Reactive power optimization method, system, storage medium and computing device

Abstract

The present invention discloses a reactive power optimization method, system, storage medium and computing device. The present invention determines the maximum dynamic reactive power limit of each weak bus effective dynamic reactive power compensation device according to the reactive power of the effective dynamic reactive power compensation device under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive power compensation device to each weak bus, converts the nonlinear dynamic reactive power constraint in the transient voltage safety under the expected fault into an algebraic constraint, and adds it to the reactive power optimization model, thereby solving the problem of difficulty in solving the reactive power optimization model after considering the dynamic reactive power constraint. By adding the reactive power optimization model with the new constraint, the reactive power optimization calculation of the current operation mode of the power grid can be realized, providing a reliable method for the power grid with voltage safety risks to take effective control measures in a timely manner, thereby improving the safe, stable and economical operation level of the large power grid.

Description

Technical Field

[0001] The present invention relates to a reactive power optimization method, system, storage medium and computing equipment, and belongs to the technical field of power system automation. Background Art

[0002] Reactive power optimization refers to a reactive power regulation method that minimizes active network losses in the power system by optimizing variables such as transformer ratios, capacitor and reactor switching, and the reactive output of dynamic reactive compensation equipment, while satisfying the constraints of the power flow equation and the inequality constraints of state and control variables, given a fixed power system grid structure, electrical equipment parameters, and load. This method is a key means of improving grid power quality and ensuring the safe, stable, and economical operation of power systems. Existing reactive power optimization methods face significant difficulties in solving reactive power optimization models that consider dynamic reactive power constraints, as the scale of anticipated fault sets increases and the nonlinearity of dynamic reactive power constraints in transient voltage safety. Summary of the Invention

[0003] The present invention provides a reactive power optimization method, system, storage medium and computing device, which solve the problem in existing reactive power optimization methods that a reactive power optimization model is difficult to solve after considering dynamic reactive power constraints.

[0004] In order to solve the above technical problems, the technical solution adopted by the present invention is:

[0005] A reactive power optimization method, comprising:

[0006] Simulate the expected fault set of the current operation mode of the power grid to obtain the transient voltage recovery margin of the busbar after each expected fault;

[0007] According to the transient voltage recovery margin of the busbar after each expected fault, the weak busbar set of the expected fault set and the constrained fault of each weak busbar are obtained; wherein the constrained fault of each weak busbar is the expected fault with the lowest transient voltage recovery margin of each weak busbar;

[0008] Determine the effective dynamic reactive power compensation equipment for each weak bus based on the reactive power voltage sensitivity of the dynamic reactive power compensation equipment to each weak bus in the weak bus cluster;

[0009] The reactive compensation capacitors in the vicinity of each weak busbar are controlled to gradually withdraw according to a preset step size to obtain the critical operating mode of each weak busbar under a constrained fault.

[0010] According to the reactive power of the effective dynamic reactive compensation equipment under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive compensation equipment to each weak bus, the maximum dynamic reactive limit of the effective dynamic reactive compensation equipment of each weak bus is determined;

[0011] New constraints are constructed according to the maximum dynamic reactive power limit of each weak busbar effective dynamic reactive power compensation device, and reactive power optimization is performed using the reactive power optimization model with the new constraints.

[0012] Simulate the expected fault set of the current grid operation mode to obtain the transient voltage recovery margin of the busbar after each expected fault, including:

[0013] Simulate the expected fault set of the current operation mode of the power grid to obtain the voltage response curve of the busbar after each expected fault;

[0014] According to the voltage response curve of the busbar after each anticipated fault, the transient voltage recovery margin of the busbar after each anticipated fault is calculated.

[0015] Calculate the transient voltage recovery margin of the busbar under each anticipated fault using the following formula:

[0016]

[0017] Among them, TVRM p,q is the transient voltage recovery margin of busbar q after the anticipated fault p, t0 is the time when the anticipated fault p is cleared, t h The bus voltage recovers to the threshold value V after a large disturbance mit In the above time, V0 is the initial voltage of bus q before the expected fault p, V(t) is the voltage of bus q at time t after the expected fault p, and t1 is the time when the voltage of bus q recovers to V mit At the moment, V(t h ) is the expected fault p after t h The bus voltage at the moment q.

