Electronic device testing method and electronic device testing apparatus

Abstract

The application relates to an electronic equipment testing method and an electronic equipment testing device, wherein the electronic equipment testing method comprises the following steps: placing electronic equipment in an electronic detection device, wherein the electronic equipment at least comprises a first light source and a light source outlet; blocking the light source outlet, detecting a first current of a photodiode; turning on the first light source, collecting a driving current of the first light source, and judging whether the driving circuit of the first light source normally works; detecting a second current of the photodiode, and judging whether the electronic equipment leaks light. The light source outlet is blocked by light-absorbing material, the light emitted by the first light source of the electronic equipment can be absorbed, on the other hand, external light sources can be prevented from entering the inside of the electronic equipment and affecting the induced current generated by the photodiode inside, the test is more accurate, and the condition that the electronic equipment leaks light inside is avoided. The application effectively solves the problem that the existing electronic product cannot test the overall PPG function of the product after assembly.

Description

Technical Field

[0001] This application relates to the technical field of electronic equipment testing, and more specifically, to an electronic equipment testing method and an electronic equipment testing apparatus. Background Technology

[0002] Heart rate and blood oxygen saturation are two important parameters reflecting the human body's physiological state, and are also key indicators monitored by many wearable physiological parameter monitoring devices. Currently, photoplethysmography (PPG) is widely used. This method uses an LED light source and a photodetector to measure the attenuation of the light beam as it passes through human tissue, reflecting cardiovascular information. It is a non-invasive measurement of pulse oxygenation. Furthermore, the reflective PPG signal detection method places the LED light source and photodetector on the same side of the measured area. The light beam is absorbed by various human tissues, including the skin, venules, and arteries, and reflected back to the body surface before being received by the photodetector. Because the LED light source and photodetector are on the same side of the measured area in reflective PPG signal detection, this method can be applied to signal detection on flat areas such as the wrist, fingers, forearm, and abdomen, making the sensor more comfortable and flexible to wear. Simultaneously, since reflective PPG signal detection does not require penetration of excessive human tissue, the emission power requirement of the light source is relatively low. Currently, most wearable physiological parameter monitoring devices use reflective PPG signals.

[0003] Because the absorption of light beams of different wavelengths varies significantly in human tissues, most human tissues have low absorption coefficients in the wavelength range of 500nm to 1300nm. Therefore, a sufficiently strong light beam can still be detected after absorption by human tissues. Simultaneously, the absorption coefficients of two important components in blood (Hb and HbO2) differ considerably, allowing for effective differentiation of the levels of these two hemoglobins. Wearable physiological parameter monitoring devices utilize LED light sources, and PPG sensors containing green, red, and infrared light offer better accuracy in detecting heart rate and blood oxygen saturation. However, due to the typically small size of wearable physiological parameter monitoring devices, they are highly sensitive to the light beam feedback received by the PPG sensor. If the PPG sensor experiences light leakage, reflection, or low beam divergence during use, it will lead to significant errors in the feedback information received by the PPG sensor, ultimately resulting in large measurement errors. In existing technologies, the aforementioned electronic devices are generally assembled after individual component testing to ensure functionality, lacking a device or method for overall product testing. Summary of the Invention

[0004] This application provides a testing method and apparatus for electronic devices to solve the problem that existing electronic products cannot perform overall PPG (Power, Product, and Gain) function testing after assembly.

[0005] In a first aspect, this application provides a method for testing electronic devices, including:

[0006] The electronic device is placed inside the electronic testing device, and the electronic device includes at least a first light source and a light source outlet;

[0007] By blocking the light source outlet with light-absorbing material, the first current of the photodiode in the electronic device is detected.

[0008] Turn on the first light source and collect the driving current of the first light source to determine whether the driving circuit of the first light source is working properly.

[0009] If the driving circuit of the first light source is working normally, the second current of the photodiode is detected. Based on the relationship between the magnitude of the first current and the second current, it is determined whether the electronic device leaks light. If the first current is greater than or equal to the second current, the electronic device does not leak light. If the first current is less than the second current, the electronic device leaks light.

[0010] Furthermore, activating the first light source also includes: the first light source emitting at least one of green light, red light, and infrared light.

[0011] Furthermore, the frequency of the light beam emitted by the electronic detection device is between 25.6 Hz and 256 Hz, and the duty cycle of the beam is 10% or 20%.

[0012] Furthermore, the duration of light emission by the electronic detection equipment is between 6 seconds and 30 seconds.

