Resistance value measuring device

Abstract

The embodiment of the present application provides a kind of resistance resistance measurement device, including first resistance placement plate and first resistance measuring instrument, first resistance placement plate is provided with measurement component, measurement component includes first placement component, first placement component includes first placement slot and two first measurement probes, first placement slot is used for the placement and limit of first to be measured patch resistance;Two first measurement probes are located in first placement slot, the first end of two first measurement probes is used for being electrically connected with the two first external electrodes of first to be measured patch resistance respectively, the second end of two first measurement probes is used for being electrically connected with the two measurement pens of first resistance measuring instrument respectively.The resistance resistance measurement device provided by the embodiment of the present application ensures that the position of first measurement probe and first to be measured patch resistance contact is fixedly unchanged, guarantees the precision of the resistance value measurement of first to be measured patch resistance.

Description

Technical Field

[0001] This invention relates to the field of resistance technology, and in particular to a resistance measuring device. Background Technology

[0002] Resistors are one of the most commonly used electronic components in electronic devices. The resistance value is the rated parameter of a resistor, indicating the extent to which the resistor impedes the flow of electric current.

[0003] Currently, to ensure that the resistance value meets the requirements, it is necessary to measure the resistance value. During measurement, the resistor is first placed on the test platform, then the two test leads of the first resistance measuring instrument are brought into contact with the terminals of the resistor, and finally the resistance value is determined by reading the value displayed on the first resistance measuring instrument.

[0004] However, during manual measurement, the contact position between the test probe and the electrodes at both ends of the resistor changes, which leads to errors in the measurement results, i.e., the measurement results are inaccurate. Summary of the Invention

[0005] The purpose of this invention is to provide a resistance measuring device to solve the technical problem of inaccurate resistance measurement results in the prior art. The specific technical solution is as follows:

[0006] This invention provides a resistance measurement device, including a first resistor placement plate and a first resistance measuring instrument. The first resistor placement plate is provided with a measuring component, which includes a first placement member. The first placement member includes a first placement groove and two first measuring probes. The first placement groove is used for placing and limiting the first chip resistor to be measured.

[0007] The two first measurement probes are located in the first placement slot. The first ends of the two first measurement probes are respectively used to electrically connect to the two first external electrodes of the first patch resistor to be tested, and the second ends of the two first measurement probes are respectively used to electrically connect to the two measuring pens of the first resistance measuring instrument.

[0008] Optionally, the first measuring probe includes a first probe body and a first telescopic needle part. The first telescopic needle part is telescopically disposed on the first probe body by a first spring. The first placement groove has a height direction, and the telescopic direction of the first telescopic needle part is consistent with the height direction of the first placement groove.

[0009] The first end of the first measuring probe is the end of the first telescopic needle portion that is away from the first probe body, and the second end of the first measuring probe is the end of the first probe body that is away from the first telescopic needle portion.

[0010] Optionally, the measurement assembly further includes a second placement member, which includes a second placement slot and two second measurement probes. The second placement slot is used for placing and limiting the second patch resistor to be tested. The second patch resistor to be tested has a different size than the first patch resistor to be tested.

[0011] Two second measurement probes are located in the second placement slot. The first ends of the two second measurement probes are respectively used to electrically connect to the two second external electrodes of the second patch resistor to be tested, and the second ends of the two second measurement probes are respectively used to electrically connect to the two measuring pens of the first resistance measuring instrument.

[0012] Optionally, with the height direction of the first placement slot as the first direction, the first placement slot is connected to the first resistor placement plate on one side along the first direction, and a pressing cover is hinged to the other side of the first placement slot along the first direction. The pressing cover is provided with a snap-fit ​​component, which is used to snap into the first placement slot when the pressing cover is closed on the first placement slot.

[0013] Optionally, the measurement component further includes a connection terminal component, which includes a first connection terminal and a second connection terminal. The first connection terminal and the second connection terminal are respectively used to connect to two measuring pens of the first resistance meter. The second ends of the two first measuring probes are respectively electrically connected to the first connection terminal and the second connection terminal, and the second ends of the two second measuring probes are respectively electrically connected to the first connection terminal and the second connection terminal.

[0014] Optionally, the first resistor placement plate is provided with a plurality of measuring components, the first resistor placement plate has a length direction, and the plurality of measuring components are distributed at intervals along the length direction of the first resistor placement plate.

