A lunar radiation environment simulation device and test method

Abstract

The application relates to a lunar radiation environment simulation device and a test method, and belongs to the technical field of moon exploration projects. The device comprises an ion beam flow emission system, a beam flow control system, a beam flow quality measurement system, a beam flow supervision system, a temperature control system, a sample plate motion control system, a beam flow pipeline and a vacuum irradiation target chamber. A device to be irradiated is placed in a temperature test box of the temperature control system, and the bottom of the temperature test box is fixed on a multi-degree-of-freedom sample platform. They are integrally arranged in the vacuum irradiation target chamber. The ion beam flow emitted by the ion beam flow emission system is transmitted into the beam flow pipeline, and is irradiated onto the device after being adjusted by the parameters of the beam flow control system. In the test process, the beam flow quality is ensured by the beam flow quality measurement system, and the ion fluence is monitored by the beam flow supervision system, so that the ion fluence irradiated onto the device reaches the corresponding specified value. The device and the method provided by the application can simultaneously simulate the radiation environment and the extreme temperature environment of the lunar surface.

Description

Technical Field

[0001] This invention belongs to the field of lunar exploration engineering technology, specifically a lunar radiation environment simulation device and test method. Background Technology

[0002] As a crucial component of my country's space strategy, the Chinese Lunar Exploration Program utilizes spacecraft to conduct comprehensive observations of the Moon, including acquiring three-dimensional lunar data, the elemental composition and distribution characteristics of the Moon, the physicochemical properties and characteristics of lunar soil, and other lunar space environment tasks. The first three phases of the program have been successfully completed, achieving the expected results: lunar orbiting, soft landing and automated rover exploration, and unmanned lunar soil sampling with successful return to Earth. Currently, the fourth phase of the program is fully underway, focusing on cutting-edge aerospace development and major national strategic needs, conducting related technological research, and planning to establish an international lunar research station. To enhance the reliability of related equipment on the lunar surface and extend its service life, it is necessary to establish relevant experimental facilities on Earth to conduct scientific research and functional assessments of electronic systems and other equipment in a simulated lunar radiation environment.

[0003] Because the Moon's magnetic field is almost nonexistent, its gravity is weak, and it lacks its own atmosphere, the radiation environment on the lunar surface is almost identical to that in interstellar space. According to data from Chang'e-4, the lunar surface radiation reaches as high as 60 μSv per hour, twice the radiation intensity of the International Space Station, 5 to 10 times the radiation received during the long-distance flight, and nearly 200 times the radiation level on Earth. The radiation on the lunar surface mainly comes from galactic cosmic rays (GCR) and solar cosmic rays (SCR). Galactic cosmic rays are mainly composed of high-energy protons... ɑ Composed of particles and a small amount of heavy ions, high-energy protons account for approximately 85%, α particles approximately 14%, and heavy ions approximately 1%. Solar cosmic rays are high-energy charged particle streams released by solar activity, with protons as their main component; therefore, they are often referred to as solar proton rays. Thus, the effects of space radiation from galactic and solar cosmic ray irradiation must be considered when conducting lunar exploration and related activities.

[0004] Electronic components and systems on lunar probes will inevitably be exposed to galactic and solar cosmic ray radiation during missions. When electronic components are exposed to high-energy particle radiation on the lunar surface, two types of radiation effects typically occur: one is the single-event effect and total dose effect due to ionization; the other is the displacement damage effect caused by high-energy particles on the semiconductor materials within the components, leading to changes in the device's electrical parameters. Therefore, high-energy particle radiation can cause functional failures in electronic components, potentially leading to mission failure. In conclusion, to improve the reliability of semiconductor devices during lunar missions and extend the lifespan of probes and related equipment, it is essential to utilize ground-based lunar radiation environment simulation devices to evaluate these semiconductor devices.