[0018] According to the transient voltage recovery margin of the busbar after each expected fault, the weak busbar set of the expected fault set and the constrained faults of each weak busbar are obtained, including:

[0019] The busbars with the lowest transient voltage recovery margin after each anticipated fault are taken as the critical busbars for each anticipated fault, and the critical busbars with a transient voltage recovery margin less than a threshold value are taken as weak buses to obtain the weak busbar set of the anticipated fault set. For the anticipated faults corresponding to each weak busbar, the anticipated fault with the lowest transient voltage recovery margin of the weak busbar is taken as the constrained fault of the weak busbar.

[0020] The reactive compensation capacitors in the vicinity of each weak busbar are controlled to gradually withdraw according to the preset step size to obtain the critical operating mode of each weak busbar under the constrained fault, including:

[0021] Taking the capacity of a group of reactive compensation capacitors as the preset step size, after each group of reactive compensation capacitors is withdrawn, the constrained fault corresponding to each weak bus is simulated, and the transient voltage recovery margin of each weak bus after the constrained fault is calculated until the transient voltage recovery margin is less than the threshold value, thereby obtaining the critical operating mode of each weak bus under the constrained fault.

[0022] According to the reactive power of the effective dynamic reactive compensation equipment under critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive compensation equipment to each weak bus, the maximum dynamic reactive limit of the effective dynamic reactive compensation equipment of each weak bus is determined. The formula is:

[0023]

[0024] Among them, Q k,max is the maximum dynamic reactive power limit of the effective dynamic reactive power compensation device of the kth weak bus, N k is the number of effective dynamic reactive power compensation devices for the kth weak busbar, λ l,k is the reactive voltage sensitivity of the lth effective dynamic reactive compensation device to the kth weak busbar, Q l,eff It is the reactive power of the lth effective dynamic reactive compensation device under critical operation mode.

[0025] The new constraints are:

[0026]

[0027] Among them, Q k,max is the maximum dynamic reactive power limit of the effective dynamic reactive power compensation device of the kth weak bus, N k is the number of effective dynamic reactive power compensation devices for the kth weak busbar, λ l,k is the reactive voltage sensitivity of the lth effective dynamic reactive compensation device to the kth weak busbar, Q l,fact is the reactive power of the lth effective dynamic reactive compensation device, and M is the number of weak buses in the expected fault set.

[0028] A reactive power optimization system, comprising:

[0029] The simulation module simulates the expected fault set of the current operation mode of the power grid to obtain the transient voltage recovery margin of the busbar after each expected fault;

[0030] The weak bus module obtains the weak bus set of the expected fault set and the constrained faults of each weak bus based on the transient voltage recovery margin of the bus after each expected fault. The constrained fault of each weak bus is the expected fault with the lowest transient voltage recovery margin of each weak bus.

[0031] An effective dynamic reactive power compensation device module determines the effective dynamic reactive power compensation device for each weak bus according to the reactive voltage sensitivity of the dynamic reactive power compensation device to each weak bus in the weak bus set;

[0032] The critical operation mode module controls the gradual withdrawal of reactive compensation capacitors in the vicinity of each weak bus according to a preset step size, and obtains the critical operation mode of each weak bus under a constrained fault;

[0033] The maximum dynamic reactive power limit module determines the maximum dynamic reactive power limit of each weak bus effective dynamic reactive power compensation device according to the reactive power of the effective dynamic reactive power compensation device under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive power compensation device to each weak bus;

[0034] The optimization module constructs new constraints based on the maximum dynamic reactive power limit of each weak busbar effective dynamic reactive power compensation device, and uses the reactive power optimization model with the new constraints to perform reactive power optimization.

[0035] A computer-readable storage medium stores one or more programs, wherein the one or more programs include instructions that, when executed by a computing device, cause the computing device to perform a reactive power optimization method.

[0036] A computing device comprising one or more processors, one or more memories, and one or more programs, wherein the one or more programs are stored in the one or more memories and configured to be executed by the one or more processors, and the one or more programs include instructions for executing a reactive power optimization method.

