A CPT atomic clock laser testing device and testing method
By designing a laser testing device for the CPT atomic clock, the problem of selecting and matching internal lasers for the CPT atomic clock was solved, enabling rapid and accurate performance evaluation of the lasers and improving the overall performance of the CPT atomic clock.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- BEIJING INST OF RADIO METROLOGY & MEASUREMENT
- Filing Date
- 2022-12-14
- Publication Date
- 2026-06-26
AI Technical Summary
In the existing technology, it is not convenient to select lasers inside the CPT atomic clock, and there is a lack of unified testing equipment and methods, which makes it difficult to evaluate the performance of the lasers.
A CPT atomic clock laser testing device was designed, including a CPT quantum physics system, a laser adapter daughterboard, a testing device motherboard, and a host computer. The laser is connected via solderless sockets and connectors to realize the generation of standard frequency signals and the acquisition and control of performance parameters, supporting rapid testing of various lasers.
It enables rapid and accurate performance evaluation of various lasers, improves testing efficiency, reduces the difficulty of equipment assembly and debugging, and enhances the overall performance of the CPT atomic clock.
Smart Images
Figure CN116027126B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of radio metrology and testing technology, and in particular to a CPT atomic clock laser testing device and testing method. Background Technology
[0002] CPT (Coherent Population Trapping) atomic clocks are a new type of atomic frequency standard designed based on the coherent population trapping mechanism of atoms. They are characterized by small size, low power consumption, and high stability of frequency source characteristics such as the frequency accuracy and stability at the atomic clock level. It is currently the only atomic clock technology that can be realized on a chip.
[0003] Lasers are key components inside CPT atomic clocks, significantly impacting their overall performance and specifications. Currently, several domestic manufacturers are capable of developing and producing lasers for CPT atomic clocks. However, the spectral linewidth, operating temperature, and packaging of these lasers vary considerably. Therefore, it is necessary to design a device capable of testing various laser products. This device would facilitate convenient and rapid testing and verification of different types of lasers, thereby aiding in the performance evaluation and application of laser products. Summary of the Invention
[0004] This application proposes a testing device and method for CPT atomic clock lasers, which solves the problem that it is inconvenient to select lasers inside CPT atomic clocks.
[0005] First, this application proposes a CPT atomic clock laser testing device, including a CPT quantum physics system, a laser adapter board, and a testing device motherboard.
[0006] The CPT quantum physics system generates a standard frequency signal when the optical inlet receives laser radiation.
[0007] The laser adapter board includes a solderless socket for connecting the laser, a solderless socket for connecting the CPT quantum physics system, and a connector for connecting the motherboard port of the test device.
[0008] The motherboard of the test device is used to send laser operating parameter control signals to the port and receive standard frequency signals from the CPT quantum physics system.
[0009] Preferably, the CPT atomic clock laser testing device further includes a fixture for fixing the laser and connecting it to the laser adapter board via a solderless socket, with the laser output port aligned with the CPT quantum physics system input port.
[0010] Preferably, the laser adapter board is also used for laser interface conversion, connecting the laser control signal of the motherboard port of the test device to the control terminal of one or more selected lasers.
[0011] Preferably, in response to a selected laser being connected to the test apparatus motherboard via the laser adapter daughterboard, the test apparatus motherboard determines a test procedure template corresponding to the selected laser. The test procedure template includes the types and / or ranges of operating parameters for the selected laser.
[0012] Preferably, the CPT atomic clock laser testing device further includes a host computer connected to the testing device motherboard. The host computer is used to edit and / or generate a test program template corresponding to the laser. In response to a selected laser being connected to the testing device motherboard via the laser adapter board, the testing device motherboard downloads the test program template from the host computer.
[0013] Furthermore, the host computer is also used to display the morphology and / or performance parameters of the standard frequency signal. The motherboard of the testing device is also used to acquire the standard frequency signal of the CPT quantum physics system and output data representing the morphology and / or performance parameter values of the standard frequency signal to the host computer.
[0014] Preferably, the CPT atomic clock laser testing apparatus further includes a frequency stability testing device. The frequency stability testing device is used to measure the accuracy and stability of the standard frequency signal.
[0015] Preferably, in response to the accuracy and / or stability value of the standard frequency signal, the motherboard of the test device controls the laser operating parameters through the port to change the accuracy and / or stability value.
[0016] This application also proposes a CPT atomic clock laser testing method, using the CPT atomic clock laser testing apparatus described in any embodiment of this application, comprising the following steps:
[0017] Connect the selected laser to the laser adapter subboard;
[0018] In response to a selected laser being connected to the test device motherboard via the laser adapter daughterboard, the test device motherboard determines a test program template corresponding to the selected laser.
