Solid state disk-based full function test system, implementation method and computer device

Abstract

This application relates to a full-featured testing system, implementation method, computer equipment, and storage medium based on solid-state drives (SSDs). The system includes a host terminal, a testing terminal, and a control terminal. The host terminal communicates with the motherboard of the testing terminal via a network port. The motherboard is connected to the testing board of the control terminal via an M.2 interface and an M.2 extension cable. The host terminal displays the test interface, saves test results, sends tasks to the testing terminal via the network, monitors test results, and controls interrupts. The testing terminal monitors and executes test tasks sent by the host terminal, updates test results, handles exceptions, and saves test records. The SSD under test is inserted into the testing board via a connector for testing. The control terminal implements test control through an STM32 chip and a power supply chip. This invention can achieve full coverage of the testing functions of a solid-state drive testing solution.

Description

Technical Field

[0001] This invention relates to the field of solid-state drive (SSD) technology, and in particular to a full-function testing system, implementation method, computer device, and storage medium based on SSDs. Background Technology

[0002] Currently, existing SSD system testing solutions are generally based on dedicated testing platforms from overseas. Dedicated testing equipment is expensive. For example, the price of a single port from mainstream South Korean equipment manufacturers Unitest and Neosem that meets high and low temperature testing requirements is generally over 15,000 RMB. The testing cost is high. If upgrades are involved (such as from PCIe 4.0 to 5.0), the cost of equipment modification and module upgrades will also be charged separately. Some equipment manufacturers' equipment does not even support module upgrades and can only be replaced as a whole, making upgrades and maintenance inconvenient.

[0003] Furthermore, since some test development technologies are not publicly available, all test platforms basically only open the upper-layer application interfaces. The underlying drivers, protocols, and command encapsulations do not support user modification. Test plan updates and technical improvements rely more on equipment manufacturers. Development time and results often cannot meet the requirements, making it difficult to guarantee the requirements for test diversity. Summary of the Invention

[0004] Therefore, it is necessary to provide a full-function testing system, implementation method, computer equipment, and storage medium based on solid-state drives to address the aforementioned technical problems.

[0005] A full-featured testing system based on a solid-state drive, the system comprising:

[0006] The system comprises a host terminal, a test terminal, and a control terminal. The host terminal communicates with the motherboard of the test terminal via a network port, and the motherboard is connected to the test board of the control terminal via an M.2 interface and an M.2 extension cable.

[0007] The host terminal is used to display the test interface, save the test results, send tasks to the test terminal via the network, monitor the test results, and control interruption.

[0008] The test terminal is used to listen for and execute test tasks issued by the host terminal, update test results, handle exceptions, and save test records.

[0009] The solid-state drive under test is inserted into the test board via a connector for testing. The control terminal implements test control through an STM32 chip and a power chip.

[0010] In one embodiment, the host terminal includes a test terminal management module, a user management module, a configuration management module, a test center module, a log management module, an analysis management module, a device management module, and a database management module;

[0011] The test terminal management module is used for: distributing test scripts and configurations, real-time monitoring of the test terminal, controlling the test process of the test terminal, and powering on and off the test terminal via network startup.

[0012] The database management module is used for mass production database connection, product information acquisition, production server connection, and test log storage.

[0013] The user management module is used for account management, permission management, user registration, user query, and permission modification;

[0014] The configuration management module is used for program query, program configuration, and parameter configuration.

[0015] The log management module is used for single queries and batch exports;

[0016] The analysis and management module is used for analysis queries and analysis uploads;

[0017] The device management module is used for temperature curve querying and voltage calibration.

[0018] The test center module is used for test information display, test status monitoring, and test process control.

[0019] In one embodiment, the test terminal includes a control terminal management module, a test script execution module, a host terminal management module, and a driver layer;

[0020] The control terminal management module is used for serial communication, power-on / off control, voltage and current detection, voltage biasing, DAS detection, PLP control, and SMBUS communication.

[0021] The host management module is used to update the test status and monitor host behavior.

[0022] The test script execution module is used to execute the test process, update the test status, and save the test results.

[0023] In one embodiment, the control terminal includes an I2C module, an SMBUS module, a serial port interface, an ADC module, and a GPIO module.