[0013] Furthermore, if light leakage is determined in an electronic device, the testing method for the electronic device also includes: determining the type of light leakage based on the light path between the first light source and the light-absorbing material. If the light path between the first light source and the light-absorbing material is correct, then the light leakage in the electronic device is a component quality problem; if the light path between the first light source and the light-absorbing material is incorrect, then the light leakage in the electronic device is an assembly quality problem.

[0014] Furthermore, if it is determined that the electronic device does not leak light, the light-absorbing material is moved out of the light source outlet, and the reflective material is moved to a position 12mm to 24mm directly opposite the light source outlet.

[0015] Furthermore, the light emitted by the electronic device is a combination of multiple types of light, including combinations of green and red light, green and infrared light, and red and infrared light, which are then detected after filtering and amplification.

[0016] Furthermore, the combination of multiple lights includes: green and red light combination, green and infrared light combination, and red and infrared light combination. After filtering and amplification, the reflectivity parameters are processed and the reflectivity parameter values ​​are written into the memory.

[0017] Furthermore, the third current of the photodiode is detected, and the assembly quality of the electronic device is judged based on the reflectivity parameters, the first current, and the third current.

[0018] Secondly, this application also provides a testing apparatus for an electronic device, which employs the aforementioned electronic device testing method. The testing apparatus includes:

[0019] The housing includes a base and an outer cover, the outer cover being fitably disposed on the base;

[0020] A placement component is disposed within a housing and has an electronic device placement section.

[0021] The detection component is housed within the housing and includes a data connection cable, a beam acquisition component, a light-absorbing material, and a reflective material. Both the light-absorbing and reflective materials can move relative to the component.

[0022] The technical solutions provided in this application have the following advantages compared with the prior art:

[0023] This application provides a testing method and apparatus for electronic devices. The testing method includes: placing the electronic device inside an electronic testing device, the electronic device including at least a first light source and a light source outlet; blocking the light source outlet with a light-absorbing material; detecting the first current of the photodiode in the electronic device; turning on the first light source and collecting the driving current of the first light source to determine whether the driving circuit of the first light source is working properly; if the driving circuit of the first light source is working properly, detecting the second current of the photodiode; and determining whether the electronic device leaks light based on the relationship between the magnitudes of the first and second currents. If the first current is greater than or equal to the second current, the electronic device does not leak light; if the first current is less than the second current, the electronic device leaks light. By using a light-absorbing material to block the light source outlet, the light emitted by the first light source of the electronic device can be absorbed. On the other hand, it can prevent external light sources from entering the electronic device and affecting the induced current generated inside the photodiode. This makes the test more accurate and avoids internal light leakage in the electronic device. This application effectively solves the problem in the prior art that electronic products cannot be tested for the overall PPG function after assembly. Attached Figure Description

[0024] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0025] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, for those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0026] Figure 1 A schematic flowchart of an electronic device testing method according to an embodiment of this application is shown;

[0027] Figure 2 A schematic diagram of the process structure of an electronic device testing apparatus according to an embodiment of this application is shown;

[0028] Figure 3 It shows Figure 2 A three-dimensional structural diagram of an electronic device testing apparatus;

[0029] Figure 4 It shows Figure 2 A partial structural diagram of an electronic device testing apparatus.

[0030] Figure 5 A schematic diagram of the internal structure of an electronic device provided in an embodiment of this application is shown.

[0031] The above figures include the following reference numerals:

[0032] 1. Display device; 2. Industrial computer; 3. Mouse; 4. Keyboard; 5. Barcode scanner; 6. Server; 7. Detection component; 8. Anti-fool hole; 9. Photodiode; 10. First light source; 11. Second light source; 12. Serial information; 13. Connection terminal; 14. Main board; 15. Positioning spring; 16. Positioning block; 17. Height-adjustable screw; 18. First cylinder; 19. Second cylinder; 20. Pressing module; 21. Guide rod; 22. Telescopic rod; 23. Third cylinder; 24. Solenoid valve; 25. Reflective material; 26. Light-absorbing material; 27. Guide post; 29. ​​Pressure gauge; 30. Pin; 31. Anti-compression spring; 32. Main control board. Detailed Implementation

[0033] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0034] It should be noted that the following detailed descriptions are illustrative and intended to provide further explanation of this application. Unless otherwise specified, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains.