[0005] Furthermore, due to the lack of an atmosphere to regulate temperature, the temperature difference between day and night on the lunar surface is enormous, reaching as high as 200°C. The average temperature at night is below -150°C, while the average temperature during the day is above 120°C, with the lowest ambient temperature in the lunar polar regions reaching -230°C. Since the carrier migration behavior in semiconductor materials is closely related to the temperature environment, the extreme temperatures on the moon far exceed the operating temperature range of commercial chips (-40°C to 85°C) and military chips (-55°C to 125°C). Therefore, lunar probes need to rely on thermal insulation devices made from isotope heat sources and other materials when performing related tasks on the lunar surface. To ensure that electronic devices can function normally in the lunar environment, it is necessary to develop electronic devices that possess both excellent radiation resistance and outstanding ability to withstand extreme temperatures.

[0006] To study and evaluate these electronic components specifically developed for exploration missions in extreme space environments such as lunar exploration, it is necessary to establish corresponding lunar environment simulation facilities on the ground to conduct related experimental research. These facilities can simulate not only the radiation environment faced by electronic components on the lunar surface but also the extreme temperature environment. Currently, heavy-ion accelerators are mainly used to simulate the heavy-ion irradiation environment on the lunar surface, and proton accelerators are used to simulate the proton irradiation environment. Irradiation experiments on electronic components are conducted using these facilities. Currently, irradiation experiments on electronic components are almost always conducted at room temperature, rarely considering the influence of ambient temperature on the irradiation experiment, which is inconsistent with the actual lunar radiation environment. Summary of the Invention

[0007] To address the shortcomings of existing technologies, the present invention aims to provide a lunar radiation environment simulation device and testing method. The device and method can simulate the actual lunar radiation environment, thereby providing a dedicated irradiation testing environment for the research and development and evaluation of electronic components for space missions such as lunar exploration, and solving the problem of inconsistency between the current ground-based irradiation simulation environment and the actual lunar radiation environment.

[0008] To achieve the above objectives, the present invention adopts the following technical solution:

[0009] A lunar radiation environment simulation device includes an ion beam emission system, a beam control system, a beam quality measurement system, a beam monitoring system, a temperature control system, a sample plate motion control system, a beam pipe, a vacuum irradiation target chamber, and related cables, wherein:

[0010] The temperature control system is used to simulate the extreme temperature environment on the lunar surface, including a temperature test chamber in which electronic components to be irradiated are placed.

[0011] The sample plate motion control system is used to control the spatial position and state of the electronic components to be irradiated. It includes a multi-degree-of-freedom sample platform, and the bottom of the temperature test chamber is fixed on the multi-degree-of-freedom sample platform.

[0012] The vacuum irradiation target chamber is used to provide a vacuum environment that meets the experimental requirements, and the temperature test chamber and the multi-degree-of-freedom sample platform are all located in the vacuum irradiation target chamber;

[0013] The ion beam emission system is connected to the vacuum irradiation target chamber through the beam pipe, and is used to emit an ion beam with the same energy spectrum as the lunar surface to the electronic components. The ion beam enters the beam pipe for transmission, and after the parameters are adjusted by the beam control system, it is irradiated onto the electronic components in the temperature test chamber.

[0014] The beam quality measurement system includes a detector array mounted on the multi-degree-of-freedom sample platform, used to measure and diagnose the quality of the ion beam, ensuring that the quality of the ion beam meets the test requirements.

[0015] The beam monitoring system includes multiple particle detectors distributed around the ion beam to monitor the cumulative ion fluence irradiated onto electronic components and ensure that the cumulative ion fluence reaches the corresponding specified value.

[0016] Furthermore, in the lunar radiation environment simulation device described above, the ion beam emission system includes a particle accelerator and a particle energy adjustment module, and the emitted ion beam is a single ion beam or a mixed ion beam.

[0017] Furthermore, in the lunar radiation environment simulation device described above, when the ion beam emitted by the ion beam emission system is a single ion beam, only one type of ion irradiates the surface of the electronic components within a certain time period. The ion beam accelerated to a set energy by the particle accelerator is then adjusted by the particle energy adjustment module to match the energy spectrum of different ions with their distribution on the lunar surface.

[0018] Furthermore, in the lunar radiation environment simulation device described above, when the ion beam emitted by the ion beam emission system is a mixed ion beam, the ion beam emission system includes multiple particle accelerators, multiple particle energy adjustment modules, and deflecting magnets. Each particle accelerator and each particle energy adjustment module corresponds one-to-one. Before mixing, the ion beams accelerated to a set energy by different particle accelerators have their respective energy spectra adjusted to be consistent with their distribution on the lunar surface by the corresponding particle energy adjustment modules. Then, the ion beams are focused into the beam pipe by the deflecting magnets, thereby forming a mixed ion beam.