[0024] The I2C module is used to adjust the potentiometer settings and the corresponding input voltage via I2C communication.

[0025] The SMBUS module is used to perform data transmission and querying on the solid-state drive under test through SMBUS commands, and to run the SMBUS function test script.

[0026] The serial port interface is used for test terminal monitoring, serial port command sending and receiving, and test data transmission.

[0027] The ADC module is used for voltage and current detection to achieve ADC data conversion;

[0028] The GPIO module is used for power-on / off control, DAS input detection, and PLP output detection.

[0029] In one embodiment, the system further includes a server and a switch, the switch communicating with the host, the test, and the server via network cables.

[0030] In one embodiment, the system further includes a power module for supplying power to the motherboard and the test board.

[0031] A method for implementing full-function testing based on a solid-state drive (SSD), wherein the method is applied to a full-function testing system based on an SSD as described in any of the above claims, wherein the SSD under test is plugged into the test board for testing, and the test board is designed with test module functions to control the SSD.

[0032] In one embodiment, the method further includes:

[0033] In high and low temperature batch testing, a high and low temperature chamber is added, and the test board is placed in the front cavity temperature change environment, while the main board is placed in the isolated rear cavity room temperature environment. The two are connected by an extension line and sealed to achieve batch temperature cycling testing.

[0034] A computer device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of any of the methods described above.

[0035] A computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of any of the above methods.

[0036] The aforementioned full-featured SSD-based testing system, implementation method, computer equipment, and storage media can achieve full coverage of the testing functions. Test communication signals are directly connected to the SSD via the motherboard to complete all data read / write function tests. Other SSD tests, such as normal and abnormal power-on / off, power consumption detection, and voltage bias testing, can be implemented by designing corresponding functional modules on the test board. Furthermore, this testing solution can be completely domestically produced. The hardware mainly includes the host, switch, motherboard, test board, power supply, and connecting cables. The motherboard selection generally chooses commercially available motherboards supporting M.2 slots with domestic applications. The test board can be independently designed and manufactured according to the functions to be implemented, achieving complete domestic production through material selection and processing. Attached Figure Description

[0037] Figure 1 This is a block diagram of a full-featured test system based on a solid-state drive in one embodiment;

[0038] Figure 2 This is a framework diagram of a full-featured test system based on a solid-state drive in one embodiment;

[0039] Figure 3 This is a block diagram of a full-featured test system based on a solid-state drive, as described in another embodiment.

[0040] Figure 4 This is a block diagram of a full-featured test system based on a solid-state drive in another embodiment;

[0041] Figure 5 This is an overall framework diagram of a full-featured test system based on a solid-state drive in one embodiment;

[0042] Figure 6 This is a schematic diagram of the functional modules on the host side in one embodiment;

[0043] Figure 7 This is a schematic diagram of the functional modules of the test terminal in one embodiment;

[0044] Figure 8 This is a schematic diagram of the functional modules of the control terminal in one embodiment;

[0045] Figure 9 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0046] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0047] Currently, existing SSD system testing solutions are generally based on dedicated testing platforms from overseas. These dedicated testing equipment are expensive; for example, a single port from major South Korean equipment manufacturers like Unitest and Neosem that meets high and low temperature testing costs generally over 15,000 RMB. This results in high testing costs. If upgrades are involved (e.g., from PCIe 4.0 to 5.0), additional costs are required for equipment modification and module upgrades. Some equipment manufacturers even do not support module upgrades, requiring complete system replacement, making upgrades and maintenance inconvenient. Furthermore, because some test development technologies are not publicly available, most testing platforms only provide upper-layer application interfaces; the underlying drivers, protocols, and command encapsulations do not support user modification. Test solution updates and technical improvements rely heavily on equipment manufacturers, and development time and results often fail to meet requirements, making it difficult to guarantee the diversity of testing needs.

[0048] Based on this, the present invention proposes a full-function testing method based on solid-state drives, which aims to meet the full coverage of all testing functions of SSD systems, achieve independent and controllable technology, reduce testing costs, and have strong scalability.

