Socket guide for electronic component testing

Abstract

The present invention relates to a socket guide for electronic component testing. The socket guide according to the present invention has an elastic support body that maintains the posture of an electronic component by supporting both ends of the electronic component inserted into a test slit. According to the present invention, since a large electronic component such as a solid state drive can be accurately connected with a tester, it is possible to improve the reliability of the electrical contact formed between the electronic component and the tester.

Description

TECHNICAL FIELD

[0001] The present application relates to a socket guide for electronic component testing that precisely guides movement of an electronic component when the electronic component is inserted into a test slot. BACKGROUND

[0002] Electronic components (e.g., SSDs, circuit boards, semiconductor elements, etc.) produced are tested by a tester and classified into good products and defective products, and only the good products are shipped.

[0003] An electronic component can be tested only when it is electrically connected to a tester, and at this time, a device that supports the electronic component so that it can be tested by electrically connecting the electronic component to the tester is a handler (hereinafter, simply referred to as a "handler") for electronic component testing.

[0004] Conventionally, relatively large electronic components such as solid state drives (SSDs) are supported for testing in a manner that an operator directly connects or disconnects them from a tester. However, as the demand for solid state drives has exploded, the present applicant has developed and proposed a handler for automatically handling solid state drives so that they are electrically connected or disconnected from a tester.

[0005] An electronic component such as a solid state drive can have a terminal formed on one surface of one side thereof to be inserted into a test socket (hereinafter, referred to as a "test slot") in a slot shape, so as to be electrically connected to a tester. At this time, a socket guide precisely guides movement of the electronic component in a process of inserting the electronic component into the test slot. In addition, the insertion guide can also function to support the electronic component inserted into the test slot.

[0006] However, the specifications of electronic components such as solid state drives are continuously upgraded, and accordingly, as more electronic elements are additionally provided in a manner of high integration and high density, the weight of large electronic components tends to gradually increase.

[0007] In addition, although the socket guide supports the electronic component, it should guide that the electronic component can move. And, this means that the socket guide cannot take a structure of stably supporting the electronic component by being firmly attached to both ends of the electronic component. Therefore, the proper posture of the electronic component is currently maintained by the holding force of the electronic component in a state of being inserted into the test slot.

[0008] Generally, as Figure 22As shown in the reference diagram, in a state in which the electronic component ED is inserted into the test slit S, only a part of the rear end is supported by the tester, and the remaining part is provided with an electronic element EE that increases the weight of the electronic component. Therefore, as described above, since the weight of the electronic component ED gradually increases, it is expected that in the near future, the time will come when the electronic component ED cannot maintain an appropriate posture in a state of being inserted into the test slit S due to an operation impact or a load, etc. If the electronic component ED cannot maintain an appropriate posture, a short circuit or a test failure due to poor electrical contact, etc. can occur.

[0009] [Related Art Documents]

[0010] [Patent Documents]

[0011] Korean Patent Laid-Open Publication No. 10-2019-0050483

[0012] Korean Patent Laid-Open Publication No. 10-2019-0061291 SUMMARY

[0013] The present invention has been made to appropriately maintain the posture of a large electronic component electrically connected to a tester in a structure inserted into a test slit.

[0014] The socket guide for electronic component testing according to the present invention can include a pair of guide bodies equipped to support both ends of an electronic component inserted into an elongated test slit, a part of a contact terminal side of the electronic component being inserted into the test slit, and a pair of elastic support bodies replaceably coupled to the guide bodies and elastically supporting both ends of the electronic component or the electronic component during insertion of a part of the contact terminal side into the test slit to maintain the posture of the electronic component, wherein the pair of guide bodies is equipped on both sides of the test slit in an elongated direction of the test slit, and the pair of elastic support bodies is respectively divided in the pair of guide bodies and detachably provided to the guide bodies.

[0015] In order to guide the movement of the electronic component in the process of being inserted into the test slit, an elongated guide groove is formed in the guide body in the direction of movement of the electronic component, a coupling groove is formed at a position of the guide groove, the elastic support body is a positioning ball plug equipped in a structure inserted into the coupling groove, and the ball of the positioning ball plug is elastically supported by a spring while pressing the electronic component.