[0037] The beneficial effects achieved by the present invention are as follows: the present invention determines the maximum dynamic reactive limit of the effective dynamic reactive compensation equipment of each weak bus according to the reactive power of the effective dynamic reactive compensation equipment under the critical operating mode and the reactive voltage sensitivity of the effective dynamic reactive compensation equipment to each weak bus, converts the nonlinear dynamic reactive constraints in the transient voltage safety under the anticipated fault into algebraic constraints, and adds them to the reactive optimization model, thereby solving the problem of difficulty in solving the reactive optimization model after considering the dynamic reactive constraints. By adding the reactive optimization model with the new constraints, the reactive optimization calculation of the current operating mode of the power grid can be realized, providing a reliable method for the power grid with voltage safety risks to take effective control measures in a timely manner, thereby improving the safe, stable and economical operation level of the large power grid. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 Flowchart of the reactive power optimization method. DETAILED DESCRIPTION

[0039] The present invention will be further described below in conjunction with the accompanying drawings. The following embodiments are only used to more clearly illustrate the technical solutions of the present invention and are not intended to limit the scope of protection of the present invention.

[0040] like Figure 1 As shown, a reactive power optimization method includes the following steps:

[0041] Step 1: simulate the expected fault set of the current operation mode of the power grid to obtain the transient voltage recovery margin of the busbar after each expected fault;

[0042] Step 2: Based on the transient voltage recovery margin of each busbar after each anticipated fault, a weak busbar set and a constrained fault of each weak busbar in the anticipated fault set are obtained; wherein the constrained fault of each weak busbar is the anticipated fault with the lowest transient voltage recovery margin of each weak busbar;

[0043] Step 3: Determine the effective dynamic reactive power compensation device for each weak bus based on the reactive power voltage sensitivity of the dynamic reactive power compensation device to each weak bus in the weak bus set;

[0044] Step 4: Control the reactive compensation capacitors in the vicinity of each weak busbar to gradually withdraw according to a preset step size, and obtain the critical operating mode of each weak busbar under the constrained fault;

[0045] Step 5: Determine the maximum dynamic reactive power limit of each weak bus effective dynamic reactive power compensation device according to the reactive power of the effective dynamic reactive power compensation device under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive power compensation device to each weak bus;

[0046] Step 6: construct a new constraint based on the maximum dynamic reactive power limit of each weak busbar effective dynamic reactive power compensation device, and perform reactive power optimization using the reactive power optimization model with the new constraint.

[0047] The above method determines the maximum dynamic reactive limit of the effective dynamic reactive compensation equipment of each weak bus based on the reactive power of the effective dynamic reactive compensation equipment under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive compensation equipment to each weak bus. The nonlinear dynamic reactive constraints in the transient voltage safety under the expected fault are converted into algebraic constraints and added to the reactive optimization model, which solves the problem of difficulty in solving the reactive optimization model after considering the dynamic reactive constraints. By adding the reactive optimization model with new constraints, the reactive optimization calculation of the current operation mode of the power grid can be realized, which provides a reliable method for the power grid with voltage safety risks to take effective control measures in a timely manner, and improves the safe, stable and economical operation level of the large power grid.

[0048] In the above method, the expected fault set F of the current operation mode of the power grid is defined p (p=1,2,…,n), for the expected fault set F pBy performing time domain simulation, the voltage response curve of the busbar after each expected fault can be obtained. Based on the voltage response curve of the busbar after each expected fault, the transient voltage recovery margin of the busbar after each expected fault can be calculated, which can be expressed as follows:

[0049]

[0050] Among them, TVRM p,q is the transient voltage recovery margin of busbar q after the anticipated fault p, t0 is the time when the anticipated fault p is cleared, t h The bus voltage recovers to the threshold value V after a large disturbance as specified in the Guidelines for Voltage Stability Assessment of Power Systems (hereinafter referred to as the “Guidelines”). mit The above time, according to the guidelines, t h Take 10s, V mit Take 0.8pu, V0 is the initial voltage of bus q before the expected fault p, V(t) is the voltage of bus q at time t after the expected fault p, and t1 is the time when the voltage of bus q recovers to V mit At the moment, V(t h ) is the expected fault p after t h The bus voltage at the moment q.

[0051] The busbar with the lowest transient voltage recovery margin after each anticipated fault is taken as the key busbar of each anticipated fault. For example, the busbar with the lowest transient voltage recovery margin after anticipated fault p is taken as the key busbar of anticipated fault p. The key busbar with a transient voltage recovery margin less than the threshold value is further taken as the weak busbar to obtain the weak busbar set A of the anticipated fault set. k (k=1,2,…,M).