[0049] In one embodiment, such as Figure 1 As shown, a full-featured testing system 100 based on a solid-state drive is provided. The system includes:

[0050] The system includes a host terminal 101, a test terminal 102, and a control terminal 103. The host terminal 101 communicates with the motherboard of the test terminal 102 via a network port. The motherboard is connected to the test board of the control terminal 103 via an M.2 interface and an M.2 extension cable.

[0051] The host terminal 101 is used to display the test interface, save the test results, send tasks to the test terminal 102 via the network, listen to the test results, and control interruption.

[0052] The test terminal 102 is used to listen for and execute test tasks issued by the host terminal 101, update test results, handle exceptions, and save test records.

[0053] The solid-state drive under test is inserted into the test board via a connector for testing. The control terminal 103 implements test control through an STM32 chip and a power chip.

[0054] For specific details, please refer to Figure 2 The framework diagram shown includes three parts: the host terminal, the test terminal, and the control terminal.

[0055] The host side specifically includes a UI module: displaying the test interface, results, and communicating with the mass production server; a Watchdog module: sending task execution commands to the test terminal, monitoring test results, and controlling interrupts; and a Power Control module: controlling the power on and off of the test terminal via the network port and enabling remote restart.

[0056] The testing module specifically includes: Watchdog module: listens for and executes tasks on the host, updates test results, and handles exceptions; Log module: saves and displays test records; PCIE module: handles PCIE commands and data reading and writing; UART module: handles serial communication; and control module.

[0057] The control unit specifically includes: PowerControl module: for power-on / off control and presence detection of the SSD; Consumption module: for power consumption detection; SMBUS module: for simulating SMBUS testing; DAS module: for DAS signal detection; PLP module: for PLP pin control; and UART module: for communication between the control and testing units.

[0058] Specifically, the motherboard and SSD are directly connected. The motherboard is connected to the test board via an M.2 interface and an M.2 extension cable. The SSD is plugged into the test board for testing. The test board is designed with relevant test modules to control the SSD. One motherboard can support 4 tests. This solution can meet all the requirements of SSD system-level testing functions, achieve complete localization, independent and controllable technology, and effectively reduce testing costs.

[0059] In this embodiment, the test scheme achieves full coverage of test functions. The test communication signal is directly connected to the SSD through the motherboard to complete all data read and write function tests. Other tests on the SSD are implemented by designing corresponding functional modules on the test board, such as normal and abnormal power-on and power-off, power consumption detection, voltage deviation, etc. In addition, this test scheme can be completely domestically produced. The hardware of the test scheme mainly includes a host, switch, motherboard, test board, power supply and connecting cables. The motherboard selection generally selects commercial motherboards that support M.2 and have domestic applications. The test board can be independently designed and manufactured according to the functions to be implemented, and complete domestic production is achieved through material selection and processing.

[0060] In one embodiment, such as Figure 3 As shown, a full-function testing system 100 based on solid-state drives is provided. The system also includes a server 104 and a switch 105. The switch 105 communicates with the host 101, the test terminal 102 and the server 104 via network cables.

[0061] In one embodiment, such as Figure 4As shown, a full-featured test system 100 based on a solid-state drive is provided. The system also includes a power module 106 for supplying power to the motherboard and the test board.

[0062] Specifically, refer to Figure 5 The overall framework diagram shown illustrates a scheme where the motherboard and SSD are directly connected. The motherboard is connected to the test board via an M.2 interface and an M.2 extension cable. The SSD is plugged into the test board for testing. The test board is designed with relevant test modules to control the SSD. One motherboard enables 1-to-4 testing.

[0063] Server: A system for managing production testing processes and test data, connected to the host via a network.

[0064] Host: The test host displays the results and saves them. It controls the motherboard's power switch via the network port and communicates with the motherboard via the network.

[0065] Switch: Network relay, facilitating expansion.

[0066] Motherboard: Executes test scripts; connects four M.2 interfaces to four SSDs for SSD communication testing; connects to the SSDs via serial port for serial display and debugging; connects to the expansion card's STM32 chip via serial port for power control, voltage and current detection, etc.

[0067] Test board: M.2 connector interface test board, SSD is inserted through the connector, and controlled by STM32 chip and power chip.

