A chip verification method, a test case generation method, and an apparatus

Abstract

This invention discloses a chip verification method, a test case generation method, and an apparatus, relating to the field of electronic design automation, which can improve chip verification efficiency. The chip verification method includes: receiving a verification instruction in a preset verification environment; determining a target circuit module involved in the verification operation based on the verification instruction, wherein the target circuit module is an instantiated module of a target IP module or an instantiated module whose similarity to the target IP module is greater than a preset threshold; determining the parameter value of an instantiation parameter of the target circuit module based on the identification information of the target circuit module, wherein the instantiation parameter is used to define the association between the target circuit module and the target IP module; and selecting test cases to be verified from the test cases of the target IP module based on the parameter value of the instantiation parameter.

Description

Technical Field

[0001] This invention relates to the field of electronic design automation, and more particularly to a chip verification method, a test case generation method, and an apparatus. Background Technology

[0002] In the field of integrated circuit technology, chips typically undergo a series of verifications before being delivered to a foundry for manufacturing to ensure that the manufactured chips meet design requirements. With the rapid development of integrated circuit technology, chip designs are becoming increasingly complex, and correspondingly, the requirements for chip verification solutions are also becoming more stringent.

[0003] For a System-on-Chip (SoC) verification system, due to its large size, each subsystem needs to be verified separately. Within these subsystems, smaller IP (Intellectual Property) modules are instantiated and invoked multiple times. These reusable IP modules, when instantiated multiple times, have inconsistent port connections, port numbers, and effective functional logic; that is, the instantiated modules may not utilize all the functions of the original IP module. Therefore, each IP instance requires different test cases for verification, and these test cases have varying constraints. This necessitates managing the characteristics to be verified by combining the IP instance module with its specific application within the subsystem and SoC system. For example, for an IP instance module in a specific application, verifiers need to analyze the application scenario, determine verification test cases, and modify the test case constraints to meet the specific application requirements of the IP instance, significantly increasing the workload of verifiers and reducing verification efficiency. Summary of the Invention

[0004] In view of this, embodiments of the present invention provide a chip verification method, a test case generation method and apparatus, an electronic device, and a computer-readable storage medium, which can effectively improve chip verification efficiency.

[0005] In a first aspect, embodiments of the present invention provide a chip verification method, comprising: receiving a verification instruction in a preset verification environment, and determining a target circuit module involved in the verification operation according to the verification instruction, wherein the target circuit module is an instantiation module of a target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold; determining a parameter value of an instantiation parameter of the target circuit module according to the identification information of the target circuit module, wherein the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module; and selecting a test case to be verified from test cases of the target IP module according to the parameter value of the instantiation parameter, wherein the test case to be verified is used to verify the target circuit module in the preset verification environment.

[0006] Optionally, before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, the method further includes: converting the variable factors in the instantiation of the target IP module into corresponding instantiation parameters, wherein the variable factors include at least one of the following: port type, port protocol, port name, internal logic; configuring corresponding parameter values ​​for the instantiation parameters of each instantiation module based on the characteristics to be verified in their respective application scenarios; and determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module includes: finding the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and using the parameter values ​​of the instantiation parameters of the first instantiation module as the parameter values ​​of the instantiation parameters of the target circuit module.

[0007] Optionally, before selecting the test case to be verified from the test cases of the target IP module based on the parameter value of the instantiation parameter, the method further includes: establishing a correspondence between the parameter value of the instantiation parameter and the test cases of the target IP module, so as to select the test case to be verified from the test cases of the target IP module based on the parameter value of the instantiation parameter and the correspondence.

[0008] Optionally, establishing the correspondence between the parameter values ​​of the instantiation parameter and the test cases of the target IP module includes: dividing the test cases of the target IP module into at least two test case groups according to a preset strategy; and establishing the correspondence between the parameter values ​​of the instantiation parameter and each of the test case groups.

[0009] Optionally, after selecting the test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, the method further includes: deriving a corresponding new class according to the class of the test case to be verified; adding the membership relationship between the test case to be verified and the target circuit module in the new class to obtain a dedicated test case for the target circuit module, so as to verify the target circuit module through the dedicated test case.

[0010] Optionally, after selecting the test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, the method further includes: using the test case to be verified to execute the verification operation corresponding to the verification instruction, wherein the verification instruction includes at least one of the following: a verification instruction for the target circuit module, a verification instruction for the subsystem where the target circuit module is located, or a verification instruction for the system where the target circuit module is located.

[0011] Optionally, after executing the verification operation corresponding to the verification instruction using the test case to be verified, the method further includes: generating a first file required for collecting code coverage for the target circuit module based on the parameter value of the instantiation parameter.

[0012] Optionally, selecting the test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter includes: selecting one test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, selecting multiple test cases to be verified, or selecting all available test cases to be verified.

[0013] Optionally, the verification operation involves at least two target circuit modules, and the instantiation parameter values ​​of each target circuit module are not completely the same; after selecting the test cases to be verified from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters, the method further includes: in the preset verification environment, using the test cases to be verified corresponding to each target circuit module, verifying each target circuit module in parallel.

[0014] Optionally, the method further includes: updating the test cases of the target IP module according to the update instruction, so as to select the updated test cases of the target IP module when executing the verification instruction.

[0015] Optionally, the target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same on-chip system or different on-chip systems.

[0016] Secondly, embodiments of the present invention also provide a method for generating test cases, comprising: determining the parameter value of an instantiation parameter of a target circuit module based on the identification information of the target circuit module, wherein the target circuit module is an instantiation module of a target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold, and the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module; and selecting test cases for the target circuit module from the test cases of the target IP module based on the parameter value of the instantiation parameter.

[0017] Optionally, before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, the method further includes: converting the variable factors in the instantiation of the target IP module into corresponding instantiation parameters, wherein the variable factors include at least one of the following: port type, port protocol, port name, internal logic; configuring corresponding parameter values ​​for the instantiation parameters of each instantiation module of the target IP module according to the characteristics to be verified in their respective application scenarios; determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module includes: finding the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and using the parameter values ​​of the instantiation parameters of the first instantiation module as the parameter values ​​of the instantiation parameters of the target circuit module.

[0018] Optionally, before selecting the test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: establishing a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module, so as to select the test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

[0019] Optionally, establishing the correspondence between the parameter values ​​of the instantiation parameter and the test cases of the target IP module includes: dividing the test cases of the target IP module into at least two test case groups according to a preset strategy; and establishing the correspondence between the parameter values ​​of the instantiation parameter and each of the test case groups.

[0020] Optionally, after selecting the test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: deriving a corresponding new class based on the class of the test cases of the target circuit module; adding the membership relationship between the test cases of the target circuit module and the target circuit module in the new class to obtain the exclusive test cases of the target circuit module.

[0021] Optionally, selecting test cases for the target circuit module from the test cases of the target IP module based on the parameter value of the instantiation parameter includes: selecting one test case for the target circuit module from the test cases of the target IP module based on the parameter value of the instantiation parameter, selecting multiple test cases for the target circuit module, or selecting all available test cases for the target circuit module.

[0022] Optionally, the method further includes: updating the test cases of the target IP module according to the update instruction, so as to select test cases for the target circuit module from the updated test cases of the target IP module.

[0023] Optionally, the target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same on-chip system or different on-chip systems.

[0024] Thirdly, embodiments of the present invention also provide a chip verification apparatus, comprising: a receiving unit, configured to receive a verification instruction in a preset verification environment, and determine a target circuit module involved in the verification operation according to the verification instruction, wherein the target circuit module is an instantiation module of a target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold; a determining unit, configured to determine the parameter value of an instantiation parameter of the target circuit module according to the identification information of the target circuit module, wherein the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module; and a selecting unit, configured to select a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, wherein the test case to be verified is used to verify the target circuit module in the preset verification environment.

[0025] Optionally, the apparatus further includes: a conversion unit, configured to convert variable factors in the instantiation of the target IP module into corresponding instantiation parameters before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, wherein the variable factors include at least one of the following: port type, port protocol, port name, and internal logic; a configuration unit, configured to configure corresponding parameter values ​​for the instantiation parameters of each instantiation module of the target IP module according to the characteristics to be verified in their respective application scenarios; and a determination unit, specifically configured to search for the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and use the parameter values ​​of the instantiation parameters of the first instantiation module as the parameter values ​​of the instantiation parameters of the target circuit module.

