A method for identifying electronic devices through impedance testing

By performing impedance tests on the pins of electronic devices and generating a data list, it is possible to determine whether the pins are identical or reversed, thus solving the problem of damage caused by incorrect insertion of electronic devices and enabling correct identification of target devices.

CN115856435BActive Publication Date: 2026-03-06NUCLEAR POWER INSTITUTE OF CHINA
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-12-01
Publication Date
2026-03-06

AI Technical Summary

Technical Problem

In industrial production, because many electronic devices use the same termination interface, it is difficult to avoid incorrect insertion through physical means, which can lead to damage to other electronic devices during testing.

Method used

By performing impedance tests on the pins of various electronic devices, a data list is generated to determine whether the pins are the same or reversed. A set of pin numbers that can be identified as reversed is obtained, the pin sets are distinguished, and the impedance values ​​of the target electronic device are compared to determine whether they are consistent.

Benefits of technology

This effectively avoids damage to electronic devices and test anomalies, ensuring the correct identification of the target electronic device.

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Abstract

This invention relates to the field of electronic device testing technology, specifically to a method for identifying electronic devices through impedance testing, comprising the following steps: performing impedance testing on all pins of each electronic device; arranging the measured impedance data horizontally and vertically to obtain a data list; determining whether the electronic device is plugged in backwards based on whether all impedances of a single electronic device are the same according to the data list; obtaining a set of pin numbers for a single electronic device that can be identified as being plugged in backwards based on the determination result; obtaining a list of pin numbers for all electronic devices that can be identified as being plugged in backwards based on the determination result; determining whether the electronic devices are the same based on whether the impedances are equal according to the pin number list, and obtaining a distinguishing pin set that can identify the device category; comparing the impedance values ​​corresponding to each pin in the distinguishing pin set with the impedance value of the target electronic device to determine whether the currently connected electronic device is the target electronic device.
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Description

Technical Field

[0001] This invention relates to the field of electronic equipment testing technology, and more specifically to a method for identifying electronic equipment through impedance testing. Background Technology

[0002] In industrial production, due to standardization and modular design requirements, there are often multiple electronic devices using the same termination interface, and all of these devices are tested using the same testing equipment. During testing, there are situations where the intended target electronic device is used, but the actual device being tested is a different type. Because the device under test needs to interface with multiple electronic devices, it is difficult to prevent incorrect insertion using physical means such as anti-misalignment pins. Even with physical anti-misalignment structures, human error in selecting the wrong device under test cannot be completely prevented. Therefore, testing under incorrect connection conditions can easily damage the other type of electronic device. Summary of the Invention

[0003] To address the technical problem that testing an electronic device under test with incorrect connections can easily damage other types of electronic devices, this invention provides a method for identifying electronic devices through impedance testing. By testing the impedance between different ports of the electronic device, it can be determined whether the electronic device under test and the target electronic device are consistent, thus avoiding damage to the electronic device and test abnormalities.

[0004] This invention is achieved through the following technical solution:

[0005] This invention provides a method for identifying electronic devices through impedance testing, comprising the following steps:

[0006] S10. Perform impedance testing on all pins of each electronic device;

[0007] S20. Arrange the measured impedance data horizontally and vertically to obtain a data list;

[0008] S30. Based on the data list, determine whether all impedances of a single electronic device are the same, and whether the electronic device is plugged in backwards.

[0009] S40. Based on the judgment result of step S30, obtain the set of pin numbers that a single electronic device can determine are reversed.

[0010] S50. Repeat steps S30 and S40 to obtain a list of pin numbers for all electronic devices that can be identified as reversed.

[0011] S60. Based on the pin number list, determine whether there are cases where the impedances are equal, and whether the electronic devices are the same.

[0012] S70. Based on the judgment result of step S60, obtain the distinguishing pin sequence set that can determine the device category;

[0013] S80. Based on the impedance value corresponding to each pin in the distinguishing pin sequence set, compare it with the impedance value of the target electronic device to determine whether the currently connected electronic device is the target electronic device.

