Decoding processing method, testing device, decoding processing system and readable storage medium

Abstract

The application discloses a decoding processing method, a test device, a decoding processing system and a readable storage medium. The method comprises the following steps: acquiring an infrared code value of a device under test; converting the infrared code value according to a preset conversion rule to obtain a target pulse signal, and sending the target pulse signal to the device under test to make the device under test send a feedback signal; adjusting the target pulse signal according to the feedback signal of the device under test, and sending the adjusted target pulse signal to the device under test; calculating and displaying a change rate of the target pulse signal, and obtaining a decoding allowable range of the device under test according to the change rate. The application realizes accurate acquisition of the decoding allowable range of the infrared device.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of electronic products, in particular to a decoding processing method, a test device, a decoding processing system and a readable storage medium. BACKGROUND

[0002] Infrared remote control technology is widely used in various electronic products. Although related applications can be realized through radio frequency technology nowadays, due to the characteristics of simple, fast response and low cost of the corresponding encoding and decoding function modules of infrared, it still occupies a large share of household consumer products.

[0003] During the life cycle of electronic products, some components need to be replaced by the original components due to cost, quality or supply capacity and other reasons. Because the electrical performance characteristics of electronic components from different manufacturers cannot be exactly the same, compatibility problems occur during material replacement. For example, during the replacement of infrared receiving heads, compatibility problems occur. That is, because the output pulse width variation ranges of remote control receiving heads from two different manufacturers are not the same, the problem of inconsistency with the pulse width variation range allowed by the product decoding software may occur, which may result in the phenomenon of not remote control. To solve this problem, the decoding allowable range of the software and the pulse width variation range of the infrared receiving head need to be known and matched.

[0004] The pulse width of the infrared remote control receiving head can be obtained through existing decoding programs or integrated third-party decoding programs before the supplier produces the factory, but the software decoding range of the product is difficult to measure, and the electrical manufacturer mainly relies on the actual test of a few samples to determine whether the decoding allowable range of the software and the pulse width variation range of the infrared receiving head are verified during the product development stage or material replacement. However, this often results in a certain proportion of not remote control phenomenon due to batch differences when in batch, which brings great quality risk to the production of products. Therefore, it is necessary to determine the decoding allowable range of the software. SUMMARY

[0005] The main purpose of the present application is to provide a decoding processing method, a test device, a decoding processing system and a readable storage medium, which aims to solve the problem of being unable to determine the decoding allowable range of the equipment.

[0006] To achieve the above purpose, the present application provides a decoding processing method, which comprises the steps of:

[0007] obtaining an infrared code value of a measured equipment;

[0008] converting the infrared code value according to a preset conversion rule to obtain a target pulse signal, and sending the target pulse signal to the measured equipment;

[0009] adjust the target pulse signal according to the feedback signal of the device under test, and send the adjusted target pulse signal to the device under test;

[0010] calculate and display a change rate of the target pulse signal, and obtain a decoding allowable range of the device under test according to the change rate.

[0011] Optionally, the step of converting the infrared code value into the target pulse signal according to a preset conversion rule comprises:

[0012] eliminating a carrier signal in the infrared code value, transforming a level state of a time period in which the carrier signal originally exists in the infrared code value into a low level, and transforming a level state of a time period in which the carrier signal originally does not exist in the infrared code value into a high level, to obtain the target pulse signal.

[0013] Optionally, the step of adjusting the target pulse signal according to the feedback signal of the device under test, and sending the adjusted target pulse signal to the device under test comprises:

[0014] if the feedback signal of the device under test is a normal remote control, adjusting pulse widths corresponding to the high level and the low level in the target pulse signal in a positive direction or a negative direction according to a preset step, respectively;

[0015] sending the adjusted target pulse signal to the device under test until the feedback signal of the device under test is an abnormal remote control, and then stopping the adjustment.

