Temperature testing method, device, computer equipment and storage medium

Abstract

The present application relates to a temperature testing method, apparatus, computer equipment, storage medium and computer program product. The method comprises: obtaining the current temperature of the processor to be tested; determining the high temperature difference according to a preset high temperature threshold and the current temperature, and determining the target temperature interval to which the high temperature difference belongs in a preset temperature interval set; determining the target test strategy that matches the target temperature interval in a preset test strategy set according to a preset test strategy matching rule, and executing the target test strategy; if the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, returning to execute the step of obtaining the current temperature of the processor to be tested until the test end condition is met to obtain the processor test result. This solution can realize the automated testing of the processor temperature without the need for the tester to perform test operations during the test process, thereby improving the test efficiency.

Description

Technical Field

[0001] The present application relates to the field of testing technology, and in particular to a temperature testing method, apparatus, computer equipment, storage medium, and computer program product. Background Art

[0002] With the development of testing technology, temperature testing technology has emerged. This technology can perform temperature testing on the server and obtain the temperature of the central processing unit of the server under test.

[0003] In traditional temperature testing technology, testers manually input test commands based on test requirements to place the server in a test state. Then, at regular intervals, they manually input temperature acquisition commands to read and record the CPU temperature until the test ends, generating the processor test results. These end conditions include the CPU temperature reaching a preset high temperature threshold or completing each test state.

[0004] However, current temperature testing technology requires a lot of manpower when testing servers, resulting in low testing efficiency. Summary of the Invention

[0005] Based on this, it is necessary to provide a temperature testing method, device, computer equipment, computer-readable storage medium and computer program product that can improve testing efficiency in response to the above technical problems.

[0006] In a first aspect, the present application provides a temperature testing method. The method comprises:

[0007] Get the current temperature of the processor under test;

[0008] Determining a high temperature difference based on a preset high temperature threshold and the current temperature, and determining a target temperature range to which the high temperature difference belongs within a preset temperature range;

[0009] According to a preset test strategy matching rule, determine a target test strategy that matches the target temperature range in a preset test strategy set, and execute the target test strategy;

[0010] If the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, the process returns to the step of obtaining the current temperature of the processor to be tested until the test end condition is met to obtain the processor test result.

[0011] This method automatically matches a target test strategy based on the current temperature of the processor under test, then executes that strategy until the test termination criteria are met, resulting in a processor test result. This solution, therefore, automates processor temperature testing, eliminating the need for human testers to perform test operations during the test process, thereby improving test efficiency.

[0012] In one embodiment, the preset test strategy set includes at least a foreground operation test strategy and a load pressure test strategy; and determining the target test strategy that matches the target temperature range in the preset test strategy set according to the preset test strategy matching rule includes:

[0013] In the case where the target temperature interval is a preset low temperature interval, the foreground operation test strategy is used as the target test strategy matching the target temperature interval;

[0014] In a case where the target temperature interval is a preset medium temperature interval, using the load pressure test strategy as a target test strategy matching the target temperature interval;

[0015] In a case where the target temperature range is a preset high temperature range, the foreground operation test strategy and the load pressure test strategy are used as target test strategies that match the target temperature range.

[0016] In this embodiment, the target test strategy corresponding to the target temperature range is determined based on the specific target temperature range. Therefore, the appropriate target test strategy can be dynamically selected without executing each target test strategy, thereby balancing test efficiency and test result accuracy.

[0017] In one embodiment, executing the target test strategy includes:

[0018] In a case where the target test strategy includes the load pressure test strategy, determining the load degree according to the high temperature difference and a preset load degree calculation strategy corresponding to the target temperature range;

[0019] Based on the load level, the load stress testing strategy is executed.

[0020] In this embodiment, when the target test strategy includes a load stress test strategy, the load level is determined based on the high temperature difference, and the load stress test strategy is executed based on the load level. Because the load level is determined based on the high temperature difference and the preset load level calculation strategy, the load level can be dynamically adjusted to avoid reduced test result accuracy or reduced test efficiency due to setting the preset load level too high or too low.

[0021] In one embodiment, determining the load level according to the high temperature difference and the preset load level calculation strategy corresponding to the target temperature range includes:

[0022] When the target temperature interval is the preset high temperature interval, the high temperature difference is compared with a preset temperature difference threshold; the preset temperature difference threshold is greater than a lower limit value of the preset high temperature interval;

[0023] When the high temperature difference is less than the preset temperature difference threshold, determining a load adjustment ratio according to the lower limit of the preset high temperature range, the preset temperature difference threshold, and the high temperature difference, and determining a load degree based on the load adjustment ratio and a preset load degree range;

[0024] When the high temperature difference is greater than or equal to the preset temperature difference threshold, the upper limit of the preset load degree range is used as the load degree.

[0025] In this embodiment, if the target test strategy includes a load stress test strategy and the target temperature range is a preset high temperature range, the server determines the corresponding preset load level calculation strategy based on the comparison result of the high temperature difference with the preset temperature difference threshold, and then calculates the load level. Therefore, the load level is specifically determined based on the comparison result and the preset load level calculation strategy, which can further improve the accuracy of load level determination.

[0026] In one embodiment, determining the load level according to the high temperature difference and the preset load level calculation strategy corresponding to the target temperature range includes:

[0027] When the target temperature range is the preset medium temperature range, a load adjustment ratio is determined according to the preset medium temperature range and the high temperature difference, and a load degree is determined based on the load adjustment ratio and the preset load degree range.