[0015] Optionally, it also includes a test connection board, which is provided with a first connector for inserting the first resistor placement board, and the test connection board is also provided with a first socket assembly, which includes a plurality of first socket components.

[0016] Multiple first socket components are respectively used to electrically connect to multiple connection terminal assemblies on the first resistor placement board via the first connector. Each first socket component includes a first socket and a second socket. The first socket is electrically connected to the first connection terminal via the first connector, and the second socket is electrically connected to the second connection terminal via the first connector. Multiple first resistance measuring instruments are provided, and each of the multiple first resistance measuring instruments corresponds to a multiple of the first socket components. The two measuring probes of the first resistance measuring instrument are respectively inserted into the first socket and the second socket.

[0017] Optionally, the first connector is used to electrically connect to a plurality of the connection end assemblies on the first resistor placement board. The first connector includes a plurality of plug-in end assemblies corresponding to the plurality of connection end assemblies. Each plug-in end assembly includes a first plug-in end for electrically connecting to the first connection end and a second plug-in end for electrically connecting to the second connection end. The first plug-in end is electrically connected to the first socket, and the second plug-in end is electrically connected to the second socket.

[0018] Optionally, the test connection board also includes a second resistor placement board with the same structure as the first resistor placement board. The test connection board is provided with a second connector for inserting the second resistor placement board. The structure of the second connector is the same as that of the first connector. The test connection board is also provided with a second socket assembly with the same structure as the first socket assembly.

[0019] Optionally, it also includes a support base, on which the test connection plate is mounted.

[0020] The resistance measuring device provided in this embodiment of the invention fixes the first chip resistor to be tested through the first placement slot, ensuring that the contact position between the first measuring probe and the first chip resistor to be tested is fixed. This prevents testing errors caused by the displacement of the first chip resistor to be tested during the testing process, ensures the accuracy of the resistance measurement of the first chip resistor to be tested, and provides more accurate measurement results. It also avoids measurement errors caused by the inconsistent contact position when the test probe is manually placed in contact with the two electrodes of the first chip resistor to be tested. Attached Figure Description

[0021] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.

[0022] Figure 1 This is a schematic diagram of the structure of the first resistor placement plate in the resistance measuring device provided in this embodiment of the invention;

[0023] Figure 2 This is a schematic diagram of the test connection plate in the resistance measuring device provided in this embodiment of the invention;

[0024] Figure 3 This is a schematic diagram of the support base in the resistance measuring device provided in this embodiment of the invention;

[0025] Figure 4 This is a cross-sectional view of the first measuring probe in the resistance measuring device provided in this embodiment of the invention.

[0026] Figure label:

[0027] 10-First resistor placement plate, 11-First placement component, 12-Second placement component, 13-Third placement component, 14-Connector assembly, 15-First circuit, 20-Test connection plate, 21-First connector, 22-First socket component, 23-Second connector, 24-Second socket component, 25-Positioning hole, 30-Support base, 31-Positioning post, 40-First surface mount resistor under test, 41-First external electrode, 111-First placement slot, 112-First measurement probe, 121-Second placement slot, 122-Second measurement probe, 141-First connection end, 142-Second connection end, 211-First insertion end, 212-Second insertion end, 221-First socket, 222-Second socket, 1121-First probe body, 1122-First telescopic pin. Detailed Implementation

[0028] The technical solutions of the present invention will now be described with reference to the accompanying drawings in the embodiments of the present invention.

[0029] The embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention. The invention is described more specifically in the following paragraphs by way of example with reference to the accompanying drawings. It should be noted that the drawings are in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of the invention.

[0030] Currently, to ensure that the resistance value meets the requirements, it is necessary to measure the resistance. During measurement, the resistor is first placed on a test platform, then the two test leads of a resistance meter are brought into contact with the two terminals of the resistor. Finally, the resistance value is determined by reading the value displayed on the resistance meter. However, during manual measurement, the position of the resistor is not fixed and may shift. Furthermore, due to human factors, the contact position between the test leads and the two terminals of the resistor also changes, leading to errors in the measurement results, i.e., inaccurate measurement results.

[0031] To address the aforementioned problems, embodiments of the present invention provide a resistance measuring device, which will be described in detail below.