[0026] Optionally, the apparatus further includes: an establishment unit, configured to establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module before selecting a test case to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, so as to select the test case to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

[0027] Optionally, the establishment unit is specifically used for: dividing the test cases of the target IP module into at least two test case groups according to a preset strategy; and establishing the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

[0028] Optionally, the apparatus further includes: a derivation unit, configured to, after selecting a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, derive a corresponding new class according to the class of the test case to be verified; and an adding unit, configured to add the membership relationship between the test case to be verified and the target circuit module in the new class to obtain a dedicated test case for the target circuit module, so as to verify the target circuit module through the dedicated test case.

[0029] Optionally, the apparatus further includes: an execution unit, configured to, after selecting a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, use the test case to be verified to execute the verification operation corresponding to the verification instruction, wherein the verification instruction includes at least one of the following: a verification instruction for the target circuit module, a verification instruction for the subsystem where the target circuit module is located, or a verification instruction for the system where the target circuit module is located.

[0030] Optionally, the apparatus further includes a generation unit, configured to generate a first file required for collecting code coverage for the target circuit module based on the parameter value of the instantiation parameter after executing the verification operation corresponding to the verification instruction using the test case to be verified.

[0031] Optionally, the selection unit is specifically used to: select one test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, select multiple test cases to be verified, or select all available test cases to be verified.

[0032] Optionally, the verification operation involves at least two target circuit modules, and the instantiation parameters of each target circuit module are not completely identical; the device further includes: a parallel verification unit, used to select test cases to be verified from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters, and then, in the preset verification environment, use the test cases to be verified corresponding to each target circuit module to verify each target circuit module in parallel.

[0033] Optionally, the apparatus further includes: an update unit, configured to update the test cases of the target IP module according to an update instruction, so as to select the updated test cases of the target IP module when executing the verification instruction.

[0034] Optionally, the target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same on-chip system or different on-chip systems.

[0035] Fourthly, embodiments of the present invention also provide a test case generation apparatus, comprising: a determining unit, configured to determine the parameter value of an instantiation parameter of a target circuit module based on the identification information of the target circuit module, wherein the target circuit module is an instantiation module of a target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold, and the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module; and a selecting unit, configured to select a test case of the target circuit module from the test cases of the target IP module based on the parameter value of the instantiation parameter.

[0036] Optionally, the apparatus further includes: a conversion unit, configured to convert variable factors in the instantiation of the target IP module into corresponding instantiation parameters before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, wherein the variable factors include at least one of the following: port type, port protocol, port name, and internal logic; a configuration unit, configured to configure corresponding parameter values ​​for the instantiation parameters of each instantiation module of the target IP module according to the characteristics to be verified in their respective application scenarios; and a determination unit, specifically configured to search for the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and use the parameter values ​​of the instantiation parameters of the first instantiation module as the parameter values ​​of the instantiation parameters of the target circuit module.

[0037] Optionally, the apparatus further includes: an establishment unit, configured to establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module before selecting test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, so as to select test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

[0038] Optionally, the establishment unit is specifically used for: dividing the test cases of the target IP module into at least two test case groups according to a preset strategy; and establishing the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

[0039] Optionally, the apparatus further includes: a derivation unit, configured to, after selecting test cases for the target circuit module from the test cases of the target IP module according to the parameter value of the instantiation parameter, derive a corresponding new class according to the class of the test cases for the target circuit module; and an adding unit, configured to add the membership relationship between the test cases for the target circuit module and the target circuit module in the new class, thereby obtaining a dedicated test case for the target circuit module.

[0040] Optionally, the selection unit is specifically used to select one test case of the target circuit module from the test cases of the target IP module, select multiple test cases of the target circuit module, or select all available test cases of the target circuit module according to the parameter value of the instantiation parameter.

[0041] Optionally, the apparatus further includes: an update unit, configured to update the test cases of the target IP module according to an update instruction, so as to select test cases for the target circuit module from the updated test cases of the target IP module.

[0042] Optionally, the target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same on-chip system or different on-chip systems.

[0043] Fifthly, embodiments of the present invention also provide an electronic device, comprising: a housing, at least one processor, a memory, a circuit board, and a power supply circuit, wherein the circuit board is disposed within a space enclosed by the housing, and the processor and memory are disposed on the circuit board; the power supply circuit is used to supply power to various circuits or devices of the above-mentioned electronic device; the memory is used to store executable program code; the at least one processor runs a program corresponding to the executable program code by reading the executable program code stored in the memory, for executing any chip verification method or any test case generation method provided by embodiments of the present invention.

[0044] Fourthly, embodiments of the present invention also provide a computer-readable storage medium storing one or more programs, which can be executed by one or more processors to implement any chip verification method or any test case generation method provided in the embodiments of the present invention.

[0045] The chip verification method, test case generation method and apparatus, electronic device, and computer-readable storage medium provided by embodiments of the present invention can determine the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, and select test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters. Since the instantiation parameters can be used to define the association between the target circuit module and the target IP module, after determining the parameter values ​​of the instantiation parameters corresponding to the target circuit module based on its identification, the association between the target circuit module and the target IP module can be determined based on these parameter values. That is, what similarities and differences exist between the target circuit module and the target IP module, and how these similarities and differences affect which test cases the target circuit module selects from the target IP module and which it does not, thereby obtaining the test cases required by the target circuit module. In this way, the target circuit module corresponding to the target IP module does not need to set up and maintain its own test case set separately. Instead, it only needs to select the required test cases from the test cases of the corresponding target IP module during verification based on its own instantiation parameters. This greatly reduces the workload of verification personnel and effectively improves verification efficiency. Attached Figure Description

[0046] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0047] Figure 1 A flowchart of a chip verification method provided in an embodiment of the present invention;

[0048] Figure 2 This is a flowchart of a script control method in an embodiment of the present invention;

[0049] Figure 3 A detailed flowchart of a chip verification method provided for an embodiment of the present invention;

[0050] Figure 4 A flowchart of a test case generation method provided in an embodiment of the present invention;

[0051] Figure 5 A schematic diagram of a chip verification device provided for an embodiment of the present invention;

[0052] Figure 6 A schematic diagram of a test case generation device provided in an embodiment of the present invention;

[0053] Figure 7 A schematic diagram of an electronic device provided as an embodiment of the present invention. Detailed Implementation

[0054] The embodiments of the present invention will now be described in detail with reference to the accompanying drawings.

[0055] It should be understood that the described embodiments are merely some, not all, of the embodiments of the present invention. All other embodiments obtained by those skilled in the art based on the embodiments of the present invention without inventive effort are within the scope of protection of the present invention.

[0056] To enable those skilled in the art to better understand the technical concept, implementation scheme and beneficial technical effects of the embodiments of the present invention, detailed descriptions are provided below through specific embodiments.

[0057] In a first aspect, embodiments of the present invention provide a chip verification method that can effectively improve chip verification efficiency.

[0058] like Figure 1 As shown, the chip verification method provided in the embodiments of the present invention may include:

[0059] S11. Receive a verification instruction in a preset verification environment, and determine the target circuit module involved in the verification operation according to the verification instruction. The target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold.

[0060] In chip verification, various verification environments can exist, such as IP module verification environments, subsystem verification environments, and system verification environments. The verification content and objectives of different verification environments may differ, but all can execute corresponding verification operations according to verification instructions. The verification instructions can specify the verification object or verification scope; circuit modules belonging to this verification object or scope are the target circuit modules. The target circuit module can be an instantiated module of the target IP module or an instantiated module whose similarity to the target IP module is greater than a preset threshold. The target IP module can be a relatively independent IP (Intellectual Property) module designed by an engineer and possessing a certain function. The target circuit module is an instantiation of the target IP module in a specific application. Optionally, in embodiments of the present invention, the target circuit module can be obtained by instantiating the target IP module or by instantiating other IP modules, but it must be very similar to the target IP module, for example, with a similarity greater than a preset threshold (e.g., the preset threshold can be 95%).