[0028] In this embodiment, if the target testing strategy includes a load stress testing strategy and the target temperature range is a preset medium temperature range, the server calculates the load level based on the preset load level calculation strategy corresponding to the preset medium temperature range. Specifically, the load level is determined based on the medium temperature range and the high temperature difference, which can further improve the accuracy of load level determination.

[0029] In one embodiment, the current temperature includes a first temperature recorded in a system log and a second temperature recorded in a baseboard management controller log; and determining the high temperature difference based on a preset high temperature threshold and the current temperature includes:

[0030] determining a current average temperature based on the first temperature and the second temperature;

[0031] The high temperature difference is determined according to a preset high temperature threshold and the current average temperature.

[0032] In this embodiment, the current average temperature is calculated based on the first temperature and the second temperature, and the high temperature difference is determined based on the current average temperature and a preset high temperature threshold. The first temperature is derived from the system log, and the second temperature is derived from the baseboard management controller log. Combining these two temperatures to determine the high temperature difference can improve the accuracy of the high temperature difference.

[0033] In one embodiment, obtaining the current temperature of the processor to be tested includes:

[0034] In response to the test start command, a preset idle test strategy is executed, and the temperature of the processor to be tested is acquired when the idle test strategy is finished being executed to obtain the current temperature.

[0035] In this embodiment, the first current temperature of the processor under test is the temperature of the processor under test when the idle state ends. Therefore, the idle test strategy can eliminate the error interference caused by the server running other tasks before the test, thereby improving the test accuracy.

[0036] In a second aspect, the present application also provides a temperature testing device. The device comprises:

[0037] An acquisition module is used to obtain the current temperature of the processor to be tested;

[0038] A first determining module is configured to determine a high temperature difference according to a preset high temperature threshold and the current temperature, and determine a target temperature interval to which the high temperature difference belongs within a preset temperature interval set;

[0039] A second determination module is configured to determine, in accordance with a preset test strategy matching rule, a target test strategy that matches the target temperature range in a preset test strategy set, and execute the target test strategy;

[0040] The loop module is used to return to the step of obtaining the current temperature of the processor to be tested if the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, until the test end condition is met to obtain the processor test result.

[0041] This device automatically matches a target test strategy based on the current temperature of the processor under test, then executes that strategy until the test termination conditions are met, yielding the processor test results. This solution, therefore, automates processor temperature testing, eliminating the need for human testers to perform test operations during the test process, thereby improving test efficiency.

[0042] In one embodiment, the preset test strategy set includes at least a foreground operation test strategy and a load stress test strategy; and the second determination module is specifically configured to:

[0043] In the case where the target temperature interval is a preset low temperature interval, the foreground operation test strategy is used as the target test strategy matching the target temperature interval;

[0044] In a case where the target temperature interval is a preset medium temperature interval, using the load pressure test strategy as a target test strategy matching the target temperature interval;

[0045] In a case where the target temperature range is a preset high temperature range, the foreground operation test strategy and the load pressure test strategy are used as target test strategies that match the target temperature range.

[0046] In this embodiment, the target test strategy corresponding to the target temperature range is determined based on the specific target temperature range. Therefore, the appropriate target test strategy can be dynamically selected without executing each target test strategy, thereby balancing test efficiency and test result accuracy.

[0047] In one embodiment, the second determining module is specifically configured to:

[0048] In a case where the target test strategy includes the load pressure test strategy, determining the load degree according to the high temperature difference and a preset load degree calculation strategy corresponding to the target temperature range;

[0049] Based on the load level, the load stress testing strategy is executed.

[0050] In this embodiment, when the target test strategy includes a load stress test strategy, the load level is determined based on the high temperature difference, and the load stress test strategy is executed based on the load level. Because the load level is determined based on the high temperature difference and the preset load level calculation strategy, the load level can be dynamically adjusted to avoid reduced test result accuracy or reduced test efficiency due to setting the preset load level too high or too low.

[0051] In one embodiment, the second determining module is specifically configured to:

[0052] When the target temperature interval is the preset high temperature interval, the high temperature difference is compared with a preset temperature difference threshold; the preset temperature difference threshold is greater than a lower limit value of the preset high temperature interval;

[0053] When the high temperature difference is less than the preset temperature difference threshold, determining a load adjustment ratio according to the lower limit of the preset high temperature range, the preset temperature difference threshold, and the high temperature difference, and determining a load degree based on the load adjustment ratio and a preset load degree range;

[0054] When the high temperature difference is greater than or equal to the preset temperature difference threshold, the upper limit of the preset load degree range is used as the load degree.

[0055] In this embodiment, if the target test strategy includes a load stress test strategy and the target temperature range is a preset high temperature range, the server determines the corresponding preset load level calculation strategy based on the comparison result of the high temperature difference with the preset temperature difference threshold, and then calculates the load level. Therefore, the load level is specifically determined based on the comparison result and the preset load level calculation strategy, which can further improve the accuracy of load level determination.

[0056] In one embodiment, the second determining module is specifically configured to:

[0057] When the target temperature range is the preset medium temperature range, a load adjustment ratio is determined according to the preset medium temperature range and the high temperature difference, and a load degree is determined based on the load adjustment ratio and the preset load degree range.

[0058] In this embodiment, if the target testing strategy includes a load stress testing strategy and the target temperature range is a preset medium temperature range, the server calculates the load level based on the preset load level calculation strategy corresponding to the preset medium temperature range. Specifically, the load level is determined based on the medium temperature range and the high temperature difference, which can further improve the accuracy of load level determination.

[0059] In one embodiment, the current temperature includes a first temperature recorded in a system log and a second temperature recorded in a baseboard management controller log; and the first determining module is specifically configured to:

[0060] determining a current average temperature based on the first temperature and the second temperature;

[0061] The high temperature difference is determined according to a preset high temperature threshold and the current average temperature.