[0016] The elastic support includes a coupling portion coupled with the guide body, a guide portion having an elongated guide groove formed in a moving direction of the electronic component for guiding movement of the electronic component during insertion into the test slot, and at least one elastic portion protruding from the coupling portion toward the guide body side to allow the coupling portion and the guide portion to be elastically supported by the guide body, wherein the guide body is formed with a coupling groove into which the coupling portion is inserted to be coupled with the guide body.

[0017] The coupling portion is inserted into and coupled with the coupling groove while moving from the rear to the front.

[0018] The coupling portion, the guide portion, and the elastic portion are formed in one body.

[0019] The elastic support is formed of a synthetic resin material that can be injection molded while allowing elastic deformation and recovery.

[0020] The coupling portion is formed with an insertion groove for insertion of the elastic portion, and the elastic portion is inserted into and coupled with the coupling portion by being inserted into the insertion groove.

[0021] The coupling portion and the guide portion are formed in one body, and the elastic portion is injection molded of a material that can be elastically deformed and recovered and is softer than the coupling portion and the guide portion and is a synthetic resin.

[0022] At least one correction pin is further included to be coupled with the guide body in a manner protruding toward the front, to correct a position of the electronic component supplied through the holder so that a portion of the electronic component on a contact terminal side is accurately inserted into the test slot to be engaged with a correction hole on the holder side, wherein the correction pin is located at a position deviated from a virtual straight line passing through the test slot in an elongated direction of the test slot, and the correction hole is located at a position deviated from a plane including a surface of the electronic component held by the holder.

[0023] It also includes a first and a second alignment pin, which engage with the guide body in a forward-projecting manner to calibrate the position of the electronic component supplied by the grip, so that the contact terminal side portion of the electronic component is precisely inserted into the test slit, thereby engaging with the alignment hole on the grip side. The first and second alignment pins are spaced apart from each other from a position deviating from a virtual straight line of the test slit along its elongated direction. The first alignment pin is used to calibrate the position of the electronic component when it is inserted into the test slit at a 90-degree angle, and the second alignment pin is used to calibrate the position of the electronic component when it is inserted into the test slit at a -90-degree angle. The alignment hole is located at a position deviating from a plane including a surface of the electronic component held by the grip.

[0024] The present invention has the following effects:

[0025] First, when a heavy, large electronic component is inserted into the test slit, the two ends are pressed by elastic supports, which can stably maintain the posture, thus improving the reliability of the electrical connection between the electronic component and the tester.

[0026] Secondly, since the elastic support body, which is made of a different material than the main body of the guide, is equipped in a replaceable manner, when problems such as wear and loss of elasticity occur, only the elastic support body can be replaced, thereby reducing replacement costs and ensuring stability.

[0027] Third, since the calibration pins are divided into two sides based on the virtual center line, they can handle changes in test conditions, changes in the contact sequence between the terminals of the test socket and the terminals of the electronic components, or changes in the insertion direction of the electronic components as required by the tester. Attached Figure Description

[0028] Figure 1 This is a reference diagram used to illustrate the electrical connection structure between electronic components and the tester.

[0029] Figure 2 This is a reference diagram illustrating the placement position of the socket guide according to the present invention.

[0030] Figure 3 It is a schematic plan view of a sorting machine that forms a pair with a tester.

[0031] Figure 4 It is aimed at Figure 3 A schematic 3D view of a sorting machine.

[0032] Figure 5 It is aimed at Figure 3 A schematic plan view of the connection part of the sorting machine.

[0033] Figure 6 is a schematic cross-section of a main part of the connection portion of Figure 5

[0034] Figure 7 is a cross-section of a holder of the connection portion of Figure 5

[0035] Figure 8 is a cross-section of a test hand of the connection portion of Figure 5

[0036] Figure 9 is a cross-section of a holding element of the test hand of Figure 8

[0037] Figure 10 is a cross-section of an opening element of the test hand of Figure 8

[0038] Figure 11 is a cross-section of a connecting element of the test hand of Figure 8

[0039] Figure 12 is a perspective view of a socket guide according to a first embodiment of the present application.

[0040] Figures 13 to 15 are reference diagrams for illustrating a socket guide according to Figure 12

[0041] Figure 16 is a perspective view of a socket guide according to a second embodiment of the present application.

[0042] Figure 17 is a partial exploded perspective view of a feature of the socket guide of Figure 16

[0043] Figure 18 and Figure 19 are reference diagrams for illustrating a socket guide according to Figure 16

[0044] Figure 20 and Figure 21 are reference diagrams for illustrating a modification of a socket guide according to Figure 16

[0045] Figure 22 is a reference diagram for illustrating background art.

