the high-temperature operating limit is discovered.
[0044] Figure 2 This is a stress diagram illustrating the rapid testing method for high-acceleration life testing of the present invention when discovering the low-temperature operating limit.
[0045] Figure 3 This is a stress diagram illustrating the rapid testing method for high-accelerated life testing according to the present invention when the vibration operation limit is discovered. Detailed Implementation
[0046] The present invention will now be further described with reference to the accompanying drawings.
[0047] like Figures 1-3 As shown, a rapid testing method for high-accelerated life testing first identifies the product's operating limits and then identifies its destructive limits. The first step, identifying the product's operating limits, involves simultaneously conducting temperature and vibration tests on the product. The temperature and vibration conditions are applied to the product with continuously varying temperature and vibration stresses at a fixed increase until the product experiences a functional failure. At this point, the operating limits are confirmed, and the high-temperature operating limit, low-temperature operating limit, and vibration operating limit are determined.
[0048] In the process of finding the operating limits of a product, when applying continuously varying temperature and vibration stress to the product with a fixed increase in temperature and vibration conditions, within the same cycle, half of the cycle is a continuous high-temperature zone and the other half is a continuous low-temperature zone. In the next cycle, the temperature increase in the high-temperature zone and the temperature decrease in the low-temperature zone are the same. When confirming the operating limits, the following two scenarios apply:
[0049] (I) The product malfunction occurred in the high-temperature zone of one of the cycles:
[0050] (a) After turning off the vibration setting, continue to maintain the high temperature value within this cycle. If the product malfunction still exists, it indicates that the malfunction is caused by high-temperature stress. Reduce the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the temperature value that caused the malfunction is the product's high-temperature operating limit. If it cannot recover, it indicates that both the product's high-temperature operating limit and high-temperature damage limit are the temperature value that caused the malfunction.
[0051] After determining the high-temperature operating limits, low-temperature and vibration stress tests are then conducted simultaneously to identify the low-temperature and vibration operating limits. If the product's high-temperature operating limit and high-temperature failure limit are the same, it indicates that the product is damaged and a new sample needs to be used for testing. If only the product's high-temperature operating limit is found, it indicates that the product is not damaged and the sample can continue to be used for testing. The specific method is as follows:
[0052] In the next cycle, only low-temperature stress and vibration stress tests are performed. The temperature value is continued to decrease while the vibration value is increased simultaneously until a product malfunction occurs. After turning off the vibration setting, the temperature value from the previous cycle is maintained. If the product malfunction persists, it indicates that the malfunction is caused by low-temperature stress. The temperature value is increased by a certain amount, and the product malfunction is observed to recover. If it recovers, it indicates that the temperature value that caused the malfunction is the product's low-temperature operating limit. If it cannot recover, it indicates that both the product's low-temperature operating limit and low-temperature failure limit are the temperature value that caused the malfunction. The temperature value is then set to room temperature, and a new test sample is used. The vibration value is continued to increase until a product malfunction occurs. The vibration value is then decreased by a certain amount, and the product malfunction is observed to recover. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operating limit. If it cannot recover, it indicates that both the product's vibration operating limit and vibration failure limit are the same. The failure limits are all vibration values that cause functional malfunctions. If the vibration setting is turned off and the temperature value within the same cycle is maintained, and the product malfunction disappears, it indicates that the product malfunction was caused by vibration stress. Set the temperature value to room temperature, turn on the vibration setting, and reduce the vibration value by one level. Observe whether the product malfunction recovers. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it indicates that both the product's vibration operation limit value and vibration failure limit are the vibration values that caused the functional malfunction. After turning off the vibration setting, replace with a new test sample and continue to reduce the temperature value until the product malfunction occurs. Increase the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the temperature value that caused the functional malfunction is the product's low-temperature operation limit value. If it cannot recover, it indicates that both the product's low-temperature operation limit value and low-temperature failure limit are the temperature values that caused the functional malfunction.
[0053] (b) After turning off the vibration setting, continue to maintain the high temperature value within this cycle. If the product malfunction disappears at this time, it means that the product malfunction was caused by vibration stress. Set the temperature value to room temperature, reduce the vibration value by one amplitude, and observe whether the product malfunction recovers. If it recovers, it means that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it means that the product's vibration operation limit value and vibration damage limit are both the vibration value that caused the malfunction.