[0014] The present invention provides a method for identifying electronic devices through impedance testing. First, impedance tests are performed on all pins of each electronic device, and the measured impedance data are arranged horizontally and vertically to obtain a data list. Based on whether all impedances of a single electronic device in the data list are the same, it is determined whether the electronic device is plugged in backwards, thus obtaining a set of pin numbers for a single electronic device that can be identified as reversed. This process is repeated to obtain a list of pin numbers for all electronic devices that can be identified as reversed. Then, based on whether the impedances in the pin number list are equal, it is determined whether the electronic devices are the same, and a distinguishing pin set for identifying device types is obtained. Finally, the impedance values ​​corresponding to each pin in the distinguishing pin set are compared with the impedance value of the target electronic device to determine whether the currently connected electronic device is the target electronic device.

[0015] Therefore, the present invention can determine whether the tested electronic device and the target electronic device are consistent, thus avoiding damage to the electronic device and test abnormalities.

[0016] Specifically, in step S30, if the pin impedances of a single electronic device do not have the same value, then the pins are reselected for impedance testing.

[0017] Specifically, in step S30, the criterion for determining that the two impedance values ​​are the same is that the absolute value of the difference between the two impedance values ​​is less than or equal to 30000Ω.

[0018] Specifically, in step S60, the criterion for determining that the two impedance values ​​are equal is that the absolute value of the difference between the two impedance values ​​is less than or equal to 30000Ω.

[0019] Specifically, in step S60, if there is no equal impedance in the pin number list, the pin is re-determined until all pins are traversed.

[0020] Specifically, in step S60, if there is still no equal impedance after traversing the pin number list, then jump to step S10 and reselect the pin for impedance testing.

[0021] Specifically, in step S80, it is determined whether the currently connected electronic device is the target electronic device based on whether the impedance value corresponding to each pin in the distinguishing pin sequence set is equal to the impedance value of the target electronic device.

[0022] Specifically, in step S80, the criterion for determining whether the impedance value corresponding to each pin in the distinguishing pin sequence set is equal to the impedance value of the target electronic device is that the absolute value of the difference between the two impedance values ​​is less than or equal to 5000Ω.

[0023] Specifically, the number of pins involved in the test for a single electronic device is 10.

[0024] Specifically, the number of electronic devices involved in the impedance test is 8.

[0025] The present invention has the following advantages and beneficial effects:

[0026] The present invention provides a method for identifying electronic devices through impedance testing. First, impedance tests are performed on all pins of each electronic device, and the measured impedance data are arranged horizontally and vertically to obtain a data list. Based on whether all impedances of a single electronic device in the data list are the same, it is determined whether the electronic device is plugged in backwards, thus obtaining a set of pin numbers for a single electronic device that can be identified as reversed. This process is repeated to obtain a list of pin numbers for all electronic devices that can be identified as reversed. Then, based on whether the impedances in the pin number list are equal, it is determined whether the electronic devices are the same, and a distinguishing pin set for identifying device types is obtained. Finally, the impedance values ​​corresponding to each pin in the distinguishing pin set are compared with the impedance value of the target electronic device to determine whether the currently connected electronic device is the target electronic device. Therefore, it is possible to determine whether the tested electronic device and the target electronic device are consistent, avoiding damage to electronic devices and test anomalies. Attached Figure Description

[0027] The accompanying drawings, which are included to provide a further understanding of the embodiments of the present invention and form part of this application, are not intended to limit the embodiments of the present invention.

[0028] In the attached diagram:

[0029] Figure 1 This is a flowchart illustrating the method for identifying electronic devices through impedance testing according to an embodiment of the present invention.

[0030] Figure 2 This is a schematic diagram of an electronic device port connected via a gold finger in an embodiment of the present invention.

[0031] exist Figure 2 In this system, the ports of electronic devices consist of two sides, front and back, with symmetry between the top and bottom. Detailed Implementation

[0032] To make the objectives, technical solutions, and advantages of the present invention clearer, the present invention will be further described in detail below with reference to the embodiments and accompanying drawings. The illustrative embodiments and descriptions of the present invention are only used to explain the present invention and are not intended to limit the present invention.

[0033] It should be noted that in existing technologies, because the device under test needs to be connected to multiple electronic devices, it is difficult to prevent incorrect insertion through physical means such as anti-misalignment pins. Moreover, even if a physical anti-misalignment structure is used to prevent incorrect insertion, it is still impossible to avoid human error in selecting the correct electronic device under test. Conducting tests under incorrect connection conditions can easily damage other types of electronic devices.