[0061] S12. Based on the identification information of the target circuit module, determine the parameter value of the instantiation parameter of the target circuit module, wherein the instantiation parameter is used to define the association between the target circuit module and the target IP module;

[0062] After determining the target circuit module involved in the verification operation according to the verification instruction in step S11, in this step, the instantiation parameters of the target circuit module can be determined according to the identification information of the target circuit module. The instantiation parameters are the parameters used to define the association between the target circuit module and the target IP module.

[0063] Optionally, if the target circuit module is instantiated from the target IP module, then the target circuit module is a type of reuse of the target IP module. Since the specific circuit environment of each target circuit module will be different, during the instantiation process, the target circuit module will not completely reuse all the contents of the target IP module, but will select a part of the contents for reuse. Therefore, different association relationships can be formed between the target circuit module and the target IP module.

[0064] In embodiments of the present invention, this association relationship can be parameterized. That is, different association relationships are described by the instantiation parameters of different target circuit modules. Different parameter values ​​of the instantiation parameters result in different association relationships. For example, target IP module IP1 has three functions: logic function A, logic function B, and logic function C. Target circuit module inst1 reuses only logic functions A and B, and target circuit module inst2 reuses only logic functions B and C, etc. Therefore, the parameter value p1 of the instantiation parameter corresponding to target circuit module inst1 and the parameter value p2 of the instantiation parameter corresponding to target circuit module inst2 will be different. In this step, the specific circuit environment and application scenario of each target circuit module can be identified based on the identification information of the target circuit module, that is, the parameter value of the instantiation parameter of the target circuit module corresponding to the identification information can be found.

[0065] Similarly, if the similarity between the target circuit module and the target IP module is greater than a preset threshold, the association between the target circuit module and the target IP module can also be defined using the corresponding instantiation parameters, which will not be elaborated here.

[0066] S13. Based on the parameter value of the instantiation parameter, select a test case to be verified from the test cases of the target IP module. The test case to be verified is used to verify the target circuit module in the preset verification environment.

[0067] After obtaining the instantiation parameter values ​​of the target circuit module in step S12, this step allows for the selection of test cases to be verified from the test cases of the target IP module based on these parameter values. Since the target IP module is an IP module designed by an engineer, possessing certain functions and relatively independent, while the target circuit module is an instantiation module of the target IP module, or an instantiation module with a similarity greater than a preset threshold, the target IP module has the most comprehensive and universal functionality compared to the target circuit module. The test cases of the target IP module also include test cases that traverse and verify all functional features of the IP. In contrast, the test cases required for the target circuit module are only a part of the test cases of the target IP module. In this step, test cases corresponding to the target circuit module can be selected from the test cases of the target IP module based on the instantiation parameters of the target circuit module, resulting in test cases to be verified. These test cases can effectively verify the target circuit module.

[0068] The chip verification method provided by the embodiments of the present invention can receive verification instructions in a preset verification environment, determine the target circuit module involved in the verification operation according to the verification instructions, determine the parameter values ​​of the instantiation parameters of the target circuit module according to the identification information of the target circuit module, and select test cases to be verified from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters, for use in verifying the target circuit module in the preset verification environment. Since the instantiation parameters can be used to define the association between the target circuit module and the target IP module, after determining the parameter values ​​of the instantiation parameters corresponding to the target circuit module according to the identifier of the target circuit module, the association between the target circuit module and the target IP module can be known based on the parameter values. That is, what similarities and differences the target circuit module and the target IP module have, and these similarities and differences affect which test cases the target circuit module selects from the target IP module and which it does not select, thereby obtaining the test cases to be verified required by the target circuit module. In this way, the target circuit module corresponding to the target IP module does not need to set up and maintain its own test case set separately. Instead, it only needs to select the required test cases from the test cases of the corresponding target IP module during verification based on its own instantiation parameters. This greatly reduces the workload of verification personnel and effectively improves verification efficiency.

[0069] Specifically, before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module in step S12, the chip verification method provided in the embodiments of the present invention may further include: converting the variable factors in the instantiation of the target IP module into corresponding instantiation parameters, wherein the variable factors include at least one of the following: port type, port protocol, port name, internal logic; configuring corresponding parameter values ​​for the instantiation parameters of each instantiation module according to the characteristics to be verified in their respective application scenarios; based on this, step S12, determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, may specifically include: finding the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and using the parameter values ​​of the instantiation parameters of the first instantiation module as the parameter values ​​of the instantiation parameters of the target circuit module.

[0070] As mentioned earlier, the target circuit module is an instantiated module of the target IP module, or an instantiated module whose similarity to the target IP module is greater than a preset threshold. To accurately define the association between the target circuit module and the target IP module through instantiation parameters, in this embodiment, the variable factors in the instantiation of the target IP module can be converted into corresponding instantiation parameters. Optionally, these variable factors may include, for example, port type, port protocol, port name, internal logic, etc., where internal logic may include, for example, internal function implementation, internal register definition, base address, bus width, etc. For example, in one embodiment of the present invention, the variable factors in the instantiation of the target IP module can be converted into a set of instantiation parameters with four components (parameter 1, parameter 2, parameter 3, parameter 4), where parameter 1 describes which ports the target circuit module uses, parameter 2 describes which internal logic functions the target circuit module uses, parameter 3 describes which port protocols the target circuit module is based on, and parameter 4 describes which internal registers the target circuit module uses, etc.

[0071] Since the instantiated modules obtained during the instantiation process of the target IP module are different, and the specific circuit location and application environment of each instantiated module are different, the application scenarios and the corresponding characteristics to be verified under the application scenarios of each instantiated module are also different. In the embodiments of the present invention, the instantiation parameters of each instantiated module can be configured with corresponding parameter values ​​according to the characteristics to be verified under their respective application scenarios. For example, the parameter value p3 of the instantiation parameter corresponding to the instantiation module inst3 is (parameter 1 = 0, parameter 2 = 3, parameter 3 = TCP / IP, parameter 4 = 5), and the parameter value p4 of the instantiation parameter corresponding to the instantiation module inst4 is (parameter 1 = 2, parameter 2 = 1, parameter 3 = 0, parameter 4 = 3), etc. If the identification information of the target circuit module is inst3 according to the verification instruction, the parameter value p3 of the instantiation parameter of the instantiation module inst3 can be selected as the parameter value of the target circuit module.

[0072] After determining the parameter values ​​of the instantiation parameters of the target circuit module, in order to select the required test cases for the target circuit module from the test cases of the target IP module based on the parameter values, in one embodiment of the present invention, before step S13 selects the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the chip verification method provided by the embodiment of the present invention may further include: establishing a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module, so as to select the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

[0073] Specifically, when designing test cases for the target IP module, each test case has its own corresponding characteristic to be verified. Here, the characteristic to be verified can be used as a bridge to establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases. For example, test case 1 is used to verify whether logic function A can be implemented, and logic function A corresponds to the parameter value p5(1,4,5,0) of the instantiation parameter. Therefore, test case 1 and p5 have a correspondence. When the parameter value of the target circuit module is p5, test case 1 can be selected as the test case to be verified.

[0074] It should be noted that although in this embodiment, logical function A corresponds to the parameter value p5 of the instantiation parameter, p5 may also correspond to other logical functions of the instantiation module. In this embodiment of the invention, each instantiation module may have a set of parameter values ​​for instantiation parameters, which can refer to the parameter values ​​corresponding to each instantiation parameter. This set of parameter values ​​can reflect all the characteristics to be verified of the instantiation module, and can also be used to select test cases for verifying these characteristics based on the parameter values ​​of the instantiation parameters.

[0075] Optionally, depending on the needs of the verification operation, selecting the test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter in step S13 may include: selecting one test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, selecting multiple test cases to be verified, or selecting all available test cases to be verified.