[0046] Explanation of reference signs

[0047] ​​​​​​​​​​100, 200: socket guide 110, 210: guide body

[0048] 111: guide groove 112, 212: coupling groove

[0049] 120: positioning ball plug 121: ball

[0050] 122: spring 220: elastic support

[0051] 221: coupling portion 222: guide portion

[0052] 222a: guide groove 223: elastic portion

[0053] 131, 231: first correction pin 132, 232: second correction pin

[0054] 140: coupling member L: virtual straight line DETAILED DESCRIPTION

[0055] With reference to the drawings, a preferred embodiment according to the present application is explained, and explanations for repeated or substantially identical configurations are omitted or compressed as much as possible for the sake of simplicity of explanation.

[0056] <Explanation for electrical connection of electronic component and tester>

[0057] The socket guide 100, 200 according to the present application (refer to Figure 11 and Figure 14 ) is applied to the case where the part of the contact terminal T side of the electronic component ED is inserted into the test slot S of the tester.

[0058] For example, as shown in Figure 1 , the tester TESTER is equipped with the test slot S into which the part of the contact terminal T side of the electronic component ED is inserted so that the electronic component ED is electrically connected with the tester TESTER.

[0059] And, as shown in Figure 2 , the socket guide 100, 200 according to the present application is disposed around the test slot S. Such socket guide 100, 200 guides the movement of the electronic component ED in the process of insertion of the electronic component ED into the test slot S by the handler, and maintains the posture of the electronic component ED during insertion into the test slot S and the electronic component ED which has completed the insertion. In this regard, the following will be explained in detail by each embodiment.

[0060] <Explanatory explanation for overall configuration of handler>

[0061] Figure 3 is an explanatory plan view of the handler which forms a pair with the tester,Figure 4 It is aimed at Figure 3 A schematic 3D diagram of the sorting machine HR.

[0062] The sorting machine HR according to this embodiment includes a stacking part SP, a connecting part CP, and a transfer part TP.

[0063] The stacking section SP houses customer pallets CT containing electronic components ED. This stacking section SP is used to receive customer pallets CT containing electronic components ED to be tested from the outside, or to transport customer pallets CT containing electronic components ED that have completed testing to the outside. Furthermore, the stacking section SP can also be used to store customer pallets CT moved in or out from the outside.

[0064] The connection section CP retrieves the electronic component ED from the customer pallet CT transferred from the stacked component section SP, and electrically connects the electronic component ED to the tester TESTER at the rear, or places the electronic component ED that has completed testing by the tester TESTER on the customer pallet CT according to the test level.

[0065] The transfer section TP transfers customer pallets CT between the stacking section SP and the connecting section CP. That is, customer pallets CT containing electronic components ED to be tested are supplied from the stacking section SP to the connecting section CP via the transfer section TP, and customer pallets CT containing electronic components ED that have completed testing are returned from the connecting section CP to the stacking section SP via the transfer section TP.

[0066] Next, the connection portion CP related to the socket guides 100, 200 according to the present invention will be examined in more detail.

[0067] like Figure 5 Schematic floor plan and Figure 6 As shown in the cutaway view of the main part I, the connecting part CP includes a placer 510, a moving hand 520, an opener 530, a converter 540, a reciprocating mover 550, and a test hand 560.

[0068] The holder 510 is equipped for holding electronic components ED. The electronic components ED can be placed in the holder 510 on their own, or they can be placed in the holder 510 by attaching an adapter AD that can hold the electronic components ED. Figure 7 As shown in the cutaway diagrams (a) and (b), this placer 510 includes a pair of fixing parts 511, a drive source 512, and a pair of transmission elements 513.

[0069] A pair of fixing members 511 can fix or release the electronic component ED by widening or narrowing the interval in the left-right direction. That is, the fixing members 511 move linearly in the left-right direction by the guidance of the guide rail GR, and if the interval between the fixing members 511 is widened, the electronic component ED or the adapter AD in which the electronic component ED is seated is in a state in which it can be placed on or detached from the placer 510, and if the interval between the fixing members 511 is narrowed, the electronic component ED is in a state in which it is fixed to be seated on the placer 510.

