Energy acquisition method and device of flicker pulse, electronic equipment and storage medium

Abstract

The application relates to the technical field of radiation detection, and particularly discloses a method and device for acquiring the energy of a scintillation pulse, electronic equipment and a storage medium. The method comprises the following steps: presetting a plurality of main threshold values and a plurality of subthreshold values, and forming a plurality of main threshold value intervals divided by the main threshold values, and a plurality of subthreshold value intervals divided by the subthreshold values in each main threshold value interval; determining the highest main threshold value crossed by a to-be-detected pulse and time information of the highest main threshold value; determining the pulse width corresponding to the highest main threshold value crossed by the to-be-detected pulse according to the time information; determining the pulse width interval in which the pulse width corresponding to the highest main threshold value crossed by the to-be-detected pulse is located; and determining the energy information of the to-be-detected pulse according to the corresponding relationship between the pulse width interval and the subthreshold value interval in the main threshold value interval where the highest main threshold value is located, and the corresponding relationship between the threshold value and the energy. The energy information of the pulse can be obtained without fitting the pulse waveform, and hardware resources are saved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of radiation detection, and in particular to a method and device for acquiring energy of a scintillation pulse, an electronic device and a storage medium. BACKGROUND

[0002] High-energy rays can be applied to various detection scenarios such as security checks, food safety, geological exploration, nuclear medicine, etc. High-energy rays (such as X-rays and gamma rays) are usually detected using a scintillation detector. The working principle of the scintillation detector is that a large number of visible light photons are generated after high-energy rays are deposited in a scintillation crystal, which can be responded by a photoelectric conversion device. An electric signal is then output by the photoelectric conversion device, and subsequent processing of the electric signal can obtain information such as energy and time of the high-energy rays.

[0003] In the prior art, the data collected by the detector is usually uploaded to a server for data processing, which undoubtedly occupies a large amount of CPU resources. In order to avoid occupying too many CPU resources, a board-level fitting method has appeared in the prior art for digitizing the electric signal, i.e., fitting is not performed on the server, but on the chip board of the detector such as FPGA (field programmable gate array chip) and DSP (digital signal processing chip). In the board-level fitting, a corresponding scintillation pulse shape feature model is first obtained, and then a series of time and voltage information collected is fitted according to the above model on the FPGA to restore the single pulse function, and the energy information of the pulse is calculated in an accumulated manner. Although the above board-level fitting method can relieve the pressure on the CPU, the pulse fitting on the FPGA, ASIC, etc. using the mathematical model still needs to restore the pulse waveform by solving equations, and then the energy information is obtained by integrating the fitted waveform, and then the energy spectrum is drawn. This process still occupies too many hardware resources and is relatively complex, resulting in high power consumption of the chip. SUMMARY

[0004] Therefore, it is necessary to provide a method and device for acquiring energy of a scintillation pulse, an electronic device and a computer readable storage medium to solve the above problems.

[0005] According to a first aspect of the embodiments of the present application, a method for acquiring energy of a scintillation pulse is provided. The method comprises: presetting a plurality of main threshold values and a plurality of sub threshold values, and forming a plurality of main threshold value intervals divided by the main threshold values, and a plurality of sub threshold value intervals divided by the sub threshold values in each main threshold value interval; determining a highest main threshold value crossed by a to-be-measured pulse, and time information of the to-be-measured pulse crossing the highest main threshold value; determining a pulse width corresponding to the highest main threshold value exceeded by the to-be-measured pulse according to the time information of the to-be-measured pulse crossing the highest main threshold value; determining a pulse width interval in which the pulse width corresponding to the highest main threshold value exceeded by the to-be-measured pulse is located; and determining energy information of the to-be-measured pulse according to a corresponding relationship between the pulse width interval and a sub threshold value interval in a main threshold value interval in which the highest main threshold value is located, and a corresponding relationship between threshold values and energies.

[0006] In one of the embodiments, the main threshold values and the sub threshold values all correspond to pulse energies, each of the main threshold value intervals corresponds to an energy segment, and each of the sub threshold value intervals corresponds to an energy channel address.

[0007] In one of the embodiments, the number of energy channel addresses in each energy segment is the same or different.

[0008] In one of the embodiments, the step of determining the time information of the to-be-measured pulse crossing the highest main threshold value comprises: determining a first time value at which the to-be-measured pulse crosses the highest main threshold value in a rising stage, and a second time value at which the to-be-measured pulse crosses the highest main threshold value in a falling stage.

[0009] In one of the embodiments, the pulse width corresponding to the highest main threshold value exceeded by the to-be-measured pulse is a time interval between the second time value and the first time value.

[0010] In one of the embodiments, the step of determining the energy information of the to-be-measured pulse according to the corresponding relationship between the pulse width interval and the sub threshold value interval in the main threshold value interval in which the highest main threshold value is located, and the corresponding relationship between the threshold values and the energies comprises: determining a sub threshold value interval in which an amplitude of the to-be-measured pulse falls according to the corresponding relationship between the pulse width interval and the sub threshold value interval in the main threshold value interval in which the highest main threshold value is located; and determining an energy channel address in which the amplitude of the to-be-measured pulse falls according to a corresponding relationship between the sub threshold value intervals and the energy channel addresses, wherein the corresponding relationship between the sub threshold value intervals and the energy channel addresses is obtained according to the corresponding relationship between the threshold values and the energies.

[0011] In one of the embodiments, the main threshold value interval in which the highest main threshold value is located is a main threshold value interval with the highest main threshold value as a lower limit value.

[0012] In one of the embodiments, the energy acquisition method further comprises the step of acquiring the correspondence between the pulse width interval and the sub-threshold interval: according to the correspondence between the threshold value and the energy, determining the energy corresponding to the sub-threshold values at both ends of the sub-threshold interval; acquiring the known pulse corresponding to the energy corresponding to the pulse amplitude of the sub-threshold values at both ends of the sub-threshold interval; when the known pulse exceeds the lower limit value of the main threshold interval where the sub-threshold interval is located, determining the pulse width corresponding to the lower limit value to establish the correspondence between the pulse width and the sub-threshold value; and according to the correspondence between the pulse width and the sub-threshold value, determining the correspondence between the pulse width interval and the sub-threshold interval.

[0013] In one of the embodiments, the energy acquisition method further comprises the step of acquiring the correspondence between the pulse width interval and the sub-threshold interval: using simulation software to set the amplitudes of the to-be-tested pulses to be the sub-threshold values at both ends of the sub-threshold interval; when the to-be-tested pulses with different amplitudes exceed the lower limit value of the main threshold interval where the sub-threshold interval is located, sampling and acquiring the pulse width corresponding to the lower limit value to establish the correspondence between the pulse width and the sub-threshold value; and according to the correspondence between the pulse width and the sub-threshold value, determining the correspondence between the pulse width interval and the sub-threshold interval.

[0014] In one of the embodiments, the energy acquisition method further comprises the step of acquiring the correspondence between the threshold value and the energy: collecting a preset number of pulses, and acquiring the amplitudes of the pulses; integrating the pulses to acquire the energy of the pulses; and acquiring the correspondence between the pulse amplitude and the energy, wherein the pulse amplitude is the same as the preset threshold attribute.