[0032] Reference Figures 1 to 4The resistance measuring device provided in this embodiment of the invention includes a first resistor placement plate 10 and a first resistance measuring instrument. The first resistor placement plate 10 is provided with a measuring component, which includes a first placement member 11. The first placement member 11 includes a first placement groove 111 and two first measuring probes 112. The first placement groove 111 is used for limiting and placing the first chip resistor 40 to be tested. The two first measuring probes 112 are located in the first placement groove 111. The first ends of the two first measuring probes 112 are respectively used to electrically connect to the two first external electrodes 41 of the first chip resistor 40 to be tested, and the second ends of the two first measuring probes 112 are respectively used to electrically connect to the two measuring pens of the first resistance measuring instrument.

[0033] Specifically, the resistance measuring device provided in this embodiment of the invention is used to measure the resistance value of surface-mount resistors. Surface-mount resistors are small in size and light in weight, which can greatly save circuit space costs and make the design more refined. Currently, surface-mount resistors are widely used in servers, computers, mobile phones, medical electronic products, camcorders, electronic electricity meters, etc. The first resistor placement board 10 itself can be a PCB (Printed Circuit Board), and the first resistor placement board 10 includes multiple first lines 15. The first resistance measuring instrument is used to measure the resistance value of the resistor. The first resistance measuring instrument includes two measuring probes for contacting the resistor, and the first resistance measuring instrument also includes a display screen for displaying the resistance value.

[0034] A single measuring component or multiple measuring components can be disposed on the first resistor placement plate 10 at intervals. Each measuring component may include a first placement member 11. The first resistor placement plate 10 has mutually perpendicular length, width, and height directions. The length direction of the first resistor placement plate 10 is referenced to... Figure 1 The direction indicated by arrow A in the middle refers to the width direction of the first resistor placement plate 10. Figure 1 The direction indicated by arrow B in the middle. The shape of the first placement slot 111 is consistent with the shape of the first chip resistor 40 to be tested. For example, if the shape of the first chip resistor 40 to be tested is a cuboid, the shape of the first placement slot 111 is also a cuboid.

[0035] The first placement groove 111 may be made of an insulating material. The first placement groove 111 has mutually perpendicular length, width, and height directions, which are respectively aligned with the length, width, and height directions of the first resistor placement plate 10. The first placement groove 111 includes a first placement cavity for placing and positioning the first surface mount resistor 40 to be tested. The length and width of the first placement cavity match the length and width of the first surface mount resistor 40 to be tested, for example, the length and width of the first placement cavity may be equal to the length and width of the first surface mount resistor 40 to be tested. The height of the first placement cavity is greater than the height of the first surface mount resistor 40 to be tested. The first placement groove 111 includes two first side plates arranged opposite each other along the length direction and two second side plates arranged opposite each other along the width direction. The first placement cavity may be formed by the two first side plates and the two second side plates, that is, the first placement cavity may be a cavity structure extending through the height direction of the first placement groove 111.

[0036] The first measuring probe 112 is made of a conductive material, such as copper or silver. The first patch resistor 40 to be tested includes a resistor body, with two first external electrodes 41 respectively at both ends of the resistor body. The two first measuring probes 112 are located in the first placement slot 111, and the two first measuring probes 112 are spaced apart along the length of the first placement slot 111. The second ends of the two first measuring probes 112 are fixed on the first resistor placement plate 10, and the second ends of the two first measuring probes 112 are electrically connected to two of the first lines 15 included in the first resistor placement plate 10, which are used to connect to the two measuring pens of the first resistance measuring instrument. Figure 1 As shown, when the first patch resistor 40 to be tested is placed in the first placement slot 111, the first ends of the two first measuring probes 112 are electrically connected to the two first external electrodes 41 of the first patch resistor 40 to be tested, respectively. It should be noted that when the first patch resistor 40 to be tested is placed in the first placement slot 111, the length and width directions of the first patch resistor 40 are consistent with the length and width directions of the first placement slot 111, and the thickness direction of the first patch resistor 40 is consistent with the height direction of the first placement slot 111.

[0037] The resistance measuring device provided in this embodiment of the invention fixes the first patch resistor 40 to be tested through the first placement slot 111, ensuring that the contact position between the first measuring probe 112 and the first patch resistor 40 to be tested is fixed. This prevents testing errors caused by the displacement of the first patch resistor 40 to be tested during the testing process, ensures the accuracy of the resistance measurement of the first patch resistor 40 to be tested, and provides more accurate measurement results. It also avoids measurement errors caused by the inconsistent contact position when the test probe is manually placed in contact with the two electrodes of the first patch resistor 40 to be tested.