[0052] For each weak busbar's corresponding predicted fault, the predicted fault with the lowest transient voltage recovery margin is used as the constrained fault for that weak busbar. Specifically, in a weak busbar set, each weak busbar corresponds to at least one predicted fault. If a weak busbar corresponds to one predicted fault, then that predicted fault is the constrained fault for that weak busbar. If a weak busbar corresponds to different predicted faults, then the predicted fault with the lowest transient voltage recovery margin is used as the constrained fault for that weak busbar.

[0053] Further calculate the reactive voltage sensitivity of each dynamic reactive compensation device to each weak bus in the weak bus set, and screen out the dynamic reactive compensation devices with reactive voltage sensitivity greater than the threshold, so as to determine the effective dynamic reactive compensation devices of each weak bus

[0054] Taking the capacity of a group of reactive compensation capacitors as the preset step size, after each group of reactive compensation capacitors is withdrawn, the constrained fault corresponding to each weak bus is simulated, and the transient voltage recovery margin of each weak bus after the constrained fault is calculated (the same as the above process), until the transient voltage recovery margin is less than the threshold value (normally set to 0), and the critical operating mode of each weak bus under the constrained fault is obtained.

[0055] According to the reactive power of the effective dynamic reactive compensation equipment under critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive compensation equipment to each weak bus, the maximum dynamic reactive limit of the effective dynamic reactive compensation equipment of each weak bus is determined, which can be expressed by the formula:

[0056]

[0057] Among them, Q k,max is the maximum dynamic reactive power limit of the effective dynamic reactive power compensation device of the kth weak bus, N k is the number of effective dynamic reactive power compensation devices for the kth weak busbar, λ l,k is the reactive voltage sensitivity of the lth effective dynamic reactive compensation device to the kth weak busbar, Q l,eff It is the reactive power of the lth effective dynamic reactive compensation device under critical operation mode.

[0058] A new constraint is constructed based on the maximum dynamic reactive power limit of each weak busbar effective dynamic reactive power compensation device, and the new constraint is added to the existing reactive power optimization model;

[0059] The new constraint is expressed as follows:

[0060]

[0061] Where M is the number of weak buses in the expected fault set;

[0062] Then the reactive power optimization model with the new constraint can be expressed as:

[0063] Objective function:

[0064]

[0065] Where N is the number of grid nodes, P loss is the active network loss, V i is the voltage at node i, V j is the voltage at node j, G ij is the conductance between node i and node j, δ ij V i and V j The phase angle difference between

[0066] Equality constraints:

[0067]

[0068] in, is the active power of the generator at node i, is the reactive power of the generator at node i, P Li is the active power of the load at node i, Q Li is the reactive power of the load at node i, B ij is the susceptance between nodes i and j, θ ij is the voltage phase angle difference between node i and node j.

[0069] Inequality constraints:

[0070] P Gi,min ≤P Gi ≤P Gi,max ,i=1,2,…,N

[0071] Q Gi,min ≤Q Gi ≤Q Gi,max ,i=1,2,…,N

[0072] Q Ci,min ≤Q Ci ≤Q Ci,max ,i=1,2,…,N

[0073] V i,min ≤V i ≤V i,max ,i=1,2,…,N

[0074] T s,min ≤T s ≤T s,max ,s=1,2,…,T

[0075]

[0076] Among them, P Gi,min 、P Gi,max They are The lower and upper limits of Q Gi,min , Q Gi,max Q Gi The lower and upper limits of Q Ci is the reactive power of the capacitor at node i, Q Ci,min , Q Ci,max Q Ci The lower and upper limits, V i,min 、V i,max V i The lower and upper limits of T s is the transformation ratio of transformer s, T s,min、T s,max T s The lower and upper limits of , T is the number of transformers.

[0077] Finally, the reactive power optimization model with new constraints is used for reactive power optimization, that is, the optimal gear position of the capacitor node and the optimal reactive power output of the dynamic reactive compensation equipment are obtained through optimal power flow calculation.

[0078] The above method adds the maximum dynamic reactive power constraint of the weak busbar into the reactive power optimization model to achieve the optimal configuration of static reactive power and dynamic reactive power, ensuring the safe and stable operation of the power system.

[0079] Based on the same technical solution, the present invention also discloses a software system of the above method, a reactive power optimization system, comprising:

[0080] The simulation module simulates the expected fault set of the current operation mode of the power grid and obtains the transient voltage recovery margin of the bus after each expected fault.

[0081] The weak bus module obtains the weak bus set of the expected fault set and the constrained faults of each weak bus according to the transient voltage recovery margin of the bus after each expected fault. Among them, the constrained fault of each weak bus is the expected fault with the lowest transient voltage recovery margin of each weak bus.