[0015] According to a second aspect of the embodiments of the present application, a device for acquiring the energy of a flickering pulse is provided, which comprises: a threshold setting module, configured to preset a plurality of main threshold values and a plurality of sub-threshold values, and form a plurality of main threshold intervals divided by the main threshold values, and a plurality of sub-threshold intervals divided by the sub-threshold values in each main threshold interval; a first determining module, configured to determine the highest main threshold value crossed by a to-be-tested pulse, and time information of crossing the highest main threshold value; a second determining module, configured to determine the pulse width corresponding to the highest main threshold value crossed by the to-be-tested pulse according to the time information of crossing the highest main threshold value; a third determining module, configured to determine the pulse width interval where the pulse width corresponding to the highest main threshold value crossed by the to-be-tested pulse is located; and an energy determining module, configured to determine the energy information of the to-be-tested pulse according to the correspondence between the pulse width interval and the sub-threshold interval in the main threshold interval where the highest main threshold value is located, and the correspondence between the threshold value and the energy.

[0016] In one of the embodiments, the main threshold value and the sub-threshold value both correspond to the pulse energy, each main threshold interval corresponds to each energy segment, and each sub-threshold interval corresponds to each energy channel address.

[0017] In one of the embodiments, the number of energy channel addresses in each energy segment is the same or different.

[0018] In one of the embodiments, to determine the highest main threshold value crossed by the to-be-tested pulse and the time information of crossing the highest main threshold value, the first determining module is configured to determine a first time value at which the to-be-tested pulse crosses the highest main threshold value in the rising stage and a second time value at which the to-be-tested pulse crosses the highest main threshold value in the falling stage.

[0019] In one of the embodiments, the second determining module is configured to take the time interval between the second time value and the first time value as the pulse width corresponding to the highest main threshold value crossed by the to-be-tested pulse.

[0020] In one of the embodiments, to determine the energy information of the to-be-tested pulse, the energy determining module is configured to determine the sub-threshold value interval in which the amplitude of the to-be-tested pulse falls according to the correspondence between the pulse width interval and the sub-threshold value interval in the main threshold value interval in which the highest main threshold value is located; and determine the energy channel address in which the amplitude of the to-be-tested pulse falls according to the correspondence between the sub-threshold value interval and the energy channel address, wherein the correspondence between the sub-threshold value interval and the energy channel address is obtained according to the correspondence between the threshold value and the energy.

[0021] In one of the embodiments, the energy determining module is configured to set the main threshold value interval in which the highest main threshold value is the lower limit value as the main threshold value interval in which the highest main threshold value is located.

[0022] In one of the embodiments, the energy acquisition device further comprises a first acquisition module, which is configured to determine the energy corresponding to the sub-threshold values at both ends of the sub-threshold value interval according to the correspondence between the threshold value and the energy; acquire a known pulse corresponding to the energy corresponding to the sub-threshold values at both ends of the sub-threshold value interval; determine the pulse width corresponding to the lower limit value of the main threshold value interval in which the sub-threshold value interval is located when the known pulse exceeds the lower limit value, so as to establish the correspondence between the pulse width and the sub-threshold value; and determine the correspondence between the pulse width interval and the sub-threshold value interval according to the correspondence between the pulse width and the sub-threshold value.

[0023] In one of the embodiments, the energy acquisition device further comprises a first acquisition module, which is configured to set the amplitudes of the to-be-tested pulses as the sub-threshold values at both ends of the sub-threshold value interval by using simulation software; acquire the pulse width corresponding to the lower limit value of the main threshold value interval in which the sub-threshold value interval is located when the to-be-tested pulses with different amplitudes exceed the lower limit value, so as to establish the correspondence between the pulse width and the sub-threshold value; and determine the correspondence between the pulse width interval and the sub-threshold value interval according to the correspondence between the pulse width and the sub-threshold value.

[0024] In one embodiment, the energy acquisition device further comprises a second acquisition module configured to: collect a preset number of pulses, and acquire the amplitude of each pulse; integrate each pulse to acquire the energy of each pulse; and acquire the correspondence between the amplitude of a pulse and the energy of the pulse, the amplitude of the pulse being the same as the preset threshold attribute.

[0025] According to a third aspect of the embodiments of the present application, an electronic device is provided, which comprises a memory, a processor, and a computer program stored in the memory and executable on the processor, and when the computer program is executed by the processor, the steps of the energy acquisition method of the flickering pulse are implemented.

[0026] According to a fourth aspect of the embodiments of the present application, an electronic device is provided, which comprises the energy acquisition device of the flickering pulse as described above.

[0027] According to a fifth aspect of the embodiments of the present application, a computer readable storage medium is provided, which stores a computer program, and when the computer program is executed by a processor, the steps of the energy acquisition method of the flickering pulse are implemented.

[0028] The energy acquisition method of the flickering pulse, a plurality of main threshold values are preset, and a plurality of main threshold value intervals are formed by the main threshold values, a plurality of sub threshold values are preset in each main threshold value interval, and a plurality of sub threshold value intervals are formed by the sub threshold values, when sampling the to-be-tested pulse, the highest main threshold value crossed by the to-be-tested pulse and the time information of crossing the highest main threshold value are determined, the main threshold value interval in which the amplitude of the to-be-tested pulse falls is determined, further, the pulse width corresponding to the highest main threshold value crossed by the to-be-tested pulse is determined according to the time information of crossing the highest main threshold value, and then the pulse width interval in which the pulse width falls is determined, and then the sub threshold value interval in which the amplitude of the to-be-tested pulse falls is determined according to the correspondence between the pulse width interval and the sub threshold value interval, and then the energy information of the to-be-tested pulse is determined according to the correspondence between the threshold value and the energy. Thus, the energy information of the pulse can be obtained without fitting the pulse waveform by solving the equation set to obtain the function curve, the acquisition process of the pulse energy is simplified, the hardware resources are saved, complex calculation is not needed, the chip power consumption is reduced, and when applied in a high temperature environment, the tolerance of the chip to high temperature can be significantly improved. BRIEF DESCRIPTION OF DRAWINGS

[0029] Figure 1 A flowchart of the energy acquisition method of the flickering pulse is provided for an embodiment of the present application;

[0030] Figure 2 A diagram for the division of the main threshold value is provided;

[0031] Figure 3 A flow chart for obtaining the corresponding relationship between the pulse width interval and the threshold interval in an embodiment of the present application is shown in FIG. 1;

[0032] Figure 4 A flow chart for obtaining the corresponding relationship between the pulse width interval and the threshold interval in another embodiment of the present application is shown in FIG. 2;

[0033] Figure 5 A flow chart for obtaining the corresponding relationship between the threshold and the energy in another embodiment of the present application is shown in FIG. 3;

[0034] Figure 6 A structural block diagram of the energy obtaining device of the scintillation pulse provided in an embodiment of the present application is shown in FIG. 4;

[0035] Figure 7 A structural block diagram of the electronic device provided in an embodiment of the present application is shown in FIG. 5. DETAILED DESCRIPTION

[0036] In order to facilitate the understanding of the present application, the present application will be described in more detail below with reference to the relevant drawings. The preferred embodiments of the present application are shown in the drawings. However, the present application can be realized in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0037] In the present application, unless otherwise explicitly specified and limited, the terms "mounting", "connecting", "connecting", "fixing" and the like should be understood in a broad sense, for example, can be fixedly connected, or can be detachably connected, or can be integrated; can be mechanically connected, or can be electrically connected; can be directly connected, or can be indirectly connected through an intermediate medium; can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0038] The terms "first", "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with "first", "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "multiple" is at least two, for example, two, three, etc., unless otherwise explicitly specified and limited.