[0062] In this embodiment, the current average temperature is calculated based on the first temperature and the second temperature, and the high temperature difference is determined based on the current average temperature and a preset high temperature threshold. The first temperature is derived from the system log, and the second temperature is derived from the baseboard management controller log. Combining these two temperatures to determine the high temperature difference can improve the accuracy of the high temperature difference.

[0063] In one embodiment, the acquisition module is specifically configured to:

[0064] In response to the test start command, a preset idle test strategy is executed, and the temperature of the processor to be tested is acquired when the idle test strategy is finished being executed to obtain the current temperature.

[0065] In this embodiment, the first current temperature of the processor under test is the temperature of the processor under test when the idle state ends. Therefore, the idle test strategy can eliminate the error interference caused by the server running other tasks before the test, thereby improving the test accuracy.

[0066] In a third aspect, the present application further provides a computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor implements the steps described in the first aspect when executing the computer program.

[0067] In a fourth aspect, the present application further provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps described in the first aspect.

[0068] In a fifth aspect, the present application further provides a computer program product, comprising a computer program that, when executed by a processor, performs the steps described in the first aspect.

[0069] The above-mentioned temperature testing method, device, computer equipment, storage medium and computer program product obtain the current temperature of the processor to be tested; determine the high temperature temperature difference according to the preset high temperature threshold and the current temperature, and determine the target temperature interval to which the high temperature temperature difference belongs in the preset temperature interval set; determine the target test strategy that matches the target temperature interval in the preset test strategy set according to the preset test strategy matching rule, and execute the target test strategy; if the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, return to the step of obtaining the current temperature of the processor to be tested until the test end condition is met to obtain the processor test result. In the above scheme, the target test strategy can be automatically matched based on the current temperature of the processor to be tested, and then the target test strategy can be executed until the test end condition is met to obtain the processor test result. Therefore, this scheme can realize automated testing of the processor temperature without the need for testers to perform test operations during the test process, thereby improving test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0070] Figure 1 Schematic diagram of a temperature testing method according to an embodiment;

[0071] Figure 2 Schematic diagram of a flow chart of a method for determining a target test strategy in one embodiment;

[0072] Figure 3 is a flow chart of a method for determining a load level in one embodiment;

[0073] Figure 4 Schematic diagram of a temperature testing method according to another embodiment;

[0074] Figure 5 is a structural block diagram of a temperature testing device in one embodiment;

[0075] Figure 6 FIG. 1 is a diagram showing the internal structure of a computer device in one embodiment. DETAILED DESCRIPTION

[0076] In order to make the purpose, technical solutions and advantages of this application more clear, the following further describes this application in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain this application and are not intended to limit this application.

[0077] In one embodiment, Figure 1As shown, a temperature testing method is provided. This embodiment uses the method applied to a server as an example for illustration. It is understandable that the method can also be applied to a terminal, and can also be applied to a system including a terminal and a server, and implemented through the interaction between the terminal and the server. In this embodiment, the method includes the following steps:

[0078] Step 102: Obtain the current temperature of the processor to be tested.

[0079] In an embodiment of the present application, a test control instruction set may be pre-stored in the server, and then the current temperature of the processor to be tested is obtained by executing the temperature acquisition instruction in the test control instruction set. The processor to be tested is the central processing unit (CPU) of the server. The current temperature of the processor to be tested includes the first temperature recorded in the system log (syslog) and the second temperature recorded in the baseboard management controller (BMC) log. Specifically, the server obtains the first temperature of the processor to be tested from the system log based on the first temperature acquisition instruction in the test control instruction set. The server can also obtain the second temperature of the processor to be tested from the baseboard management controller log based on the second temperature acquisition instruction in the test control instruction set. In one embodiment, the second temperature acquisition instruction is an Intelligent Platform Management Interface (IPMI) command.

[0080] Step 104 : determining a high temperature difference based on a preset high temperature threshold and the current temperature, and determining a target temperature range to which the high temperature difference belongs within a preset temperature range.

[0081] In an embodiment of the present application, the server calculates the high temperature difference based on a preset high temperature threshold and the current temperature. The high temperature threshold is determined based on the alarm temperatures in historical temperature alarm data. The data source for the historical temperature alarm data can be the server to be tested or a server of the same type. Optionally, the high temperature threshold can be the average of the alarm temperatures in the historical temperature alarm data or the mode of the alarm temperatures in the historical temperature alarm data. The server determines the target temperature range to which the high temperature difference belongs from a preset set of temperature intervals. The temperature interval set includes at least one temperature interval. It is understood that there is no intersection between the temperature intervals, and the total temperature interval obtained by combining all temperature intervals is in the range (0, positive infinity). In one embodiment, the temperature intervals include a low temperature interval, a medium temperature interval, and a high temperature interval. The upper limit of the low temperature interval is the lower limit of the medium temperature interval, and the upper limit of the medium temperature interval is the lower limit of the high temperature interval. For example, the low temperature interval is (0, ΔT1), the medium temperature interval is [ΔT1, ΔT2], and the high temperature interval is (ΔT2, +∞).

[0082] Step 106 : According to the preset test strategy matching rule, a target test strategy matching the target temperature range is determined in the preset test strategy set, and the target test strategy is executed.

[0083] In an embodiment of the present application, the server matches the target test strategy corresponding to the target temperature range in the preset test strategy set according to the preset test strategy matching rule, and executes the target test strategy. Among them, the test strategy matching rule includes a first correspondence between the target temperature range and the target test strategy, and the first correspondence between the target temperature range and the target test strategy is one-to-one, or one-to-many. It can be understood that the server can execute multiple target test strategies at the same time. The target test strategy includes at least a foreground operation test strategy and a load stress test strategy.