[0019] Furthermore, in the lunar radiation environment simulation device described above, the beam control system includes a beam diagnostic target chamber, a beam shutter, a fluorescent screen, a guide, a beam expander magnet, a scanning magnet, an aperture, and corresponding controllers. The relevant ion irradiation parameters controlling the ion beam include the switching on and off of the ion beam, the size of the beam spot, and the beam uniformity.

[0020] Furthermore, in the lunar radiation environment simulation device described above, the beam quality measurement system also includes electronics and corresponding measurement software. The planar arrangement of the detector array is as follows: three first particle detectors at different heights are arranged at equal intervals near one end to correct the ion count detected by the beam monitoring system during device irradiation, ensuring that the cumulative ion fluence irradiated to the device surface reaches the specified value; nine second particle detectors are evenly arranged in a 3*3 array in the middle region to measure the beam spot uniformity, ensuring that ions are evenly distributed throughout the entire beam spot area during device irradiation; and two third particle detectors with different collimating apertures are arranged near the other end to measure the energy of the ion beam, ensuring that the beam energy is at the specified value during device irradiation.

[0021] Furthermore, in the lunar radiation environment simulation device described above, when the ion beam emitted by the ion beam emission system is a single ion beam, the particle detector is installed at the front end of the vacuum irradiation target chamber; when the ion beam emitted by the ion beam emission system is a mixed ion beam, the particle detector is installed at the front end of the deflection magnet.

[0022] Furthermore, the specific method for monitoring the cumulative ion fluence irradiated onto electronic components using the beam monitoring system in the lunar radiation environment simulation device described above is as follows:

[0023] Before irradiating the electronic components, the ion counts detected by the first particle detector and the ion counts detected by the particle detector were recorded respectively, and the ratio between them was calculated.

[0024] When irradiating electronic components, the ion count detected by the particle detector is recorded, and then the count is multiplied by the ratio to obtain the cumulative ion fluence irradiated onto the electronic components.

[0025] Furthermore, in the lunar radiation environment simulation device described above, the front and rear panels of the temperature test chamber are hollow structures used to store the cryogenic medium. The front and rear panels are connected to a refrigerant storage tank located outside the vacuum irradiation target room via flexible hoses. The front panel has multiple windows, through which the ion beam irradiates the surface of electronic components inside the temperature test chamber during the irradiation test. Inside the temperature test chamber, adjacent to the rear panel, are arranged an electric heating wire, multiple Pt100 thermal resistors, and a circuit board fixing plate. The internal temperature of the temperature test chamber is monitored in real time by the Pt thermal resistors. By controlling the cryogenic medium or the electric heating wire to execute corresponding commands, the internal temperature of the temperature test chamber is cooled or heated, thereby ensuring that the internal temperature of the temperature test chamber is maintained at the set temperature.

[0026] Furthermore, in the lunar radiation environment simulation device described above, the cryogenic medium is liquid nitrogen or liquid helium.

[0027] Furthermore, in the lunar radiation environment simulation device described above, the multi-degree-of-freedom sample platform includes a sample plate for carrying electronic components, four servo motors for X, Y, and Z axes and for rotating around the Y axis, a belt, and a lead screw, which can realize the X, Y, and Z axis translational motion and the rotational motion around the Y axis of the electronic components.

[0028] Furthermore, in the lunar radiation environment simulation device described above, the vacuum irradiation target chamber is a cylindrical shell structure closed at both ends, and its internal vacuum level ranges from 10 during irradiation experiments. -3 ~10 -4 Pa.

[0029] Furthermore, in the lunar radiation environment simulation device described above, multiple flanges are evenly distributed along the circumference of the vacuum irradiation target chamber. High-sealing inserts with relevant functions are installed on the flanges for relevant cables and pipes to be led out from inside the vacuum irradiation target chamber.

[0030] The method for conducting device irradiation tests using the lunar radiation environment simulation device described above includes the following steps:

[0031] S1. Close all openings and evacuate the vacuum irradiation target chamber to match the vacuum level inside the vacuum irradiation target chamber and beam pipe with that of the particle accelerator, ensuring smooth connection with the particle accelerator.