[0039] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description herein is for describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0040] High-energy rays can be applied to various detection scenarios such as security inspection, food safety, geological exploration, nuclear medicine, etc. The detection of high-energy rays (such as X-rays and gamma rays) usually requires the use of a scintillation detector. For example, in the case of pulsed neutron logging in geological exploration, the principle is to use pulsed neutrons to interact with different elements in the formation to release gamma rays, and the corresponding energy spectrum information, time spectrum information or position information can be obtained according to the detected gamma ray information. For example, a scintillation crystal coupled with a photoelectric conversion device is used to deposit the energy of the gamma ray and generate visible light, and the photoelectric conversion device converts the visible light signal into an electrical signal, which is then processed digitally to obtain information such as the energy of the gamma ray. The scintillation crystals currently used are generally BGO, lanthanum bromide, sodium iodide, etc., and the photoelectric conversion device can be a photomultiplier tube (PMT) or a silicon photomultiplier (SiPM) that can work at high temperatures.

[0041] There are two common digitalization methods. The first is a high-speed ADC direct digitalization method, which requires first shaping and broadening the electrical pulse signal, and then using a high-speed ADC (usually with a sampling rate greater than 1 GSps) for digitalization sampling. However, in engineering practice, at least 20 sampling points are needed to obtain relatively accurate energy information for a pulse, and ADC chips that work at high temperatures (such as 175°C) not only have insufficient sampling performance, but also have high costs, so they cannot complete the digitalization of high-speed scintillation pulse signals, especially in oil logging.

[0042] To solve the above-mentioned pulse digitization problem, a MVT (Multi-Voltage Threshold) digitization method is introduced. Compared with the traditional ADC time interval sampling method, in the MVT digitization sampling method, multiple threshold voltages can be set, and only the time when the scintillation pulse passes through the threshold voltage is digitized and sampled, so as to obtain multiple sampling points in the fast rising edge stage and the relatively slow falling edge stage respectively, and each sampling point corresponds to a group of time-voltage pair information. In specific use, after a series of time-voltage pair information is obtained, according to the prior shape information of the scintillation pulse obtained in advance, the pulse fitting method is used to realize the accurate acquisition of the particle energy deposition information. At present, the Levenberg-Marquardt method is one of the optimal algorithms for pulse fitting, and it is also the most widely used nonlinear least squares iteration algorithm. It is a nonlinear optimization method that uses gradient to find the maximum (minimum) value, which is between the Newton method and the gradient descent method, and has the advantages of gradient method and Newton method.

[0043] However, due to the limitation of chip computing power and the complexity of the fitting method, the fitting algorithm of MVT cannot be completed on embedded chips such as FPGA, STM32, DSP, etc., which requires that the original sampling points obtained by the MVT method must be transmitted to the computer through Ethernet, serial port, WiFi, etc. The original sampling point information is transmitted to the computer, and then the energy is calculated through the software iteration algorithm. In the logging process, the scintillation pulse presents the characteristics of periodic burst, and the data volume of the original sampling point can reach 10 Mbps-1 Gbps. Due to the characteristics of the logging scene, such as the depth of thousands of meters underground and high temperature environment, only the carrier communication transmission mode can be used for external transmission, and the bandwidth is only about 100 Kbps. In the existing method, transmitting a large number of original sampling point data will undoubtedly occupy a very high bandwidth, resulting in a decrease in count rate. When fitting on the host computer / server, due to repeated iterations, it takes a very high CPU time to fit each pulse. Therefore, in order to avoid occupying too much CPU resource and reduce the operation pressure of CPU, a board-level fitting method appears in the field, that is, the energy information is calculated quickly on the hardware, for example, it can be fitted on the chip board such as FPGA, DSP, etc. instead of fitting on the server, that is, without using a server or a computer with strong computing power.

[0044] The existing board-level fitting calculation method generally includes:

[0045] According to the coupled scintillation crystal and photoelectric conversion device, a corresponding scintillation pulse shape feature model is obtained. For example, in the case of coupling LaBr3 scintillation crystal and photoelectric conversion device (PMT), without considering the influence of noise, the shape of the scintillation pulse can be described as including a relatively fast rising edge and a relatively slow falling edge, and the corresponding scintillation pulse shape feature model can be considered as the following function mathematical model:

[0046] y=e a x c e bx

[0047] Wherein, y is the amplitude of the scintillation pulse, such as voltage amplitude, x is the time of the scintillation pulse, and a, b, c are three parameters to be determined, that is, a scintillation pulse signal generated by LaBr3 / PMT coupling can be determined by three characteristic values a, b and c.

[0048] When the detector collects a series of time-voltage information, it is fitted and restored on the FPGA according to the above mathematical model. This process is realized on the hardware circuit, and the function of the pulse waveform is fitted by the FPGA, and then the function of the pulse waveform is integrated in an accumulated manner, so that the energy information of the pulse is calculated. After the FPGA completes the calculation of the pulse energy, the energy information is sent to the DSP, and the energy spectrum is drawn by the DSP, so that subsequent specific analysis based on the energy spectrum can be carried out.

[0049] However, when the above mathematical model is used for pulse fitting on hardware circuits such as FPGA and ASCI (special application integrated circuit), the pulse waveform also needs to be restored by solving equations, and then the energy information is obtained by integrating the fitted waveform, and then the energy spectrum is drawn. This process still occupies too many hardware resources and is too complex to calculate, resulting in a large power consumption of the chip. In addition, the high temperature resistance of the chip is affected by the power consumption of the chip, and in the scene of high energy ray detection, such as the scene of geological exploration, the environmental temperature is as high as 175℃. The too complex pulse fitting process will make the chip more intolerant to high temperature due to excessive power consumption.

[0050] To solve the above problems, the present application provides a scintillation pulse energy acquisition method, a scintillation pulse energy acquisition device, an electronic device and a computer readable storage medium.

[0051] Reference Figure 1 In one embodiment, a scintillation pulse energy acquisition method is provided, comprising the following steps:

[0052] Step S200, a plurality of main threshold values and a plurality of subthreshold values are preset, and a plurality of main threshold value intervals divided by the main threshold values and a plurality of subthreshold value intervals divided by the subthreshold values in each main threshold value interval are formed.

[0053] Firstly, a plurality of main threshold values can be preset, and a plurality of main threshold value intervals divided by the main threshold values are formed, and then for each main threshold value interval, a plurality of sub threshold values are set, and a plurality of sub threshold value intervals divided by the sub threshold values are formed in each main threshold value interval, that is, a plurality of large intervals are formed, and a plurality of small intervals are formed in the large intervals. When collecting the pulses subsequently, it can be preliminarily judged that the amplitude of the pulse falls into which large interval, and then it is further determined that the amplitude of the pulse falls into which small interval in the large interval, and then the amplitude of the pulse can be positioned in a relatively accurate threshold value interval. The amplitude of the pulse is usually related to the energy of the pulse, and the relationship can be a relatively obvious linear relationship, so when the amplitude of the pulse is positioned in a relatively accurate threshold value range, the energy interval in which the energy of the pulse is located can be determined according to the corresponding relationship between the amplitude of the pulse and the energy of the pulse.