[0084] Step 108 , when the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, return to the step of obtaining the current temperature of the processor to be tested until the test end condition is met to obtain the processor test result.

[0085] In an embodiment of the present application, during the execution of the target test strategy, the server obtains at least one processor temperature according to a preset temperature acquisition cycle. The processor temperature is the temperature of the processor to be tested in the server. It is understandable that the processor temperature includes the temperature recorded in the system log and the temperature recorded in the baseboard management controller log. If the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, the server returns to execute step 102 after the current target test strategy execution ends, until the test end condition is met, and the server stops executing the target test strategy. The server can then obtain the current temperature of the processor to be tested and generate a processor test result including the current temperature. Optionally, the processor test result may also include the processor temperature, temperature test time, high temperature alarm information, etc. during the execution of the target test strategy. If the processor temperature during the execution of the target test strategy meets the preset high temperature condition, the server stops executing the target test strategy, obtains the current temperature of the processor to be tested, and generates a processor test result including the current temperature.

[0086] Among them, the preset high temperature condition includes that the processor temperature is greater than or equal to a preset high temperature threshold. Optionally, the processor temperature is greater than or equal to the preset high temperature threshold can be the temperature recorded in the system log or the temperature recorded in the baseboard management controller log is greater than or equal to the preset high temperature threshold, or it can be that the average temperature determined based on the temperature recorded in the system log and the temperature recorded in the baseboard management controller log is greater than or equal to the preset high temperature threshold. Optionally, there can be multiple high temperature conditions. In one example, the high temperature condition can include that the processor temperature is greater than or equal to the preset high temperature threshold, and can also include other conditions. For example, the high temperature condition can also be that the processor temperature is maintained in a preset high temperature interval for a preset high temperature time. Among them, the high temperature interval is determined based on the high temperature threshold, and any value in the high temperature interval is less than the high temperature threshold. For example, assuming that the high temperature threshold is 80 degrees, the high temperature interval can be (79, 80) or (79.5, 79.9].

[0087] Optionally, there may be multiple test termination conditions. In one example, the test termination condition may include the above-mentioned high temperature condition and may also include other conditions. For example, the test termination condition may be that the target test strategies matching the target temperature intervals cannot be the same. Exemplarily, assuming that the target temperature interval to which the first high temperature difference belongs is a low temperature interval, and the target test strategy matching the low temperature interval is a foreground operation test strategy, then when the target temperature interval to which the second high temperature difference belongs is also a low temperature interval, the target test strategy matching the low temperature interval is still a foreground operation test strategy, then the server stops executing the target test strategy.

[0088] The temperature testing method described above automatically matches a target test strategy based on the current temperature of the processor under test. This strategy is then executed until the test termination conditions are met, resulting in a processor test result. Therefore, this solution enables automated testing of processor temperature, eliminating the need for testers to perform test operations during the test process, thereby improving test efficiency.

[0089] In one embodiment, Figure 2 As shown, the preset test strategy set includes at least a foreground operation test strategy and a load pressure test strategy. According to the preset test strategy matching rules, in the preset test strategy set, the target test strategy that matches the target temperature range is determined to include:

[0090] Step 202: When the target temperature interval is a preset low temperature interval, the foreground running test strategy is used as the target test strategy matching the target temperature interval.

[0091] In an embodiment of the present application, when the target temperature interval is a preset low temperature interval, the server matches the test policy corresponding to the low temperature interval in the preset test policy set according to the preset policy matching rule as the foreground operation test policy, and uses the foreground operation test policy as the target test policy for the low temperature interval. Wherein, the foreground operation test policy is used to enable the server to execute the test policy of the foreground operation task. Optionally, the foreground operation state can be a video playing state, a music playing state, or an image processing state. The server controls the foreground operation of the server based on the foreground operation control instruction in the test control instruction set. In one embodiment, the server controls the playback of a multimedia player based on the control foreground operation instruction in the test control instruction set. Wherein, the multimedia player can be, but is not limited to, an MPlayer multimedia player.

[0092] Step 204 : When the target temperature range is a preset medium temperature range, the load pressure test strategy is used as a target test strategy matching the target temperature range.

[0093] In an embodiment of the present application, when the target temperature interval is a preset medium temperature interval, the server matches the test strategy corresponding to the medium temperature interval in the preset test strategy set according to the preset policy matching rules as the load stress test strategy, and uses the load stress test strategy as the target test strategy for the medium temperature interval. The load stress test strategy is a test strategy for placing the server in a specific load stress state. The server runs the load stress test script based on the load stress control instruction in the test control instruction set. The load stress test script can be, but is not limited to, a stress application test (Stressapptest).

[0094] Step 206 : When the target temperature range is a preset high temperature range, the foreground operation test strategy and the load pressure test strategy are used as target test strategies matching the target temperature range.