[0082] The effective dynamic reactive power compensation device module determines the effective dynamic reactive power compensation device of each weak bus according to the reactive voltage sensitivity of the dynamic reactive power compensation device to each weak bus in the weak bus set.

[0083] The critical operation mode module controls the reactive compensation capacitors in the vicinity of each weak busbar to gradually withdraw according to a preset step size, and obtains the critical operation mode of each weak busbar under a constrained fault.

[0084] The maximum dynamic reactive power limit module determines the maximum dynamic reactive power limit of each weak bus effective dynamic reactive power compensation device according to the reactive power of the effective dynamic reactive power compensation device under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive power compensation device to each weak bus.

[0085] The optimization module constructs new constraints based on the maximum dynamic reactive power limit of each weak busbar effective dynamic reactive power compensation device, and uses the reactive power optimization model with the new constraints to perform reactive power optimization.

[0086] The data processing flow of the above software system modules is consistent with the corresponding steps of the method and will not be repeated here.

[0087] Based on the same technical solution, the present invention also discloses a computer-readable storage medium storing one or more programs, wherein the one or more programs include instructions, and when the instructions are executed by a computing device, the computing device performs a reactive power optimization method.

[0088] Based on the same technical solution, the present invention also discloses a computing device, including one or more processors, one or more memories, and one or more programs, wherein the one or more programs are stored in the one or more memories and are configured to be executed by the one or more processors, and the one or more programs include instructions for executing a reactive power optimization method.

[0089] It will be understood by those skilled in the art that embodiments of the present invention may be provided as methods, systems, or computer program products. Thus, the present invention may take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware. Furthermore, the present invention may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0090] The present invention is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present invention. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowcharts and / or block diagrams. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0091] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.

[0092] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.

[0093] The above are merely embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention are included in the scope of the claims of the present invention to be approved.

Claims

1. A reactive power optimization method, characterized in that: include: Simulate the expected fault set under the current operation mode of the power grid to obtain the voltage response curve of the busbar after each expected fault. Based on the voltage response curve of the busbar after each expected fault, calculate the transient voltage recovery margin of the busbar after each expected fault. According to the transient voltage recovery margin of the busbar after each expected fault, the weak busbar set of the expected fault set and the constrained fault of each weak busbar are obtained; wherein the constrained fault of each weak busbar is the expected fault with the lowest transient voltage recovery margin of each weak busbar; Determine the effective dynamic reactive power compensation equipment for each weak bus based on the reactive power voltage sensitivity of the dynamic reactive power compensation equipment to each weak bus in the weak bus cluster; The reactive compensation capacitors in the vicinity of each weak busbar are controlled to gradually withdraw according to a preset step size to obtain the critical operating mode of each weak busbar under a constrained fault. According to the reactive power of the effective dynamic reactive compensation equipment under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive compensation equipment to each weak bus, the maximum dynamic reactive limit of the effective dynamic reactive compensation equipment of each weak bus is determined; According to the maximum dynamic reactive power limit of each weak busbar effective dynamic reactive power compensation device, a new constraint is established and the reactive power optimization model with the new constraint is used for reactive power optimization. The above formula for calculating the transient voltage recovery margin of the busbar under each anticipated fault is: Among them, TVRM p,q is the transient voltage recovery margin of busbar q after the anticipated fault p, t0 is the time when the anticipated fault p is cleared, t h The bus voltage recovers to the threshold value V after a large disturbance mit In the above time, V0 is the initial voltage of bus q before the expected fault p, V(t) is the voltage of bus q at time t after the expected fault p, and t1 is the time when the voltage of bus q recovers to the threshold V mit At the moment, V(t h ) is the expected fault p after t h Bus q voltage at time t; The new constraints are: Among them, Q k,max is the maximum dynamic reactive power limit of the effective dynamic reactive power compensation device of the kth weak bus, N k is the number of effective dynamic reactive power compensation devices for the kth weak busbar, λ l,k is the reactive voltage sensitivity of the lth effective dynamic reactive compensation device to the kth weak busbar, Q l,fact is the reactive power of the lth effective dynamic reactive compensation device, and M is the number of weak buses in the expected fault set.