[0070] A driving source 512 supplies a driving force for adjusting the interval between the pair of fixing members 511, and in the present embodiment, is equipped as a cylinder.

[0071] A transmission element 513 transmits the driving force applied by the driving source 512 to the pair of fixing members 511. Although the transmission element 513 in the present embodiment takes a rotation while converting the forward and backward force of the driving source 512, which is a cylinder, into the left-right moving force of the fixing members 511 to achieve transmission of the connection structure, various modifications can be made according to the implementation.

[0072] A moving hand 520 places the electronic component ED to be tested on the placer 510 by moving it from the customer tray CT conveyed from the stacker portion SP to the supply position FP by the transfer portion TP or moves the electronic component ED, which is completed testing, placed on the placer 510 to the customer tray CT at the recovery position RP. Such a moving hand 520 holds the electronic component ED in a prone state by vacuum suction, which is implemented to be equipped with a plurality of suction elements and selectively suctioned by one or more suction elements, so that it can be implemented to suction and hold all electronic components ED of various sizes (refer to Korean Application No. 10-2020-0019380).

[0073] An opener 530 is applied in the case of applying an adapter AD in order to place the electronic component ED on the placer 510. Here, the adapter AD is a holder for handling a relatively small electronic component ED having a size that is difficult to place directly on the placer 510, and also functions as a carrier (refer to Korean Application No. 10-2021-0017446). That is, since the opener 530 pushes the operation member of the adapter AD in the first operation area W1 to open the adapter AD, the moving hand 520 can load or unload the electronic component ED in the adapter AD. Such an opener 530 can include a pusher 531 for pushing an operation member for operating the adapter AD to open the adapter AD, and a forward and backward source 532 for making the pusher 531 advance and retreat.

[0074] The converter 540 finally converts the posture of the electronic component ED placed in the placer 510 by rotating the placer 510 by 90 degrees or -90 degrees. That is, the posture of the electronic component ED can be converted from the horizontal to the vertical by the converter 540, or from the vertical to the horizontal. By such a converter 540, the electronic component ED whose posture is converted from the horizontal to the vertical is in a state where the portion thereof on the side of the contact terminal T can be properly inserted into the test slit S, and the electronic component ED whose posture is converted from the vertical to the horizontal is in a state where it can be properly sucked and held by the moving hand 520. Of course, in the case where the electronic component ED is electrically connected to the tester TESTER in the state where it is in the horizontal (for example, in the case where the test slit is formed elongated in the horizontal direction), the converter 540 can not perform its role, or the configuration of the converter 540 can be omitted. Here, the reason why the converter 540 is configured to selectively rotate the placer 510 by 90 degrees or -90 degrees is related to the positions of the connection terminals in the test slit S. That is, if the contact terminal T of the electronic component ED is to be electrically contacted with the connection terminal in the test slit S, it is necessary to face each other, and thus depending on whether the connection terminal in the test slit S is located on the left side or the right side with the electronic component ED inserted as a reference, it is necessary to rotate the contact terminal T of the electronic component ED to face the connection terminal.

[0075] The reciprocating mover 550 moves the placer 510 between a first operation area Wl which is an area where the moving hand 520 operates and a second operation area W2 which is an area where the testing hand 560 operates. Since the placer 510 reciprocates between the first operation area Wl and the second operation area W2 by such a reciprocating mover 550, the first operation area Wl and the second operation area W2 are regionally separated, so that interference between the moving hand 520 and the testing hand 560 can be excluded.

[0076] The testing hand 560, after holding the electronic component ED of the placer 510 placed in the second operation area W2, moves to insert the portion of the electronic component ED on the side of the contact terminal T into the test slit S, and, if the test on the electronic component ED is completed, takes out the electronic component ED from the test slit S, and then places the electronic component ED on which the test is completed in the placer 510 again. Of course, in the case where the adapter AD is applied, the testing hand 560 moves the adapter AD holding the electronic component ED. For this purpose, as shown in a cutaway view of Figure 8 The testing hand 560 includes a holding element 561, horizontal moving elements 562a, 562b, a vertical moving element 563, an opening element 564, and a connecting element 565.

[0077] The holding element 561 is provided in order to hold or release the electronic component ED or the adapter AD, and for this purpose, as shown in a cutaway view of Figure 9As shown in the cutaway diagram, there is a pair of gripping parts 561a-1 and 561a-2 that can grip or release the electronic component ED or the adapter AD by widening or narrowing the gap between them through the driving force of the first driving source 561b.