[0019] According to the test program template, run the laser test program, including temperature control and operating current control, until the laser reaches the optimal operating current at the currently set temperature point;
[0020] The optimal operating current corresponds to the optimal accuracy and / or optimal stability of the standard frequency signal at the currently set temperature point.
[0021] Furthermore, it also includes the following steps:
[0022] By changing the temperature control value, the optimal operating temperature parameter of the selected laser is obtained; the optimal temperature parameter corresponds to the optimal accuracy and / or optimal stability of the standard frequency signal.
[0023] The above-described technical solutions adopted in the embodiments of this application can achieve the following beneficial effects:
[0024] This invention is used for the inspection and performance testing of lasers used in CPT atomic clocks (hereinafter referred to as lasers). Based on CPT atomic clock technology, it can quickly evaluate the applicability of lasers in CPT atomic clocks and various related performances. It has high practical value for improving the performance of atomic clocks and optimizing the design of laser technology.
[0025] This invention improves testing efficiency and reduces the difficulty of assembling and debugging testing equipment by utilizing conventional tools and components, while ensuring the accuracy and reliability of test results. Attached Figure Description
[0026] The accompanying drawings, which are included to provide a further understanding of this application and form part of this application, illustrate exemplary embodiments and are used to explain this application, but do not constitute an undue limitation of this application. In the drawings:
[0027] Figure 1 This is a schematic diagram of the CPT atomic clock laser testing device.
[0028] Figure 2 This is a flowchart example of a CPT atomic clock laser testing method;
[0029] Figure 3 This is an example of the laser parameter search process in the method of this application;
[0030] Figure 4 The image shows the absorption waveform of the CPT atomic clock laser, as actually tested using this device. Detailed Implementation
[0031] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below in conjunction with specific embodiments and corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments in this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.
[0032] The technical solutions provided by the various embodiments of this application are described in detail below with reference to the accompanying drawings.
[0033] Figure 1 This is a schematic diagram of the CPT atomic clock laser testing device.
[0034] First, this application proposes a CPT atomic clock laser testing device, including a CPT quantum physics system 11, a laser adapter daughterboard 10, a testing device motherboard 13, a signal connection line (connecting the testing device motherboard and the host computer 14), host computer display and control software, and a power supply section 15.
[0035] The CPT quantum physics system generates a standard frequency signal when the light inlet receives laser radiation.
[0036] The laser adapter board includes a solderless socket for connecting the laser under test 12, a solderless socket for connecting the CPT quantum physics system, and a connector for connecting the motherboard port of the test device.
[0037] The motherboard of the test device is used to send laser operating parameter control signals to the port and receive standard frequency signals from the CPT quantum physics system.
[0038] Preferably, the CPT atomic clock laser testing device further includes a fixture for fixing the laser under test and connecting it to the laser adapter board via a solderless socket, with the laser output port aligned with the CPT quantum physics system input port.
[0039] Preferably, the laser adapter board is also used for laser interface conversion, connecting the laser control signal of the motherboard port of the test device to the control terminal of one or more selected lasers.
[0040] Preferably, the CPT atomic clock laser testing device further includes a host computer connected to the testing device motherboard. The host computer is used to edit and / or generate a test program template corresponding to the laser. Preferably, in response to a selected laser being connected to the testing device motherboard via the laser adapter daughterboard, the testing device motherboard determines a test program template corresponding to the selected laser. The test program template includes the types and / or ranges of operating parameters for the selected laser. For example, in response to a selected laser being connected to the testing device motherboard via the laser adapter daughterboard, the testing device motherboard downloads the test program template from the host computer.
[0041] Furthermore, the host computer is also used to display the morphology and / or performance parameters of the standard frequency signal. The motherboard of the testing device is also used to acquire the standard frequency signal of the CPT quantum physics system and output data representing the morphology and / or performance parameter values of the standard frequency signal to the host computer.
[0042] Preferably, the CPT atomic clock laser testing apparatus further includes a frequency stability testing device. The frequency stability testing device is used to measure the accuracy and stability of the standard frequency signal.
[0043] When testing lasers with different structural packaging forms, the lasers are mounted on corresponding adapter sub-boards according to their respective packaging, with the laser output port aligned with the CPT quantum physics system input port. After the laser adapter sub-board is connected to the main board via connectors, the corresponding laser operating parameters are set on the host computer software according to the laser's parameters, generating a laser test program template. The operating parameters are then downloaded to the controller on the test device's main board. The controller controls the laser's operating parameters according to the downloaded test program, achieving high-precision temperature control and servo control of the operating current. The test device processes the acquired optical detection signals and uploads them to the host computer display and control software, enabling real-time evaluation of the laser's key performance parameters such as light intensity, wavelength, and spectral linewidth. The test device features a closed-loop locking function for the entire CPT atomic clock. Once the test device is locked in place, its output standard frequency signal possesses the high stability and accuracy of the quantum standard. By testing the stability and accuracy of the standard signal output by the test device, the effectiveness of the laser in the CPT atomic clock system can be evaluated.