[0032] S2. Set up a temperature control system to keep the temperature test chamber at the set ambient temperature.

[0033] S3. Open the beam shutter and measure the beam quality to ensure that the beam quality meets the relevant test requirements during the test;

[0034] S4. Close the beam shutter and move the multi-degree-of-freedom sample platform so that the irradiated electronic components are within the area of ​​the ion beam spot.

[0035] S5. Open the beam shutter, conduct device irradiation tests, and record the corresponding ion irradiation parameters and radiation effect number parameters in real time;

[0036] S6. Change the parameter settings in steps S2 and S3, and repeat steps S2-S5 to complete the device irradiation test under different ambient temperatures and different ion parameters.

[0037] The lunar radiation environment simulation device and testing method described in this invention have the following significant technical effects:

[0038] (1) This invention utilizes a combination of multiple ion mixed beams and a temperature control system to form a new irradiation simulation device. This device can simultaneously simulate the radiation environment and extreme temperature environment on the lunar surface and can be used for the study and evaluation of the radiation effects of special electronic components and systems for deep space exploration missions such as lunar exploration.

[0039] (2) By adjusting the temperature control system designed in this invention, the cryogenic medium liquid nitrogen can be replaced with liquid helium. This device can also be used to simulate deep space radiation environments such as the surface of Mars. Attached Figure Description

[0040] Figure 1 This is a schematic diagram of the structure of a lunar radiation environment simulation device provided in an embodiment of the present invention;

[0041] Figure 2 This is a schematic diagram of the detector array layout in a beam quality measurement system;

[0042] Figure 3 for Figure 1 Schematic diagram of the medium temperature test chamber;

[0043] Figure 4 This is a schematic diagram of the cross-sectional structure of the temperature test chamber;

[0044] Figure 5 The single-particle flip cross sections of a certain type of SRAM at different temperatures;

[0045] In the diagram: 1-Ion beam emission system, 2-Beam control system, 3-Beam quality measurement system, 4-Beam monitoring system, 5-Temperature control system, 6-Sample plate motion control system, 7-Beam pipe, 8-Vacuum irradiation target chamber, 9-Flange; 31-Detector array, 41-Particle detector, 51-Temperature test chamber, 52-Low temperature medium storage tank, 61-Multi-degree-of-freedom sample platform, 311-First particle detector, 312-Second particle detector, 313-Third particle detector, 511-Front plate, 512-Rear plate, 513-Window, 514-Electric heating wire, 515-Pt100 resistance thermometer, 516-Circuit board mounting plate. Detailed Implementation

[0046] The present invention will now be further described with reference to specific embodiments and the accompanying drawings.

[0047] In response to the problem mentioned in the background art that the irradiation tests of electronic components used in lunar probes are almost all conducted at room temperature, which is inconsistent with the actual lunar radiation environment, this invention proposes a lunar radiation environment simulation device and test method. This device can simultaneously simulate the radiation environment and extreme temperature environment on the lunar surface, and can be used for the study and evaluation of the radiation effects of electronic components and systems used in deep space exploration missions such as lunar exploration.

[0048] Figure 1 This is a schematic diagram of a lunar radiation environment simulation device provided in an embodiment of the present invention. The device mainly includes an ion beam emission system 1, a beam control system 2, a beam quality measurement system 3, a beam monitoring system 4, a temperature control system 5, a sample plate motion control system 6, a beam pipe 7, a vacuum irradiation target chamber 8, and related cables. The electronic components to be irradiated are placed in a temperature test chamber 51 of the temperature control system 5. The bottom of the temperature test chamber 51 is fixed on a multi-degree-of-freedom sample platform 61 of the sample plate motion control system 6. The entire assembly is located in the vacuum irradiation target chamber 8. The ion beam emission system 1 is connected to the vacuum irradiation target chamber 8 through the beam pipe 7. The ion beam emitted by the ion beam emission system 1 enters the beam pipe 7 for transmission. After parameter adjustment by the beam control system 2, it is irradiated onto the electronic components in the temperature test chamber. During the test, the beam quality is measured and diagnosed by the beam quality measurement system 3 to ensure that the beam quality meets the test requirements. The ion fluence is monitored by the beam monitoring system 4 to ensure that the ion fluence irradiated onto the electronic components reaches the corresponding specified value.