[0054] In actual application, the values of the main threshold values can be determined according to the energy range of the to-be-measured pulse. Based on the corresponding relationship between the energy of the pulse and the amplitude of the pulse, the energy of the to-be-measured pulse can be divided into a plurality of energy segments, that is, the above-mentioned main threshold value intervals, each main threshold value corresponds to each energy value, and each main threshold value interval corresponds to each energy segment. Similarly, each main threshold value interval can be divided into a plurality of sub threshold value intervals by setting sub threshold values in each main threshold value interval, that is, each energy segment can be divided into a plurality of energy channel addresses by the sub threshold values, each sub threshold value corresponds to each energy value, each sub threshold value interval corresponds to each energy channel address in the energy segment, and the number of energy channel addresses in each energy segment can be the same or different. Subsequently, it is determined that the amplitude of the pulse falls into which sub threshold value interval, that is, it is determined that the amplitude of the pulse falls into which energy channel address in which energy segment, and when the energy channel address in which the amplitude of each pulse is located is determined, a histogram can be drawn according to the number of pulses in each energy channel address, that is, the energy spectrum is obtained.

[0055] Among them, a comparator can be used to compare the threshold value, one comparator corresponds to set one threshold value, the setting of the threshold value can be realized by the DAC, that is, the DAC is used to set a threshold value at the negative end of the corresponding comparator, the other end of the comparator can receive the pulse signal and complete the comparison between the amplitude of the pulse signal and the set threshold value, and when the scintillation pulse crosses the corresponding threshold value, an indication signal is output, so that the time information corresponding to the threshold value can be collected subsequently. In the process of collecting the pulse, the amplitudes of the pulses can be compared with the threshold values in turn by the comparators, and then the threshold value crossed by the pulse and the time when each threshold value is crossed can be determined, that is, a plurality of threshold value-time pairs are formed.

[0056] In order to more clearly illustrate this step, a specific example is described as follows:

[0057] For example, in a well logging scenario, assuming that the energy range of the pulse to be measured is 0-9 MeV, its energy range is usually divided into 256 energy channels.

[0058] Reference Figure 2 Based on the corresponding relationship between the pulse amplitude and energy, 16 main thresholds V1, V2, V3, ..., V 16 , through 16 main thresholds V1, V2, V3, ..., V 16 The energy range of the pulse to be measured is preliminarily divided into 16 main threshold intervals, that is, 16 energy segments, which are the energy segment corresponding to the main threshold interval V1~V2, the energy segment corresponding to the main threshold interval V2~V3, the energy segment corresponding to the main threshold interval V3~V4, ..., the energy segment corresponding to the main threshold interval V 15 ~V 16 Corresponding energy segment, main threshold interval V 16 Assuming that the highest main threshold value crossed by the pulse amplitude is within the energy range corresponding to the main threshold interval V2-V3, the energy of the pulse is within the energy range corresponding to the main threshold interval V2-V3.

[0059] To ultimately obtain the energy spectrum, it's necessary to count the number of pulses within each energy channel. In other words, obtaining the energy spectrum presupposes knowing which energy channel the pulse's energy falls into. Therefore, after defining the energy bands described above, we can further determine the energy channels contained within each band. Specifically, we can set multiple subthresholds for each energy band to divide each band into multiple subthreshold intervals, with each subthreshold interval corresponding to one energy channel. Returning to the example above, assuming the 0-9 MeV energy range has 256 energy channels, and the number of energy channels within each of the 16 energy bands is the same, we can set 15 subthresholds within each band to divide each band into 16 energy channels, resulting in 256 energy channels. Once we determine which energy band the pulse's amplitude falls into, we can further determine which energy channel within that band the pulse's amplitude falls into, thereby obtaining the energy information necessary to form the energy spectrum.

[0060] The number of energy channels in each energy segment may also be different, as long as the total number of energy channels in the final 16 energy segments is ensured to be 256 as required in the energy spectrum.

[0061] Step S300: Determine the highest main threshold crossed by the pulse to be tested, and the time information of crossing the highest main threshold.

[0062] After the thresholds and threshold intervals are determined, the to-be-tested pulse can be sampled. The sampling mode can be a multi-voltage threshold (MVT) digitization method, that is, the to-be-tested pulse can be acquired to cross each main threshold and the time information when crossing each main threshold. Based on the above method, the highest main threshold crossed by the to-be-tested pulse and the time information of crossing the highest main threshold can be determined. Assuming that the highest main threshold crossed by the to-be-tested pulse is V3, the amplitude of the to-be-tested pulse falls into the energy segment corresponding to the main threshold interval V3-V4 with V3 as the lower limit value.

[0063] In step S400, the time information of the to-be-tested pulse crossing the highest main threshold is determined, and the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse is determined.

[0064] Reference Figure 2 The waveform of the to-be-tested pulse generally includes a fast-rising rising edge and a slow-falling falling edge. Therefore, one main threshold often corresponds to two sampling points, that is, each has a sampling point at the rising edge and the falling edge of the to-be-tested pulse. The time interval between the two sampling points represents the pulse width exceeding the main threshold. In the actual sampling process, the pulse width of the to-be-tested pulse exceeding each main threshold can be determined (for example, the pulse width W3 of the to-be-tested pulse exceeding the main threshold V3 shown in FIG. 1). Thus, the pulse width of the to-be-tested pulse exceeding the highest main threshold can be acquired according to the time information of the to-be-tested pulse crossing the highest main threshold.

[0065] In step S400, the time information of the to-be-tested pulse crossing the highest main threshold can include a first time value of the to-be-tested pulse crossing the highest main threshold at the rising stage and a second time value of the to-be-tested pulse crossing the highest main threshold at the falling stage.

[0066] The pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse is the time interval between the second time value and the first time value.

[0067] In step S500, the pulse width interval in which the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse is located is determined.

[0068] In this embodiment, the pulse width intervals are determined in advance, and each pulse width interval corresponds to each sub-threshold interval. For example, the sub-threshold interval V 32 -V 33 The pulse width W 32 of the pulse with the amplitude V 32 exceeding the main threshold V3 and the pulse width W 33 of the pulse with the amplitude V 33 exceeding the main threshold V3 can be acquired. Therefore, the sub-threshold interval V 32 in the main threshold interval V3-V4 can be determined.32 ~ V 33 The corresponding pulse width interval is W 32 ~ W 33 By analogy, the corresponding pulse width interval of each sub-threshold interval in each main threshold interval can be determined in advance.

[0069] After determining the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse, the pulse width interval in which the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse falls can be determined by querying the pulse width interval determined in advance.

[0070] In step S600, the energy information of the to-be-tested pulse is determined according to the correspondence between the pulse width interval and the sub-threshold interval in the main threshold interval in which the highest main threshold is located, and the correspondence between the threshold and the energy.