[0078] The horizontal movement elements 562a and 562b cause the gripping element 561 to move along the left-right and front-back directions, which are horizontal, so that the electronic component ED can move toward the side of the currently empty test slit S in the majority of test slits S.

[0079] The vertical movement element 563 moves the gripping element 561 in the vertical direction, so that the gripping element 561 can grip the electronic component ED or adapter AD in the gripping position, or raise the gripped electronic component ED or adapter AD to the height required for testing, and can also achieve the opposite operation.

[0080] In the case of applying adapter AD, the open element 564 slightly opens the adapter AD to a limit within which the electronic component ED can remain within the adapter AD. For this purpose, as follows: Figure 10 As shown in the cutaway diagram, the opening element 564 has a first pusher 564a that can move forward and backward via the second drive source 564b. Here, the first pusher 564a slightly pushes the operating member of the adapter AD while the holding element 561 is holding the adapter AD, thereby opening the adapter AD and placing the electronic component ED in a state where it can move rearward while still attached to the adapter AD. That is, the opening element 564, equipped on the test hand 560, opens the adapter AD to a degree that allows the electronic component ED to move rearward without detaching from the adapter AD. Therefore, the electronic component ED can move rearward while still supported on the adapter AD.

[0081] like Figure 11 As shown in the cutaway diagram, in the connection element 565, the electronic component ED is pushed rearward by the second pusher 565a, which moves forward and backward by the operation source 565b, so that the portion of the electronic component ED on the contact terminal T side can be inserted into the test slit S. Furthermore, the socket guides 100 and 200 according to the present invention function in the process of inserting the portion of the electronic component ED on the contact terminal T side into the test slit S through the operation of the connection element 565, and in the state of completed insertion.

[0082] For reference, in this embodiment, although the test hand 560 is configured to hold the electronic component ED or adapter AD whose posture is changed from horizontal to vertical by the converter 540, the test hand 560 can also be configured to hold the horizontal electronic component ED or adapter AD depending on the shape of the test slit S.

[0083] <First embodiment of socket guide>

[0084] Figure 12 is a perspective view of a socket guide according to the first embodiment of the present application. The socket guide 100 according to the present embodiment includes a pair of guide bodies 110, a positioning ball 120, a first correction pin 131, a second correction pin 132, and a coupling member 140.

[0085] The pair of guide bodies 110 are equipped to place a test slot S elongated in the up-down direction in the middle and face each other in the up-down direction on both sides of the test slot S, and are identical in configuration. Such a pair of guide bodies 110 are equipped to guide the movement of an electronic component ED inserted into the test slot S, and ultimately serve to support both ends of the electronic component ED.

[0086] The guide body 110 is formed with a long guide groove 111 in the front-rear direction that is the direction of movement of the electronic component ED. The front end portion of the guide groove 111 becomes larger as it goes forward, thereby configured to enable the electronic component ED moving in the rearward direction to be properly inserted into the guide groove 111.

[0087] Also, in the guide body 110, a coupling groove 112 is formed in the up-down direction at a position on the guide groove 111.

[0088] The two positioning balls 120 are configured in a pair and are equipped as elastic support bodies that elastically support both ends of the electronic component ED inserted into the test slot S at the side portions of the contact terminals T to maintain the posture of the electronic component ED. Also, the positioning balls 120 configured in a pair with each other are arranged to be inserted into the coupling groove 112 in the up-down direction in the structure of being divided in the pair of guide bodies 110.

[0089] The first correction pin 131 engages with a correction hole RH (refer to Figure 8 ) on the side of the holder (which can be an adapter or a test hand), thereby making it possible to correct the position of the electronic component ED held by the holder to guide the portion of the contact terminals T side of the electronic component ED to be accurately inserted into the test slot S. As Figure 13 shown in the reference diagram, when a virtual straight line L passing through the center of the test slot S in the up-down direction is drawn, such a first correction pin 131 is arranged at a position deviated to the right side from the virtual straight line L.

[0090] The second correction pin 132 engages with the correction hole RH on the side of the holder, thereby making it possible to correct the position of the electronic component ED held by the holder to guide the portion of the contact terminals T side of the electronic component ED to be accurately inserted into the test slot S. As Figure 13As shown in the reference diagram, this second correction pin 132 places the virtual straight line L midway and symmetrically apart from the first correction pin 131. Of course, the second correction pin 132 is also disposed at a position deviated to the left side from the virtual straight line L.