[0049] The ion beam emission system 1 includes a particle accelerator and a particle energy adjustment module, used to emit an ion beam with an energy spectrum consistent with that of the lunar surface to electronic components. The emitted ion beam can be a single ion beam or a mixed ion beam. When the emitted ion beam is a single ion beam, only one type of ion irradiates the surface of the electronic components within a given time period. During irradiation experiments, the components can be irradiated sequentially according to the proportion of different ions on the lunar surface, for example, the irradiation sequence is protons → α particles → heavy ions. Before the ions irradiate the electronic components, the ion beam, accelerated to a certain energy by the particle accelerator, is adjusted by the particle energy adjustment module to match the energy spectrum of different ions to their distribution on the lunar surface.

[0050] When the emitted ion beam is a mixed ion beam, the ion beam emission system 1 includes multiple particle accelerators, multiple particle energy adjustment modules, and deflecting magnets, with each particle accelerator and particle energy adjustment module corresponding to one another. Before mixing, the mixed beam, composed of proton beams, α particle beams, and heavy ion beams accelerated to a certain energy by different particle accelerators, has its energy spectrum adjusted to match its distribution on the lunar surface by the corresponding particle energy adjustment modules. Then, with the help of deflecting magnets, these ion beams are converged into the beam pipe 7, thus forming a mixed ion beam.

[0051] The beam control system 2 is used to control ion irradiation parameters such as the switching on and off of the ion beam, beam spot size, and beam uniformity. It mainly consists of a beam diagnostic target chamber, beam shutter, fluorescent screen, guide, beam expander magnet, scanning magnet, aperture, and corresponding controllers and systems. During irradiation experiments, the beam spot size is adjusted according to the size of the electronic components to be irradiated.

[0052] The beam quality measurement system 3 is used to measure and diagnose beam quality. It mainly consists of a detector array 31, electronics, and corresponding measurement software. The detector array 31 is installed on a multi-degree-of-freedom sample platform 61 inside the vacuum irradiation target chamber 8. In a specific embodiment of the present invention, the specific arrangement of the detector array 31 is as follows: Figure 2 As shown, S1, S2, and S3 are first particle detectors 311 at different heights, which can be gold-silicon surface barrier detectors. They are mainly used to correct the ion count detected by the beam monitoring system 4 during device irradiation to ensure that the cumulative ion fluence irradiated to the device surface reaches the specified value. The nine second detectors 312 arranged in a 3*3 uniform distribution in the middle area are mainly used to measure the beam spot uniformity to ensure that the ions are uniformly distributed throughout the entire beam spot area during device irradiation. A1 and A2 are third particle detectors 313 with different collimating apertures to measure the energy of the ion beam to ensure that the beam energy is at the specified value during device irradiation.

[0053] The beam monitoring system 4 is used to monitor the ion fluence to ensure that the ion fluence irradiated onto the electronic device reaches the corresponding specified value. It mainly consists of multiple particle detectors 41 distributed around the ion beam, readout electronics, and corresponding measurement software. When the ion beam is a single beam, the particle detectors 41 are installed at the front end of the vacuum irradiation target chamber 8; when the ion beam is a mixed beam, the particle detectors 41 are installed at the front end of the deflection magnet used for ion focusing. During the irradiation test, the specific implementation method of the beam monitoring system 4 is as follows: before the device is irradiated, the ion counts detected by the first particle detector 311 (S1-S3) and the ion counts detected by the particle detector 41 are recorded respectively, and the ratio between them is calculated; during the device irradiation, the ion counts detected by the particle detector 41 are recorded, and then the cumulative ion fluence irradiated onto the device is obtained by multiplying the count by the above ratio.