[0076] To further improve the efficiency of test case selection for the target circuit module, in one embodiment of the present invention, establishing the correspondence between the parameter values ​​of the instantiation parameter and the test cases of the target IP module may specifically include: dividing the test cases of the target IP module into at least two test case groups according to a preset strategy; and establishing the correspondence between the parameter values ​​of the instantiation parameter and each of the test case groups. In other words, multiple test cases used to verify the same characteristic to be verified can be divided into the same test case group, and the correspondence between the parameter values ​​of the instantiation parameter and each test case group can be established. This allows for the selection of the corresponding test case group based on the parameter values ​​of the instantiation parameter of the target circuit module, without having to traverse all test cases of the target IP module.

[0077] For example, in one embodiment of the present invention, a test case group suite_name_1

[0078] The definition can be as follows:

[0079] Suite_name:suite_name_1

[0080] {

[0081] Attribute 1: The storage path of the test cases corresponding to the target IP module.

[0082] Attribute 2: The person in charge of this test case group.

[0083] Example 1: test_name_1,

[0084] Test case 2: test_name_2,

[0085] ...

[0086] Test case n: test_name_n

[0087] }

[0088] Furthermore, in the embodiments of the present invention, the test case set corresponding to the target circuit module, as an instantiation module, can exist virtually and does not occupy physical storage files. The corresponding test cases or test case set are dynamically generated only when the target circuit module starts running simulation. Specifically, generating a single test case can be used to simulate and run a single test case on the target circuit module, while generating a test case set can utilize all test cases belonging to the target circuit module to verify the target circuit module.

[0089] In order to reflect the relationship between dynamically generated test cases or test case sets and the test cases of the target IP module, and also to distinguish the test cases corresponding to different target circuit modules, in one embodiment of the present invention, each dynamically generated test case can be equipped with a corresponding identifier.

[0090] Specifically, since the Universal Verification Methodology (UVM) requires each test case to be a class, with uvm_test as the base class, the specific form of the identifier that can be distinguished from other IP instances can be as follows: A script is used to add a class wrapper to the class of each test case test_name_n to extend the test cases for the general target IP module. The naming convention in the wrapper can be to add a suffix to test_name_n, for example, test_name_n_IP_inst as the new class name. Furthermore, each test case class test_name_n can generate test case names corresponding to different target circuit modules.

[0091] For example, in one embodiment of the present invention, after selecting the test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter in step S13, the chip verification method provided by the embodiment of the present invention may further include: deriving a corresponding new class according to the class of the test case to be verified; adding the membership relationship between the test case to be verified and the target circuit module in the new class to obtain a dedicated test case for the target circuit module, so as to verify the target circuit module through the dedicated test case.

[0092] Further, after selecting the test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter in step S13, the chip verification method provided by the embodiment of the present invention may further include: using the test case to be verified to execute the verification operation corresponding to the verification instruction, wherein the verification instruction includes at least one of the following: a verification instruction for the target circuit module, a verification instruction for the subsystem where the target circuit module is located, or a verification instruction for the system where the target circuit module is located.

[0093] Specifically, after selecting the test cases to be verified for the target circuit module, the verification operations corresponding to the verification instructions can be executed using the selected test cases. It should be noted that although the selected test cases belong to the target circuit module, the verification operations performed using these test cases are not limited to verifying only the target circuit module. That is, in the embodiments of the present invention, the verification instructions can include not only verification instructions for the target circuit module, but also verification instructions for the subsystem containing the target circuit module, or verification instructions for the system containing the target circuit module. These test cases can also be used when verifying these subsystems or the system.

[0094] Furthermore, after executing the verification operation corresponding to the verification instruction using the test case to be verified, the chip verification method provided in the embodiments of the present invention may further include: generating a first file required for collecting code coverage for the target circuit module based on the parameter values ​​of the instantiation parameters. Here, code coverage represents the degree to which code is covered by test case execution. The first file can be used by simulation tools when providing code coverage reports. Specifically, the first file may contain signal paths and module paths to be excluded corresponding to the code coverage collection target; that is, the first file excludes coverage collection for ports or logic functions that are invalid for the current target circuit module. Optionally, in one embodiment of the present invention, the first file may be, for example, a waive file. The waive file may contain information such as ports, internal functional logic, and internal registers corresponding to the characteristics to be verified that are not supported by the target circuit module. Thus, since the waive file is also generated based on the parameter values ​​of the instantiation parameters of each target circuit module, no corresponding operations are required from the verification personnel, further improving verification efficiency.

[0095] Optionally, in embodiments of the present invention, the target circuit module involved in the verification operation can be one or more. For example, in one embodiment of the present invention, the verification operation involves at least two target circuit modules, and the parameter values ​​of the instantiation parameters of each target circuit module are not completely the same; based on this, after selecting the test cases to be verified from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters in step S13, the chip verification method provided by the embodiments of the present invention may further include: in the preset verification environment, using the test cases to be verified corresponding to each target circuit module, verifying each target circuit module in parallel, thereby further improving the chip verification efficiency.

[0096] The chip verification method provided by the embodiments of the present invention not only effectively improves the efficiency of chip verification but also significantly reduces the maintenance burden of test cases required for verification. When test cases need to be updated, it is only necessary to update the test cases of the target IP module according to the update instruction. When executing the verification instruction, the updated test cases of the target IP module can be selected, eliminating the need to update and maintain the test cases for each target circuit module separately. This not only greatly reduces the maintenance burden of test cases but also allows the test results and code coverage of test cases updated for a specific target circuit module to be applied to other similar circuit modules, thereby further improving the chip verification efficiency.

[0097] Furthermore, in embodiments of the present invention, the target IP module may correspond to multiple target circuit modules, and each target circuit module may be located not only in the same on-chip system but also in different on-chip systems. That is to say, even if the target circuit modules are located in different SoCs, as long as these target circuit modules correspond to the same target IP module, the chip verification method provided in the embodiments of the present invention can be used to select the corresponding test case to be verified from the test cases of the target IP module.

[0098] In specific implementations, the chip verification method provided in the embodiments of the present invention can be implemented using a corresponding scripting language, such as Ruby control scripts, Perl scripts, etc. For example, a chip verification method implemented using Ruby control scripts can be as follows: Figure 2 As shown.

[0099] The chip verification method provided by the present invention will be described in detail below through a specific embodiment.

[0100] like Figure 3 As shown, the chip verification method provided by the embodiments of the present invention may include:

[0101] S201. Convert the variable factors of the target IP module in instantiation into corresponding instantiation parameters, wherein the variable factors include at least one of the following: port type, port protocol, port name, and internal logic;

[0102] S202. Based on the characteristics to be verified of each instantiation module of the target IP module in its respective application scenario, configure corresponding parameter values ​​for the instantiation parameters of each instantiation module.

[0103] S203. Receive a verification instruction in a preset verification environment, and determine the target circuit module involved in the verification operation based on the verification instruction.

[0104] S204. Determine the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module;

[0105] S205. Based on the parameter values ​​of the instantiation parameters, select test cases to be verified from the test cases of the target IP module;

[0106] S206. Derive a new class based on the class of the test case to be verified;

[0107] S207. In the new class, add the membership relationship between the test case to be verified and the target circuit module to obtain a dedicated test case for the target circuit module, so as to verify the target circuit module through the dedicated test case;

[0108] S208. Execute the verification operation corresponding to the verification instruction using the test case to be verified, wherein the verification instruction includes at least one of the following: a verification instruction for the target circuit module, a verification instruction for the subsystem where the target circuit module is located, or a verification instruction for the system where the target circuit module is located.

[0109] S209. Based on the parameter values ​​of the instantiation parameters, generate a first file required for collecting code coverage for the target circuit module;

[0110] S210. Update the test cases of the target IP module according to the update instruction.

[0111] Secondly, embodiments of the present invention provide a method for generating test cases, which can effectively improve chip verification efficiency.

[0112] like Figure 4 As shown, the test case generation method provided in the embodiments of the present invention may include:

[0113] S31, Based on the identification information of the target circuit module, determine the parameter value of the instantiation parameter of the target circuit module, wherein the target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold, and the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module;

[0114] The target circuit module can be an instantiation of the target IP module or an instantiation of the target IP module with a similarity greater than a preset threshold. The target IP module can be a relatively independent IP module designed by an engineer and possessing a specific function. The target circuit module is an instantiation of the target IP module in a specific application. Optionally, in embodiments of the present invention, the target circuit module can be obtained by instantiating the target IP module or by instantiating other IP modules, but it must be very similar to the target IP module, for example, with a similarity greater than a preset threshold (e.g., the preset threshold could be 95%).