[0035] For ease of description, spatial relative terms such as "above," "on top of," "on the upper surface of," "above," etc., are used herein to describe the spatial positional relationship of a device or feature as shown in the figures to other devices or features. It should be understood that spatial relative terms are intended to encompass different orientations in use or operation beyond the orientation of the device as described in the figures. For example, if the device in the figures were inverted, a device described as "above" or "on top of" other devices or structures would subsequently be positioned as "below" or "under" other devices or structures. Thus, the exemplary term "above" can include both "above" and "below." The device may also be positioned in other different ways, rotated 90 degrees, or in other orientations, and the spatial relative descriptions used herein will be interpreted accordingly.

[0036] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0037] like Figure 1 As shown in the embodiment of this application, an electronic device testing method is provided, comprising: placing the electronic device in an electronic testing device, the electronic device including at least a first light source 10 and a light source outlet; blocking the light source outlet with a light-absorbing material 26; detecting the first current of the photodiode 9 of the electronic device; turning on the first light source 10 and collecting the driving current of the first light source 10 to determine whether the driving circuit of the first light source 10 is working normally; if the driving circuit of the first light source 10 is working normally, detecting the second current of the photodiode 9; and determining whether the electronic device leaks light based on the relationship between the magnitudes of the first current and the second current. If the first current is greater than or equal to the second current, the electronic device does not leak light; if the first current is less than the second current, the electronic device leaks light. By using a light-absorbing material 26 to block the light source outlet, the light emitted by the first light source 10 of the electronic device can be absorbed. On the other hand, it can prevent external light sources from entering the interior of the electronic device and affecting the induced current generated inside the photodiode 9. This test is more accurate and avoids internal light leakage in the electronic device. This application effectively solves the problem in the prior art that electronic products cannot be tested for the overall PPG function after assembly.

[0038] It should be noted that the light-absorbing material 26 can be a flexible black foam or a black colloid that can form a transitional fit with the light source outlet. The light-absorbing material 26 can absorb light. When the first light source 10 is assembled correctly, the light emitted will be completely absorbed by the light-absorbing material 26. At this time, there is no internal reflection of the electronic device and no external light source influence. The actual beam of light received by the photodiode 9 is small and stable. The first current is collected when the first light source 10 is not turned on, that is, the first current is the current value of the photodiode 9 in its initial state. The second current is measured when the first light source 10 is turned on. If the second current increases, that is, the photodiode 9 absorbs other beams of light, resulting in a relative increase in current, it can be determined that there is light leakage inside the electronic device. The electronic device is specifically a wearable electronic device, such as a smartwatch, smart bracelet, smart glasses, smart ankle bracelet, smart ring, etc.; the electronic device can also be a non-wearable electronic device, such as a finger clip pulse oximeter, facial recognition device, and fingerprint lock, etc., and the electronic watch has a PPG sensing physiological detection function.

[0039] In this embodiment, turning on the first light source 10 further includes emitting at least one of green light, red light, and infrared light. Taking a smartwatch as an example, the above three types of light can meet the requirements, resulting in a cost-effective smartwatch and a correspondingly efficient testing method.

[0040] In this embodiment, the frequency of the light beam emitted by the electronic detection device is between 25.6Hz and 256Hz, and the duty cycle of the beam is 10% or 20%. Since the effective spectrum of the human heart rate PPG signal is mainly concentrated between 0.8Hz and 8Hz, according to the Nais sampling theorem, the sampling multiple is set to 32 times, i.e., 256Hz.

[0041] In this embodiment, the duration of light emission by the electronic detection device is between 6 seconds and 30 seconds. The requirements are met by testing the duration described above. The emission time of 6 seconds to 30 seconds refers to the total emission time, with each monochromatic wavelength emitting light for 20 milliseconds to 100 milliseconds. In this embodiment, a duration of 10 seconds is used. It should be noted that the above tests use different currents and frequencies. The electronic device emits one of green, red, or infrared light, which is reflected by a reflective component to the photodiode 9 of the electronic device. This allows detection of whether the green, red, infrared, and LED light of the electronic device are normal, as well as whether the photodiode 9 is functioning correctly, and whether the coordination between the green, red, infrared, and LED light and the photodiode 9 is normal.