[0095] In an embodiment of the present application, when the target temperature range is a preset high temperature range, the server matches the test strategies corresponding to the high temperature range to the foreground operation test strategy and the load stress test strategy from the preset test strategy set according to the preset policy matching rules, and uses the foreground operation test strategy and the load stress test strategy as the target test strategy for the high temperature range. It can be understood that when the high temperature difference falls within the low temperature range, it indicates that the high temperature difference is small, that is, the temperature difference between the current temperature and the preset high temperature threshold is small. When the high temperature difference falls within the medium temperature range, it indicates that the high temperature difference is medium, that is, the temperature difference between the current temperature and the preset high temperature threshold is neither large nor small. When the high temperature difference falls within the high temperature range, it indicates that the high temperature difference is large, that is, the temperature difference between the current temperature and the preset high temperature threshold is large. When the server is only in the foreground operation state, the processor temperature rises more slowly than when the server is only in the load stress state. The processor temperature rises fastest when the server is in both the foreground operation state and the load stress state. Therefore, when the high temperature difference is small, the server executes the foreground operation test strategy, and the processor temperature climbs slowly, which can obtain more test data and thus improve the accuracy of the processor test results; when the high temperature difference is medium, the server executes the load stress test strategy, and the processor temperature climbs at a medium speed, which can ensure that the current temperature rises quickly while obtaining as much test data as possible, taking into account both test efficiency and test result accuracy; when the high temperature difference is large, the server executes the foreground operation test strategy and the load stress test strategy at the same time, ensuring that the current temperature rises quickly and improving test efficiency.

[0096] In this embodiment, the target test strategy corresponding to the target temperature range is determined based on the specific target temperature range. Therefore, the appropriate target test strategy can be dynamically selected without executing each target test strategy, thereby balancing test efficiency and test result accuracy.

[0097] In one embodiment, executing the target test strategy includes:

[0098] In the case where the target test strategy includes a load stress test strategy, the load level is determined according to the high temperature difference and the preset load level calculation strategy corresponding to the target temperature range; and the load stress test strategy is executed based on the load level.

[0099] In an embodiment of the present application, when the target test strategy includes a load stress test strategy, the server calculates the load level based on the high temperature difference and the preset load level calculation strategy corresponding to the target temperature interval. Among them, the preset load level calculation strategy corresponding to the target temperature interval includes a preset load level calculation strategy corresponding to the preset medium temperature interval and a preset load level calculation strategy corresponding to the preset high temperature interval. Specifically, when the target test strategy is a load stress test strategy and the target temperature interval is a preset medium temperature interval, the server calculates the load level based on the high temperature difference and the preset medium temperature interval. When the target test strategy is a load stress test strategy and a foreground operation test strategy and the target temperature interval is a preset high temperature interval, the server calculates the load level based on the high temperature difference and the preset high temperature interval. The server executes the load stress test strategy based on the load level. Among them, the load level belongs to a preset load range. In one embodiment, the preset load range is [50, 90].

[0100] In this embodiment, when the target test strategy includes a load stress test strategy, the load level is determined based on the high temperature difference, and the load stress test strategy is executed based on the load level. Since the load level is determined based on the high temperature difference and the preset load level calculation strategy, the load level can be dynamically adjusted to avoid the reduction of test result accuracy or test efficiency due to the preset load level being set too high or too low. In one embodiment, Figure 3 As shown, according to the high temperature difference and the preset load degree calculation strategy corresponding to the target temperature range, determining the load degree includes:

[0101] Step 302 : When the target temperature range is a preset high temperature range, the high temperature difference is compared with a preset temperature difference threshold.

[0102] The preset temperature difference threshold is greater than the lower limit of the preset high temperature range.

[0103] In an embodiment of the present application, when the target test strategy includes a load stress test strategy and the target temperature interval is a preset high temperature interval, the server compares the high temperature difference with the preset temperature difference threshold to obtain a comparison result. For example, assuming that the high temperature interval is (ΔT2, +∞) and the preset temperature difference threshold is ΔT3, the lower limit of the high temperature interval is ΔT2, and ΔT3>ΔT2.

[0104] Step 302, when the high temperature difference is less than the preset temperature difference threshold, determine the load adjustment ratio based on the lower limit value of the preset high temperature range, the preset temperature difference threshold, and the high temperature difference, and determine the load degree based on the load adjustment ratio and the preset load degree range; when the high temperature difference is greater than or equal to the preset temperature difference threshold, use the upper limit value of the preset load degree range as the load degree.

[0105] In an embodiment of the present application, when the high temperature difference is less than a preset temperature difference threshold, the server calculates the load adjustment ratio based on the preset lower limit of the high temperature interval, the preset temperature difference threshold, and the high temperature difference. Specifically, when the high temperature difference is less than the preset temperature difference threshold, the server calculates the difference between the high temperature difference and the lower limit of the high temperature interval (referred to as the first numerator difference for ease of distinction), and the difference between the preset temperature difference threshold and the lower limit of the high temperature interval (referred to as the first denominator difference for ease of distinction), and then calculates the quotient of the first numerator difference and the first denominator difference to obtain the load adjustment ratio, as shown in the following formula (1).

[0106]

[0107] Among them, k is the load adjustment ratio, ΔT is the high temperature difference, ΔT2 is the lower limit of the high temperature range, and ΔT3 is the preset temperature difference threshold.

[0108] The server calculates the load level based on the load adjustment ratio and the preset load level interval. Specifically, the server calculates the difference between the upper limit of the preset load level interval and the lower limit of the preset load level interval (for convenience, referred to as the adjustable load amount). Then, the server calculates the product of the adjustable load amount and the load adjustment ratio (for convenience, referred to as the required load amount). Finally, the server calculates the sum of the required load amount and the lower limit of the preset load level interval to obtain the load level. Specifically, this is shown in the following formula (2).

[0109] F=F1+k·(F2-F1) (2)

[0110] Among them, F is the load level, F1 is the lower limit of the preset load level range, k is the load adjustment ratio, and F2 is the upper limit of the preset load level range.