[0115] In this step, the instantiation parameters of the target circuit module can be determined based on the identification information of the target circuit module. The instantiation parameters are the parameters used to define the association between the target circuit module and the target IP module.

[0116] Optionally, if the target circuit module is instantiated from a target IP module, then the target circuit module is a type of reuse of the target IP module. Since the specific circuit environment of each target circuit module will differ, during the instantiation process, the target circuit module usually does not completely reuse all the content of the target IP module, but rather selects and reuses a portion of it. Therefore, different associations can be formed between the target circuit module and the target IP module. In the embodiments of the present invention, this association relationship can be parameterized, that is, different association relationships can be described by the instantiation parameters of different target circuit modules. Different parameter values ​​of the instantiation parameters result in different association relationships. For example, target IP module IP1 has three functions: logic function A, logic function B, and logic function C. The corresponding target circuit module inst1 only reuses logic functions A and B, and target circuit module inst2 only reuses logic functions B and C, etc. Therefore, the parameter value p1 of the instantiation parameter corresponding to target circuit module inst1 and the parameter value p2 of the instantiation parameter corresponding to target circuit module inst2 will be different. In this step, the specific circuit environment and application scenario of each target circuit module can be identified based on the identification information of the target circuit module, that is, the parameter value of the instantiation parameter of the target circuit module corresponding to the identification information can be found.

[0117] Similarly, if the similarity between the target circuit module and the target IP module is greater than a preset threshold, the association between the target circuit module and the target IP module can also be defined using the corresponding instantiation parameters, which will not be elaborated here.

[0118] S32, based on the parameter value of the instantiation parameter, select the test case of the target circuit module from the test cases of the target IP module.

[0119] In this step, test cases for the target circuit module can be selected from the test cases of the target IP module based on this parameter value. Since the target IP module is an IP module designed by an engineer, possessing certain functions and relatively independent, while the target circuit module is an instantiated module of the target IP module, or an instantiated module with a similarity greater than a preset threshold to the target IP module, the target IP module has the most comprehensive and general functionality compared to the target circuit module. The test cases for the target IP module also include test cases that verify all functional features of the IP. In contrast, the test cases required for the target circuit module are only a part of the test cases for the target IP module. In this step, test cases corresponding to the target circuit module can be selected from the test cases of the target IP module based on the instantiation parameters of the target circuit module.

[0120] The test case generation method provided by the embodiments of the present invention can determine the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, and select test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters. Since the instantiation parameters can be used to define the association between the target circuit module and the target IP module, after determining the parameter values ​​of the instantiation parameters corresponding to the target circuit module based on the identifier of the target circuit module, the association between the target circuit module and the target IP module can be determined based on the parameter values. That is, what similarities and differences exist between the target circuit module and the target IP module, and these similarities and differences affect which test cases the target circuit module selects from the target IP module and which it does not, thus obtaining the test cases for the target circuit module. In this way, the target circuit module corresponding to the target IP module does not need to set and maintain its own test case set separately, but only needs to select the required test cases from the test cases of the corresponding target IP module based on its own instantiation parameters, thereby greatly reducing the workload of verification personnel and effectively improving verification efficiency.

[0121] Specifically, before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module in step S31, the test case generation method provided in the embodiments of the present invention may further include: converting the variable factors in the instantiation of the target IP module into corresponding instantiation parameters, wherein the variable factors include at least one of the following: port type, port protocol, port name, internal logic; configuring corresponding parameter values ​​for the instantiation parameters of each instantiation module based on the characteristics to be verified in their respective application scenarios; based on this, step S31, determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, may specifically include: finding the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and using the parameter values ​​of the instantiation parameters of the first instantiation module as the parameter values ​​of the instantiation parameters of the target circuit module.

[0122] As mentioned earlier, the target circuit module is an instantiated module of the target IP module, or an instantiated module whose similarity to the target IP module is greater than a preset threshold. To accurately define the association between the target circuit module and the target IP module through instantiation parameters, in this embodiment, the variable factors in the instantiation of the target IP module can be converted into corresponding instantiation parameters. Optionally, these variable factors may include, for example, port type, port protocol, port name, internal logic, etc., where internal logic may include, for example, internal function implementation, internal register definition, base address, bus width, etc. For example, in one embodiment of the present invention, the variable factors in the instantiation of the target IP module can be converted into a set of instantiation parameters with four components (parameter 1, parameter 2, parameter 3, parameter 4), where parameter 1 describes which ports the target circuit module uses, parameter 2 describes which internal logic functions the target circuit module uses, parameter 3 describes which port protocols the target circuit module is based on, and parameter 4 describes which internal registers the target circuit module uses, etc.

[0123] Since the instantiated modules obtained during the instantiation process of the target IP module are different, and the specific circuit location and application environment of each instantiated module are different, as are the application scenarios and the corresponding characteristics to be verified in those scenarios, the instantiation parameters of each instantiated module can be configured with corresponding parameter values ​​according to the characteristics to be verified in their respective application scenarios. For example, the parameter value p3 of the instantiation parameter corresponding to instantiated module inst3 is (parameter 1 = 0, parameter 2 = 3, parameter 3 = TCP / IP, parameter 4 = 5), and the parameter value p4 of the instantiation parameter corresponding to instantiated module inst4 is (parameter 1 = 2, parameter 2 = 1, parameter 3 = 0, parameter 4 = 3), etc. If the identification information of the target circuit module is inst3, then the parameter value p3 of the instantiation parameter of instantiated module inst3 can be selected as the parameter value of the target circuit module.

[0124] After determining the parameter values ​​of the instantiation parameters of the target circuit module, in order to select the required test cases for the target circuit module from the test cases of the target IP module based on the parameter values, in one embodiment of the present invention, before step S32 selects the test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the test case generation method provided by the embodiment of the present invention may further include: establishing a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module, so as to select the test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

[0125] Specifically, when designing test cases for the target IP module, each test case has its own corresponding characteristic to be verified. Here, the characteristic to be verified can be used as a bridge to establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases. For example, test case 1 is used to verify whether logic function A can be implemented, and logic function A corresponds to the parameter value p5(1,4,5,0) of the instantiation parameter. Therefore, test case 1 and p5 have a correspondence. When the parameter value of the target circuit module is p5, test case 1 can be selected as the test case to be verified.

[0126] It should be noted that although in this embodiment, logical function A corresponds to the parameter value p5 of the instantiation parameter, p5 may also correspond to other logical functions of the instantiation module. In this embodiment of the invention, each instantiation module may have a set of parameter values ​​for instantiation parameters, which can refer to the parameter values ​​corresponding to each instantiation parameter. This set of parameter values ​​can reflect all the characteristics to be verified of the instantiation module, and can also be used to select test cases for verifying these characteristics based on the parameter values ​​of the instantiation parameters.

[0127] Optionally, selecting test cases for the target circuit module from the test cases of the target IP module based on the parameter value of the instantiation parameter may include: selecting one test case for the target circuit module from the test cases of the target IP module, selecting multiple test cases for the target circuit module, or selecting all available test cases for the target circuit module based on the parameter value of the instantiation parameter.

[0128] To further improve the efficiency of test case selection for the target circuit module, in one embodiment of the present invention, establishing the correspondence between the parameter values ​​of the instantiation parameter and the test cases of the target IP module may specifically include: dividing the test cases of the target IP module into at least two test case groups according to a preset strategy; and establishing the correspondence between the parameter values ​​of the instantiation parameter and each of the test case groups. In other words, multiple test cases used to verify the same characteristic to be verified can be divided into the same test case group, and the correspondence between the parameter values ​​of the instantiation parameter and each test case group can be established. This allows for the selection of the corresponding test case group based on the parameter values ​​of the instantiation parameter of the target circuit module, without having to traverse all test cases of the target IP module.