[0044] Figure 2 This is a flowchart example of a CPT atomic clock laser testing method.
[0045] This application also proposes a CPT atomic clock laser testing method, using the CPT atomic clock laser testing apparatus described in any embodiment of this application, comprising the following steps:
[0046] Step 21: Connect the selected laser to the laser adapter board, and align the laser's output port with the CPT quantum physics system's input port.
[0047] First, fix or plug the laser onto the laser adapter board using the corresponding clamp or a solderless socket. This ensures the laser has a correct and stable circuit connection and structure. Then, plug the laser adapter board into the motherboard of the test setup via a connector. The laser's output port should be aligned with the input port of the CPT quantum physics system, which acts as the laser receiver. Power supplies provide the necessary operating voltage to both the laser adapter board and the test setup motherboard.
[0048] Step 22: In response to the selected laser being connected to the test device motherboard via the laser adapter daughterboard, the test device motherboard determines the test program template corresponding to the selected laser.
[0049] For lasers with different packaging forms, use the corresponding packaging adapter sub-boards and install the lasers. The adapter sub-boards are connected to the motherboard of the test device via connectors. The operating temperature and input excitation current of different lasers are set and adjusted using a host computer, and corresponding laser test program templates are generated. According to different lasers, the corresponding test program template is selected and the program is downloaded to the controller of the test device.
[0050] Step 23: Run the laser test program according to the test program template, including temperature control and operating current control, until the laser reaches the optimal operating current at the currently set temperature point.
[0051] The optimal operating current corresponds to the optimal accuracy and / or optimal stability of the standard frequency signal at the currently set temperature point.
[0052] Preferably, in response to the accuracy and / or stability value of the standard frequency signal, the motherboard of the test device controls the laser operating parameters through the port to change the accuracy and / or stability value.
[0053] Furthermore, it also includes the following steps:
[0054] Step 24: Change the temperature control value to obtain the optimal operating temperature parameter of the selected laser; the optimal temperature parameter corresponds to the optimal accuracy and / or optimal stability of the standard frequency signal.
[0055] To further explain steps 23-24, Figure 3 As an example of the laser parameter search process in this application, after the device is powered on and the power supply is working normally, the laser test program located on the motherboard starts running. First, the laser operating temperature and operating current search process is performed. The test process is as follows:
[0056] Step 31: First, read the working temperature point set by the host computer display and control software.
[0057] Step 32: Control the temperature of the laser according to the set temperature point until the temperature control is stable.
[0058] Step 33: After the temperature control stabilizes, enter the laser operating current search stage: perform reciprocating current scanning within a certain range, and search for the optimal laser operating current based on the set algorithm and the absorption of the laser spectrum absorption lines.
[0059] Step 34: After finding the optimal operating current of the laser at the current set temperature, save and record the current operating status parameters.
[0060] Then, according to the temperature adjustment range set by the host computer display and control software, the laser's operating temperature is gradually changed with a certain adjustment precision. Each time the operating temperature is changed, the optimal operating current and corresponding operating status parameters at the current operating temperature are saved and recorded according to steps 31-34 described above. After testing at all operating temperature points within the set range, the host computer display and control software judges and selects all saved parameters, finds the optimal operating temperature parameter for the laser, and controls the testing device to operate at that temperature point. Then, it enters the laser operating temperature and operating current servo control state to provide the optimal operating conditions for the laser under test.
[0061] Figure 4 The image shows the absorption waveform of the CPT atomic clock laser, as actually tested using this device.
[0062] exist Figure 4 In the diagram, the upper curve represents the optical absorption waveform obtained by this device when testing the laser under test. The troughs in this waveform indicate optical absorption at adjacent different wavelengths. The curve below this waveform is the corresponding rate of change waveform of optical absorption; that is, this waveform represents the rate of change of the upper waveform.
[0063] The collected test data is transmitted from the test device motherboard to the host computer via the communication interface. The host computer's display and control software interface allows observation of the laser's operating temperature, operating current, spectral absorption signal waveform, system lock status, and other operating conditions. This device has a CPT atomic clock function and can output a standard frequency signal. After the system consisting of the laser under test, the CPT quantum physics system, and the test device motherboard is locked in a closed loop, the accuracy and stability of the standard frequency signal output by this device can be tested using frequency stability testing equipment. The test results can reflect the performance of the laser at the CPT atomic clock level.