[0016] Optionally, the step of calculating and displaying the change rate of the target pulse signal, and obtaining the decoding allowable range of the device under test according to the change rate comprises:

[0017] displaying a first change rate of the target pulse signal, and taking the first change rate as a maximum value of the decoding allowable range, wherein the first change rate is a change rate of the target pulse signal when the target pulse signal is adjusted in a positive direction to the target pulse signal at which the feedback signal is the abnormal remote control;

[0018] displaying a second change rate of the target pulse signal, and taking the second change rate as a minimum value of the decoding allowable range, wherein the second change rate is a change rate of the target pulse signal when the target pulse signal is adjusted in a negative direction to the target pulse signal at which the feedback signal is the abnormal remote control;

[0019] obtaining the decoding allowable range of the device under test according to the maximum value and the minimum value.

[0020] To achieve the above object, the application further provides a testing device, which comprises:

[0021] An infrared code value learning module is configured to acquire an infrared code value of a device under test.

[0022] A control chip is configured to convert the infrared code value according to a preset conversion rule to obtain a target pulse signal, and send the target pulse signal to the device under test, so that the device under test sends a feedback signal.

[0023] An adjustment module is configured to adjust the target pulse signal according to the feedback signal of the device under test, so that the control chip sends the adjusted target pulse signal to the device under test.

[0024] A display module is configured to calculate and display a change rate of the target pulse signal, and obtain a decoding tolerance range of the device under test according to the change rate.

[0025] Optionally, the adjustment module comprises a positive adjustment unit and a negative adjustment unit, the positive adjustment unit is configured to perform positive adjustment on a pulse width of the target pulse signal, and the negative adjustment unit is configured to perform negative adjustment on the pulse width of the target pulse signal.

[0026] Optionally, the adjustment module further comprises a key matrix module, the key matrix module is configured to set an adjustment multiple of the pulse width.

[0027] Optionally, the test device further comprises a signal output module, one end of the signal output module is connected with the control chip, and the other end of the signal output module is connected with the device under test, so as to transmit the target pulse signal to the device under test.

[0028] To achieve the above object, the present application further provides a decoding processing system, which comprises a memory, a processor and a test program stored in the memory and executable on the processor, and the test program implements the steps of the decoding processing method when executed by the processor.

[0029] To achieve the above object, the present application further provides a readable storage medium, which stores a test program, and the test program implements the steps of the decoding processing method when executed by a processor.

[0030] The application provides a decoding processing method, a test device, a decoding processing system and a readable storage medium, the decoding processing method comprises the following steps: acquiring an infrared code value of a to-be-tested device; copying the infrared code value of the to-be-tested device into the test device, so that the test device can control the to-be-tested device; converting the infrared code value according to a preset conversion rule to obtain a target pulse signal, and sending the target pulse signal to the to-be-tested device, so that the to-be-tested device sends a feedback signal; adjusting the target pulse signal according to the feedback signal of the to-be-tested device, and sending the adjusted target pulse signal to the to-be-tested device, so that the adjustment of the pulse signal of the to-be-tested device is realized, the adjustment range of the pulse signal can be accurately adjusted according to the feedback signal, and the obtained decoding tolerance range is more accurate; calculating and displaying the change rate of the target pulse signal, and obtaining the decoding tolerance range of the to-be-tested device according to the change rate, so that the change of the pulse signal can be accurately obtained, and the decoding tolerance range of the to-be-tested device can be accurately measured. The decoding tolerance range of the to-be-tested device can be accurately measured, the factory control range of the infrared remote control receiver can be accurately matched, a large number of defective products can be avoided, and the production cost is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0031] Figure 1 is a structural schematic diagram of a hardware running environment involved in an embodiment scheme of the application;

[0032] Figure 2 is a flowchart of a decoding processing method first embodiment of the application;

[0033] Figure 3 is a detailed flowchart of step S30 in the decoding processing method first embodiment of the application;

[0034] Figure 4 is a detailed flowchart of step S40 in the decoding processing method first embodiment of the application;

[0035] Figure 5 is a frame structure schematic diagram of a test device of the application;

[0036] Figure 6 is a use scenario schematic diagram of the test device of the application.

[0037] The implementation, functional features and advantages of the application will be further described with reference to the embodiments and the accompanying drawings. DETAILED DESCRIPTION

[0038] In order to make the object, technical scheme and advantages of the application more clear, the application will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the application, and are not used to limit the application.