[0038] Reference Figure 4 The first measuring probe 112 includes a first probe body 1121 and a first telescopic needle part 1122. The first telescopic needle part 1122 is telescopically mounted on the first probe body 1121 by a first spring. The first placement groove 111 has a height direction, and the telescopic direction of the first telescopic needle part 1122 is consistent with the height direction of the first placement groove 111. The first end of the first measuring probe 112 is the end of the first telescopic needle part 1122 that is away from the first probe body 1121, and the second end of the first measuring probe 112 is the end of the first probe body 1121 that is away from the first telescopic needle part 1122.

[0039] Specifically, the end of the first probe body 1121 facing away from the first telescopic needle portion 1122 is electrically connected to the first circuit 15 included in the first resistor placement plate 10. It should be noted that the first placement groove 111 may also include a base plate parallel to the first resistor placement plate 10. This base plate may be attached to the first resistor placement plate 10. In this case, the end of the first probe body 1121 facing away from the first telescopic needle portion 1122 passes through the base plate of the first placement groove 111 before being electrically connected to the first circuit 15. The first probe body 1121 has a receiving cavity, and a first spring is located within the receiving cavity. One end of the first spring is connected to the first probe body 1121, and the other end is connected to the first telescopic needle portion 1122. The extension direction of the first spring is consistent with the height direction of the first placement groove 111. The telescopic movement of the first telescopic needle portion 1122 is achieved by the compression and release of the first spring. The end of the first telescopic needle portion 1122 facing away from the first probe body 1121 is used for electrical connection with the two first external electrodes 41 of the first patch resistor 40 to be tested.

[0040] In this embodiment of the invention, by configuring the first measuring probe 112, which includes a first probe body 1121 and a first telescopic needle portion 1122, it is possible to ensure close contact between the first measuring probe 112 and the first patch resistor 40 to be tested, and to avoid damage to the first patch resistor 40 by the first measuring probe 112. In addition, by configuring the first measuring probe 112, which includes a first probe body 1121 and a first telescopic needle portion 1122, it is also compatible with first patch resistors 40 to be tested that have the same length and width but different thicknesses, thereby improving the range of first patch resistors 40 to be tested that the resistance measuring device can adapt to measure.

[0041] The measurement assembly also includes a second placement member 12, which includes a second placement groove 121 and two second measurement probes 122. The second placement groove 121 is used for placing and limiting the second chip resistor to be tested. The second chip resistor to be tested has a different size than the first chip resistor to be tested 40. The two second measurement probes 122 are located in the second placement groove 121. The first ends of the two second measurement probes 122 are respectively used to electrically connect to the two second external electrodes of the second chip resistor to be tested, and the second ends of the two second measurement probes 122 are respectively used to electrically connect to the two measuring pens of the first resistance measuring instrument.

[0042] Specifically, the structure of the second placement component 12 is the same as that of the first placement component 11, but the dimensions are different. That is, the dimensions of each structure included in the second placement component 12 are different from the dimensions of each structure included in the first placement component 11. For example, the shape of the second placement groove 121 is the same as that of the first placement groove 111, but the length, width, and height of the second placement groove 121 are different from those of the first placement groove 111. Figure 1 , Figure 1 The length and width of the second placement slot 121 are both smaller than the length and width of the first placement slot 111; the second measuring probe 122 has the same structure as the first measuring probe 112, but the dimensions are different. The first placement member 11 and the second placement member 12 can be distributed at intervals along the width direction of the first resistor placement plate 10.

[0043] The second surface mount resistor to be tested has the same structure as the first surface mount resistor to be tested 40, but different dimensions. Specifically, the length and width of the second surface mount resistor to be tested are not equal to those of the first surface mount resistor to be tested 40. The thickness of the second surface mount resistor to be tested can be equal to or unequal to the thickness of the first surface mount resistor to be tested 40. The second ends of the two first measuring probes 112 are respectively electrically connected to two other first lines 15 included in the first resistor placement plate 10. These two first lines 15 are used to connect to the two measuring pens of the first resistance measuring instrument. In this embodiment of the invention, by setting the second placement member 12, the resistance value of the second surface mount resistor to be tested, which has a different size from the first surface mount resistor to be tested 40, can be measured. This increases the range of surface mount resistors that the resistance measuring device can adapt to measure, eliminates the need to design a measuring device specifically for the second surface mount resistor to be tested, and reduces the measurement cost.