[0068] Power supply: Powered by the motherboard and test board power supply.

[0069] In this embodiment, complete domestic production can be achieved. The hardware of the test solution mainly includes servers, hosts, switches, motherboards, test boards, power supplies, and connecting cables. Among them, servers, hosts, switches, power supplies, and connecting cables are all industry-standard and have domestic supply. The motherboard selection generally selects commercial motherboards that support M.2 and have domestic applications. The test board can be independently designed and manufactured according to the functions to be implemented. Complete domestic production can be achieved through material selection and processing.

[0070] Secondly, the testing solution is technically independent and controllable. The software development and application part of the testing solution is implemented using C++ programming, while the underlying layer uses NVME open-source tools and C development. Different test cases are implemented through parameter and interface configuration.

[0071] Furthermore, the testing cost of the testing solution is effectively reduced. Through solution selection and market research, the cost per port of the hardware can be reduced by more than half compared with foreign testing equipment.

[0072] In one embodiment, the host side includes a test management module, a user management module, a configuration management module, a test center module, a log management module, an analysis management module, a device management module, and a database management module;

[0073] The test terminal management module is used for: distributing test scripts and configurations, real-time monitoring of the test terminal, controlling the test process on the test terminal, and starting and stopping the test terminal via network.

[0074] The database management module is used for mass production database connection, product information acquisition, production server connection, and test log saving;

[0075] The user management module is used for account management, permission management, user registration, user query, and permission modification;

[0076] The configuration management module is used for program querying, program configuration, and parameter configuration;

[0077] The log management module is used for single queries and batch exports;

[0078] The analysis and management module is used for analysis queries and analysis uploads;

[0079] The device management module is used for temperature profile querying and voltage calibration;

[0080] The test center module is used for displaying test information, monitoring test status, and controlling the test process.

[0081] Specifically, refer to Figure 6 The diagram shows the functional modules of the host side. The main functions of the host side include: test terminal management, user management, configuration management, test center, log management, analysis management, device management, and database management. Test terminal management and database management are implemented in the backend, while other modules are implemented in the frontend with interface configuration or display functions.

[0082] Test client management (backend): Distribution of test scripts and configurations to the test client, real-time monitoring of the test client, control of the test process on the test client, and network startup and shutdown of the test client.

[0083] Database Management (Backend): Mass production database connection, product information acquisition, production server connection, and test log saving.

[0084] User Management: Account management, permission management, user registration, user query, permission modification.

[0085] Configuration management: program query, program configuration, parameter configuration.

[0086] Log management: Single query, batch export.

[0087] Analysis and Management: Analysis queries and analysis uploads.

[0088] Equipment management: Temperature profile query, voltage calibration.

[0089] Test Center: Displays test information, monitors test status, and controls the test process.

[0090] In one embodiment, the test end includes a control end management module, a test script execution module, a host end management module, and a driver layer;

[0091] The control terminal management module is used for serial communication, power-on / off control, voltage and current detection, voltage bias control, DAS detection, PLP control, and SMBUS communication.

[0092] The host-side management module is used to update the test status and monitor host-side behavior.

[0093] The test script execution module is used to execute the test process, update the test status, and save the test results.

[0094] Specifically, refer to Figure 7 The diagram shows the functional modules of the test terminal. The main functions of the test terminal include: control terminal management, test script execution, host terminal management, and driver layer. The test terminal is implemented in the backend and has no display interface. Script execution and debugging can be performed using the LinuxVScode software environment.

[0095] 1. Control Terminal Management

[0096] Serial communication: The test terminal sends serial commands through the serial port to control the control terminal.

[0097] Power supply control: Serial port command execution with parameters to control power-on and power-off.

[0098] Voltage and current detection: Serial port command execution, with parameters to control voltage and current detection, and the results are returned as test data.

[0099] Voltage biasing: Executed via serial port command, with parameters controlling the biasing value.

[0100] DAS detection: Serial port commands are executed, and the results are returned as detection data.

[0101] PLP control: Serial port command execution with parameter control.

[0102] SMBUS communication (reserved): Serial port command execution, controlling data reading and writing.