[0034] In view of this, this embodiment provides a method for identifying electronic devices through impedance testing. By testing the impedance between different ports of the electronic device, it determines whether the electronic device under test and the target electronic device are consistent, thus avoiding damage to the electronic device and test abnormalities. The specific details are as follows:

[0035] Example

[0036] Combination Figure 1 This embodiment provides a method for identifying electronic devices through impedance testing, including the following steps:

[0037] S10. Perform impedance testing on all pins of each electronic device.

[0038] Specifically, in this embodiment, impedance testing is performed on all electronic devices with identical interfaces. Combined with... Figure 2 In this embodiment, the electronic device interface is in the form of a gold finger, which has two sides and is symmetrical from top to bottom.

[0039] S20. Arrange the measured impedance data horizontally and vertically to obtain a data list.

[0040] In other words, in this embodiment, the measured values ​​of the pin impedance between the front and back sides of the interface pins of each device are summarized in a data list, as shown in Table 1:

[0041] pin Equipment 1 Equipment 2 Equipment 3 Equipment 4 Equipment 5 Equipment 6 Equipment 7 Equipment 8 A1B1 99999 50000 99999 99999 99999 99999 99999 99999 A2B2 0 50000 0 0 0 0 0 0 A3B3 0 50000 0 0 0 0 0 0 A4B4 99999 0 0 99999 99999 99999 99999 0 A5B5 99999 99999 99999 0 99999 0 99999 99999 A6B6 99999 99999 0 99999 99999 99999 99999 0 A7B7 0 99999 99999 0 0 99999 99999 99999 A8B8 99999 99999 99999 99999 99999 99999 99999 0 A9B9 99999 99999 0 0 99999 99999 99999 0 A10B10 99999 99999 99999 0 99999 99999 0 99999

[0042] Table 1

[0043] In Table 1, the unit for each impedance is ohms (Ω).

[0044] In this specific embodiment, the number of electronic devices participating in the impedance test is 8, and the number of test pins for each electronic device is 10.

[0045] Therefore, the list above can be viewed as an m x n matrix A. m×n , where m = 10 and n = 8.

[0046] S30. Based on the data list, determine whether all impedances of a single electronic device are the same, and whether the electronic device is plugged in backwards.

[0047] Understandably, for each individual electronic device, the first priority is to ensure that the top and bottom are not reversed. That is, to select 'a' from matrix A... ij ≠a (m-i+1)j The data (i = 1, 2, 3…10, j = 1, 2, 3…8) is used to determine whether the device is plugged in backwards. Here, i is the pin number of a single interface, and j is the electronic device number participating in the impedance test.

[0048] If the pin impedances of a single electronic device do not have the same value, then a different pin is selected for impedance testing. That is, if none of the data satisfies condition a, then... ij If so, you need to jump to step S10, reselect the pins, and test the impedance between the pins. At the same time, obtain a new data list (the current selection is the impedance between A1B1..., and the reselected impedance can be the impedance between A2B1...).

[0049] According to Table 1, taking electronic device 2 as an example, at this time, j = 2, we have a 12 ≠a (10)2 a 22 ≠a (9)2 a 32 ≠a (8)2 a 42 ≠a (7)2 To ensure accurate identification, a ij ≠a (m-i+1)j The range of (i = 1, 2, 3…m, j = 1, 2, 3…n) can be expanded according to the actual situation. For example, the two impedances are considered unequal only if the difference exceeds 30,000Ω. In other words, the criterion for judging that the two impedance values ​​are the same is: the absolute value of the difference between the two impedance values ​​is less than or equal to 30,000Ω.

[0050] It should be noted that the criterion for judging that two impedance values ​​are the same should be determined based on the measured value, which is usually within ±20% of the measured value, but can also be extended to within ±50% of the measured value.

[0051] S40. Based on the judgment result of step S30, the set of pin numbers that a single electronic device can determine are reversed is obtained.

[0052] It should be noted that, in order to ensure that device 2 is inserted correctly, at least one of the test pins must be selected for testing. For device 2, the possible values ​​for test pin i are 1, 2, 3, and 4.

[0053] S50. Repeat steps S30 and S40 to obtain a list of pin numbers for all electronic devices that can be identified as reversed.