[0044] In other embodiments, the measuring assembly further includes a third placement member 13, which has the same structure as the first placement member 11 but different dimensions, and the dimensions of the third placement member 13 are different from those of the second placement member 12. The first placement member 11, the second placement member 12, and the third placement member 13 may be distributed at intervals along the width direction of the first resistor placement plate 10. The third placement member 13 includes a third placement slot and two third measuring probes. The third placement slot is used for placing and positioning the third chip resistor to be tested. The dimensions of the third chip resistor to be tested are different from those of the second chip resistor to be tested and the first chip resistor to be tested. The measuring assembly may also include other placement members of different dimensions to accommodate the measurement of resistance values ​​of chip resistors of different sizes.

[0045] With the height direction of the first placement groove 111 as the first direction, the first placement groove 111 is connected to the first resistor placement plate 10 on one side along the first direction, and a pressing cover is hinged to the other side of the first placement groove 111 along the first direction. A snap-fit ​​component is provided on the pressing cover, which is used to snap-fit ​​with the first placement groove 111 when the pressing cover is closed on the first placement groove 111.

[0046] Specifically, one side of the first placement slot 111 along the first direction can be attached to the first resistor placement plate 10. The first placement slot 111 includes two first side plates arranged opposite each other along the length direction and two second side plates arranged opposite each other along the width direction. The pressing cover can be hinged to one of the second side plates, and the other second side plate can be provided with a snap-fit ​​groove. The snap-fit ​​element can be a buckle, and the snap-fit ​​groove is a groove that mates with the buckle. The snap-fit ​​element is used to snap into the snap-fit ​​groove on the other second side plate when the pressing cover is closed on the first placement slot 111.

[0047] After the first surface mount resistor 40 to be tested is placed in the first placement slot 111, the pressing cover can be closed on the first placement slot 111. At this time, the snap-fit ​​component engages with the snap-fit ​​slot on the second side plate, and the first spring is in a compressed state. After the resistance value of the first surface mount resistor 40 to be tested is measured, the pressing cover is opened. Due to the elastic force of the first spring, the first surface mount resistor 40 to be tested will be pushed out partly. The first surface mount resistor 40 to be tested can be removed with tweezers. In this embodiment of the invention, by setting the pressing cover, it is possible to prevent the first surface mount resistor 40 to be tested from falling out of the first placement slot 111 during the resistance value measurement process, and it is also possible to ensure close contact between the first surface mount resistor 40 to be tested and the first measuring probe 112.

[0048] The measurement assembly also includes a connection terminal assembly 14, which includes a first connection terminal 141 and a second connection terminal 142. The first connection terminal 141 and the second connection terminal 142 are respectively used to connect to two measuring pens of the first resistance measuring instrument. The second ends of the two first measuring probes 112 are electrically connected to the first connection terminal 141 and the second connection terminal 142, respectively. The second ends of the two second measuring probes 122 are electrically connected to the first connection terminal 141 and the second connection terminal 142, respectively.

[0049] Specifically, both the first connection terminal 141 and the second connection terminal 142 can be gold fingers. The first resistor placement plate 10 includes a front side where the measuring component is disposed and a back side disposed opposite to the front side. When both the first connection terminal 141 and the second connection terminal 142 are gold fingers, the gold fingers can be distributed on both the front and back sides of the first resistor placement plate 10. The two measuring probes of the first resistance measuring instrument can directly contact the first connection terminal 141 and the second connection terminal 142 respectively, so as to realize the electrical connection between the first connection terminal 141 and the second connection terminal 142 and the two measuring probes of the first resistance measuring instrument respectively.

[0050] The second ends of the two first measuring probes 112 are electrically connected to the first connection terminal 141 and the second connection terminal 142 respectively via two first lines 15. The second ends of the two second measuring probes 122 are electrically connected to the first connection terminal 141 and the second connection terminal 142 respectively via two other first lines 15. The second ends of the two third measuring probes are electrically connected to the first connection terminal 141 and the second connection terminal 142 respectively via two other first lines 15. The first measuring probes 112, second measuring probes 122, and third measuring probes share a single connection terminal assembly 14. Therefore, only one type of surface mount resistor can be measured at a time, as shown in the reference... Figure 1 At this time, the first patch resistor 40 to be tested is placed in the first placement slot 111, and the first patch resistor 40 to be tested is being measured. In this embodiment of the invention, the setting of the first connection terminal 141 and the second connection terminal 142 facilitates the electrical connection between the second end of the first measuring probe 112 or the second end of the second measuring probe 122 and the two measuring probes of the first resistance measuring instrument.