[0103] 2. Host Management

[0104] Test status update feedback to the host: Test results and test status are updated in real time, and the host obtains the information through monitoring.

[0105] Host-side behavior monitoring: Acquire host-side behavior, such as test termination, power-on / off, etc., when the test server stops and executes the host-side behavior.

[0106] 3. Test script execution

[0107] Test procedure execution: At the start of the test, the test items are executed according to the test procedure: initialization -> aging test -> voltage test -> PLP test...

[0108] Test status update: During testing, test results are updated and saved in real time for querying on the host side.

[0109] Test results are saved locally in a file path and then uploaded to the host computer after the test is completed.

[0110] 4. Driver layer

[0111] Driver 1: Uses the NVMECLI tool, supporting all NVME protocol command operations and user command operations.

[0112] Driver 2: Pynvme open-source version tools, which provides Python wrapper interfaces for commonly used NVME operations.

[0113] In one embodiment, the control terminal includes an I2C module, an SMBUS module, a serial port interface, an ADC module, and a GPIO module.

[0114] The I2C module is used to adjust the potentiometer settings and the corresponding input voltage via I2C communication;

[0115] The SMBUS module is used to perform data transfer and querying on the solid-state drive under test via SMBUS commands, enabling the execution of SMBUS function test scripts.

[0116] The serial port interface is used for test terminal monitoring, serial command sending and receiving, and test data transmission;

[0117] The ADC module is used for voltage and current detection to achieve ADC data conversion;

[0118] The GPIO module is used for power-on / off control, DAS input detection, and PLP output detection.

[0119] Specifically, refer to Figure 8 The diagram shows the functional modules of the control terminal. The control terminal uses an STM32 MCU and its main functions include: I2C module, SMBUS module, serial port interface, SPI module, and GPIO module. All modules run in the backend and are debugged and verified through the serial port.

[0120] 1. I2C Module: Voltage bias adjustment, potentiometer adjustment, via I2C communication, adjust the potentiometer setting to adjust the corresponding input voltage.

[0121] 2. SMBUS Module: Configures SMBUS communication mode, enables data transfer and querying of the SSD via SMBUS commands, and allows for the execution of SMBUS function test scripts.

[0122] 3. Serial port interface:

[0123] Test-side monitoring: Monitor and execute commands on the test side.

[0124] Serial port command sending and receiving: receiving and sending serial port commands, and passing parameters.

[0125] Test data transmission: receiving and sending test data.

[0126] 4. ADC Module: Voltage and Current Detection: The ADC on the MCU is directly connected to the 3.3V M.2 connector for voltage sampling to achieve ADC data conversion.

[0127] 5. GPIO module:

[0128] The power supply is powered on and off. The enable pin of the power supply is controlled by the MCU, which controls the power switch through GPIO.

[0129] DAS Input Detection: The MCU judges the DAS input level through GPIO.

[0130] PLP output detection: The MCU controls the PLP pins through GPIO to perform corresponding level control and control the PLP to execute.

[0131] In one embodiment, a full-function test implementation method based on a solid-state drive (SSD) is provided. This method is applied to any of the above-described full-function test systems based on a solid-state drive (SSD). The SSD under test is plugged into the test board for testing, and the test board is designed with test module functions to control the SSD.

[0132] For specific limitations regarding the full-featured test system based on solid-state drives, please refer to the descriptions in the various embodiments above, which will not be repeated here.

[0133] In one embodiment, a full-featured testing implementation method based on a solid-state drive is provided, the method further comprising:

[0134] In high and low temperature batch testing, a high and low temperature chamber is added, and the test board is placed in the front cavity temperature change environment, while the main board is placed in the isolated rear cavity room temperature environment. The two are connected by an extension line and sealed to achieve batch temperature cycling testing.

[0135] Specifically, in this embodiment, the test scheme is highly scalable. If room temperature miniaturized test bench needs to be implemented, the corresponding structural design can be added for fixing and layout. If high and low temperature batch testing is required, a set of motherboard + test board can be copied, a high and low temperature chamber design can be added, and the test board can be placed in the front cavity temperature change environment, while the motherboard can be placed in the isolated rear cavity room temperature environment. The middle is connected by an extension line and sealed. Batch temperature cycling test can be achieved.