[0042] In the technical solution of this embodiment, if light leakage is determined in the electronic device, the electronic device testing method further includes: determining the type of light leakage based on the light path between the first light source 10 and the light-absorbing material 26. If the light path between the first light source 10 and the light-absorbing material 26 is correct, the light leakage in the electronic device is a component quality problem; if the light path between the first light source 10 and the light-absorbing material 26 is incorrect, the light leakage in the electronic device is an assembly quality problem. There are two situations for light leakage in electronic devices. The first situation is that the light-absorbing material 26 used for sealing is damaged, leading to light leakage. The second situation is that the assembly materials of the electronic device are damaged or there are gaps between the components, i.e., an assembly problem, leading to light leakage. The detection light path is used to determine whether it is an assembly problem. Replacing the light-absorbing material 26 can eliminate the influence of damaged sealing material. If neither of these is a problem, it is considered that the assembly materials of the electronic device had a problem in a previous process.

[0043] In the technical solution of this embodiment, if it is determined that the electronic device does not leak light, the light-absorbing material 26 is moved out of the light source outlet, and the reflective material 25 is moved to a position 12mm to 24mm directly opposite the light source outlet. After the light leakage detection is completed, it is necessary to further detect the reflectivity. In the actual application of PPG, the reflectivity of the human body is used as the data basis. The detection of reflectivity can simulate the light reflected by human tissues such as skin, bones, and blood vessels. Human tissues have relatively large differences in the absorption of red light, infrared light, and green light wavelengths, and can be detected by combining multiple light sources.

[0044] In this embodiment, the electronic device emits a combination of multiple light sources, including combinations of green and red light, green and infrared light, and red and infrared light. These combinations are then filtered and amplified before detection. In practical use, the electronic device requires a combination of multiple light sources to ensure its proper functioning. The filtering effect and amplifier functionality can be detected.

[0045] It should be noted that photodiode 9 is a commonly used photodetector, capable of reflecting the intensity of irradiated light through the magnitude of photocurrent. However, under LED illumination, the output signal of photodiode 9 is extremely weak, while the current change caused by blood absorption is a very weak current in the nA range. Simultaneously, due to noise factors such as power frequency interference and ambient light, the PPG signal needs signal conditioning before sampling by the ADC. This includes: using a transimpedance amplifier to convert the weak photocurrent signal into a larger voltage signal, using a bandpass filter to filter out power frequency interference and baseline drift caused by respiration, and suppressing the influence of ambient light, etc. Therefore, the current signal of photodiode 9 needs to be filtered through a 0.2Hz to 8Hz bandpass filter to remove out-of-band noise from the PPG signal before detecting the signal-to-noise ratio (SNR) at 30x, 60x, 180x, and 480x amplification. The main control board 32 detects the current amplified by 30x, 60x, 180x, and 480x after the photodiode 9 passes through the 0.2Hz to 8Hz bandpass filter, which is used for background noise detection of the electronic equipment.

[0046] In this embodiment, the combined light includes combinations of green and red light, green and infrared light, and red and infrared light. These are then processed through filtering and amplification to determine reflectivity parameters, which are written into a memory. The durations, driving currents, and frequencies of the two combined light sources differ, allowing for the generation of multiple sets of data to mutually verify the authenticity of the data.

[0047] In this embodiment, the third current of the photodiode 9 is detected, and the assembly quality of the electronic device is judged based on the reflectivity parameters, the first current, and the third current. The third current reflects the reflectivity of the photodiode 9. After ruling out any abnormalities in the reflective material 25, the third current of the photodiode reflects the overall assembly condition of the electronic device.

[0048] It should be noted that further analysis of the reflection path and angle of the reflective material 25 is needed to determine the problems with the electronic device. Specifically, when the assembly of the electronic device is misaligned, the angle and distance of light from different colored light sources hitting the reflective material 25 will shift, causing the path and angle of the beam reflected from the reflective material 25 to the photodiode 9 to also deflect. This can be used to determine whether the assembly quality of the electronic device is up to standard. When a crack appears at the light source outlet, it is equivalent to increasing the outlet area (in the case of light-absorbing material 26 blocking the crack during light leakage detection). At this time, the intensity of the reflected beam increases, which will increase the value of the third current. When the light source outlet is dirty, the area through which the beam can pass will be directly reduced. In this case, the measured third current will be lower, and the light source outlet needs to be cleaned. If the third current value is still lower than the reasonable current value after cleaning the dirt at the light source outlet, it is necessary to consider whether the light source has been contaminated, resulting in a relatively low light intensity and affecting the magnitude of the third current.