[0071] As can be known from the foregoing, the correspondence between the pulse width interval and the sub-threshold interval is formed in advance, so that when the pulse width interval in which the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse is located is obtained, it can be determined in which sub-threshold interval the amplitude of the to-be-tested pulse falls in the main threshold interval in which the highest main threshold is located, and as can be known from the correspondence between the threshold and the energy, each sub-threshold interval corresponds to an energy channel address, so that it can be determined in which energy channel address the energy of the to-be-tested pulse is located, that is, the energy information of the to-be-tested pulse required for forming the energy spectrum is obtained.

[0072] In step S600, the energy information of the to-be-tested pulse is determined according to the correspondence between the pulse width interval and the sub-threshold interval in the main threshold interval in which the highest main threshold is located, and the correspondence between the threshold and the energy.

[0073] In step S610, the amplitude of the to-be-tested pulse is determined to fall in which sub-threshold interval according to the correspondence between the pulse width interval and the sub-threshold interval in the main threshold interval in which the highest main threshold is located.

[0074] In step S620, the amplitude of the to-be-tested pulse is determined to fall in which energy channel address according to the correspondence between the sub-threshold interval and the energy channel address, wherein the correspondence between the sub-threshold interval and the energy channel address is obtained according to the correspondence between the threshold and the energy.

[0075] The main threshold interval in which the highest main threshold is located can be a main threshold interval with the highest main threshold as a lower limit value. Returning to the foregoing example, for example, the highest main threshold exceeded by the to-be-tested pulse is V3, and the main threshold interval in which the highest main threshold is located is the main threshold interval V3~V4 with V3 as a lower limit value.

[0076] The energy acquisition method of the scintillation pulse provided in the embodiment predefines a plurality of main threshold values, and divides a plurality of main threshold interval by the main threshold values, predefines a plurality of sub-threshold values in each main threshold interval, and divides a plurality of sub-threshold interval by the sub-threshold values. When sampling the to-be-tested pulse, the highest main threshold value crossed by the to-be-tested pulse and the time information of crossing the highest main threshold value are determined, the main threshold interval into which the amplitude of the to-be-tested pulse falls is determined, further, the pulse width of the to-be-tested pulse exceeding the highest main threshold value is determined according to the time information of crossing the highest main threshold value, and then the pulse width interval into which the pulse width falls is determined, and then the sub-threshold interval into which the amplitude of the to-be-tested pulse falls is determined according to the corresponding relationship between the pulse width interval and the sub-threshold interval determined in advance, and then the energy information of the to-be-tested pulse is determined according to the corresponding relationship between the threshold value and the energy. For example, in the application of oil well logging, a large number of gamma rays with different energies are generated after the interaction of neutrons and formation elements, the energies of the gamma rays generated by the interaction of different elements and neutrons are usually different, the number of gamma rays in different energy segments can be accurately counted by the energy acquisition method of the embodiment, that is, the process of drawing the energy spectrum, and then the type of formation element can be conveniently determined by the energy spectrum, such as H element rich or O element rich, so as to determine whether the formation stores oil, natural gas or water resources.

[0077] The energy acquisition method of the scintillation pulse provided in the application does not need to fit the pulse waveform by solving the equation set to obtain the function curve, but can directly obtain the energy information of the pulse by the table lookup method, simplifies the acquisition process of the pulse energy, saves the hardware resources, does not need complex calculation, reduces the chip power consumption, and can significantly improve the tolerance of the chip to high temperature when applied in high temperature environment.

[0078] In addition, in the existing pulse sampling process, when different main threshold values are used for sampling, the sampling channels corresponding to different main threshold values occupy different pins on the hardware chip, and the pulse signal enters different pins through different lines in the input process, which inevitably causes the pulse signal to enter the sampling channels corresponding to different main threshold values after different time delays, which causes the time obtained by the TDC to be inaccurate, and further affects the fitting of the pulse waveform, and finally causes the energy information to be inaccurate. In the application, the energy information can be obtained without fitting the pulse waveform, and only the relative time interval obtained by subtracting the time value of the pulse crossing the main threshold value at the falling edge from the time value of the pulse crossing the main threshold value at the rising edge is needed when sampling, so that the calculation of the relative time interval is not affected by the different time delays of different sampling channels, and thus the interference of the time delay on the acquisition of the energy information can be avoided.

[0079] Reference Figure 3 In one of the embodiments, the energy acquisition method provided in the embodiment further includes the following steps of acquiring the corresponding relationship between the pulse width interval and the sub-threshold interval:

[0080] Step S111: Determine the energies corresponding to the thresholds at both ends of the threshold interval according to the corresponding relationship between the threshold and the energy.

[0081] According to the predetermined correspondence between the threshold and the energy, the energy corresponding to the threshold can be determined, that is, the energies corresponding to the sub-thresholds at both ends of each sub-threshold interval within each main threshold interval can be obtained respectively.

[0082] Step S112: Acquire known pulses whose energies correspond to the energies corresponding to the sub-thresholds at both ends of the sub-threshold interval.

[0083] In practical applications, a large number of known pulses with known energy values ​​can be collected. These pulses can then be screened for known pulses with target energies. The target energies are the energies corresponding to the sub-thresholds at both ends of the sub-threshold interval. Thus, for each sub-threshold at both ends of each sub-threshold interval, known pulses with corresponding energies can be obtained.

[0084] Step S113: When the known pulse exceeds the lower limit of the main threshold interval where the sub-threshold interval is located, determine the pulse width corresponding to the lower limit of the main threshold interval to establish a corresponding relationship between the pulse width and the sub-threshold.

[0085] After the known pulses of corresponding energies are determined, each known pulse can be sampled separately using the MVT digitization method to obtain the pulse width corresponding to each sub-threshold.

[0086] To describe this step more clearly, let's go back to the previous example for further explanation:

[0087] Assume that the main threshold interval V3~V4 has a sub-threshold interval V 32 ~V 33 , the sub-threshold V at the end of the sub-threshold interval 32 The corresponding energy is E 32 , the sub-threshold V at the end of the sub-threshold interval 33 The corresponding energy is E 33 , then the energies of the pulses E 32 and E 33 The MVT digitization method is used to sample the two known pulses respectively, and then the time when the known pulse crosses the main threshold V3 in the rising phase and the time when the known pulse crosses the main threshold V3 in the falling phase are obtained. The pulse width is obtained according to the time interval between the two. That is, when the energy is E 32 The known pulse exceeds the threshold interval V 32 ~V 33 When the lower limit value V3 of the main threshold interval V3 to V4 is determined, the pulse width W corresponding to the main threshold V3 is determined. 32 , due to the energy E32 Corresponding to the threshold V 32 , then the threshold value V 32 With pulse width W 32 For the corresponding relationship, similarly, the threshold V 33 With pulse width W 33 Similarly, the corresponding relationship between the sub-thresholds at both ends of each sub-threshold interval and the pulse width can be obtained through the above method.

[0088] Step S114 : Determine the corresponding relationship between the pulse width interval and the sub-threshold interval according to the corresponding relationship between the pulse width and the sub-threshold.

[0089] After the corresponding relationship between the pulse width and the sub-threshold value is determined, the corresponding relationship between the pulse width interval and the sub-threshold value interval can be determined. 32 ~V 33 End threshold V 32 The corresponding pulse width is W 32 , threshold V 33 The corresponding pulse width is W 33 , then the threshold interval V can be determined 32 ~V 33 The corresponding pulse width interval is W 32 ~W 33 .