[0091] Further, in the process of inserting the electronic component ED into the test slit S, the above-mentioned first correction pin 131 and second correction pin 132 are selectively used.

[0092] For example, when the electronic component ED in a lying state is inserted into the test slit S after being erected at 90 degrees, the first correction pin 131 is used for the purpose of correcting the position of the electronic component ED, and when the electronic component ED in a lying state is inserted into the test slit S after being erected at -90 degrees, the second correction pin 132 is used for the purpose of correcting the position of the electronic component ED.

[0093] For reference, in the present specification, by Figure 8 only the case where the correction hole RH is formed in the test hand 560 is exemplified, but the correction hole RH can also be formed in the adapter AD according to the implementation. At this time, regardless of which configuration is selected as the holder, as Figure 14 shown in the conceptual diagram, the correction hole RH is located at a position deviated to one side (in Figure 14 , the lower side) from a plane PS including one surface of the electronic component ED held by the holder, and engages with either the first correction pin 131 or the second correction pin 132, regardless of which configuration is selected as the holder.

[0094] The coupling member 140 fixes the positioning ball plug 120 inserted into the coupling groove 112 to the guide member body 110. Therefore, after the coupling member 140 is disassembled later, the positioning ball plug 120 that has reached the end of its life can be replaced. That is, the positioning ball plug 120 is replaceably coupled to the guide member body 110.

[0095] According to the first embodiment as described above, as shown in the exaggerated and conceptual cross-sectional view of Figure 15 , in a state where the electronic component ED is inserted into the test slit S at a portion on the contact terminal T side, the ball 121 is elastically supported by the spring 122 while pressing both ends TT, DT (refer to Figure 22 ) of the electronic component ED. Accordingly, the electronic component ED receives the pressing force of the ball 121 in addition to the insertion force received in the test slit S, and thus can maintain the state of being inserted into the test slit S in a stable and appropriate posture.

[0096] <Second Embodiment for Socket Guide>

[0097] Figure 16 is a perspective view of a socket guide 200 according to a second embodiment of the present application, Figure 17 is a perspective view of a socket guide 200 according to a second embodiment of the present application,Figure 16 A partial exploded perspective view of the characteristic parts of the socket guide 200.

[0098] According to this embodiment, the socket guide 200 includes a pair of guide bodies 210, an elastic support 220, a first correction pin 231, and a second correction pin 232.

[0099] A pair of guide bodies 210 are configured to place a test slit S that is elongated in the vertical direction in the middle and to face each other on both sides of the test slit S in the vertical direction, and they are identical in configuration. This pair of guide bodies 210 is configured to guide the movement of an electronic component ED inserted into the test slit S and ultimately to support both ends of the electronic component ED. Similar to the first embodiment, the guide bodies 210 have engagement grooves 212 for engagement with the elastic support 220.

[0100] like Figure 18 As shown in the cut-off perspective view (a) and cut-off perspective view (b), the elastic support 220 includes a connecting portion 221, a guiding portion 222, and an elastic portion 223.

[0101] The engaging portion 221 is inserted into the engaging groove 212, thereby engaging with the guide body 210. At this time, the engaging portion 221 moves from rear to front and is inserted into the engaging groove 212, with its rear end protruding downward to form a locking platform J. Therefore, the rear surface of the elastic support 220 is in contact with the front surface of the tester TESTER, and because the locking platform J is in a locked state at the rear end of the guide body 210, the elastic support 220 is fundamentally prevented from moving rearward or forward or disengaging from the engaging groove 212.

[0102] In order to guide the movement of the electronic component ED during the insertion into the test slit S, the guide portion 222 has a guide groove 222a that is elongated along the front-back direction, which is the movement direction of the electronic component ED.

[0103] The elastic portion 223 is formed to protrude from the connecting portion 221 toward the guide body 210, so that the connecting portion 221 and the guide portion 222 can be elastically supported from the guide body 210. For appropriate magnitude and balance of elastic force, preferably, multiple such elastic portions 223 are provided. Of course, as... Figure 18 As shown, the elastic portion 223 can also have The shape can be a letter, but depending on the implementation, it can also be a shorter, protruding shape. In this case, it can also be designed with a rounded end to solve the problem of friction.