[0054] In other words, by performing steps S30 and S40 for each device, the possible values ​​of the test pin i for each device can be obtained, and the data obtained is shown in Table 2:

[0055]

[0056]

[0057] Table 2

[0058] Table 2 shows that pin 3 of each electronic device interface appears 7 times, making it the most frequently occurring pin. Furthermore, checking pin 3 ensures that electronic devices 1 through 7 are not inserted incorrectly. For electronic device 8, pin 4 or 5 can be selected. Additionally, by comparison, selecting pin 5 can further distinguish electronic devices 4 and 6.

[0059] S60. Based on the pin number list, determine whether there are cases where the impedances are equal, and whether the electronic devices are the same.

[0060] Specifically, in order to distinguish the eight different devices, it must be ensured that in the new matrix formed by the selected test pins, at least one pin 'a' exists in the same row 'i'. ij ≠a ik (i = 1, 2, 3…m, j ≠ k, j = 1, 2, 3…n, k = 1, 2, 3…n) To ensure accuracy, the criterion for inequality can be amplified based on the actual situation. For example, only when the difference between the two impedances exceeds 30,000 Ω is it considered unequal. That is, the criterion for judging the equality of the two impedance values ​​here is: the absolute value of the difference between the two impedance values ​​is less than or equal to 30,000 Ω.

[0061] If a distinct value of 'a' is found, the devices corresponding to those values ​​can be removed (e.g., in Table 1, if the 'a' value for pin 3 is different only for device 2, then device 2 can be removed). If no 'a' value satisfies the condition after iterating through all data... ij If so, then different i values ​​are selected again and the process is repeated until all i values ​​are traversed.

[0062] If none of the data satisfies condition 'a' after iterating through all the data... ij If the problem persists, you need to go back to step one, reselect the impedance between the pins for testing, and regenerate the impedance. Figure 1 The corresponding table (the current selection is the impedance between A1B1..., and the reselection can be the impedance between A2B1...).

[0063] In other words, if there is no matching impedance in the pin number list, the pin is re-selected until all pins have been traversed. If there is still no matching impedance after traversing the pin number list, the process jumps to step S10 and a new pin is selected for impedance testing.

[0064] S70. Based on the judgment result of step S60, a set of distinguishing pins that can determine the device category is obtained.

[0065] Specifically, the obtained distinguishing pin sequence set is shown in Table 2. According to Table 2, it can be seen that in this embodiment, pins 3, 5, 7, and 8 are sufficient to completely distinguish each device.

[0066] S80. Based on the impedance value corresponding to each pin in the distinguishing pin sequence set, compare it with the impedance value of the target electronic device to determine whether the currently connected electronic device is the target electronic device.

[0067] Specifically, it is determined whether the currently connected electronic device is the target electronic device by comparing the impedance values ​​of each pin in the distinguishing pin sequence set with the impedance value of the target electronic device.

[0068] In this embodiment, the impedance values ​​corresponding to each pin in the pin sequence set are distinguished as shown in Figure 3:

[0069] pin Equipment 1 Equipment 2 Equipment 3 Equipment 4 Equipment 5 Equipment 6 Equipment 7 Equipment 8 A3B3 0 50000 0 0 0 0 0 0 A5B5 99999 99999 99999 0 99999 0 99999 99999 A7B7 0 99999 99999 0 0 99999 99999 99999 A8B8 99999 99999 99999 99999 99999 99999 99999 0

[0070] Table 3

[0071] In Table 3, the unit for each impedance is ohms (Ω).

[0072] In practice, measured data may differ from the expected resistance values ​​in Table 3. A difference of less than 5000Ω is considered equal. Specifically, the criterion for determining whether the impedance value corresponding to each pin in the pin sequence set is equal to the impedance value of the target electronic device is that the absolute value of the difference between the two impedance values ​​is less than or equal to 5000Ω.

[0073] Similarly, the criterion for judging whether two impedance values ​​are equal should be determined based on the measured values, which are usually within ±20% of the measured values.

[0074] In summary, the method for identifying electronic devices through impedance testing provided in this embodiment first performs impedance testing on all pins of each electronic device and arranges the measured impedance data horizontally and vertically to obtain a data list. Based on whether all impedances of a single electronic device in the data list are the same, it is determined whether the electronic device is plugged in backwards, thus obtaining a set of pin numbers for a single electronic device that can be identified as reversed. This process is repeated to obtain a list of pin numbers for all electronic devices that can be identified as reversed. Then, based on whether the impedances in the pin number list are equal, it is determined whether the electronic devices are the same, and a distinguishing pin set for identifying device types is obtained. Finally, the impedance values ​​corresponding to each pin in the distinguishing pin set are compared with the impedance value of the target electronic device to determine whether the currently connected electronic device is the target electronic device.