[0049] Secondly, this application also provides a testing device for electronic devices. The testing device adopts the above-mentioned testing method for electronic devices. The testing device includes: a housing, which includes a base and an outer cover, the outer cover being disposed on the base; a placement component, which is disposed inside the housing and has an electronic device placement part; and a detection component 7, which is disposed inside the housing and includes a data connection line, a beam acquisition component, a light-absorbing material 26, and a reflective material 25, both of which can move relative to the placement component.

[0050] It should be noted that, in the technical solution of this embodiment, as... Figure 5 As shown, the electronic device specifically includes two anti-foolproof holes 8, four photodiodes 9, four first light sources 10 and one second light source 11, sequence information 12, connection terminals 13, and a device motherboard 14. The first light sources 10 are LEDs that can emit red, green, and infrared light. The second light source 11 is a detection light source, also using LEDs, used to detect whether the part being used is in place. During assembly, the photodiodes 9 and the first light sources 10 can only be illuminated and reflected through their light source outlets. When the relative positions of the light source outlets shift, a portion of the beam emitted by the first light source 10 will be blocked, thus reducing the accuracy of physiological data monitoring. When gaps appear during the pressing of the device motherboard 14 with the device casing, or when the black foam surrounding the photodiodes 9 is damaged, internal light leakage will occur when the first light source 10 emits light, further affecting the measurement accuracy.

[0051] like Figure 2As shown, in this embodiment, the electronic device testing device further includes a display device 1, an industrial computer 2, a mouse 3, a keyboard 4, a power cord, a video cable, a USB cable, a testing component 7, an air hose, and an Ethernet cable. The video interface and peripheral interface of the industrial computer 2 are connected to the display device 1, mouse 3, and keyboard 4 respectively via the video cable and USB cable, serving as an input / output platform for human-computer interaction. The industrial computer 2 is connected to the testing component 7 via the USB cable for USB communication using the USB communication protocol. The industrial computer 2 and the testing component 7 are connected to the factory production network server 6 via an Ethernet cable. The upper part of the testing component 7 is a closed metal shell (for light shielding and electromagnetic interference shielding), inside which are a cylinder module, a pin 30 interface module, and a spring buffer module. The middle of the testing component 7 is a drawer-type support frame with a linear slide rail. The front of the device is equipped with a set of status indicator lights, a selection switch, a pressure gauge 29, a power indicator light, and an emergency stop button. The USB interface on the back of the detection component 7 is connected to the industrial computer 2, the air source input port is connected to the external constant pressure air pipe to provide air source for the internal cylinder, and the external 220V AC power interface provides power for the entire device.

[0052] like Figure 3 and Figure 4 As shown, the technical solution in this embodiment includes two guide rods 21, four height-adjustable screws 17, four positioning springs 15, an anti-compression spring 31, and a positioning block 16. The specific workflow is as follows:

[0053] The components of the electronic device are arranged according to Figure 5 The electronic equipment is assembled in a certain way. The electronic equipment is transferred from the production line to the test station. The test operator or automated robotic arm places the electronic equipment under test under the barcode scanning device 5 to scan the serial information 12 of the electronic equipment under test, reads the serial number of the electronic equipment under test, and sends the serial number to the PPG reflection and light leakage test program in the industrial computer 2.

[0054] Then, the test operator or the automated mechanical linkage pulls out the bracket and places the electronic device into the pull-out bracket. The anti-foolproof hole 8 of the electronic device is magnetically fixed to the bracket by the magnetic anti-foolproof positioning post on the bracket to reduce shaking (if the electronic device is placed backwards, it will not be able to be put in and will tilt up). The test operator or the automated mechanical linkage pushes the pull-out bracket in until it touches the bracket limit block. The limit block I / O electrical signal is transmitted to the main control board.

[0055] The test operator clicks the "Start" icon on the PPG reflective light leakage test program UI interface in the industrial computer 2. The PPG reflective light leakage test program sends a test start command to the main control board 32 of the detection component 7 via USB. After receiving the test command, the main control board 32 first checks whether the bracket has reached the limit block to prevent the electronic device under test from not being placed properly or not reaching the limit block (if the pressure module 20 is pressed down, it will damage the fixture and electronic device).