[0104] Furthermore, the connecting portion 221, the guiding portion 222, and the elastic portion 223 are formed as a single unit. That is, preferably, the elastic support 220 is formed using a synthetic resin material (e.g., polyetherimide) that can achieve elastic deformation and recovery while being injection moldable.

[0105] Since the first calibration pin 231 and the second calibration pin 232 have the same structure as in the first embodiment, their description will be omitted.

[0106] According to the second embodiment described above, such as Figure 19 As shown in the exaggerated and conceptual cross-sectional view, with the electronic component ED inserted into the test slit S at the contact terminal T side, the contact surface of the guide groove 222a constituting the elastic support 220 is engaged with the two ends TT and DT of the electronic component ED (see reference) by the elastic force of the elastic portion 223. Figure 22 The electronic component ED is pressurized in a close-fitting state. Accordingly, in addition to the insertion force from the test slit S, the electronic component ED is also subjected to the pressure from the elastic support 220, thus enabling it to maintain a stable and appropriate posture when inserted into the test slit S.

[0107] <Modifications to the second embodiment>

[0108] Figure 20 and Figure 21 The above describes a modified example of the second embodiment, and more specifically, a perspective view and an exploded view of a modified example of the elastic support 220.

[0109] According to this modified example, the elastic support 220 is formed integrally from only the connecting portion 221 and the guiding portion 222. At the same time, an insertion groove 221a is formed in the connecting portion 221 for the elastic portion 223 to be inserted.

[0110] The elastic part 223 has an insertion protrusion 223a and four elastic feet 223b-1, 223b-2, 223b-3, and 223b-4, and is injection molded as a single unit.

[0111] The insertion protrusion 223a is inserted into the insertion groove 221a, so that the elastic part 223 can eventually be inserted and engaged with the engagement part 221.

[0112] The four elastic legs 223b-1, 223b-2, 223b-3, and 223b-4 are divided into two and extend forward and backward from the insertion protrusion 223a, respectively. That is, when viewed from the bottom surface, the elastic portion 223 has an "H" shape. Furthermore, the elastic legs 223b-1, 223b-2, 223b-3, and 223b-4 extend in a downwardly inclined manner as they move away from the insertion protrusion 223a, so that their ends contact the bottom surface constituting the engagement groove 212.

[0113] In addition, the coupling portion 221 and the guide portion 222 are preferably formed in one body and formed of a material that is relatively harder than the elastic portion 223, thereby having a hard property that is very slow to be damaged by use. Of course, the coupling portion 221 and the guide portion 222 can also be formed of a synthetic resin material that can be injection molded, but are not limited to this material.

[0114] Further, the elastic portion 223 is formed of a material that is softer than the coupling portion 221 and the guide portion 222 and that can achieve elastic deformation and recovery. For example, the elastic portion 223 can be formed of a thermoplastic polyurethane resin for proper elastic deformation and recovery.

[0115] According to this modification, compared with the second embodiment, only the elastic portion 223 that is easily damaged by continuous elastic deformation can be replaced alone, thereby reducing the replacement cost and having a structure that is closer to environmental protection by saving resources, and thus is more preferable. Of course, in the case where the coupling portion 221 and the guide portion 222 are damaged by long-term use, the elastic support 220 itself can also be replaced, but the replacement period will be longer than the above-described second embodiment.

[0116] In addition, the above-described embodiments describe a structure in which the electronic component ED is moved in the front-rear direction while being inserted into the elongated test slit S in the up-down direction, but the present application is not limited to this structure. For example, the present application can also be applied to a case where the test slit S is elongated in the left-right direction and can be appropriately applied to a structure in which the electronic component ED is moved in the up-down direction while being inserted into the test slit S.

[0117] As described above, the specific description of the present application is described with reference to the embodiments with reference to the accompanying drawings, but the above-described embodiments are described only as preferred examples of the present application, and thus the present application should not be understood as being limited to the described embodiments, and the scope of the rights of the present application should be understood as the claims and the equivalent scope thereof.