[0129] Furthermore, in the embodiments of the present invention, the test case set corresponding to the target circuit module, as an instantiation module, can exist virtually and does not occupy physical storage files. The corresponding test cases or test case set are dynamically generated only when the target circuit module starts running simulation. Specifically, generating a single test case can be used to simulate and run a single test case on the target circuit module, while generating a test case set can utilize all test cases belonging to the target circuit module to verify the target circuit module.

[0130] In order to reflect the relationship between dynamically generated test cases or test case sets and the test cases of the target IP module, and also to distinguish the test cases corresponding to different target circuit modules, in one embodiment of the present invention, each dynamically generated test case can be equipped with a corresponding identifier.

[0131] Specifically, since the Universal Verification Methodology (UVM) requires each test case to be a class, with uvm_test as the base class, the specific form of the identifier that can be distinguished from other IP instances can be as follows: A script is used to add a class wrapper to the class of each test case test_name_n to extend the test cases for the general target IP module. The naming convention in the wrapper can be to add a suffix to test_name_n, for example, test_name_n_IP_inst as the new class name. Furthermore, each test case class test_name_n can generate test case names corresponding to different target circuit modules.

[0132] For example, in one embodiment of the present invention, after selecting the test cases of the target circuit module from the test cases of the target IP module according to the parameter value of the instantiation parameter, the test case generation method provided by the embodiment of the present invention may further include: deriving a corresponding new class according to the class of the test cases of the target circuit module; adding the membership relationship between the test cases of the target circuit module and the target circuit module in the new class to obtain the exclusive test cases of the target circuit module.

[0133] The test case generation method provided by the embodiments of the present invention can not only effectively improve the efficiency of chip verification, but also effectively reduce the maintenance burden of test cases required for verification. When test cases need to be updated, it is only necessary to update the test cases of the target IP module according to the update instruction, so as to select test cases for the target circuit module from the updated test cases of the target IP module, without having to update and maintain the test cases of each target circuit module separately.

[0134] Furthermore, in embodiments of the present invention, the target IP module may correspond to multiple target circuit modules, and each target circuit module may be located not only in the same system-on-a-chip (SoC) but also in different SoCs. That is to say, even if the target circuit modules are located in different SoCs, as long as these target circuit modules correspond to the same target IP module, the test case generation method provided in the embodiments of the present invention can be used to select test cases for the target circuit module from the test cases of the target IP module.

[0135] Accordingly, in a third aspect, embodiments of the present invention provide a chip verification apparatus that can effectively improve chip verification efficiency.

[0136] like Figure 5 As shown, the chip verification apparatus provided in the embodiments of the present invention may include:

[0137] The receiving unit 41 is used to receive a verification instruction in a preset verification environment and determine the target circuit module involved in the verification operation according to the verification instruction. The target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold.

[0138] The determining unit 42 is used to determine the parameter value of the instantiation parameter of the target circuit module based on the identification information of the target circuit module. The instantiation parameter is used to define the association relationship between the target circuit module and the target IP module.

[0139] Selection unit 43 is used to select a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter. The test case to be verified is used to verify the target circuit module in the preset verification environment.

[0140] The chip verification apparatus provided in the embodiments of the present invention can receive verification instructions in a preset verification environment, determine the target circuit module involved in the verification operation according to the verification instructions, determine the parameter value of the instantiation parameter of the target circuit module according to the identification information of the target circuit module, and select test cases to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, for verifying the target circuit module in the preset verification environment. Since the instantiation parameter can be used to define the association relationship between the target circuit module and the target IP module, after determining the parameter value of the instantiation parameter corresponding to the target circuit module according to the identifier of the target circuit module, it is possible to know the association relationship between the target circuit module and the target IP module according to the parameter value, that is, what similarities and differences the target circuit module and the target IP module have. These similarities and differences affect which test cases the target circuit module selects from the target IP module and which test cases it does not select, thereby obtaining the test cases to be verified required by the target circuit module. In this way, the target circuit module corresponding to the target IP module does not need to set up and maintain its own test case set separately. Instead, it only needs to select the required test cases from the test cases of the corresponding target IP module during verification based on its own instantiation parameters. This greatly reduces the workload of verification personnel and effectively improves verification efficiency.

[0141] Optionally, the chip verification apparatus provided in the embodiments of the present invention may further include:

[0142] The conversion unit is used to convert the variable factors in the instantiation of the target IP module into corresponding instantiation parameters before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module. The variable factors include at least one of the following: port type, port protocol, port name, and internal logic.

[0143] The configuration unit is used to configure corresponding parameter values ​​for the instantiation parameters of each instantiation module according to the characteristics to be verified of each instantiation module of the target IP module in their respective application scenarios.

[0144] The determining unit 42 is specifically used to find the first instantiated module corresponding to the identification information from each instantiated module according to the identification information of the target circuit module, and use the parameter value of the instantiation parameter of the first instantiated module as the parameter value of the instantiation parameter of the target circuit module.

[0145] Optionally, the chip verification apparatus provided in the embodiments of the present invention may further include: an establishment unit, configured to establish a correspondence between the parameter value of the instantiation parameter and the test cases of the target IP module before selecting a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, so as to select the test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter and the correspondence.

[0146] Optionally, the establishment unit can be used to: divide the test cases of the target IP module into at least two test case groups according to a preset strategy; and establish the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

[0147] Optionally, the chip verification apparatus provided in the embodiments of the present invention may further include:

[0148] The derivation unit is used to derive a corresponding new class based on the class of the test case to be verified after selecting a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter.

[0149] An adding unit is used to add the membership relationship between the test case to be verified and the target circuit module in the new class, so as to obtain a dedicated test case for the target circuit module, and to verify the target circuit module through the dedicated test case.

[0150] Optionally, the chip verification apparatus provided in the embodiments of the present invention may further include: an execution unit, configured to, after selecting a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, use the test case to be verified to execute the verification operation corresponding to the verification instruction, wherein the verification instruction includes at least one of the following: a verification instruction for the target circuit module, a verification instruction for the subsystem where the target circuit module is located, or a verification instruction for the system where the target circuit module is located.

[0151] Optionally, the chip verification apparatus provided in the embodiments of the present invention may further include: a generation unit, configured to generate a first file required for collecting code coverage for the target circuit module according to the parameter value of the instantiation parameter after executing the verification operation corresponding to the verification instruction using the test case to be verified.

[0152] Optionally, the selection unit 43 can be used to: select one test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, select multiple test cases to be verified, or select all available test cases to be verified.

[0153] Optionally, the verification operation involves at least two target circuit modules, and the instantiation parameters of each target circuit module are not completely identical; the device further includes: a parallel verification unit, used to select test cases to be verified from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters, and then, in the preset verification environment, use the test cases to be verified corresponding to each target circuit module to verify each target circuit module in parallel.

[0154] Optionally, the chip verification apparatus provided in the embodiments of the present invention may further include: an update unit, configured to update the test cases of the target IP module according to an update instruction, so as to select the updated test cases of the target IP module when executing the verification instruction.

[0155] Optionally, the target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same on-chip system or different on-chip systems.

[0156] Accordingly, in a fourth aspect, embodiments of the present invention provide a test case generation apparatus that can effectively improve chip verification efficiency.

[0157] like Figure 6 As shown, the test case generation apparatus provided in the embodiments of the present invention may include:

[0158] The determining unit 51 is used to determine the parameter value of the instantiation parameter of the target circuit module according to the identification information of the target circuit module, wherein the target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold, and the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module.

[0159] Selection unit 52 is used to select test cases for the target circuit module from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters.

[0160] The test case generation device provided in the embodiments of the present invention can determine the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, and select test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters. Since the instantiation parameters can be used to define the association between the target circuit module and the target IP module, after determining the parameter values ​​of the instantiation parameters corresponding to the target circuit module based on the identifier of the target circuit module, the association between the target circuit module and the target IP module can be determined based on the parameter values. That is, what similarities and differences exist between the target circuit module and the target IP module, and these similarities and differences affect which test cases the target circuit module selects from the target IP module and which it does not, thus obtaining the test cases for the target circuit module. In this way, the target circuit module corresponding to the target IP module does not need to set and maintain its own test case set separately, but only needs to select the required test cases from the test cases of the corresponding target IP module based on its own instantiation parameters, thereby greatly reducing the workload of verification personnel and effectively improving verification efficiency.