[0051] The first resistor placement plate 10 is provided with multiple measuring components. The first resistor placement plate 10 has a length direction, and the multiple measuring components are distributed at intervals along the length direction of the first resistor placement plate 10.

[0052] Specifically, the number of measuring components set on the first resistor placement plate 10 can be set according to actual needs, such as two to ten. (Refer to...) Figure 1 , Figure 1The first resistor placement plate 10 is provided with three measuring components. The first resistor placement plate 10 is provided with multiple measuring components, each including a first placement slot 111 and a second placement slot 121. That is, the first resistor placement plate 10 is provided with multiple first placement slots 111 and multiple second placement slots 121, meaning that multiple first surface mount resistors 40 or multiple second surface mount resistors 40 can be measured simultaneously. (Refer to...) Figure 1 During measurement, the first chip resistor 40 to be tested can be placed on two of the first placement slots 111, meaning that two first chip resistors 40 to be tested can be measured at the same time. In this embodiment of the invention, by setting up multiple measurement components, multiple chip resistors to be tested can be measured simultaneously, thereby improving testing efficiency.

[0053] The resistance measuring device provided in this embodiment of the invention further includes a test connection plate 20. The test connection plate 20 is provided with a first connector 21 for inserting a first resistor placement plate 10. The test connection plate 20 is also provided with a first socket assembly, which includes a plurality of first socket components 22. The plurality of first socket components 22 are respectively used to electrically connect to a plurality of connection end components 14 on the first resistor placement plate 10 through the first connector 21. The first socket component 22 includes a first socket 221 and a second socket 222. The first socket 221 is electrically connected to a first connection end 141 through the first connector 21, and the second socket 222 is electrically connected to a second connection end 142 through the first connector 21. A plurality of first resistance measuring instruments are provided, and the plurality of first resistance measuring instruments correspond to the plurality of first socket components 22 respectively. The two measuring probes of the first resistance measuring instruments are respectively inserted into the first socket 221 and the second socket 222.

[0054] Specifically, when the first resistor placement plate 10 is inserted into the test connection plate 20, the first resistor placement plate 10 is perpendicular to the test connection plate 20. A measurement component includes a connection terminal assembly 14. Multiple measurement components are disposed on the first resistor placement plate 10, meaning multiple connection terminal assemblies 14 are disposed on the first resistor placement plate 10. The multiple connection terminal assemblies 14 are located at the bottom end of the first resistor placement plate 10. When the first resistor placement plate 10 is inserted into the test connection plate 20, specifically, the bottom end of the first resistor placement plate 10 is inserted into the first connector 21. When the first resistor placement plate 10 is inserted into the test connection plate 20, the multiple connection terminal assemblies 14 on the first resistor placement plate 10 are electrically connected to the first connector 21.

[0055] The first socket assembly corresponds to the first connector 21, and the number of first socket components 22 is the same as the number of connection end components 14 on the first resistor placement plate 10. The first socket 221 of the first socket component 22 is electrically connected to the first connection end 141 of the connection end component 14 through the first connector 21, and the second socket 222 of the first socket component 22 is electrically connected to the second connection end 142 of the connection end component 14 through the first connector 21. The number of first resistance measuring instruments is the same as the number of first socket components 22, and the two measuring probes of the first resistance measuring instruments are respectively inserted into the first socket 221 and the second socket 222 of the first socket component 22. In this embodiment of the invention, the two measuring probes of the first resistance measuring instruments are respectively inserted into the first socket 221 and the second socket 222. That is, during measurement, it is only necessary to insert the first resistor placement plate 10, on which the surface mount resistor to be tested is placed, into the test connection plate 20 to realize the resistance measurement, without having to manually contact the two measuring probes of the first resistance measuring instrument with the connection end component 14, thereby improving the testing efficiency.