[0039] AsFigure 1 As shown in the figure, Figure 1 is a terminal structure diagram of a hardware running environment involved in the embodiment of the present application.

[0040] The terminal of the embodiment of the present application can be a test device.

[0041] As shown in the figure, Figure 1 the terminal can include a processor 1001, for example, a CPU, a communication bus 1002, a user interface 1003, a DVI interface 1004, a USB interface 1005, and a memory 1006. The communication bus 1002 is used to realize the connection and communication between the components. The user interface 1003 can include a display screen (Display) and an input unit such as a keyboard (Keyboard). Optionally, the user interface 1003 can further include a standard wired interface and a wireless interface. The DVI interface 1004 can optionally include a standard wired interface and is connected to other external devices through a DVI line. The USB interface 1005 can optionally include a standard wired interface and is connected to other external devices through a USB connection line. The memory 1006 can be a high-speed RAM memory or a stable memory (non-volatile memory) such as a disk memory. The memory 1006 can optionally be a storage device independent of the aforementioned processor 1001.

[0042] Optionally, the terminal can further include an audio circuit and the like, which will not be described here.

[0043] Those skilled in the art can understand that Figure 1 the terminal structure shown in the figure does not constitute a limitation on the terminal, and can include more or fewer components than the figure, or combine certain components, or different component arrangements.

[0044] As shown in the figure, Figure 1 the memory 1006 as a computer storage medium can include an operating system, a DVI interface module, a USB interface module, a user interface module, and a decoding processing program.

[0045] In the terminal shown in the figure, Figure 1 the DVI interface 1004 is mainly used to connect external devices and communicate data with the external devices; the USB interface 1005 is mainly used to connect external devices and communicate data with the external devices; the user interface 1003 is mainly used to connect a client and communicate data with the client; and the processor 1001 can be used to call the decoding processing program stored in the memory 1006 and perform the following operations:

[0046] obtain the infrared code value of the device under test;

[0047] According to the preset conversion rule, the infrared code value is converted to obtain a target pulse signal, and the target pulse signal is sent to the device under test to make the device under test send a feedback signal;

[0048] According to the feedback signal of the device under test, the target pulse signal is adjusted, and the adjusted target pulse signal is sent to the device under test;

[0049] The change rate of the target pulse signal is calculated and displayed, and the decoding allowable range of the device under test is obtained according to the change rate.

[0050] Further, the processor 1001 can call the decoding processing program stored in the memory 1006, and further perform the following operations:

[0051] The carrier signal in the infrared code value is eliminated, and the level state of the time period in which the carrier signal originally exists in the infrared code value is transformed into a low level, and the level state of the time period in which the carrier signal originally does not exist in the infrared code value is transformed into a high level, to obtain a target pulse signal.

[0052] Further, the processor 1001 can call the decoding processing program stored in the memory 1006, and further perform the following operations:

[0053] If the feedback signal of the device under test is a normal remote control, the pulse width corresponding to the high level and the low level in the target pulse signal is adjusted in a positive direction or a negative direction according to a preset step, respectively;

[0054] The adjusted target pulse signal is sent to the device under test until the feedback signal of the device under test is an abnormal remote control, and then the adjustment is stopped.

[0055] Further, the processor 1001 can call the decoding processing program stored in the memory 1006, and further perform the following operations:

[0056] The first change rate of the target pulse signal is displayed, and the first change rate is taken as the maximum value of the decoding allowable range, wherein the first change rate is the change rate of the target pulse signal when the target pulse signal is adjusted in a positive direction to the target pulse signal when the feedback signal is an abnormal remote control;

[0057] The second change rate of the target pulse signal is displayed, and the second change rate is taken as the minimum value of the decoding allowable range, wherein the second change rate is the change rate of the target pulse signal when the target pulse signal is adjusted in a negative direction to the target pulse signal when the feedback signal is an abnormal remote control;

[0058] According to the maximum value and the minimum value, the decoding allowable range of the device under test is obtained.