Claims

1. A socket guide for testing electronic components, disposed around a test slit to guide insertion of the electronic component into the test slit, the socket guide comprising: A pair of guide bodies are configured to support the two ends of an electronic component that is inserted into the test slit, which is elongated in the vertical direction as the direction of gravity, with the contact terminal side of the electronic component inserted into the test slit. as well as A pair of resilient supports, interchangeably coupled to the guide body, and resiliently supporting the electronic component at both ends during insertion of the contact terminal side portion into the test slit, or after insertion, to maintain the posture of the electronic component. The pair of guide bodies are positioned on both sides of the test slit in the vertical direction. The pair of elastic supports are respectively located on the pair of guide bodies and are detachably disposed on the guide bodies. The pair of elastic supports elastically support the electronic component by applying pressure to both ends of the electronic component in the direction toward the electronic component. To guide the movement of the electronic component during insertion into the test slit, an elongated guide groove is formed on the guide body along the movement direction of the electronic component, and a connecting groove is formed at a position of the guide groove. The elastic support is a positioning ball plug equipped with a structure that is inserted into the connecting groove. The positioning ball is elastically supported by a spring while applying pressure to the electronic components.

2. A socket guide for testing electronic components, disposed around a test slit to guide insertion of the electronic component into the test slit, the socket guide comprising: A pair of guide bodies are configured to support the two ends of an electronic component that is inserted into the test slit, which is elongated in the vertical direction as the direction of gravity, with the contact terminal side of the electronic component inserted into the test slit. as well as A pair of resilient supports, interchangeably coupled to the guide body, and resiliently supporting the electronic component at both ends during insertion of the contact terminal side portion into the test slit, or after insertion, to maintain the posture of the electronic component. The pair of guide bodies are positioned on both sides of the test slit in the vertical direction. The pair of elastic supports are respectively located on the pair of guide bodies and are detachably disposed on the guide bodies. The pair of elastic supports elastically support the electronic component by applying pressure to both ends of the electronic component in the direction toward the electronic component. The elastic support includes: The connecting part is connected to the main body of the guide component; In order to guide the movement of the electronic component during insertion into the test slit, an elongated guide groove is formed along the movement direction of the electronic component; and At least one elastic portion protrudes from the connecting portion toward the guide body, so that the connecting portion and the guide portion can be elastically supported by the guide body. The guide body has a connecting groove for the connecting portion to engage with, so that the connecting portion is inserted into the connecting groove and engages with the guide body.

3. The socket guide for testing electronic components according to claim 1 or 2, further comprising: At least one calibration pin, protruding forward, engages with the guide body to calibrate the position of the electronic component supplied via the grip, ensuring that the portion of the electronic component on the contact terminal side is precisely inserted into the test slit and engages with the calibration hole on the grip side. The calibration pin is located at a position deviating from a virtual straight line passing through the test slit in an elongated direction. The calibration hole is located off-center from a surface of the electronic component held by the gripper.

4. The socket guide for testing electronic components according to claim 1 or 2, further comprising: The first and second calibration pins, protruding forward, engage with the guide body to calibrate the position of the electronic component supplied via the gripper, ensuring that the portion of the electronic component on the contact terminal side is precisely inserted into the test slit and engages with the calibration hole on the gripper side. The first correction pin and the second correction pin are spaced apart from each other at positions deviating from a virtual straight line through the test slit along its elongated direction. When the horizontally positioned electronic component is inserted into the test slit at a 90-degree angle, the first alignment pin is used to correct the position of the electronic component. When the horizontally positioned electronic component is inserted into the test slit at a -90-degree angle, the second alignment pin is used to correct the position of the electronic component. The calibration hole is located off-center from a surface of the electronic component held by the gripper.

5. The socket guide for testing electronic components according to claim 2, wherein, The connecting part has a locking platform, which locks into the rear end of the guide body during the process of moving from rear to front and inserting into the connecting groove.

6. The socket guide for testing electronic components according to claim 2, wherein, The connecting portion, the guiding portion, and the elastic portion are formed as one unit.

7. The socket guide for testing electronic components according to claim 6, wherein, The elastic support is formed using a synthetic resin material that can achieve elastic deformation and recovery while also being injection molded.

8. The socket guide for testing electronic components according to claim 2, wherein, The connecting portion is formed with an insertion groove for inserting the elastic portion. The elastic portion is inserted into the insertion slot to engage with the connecting portion.

9. The socket guide for testing electronic components according to claim 8, wherein, The connecting portion and the guiding portion are formed as one piece. The elastic portion is injection molded using a material that can achieve elastic deformation and recovery, is softer than the connecting portion and the guiding portion, and is made of synthetic resin.

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