[0064] This device can quickly and accurately test the performance of CPT atomic clock lasers by displaying the optical detection data acquired and processed by the device on a host computer without using testing equipment such as spectrometers, oscilloscopes, signal generators, and high-precision digital inspection instruments. After the system is closed-loop locked, the output standard frequency signal can be used to evaluate the overall performance of the CPT atomic clock. It has significant advantages in terms of flexibility and cost.
[0065] It should also be noted that the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.
[0066] Those skilled in the art will understand that, unless specifically stated otherwise, the singular forms “a,” “an,” “the,” and “the” used herein may also include the plural forms. It should be further understood that the term “comprising” as used in this specification means the presence of the stated features, integers, steps, operations, elements, and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof. It should be understood that when an element is “connected” or “coupled” to another element, it may be directly connected or coupled to the other element, or there may be intermediate elements. Furthermore, “connected” or “coupled” as used herein may include wireless connections or wireless coupling. The term “and / or” as used herein includes all or any units and all combinations of one or more associated listed items.
[0067] The above description is merely an embodiment of this application and is not intended to limit the scope of this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the scope of the claims of this application.
Claims
1. A testing device for a CPT atomic clock laser, characterized in that, Includes the CPT quantum physics system, laser adapter daughterboard, and test device motherboard; The CPT quantum physics system generates a standard frequency signal when the optical inlet receives laser radiation. The laser adapter board includes a solderless socket for connecting the laser, a solderless socket for connecting the CPT quantum physics system, and a connector for connecting the motherboard port of the test device. The motherboard of the test device is used to send laser operating parameter control signals to the port, receive standard frequency signals from the CPT quantum physics system, and output data representing the shape and / or performance difference parameter values of the standard frequency signals. The testing device has a closed-loop locking function for the entire CPT atomic clock. Once the testing device is locked in closed loop, its output standard frequency signal has the high stability and high accuracy of the quantum standard, which is used to reflect the performance of the laser at the level of the entire CPT atomic clock.
2. The CPT atomic clock laser testing device as described in claim 1, characterized in that, It also includes a fixture for fixing the laser and connecting it to the laser adapter board via a solderless socket, with the laser output port aligned with the light inlet of the CPT quantum physics system.
3. The CPT atomic clock laser testing device as described in claim 1, characterized in that, The laser adapter daughterboard is also used for laser interface conversion, connecting the laser control signal of the motherboard port of the test device to the control terminal of one or more selected lasers.
4. The CPT atomic clock laser testing device as described in claim 1, characterized in that, In response to a selected laser being connected to the test device motherboard via the laser adapter daughterboard, the test device motherboard determines a test program template corresponding to the selected laser. The test procedure template includes the types and / or ranges of operating parameters for the selected laser.
5. The CPT atomic clock laser testing device as described in claim 1, characterized in that, Includes a host computer connected to the motherboard of the test device; The host computer is used to edit and / or generate test program templates corresponding to the laser; In response to the selected laser, the test device motherboard is connected to the test device motherboard via the laser adapter daughterboard, and the test device motherboard downloads the test program template from the host computer.
6. The CPT atomic clock laser testing device as described in claim 5, characterized in that, The host computer is also used to display the shape and / or performance parameters of the standard frequency signal.
7. The CPT atomic clock laser testing device as described in claim 1, characterized in that, It includes a frequency stability testing device; the frequency stability testing device is used to measure the accuracy and stability of the standard frequency signal.
8. The CPT atomic clock laser testing device as described in claim 1, characterized in that, In response to the accuracy and / or stability values of the standard frequency signal, the motherboard of the test device controls the laser operating parameters through the port to change the accuracy and / or stability values.
9. A method for testing a CPT atomic clock laser, using the CPT atomic clock laser testing apparatus according to any one of claims 1 to 8, characterized in that, Includes the following steps: Connect the selected laser to the laser adapter subboard; In response to a selected laser being connected to the test device motherboard via the laser adapter daughterboard, the test device motherboard determines a test program template corresponding to the selected laser. According to the test program template, run the laser test program, including temperature control and operating current control, until the laser reaches the optimal operating current at the currently set temperature point; The optimal operating current corresponds to the optimal accuracy and / or optimal stability of the standard frequency signal at the currently set temperature point.
10. The CPT atomic clock laser testing method as described in claim 9, characterized in that, It also includes the following steps: By changing the temperature control value, the optimal operating temperature parameter of the selected laser is obtained; the optimal operating temperature parameter corresponds to the optimal accuracy and / or optimal stability of the standard frequency signal.