[0059] Further, please refer toFigure 2 , Figure 2 is a schematic diagram of a frame structure of a testing device of the present application, the testing device comprising:

[0060] The control chip 2 is connected with the infrared code value learning module 1, the adjusting module 3 and the display module 4, respectively. The infrared code value learning module 1 is used to obtain the infrared code value of the device under test. The control chip 2 is used to convert the infrared code value according to a preset conversion rule to obtain a target pulse signal, and send the target pulse signal to the device under test to make the device under test send a feedback signal. The adjusting module 3 is used to adjust the target pulse signal according to the feedback signal of the device under test, so that the control chip 2 sends the adjusted target pulse signal to the device under test. The display module 4 is used to calculate and display the change rate of the target pulse signal, and obtain the decoding tolerance range of the device under test according to the change rate.

[0061] In the embodiment, the infrared code value learning module 1 comprises an infrared emitter and a plurality of learning buttons connected with the control chip 2. The infrared emitter is used to emit and receive infrared signals after receiving the pressing of the learning buttons, and send the received infrared signals to the control chip 2, so that the control chip 2 analyzes the received infrared code according to the infrared encoding protocol corresponding to the infrared signals, and parses the address code, data code and the like contained therein one by one, and then copies and saves them one by one with the pressed learning buttons, so that the corresponding learning buttons can control the device under test. It should be noted that when learning the infrared code value of the device under test, the infrared code value of the remote control device corresponding to the device under test is learned, for example, the device under test is a television, and the infrared code value learned in the embodiment is the infrared code value of the remote control device matched with the television, so as to control the television according to the learned infrared code value.

[0062] The control chip 2 is the control center of the testing device in the embodiment. After receiving the learned infrared code value, the control chip 2 eliminates the carrier signal in the infrared code value, transforms the level state of the time period in which the carrier signal originally exists in the infrared code value into a low level, transforms the level state of the time period in which the carrier signal originally does not exist in the infrared code value into a high level, and obtains a target pulse signal formed by the changed high level and low level. It should be noted that the infrared code is essentially composed of a series of high and low level signals, and is finally sent out by modulating the carrier. Therefore, the infrared code value includes the carrier signal and the high and low level values of the signal. The conversion rule in the embodiment is the demodulation process of the infrared code value. After demodulation, the learned infrared code value can control the device under test.

[0063] The display module 4 is a three-digit nixie tube, which is used to display the total change rate of the pulse width of the target pulse signal in each adjustment, and finally the decoding allowable range of the measured device is obtained according to the change rate. For the specific adjustment method and the determination of the decoding allowable range, please refer to the following two embodiments.

[0064] Further, the adjustment module 3 comprises a positive adjustment unit 31 and a negative adjustment unit 32. The positive adjustment unit 31 is used to positively adjust the pulse width of the target pulse signal, and the negative adjustment unit 32 is used to negatively adjust the pulse width of the target pulse signal.

[0065] Further, the adjustment module further comprises a key matrix module 33, which is used to set the adjustment multiple of the pulse width.

[0066] The positive adjustment unit 31 further comprises a positive variable mode adjustment unit 311 and a positive variable fine adjustment unit 312. The positive variable mode adjustment unit 311 is used to positively adjust the pulse width of the target pulse signal according to a first preset step, and the positive variable fine adjustment unit 312 is used to positively adjust the pulse width of the target pulse signal according to a second preset step. The negative adjustment unit 32 comprises a negative variable mode adjustment unit 321 and a negative variable fine adjustment unit 322. The negative variable mode adjustment unit 321 is used to negatively adjust the pulse width of the target pulse signal according to a first preset step, and the negative variable fine adjustment unit 322 is used to negatively adjust the pulse width of the target pulse signal according to a second preset step. The second preset step is smaller than the first preset step. That is, the positive variable mode adjustment unit 311 and the negative variable mode adjustment unit 321 are used to coarsely adjust the pulse width, and the positive variable fine adjustment unit 312 and the negative variable fine adjustment unit 322 are used to finely adjust the pulse width, which further improves the accuracy of obtaining the decoding allowable range.