[0075] Therefore, this embodiment can determine whether the tested electronic device and the target electronic device are consistent, thus avoiding situations such as damage to the electronic device and test abnormalities.

[0076] It should be noted that the pin types, number of pins, and number of electronic devices listed in this embodiment are for ease of understanding of the technical solution provided in this embodiment. In actual use, the pin types, number of pins, and number of electronic devices will all be different. When dealing with different types, numbers of pins, or numbers of electronic devices, simply replace the specific numbers in this embodiment.

[0077] The specific embodiments described above further illustrate the purpose, technical solution, and beneficial effects of the present invention. It should be understood that the above description is only a specific embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A method of identifying an electronic device by impedance testing, the method comprising: The method comprises the following steps: S10, impedance test is performed on all pins of each electronic device; S20, the measured impedance data is arranged horizontally and vertically to obtain a data list; S30, according to the data list, whether all the impedances of the single electronic device are the same, to determine whether the electronic device is inserted reversely, the method for determining whether the electronic device is inserted reversely is to select a ij ≠a (m-i+1)j in the matrix A, and the data is used to determine whether the device is inserted reversely, wherein i is the pin number of a single interface, i=1, 2, 3…10, j is the number of the electronic device participating in the impedance test, j=1, 2, 3…8, a ij is the impedance value of the i pin of the j device, a (m-i+1)j is the impedance value of the m-i+1 pin of the j device, if all the data do not meet the condition a ij , then jump to step S10, select the pin again, and test the impedance between the pins; S40, according to the judgment result of step S30, a pin number set capable of judging reverse connection of a single electronic device is obtained; S50, steps S30 and S40 are repeated to obtain a pin number list capable of judging reverse connection of all electronic devices; S60, according to whether the impedances in the pin number list are equal, it is judged whether the electronic devices are the same; S70, according to the judgment result of step S60, a distinguishing pin number set capable of judging the type of the electronic device is obtained; S80, according to the comparison between the impedance values corresponding to the pins in the distinguishing pin number set and the impedance value of a target electronic device, it is judged whether the currently connected electronic device is the target electronic device.

2. The method of identifying an electronic device by impedance testing of claim 1, wherein, In step S30, if the pin impedances of a single electronic device do not have the same value, the pins are reselected for impedance test.

3. The method of identifying an electronic device by impedance testing of claim 1, wherein, In step S30, the judgment basis for the two impedance values being the same is that the absolute value of the difference between the two impedance values is less than or equal to 30,000 Ω.

4. The method of identifying an electronic device by impedance testing of claim 1, wherein, In step S60, the judgment basis for the two impedance values being the same is that the absolute value of the difference between the two impedance values is less than or equal to 30,000 Ω.

5. The method of identifying an electronic device by impedance testing of claim 4, wherein, In step S60, if there is no equal impedance in the pin number list, the pins are reselected until all pins are traversed.

6. The method of identifying an electronic device by impedance testing of claim 5, wherein, In step S60, if there is still no equal impedance after traversing the pin number list, step S10 is jumped to and the pins are reselected for impedance test.

7. The method of identifying an electronic device by impedance testing of claim 1, wherein, In step S80, according to whether the impedance values corresponding to the pins in the distinguishing pin number set are equal to the impedance value of a target electronic device, it is judged whether the currently connected electronic device is the target electronic device.

8. The method of identifying an electronic device by impedance testing of claim 7, wherein, In step S80, the judgment basis for the impedance values corresponding to the pins in the distinguishing pin number set being equal to the impedance value of a target electronic device is that the absolute value of the difference between the two impedance values is less than or equal to 5,000 Ω.

9. The method of identifying an electronic device by impedance testing according to any one of claims 1 to 8, wherein, The number of pins of a single electronic device participating in the test is 10.

10. The method of identifying an electronic device by impedance testing of claim 9, wherein, The number of electronic devices participating in the impedance test is 8.

Citation Information

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