[0054] (II) If the product malfunction occurs in the low-temperature zone of one of the cycles, the operation process is similar to that described above:
[0055] (i) After turning off the vibration setting, continue to maintain the low temperature value within this cycle. If the product malfunction persists, it indicates that the malfunction is caused by low-temperature stress. Increase the temperature value by a certain margin and observe whether the malfunction recovers. If it recovers, it indicates that the temperature value causing the malfunction is the product's low-temperature operating limit. If it does not recover, it indicates that both the product's low-temperature operating limit and low-temperature failure limit are the temperature value causing the malfunction. In the next cycle, only high-temperature stress and vibration stress tests are performed. Continue to increase the temperature value and simultaneously increase the vibration value until the product malfunction occurs. Identify the product's high-temperature operating limit and vibration limit. If the product's low-temperature operating limit and low-temperature failure limit are the same, it indicates that the product is damaged and a new sample needs to be replaced for testing. If only the product's low-temperature operating limit is found, it indicates that the product is not damaged and the sample can continue to be used for testing.
[0056] After turning off the vibration setting, continue to maintain the temperature value within this cycle. If the product malfunction persists, it indicates that the malfunction is caused by high-temperature stress. Reduce the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the temperature value that caused the malfunction is the product's high-temperature operating limit. If it cannot recover, it indicates that both the product's high-temperature operating limit and high-temperature damage limit are the temperature value that caused the malfunction. Set the temperature value to room temperature and continue to increase the vibration value until the product malfunction occurs. Reduce the vibration value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operating limit. If it cannot recover, it indicates that both the product's vibration operating limit and vibration damage limit are the vibration value that caused the malfunction.
[0057] After turning off the vibration setting, continue to maintain the temperature value within this cycle. If the product malfunction disappears, it indicates that the malfunction was caused by vibration stress. Set the temperature value to room temperature, reduce the vibration value by one level, and observe whether the product malfunction recovers. If it recovers, it indicates that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it indicates that both the product's vibration operation limit value and vibration damage limit are the vibration value that caused the malfunction. After turning off the vibration setting, continue to increase the temperature value until the product malfunction occurs. Reduce the temperature value by one level and observe whether the product malfunction recovers. If it recovers, it indicates that the temperature value that caused the malfunction is the product's high-temperature operation limit value. If it cannot recover, it indicates that both the product's high-temperature operation limit value and high-temperature damage limit are the temperature value that caused the malfunction.
[0058] (ii) After turning off the vibration setting, continue to maintain the low temperature value within this cycle. If the product malfunction disappears at this time, it means that the product malfunction was caused by vibration stress. Set the temperature value to room temperature, reduce the vibration value by one amplitude, and observe whether the product malfunction recovers. If it recovers, it means that the vibration value that caused the malfunction is the product's vibration operation limit value. If it cannot recover, it means that both the product's vibration operation limit value and vibration damage limit are the vibration values that caused the malfunction.
[0059] If the vibration operating limit is found first in scenario (b) or scenario (ii), then the vibration setting is turned off, and the product continues to be subjected to continuously varying temperature stress at a continuously varying fixed increment until a product malfunction occurs.
[0060] If the product malfunction occurs in the high-temperature zone of this cycle, reduce the temperature by one increment and observe whether the malfunction recovers. If it recovers, the temperature at which the malfunction occurred is the product's high-temperature operating limit. If it does not recover, both the product's high-temperature operating limit and high-temperature damage limit are the temperature at which the malfunction occurred. In the next cycle, continue to reduce the temperature by applying low-temperature stress until the product malfunction occurs. Increase the temperature by one increment and observe whether the malfunction recovers. If it recovers, the temperature at which the malfunction occurred is the product's low-temperature operating limit. If it does not recover, both the product's low-temperature operating limit and low-temperature damage limit are the temperature at which the malfunction occurred.
[0061] If the product malfunction occurs in the low-temperature zone of this cycle, increase the temperature value by one increment and observe whether the malfunction is resolved. If it is resolved, the temperature value at which the malfunction occurred is the product's low-temperature operating limit. If it cannot be resolved, the product's low-temperature operating limit and low-temperature failure limit are both the temperature value at which the malfunction occurred. In the next cycle, only high-temperature stress is applied, and the temperature value is increased until the product malfunction occurs. Then, the temperature value is decreased by one increment, and the malfunction is observed whether it is resolved. If it is resolved, the temperature value at which the malfunction occurred is the product's high-temperature operating limit. If it cannot be resolved, the product's high-temperature operating limit and high-temperature failure limit are both the temperature value at which the malfunction occurred.