[0067] The key matrix module is connected with the control chip and comprises keys from 0 to 9, which are used to set the multiple of the preset step in adjusting the pulse width. For example, when the preset step is 5%, the key matrix module is used to set the multiple to 9, so that the specific adjustment value in each adjustment of the pulse width becomes 5%*9=45%, or the multiple is set to 2, so that the specific adjustment value becomes 5%*2=10%, which is beneficial to the rapid adjustment of the pulse width.

[0068] Further, the test device further comprises a signal output module 5, one end of the signal output module 5 is connected with the control chip 2, the other end is connected with the device under test, and the signal output module 5 is used for transmitting the target pulse signal to the device under test. The signal output module 5 is a signal line and a ground line, which are used for connection with the test device and the device under test, and realize signal transmission between the test device and the device under test. The two wires are GND and signal output (the signal output is normally high level), and the ends of the wires are provided with clamps, so that the wires can be conveniently connected to the device under test, the GND is connected with the GND of the machine, and the signal line is directly connected with the signal output pin of the infrared receiving head.

[0069] The specific embodiment of the decoding processing system of the present application is basically the same as the following test procedures, and will not be repeated here.

[0070] Please refer to Figure 2 , Figure 2 The present application provides a flowchart of the decoding processing method of the first embodiment, and the decoding processing method comprises the following steps:

[0071] In step S10, the infrared code value of the device under test is acquired.

[0072] When learning the infrared code value of the device under test, the infrared code value of the remote control device corresponding to the device under test is acquired, for example, the device under test is a television, and the infrared code value learned in the present embodiment is the infrared code value of the remote control device matched with the television, so that the television can be controlled according to the learned infrared code value. The device under test in the present embodiment can be a television, an air conditioner, a fan or other electronic devices with infrared remote control.

[0073] In step S20, the infrared code value is converted according to a preset conversion rule to obtain a target pulse signal, and the target pulse signal is sent to the device under test, so that the device under test sends a feedback signal.

[0074] In an embodiment, the step of converting the infrared code value according to the preset conversion rule to obtain a target pulse signal in step S20 further comprises:

[0075] In step A21, the carrier signal in the infrared code value is eliminated, the level state of the time period in which the carrier signal originally exists in the infrared code value is transformed into a low level, and the level state of the time period in which the carrier signal originally does not exist in the infrared code value is transformed into a high level, to obtain a target pulse signal.

[0076] In the embodiment, the infrared code is essentially composed of a series of high and low level signals, and is finally sent out by modulating and sending on a carrier through infrared pulses. Therefore, the infrared code value includes the high and low level values of the carrier signal and the infrared signal. The time period of the carrier signal is high level, and the time period of the non-carrier signal is low level. The preset conversion rule in the embodiment is to eliminate the carrier signal in the infrared code value, change the level state of the time period in which the carrier signal originally exists to low level, change the level state of the time period in which the carrier signal originally exists to high level, and form a pulse by the changed high and low levels, which is the target second pulse signal. In the embodiment, only through the above change, the test device can realize remote control of the measured device.

[0077] After the target pulse signal is sent to the measured device, the measured device will feed back according to the received target pulse signal. The feedback signal includes normal remote control and abnormal remote control. The normal remote control is that the measured device can be normally controlled to adjust, and the abnormal remote control is that the measured device cannot be controlled to adjust. For example, the test device sends the target pulse signal of the learned "volume +" key to the measured device. If the measured device can normally increase the volume, a feedback signal of normal remote control is sent; if the measured device cannot normally increase the volume, a feedback signal of abnormal remote control is sent.

[0078] Step S30, adjusting the target pulse signal according to the feedback signal of the measured device, and sending the adjusted target pulse signal to the measured device;

[0079] In an embodiment, the step S30 further includes:

[0080] Step S31, if the feedback signal of the measured device is normal remote control, the pulse width corresponding to the high level and the low level in the target pulse signal is respectively adjusted in positive direction or negative direction according to a preset step.