[0090] Reference Figure 4 As an alternative embodiment, in this embodiment, the step of obtaining the corresponding relationship between the pulse width interval and the sub-threshold interval may include:

[0091] Step S115 : using simulation software to set the amplitude of the pulse to be measured to the sub-thresholds at both ends of the sub-threshold interval.

[0092] When the amplitude of the pulse to be measured is set to the sub-thresholds at both ends of each sub-threshold interval using simulation software, a pulse having an energy corresponding to each sub-threshold can be obtained due to the corresponding relationship between threshold and energy. The simulation software may be MATLAB or the like.

[0093] Step S116 : When the pulses to be tested of different amplitudes cross the lower limit of the main threshold interval where the sub-threshold interval is located, the pulse width corresponding to the lower limit is sampled to establish a corresponding relationship between the pulse width and the sub-threshold.

[0094] After determining the pulses with energy corresponding to each sub-threshold, each pulse can be sampled to obtain the pulse width corresponding to the lower limit of the main threshold interval where each pulse crosses the sub-threshold. 32 ~V 33As an example, the amplitude of the pulse to be measured is set to V 32 and V 33 , we can get two amplitudes of V 32 and V 33 The pulse with amplitude V 32 The pulse is sampled and when the pulse exceeds the threshold V 32 When the lower limit value V3 of the main threshold interval V3 to V4 is reached, the pulse width W corresponding to the lower limit value V3 can be obtained. 32 , similarly for the amplitude V 33 The pulse width W of the pulse exceeding V3 can be obtained by sampling the pulse 33 , from which V 32 With W 32 The corresponding relationship and V 33 With W 33 Similarly, for each sub-threshold in each main threshold interval, the pulse width corresponding to each sub-threshold can be obtained by the above method.

[0095] Step S117 : Determine the corresponding relationship between the pulse width interval and the sub-threshold interval according to the corresponding relationship between the pulse width and the sub-threshold.

[0096] After the corresponding relationship between the pulse width and the sub-threshold value is determined, the corresponding relationship between the pulse width interval and the sub-threshold value interval can be determined. 32 ~V 33 End threshold V 32 The corresponding pulse width is W 32 , threshold V 33 The corresponding pulse width is W 33 , then the threshold interval V can be determined 32 ~V 33 The corresponding pulse width interval is W 32 ~W 33 .

[0097] Reference Figure 5 In one embodiment, the energy acquisition method provided in this embodiment further includes the step of acquiring a corresponding relationship between the threshold and the energy:

[0098] Step S121: Collect a preset number of pulses and obtain the amplitude of each pulse.

[0099] Step S122: Integrate each pulse to obtain the energy of each pulse.

[0100] Step S123: Obtain the corresponding relationship between the pulse amplitude and energy, and the pulse amplitude is consistent with the preset threshold attribute.

[0101] That is, the correspondence between the amplitude of the pulse and the energy of the pulse can be obtained by prior information, that is, a large number of pulses can be collected, and the number of pulses can be determined according to actual needs. After a large number of pulses are collected, the amplitude information of the pulses can be obtained by an oscilloscope or other electronic measuring equipment. The energy of the pulse can be obtained by integrating each pulse. Thus, the correspondence between the amplitude of the pulse and the energy of the pulse can be formed. The correspondence can be a corresponding calculation formula of the amplitude of the pulse and the energy of the pulse, or a corresponding lookup table of the amplitude of the pulse and the energy of the pulse. The embodiment does not limit the expression form of the correspondence between the amplitude of the pulse and the energy of the pulse.

[0102] In the embodiment, the amplitude of the pulse is often a voltage value, and the preset threshold value also corresponds to a voltage threshold value, that is, the amplitude of the pulse and the preset threshold value have the same attribute.

[0103] It should be understood that, although each step in the flowchart involved in the above embodiments is displayed in sequence according to the arrow, these steps are not necessarily executed in sequence according to the arrow. Unless otherwise specified herein, the execution of these steps is not strictly limited in sequence, and these steps can be executed in other sequences. Moreover, at least part of the steps in the flowchart involved in the above embodiments can include multiple steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times. The execution sequence of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least part of other steps or steps or stages in other steps.

[0104] Based on the same inventive concept, another embodiment of the present application also provides a scintillation pulse energy acquisition device for implementing the above-mentioned scintillation pulse energy acquisition method. The implementation scheme for solving the problem provided by the scintillation pulse energy acquisition device is similar to the implementation scheme described in the above method. Therefore, the specific limitations in one or more scintillation pulse energy acquisition device embodiments provided below can refer to the limitations of the scintillation pulse energy acquisition method described above, and will not be repeated here.

[0105] With reference to Figure 6 The scintillation pulse energy acquisition device provided by the embodiment includes a threshold setting module 200, a first determination module 300, a second determination module 400, a third determination module 500, and an energy determination module 600.

[0106] Among them:

[0107] The threshold setting module 200 is configured to preset a plurality of main threshold values and a plurality of sub-threshold values, and form a plurality of main threshold value intervals divided by each main threshold value, and a plurality of sub-threshold value intervals in each main threshold value interval divided by each sub-threshold value.

[0108] The first determination module 300 is configured to determine a highest main threshold value crossed by the to-be-tested pulse and time information of crossing the highest main threshold value.

[0109] The second determination module 400 is configured to determine a pulse width corresponding to the highest main threshold value crossed by the to-be-tested pulse according to the time information of crossing the highest main threshold value.

[0110] The third determination module 500 is configured to determine a pulse width interval in which the pulse width corresponding to the highest main threshold value crossed by the to-be-tested pulse falls.

[0111] The energy determination module 600 is configured to determine energy information of the to-be-tested pulse signal according to a corresponding relationship between the pulse width interval and a sub-threshold interval in the main threshold interval in which the highest main threshold value falls, and a corresponding relationship between the threshold value and the energy.

[0112] The energy acquisition device for the scintillation pulse provided in the embodiment is configured to preset a plurality of main threshold values, divide a plurality of main threshold intervals by the main threshold values, preset a plurality of sub-threshold values in each main threshold interval, divide a plurality of sub-threshold intervals by the sub-threshold values, determine a highest main threshold value crossed by the to-be-tested pulse and time information of crossing the highest main threshold value when sampling the to-be-tested pulse, determine a main threshold interval in which an amplitude of the to-be-tested pulse falls, further determine a pulse width corresponding to the highest main threshold value crossed by the to-be-tested pulse according to the time information of crossing the highest main threshold value, further determine a pulse width interval in which the pulse width falls, and then determine a sub-threshold interval in which the amplitude of the to-be-tested pulse falls according to a corresponding relationship between the pulse width interval and the sub-threshold interval, and then determine energy information of the to-be-tested pulse according to a corresponding relationship between the threshold value and the energy. Thus, the energy information of the pulse can be obtained without fitting the pulse waveform by solving the equation set to obtain the function curve, the process of acquiring the pulse energy is simplified, the hardware resources are saved, the complex calculation is not needed, the chip power consumption is reduced, and the chip tolerance to high temperature can be significantly improved when applied in a high temperature environment.

[0113] In one of the embodiments, the main threshold value and the sub-threshold value both correspond to pulse energy, each main threshold interval corresponds to each energy segment, and each sub-threshold interval corresponds to each energy channel address.