[0111] In this embodiment, if the target test strategy includes a load stress test strategy and the target temperature range is a preset high temperature range, the server determines the corresponding preset load level calculation strategy based on the comparison result of the high temperature difference with the preset temperature difference threshold, and then calculates the load level. Therefore, the load level is specifically determined based on the comparison result and the preset load level calculation strategy, which can further improve the accuracy of load level determination.

[0112] In one embodiment, determining the load level according to the high temperature difference and the preset load level calculation strategy corresponding to the target temperature range includes:

[0113] When the target temperature range is a preset medium temperature range, the load adjustment ratio is determined according to the preset medium temperature range and the high temperature difference, and the load degree is determined based on the load adjustment ratio and the preset load degree range.

[0114] In an embodiment of the present application, when the target test strategy includes a load stress test strategy and the target temperature interval is a preset medium temperature interval, the server calculates the load adjustment ratio based on the preset medium temperature interval and the high temperature difference. Specifically, the server calculates the difference between the high temperature difference and the lower limit of the medium temperature interval (for convenience of distinction, referred to as the second numerator difference), and the difference between the upper limit of the medium temperature interval and the lower limit of the medium temperature interval (for convenience of distinction, referred to as the second denominator difference), and then calculates the quotient of the second numerator difference and the second denominator difference to obtain the load adjustment ratio, as shown in the following formula (3).

[0115]

[0116] Where k is the load regulation ratio, ΔP is the high temperature difference, ΔT1 is the lower limit of the medium temperature range, and ΔT2 is the upper limit of the medium temperature range (which is also the lower limit of the high temperature range).

[0117] The server calculates the load level based on the load adjustment ratio and the preset load level interval. Specifically, the server calculates the difference between the upper limit of the preset load level interval and the lower limit of the preset load level interval (for convenience of distinction, referred to as the adjustable load amount). Then, the server calculates the product of the adjustable load amount and the load adjustment ratio (for convenience of distinction, referred to as the required load amount). Finally, the server calculates the sum of the required load amount and the lower limit of the preset load level interval to obtain the load level. Specifically, as shown in the above formula (2).

[0118] In this embodiment, when the target test strategy includes a load stress test strategy and the target temperature range is a preset medium temperature range, the server calculates the load level based on the preset load level calculation strategy corresponding to the preset medium temperature range. Therefore, specifically, the load level is determined based on the medium temperature range and the high temperature difference, which can further improve the accuracy of load level determination.

[0119] In one embodiment, the current temperature includes a first temperature recorded in a system log and a second temperature recorded in a baseboard management controller log; and determining the high temperature difference based on a preset high temperature threshold and the current temperature includes:

[0120] The current average temperature is determined based on the first temperature and the second temperature; and the high temperature difference is determined based on the preset high temperature threshold and the current average temperature.

[0121] In an embodiment of the present application, the server calculates the average of the first temperature and the second temperature to obtain the current average temperature, and calculates the difference between the preset high temperature threshold and the current average temperature to obtain the high temperature difference. The current temperature of the processor under test includes the first temperature recorded in the system log (syslog) and the second temperature recorded in the baseboard management controller (BMC) log. The high temperature threshold is determined based on the alarm temperature in historical temperature alarm data. The data source of the historical temperature alarm data can be the server under test or a server of the same type.

[0122] In this embodiment, the current average temperature is calculated based on the first temperature and the second temperature, and the high temperature difference is determined based on the current average temperature and a preset high temperature threshold. The first temperature is derived from the system log, and the second temperature is derived from the baseboard management controller log. Combining these two temperatures to determine the high temperature difference can improve the accuracy of the high temperature difference.

[0123] In one embodiment, obtaining the current temperature of the processor to be tested includes:

[0124] In response to the test start command, a preset idle test strategy is executed, and the current temperature of the processor to be tested is obtained when the idle test strategy is finished being executed.

[0125] In an embodiment of the present application, the server executes a preset idle test strategy in response to a test start command, so that the server is in an idle state, and obtains the temperature of the processor to be tested at the end of the execution of the idle test strategy (i.e., the end of the idle state), and obtains the current temperature of the processor to be tested. Among them, the first current temperature of the processor to be tested is the temperature of the processor to be tested at the end of the idle state. Optionally, the test start command can be a manually input command, or it can be a preset test start command. In the case where the test start command is a preset test start command, the trigger condition for responding to the test start command can be that the current moment reaches a preset test time or a preset test cycle.

[0126] In this embodiment, the first current temperature of the processor under test is the temperature of the processor under test when the idle state ends. Therefore, the idle test strategy can eliminate the error interference caused by the server running other tasks before the test, thereby improving the test accuracy.

[0127] In one embodiment, Figure 4 As shown, the temperature test methods include:

[0128] Step 402 : In response to the test start command, a preset idle test strategy is executed, and the temperature of the processor to be tested is obtained when the idle test strategy is finished, to obtain the current temperature.

[0129] Step 404: Determine the high temperature difference based on the preset high temperature threshold and the current temperature.

[0130] Step 406 : Determine the target temperature range to which the high temperature difference belongs in the preset temperature range set.

[0131] When the target temperature range is the preset low temperature range, step 408 is executed; when the target temperature range is the preset medium temperature range, step 410 is executed; when the target temperature range is the preset high temperature range, step 412 is executed.

[0132] Step 408: Determine that the target test strategy is a foreground running test strategy.

[0133] Step 410: Determine that the target test strategy is a load stress test strategy.

[0134] Step 412: Determine that the target test strategy is a foreground operation test strategy and a load stress test strategy.

[0135] Step 414 , determining whether the test end condition is met, if so, executing step 422 ; if not, executing step 416 .

[0136] Step 416: Execute the target test strategy.