[0136] In one embodiment, a computer device is provided, the internal structure of which can be shown as follows: Figure 9 As shown, the computer device includes a processor, memory, and a network interface connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and databases. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The network interface is used for communication with external terminals via a network connection. When the computer program is executed by the processor, it implements a full-function testing method based on a solid-state drive.

[0137] Those skilled in the art will understand that Figure 9 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0138] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps in the various method embodiments described above.

[0139] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps in the various method embodiments described above.

[0140] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM), or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), dual data rate SDRAM (DDRSDRAM), enhanced SDRAM (ESDRAM), synchronous link DRAM (SLDRAM), RAMbus direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and RAMbus dynamic RAM (RDRAM), etc.

[0141] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0142] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A full-featured testing system based on a solid-state drive, characterized in that, The system includes: The system comprises a host terminal, a test terminal, and a control terminal. The host terminal communicates with the motherboard of the test terminal via a network port, and the motherboard is connected to the test board of the control terminal via an M.2 interface and an M.2 extension cable. The host terminal is used to display the test interface, save the test results, send tasks to the test terminal via the network, monitor the test results, and control interruption. The test terminal is used to listen for and execute test tasks issued by the host terminal, update test results, handle exceptions, and save test records. The solid-state drive under test is inserted into the test board via a connector for testing. The control terminal uses an STM32 chip and a power chip to control the test. The host terminal includes a test terminal management module, a user management module, a configuration management module, a test center module, a log management module, an analysis management module, a device management module, and a database management module; The test terminal management module is used for: distributing test scripts and configurations, real-time monitoring of the test terminal, controlling the test process of the test terminal, and powering on and off the test terminal via network startup. The database management module is used for mass production database connection, product information acquisition, production server connection, and test log storage. The user management module is used for account management, permission management, user registration, user query, and permission modification; The configuration management module is used for program query, program configuration, and parameter configuration. The log management module is used for single queries and batch exports; The analysis and management module is used for analysis queries and analysis uploads; The device management module is used for temperature curve querying and voltage calibration. The test center module is used for test information display, test status monitoring, and test process control.

2. The full-function testing system based on a solid-state drive according to claim 1, characterized in that, The test terminal includes a control terminal management module, a test script execution module, a host terminal management module, and a driver layer; The control terminal management module is used for serial communication, power-on / off control, voltage and current detection, voltage biasing, DAS detection, PLP control, and SMBUS communication. The host management module is used to update the test status and monitor host behavior. The test script execution module is used to execute the test process, update the test status, and save the test results.

3. The full-function testing system based on a solid-state drive according to claim 2, characterized in that, The control terminal includes an I2C module, an SMBUS module, a serial port interface, an ADC module, and a GPIO module. The I2C module is used to adjust the potentiometer settings and the corresponding input voltage via I2C communication. The SMBUS module is used to perform data transmission and querying on the solid-state drive under test through SMBUS commands, and to run the SMBUS function test script. The serial port interface is used for test terminal monitoring, serial port command sending and receiving, and test data transmission. The ADC module is used for voltage and current detection to achieve ADC data conversion; The GPIO module is used for power-on / off control, DAS input detection, and PLP output detection.

4. The full-function testing system based on a solid-state drive according to claim 3, characterized in that, The system also includes a server and a switch, which communicate with the host, the test, and the server via network cables.

5. The full-function testing system based on a solid-state drive according to claim 4, characterized in that, The system also includes a power module for supplying power to the motherboard and the test board.

6. A method for implementing full-function testing based on a solid-state drive, characterized in that, The method is applied to the full-function test system based on solid-state drive as described in any one of claims 1-5, wherein the solid-state drive under test is plugged into the test board for testing, and the test board is designed with test module functions to control the solid-state drive; The method further includes: In high and low temperature batch testing, a high and low temperature chamber is added, and the test board is placed in the front cavity temperature change environment, while the main board is placed in the isolated rear cavity room temperature environment. The two are connected by an extension line and sealed to achieve batch temperature cycling testing.

7. A computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the steps of the method of claim 6.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method of claim 6.

Images