[0114] In one of the embodiments, the number of energy channel addresses in each energy segment is the same or different.

[0115] In one of the embodiments, to determine the highest main threshold value crossed by the to-be-tested pulse and the time information of crossing the highest main threshold value, the first determination module 300 is configured to determine a first time value of crossing the highest main threshold value by the to-be-tested pulse in the rising stage and a second time value of crossing the highest main threshold value by the to-be-tested pulse in the falling stage.

[0116] In one of the embodiments, the second determining module 400 is configured to take the time interval between the second time value and the first time value as the pulse width corresponding to the highest main threshold value by which the to-be-tested pulse exceeds.

[0117] In one of the embodiments, for determining the energy information of the to-be-tested pulse, the energy determining module 600 is configured to: determine the sub-threshold interval in which the amplitude of the to-be-tested pulse falls according to the correspondence between the pulse width interval and the sub-threshold interval in the main threshold interval in which the highest main threshold value is located; and determine the energy channel address in which the amplitude of the to-be-tested pulse falls according to the correspondence between the sub-threshold interval and the energy channel address, wherein the correspondence between the sub-threshold interval and the energy channel address is obtained according to the correspondence between the threshold value and the energy.

[0118] In one of the embodiments, the energy determining module 600 is configured to set the main threshold interval in which the highest main threshold value is the lower limit value as the main threshold interval in which the highest main threshold value is located.

[0119] In one of the embodiments, the energy acquisition device for the scintillation pulse provided by the embodiment further includes a first acquisition module, which is configured to: determine the energy corresponding to the sub-threshold values at both ends of the sub-threshold interval according to the correspondence between the threshold value and the energy; acquire a known pulse corresponding to the energy corresponding to the sub-threshold values at both ends of the sub-threshold interval; determine the pulse width corresponding to the lower limit value of the main threshold interval in which the sub-threshold interval is located when the known pulse exceeds the lower limit value, so as to establish the correspondence between the pulse width and the sub-threshold value; and determine the correspondence between the pulse width interval and the sub-threshold interval according to the correspondence between the pulse width and the sub-threshold value.

[0120] In one of the embodiments, the energy acquisition device for the scintillation pulse provided by the embodiment further includes a first acquisition module, which is configured to: set the amplitudes of the to-be-tested pulses as the sub-threshold values at both ends of the sub-threshold interval by using the simulation software; sample and acquire the pulse width corresponding to the lower limit value of the main threshold interval in which the sub-threshold interval is located when the to-be-tested pulses with different amplitudes exceed the lower limit value, so as to establish the correspondence between the pulse width and the sub-threshold value; and determine the correspondence between the pulse width interval and the sub-threshold interval according to the correspondence between the pulse width and the sub-threshold value.

[0121] In one of the embodiments, the energy acquisition device for the scintillation pulse provided by the embodiment further includes a second acquisition module, which is configured to: collect a preset number of pulses and acquire the amplitudes of the pulses; integrate the pulses to acquire the energies of the pulses; and acquire the correspondence between the amplitudes of the pulses and the energies, wherein the amplitudes of the pulses are identical to the preset threshold attribute.

[0122] The modules in the energy acquisition device of the scintillation pulse can be implemented by software, hardware, or a combination thereof. The modules can be embedded in or independent of a processor in the electronic device in hardware form, or stored in a memory in the electronic device in software form, so as to be invoked and executed by the processor to perform the operations corresponding to the modules.

[0123] In an embodiment, an electronic device is provided, including a memory and a processor, the memory storing a computer program, and the processor implementing the steps in the above method embodiments when executing the computer program.

[0124] Figure 7 The electronic device provided in an embodiment of the present application has a structure diagram as shown in the figure. The electronic device can be a server, and its internal structure diagram can be as shown in Figure 7 The electronic device includes a processor, a memory, and a network interface connected through a system bus. The processor of the electronic device is configured to provide computing and control capabilities. The memory of the electronic device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system, a computer program, and a database. The internal memory provides an environment for running the operating system and the computer program in the non-volatile storage medium. The database of the electronic device is configured to store various types of data involved in the method. The network interface of the electronic device is configured to communicate with an external terminal through a network connection. The computer program is executed by the processor to implement a scintillation pulse energy acquisition method.

[0125] Those skilled in the art can understand that Figure 7 The structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not limit the electronic device to which the scheme of the present application is applied. Specifically, the electronic device can include more or fewer components than those shown in the figure, or combine certain components, or have a different component arrangement.

[0126] In an embodiment, a computer readable storage medium is provided, which stores a computer program. The computer program is executed by a processor to implement the steps in the above method embodiments.

[0127] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, storage, database or other medium used in each embodiment provided by the present application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory or optical memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0128] Each technical feature of the above-mentioned embodiments can be combined arbitrarily. In order to make the description simple, all possible combinations of each technical feature in the above-mentioned embodiments are not described, but as long as the combination of these technical features does not exist, it should be considered as the scope of the present application.

[0129] The above-mentioned embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the patent scope. It should be pointed out that for those skilled in the art, without departing from the concept of the present application, some modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A method of energy acquisition of a flickering pulse, characterized by, The energy acquisition method comprises: a plurality of main threshold values and a plurality of sub threshold values are preset, and a plurality of main threshold value intervals divided by the main threshold values and a plurality of sub threshold value intervals divided by the sub threshold values in each main threshold value interval are formed, the main threshold values and the sub threshold values correspond to pulse energy, each main threshold value interval corresponds to an energy segment, and each sub threshold value interval corresponds to an energy channel address; a highest main threshold value crossed by a to-be-measured pulse is determined, and time information of the to-be-measured pulse crossing the highest main threshold value is determined; a pulse width corresponding to the highest main threshold value exceeded by the to-be-measured pulse is determined according to the time information of the to-be-measured pulse crossing the highest main threshold value; a pulse width interval in which the pulse width corresponding to the highest main threshold value exceeded by the to-be-measured pulse is located is determined; energy information of the to-be-measured pulse is determined according to a corresponding relationship between the pulse width interval and a sub threshold value interval in a main threshold value interval in which the highest main threshold value is located and a corresponding relationship between a threshold value and energy.

2. The method of energy acquisition of a scintillation pulse according to claim 1, characterized in that, The number of energy channel addresses in each energy segment is the same or different.

3. The method of energy acquisition of a scintillation pulse according to claim 1, characterized in that, The step of determining the time information of the to-be-measured pulse crossing the highest main threshold value comprises: a first time value of the to-be-measured pulse crossing the highest main threshold value in a rising stage and a second time value of the to-be-measured pulse crossing the highest main threshold value in a falling stage are determined.

4. The method of energy acquisition of a scintillation pulse according to claim 3, characterized in that, The pulse width corresponding to the highest main threshold value exceeded by the to-be-measured pulse is a time interval between the second time value and the first time value.