[0062] (S2) Find the product's damage threshold:
[0063] Using the high temperature operating limit, low temperature operating limit, and vibration operating limit obtained in test (S1) as the initial set values, the temperature and vibration conditions are applied to the product in a continuously changing fixed increment until the product can no longer work normally. Then, the failure limit is confirmed and the high temperature failure limit, low temperature failure limit, and vibration failure limit are determined.
[0064] In step (S2), when applying continuously varying temperature and vibration stress to the product with a fixed increase in temperature and vibration conditions, within the same cycle, half of the cycle is a continuous high-temperature zone and the other half is a continuous low-temperature zone. In the next cycle, the temperature increase in the high-temperature zone and the temperature decrease in the low-temperature zone are consistent. When confirming the operating limits, the following two scenarios apply:
[0065] (a) The product malfunctions during the high-temperature zone of one of the cycles:
[0066] Keep the temperature constant while reducing the vibration value by one amplitude. Test the new product after replacement. If the product still fails to work properly, it indicates that the temperature is the high temperature damage limit. If the product works properly, it indicates that the vibration value at which the product fails to work properly is the vibration damage limit.
[0067] (ii) The product malfunctions during the low-temperature zone of one of the cycles:
[0068] Keep the temperature constant while reducing the vibration value by one amplitude. Test the new product after replacement. If the product still fails to work properly, it indicates that the temperature is the low-temperature damage limit; if the product works properly, it indicates that the vibration value at which the product fails to work properly is the vibration damage limit.
[0069] In scenario (i), if the high-temperature damage limit is determined first, then in the next cycle, only low-temperature stress and vibration stress tests are performed. The temperature value is continued to decrease while the vibration value is increased simultaneously to test the replaced new product until the product fails to function properly. The temperature is then kept constant while the vibration value is decreased by one amplitude to test another replaced new product. If the product still fails to function properly, it indicates that the temperature is the low-temperature damage limit. At room temperature, the vibration value is increased to test another new product until the product fails to function properly, indicating that the vibration value is the vibration damage limit. If the product functions properly, it indicates that the vibration value at which the product fails to function properly is the vibration damage limit. The vibration setting is turned off, and the temperature value is continued to decrease to test another new product until the product fails to function properly, indicating that the temperature value is the low-temperature damage limit.
[0070] The process of finding the product's failure limits is similar to the method and process of finding the product's operational limits. Both involve combining temperature and vibration tests simultaneously and directly performing composite stress tests. Temperature and vibration stress are gradually increased until the product fails or malfunctions. This is a rapid limit discovery process that saves testing time, and will not be elaborated on here.
[0071] During the operation limit and destruction limit testing process, once the product reaches the destruction limit, the surface product can no longer function normally, and subsequent normal testing requirements will require replacing the sample for testing.
[0072] The following example illustrates how to find the high-temperature operating limit, low-temperature operating limit, and vibration operating limit at once.
[0073] Temperature: Set the initial temperature to 20℃. After the temperature stabilizes, maintain it for at least 10 minutes (generally based on the completion time of the functional test). Gradually increase the temperature in 10℃ increments. Vibration: Set the initial vibration to 5Grms. Maintain the vibration for 20 minutes. Gradually increase the vibration in 5Grms increments. Repeat this process until the product fails or malfunctions for the first time. At this point, you can begin to confirm the operating limits.
[0074] like Figure 1 As shown, assuming the test conditions for product malfunction are a high temperature setting of 80°C and a vibration setting of 35 Grms, the vibration setting can be turned off; if the high temperature setting of 80°C is retained, and the product malfunction still exists, it means the malfunction is not caused by vibration stress, and the focus can be on temperature. The high temperature setting can be reduced by 10°C to 70°C, and the product malfunction can be observed to see if it can be recovered. If it can be recovered, since 80°C will cause product malfunction, it is determined that the high temperature operating limit has been reached, and the high temperature operating limit is recorded as 80°C.
[0075] Once the high-temperature operating limit of the product is identified, the high-temperature test condition needs to be turned off, and the temperature set to 20°C. Continue to identify the operating limits of other test conditions until all operating limits are met.
[0076] like Figure 2 As shown, assuming the test conditions for product malfunction are a low temperature setting of -60℃ and a vibration setting of 35 Grms, the vibration setting can be turned off; if the product malfunction still exists under these conditions, it means the malfunction is not caused by vibration stress, and the focus can be placed on temperature. The low temperature setting can be reduced by 10℃ to -50℃, and the product malfunction can be observed to see if it recovers. If it does recover, and -60℃ causes product malfunction, then the low temperature operating limit has been reached, and this low temperature operating limit is recorded as -60℃.