[0056] The first connector 21 is used to electrically connect to a plurality of connection end assemblies 14 on the first resistor placement plate 10. The first connector 21 includes a plurality of plug-in end assemblies corresponding to the plurality of connection end assemblies 14 respectively. The plug-in end assembly includes a first plug-in end 211 for electrically connecting to the first connection end 141 and a second plug-in end 212 for electrically connecting to the second connection end 142. The first plug-in end 211 is electrically connected to the first socket 221, and the second plug-in end 212 is electrically connected to the second socket 222.

[0057] Specifically, the number of plug-in terminal assemblies is equal to the number of connection terminal assemblies 14. Both the first connection terminal 141 and the second connection terminal 142 are gold fingers, and when the gold fingers are distributed on both the front and back sides of the first resistor placement plate 10, the first connection terminal 141 corresponds to two first plug-in terminals 211, and the second connection terminal 142 corresponds to two second plug-in terminals 212. Both the first plug-in terminals 211 and the second plug-in terminals 212 can be metal pins with a spring-loaded structure, thereby ensuring the stability of the electrical connection between the connection terminal assembly 14 and the plug-in terminal assembly. In this embodiment of the invention, the plug-in terminal assembly enables the first socket component 22 to be electrically connected to the connection terminal assembly 14 via the first connector 21.

[0058] The resistance measuring device provided in this embodiment of the invention also includes a second resistance placement plate with the same structure as the first resistance placement plate 10. A second connector 23 for inserting the second resistance placement plate is provided on the test connection plate 20. The structure of the second connector 23 is the same as that of the first connector 21. A second socket assembly with the same structure as the first socket assembly is also provided on the test connection plate 20.

[0059] Specifically, the size of the second resistor placement plate can be the same as or different from the size of the first resistor placement plate 10. The second resistor placement plate also has multiple placement slots for placing the surface-mount resistors to be tested. The size of these slots can be different from the size of the first placement slot 111 or the second placement slot 121 on the first resistor placement plate 10. The second socket assembly corresponds to the second connector 23 and includes multiple second socket components 24. The resistance measuring device provided in this embodiment also includes multiple second resistance measuring instruments, each corresponding to a different second socket component 24. The two probes of the second resistance measuring instruments are used to connect to the second socket components 24. In this embodiment, the arrangement of the second resistor placement plate and the second connector 23 allows the test connection plate 20 to be adapted to both the first resistor placement plate 10 and the second resistor placement plate, thereby increasing the range of surface-mount resistors that the resistance measuring device can measure.

[0060] In other embodiments, the measuring component may also include other connectors with the same structure as the first connector 21 to accommodate different resistor placement boards.

[0061] Reference Figure 3 The resistance measuring device provided in this embodiment of the invention also includes a support base 30, and a test connection plate 20 is mounted on the support base 30.

[0062] Specifically, the support base 30 supports the test connection plate 20. The support base 30 has multiple positioning posts 31, and the test connection plate 20 has multiple positioning holes 25 that mate with the positioning posts 31. The positioning posts 31 are inserted into the positioning holes 25. The positioning holes 25 and positioning posts 31 ensure the positional accuracy of the test connection plate 20 when mounted on the support base 30. In this embodiment of the invention, the support base 30 supports the test connection plate 20, ensuring the stability of the entire resistance measurement device.

[0063] The measurement process of measuring the resistance value of the chip resistor to be tested using the resistance measuring device provided in this embodiment of the invention is as follows:

[0064] Taking the measurement of the resistance value of the first chip resistor 40 to be tested as an example, first, according to the size of the first chip resistor 40 to be tested, select to place the first chip resistor 40 to be tested in the first placement slot 111 of the first resistor placement plate 10, then close and press the cover, insert the first resistor placement plate 10 into the first connector 21, and by reading the resistance value displayed by the first resistance measuring instrument, the resistance value of the first chip resistor 40 to be tested can be measured.

[0065] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0066] It should be noted that when a component is described as "fixed to" another component, it can be directly on the other component or may have a component in between. When a component is considered "connected to" another component, it can be directly connected to the other component or may have a component in between. When a component is considered "set on" another component, it can be directly set on the other component or may have a component in between. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0067] The various embodiments in this specification are described in a related manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions of the method embodiments.

[0068] The above description is merely a preferred embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention are included within the scope of protection of the present invention.