[0081] In the embodiment, the preset step refers to a specific value of adjusting the pulse width each time, which can be freely set in the design tool software code matched with the testing device. The pulse width refers to the duration of high level and low level, for example, the duration of high level in the target pulse signal is 100us, and the pulse width is 100us. The preset step can be determined according to the pulse width of the target pulse signal before adjustment, for example, the pulse width of the target pulse signal is 100us, and the preset step is set to 5% of the pulse width, that is, 5us, or 6% or 7%, which is not limited in the present application. The positive adjustment and the negative adjustment both include two adjustment modes, one is coarse adjustment, and the other is fine adjustment. The coarse adjustment is that the positive variable mode adjustment unit or the negative variable mode adjustment unit adjusts the pulse width by the first preset step, and the first preset step can be set to 5%. The fine adjustment is that the positive variable fine adjustment unit or the negative variable fine adjustment unit adjusts the pulse width by the second preset step, and the second preset step can be set to 1%. The positive adjustment means increasing the pulse width, and the negative adjustment means decreasing the pulse width.

[0082] The specific adjustment process in the embodiment is as follows: the specific principle is that when the low level is lengthened by a certain width, the high level following it is shortened by a corresponding width; of course, the low level can also be lengthened by a certain width, and the high level following it is shortened by a corresponding width, that is, the change direction of the high level following the low level is opposite to that of the low level, the low level is increased, and the high level is decreased, or vice versa, the low level is decreased by a certain width, and the high level is increased by a corresponding width, wherein the width refers to the duration of the high level or the low level.

[0083] In step S32, the adjusted target pulse signal is sent to the device under test, and the adjustment is stopped until the feedback signal of the device under test is abnormal remote control.

[0084] In the embodiment, in order to obtain the decoding allowable range of the target pulse signal corresponding to the device under test, that is, when the pulse width of the target pulse signal exceeds the decoding allowable range, the device under test cannot be remotely controlled. In the adjustment process, the pulse width can be first adjusted by the positive mode adjustment unit until the testing device cannot remotely control the device under test, and in order to obtain a more accurate decoding allowable range, the pulse width can be further adjusted by the positive variable fine adjustment unit or the negative variable fine adjustment unit until the feedback signal of the device under test is abnormal remote control again. For example, when the positive adjustment is performed, when the coarse adjustment is performed to the feedback signal being abnormal remote control, the fine negative adjustment is then performed until the feedback signal is normal remote control, the fine positive adjustment is then performed until the feedback signal is abnormal remote control, and the maximum value of the pulse allowable range can be obtained. Similarly, the minimum value of the pulse allowable range can be obtained.

[0085] Step S40, calculating and displaying the change rate of the target pulse signal, and obtaining the decoding allowable range of the measured device according to the change rate.

[0086] In an embodiment, the step S40 further comprises:

[0087] Step S41, displaying the first change rate of the target pulse signal, and taking the first change rate as the maximum value of the decoding allowable range, wherein the first change rate is the change rate of the target pulse signal when the target pulse signal is positively adjusted to the target pulse signal of the abnormal remote control of the feedback signal.

[0088] Step S42, displaying the second change rate of the target pulse signal, and taking the second change rate as the minimum value of the decoding allowable range, wherein the second change rate is the change rate of the target pulse signal when the target pulse signal is negatively adjusted to the target pulse signal of the abnormal remote control of the feedback signal.

[0089] Step S43, obtaining the decoding allowable range of the measured device according to the maximum value and the minimum value.

[0090] In the embodiment, the decoding allowable range is the remote control range that can be received by the measured device. Through the display module, the total change rate of the adjusted pulse width can be displayed in real time. For example, the pulse width before adjustment is 100us, after positively adjusting twice with a step of 5%, the feedback signal is abnormal adjustment, and the pulse width becomes 110us, and the 110us at this time is the first change rate of the target pulse signal. Or the pulse width before adjustment is 100us, after negatively adjusting twice with a step of 5%, the feedback signal is abnormal adjustment, and the pulse width becomes 90us, and the 90us at this time is the second change rate of the target pulse signal. The decoding allowable range is the range between the minimum value and the maximum value.