2. A reactive power optimization method according to claim 1, characterized in that: According to the transient voltage recovery margin of the busbar after each expected fault, the weak busbar set of the expected fault set and the constrained faults of each weak busbar are obtained, including: The busbars with the lowest transient voltage recovery margin after each anticipated fault are taken as the critical busbars for each anticipated fault, and the critical busbars with a transient voltage recovery margin less than a threshold value are taken as weak buses to obtain the weak busbar set of the anticipated fault set. For the anticipated faults corresponding to each weak busbar, the anticipated fault with the lowest transient voltage recovery margin of the weak busbar is taken as the constrained fault of the weak busbar.

3. The reactive power optimization method according to claim 1, characterized in that: The reactive compensation capacitors in the vicinity of each weak busbar are controlled to gradually withdraw according to the preset step size to obtain the critical operating mode of each weak busbar under the constrained fault, including: Taking the capacity of a group of reactive compensation capacitors as the preset step size, after each group of reactive compensation capacitors is withdrawn, the constrained fault corresponding to each weak bus is simulated, and the transient voltage recovery margin of each weak bus after the constrained fault is calculated until the transient voltage recovery margin is less than the threshold value, thereby obtaining the critical operating mode of each weak bus under the constrained fault.

4. A reactive power optimization method according to claim 1, characterized in that: According to the reactive power of the effective dynamic reactive compensation equipment under critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive compensation equipment to each weak bus, the maximum dynamic reactive limit of the effective dynamic reactive compensation equipment of each weak bus is determined. The formula is: Among them, Q l,eff It is the reactive power of the lth effective dynamic reactive power compensation device under critical operation mode.

5. A reactive power optimization system, characterized in that: include: The simulation module simulates the expected fault set of the current operation mode of the power grid, obtains the voltage response curve of the busbar after each expected fault, and calculates the transient voltage recovery margin of the busbar after each expected fault based on the voltage response curve of the busbar after each expected fault; The weak bus module obtains the weak bus set of the expected fault set and the constrained faults of each weak bus based on the transient voltage recovery margin of the bus after each expected fault. The constrained fault of each weak bus is the expected fault with the lowest transient voltage recovery margin of each weak bus. An effective dynamic reactive power compensation device module determines the effective dynamic reactive power compensation device for each weak bus according to the reactive voltage sensitivity of the dynamic reactive power compensation device to each weak bus in the weak bus set; The critical operation mode module controls the gradual withdrawal of reactive compensation capacitors in the vicinity of each weak bus according to a preset step size to obtain the critical operation mode of each weak bus under a constrained fault; The maximum dynamic reactive power limit module determines the maximum dynamic reactive power limit of each weak bus effective dynamic reactive power compensation device according to the reactive power of the effective dynamic reactive power compensation device under the critical operation mode and the reactive voltage sensitivity of the effective dynamic reactive power compensation device to each weak bus; The optimization module constructs new constraints based on the maximum dynamic reactive power limit of each weak busbar effective dynamic reactive power compensation device, and uses the reactive power optimization model with the new constraints to perform reactive power optimization; The above formula for calculating the transient voltage recovery margin of the busbar under each anticipated fault is: Among them, TVRM p,q is the transient voltage recovery margin of busbar q after the anticipated fault p, t0 is the time when the anticipated fault p is cleared, t h The bus voltage recovers to the threshold value V after a large disturbance mit In the above time, V0 is the initial voltage of bus q before the expected fault p, V(t) is the voltage of bus q at time t after the expected fault p, and t1 is the time when the voltage of bus q recovers to the threshold V mit At the moment, V(t h ) is the expected fault p after t h Bus q voltage at time t; The new constraints are: Among them, Q k,max is the maximum dynamic reactive power limit of the effective dynamic reactive power compensation device of the kth weak bus, N k is the number of effective dynamic reactive power compensation devices for the kth weak busbar, λ l,k is the reactive voltage sensitivity of the lth effective dynamic reactive compensation device to the kth weak busbar, Q l,fact is the reactive power of the lth effective dynamic reactive compensation device, and M is the number of weak buses in the expected fault set.

6. A computer-readable storage medium storing one or more programs, characterized in that: The one or more programs include instructions that, when executed by a computing device, cause the computing device to perform any one of the methods according to claims 1 to 4 .

7. A computing device, characterized in that include: One or more processors, one or more memories, and one or more programs, wherein the one or more programs are stored in the one or more memories and configured to be executed by the one or more processors, the one or more programs comprising instructions for performing any of the methods according to claims 1 to 4.

Images