[0161] Optionally, the test case generation device may further include:

[0162] The conversion unit is used to convert the variable factors in the instantiation of the target IP module into corresponding instantiation parameters before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module. The variable factors include at least one of the following: port type, port protocol, port name, and internal logic.

[0163] The configuration unit is used to configure corresponding parameter values ​​for the instantiation parameters of each instantiation module according to the characteristics to be verified of each instantiation module of the target IP module in their respective application scenarios.

[0164] The determining unit 51 can be used to find the first instantiated module corresponding to the identification information from each instantiated module according to the identification information of the target circuit module, and use the parameter value of the instantiation parameter of the first instantiated module as the parameter value of the instantiation parameter of the target circuit module.

[0165] Optionally, the test case generation device may further include:

[0166] A setup unit is configured to establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module before selecting test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, so as to select test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

[0167] Optionally, the establishment unit may specifically be used for:

[0168] According to the preset strategy, the test cases of the target IP module are divided into at least two test case groups;

[0169] Establish the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

[0170] Optionally, the test case generation device may further include:

[0171] The derivation unit is used to derive a corresponding new class based on the class of the test cases of the target circuit module after selecting the test cases of the target circuit module from the test cases of the target IP module according to the parameter value of the instantiation parameter.

[0172] An adding unit is used to add the membership relationship between the test cases of the target circuit module and the target circuit module in the new class, thereby obtaining the exclusive test cases of the target circuit module.

[0173] Optionally, the selection unit 52 can be used to select one test case of the target circuit module from the test cases of the target IP module, select multiple test cases of the target circuit module, or select all available test cases of the target circuit module according to the parameter value of the instantiation parameter.

[0174] Optionally, the test case generation device may further include: an update unit, configured to update the test cases of the target IP module according to an update instruction, so as to select test cases for the target circuit module from the updated test cases of the target IP module.

[0175] Optionally, the target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same on-chip system or different on-chip systems.

[0176] Fifthly, such as Figure 7 As shown, embodiments of the present invention also provide an electronic device, including: a housing 100, at least one processor 110, a memory 120, a circuit board 130, and a power supply circuit 140, wherein the circuit board 130 is disposed within the space enclosed by the housing 100, and the processor 110 and the memory 120 are disposed on the circuit board 130; the power supply circuit 140 is used to supply power to various circuits or devices of the above-mentioned electronic device; the memory 120 is used to store executable program code; the processor 110 runs a program corresponding to the executable program code by reading the executable program code stored in the memory 120, for executing any of the chip verification methods or any of the test case generation methods provided in the foregoing embodiments. The specific execution process of the processor 110 of the above steps and the steps further executed by the processor 110 by running the executable program code can be found in the description of the foregoing embodiments, and will not be repeated here.

[0177] Sixthly, embodiments of the present invention also provide a computer-readable storage medium storing one or more programs, which can be executed by one or more processors to implement any of the chip verification methods or test case generation methods provided in the foregoing embodiments. The specific execution process of the processor on the above steps and the steps further executed by the processor by running executable program code can be found in the description of the foregoing embodiments, and will not be repeated here.

[0178] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0179] The various embodiments in this specification are described in a related manner. The same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on describing the differences from other embodiments.

[0180] In particular, the device embodiment is basically similar to the method embodiment, so the description is relatively simple. For relevant details, please refer to the description of the method embodiment.

[0181] For ease of description, the above apparatus is described by dividing it into various functional units / modules. Of course, in implementing this invention, the functions of each unit / module can be implemented in one or more software and / or hardware.

[0182] Those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), or random access memory (RAM), etc.

[0183] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the technical scope disclosed in the present invention should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be determined by the scope of the claims.

Claims

1. A chip verification method, characterized in that, include: The system receives a verification instruction under a preset verification environment and determines the target circuit module involved in the verification operation based on the verification instruction. The target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold. Based on the identification information of the target circuit module, the parameter values ​​of the instantiation parameters of the target circuit module are determined, and the instantiation parameters are used to define the association between the target circuit module and the target IP module; Based on the parameter values ​​of the instantiation parameters, test cases to be verified are selected from the test cases of the target IP module. The test cases to be verified are used to verify the target circuit module under the preset verification environment. Before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, the method further includes: The variable factors in the instantiation of the target IP module are converted into corresponding instantiation parameters, wherein the variable factors include at least one of the following: port type, port protocol, port name, and internal logic; Based on the characteristics to be verified of each instantiation module of the target IP module in its respective application scenario, configure corresponding parameter values ​​for the instantiation parameters of each instantiation module. The step of determining the parameter value of the instantiation parameter of the target circuit module based on the identification information of the target circuit module includes: finding the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and using the parameter value of the instantiation parameter of the first instantiation module as the parameter value of the instantiation parameter of the target circuit module.

2. The method according to claim 1, characterized in that, Before selecting the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: Establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module, so as to select the test cases to be verified from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters and the correspondence.

3. The method according to claim 2, characterized in that, The correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module includes: According to the preset strategy, the test cases of the target IP module are divided into at least two test case groups; Establish the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

4. The method according to claim 1, characterized in that, After selecting the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: Based on the class of the test case to be verified, derive the corresponding new class; In the new class, the membership relationship between the test case to be verified and the target circuit module is added to obtain a dedicated test case for the target circuit module, so as to verify the target circuit module through the dedicated test case.

5. The method according to claim 1, characterized in that, After selecting the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: The verification operation corresponding to the verification instruction is executed using the test case to be verified, wherein the verification instruction includes at least one of the following: a verification instruction for the target circuit module, a verification instruction for the subsystem in which the target circuit module is located, or a verification instruction for the system in which the target circuit module is located.

6. The method according to claim 5, characterized in that, After executing the verification operation corresponding to the verification instruction using the test case to be verified, the method further includes: Based on the parameter values ​​of the instantiation parameters, a first file is generated for the target circuit module. The first file is used to collect code coverage. The code coverage represents the degree to which the code of the target circuit module is covered by test case execution. The first file contains signal paths and module paths that need to be excluded, corresponding to the code coverage collection target, in order to exclude coverage collection of ports or logic functions that are invalid for the target circuit module.

7. The method according to claim 1, characterized in that, The step of selecting test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters includes: Based on the parameter value of the instantiation parameter, select one test case to be verified from the test cases of the target IP module, select multiple test cases to be verified, or select all available test cases to be verified.

8. The method according to claim 1, characterized in that, The verification operation involves at least two target circuit modules, and the instantiation parameters of each target circuit module are not exactly the same. After selecting the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: In the preset verification environment, each target circuit module is verified in parallel using the test cases corresponding to each target circuit module.

9. The method according to any one of claims 1 to 8, characterized in that, The method further includes: According to the update instruction, the test cases of the target IP module are updated so that when the verification instruction is executed, the updated test cases of the target IP module are selected.

10. The method according to any one of claims 1 to 8, characterized in that, The target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same system-on-a-chip or different systems-on-a-chip.

11. A method for generating test cases, characterized in that, include: Based on the identification information of the target circuit module, the parameter value of the instantiation parameter of the target circuit module is determined, wherein the target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold, and the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module; Based on the parameter values ​​of the instantiation parameters, test cases for the target circuit module are selected from the test cases for the target IP module; Before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, the method further includes: The variable factors in the instantiation of the target IP module are converted into corresponding instantiation parameters, wherein the variable factors include at least one of the following: port type, port protocol, port name, and internal logic; Based on the characteristics to be verified of each instantiation module of the target IP module in its respective application scenario, configure corresponding parameter values ​​for the instantiation parameters of each instantiation module. The step of determining the instantiation parameter value of the target circuit module based on the identification information of the target circuit module includes: finding the first instantiation module corresponding to the identification information from among the instantiation modules based on the identification information of the target circuit module, and using the instantiation parameter value of the first instantiation module as the instantiation parameter value of the target circuit module.

12. The method according to claim 11, characterized in that, Before selecting test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: Establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module, so as to select the test cases of the target circuit module from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters and the correspondence.