[0054] The temperature control system 5 mainly consists of a temperature test chamber 51, a high-temperature control module, a low-temperature control module, and related pipelines and cables. It is used to simulate the extreme temperature environment of the lunar surface (the lunar surface temperature range is -180°C to 125°C). During the irradiation test, the electronic components to be irradiated are placed inside the temperature test chamber 51. The high-temperature control module and the low-temperature control module control the ambient temperature inside the temperature test chamber to either a high or low temperature, thereby simulating the extreme temperature environment. Figure 3 This is a schematic diagram of the temperature test chamber. Figure 4 This is a top-view cross-sectional diagram of the temperature test chamber 51. The front plate 511 and rear plate 512 of the temperature test chamber 51 are hollow structures used to store cryogenic media, such as liquid nitrogen or liquid helium. The front plate 511 and rear plate 512 are connected to a cryogenic media storage tank 52 located outside the vacuum irradiation target chamber 8 via flexible hoses. A certain number of windows 513 are opened on the front plate 511, allowing the ion beam to irradiate the surface of electronic components inside the temperature test chamber 51 through the windows 513. Inside the temperature test chamber 51, close to the rear plate 512, are arranged in sequence an electric heating wire 514, multiple Pt100 thermistors 515, and a circuit board fixing plate 516. During the irradiation test, the internal temperature of the temperature test chamber 51 is monitored in real time by the Pt100 thermistors 515. Then, by controlling the cryogenic media or the electric heating wires 513 to execute corresponding commands, the internal temperature of the temperature test chamber 51 is cooled or heated, thereby ensuring that the internal temperature of the temperature test chamber 51 is maintained at the set temperature, realizing the simulation of extreme temperatures.

[0055] The sample plate motion control system 6 mainly includes a multi-degree-of-freedom sample platform 61 and a corresponding control module. The multi-degree-of-freedom sample platform 61 mainly consists of a sample plate, X, Y, and Z axes, four servo motors rotating around the Y axis, belts, and lead screws. The control module mainly consists of drive circuits, multi-channel motion controllers, control software, and other important components. The bottom of the temperature test chamber 51 is fixed to the sample plate of the multi-degree-of-freedom sample platform 61. During irradiation testing, the control module controls the movement of the multi-degree-of-freedom sample platform 61 to adjust the electronic components to be irradiated to the designated position and state, facilitating subsequent irradiation testing of the electronic components.

[0056] Vacuum irradiation target chamber 8 provides a vacuum environment that meets experimental requirements, facilitating smooth connection with the particle accelerator. During irradiation experiments, the vacuum level of vacuum irradiation target chamber 8 ranges from 10... -3 ~10 -4 Pa. In a specific embodiment of the present invention, the vacuum irradiation target chamber 8 is a cylindrical shell structure closed at both ends.

[0057] Multiple flanges are evenly distributed along the circumference of the vacuum irradiation target chamber 8. High-sealing inserts with relevant functions are installed on these flanges for cables and pipes to be led out from inside the vacuum irradiation target chamber 8. In this embodiment of the invention, seven flanges are provided.

[0058] The specific steps for conducting device irradiation tests using the aforementioned lunar radiation environment simulation device are as follows:

[0059] 1. First, close all the openings on the device, and then use the relevant vacuum extraction device to perform a vacuum extraction operation to match the vacuum level inside the vacuum irradiation target chamber and beam pipe with the particle accelerator, ensuring smooth connection with the accelerator.

[0060] 2. Set up a temperature control system to ensure that the temperature test chamber is kept at the set ambient temperature;

[0061] 3. Open the beam shutter and measure the beam quality to ensure that the beam quality meets the relevant test requirements during the experiment;

[0062] 4. Close the beam shutter and move the multi-degree-of-freedom sample platform to place the irradiated device within the ion beam spot area;

[0063] 5. Open the beam shutter, conduct device irradiation tests, and record the corresponding ion irradiation parameters (such as energy, surface LET value, range, fluence rate, fluence) and the number of radiation effects in real time.

[0064] 6. Steps 2, 3, 4, and 5 work together to complete device irradiation tests under different ambient temperatures and ion parameters.

[0065] Figure 5The results of single-event flips of a certain type of SRAM device at different temperatures are presented using this device. It can be seen that the ambient temperature during irradiation has a significant impact on the single-event effect of the device.

[0066] This invention provides a lunar radiation environment simulation device and testing method, which utilizes a combination of multiple ion mixed beams and a temperature control system to form a new irradiation simulation device. This device can simultaneously simulate the radiation environment and extreme temperature environment on the lunar surface, providing a radiation test environment comparable to the real lunar surface for scientific research on the radiation effects of electronic components for extreme space environments such as the moon.