[0077] After identifying the product's low-temperature operating limits, the low-temperature test conditions need to be turned off, the temperature set to 20°C, and the vibration operating limits need to be identified.
[0078] like Figure 3 As shown, the temperature setting can be turned off at this time; the temperature is set to 20℃; focus on the vibration, and set the vibration to 40Grms. Assuming that the product function malfunctions at this time, reduce the vibration setting by 5Grms, and set the vibration to 35Grms. Observe whether the product function malfunction can be recovered. If it can be recovered, 40Grms will cause the product function malfunction. It is determined that the vibration operation limit has been reached, and the vibration operation limit is recorded as 40Grms.
[0079] The testing methods for the destructive limits are similar to those for the operational limits. The results of the accelerated life test of this invention identify the product's: high temperature operational limits and destructive limits, low temperature operational limits and destructive limits, and vibration operational limits and destructive limits.
[0080] Design of a rapid accelerated life test method: Using a continuous composite stress test condition, a single test condition can simultaneously test the product's ability to withstand three stresses: high temperature, low temperature, and vibration, and obtain the test results.
[0081] At this point, the product has already undergone at least five rapid temperature change cycle tests (according to the formula for the excitation intensity of temperature cycle, five cycles are enough to reach 100% excitation intensity); the combined stress of vibration and temperature is the best combination for exciting product defects, making the test results more significant and increasing the test speed.
[0082] This method for rapidly completing high-accelerated life testing reduces the time required to determine a product's operational limits from three to six hours to three to six hours, saving significant amounts of liquid nitrogen consumption and overall time and cost. The test plan design first identifies the product's operational limits, then its basic failure limit. After identifying the operational limits, the product can continue testing because it has not yet failed when its operational limits are found; when the stress decreases or is removed, the product can resume normal output.
[0083] In summary, the rapid testing method for high-accelerated life testing provided by this invention combines temperature and vibration testing at the beginning and performs composite stress testing directly. It gradually increases temperature and vibration stress until the product fails or malfunctions, which is a process of limit discovery and saves testing time. At the same time, the composite stress of vibration and temperature is the best combination to induce product defects, making the test results more significant and improving the testing speed.
[0084] The foregoing has shown and described the basic principles, main features, and advantages of the present invention. Those skilled in the art should understand that the present invention is not limited to the above embodiments. The embodiments and descriptions in the specification are merely illustrative of the principles of the invention. Various changes and modifications can be made to the invention without departing from its spirit and scope, and all such changes and modifications fall within the scope of the present invention as claimed. The scope of protection of this invention is defined by the appended claims and their equivalents.
Claims
1. A rapid test method for high acceleration life testing, characterized by: First, find the operating limit of the product, and then find the destruction limit of the product, wherein (S1) find the operating limit of the product: Meanwhile, the temperature and vibration test is carried out on the product, and the temperature and vibration conditions are applied to the product in a continuously changing fixed increment manner to continuously change the temperature and vibration stress until the product fails, and the operating limit is confirmed, and the high-temperature operating limit, the low-temperature operating limit and the vibration operating limit are determined; (S2) find the destruction limit of the product: The high-temperature operating limit, the low-temperature operating limit and the vibration operating limit obtained in (S1) are used as the initial setting value, and the temperature and vibration conditions are applied to the product in a continuously changing fixed increment manner to continuously change the temperature and vibration stress until the product cannot work normally, and the destruction limit is confirmed, and the high-temperature destruction limit, the low-temperature destruction limit and the vibration destruction limit are determined; In step (S1), when the temperature and vibration conditions are applied to the product in a continuously changing fixed increment manner to continuously change the temperature and vibration stress, in the same cycle, one half cycle is a continuous high-temperature zone, and the other half cycle is a continuous low-temperature zone, and in the next cycle, the temperature increment of the high-temperature zone and the temperature decrement of the low-temperature zone are consistent, and the operating limit is confirmed, which is divided into the following two cases: (I) the product function failure occurs in the high-temperature zone of one cycle: (a) after the vibration setting is closed, the high-temperature temperature value in the cycle is maintained, at this time, if the product function failure still exists, it means that the product function failure is caused by high-temperature stress, the temperature value is reduced by one amplitude, and it is observed whether the product function failure is recovered, if recovered, it means that the temperature value causing the function failure is the high-temperature operating limit value of the product, if not recovered, it means that the high-temperature operating limit value and the high-temperature destruction limit of the product are both the temperature value causing the function failure; (b) after the vibration setting is closed, the high-temperature temperature value in the cycle is maintained, at this time, if the product function failure disappears, it means that the product function failure is caused by vibration stress, the temperature value is set to normal temperature, and the vibration value is reduced by one amplitude, and it is observed whether the product function failure is recovered, if recovered, it means that the vibration value causing the function failure is the vibration operating limit value of the product, if not recovered, it means that the vibration operating limit value and the vibration destruction limit