13. The method according to claim 12, characterized in that, The correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module includes: According to the preset strategy, the test cases of the target IP module are divided into at least two test case groups; Establish the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

14. The method according to claim 11, characterized in that, After selecting test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, the method further includes: Based on the class of the test cases for the target circuit module, derive the corresponding new class; In the new class, the membership relationship between the test cases of the target circuit module and the target circuit module is added to obtain the exclusive test cases of the target circuit module.

15. The method according to claim 11, characterized in that, The step of selecting test cases for the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters includes: Based on the parameter value of the instantiation parameter, select one test case of the target circuit module from the test cases of the target IP module, select multiple test cases of the target circuit module, or select all available test cases of the target circuit module.

16. The method according to any one of claims 11 to 15, characterized in that, The method further includes: According to the update instruction, the test cases of the target IP module are updated to select test cases for the target circuit module from the updated test cases of the target IP module.

17. The method according to any one of claims 11 to 15, characterized in that, The target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same system-on-a-chip or different systems-on-a-chip.

18. A chip verification device, characterized in that, include: The receiving unit is configured to receive a verification instruction under a preset verification environment and determine the target circuit module involved in the verification operation according to the verification instruction. The target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold. The determining unit is configured to determine the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module, wherein the instantiation parameters are used to define the association relationship between the target circuit module and the target IP module; The selection unit is used to select test cases to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter. The test cases to be verified are used to verify the target circuit module in the preset verification environment. The device further includes: The conversion unit is used to convert the variable factors in the instantiation of the target IP module into corresponding instantiation parameters before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module. The variable factors include at least one of the following: port type, port protocol, port name, and internal logic. The configuration unit is used to configure corresponding parameter values ​​for the instantiation parameters of each instantiation module according to the characteristics to be verified of each instantiation module of the target IP module in their respective application scenarios. The determining unit is specifically used to find the first instantiated module corresponding to the identification information from each instantiated module according to the identification information of the target circuit module, and use the parameter value of the instantiation parameter of the first instantiated module as the parameter value of the instantiation parameter of the target circuit module.

19. The apparatus according to claim 18, characterized in that, Also includes: An establishment unit is used to establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module before selecting the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, so as to select the test cases to be verified from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

20. The apparatus according to claim 19, characterized in that, The establishment unit is specifically used for: According to the preset strategy, the test cases of the target IP module are divided into at least two test case groups; Establish the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

21. The apparatus according to claim 18, characterized in that, Also includes: The derivation unit is used to derive a corresponding new class based on the class of the test case to be verified after selecting a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter. An adding unit is used to add the membership relationship between the test case to be verified and the target circuit module in the new class, so as to obtain a dedicated test case for the target circuit module, and to verify the target circuit module through the dedicated test case.

22. The apparatus according to claim 18, characterized in that, Also includes: An execution unit is configured to, after selecting a test case to be verified from the test cases of the target IP module according to the parameter value of the instantiation parameter, use the test case to be verified to execute the verification operation corresponding to the verification instruction, wherein the verification instruction includes at least one of the following: a verification instruction for the target circuit module, a verification instruction for the subsystem where the target circuit module is located, or a verification instruction for the system where the target circuit module is located.

23. The apparatus according to claim 22, characterized in that, Also includes: The generation unit is configured to generate a first file for the target circuit module based on the parameter value of the instantiation parameter after executing the verification operation corresponding to the verification instruction using the test case to be verified. The first file is used to collect code coverage. The code coverage indicates the degree to which the code of the target circuit module is covered by the execution of the test case. The first file contains signal paths and module paths to be excluded corresponding to the code coverage collection target, so as to exclude the coverage collection of ports or logic functions that are invalid for the target circuit module.

24. The apparatus according to claim 18, characterized in that, The selection unit is specifically used for: Based on the parameter value of the instantiation parameter, select one test case to be verified from the test cases of the target IP module, select multiple test cases to be verified, or select all available test cases to be verified.

25. The apparatus according to claim 18, characterized in that, The verification operation involves at least two target circuit modules, and the instantiation parameters of each target circuit module are not exactly the same. The apparatus further includes a parallel verification unit, configured to, after selecting test cases to be verified from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters, verify each target circuit module in parallel using the test cases to be verified corresponding to each target circuit module in the preset verification environment.

26. The apparatus according to any one of claims 18 to 25, characterized in that, The apparatus further includes an update unit, configured to update the test cases of the target IP module according to an update instruction, so as to select the updated test cases of the target IP module when executing the verification instruction.

27. The apparatus according to any one of claims 18 to 25, characterized in that, The target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same system-on-a-chip or different systems-on-a-chip.

28. A test case generation device, characterized in that, include: The determining unit is used to determine the parameter value of the instantiation parameter of the target circuit module based on the identification information of the target circuit module, wherein the target circuit module is an instantiation module of the target IP module or an instantiation module whose similarity to the target IP module is greater than a preset threshold, and the instantiation parameter is used to define the association relationship between the target circuit module and the target IP module. The selection unit is used to select test cases for the target circuit module from the test cases of the target IP module according to the parameter values ​​of the instantiation parameters. The device further includes: The conversion unit is used to convert the variable factors in the instantiation of the target IP module into corresponding instantiation parameters before determining the parameter values ​​of the instantiation parameters of the target circuit module based on the identification information of the target circuit module. The variable factors include at least one of the following: port type, port protocol, port name, and internal logic. The configuration unit is used to configure corresponding parameter values ​​for the instantiation parameters of each instantiation module according to the characteristics to be verified of each instantiation module of the target IP module in their respective application scenarios. The determining unit is specifically used to find the first instantiated module corresponding to the identification information from each instantiated module according to the identification information of the target circuit module, and use the parameter value of the instantiation parameter of the first instantiated module as the parameter value of the instantiation parameter of the target circuit module.

29. The apparatus according to claim 28, characterized in that, The device further includes: A setup unit is configured to establish a correspondence between the parameter values ​​of the instantiation parameters and the test cases of the target IP module before selecting test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters, so as to select test cases of the target circuit module from the test cases of the target IP module based on the parameter values ​​of the instantiation parameters and the correspondence.

30. The apparatus according to claim 29, characterized in that, The establishment unit is specifically used for: According to the preset strategy, the test cases of the target IP module are divided into at least two test case groups; Establish the correspondence between the parameter values ​​of the instantiation parameters and each of the test case groups.

31. The apparatus according to claim 28, characterized in that, Also includes: The derivation unit is used to derive a corresponding new class based on the class of the test cases of the target circuit module after selecting the test cases of the target circuit module from the test cases of the target IP module according to the parameter value of the instantiation parameter. An adding unit is used to add the membership relationship between the test cases of the target circuit module and the target circuit module in the new class, thereby obtaining the exclusive test cases of the target circuit module.

32. The apparatus according to claim 28, characterized in that, The selection unit is specifically used to select one test case of the target circuit module from the test cases of the target IP module, select multiple test cases of the target circuit module, or select all available test cases of the target circuit module according to the parameter value of the instantiation parameter.

33. The apparatus according to any one of claims 28 to 32, characterized in that, The device further includes: An update unit is configured to update the test cases of the target IP module according to an update instruction, so as to select test cases for the target circuit module from the updated test cases of the target IP module.

34. The apparatus according to any one of claims 28 to 32, characterized in that, The target IP module corresponds to multiple target circuit modules, and each target circuit module is located in the same system-on-a-chip or different systems-on-a-chip.

35. An electronic device, characterized in that, include: The device comprises a housing, at least one processor, a memory, a circuit board, and a power supply circuit, wherein the circuit board is disposed within the space enclosed by the housing, and the processor and memory are disposed on the circuit board; the power supply circuit is used to supply power to various circuits or devices of the aforementioned electronic device; the memory is used to store executable program code; the at least one processor runs a program corresponding to the executable program code by reading the executable program code stored in the memory, for executing the chip verification method of any one of claims 1-10 or the test case generation method of any one of claims 11-17.

36. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores one or more programs, which can be executed by one or more processors to implement the chip verification method of any one of claims 1-10 or the test case generation method of any one of claims 11-17.

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