[0067] The above embodiments are merely illustrative examples of the present invention. The present invention may also be implemented in other specific ways or forms without departing from its spirit or essential characteristics. Therefore, the described embodiments should be considered illustrative rather than limiting in any respect. The scope of the present invention should be defined by the appended claims, and any variations equivalent to the intent and scope of the claims should also be included within the scope of the present invention.

Claims

1. A lunar radiation environment simulation device, characterized in that, The device includes an ion beam emission system (1), a beam control system (2), a beam quality measurement system (3), a beam monitoring system (4), a temperature control system (5), a sample plate motion control system (6), a beam pipe (7), a vacuum irradiation target chamber (8), and related cables, wherein: The temperature control system (5) is used to simulate the extreme temperature environment on the lunar surface, including a temperature test chamber (51), in which the electronic components to be irradiated are placed; The sample plate motion control system (6) is used to control the spatial position and state of the electronic components to be irradiated. It includes a multi-degree-of-freedom sample platform (61), and the bottom of the temperature test chamber (51) is fixed on the multi-degree-of-freedom sample platform (61). The vacuum irradiation target chamber (8) is used to provide a vacuum environment that meets the experimental requirements. The temperature test chamber (51) and the multi-degree-of-freedom sample platform (61) are located in the vacuum irradiation target chamber (8). The ion beam emission system (1) is connected to the vacuum irradiation target chamber (8) through the beam pipe (7) and is used to emit an ion beam with the same energy spectrum as the lunar surface to the electronic components. The ion beam enters the beam pipe (7) for transmission and is irradiated onto the electronic components in the temperature test chamber (51) after the parameters are adjusted by the beam control system (2). The beam quality measurement system (3) includes a detector array (31) installed on the multi-degree-of-freedom sample platform (61) for measuring and diagnosing the quality of the ion beam, ensuring that the quality of the ion beam meets the test requirements; The beam monitoring system (4) includes multiple particle detectors (41) distributed around the ion beam to monitor the cumulative ion fluence irradiated onto electronic components and ensure that the cumulative ion fluence reaches the corresponding specified value. The beam quality measurement system (3) also includes electronics and corresponding measurement software. The planar arrangement of the detector array (31) is as follows: three first particle detectors (311) of different heights are arranged at equal intervals near one end to correct the ion count detected by the beam monitoring system (4) during device irradiation, ensuring that the cumulative ion fluence irradiated to the device surface reaches the specified value; nine second particle detectors (312) are evenly arranged in a 3*3 array in the middle area to measure the beam spot uniformity, ensuring that the ions are evenly distributed in the entire beam spot area during device irradiation; and two third particle detectors (313) with different collimation holes are arranged near the other end to measure the energy of the ion beam, ensuring that the beam energy is the specified value during device irradiation.

2. The lunar radiation environment simulation device according to claim 1, characterized in that, The ion beam emission system (1) includes a particle accelerator and a particle energy regulation module, and the emitted ion beam is a single ion beam or a mixed ion beam.

3. The lunar radiation environment simulation device according to claim 2, characterized in that, When the ion beam emitted by the ion beam emission system (1) is a single ion beam, only one type of ion irradiates the surface of the electronic component within a certain time period. The ion beam accelerated to a set energy by the particle accelerator is then adjusted by the particle energy adjustment module to match the energy spectrum of different ions with their distribution on the lunar surface.

4. The lunar radiation environment simulation device according to claim 2, characterized in that, When the ion beam emitted by the ion beam emission system (1) is a mixed ion beam, the ion beam emission system (1) includes multiple particle accelerators, multiple particle energy adjustment modules and deflection magnets. Each particle accelerator and each particle energy adjustment module corresponds one-to-one. Before mixing, the ion beams accelerated to a set energy by different particle accelerators are adjusted by the corresponding particle energy adjustment modules to match their distribution on the lunar surface. Then, the ion beams are focused into the beam pipe (7) by the deflection magnets to form a mixed ion beam.