of the product are both the vibration value causing the function failure; (II) the product function failure occurs in the low-temperature zone of one cycle: (i) after the vibration setting is closed, the low-temperature temperature value in the cycle is maintained, at this time, if the product function failure still exists, it means that the product function failure is caused by low-temperature stress, the temperature value is increased by one amplitude, and it is observed whether the product function failure is recovered, if recovered, it means that the temperature value causing the function failure is the low-temperature operating limit value of the product, if not recovered, it means that the low-temperature operating limit value and the low-temperature destruction limit of the product are both the temperature value causing the function failure; (ii) After the vibration is set off, the low temperature value in the cycle is kept, and if the product function failure disappears, it means that the product function failure is caused by vibration stress, the temperature value is set to normal temperature, the vibration value is reduced by one amplitude, and whether the product function failure is recovered is observed, if recovered, it means that the vibration value causing the function failure is the vibration operation limit value of the product, if not recovered, it means that the vibration operation limit value and the vibration damage limit of the product are both the vibration value causing the function failure.
2. The method of claim 1, wherein: If the vibration operation limit is found in case (I) or case (II), the vibration is set off, and the product is continuously subjected to temperature stress in a continuously changing manner with a fixed amplitude until the product function failure appears: If the product function failure appears in the high temperature zone of the cycle at this time, the temperature value is reduced by one amplitude, and whether the product function failure is recovered is observed, if recovered, it means that the temperature value causing the function failure is the high temperature operation limit value of the product, if not recovered, it means that the high temperature operation limit value and the high temperature damage limit of the product are both the temperature value causing the function failure; in the next cycle, only low temperature stress is carried out to continue to reduce the temperature value until the product function failure appears, the temperature value is increased by one amplitude, and whether the product function failure is recovered is observed, if recovered, it means that the temperature value causing the function failure is the low temperature operation limit value of the product, if not recovered, it means that the low temperature operation limit value and the low temperature damage limit of the product are both the temperature value causing the function failure; If the product function failure appears in the low temperature zone of the cycle at this time, the temperature value is increased by one amplitude, and whether the product function failure is recovered is observed, if recovered, it means that the temperature value causing the function failure is the low temperature operation limit value of the product, if not recovered, it means that the low temperature operation limit value and the low temperature damage limit of the product are both the temperature value causing the function failure; in the next cycle, only high temperature stress is carried out to continue to increase the temperature value until the product function failure appears, the temperature value is reduced by one amplitude, and whether the product function failure is recovered is observed, if recovered, it means that the temperature value causing the function failure is the high temperature operation limit value of the product, if not recovered, it means that the high temperature operation limit value and the high temperature damage limit of the product are both the temperature value causing the function failure.
3. The method of claim 2, wherein the method is a rapid test method for high- stress accelerated life testing. In the case (a), after confirming the high temperature operation limit, only low temperature stress and vibration stress test is carried out in the next cycle, the temperature value is continuously decreased and the vibration value is simultaneously increased until product function failure occurs, the vibration is set to off, the temperature value in the cycle is continuously maintained, if the product function failure still exists, it means that the product function failure is caused by low temperature stress, the temperature value is increased by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it means that the temperature value causing the function failure is the low temperature operation limit value of the product, if the product function failure cannot recover, it means that the low temperature operation limit value and the low temperature damage limit of the product are both the temperature value causing the function failure; the temperature value is set to normal temperature, and the vibration value is continuously increased until product function failure occurs, the vibration value is decreased by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it means that the vibration value causing the function failure is the vibration operation limit value of the product, if the product function failure cannot recover, it means that the vibration operation limit value and the vibration damage limit of the product are both the vibration value causing the function failure; After the vibration is set to off, the temperature value in the cycle is continuously maintained, if the product function failure disappears, it means that the product function failure is caused by vibration stress, the temperature value is set to normal temperature, the vibration is set to on and the vibration value is decreased by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it means that the vibration value causing the function failure is the vibration operation limit value of the product, if the product function failure cannot recover, it means that the vibration operation limit value and the vibration damage limit of the product are both the vibration value causing the function failure; after the vibration is set to off, the temperature value is continuously decreased until product function failure occurs, the temperature value is increased by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it means that the temperature value causing the function failure is the low temperature operation limit value of the product, if the product function failure cannot recover, it means that the low temperature operation limit value and the low temperature damage limit of the product are both the temperature value causing the function failure.