[0056] The main control board 32 controls the solenoid valve 24 to operate, causing the third cylinder 23 to move horizontally and smoothly downwards along the telescopic rod 22 and the four guide rods 21. The guide post 27 of the pressing module 20 continues to move downwards along the guide hole on the electronic device carrier. The anti-pressure spring 31 and the height-adjustable screw 17 press and hold the electronic device carrier until the positioning block 16 and the positioning component on the carrier are initially positioned. This avoids the failure of the initial positioning. The anti-pressure spring 31 acts as a buffer to prevent the electronic device from being damaged by hard pressure. The height-adjustable screw 17 adjusts the overpressure stroke and pressure to protect the electronic device. After the positioning block 16 and the positioning component complete the initial positioning, they will send an I / O signal to the main control board 32 indicating that the limit position has been successfully reached. If the initial positioning of the positioning block 16 and the positioning component fails, it will send an I / O signal indicating that the initial positioning has failed to the main control board to prevent the third cylinder 23 on the pressing module 20 from continuing to press down and damage the terminal pins 30 on the electronic device.

[0057] After the main control board 32 detects that the positioning block 16 and the positioning component have been initially positioned successfully, it controls the solenoid valve 24 to move, causing the third cylinder 23 on the pressing module 20 to move downward. The precision positioning spring 15 and the precision positioning equal-height screw spring on the pressing module 20 align with the protrusion on the electronic device to complete the precision positioning until the pin 30 on the precision positioning cylinder module connects with the connection terminal 13 on the electronic device to complete the pin 30 interface docking. Then, the electrical connection between the main control board 32 and the electronic device forms a control circuit. The main control board 32 controls the solenoid valve 24 to work, causing the second shaft cylinder 19 to rise 12mm, keeping the light-absorbing material 26 at a constant pressure to block the light source opening on the back of the electronic device, so that the light generated by the first light source 10 will not leak outward, and the photodiode 9 will not receive light, thus blocking the influence of external light on the reflection and light leakage of the watch PPG module.

[0058] The main control board 32 controls the first light source 10 to have no output, detects the first current of the photodiode 9, which is the static dark current. The main control board 32 provides power to the electronic device and controls the four groups of first light sources 10 on the main board 14 to emit red light, infrared light, and green light respectively at a frequency of 256Hz and a duty cycle of 10% (since the effective spectrum of the human heart rate PPG signal is mainly concentrated between 0.8Hz and 8Hz, according to the Nais sampling theorem, the sampling multiple is set to 32 times, i.e., 256Hz), for a duration of 10s. The drive current of the four groups of first light sources 10 is detected to determine... Is the driving circuit of the first light source 10 working properly? Detect the current of the photodiode 9. The current at this time is the second current. Compare the current values ​​of the first current and the second current. If the values ​​of the first current and the second current exceed the specified range, that is, there is light leakage in the photodiode 9. When the second current is too large, it may be that the light-absorbing material 26 around the photodiode 9 is damaged or there is a gap between the PPG motherboard and the back of the watch, resulting in light leakage. Then, based on the light path between the photodiode 9 and the first light source 10, determine whether the light leakage of the electronic device is an assembly quality problem or a PPG motherboard material quality problem.

[0059] After the main control board 32 detects the PPG light leakage program of the watch, it controls the second cylinder 19 to move downwards back to the original limit position, and then controls the first cylinder 18 to move to the right until the right limit position. At this time, the reflective material 25 is directly below the electronic device. The reflective material 25 is a reflective card. The side of the reflective card facing the electronic device is 12mm above the vertical center of the electronic device.

[0060] Next, the electronic device needs to undergo a reflection test. The main control board 32 controls the first light source 10 to emit red light, infrared light, and green light sequentially at a frequency of 256Hz, with duty cycles of 10% and 20% for 10 seconds. The light beam passes through the light source opening and hits the reflective material 25 (simulating the reflection of light from human skin, bones, blood vessels, and other human tissues, which have different absorption rates for red, infrared, and green light wavelengths). The main control board 32 detects the current amplified by the photodiode 9 by 30, 60, 180, and 480 times after passing through a bandpass filter from 0.2Hz to 8Hz. At the same time, it also detects the driving current of the first light source 10 to determine whether the red, infrared, and green light driving of the electronic device is working properly and whether the first light source 10 is emitting light normally (the photodiode 9 receiving the light reflected back from the reflective material 25 indicates that the first light source 10 can emit light; controlling the duty cycle of the first light source 10 controls the luminous intensity of the first light source 10; the current detected by the photodiode 9 is linearly related to the duty cycle of the first light source 10, which can also determine whether the first light source 10 is emitting light normally).