5. The lunar radiation environment simulation device according to claim 4, characterized in that, The beam control system (2) includes a beam diagnostic target chamber, a beam shutter, a fluorescent screen, a guide, a beam expander magnet, a scanning magnet, an aperture and its corresponding controller. The relevant ion irradiation parameters for controlling the ion beam include the switching of the ion beam, the size of the beam spot and the uniformity of the beam.

6. The lunar radiation environment simulation device according to claim 5, characterized in that, When the ion beam emitted by the ion beam emission system (1) is a single ion beam, the particle detector (41) is installed at the front end of the vacuum irradiation target chamber (8); when the ion beam emitted by the ion beam emission system (1) is a mixed ion beam, the particle detector (41) is installed at the front end of the deflection magnet.

7. The lunar radiation environment simulation device according to claim 6, characterized in that, The specific method for monitoring the cumulative ion flux irradiated onto electronic components using the beam monitoring system (4) is as follows: Before irradiating the electronic components, the ion counts detected by the first particle detector (311) and the ion counts detected by the particle detector (41) are recorded respectively, and the ratio between them is calculated. When irradiating electronic components, the ion count detected by the particle detector (41) is recorded, and then the count is multiplied by the ratio to obtain the cumulative ion fluence irradiated onto the electronic components.

8. The lunar radiation environment simulation device according to any one of claims 1-7, characterized in that, The front panel (511) and rear panel (512) of the temperature test chamber (51) are hollow structures used to store low-temperature media. The front panel (511) and rear panel (512) are connected to a refrigerant storage tank (52) located outside the vacuum irradiation target chamber (8) via flexible hoses. The front panel (511) has multiple windows (513) through which the ion beam irradiates the surface of electronic components inside the temperature test chamber (51) during the irradiation test. An electric heating wire (514), multiple Pt100 thermal resistors (515), and a circuit board fixing plate (516) are sequentially arranged inside the rear plate (512). The internal temperature of the temperature test chamber (51) is monitored in real time by the Pt100 thermal resistors (515). The internal temperature of the temperature test chamber (51) is cooled or heated by controlling the low temperature medium or the electric heating wire (514) to execute corresponding instructions, thereby ensuring that the internal temperature of the temperature test chamber (51) is at the set temperature.

9. The lunar radiation environment simulation device according to claim 8, characterized in that, The cryogenic medium is liquid nitrogen or liquid helium.

10. The lunar radiation environment simulation device according to claim 1, characterized in that, The multi-degree-of-freedom sample platform (61) includes a sample plate for carrying electronic components, four servo motors for X, Y, and Z axes and for rotating around the Y axis, a belt, and a lead screw, which can realize the X, Y, and Z axis translational motion and the rotational motion around the Y axis of the electronic components.

11. The lunar radiation environment simulation device according to claim 1, characterized in that, The vacuum irradiation target chamber (8) is a cylindrical shell structure closed at both ends. During irradiation experiments, its internal vacuum level ranges from 10. -3 ~10 -4 Pa.

12. The lunar radiation environment simulation device according to claim 11, characterized in that, Multiple flanges (9) are evenly distributed along the circumference of the vacuum irradiation target chamber (8). High-sealing inserts with relevant functions are installed on the flanges (9) for relevant cables and pipes to be led out from the inside of the vacuum irradiation target chamber (8).

13. A method for conducting device irradiation tests using the lunar radiation environment simulation apparatus according to any one of claims 1-12, comprising the following steps: S1. Close all openings and evacuate the vacuum irradiation target chamber to match the vacuum level inside the vacuum irradiation target chamber and beam pipe with that of the particle accelerator, ensuring smooth connection with the particle accelerator. S2. Set up a temperature control system to keep the temperature test chamber at the set ambient temperature. S3. Open the beam shutter and measure the beam quality to ensure that the beam quality meets the relevant test requirements during the test; S4. Close the beam shutter and move the multi-degree-of-freedom sample platform so that the irradiated electronic components are within the area of ​​the ion beam spot. S5. Open the beam shutter, conduct device irradiation tests, and record the corresponding ion irradiation parameters and radiation effect number parameters in real time; S6. Change the parameter settings in steps S2 and S3, and repeat steps S2-S5 to complete the device irradiation test under different ambient temperatures and different ion parameters.

Images