4. The method of claim 2, wherein the method is a rapid test method for high- stress accelerated life testing. In the case (i), after confirming the low temperature operation limit, only high temperature stress and vibration stress test is carried out in the next cycle, the temperature value is continuously increased and the vibration value is simultaneously increased until product function failure occurs, the vibration is set to off, the temperature value in the cycle is continuously maintained, if the product function failure still exists, it means that the product function failure is caused by high temperature stress, the temperature value is decreased by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it means that the temperature value causing the function failure is the high temperature operation limit value of the product, if the product function failure cannot recover, it means that the high temperature operation limit value and the high temperature damage limit of the product are both the temperature value causing the function failure, the temperature value is set to normal temperature, the vibration value is continuously increased until product function failure occurs, the vibration value is decreased by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it means that the vibration value causing the function failure is the vibration operation limit value of the product, if the product function failure cannot recover, it means that the vibration operation limit value and the vibration damage limit of the product are both the vibration value causing the function failure; After the vibration setting is closed, the temperature value in the cycle is continuously maintained, if the product function failure disappears, it represents that the product function failure is caused by vibration stress, the temperature value is set as normal temperature, the vibration value is reduced by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it indicates that the vibration value causing the function failure is the vibration operation limit value of the product, if the product function failure cannot recover, it indicates that the vibration operation limit value and the vibration damage limit of the product are both the vibration values causing the function failure; after the vibration setting is closed, the temperature value is continuously increased until the product function failure appears, the temperature value is reduced by one amplitude, and whether the product function failure recovers is observed, if the product function failure recovers, it indicates that the temperature value causing the function failure is the high-temperature operation limit value of the product, if the product function failure cannot recover, it indicates that the high-temperature operation limit value and the high-temperature damage limit of the product are both the temperature values causing the function failure.
5. The method of claim 1, wherein: the high stress level is 0.7 or more. In step (S2), when the temperature and vibration conditions are applied to the product with continuously changing temperature and vibration stress in a fixed amplitude manner, in the same cycle, one half cycle is a continuously high-temperature zone, and one half cycle is a continuously low-temperature zone, in the next cycle, the temperature increase amplitude of the high-temperature zone and the temperature decrease amplitude of the low-temperature zone are consistent, and when the operation limit is confirmed, the following two situations are divided: (1) the product cannot work normally in the high-temperature zone of one cycle: the temperature is kept unchanged, and the vibration value is reduced by one amplitude, the new product is tested, if the product still cannot work normally, it indicates that the temperature is the high-temperature damage limit; if the product can work normally, it indicates that the vibration value when the product cannot work normally is the vibration damage limit; (2) the product cannot work normally in the low-temperature zone of one cycle: the temperature is kept unchanged, and the vibration value is reduced by one amplitude, the new product is tested, if the product still cannot work normally, it indicates that the temperature is the low-temperature damage limit; if the product can work normally, it indicates that the vibration value when the product cannot work normally is the vibration damage limit.
6. The method of claim 5, wherein: In the situation (1), if the high-temperature damage limit is determined first, in the next cycle, only the low-temperature stress and vibration stress test is carried out, the temperature value is continuously reduced and the vibration value is simultaneously increased to test the new product until the product cannot work normally, the temperature is kept unchanged, and the vibration value is reduced by one amplitude to test another new product, if the product still cannot work normally, it indicates that the temperature is the low-temperature damage limit, under the condition of normal temperature, the vibration value is continuously increased to test another new product until the product cannot work normally, which indicates that the vibration value is the vibration damage limit; if the product can work normally, it indicates that the vibration value when the product cannot work normally is the vibration damage limit, the vibration setting is closed, the temperature value is continuously reduced to test another new product until the product cannot work normally, which indicates that the temperature value is the low-temperature damage limit.
Citation Information
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