[0137] Step 418 , determining whether the processor temperature during the execution of the target test strategy meets a preset high temperature condition. If so, proceed to step 422 ; if not, proceed to step 420 .

[0138] Step 420 , obtaining the current temperature of the processor to be tested, and returning to step 404 .

[0139] Step 422: Stop executing the target layer test strategy and obtain the processor test result.

[0140] In an embodiment of the present application, during the execution of the target test strategy, the server obtains at least one processor temperature according to a preset temperature acquisition cycle. In the case that the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, the current temperature of the processor to be tested is obtained, and the server returns to execute step 404 until the test end condition is met and stops executing the target test strategy. Then, the server obtains the current temperature of the processor to be tested and generates a processor test result including the current temperature. In the case that the processor temperature during the execution of the target test strategy meets the preset high temperature condition, the server stops executing the target test strategy, obtains the current temperature of the processor to be tested, and generates a processor test result including the current temperature.

[0141] In this embodiment, a target test strategy can be automatically matched based on the current temperature of the processor to be tested. This target test strategy is then executed until the test termination conditions are met, resulting in a processor test result. Therefore, this solution can achieve automated testing of processor temperature, eliminating the need for testers to perform test operations during the test process, thereby improving test efficiency.

[0142] It should be understood that, although the various steps in the flowcharts involved in the various embodiments described above are displayed in sequence according to the instructions of the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be executed in other orders. Moreover, at least a portion of the steps in the flowcharts involved in the various embodiments described above can include multiple steps or multiple stages, and these steps or stages are not necessarily executed and completed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily to be carried out in sequence, but can be executed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0143] Based on the same inventive concept, the present application also provides a temperature testing device for implementing the temperature testing method described above. The solution provided by this device is similar to the solution described in the method described above. Therefore, the specific limitations of one or more temperature testing device embodiments provided below can be found in the above-mentioned limitations of the temperature testing method and will not be repeated here.

[0144] In one embodiment, Figure 5 As shown, a temperature testing device is provided, comprising:

[0145] An acquisition module 502 is configured to acquire the current temperature of the processor to be tested;

[0146] A first determining module 504 is configured to determine a high temperature difference based on a preset high temperature threshold and a current temperature, and determine a target temperature range to which the high temperature difference belongs within a preset temperature range set;

[0147] A second determination module 506 is configured to determine a target test strategy that matches the target temperature range in a preset test strategy set according to a preset test strategy matching rule, and execute the target test strategy;

[0148] The loop module 508 is used to return to the step of obtaining the current temperature of the processor to be tested if the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, until the test end condition is met to obtain the processor test result.

[0149] In one embodiment, the preset test strategy set includes at least a foreground operation test strategy and a load stress test strategy; the second determination module 506 is specifically configured to:

[0150] When the target temperature range is the preset low temperature range, the foreground running test strategy is used as the target test strategy matching the target temperature range;

[0151] When the target temperature range is the preset medium temperature range, the load stress test strategy is used as the target test strategy matching the target temperature range;

[0152] When the target temperature range is a preset high temperature range, the foreground operation test strategy and the load pressure test strategy are used as target test strategies matching the target temperature range.

[0153] In one embodiment, the second determining module 506 is specifically configured to:

[0154] In the case where the target test strategy includes a load pressure test strategy, the load level is determined according to the high temperature difference and the preset load level calculation strategy corresponding to the target temperature range;

[0155] Based on the load level, execute load stress testing strategy.

[0156] In one embodiment, the second determining module 506 is specifically configured to:

[0157] When the target temperature range is a preset high temperature range, the high temperature difference is compared with a preset temperature difference threshold; the preset temperature difference threshold is greater than the lower limit of the preset high temperature range;

[0158] When the high temperature difference is less than a preset temperature difference threshold, determining a load adjustment ratio according to a preset lower limit of the high temperature range, a preset temperature difference threshold, and the high temperature difference, and determining a load degree based on the load adjustment ratio and a preset load degree range;

[0159] When the high temperature difference is greater than or equal to the preset temperature difference threshold, the upper limit of the preset load degree range is used as the load degree.

[0160] In one embodiment, the second determining module 506 is specifically configured to:

[0161] When the target temperature range is a preset medium temperature range, the load adjustment ratio is determined according to the preset medium temperature range and the high temperature difference, and the load degree is determined based on the load adjustment ratio and the preset load degree range.

[0162] In one embodiment, the current temperature includes a first temperature recorded in a system log and a second temperature recorded in a baseboard management controller log; the first determining module 504 is specifically configured to:

[0163] determining a current average temperature based on the first temperature and the second temperature;

[0164] The high temperature difference is determined based on the preset high temperature threshold and the current average temperature.

[0165] In one embodiment, the acquisition module 502 is specifically configured to:

[0166] In response to the test start command, a preset idle test strategy is executed, and the temperature of the processor to be tested is obtained when the idle test strategy is finished, so as to obtain the current temperature.

[0167] Each module in the temperature testing device can be implemented in whole or in part through software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in hardware form, or can be stored in a memory in the computer device in software form, so that the processor can call and execute the corresponding operations of each module.

[0168] In one embodiment, a computer device is provided. The computer device may be a server, and its internal structure diagram may be as follows: Figure 6As shown. The computer device includes a processor, a memory, an input / output interface (Input / Output, abbreviated as I / O) and a communication interface. The processor, the memory and the input / output interface are connected through a system bus, and the communication interface is connected to the system bus through the input / output interface. The processor of the computer device is used to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program and a database. The internal memory provides an environment for the operation of the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is used to exchange information between the processor and an external device. The communication interface of the computer device is used to communicate with an external terminal through a network connection. When the computer program is executed by the processor, a temperature testing method is implemented.