5. The method of energy acquisition of a scintillation pulse according to claim 1, wherein, The step of determining the energy information of the to-be-measured pulse according to the corresponding relationship between the pulse width interval and the sub threshold value interval in the main threshold value interval in which the highest main threshold value is located and the corresponding relationship between the threshold value and the energy comprises: a sub threshold value interval into which an amplitude of the to-be-measured pulse falls is determined according to the corresponding relationship between the pulse width interval and the sub threshold value interval in the main threshold value interval in which the highest main threshold value is located; an energy channel address into which the amplitude of the to-be-measured pulse falls is determined according to a corresponding relationship between a sub threshold value interval and an energy channel address, wherein the corresponding relationship between the sub threshold value interval and the energy channel address is obtained according to the corresponding relationship between the threshold value and the energy.

6. The method of energy acquisition of a scintillation pulse according to claim 1, wherein, The main threshold value interval in which the highest main threshold value is located is a main threshold value interval with the highest main threshold value as a lower limit value.

7. The method of energy acquisition of a scintillation pulse according to claim 1, wherein, The energy acquisition method further comprises a step of obtaining the corresponding relationship between the pulse width interval and the sub threshold value interval: corresponding energies of two end sub threshold values of the sub threshold value interval are determined according to the corresponding relationship between the threshold value and the energy; a known pulse corresponding to the corresponding energies of the two end sub threshold values of the sub threshold value interval is obtained; when the known pulse exceeds a lower limit value of a main threshold value interval in which the sub threshold value interval is located, a pulse width corresponding to the lower limit value is determined to establish a corresponding relationship between the pulse width and the sub threshold value; the corresponding relationship between the pulse width interval and the sub threshold value interval is determined according to the corresponding relationship between the pulse width and the sub threshold value.

8. The method of energy acquisition of a scintillation pulse according to claim 1, wherein, The energy acquisition method further comprises a step of obtaining the corresponding relationship between the pulse width interval and the sub threshold value interval: amplitudes of the to-be-measured pulse are set to be the two end sub threshold values of the sub threshold value interval by using simulation software. When the to-be-tested pulse with different amplitudes crosses the lower limit value of the main threshold interval where the threshold interval is located, the pulse width corresponding to the lower limit value is acquired by sampling to establish the corresponding relationship between the pulse width and the threshold; According to the corresponding relationship between the pulse width and the threshold, the corresponding relationship between the pulse width interval and the threshold interval is determined.

9. The method of energy acquisition of a scintillation pulse according to claim 1, wherein, The energy acquisition method further includes the step of acquiring the corresponding relationship between the threshold and the energy: A preset number of pulses are collected, and the amplitudes of the pulses are acquired; The energy of each pulse is acquired by integrating each pulse; The corresponding relationship between the amplitude of the pulse and the energy is acquired, and the amplitude of the pulse is the same as the preset threshold attribute.

10. An energy harvesting device of a flickering pulse, characterized in that, The energy acquisition device includes: A threshold setting module is configured to preset a plurality of main thresholds and a plurality of sub-thresholds, and form a plurality of main threshold intervals divided by each main threshold, and a plurality of sub-threshold intervals divided by each sub-threshold in each main threshold interval, the main threshold and the sub-threshold correspond to the pulse energy, each main threshold interval corresponds to each energy segment, and each sub-threshold interval corresponds to each energy channel address; A first determination module is configured to determine the highest main threshold crossed by the to-be-tested pulse and the time information of crossing the highest main threshold; A second determination module is configured to determine the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse according to the time information of crossing the highest main threshold by the to-be-tested pulse; A third determination module is configured to determine the pulse width interval where the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse is located; An energy determination module is configured to determine the energy information of the to-be-tested pulse according to the corresponding relationship between the pulse width interval and the sub-threshold interval in the main threshold interval where the highest main threshold is located, and the corresponding relationship between the threshold and the energy.

11. The scintillation pulse energy harvesting device of claim 10, wherein, The number of energy channel addresses in each energy segment is the same or different.

12. The scintillating pulse energy harvesting device of claim 10, wherein, To determine the highest main threshold crossed by the to-be-tested pulse and the time information of crossing the highest main threshold, the first determination module is configured to: Determine the first time value of crossing the highest main threshold in the rising stage of the to-be-tested pulse, and the second time value of crossing the highest main threshold in the falling stage of the to-be-tested pulse.

13. The scintillation pulse energy harvesting device of claim 12, wherein, The second determination module is configured to take the time interval between the second time value and the first time value as the pulse width corresponding to the highest main threshold exceeded by the to-be-tested pulse.

14. The scintillating pulse energy harvesting device of claim 10, wherein, To determine the energy information of the to-be-tested pulse, the energy determination module is configured to: According to the corresponding relationship between the pulse width interval and the sub-threshold interval in the main threshold interval where the highest main threshold is located, determine the sub-threshold interval where the amplitude of the to-be-tested pulse falls; According to the corresponding relationship between the sub-threshold interval and the energy channel address, the energy channel address where the amplitude of the to-be-tested pulse falls is determined, and the corresponding relationship between the sub-threshold interval and the energy channel address is obtained according to the corresponding relationship between the threshold and the energy.

15. The scintillating pulse energy harvesting device of claim 10, wherein, The energy determination module is configured to set the main threshold interval with the highest main threshold as the lower limit value as the main threshold interval where the highest main threshold is located.

16. The scintillating pulse energy harvesting device of claim 10, wherein, The energy acquisition device further includes a first acquisition module, and the first acquisition module is configured to: According to the correspondence between the threshold value and the energy, the energy corresponding to the threshold value at the two ends of the sub-threshold interval is determined; The energy corresponding to the known pulse corresponding to the energy corresponding to the threshold value at the two ends of the sub-threshold interval is obtained; When the known pulse exceeds the lower limit value of the main threshold interval in which the sub-threshold interval is located, the pulse width corresponding to the lower limit value is determined to establish the correspondence between the pulse width and the sub-threshold value; According to the correspondence between the pulse width and the sub-threshold value, the correspondence between the pulse width interval and the sub-threshold interval is determined.

17. The scintillating pulse energy harvesting device of claim 10, wherein, The energy acquisition device further comprises a first acquisition module, which is configured to: Set the amplitude of the to-be-tested pulse to be the threshold value at the two ends of the sub-threshold interval by using simulation software; When the to-be-tested pulse with different amplitudes exceeds the lower limit value of the main threshold interval in which the sub-threshold interval is located, the pulse width corresponding to the lower limit value is sampled and acquired to establish the correspondence between the pulse width and the sub-threshold value; According to the correspondence between the pulse width and the sub-threshold value, the correspondence between the pulse width interval and the sub-threshold interval is determined.

18. The scintillating pulse energy harvesting device of claim 10, wherein, The energy acquisition device further comprises a second acquisition module, which is configured to: Collect a preset number of pulses and obtain the amplitudes of the pulses; Integrate each pulse to obtain the energy of each pulse; Obtain the correspondence between the amplitude of the pulse and the energy, and the amplitude of the pulse is the same as the preset threshold attribute.

19. An electronic device, comprising: Comprise: A memory, a processor, and a computer program stored on the memory and executable on the processor, which when executed by the processor implements the steps of the energy acquisition method of the flickering pulse as claimed in any one of claims 1 to 9.

20. An electronic device, comprising: The electronic device comprises the energy acquisition device of the flickering pulse as claimed in any one of claims 10-18.

21. A computer-readable storage medium, characterized in that, The storage medium stores a computer program, which when executed by the processor implements the steps of the energy acquisition method of the flickering pulse as claimed in any one of claims 1 to 9.

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