[0061] When the mainboard 14 of the device is misaligned with the base (the angle and distance of the four sets of red, infrared, and green LEDs reflected from the reflective material 25 are relatively offset, and the path and angle of the reflection from the reflective material 25 back to the photodiode 9 are also offset, which will cause a significant change in the photocurrent of the photodiode 9, thereby judging whether the assembly quality is qualified), cracks appear in the light source opening of the base (increasing the light transmission hole, which is equivalent to increasing the intensity of reflected light, which will increase the photocurrent of the photodiode 9), dirt is on the light source opening of the base (reducing the area of ​​the light transmission hole, reducing the photocurrent of the photodiode 9), dirt is on the first light source 10 (reducing the light irradiation intensity, reducing the photocurrent of the photodiode 9), and dirt is on the photodiode 9 (reducing the light receiving area, reducing the photocurrent of the photodiode 9), all of these can be detected by test parameters. Therefore, the reflection test can detect the assembly quality of the electronic device, the reflective performance of the electronic device (calculating heart rate and blood oxygen saturation based on Lambert-Beer's law and diffusion transport theory), whether there are cracks in the base on the back of the electronic device, the consistency of the incoming materials of the base on the back of the electronic device (inconsistent light source opening size and material may cause changes in reflective characteristics), and whether there is dirt inside and outside the electronic device. It achieves the purpose of testing the reflection and light leakage of electronic devices.

[0062] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the exemplary embodiments according to this application. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0063] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0064] The above description is merely a specific embodiment of the present invention, enabling those skilled in the art to understand or implement the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A method for testing electronic devices, characterized in that, include: An electronic device is placed inside an electronic testing device, wherein the electronic device includes at least a first light source and a light source outlet; The light-absorbing material is used to block the light source outlet, and the first current of the photodiode of the electronic device is detected. Turn on the first light source and collect the driving current of the first light source to determine whether the driving circuit of the first light source is working properly. If the driving circuit of the first light source is working normally, the second current of the photodiode is detected. Based on the relationship between the magnitude of the first current and the second current, it is determined whether the electronic device leaks light. If the first current is greater than or equal to the second current, the electronic device does not leak light. If the first current is less than the second current, the electronic device leaks light. If it is determined that the electronic device is leaking light, the electronic device testing method further includes: determining the type of light leakage based on the light path between the first light source and the light-absorbing material; if the light path between the first light source and the light-absorbing material is correct, then the light leakage of the electronic device is a component quality problem; if the light path between the first light source and the light-absorbing material is incorrect, then the light leakage of the electronic device is an assembly quality problem. If it is determined that the electronic device does not leak light, the light-absorbing material is removed from the light source outlet, and the reflective material is moved to a position 12mm to 24mm directly opposite the light source outlet; The third current of the photodiode is detected, and the assembly quality of the electronic device is determined based on the first current and the third current. The first light source is controlled to emit red light, infrared light, and green light sequentially at a frequency of 256Hz, with duty cycles of 10% and 20% for 10s respectively. The light beam passes through the light source outlet and hits the reflective material. The current of the photodiode is amplified by 30 times, 60 times, 180 times, and 480 times after passing through a bandpass filter from 0.2Hz to 8Hz. At the same time, the driving current of the first light source is also detected to determine whether the red light, infrared light, and green light driving of the electronic device is working properly. If the photodiode receives the light reflected back from the reflective material, the first light source can emit light. If the current detected by the photodiode is linearly related to the duty cycle of the first light source, the first light source is emitting light normally.

2. The electronic device testing method according to claim 1, characterized in that, Turning on the first light source further includes: the first light source emitting at least one of green light, red light, and infrared light.

3. The electronic device testing method according to claim 2, characterized in that, The frequency of the light beam emitted by the electronic device is between 25.6 Hz and 256 Hz, and the duty cycle of the light beam is 10% or 20%.

4. The electronic device testing method according to claim 3, characterized in that, The duration of light emission by the electronic device is between 6 seconds and 30 seconds.

5. The electronic device testing method according to claim 1, characterized in that, The electronic device emits a combination of multiple types of light, including a combination of green and red light, a combination of green and infrared light, and a combination of red and infrared light, which is then detected after filtering and amplification.

6. The electronic device testing method according to claim 5, characterized in that, The combined light includes: green and red light combination, green and infrared light combination, and red and infrared light combination. After filtering and amplification, the reflectivity is processed, and the reflectivity parameter values ​​are written into the memory.

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