[0169] Those skilled in the art will understand that Figure 6 The structure shown in the figure is only a block diagram of a part of the structure related to the solution of the present application, and does not constitute a limitation on the computer device to which the solution of the present application is applied. The specific computer device may include more or fewer components than shown in the figure, or combine certain components, or have a different component arrangement.

[0170] In one embodiment, a computer device is further provided, including a memory and a processor. The memory stores a computer program, and the processor implements the steps in the above method embodiments when executing the computer program.

[0171] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned method embodiments are implemented.

[0172] In one embodiment, a computer program product is provided, including a computer program, which implements the steps in the above method embodiments when executed by a processor.

[0173] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, stored data, displayed data, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of relevant data must comply with the relevant laws, regulations and standards of relevant countries and regions.

[0174] Those skilled in the art will appreciate that all or part of the processes in the above-mentioned embodiment methods can be implemented by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, database or other media used in the embodiments provided in this application may include at least one of non-volatile and volatile memory. Non-volatile memory may include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory may include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM). The database involved in the various embodiments provided herein may include at least one of a relational database and a non-relational database. Non-relational databases may include, but are not limited to, distributed databases based on blockchains. The processor involved in the various embodiments provided herein may be, but are not limited to, a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic unit, a data processing logic unit based on quantum computing, and the like.

[0175] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0176] The above-described embodiments merely represent several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present application. It should be noted that a person of ordinary skill in the art may make various modifications and improvements without departing from the spirit of the present application, and these modifications and improvements fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. A temperature testing method, characterized in that: The method comprises: Get the current temperature of the processor under test; Determining a high temperature difference based on a preset high temperature threshold and the current temperature, and determining a target temperature range to which the high temperature difference belongs within a preset temperature range; According to a preset test strategy matching rule, in a preset test strategy set, determining a target test strategy that matches the target temperature range, and executing the target test strategy, wherein the test strategy matching rule includes a correspondence between the target temperature range and the target test strategy; If the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, the process returns to the step of obtaining the current temperature of the processor to be tested until the test end condition is met to obtain the processor test result.

2. The method according to claim 1, characterized in that The preset test strategy set includes at least a foreground operation test strategy and a load pressure test strategy; and the target test strategy for determining the target temperature range matching in the preset test strategy set according to the preset test strategy matching rule includes: In the case where the target temperature interval is a preset low temperature interval, the foreground operation test strategy is used as the target test strategy matching the target temperature interval; In a case where the target temperature interval is a preset medium temperature interval, using the load pressure test strategy as a target test strategy matching the target temperature interval; In a case where the target temperature range is a preset high temperature range, the foreground operation test strategy and the load pressure test strategy are used as target test strategies that match the target temperature range.

3. The method according to claim 2, characterized in that The executing the target test strategy includes: In a case where the target test strategy includes the load pressure test strategy, determining the load degree according to the high temperature difference and a preset load degree calculation strategy corresponding to the target temperature range; Based on the load level, the load stress testing strategy is executed.

4. The method according to claim 3, characterized in that The determining of the load level according to the high temperature difference and the preset load level calculation strategy corresponding to the target temperature range includes: When the target temperature interval is the preset high temperature interval, the high temperature difference is compared with a preset temperature difference threshold; the preset temperature difference threshold is greater than a lower limit value of the preset high temperature interval; When the high temperature difference is less than the preset temperature difference threshold, determining a load adjustment ratio according to the lower limit of the preset high temperature range, the preset temperature difference threshold, and the high temperature difference, and determining a load degree based on the load adjustment ratio and a preset load degree range; When the high temperature difference is greater than or equal to the preset temperature difference threshold, the upper limit of the preset load degree range is used as the load degree.

5. The method according to claim 3, characterized in that The determining of the load level according to the high temperature difference and the preset load level calculation strategy corresponding to the target temperature range includes: When the target temperature range is the preset medium temperature range, a load adjustment ratio is determined according to the preset medium temperature range and the high temperature difference, and a load degree is determined based on the load adjustment ratio and the preset load degree range.

6. The method according to claim 1, wherein The current temperature includes a first temperature recorded in a system log and a second temperature recorded in a baseboard management controller log; and determining the high temperature difference based on a preset high temperature threshold and the current temperature includes: determining a current average temperature based on the first temperature and the second temperature; The high temperature difference is determined according to a preset high temperature threshold and the current average temperature.

7. The method according to any one of claims 1 to 6, characterized in that The obtaining of the current temperature of the processor to be tested comprises: In response to the test start command, a preset idle test strategy is executed, and the temperature of the processor to be tested is acquired when the idle test strategy is finished being executed to obtain the current temperature.

8. A temperature testing device, characterized in that: The device comprises: An acquisition module is used to obtain the current temperature of the processor to be tested; A first determining module is configured to determine a high temperature difference according to a preset high temperature threshold and the current temperature, and determine a target temperature interval to which the high temperature difference belongs within a preset temperature interval set; A second determination module is configured to determine, in a preset test strategy set, a target test strategy that matches the target temperature range according to a preset test strategy matching rule, and execute the target test strategy, wherein the test strategy matching rule includes a correspondence between the target temperature range and the target test strategy; The loop module is used to return to the step of obtaining the current temperature of the processor to be tested if the processor temperature during the execution of the target test strategy does not meet the preset high temperature condition, until the test end condition is met to obtain the processor test result.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, wherein: When the processor executes the computer program, the steps of the method according to any one of claims 1 to 7 are implemented.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

11. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 7 are implemented.

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