[0069] The resistance measuring device provided by the present invention has been described in detail above. Specific examples have been used to illustrate the principle and implementation of the present invention. The description of the above embodiments is only for the purpose of helping to understand the structure and core idea of ​​the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation and application scope based on the idea of ​​the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A resistance value measuring device, characterized by comprising: The utility model relates to a first resistance placement plate and a first resistance measuring instrument, the first resistance placement plate is provided with a measuring assembly, the measuring assembly includes first placement component, the first placement component includes first placement groove and two first measuring probes, the first placement groove is used for the placement and position limiting of first resistance to be measured patch, Two first measuring probes are located in the first placement groove, the first end of two first measuring probes is used for electrical connection with two first external electrodes of the first resistance to be measured patch respectively, the second end of two first measuring probes is used for electrical connection with two measuring pens of the first resistance measuring instrument respectively, The measuring assembly further includes connecting end assembly, the connecting end assembly includes first connecting end and second connecting end, the second end of two first measuring probes is electrically connected with the first connecting end and the second connecting end respectively, It further includes test connecting plate, the test connecting plate is provided with first connector for inserting the first resistance placement plate, the test connecting plate is further provided with first jack assembly, the first jack assembly includes first jack component, the first jack component includes first jack and second jack, the first jack is electrically connected with the first connecting end through the first connector, the second jack is electrically connected with the second connecting end through the first connector, the first resistance measuring instrument corresponds with the first jack component, two measuring pens of the first resistance measuring instrument are inserted in the first jack and the second jack respectively.

2. The resistance value measuring device according to claim 1, characterized in that, The first measuring probe includes first probe body and first telescopic needle part, the first telescopic needle part is telescopically arranged on the first probe body through first spring, the first placement groove has height direction, the telescopic direction of the first telescopic needle part is consistent with the height direction of the first placement groove, The first end of the first measuring probe is the end of the first telescopic needle part away from the first probe body, the second end of the first measuring probe is the end of the first probe body away from the first telescopic needle part.

3. The resistance value measuring device according to claim 1, characterized in that, The measuring assembly further includes second placement component, the second placement component includes second placement groove and two second measuring probes, the second placement groove is used for the placement and position limiting of second resistance to be measured patch, the size of the second resistance to be measured patch is different from that of the first resistance to be measured patch, Two second measuring probes are located in the second placement groove, the first end of two second measuring probes is used for electrical connection with two second external electrodes of the second resistance to be measured patch respectively, the second end of two second measuring probes is used for electrical connection with two measuring pens of the first resistance measuring instrument respectively.

4. The resistance value measuring device according to claim 2, characterized in that, The height direction of the first placement groove is first direction, one side of the first placement groove along the first direction is connected with the first resistance placement plate, the other side of the first placement groove along the first direction is hinged with compression cover, the compression cover is provided with clamping piece, the clamping piece is used for clamping with the first placement groove when the compression cover is closed on the first placement groove.

5. The resistance value measuring device according to claim 3, wherein Second ends of the two second measurement probes are respectively electrically connected with the first connection end and the second connection end.

6. The resistance value measuring device according to claim 5, characterized in that The first resistance placement board is provided with a plurality of measurement components, and the first resistance placement board has a length direction, and the plurality of measurement components are distributed along the length direction of the first resistance placement board.

7. The resistance value measuring device according to claim 6, characterized in that The first jack assembly includes a plurality of first jack members, and the plurality of first jack members are respectively used for being electrically connected with the plurality of connection end components on the first resistance placement board through the first connector. A plurality of first resistance measurement instruments are provided, and the plurality of first resistance measurement instruments correspond to the plurality of first jack members respectively.

8. The resistance value measuring device according to claim 7, characterized in that The first connector is used for being electrically connected with the plurality of connection end components on the first resistance placement board, and the first connector includes a plurality of plug-in end components corresponding to the plurality of connection end components respectively, the plug-in end component includes a first plug-in end used for being electrically connected with the first connection end and a second plug-in end used for being electrically connected with the second connection end, the first plug-in end is electrically connected with the first jack, and the second plug-in end is electrically connected with the second jack.

9. The resistance value measuring device according to claim 7, wherein A second resistance placement board with the same structure as the first resistance placement board is further included, the test connection board is provided with a second connector used for inserting the second resistance placement board, the structure of the second connector is the same as that of the first connector, and the test connection board is further provided with a second jack assembly with the same structure as the first jack assembly.

10. The resistance value measuring device according to claim 7, wherein A support base is further included, and the test connection board is installed on the support base.

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