[0091] The application provides a decoding processing method and a test device, the infrared code value of the measured device is obtained, the infrared code value of the measured device is copied into the test device, so that the test device can control the measured device, the infrared code value is converted according to a preset conversion rule, a target pulse signal is obtained, the target pulse signal is sent to the measured device, the measured device sends a feedback signal, the target pulse signal is adjusted according to the feedback signal of the measured device, the adjusted target pulse signal is sent to the measured device, the adjustment of the pulse signal of the measured device is realized, the adjustment range of the pulse signal is accurately adjusted according to the feedback signal, the obtained decoding tolerance range is more accurate, the change rate of the target pulse signal is calculated and displayed, the decoding tolerance range of the measured device is obtained according to the change rate, the change of the pulse signal is accurately obtained, and the decoding tolerance range of the measured device is accurately measured. The decoding tolerance range of the measured device is accurately measured, the factory control range of the infrared remote control receiving head can be accurately matched, a large number of defective products can be avoided, and the production cost is reduced.

[0092] In addition, the application further provides a readable storage medium, the readable storage medium stores a test program, and the test program is executed by a processor to realize the following operations.

[0093] The infrared code value of the measured device is obtained.

[0094] The infrared code value is converted according to a preset conversion rule, a target pulse signal is obtained, and the target pulse signal is sent to the measured device, so that the measured device sends a feedback signal.

[0095] The target pulse signal is adjusted according to the feedback signal of the measured device, and the adjusted target pulse signal is sent to the measured device.

[0096] The change rate of the target pulse signal is calculated and displayed, and the decoding tolerance range of the measured device is obtained according to the change rate.

[0097] Further, the decoding processing program is executed by the processor to further realize the following operations.

[0098] The carrier signal in the infrared code value is eliminated, the level state of a time period in which the carrier signal originally exists in the infrared code value is transformed into a low level, and the level state of a time period in which the carrier signal originally does not exist in the infrared code value is transformed into a high level, to obtain a target pulse signal.

[0099] Further, the decoding processing program is executed by the processor to further realize the following operations.

[0100] If the feedback signal of the device under test is normal remote control, the pulse width corresponding to the high level and the low level in the target pulse signal is respectively adjusted in positive direction or negative direction according to preset steps;

[0101] The adjusted target pulse signal is sent to the device under test until the feedback signal of the device under test is abnormal remote control, and then the adjustment is stopped.

[0102] Further, the decoding process program is also implemented to perform the following operations when executed by the processor:

[0103] The first change rate of the target pulse signal is displayed, and the first change rate is taken as the maximum value of the decoding allowable range, wherein the first change rate is the change rate of the target pulse signal when the target pulse signal is adjusted in positive direction to the target pulse signal at which the feedback signal is abnormal remote control;

[0104] The second change rate of the target pulse signal is displayed, and the second change rate is taken as the minimum value of the decoding allowable range, wherein the second change rate is the change rate of the target pulse signal when the target pulse signal is adjusted in negative direction to the target pulse signal at which the feedback signal is abnormal remote control;

[0105] According to the maximum value and the minimum value, the decoding allowable range of the device under test is obtained.

[0106] The specific embodiments of the readable storage medium of the present application are basically the same as the above-mentioned decoding process program, and will not be repeated here.

[0107] It should be noted that in this paper, the term "including", "containing" or any other variant thereof is intended to cover non-exclusive inclusion, so that the process, method, article or system including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or includes elements inherent to such process, method, article or system. Without more limitations, the element defined by the statement "including a" does not exclude the presence of other identical elements in the process, method, article or system including the element.

[0108] The above-mentioned serial numbers of the embodiments of the present application are only for description, not representing the advantages and disadvantages of the embodiments.

[0109] Those skilled in the art can clearly understand the above-mentioned embodiment method can be realized by means of software and the necessary general hardware platform, of course, can also be through hardware, but in many cases the former is a better embodiment. Based on such understanding, the technical solutions of the present application essentially or say the part of the prior art contribution can be embodied in the form of software products, the computer software product is stored in a storage medium (such as ROM / RAM, magnetic disc, optical disc) as described above, including a number of instructions to make a terminal device (may be a mobile phone, computer, server, air conditioner, or network equipment, etc.) executes the method described in various embodiments of the present application.

[0110] The above is only the preferred embodiment of the present application, not therefore limit the patent scope of the present application, any equivalent structure or equivalent flow transformation made by using the content of the present application specification and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present application.

Claims

1. A decoding processing method, characterized in that: The decoding processing method comprises the steps of: Get the infrared code value of the device under test; Converting the infrared code value according to a preset conversion rule to obtain a target pulse signal, and sending the target pulse signal to the device under test so that the device under test sends a feedback signal; adjusting the target pulse signal according to the feedback signal sent by the device under test, and sending the adjusted target pulse signal to the device under test; Calculating and displaying the rate of change of the target pulse signal, and obtaining the decoding allowable range of the device under test according to the rate of change; The step of adjusting the target pulse signal according to the feedback signal of the device under test and sending the adjusted target pulse signal to the device under test includes: If the feedback signal of the device under test is normal remote control, the pulse width corresponding to the high level and the low level in the target pulse signal are adjusted positively or negatively according to the preset step; The adjusted target pulse signal is sent to the device under test until the feedback signal from the device under test is abnormal remote control, and then the adjustment is stopped.

2. The decoding method according to claim 1, wherein: The step of converting the infrared code value according to a preset conversion rule to obtain a target pulse signal includes: Eliminate the carrier signal in the infrared code value, and convert the level state of the infrared code value in the time period when the carrier signal originally exists to a low level, and convert the level state of the infrared code value in the time period when the carrier signal originally does not exist to a high level to obtain a target pulse signal.

3. The decoding method according to claim 1, wherein: The step of calculating and displaying the rate of change of the target pulse signal and obtaining the decoding allowable range of the device under test according to the rate of change includes: Displaying a first change rate of the target pulse signal and using the first change rate as a maximum value of a decoding allowable range, wherein the first change rate is a change rate of the target pulse signal when the target pulse signal is positively adjusted to the point where the feedback signal indicates abnormal remote control; Displaying a second change rate of the target pulse signal and using the second change rate as a minimum value of a decoding allowable range, wherein the second change rate is a change rate of the target pulse signal when the target pulse signal is negatively adjusted to the point where the feedback signal indicates abnormal remote control; An allowable decoding range of the device under test is obtained according to the maximum value and the minimum value.

4. A testing device, characterized in that: The testing device comprises: Infrared code value learning module, used to obtain the infrared code value of the device under test; A control chip, configured to convert the infrared code value according to a preset conversion rule to obtain a target pulse signal, and send the target pulse signal to the device under test so that the device under test sends a feedback signal; an adjustment module, configured to adjust the target pulse signal according to the feedback signal of the device under test, so that the control chip sends the adjusted target pulse signal to the device under test; the adjustment module is further configured to adjust the pulse widths corresponding to the high level and the low level in the target pulse signal in a positive or negative direction according to a preset step if the feedback signal of the device under test indicates normal remote control; and send the adjusted target pulse signal to the device under test until the feedback signal of the device under test indicates abnormal remote control, at which time the adjustment is stopped; The display module is used to calculate and display the change rate of the target pulse signal, and obtain the decoding allowable range of the device under test according to the change rate.

5. The testing device according to claim 4, wherein: The regulating module includes a positive regulating unit and a negative regulating unit. The positive regulating unit is used to positively regulate the pulse width of the target pulse signal, and the negative regulating unit is used to negatively regulate the pulse width of the target pulse signal.

6. The testing device according to claim 5, wherein: The adjustment module further includes a key matrix module, and the key matrix module is used to set the adjustment multiple of the pulse width.

7. The testing device according to claim 4, wherein: The testing device further includes a signal output module, one end of which is connected to the control chip, and the other end of which is connected to the device under test, for transmitting the target pulse signal to the device under test.

8. A decoding processing system, characterized in that: The decoding processing system includes a memory, a processor, and a test program stored in the memory and executable on the processor. When the test program is executed by the processor, the steps of the decoding processing method according to any one of claims 1 to 3 are implemented.

9. A readable storage medium, characterized in that The readable storage medium stores a test program, which, when executed by a processor, implements the steps of the decoding method according to any one of claims 1 to 3.

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