Method, system and device for evaluating anti-interference capability of power beidou and storage medium

Abstract

The application discloses a kind of power Beidou anti-interference capability evaluation method, system, equipment and storage medium, belong to navigation test technical field.The application is aimed at different anti-interference test types of power Beidou equipment terminal, obtains corresponding test scene and test factor;Anti-interference test is carried out under different test scene and test factor different threshold value;Based on the test result of test factor different threshold value, obtain the anti-interference test result of equipment.The method gives the anti-interference test method in multiple conditions for power Beidou equipment, proposes the test suitable for multiple test factors, is aimed at different test method and equipment and has universality.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of navigation test, and relates to an evaluation method, system and device for the anti-interference capability of a power Beidou and a storage medium. BACKGROUND

[0002] The power industry has extensive space-time requirements, and the Beidou system is introduced therein; the Beidou system provides various Beidou precision services covering fields such as marketing and distribution, marketing collection, emergency command, survey and design, and network-wide time service for the power industry. Considering that the power industry is a basic industry in the economy, the safety of the power grid is of great significance to various industries, and therefore the Beidou terminal applied by the power industry needs to have certain anti-interference capability, thereby providing a basic guarantee for subsequent power Beidou applications.

[0003] The existing anti-interference test of the Beidou terminal applied by the power industry often only lists some individual test scenarios, executes them, records the test results, and gives test conclusions, but whether other test scenarios and types are used cannot be verified. For example, a patent with the application number 201510728519.6 and the name of a satellite navigation multi-beam anti-interference test method is a kind of anti-interference test in a darkroom, but whether the test method is applicable to all test scenarios and whether the test results are applicable to other types of satellites have not been verified.

[0004] Therefore, the existing method does not have a complete test guidance method, and the test results cannot strongly support the conclusions, which may cause hidden dangers in the detection of the anti-interference test of the Beidou terminal. SUMMARY

[0005] The application aims to overcome the shortcomings of the prior art, provide an evaluation method, system, device and storage medium for the anti-interference capability of a power Beidou, solve the problem of the lack of a universal test method in the prior art, and determine whether the existing test method can meet the device test requirements and the test results.

[0006] To achieve the above-mentioned purpose, the application adopts the following technical solutions:

[0007] In a first aspect, the application provides an evaluation method for the anti-interference capability of a power Beidou, comprising:

[0008] determining the anti-interference test type of a power Beidou device terminal;

[0009] determining the test scene and test factor according to the anti-interference test type;

[0010] performing anti-interference tests on different thresholds of the test factor in a test scene of an anti-interference test type;

[0011] Obtain the test results of different threshold values of the test factors under each test scene, and obtain the evaluation result of the anti-interference capability of the power Beidou device terminal based on the test results of the test factors.

[0012] Further changes of the application are:

[0013] Preferably, the anti-interference test type is suppression type interference test and deception type interference test.

[0014] Preferably, the test scene of the suppression type interference test is test scene one or test scene two.

[0015] The test scene one is to receive the suppression type interference test after positioning, time service and speed measurement by satellite signals.

[0016] The test scene two is that the satellite signals and the suppression type interference signals exist at the same time, and positioning, time service and speed measurement are performed according to the satellite signals.

[0017] The deception type interference test is test scene three or test scene four.

[0018] The test scene three is to receive the deception type interference test after positioning, time service and speed measurement by satellite signals.

[0019] The test scene four is that the satellite signals and the deception type interference signals exist at the same time, and positioning, time service and speed measurement are performed according to the satellite signals.

[0020] Preferably, the test factors of the suppression type interference test include a device stable working time factor, an interference signal waiting time factor, a reset alarm waiting time factor, an interference signal size evaluation factor and an interference azimuth angle evaluation factor.

[0021] The test factors of the deception type interference test include a device stable working time factor, an interference signal waiting time factor, a reset alarm waiting time factor and a deception signal step factor.

[0022] Preferably, the specific process of the anti-interference test is that, when testing in a test scene, the test is performed under the condition that the test factor threshold value is set, if the test is successful, the evaluation result of the anti-interference capability of the power Beidou device terminal is directly calculated according to the test result, and the test is ended, if the test is unsuccessful, the evaluation result of the anti-interference capability of the power Beidou device terminal is calculated according to the test result, the threshold value of the test failure is updated, and the test is continued.

[0023] Preferably, when the threshold value of the test failure is updated, the updated threshold value is an integral multiple of the previous test factor threshold value.

[0024] By testing the test results of different thresholds of the test factors, different evaluation results can be obtained, and the evaluation results of the anti-interference capability of the power Beidou device terminal under different test factor conditions are compared.

[0025] Preferably, the evaluation result of the anti-interference capability is calculated by multiplying the test factor result by the weight of the test factor, adding all the products to obtain the evaluation result, and the test factor result is 1 or 0.

[0026] In the second aspect of the present application, an evaluation system for the anti-interference capability of the power Beidou device terminal is provided, comprising:

[0027] A type determination unit is configured to determine the anti-interference test type of the power Beidou device terminal.

[0028] A scene determination unit is configured to determine the test scene and the test factor according to the anti-interference test type.

[0029] A test unit is configured to perform anti-interference tests on different thresholds of the test factor under the test scene of one anti-interference test type.

[0030] An evaluation unit is configured to obtain the test results of different thresholds of the test factor under each test scene, and obtain the evaluation result of the anti-interference capability of the power Beidou device terminal based on the test results of the test factors.

[0031] In the third aspect of the present application, a computer device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor executes the computer program to realize the steps of the evaluation method of the anti-interference capability of the power Beidou device terminal.

[0032] In the fourth aspect of the present application, a computer readable storage medium is provided, and the computer readable storage medium stores a computer program, and the computer program is executed by the processor to realize the steps of the evaluation method of the anti-interference capability of the power Beidou device terminal.

[0033] Compared with the prior art, the present application has the following beneficial effects:

[0034] This invention discloses a method for evaluating the anti-interference capability of power grid BeiDou navigation systems. This method acquires corresponding test scenarios and test factors for different anti-interference test types of power grid BeiDou equipment terminals; conducts anti-interference tests under different test scenarios and test factor thresholds; and obtains the final anti-interference capability result of the power grid BeiDou equipment based on the test results at different test factor thresholds. This method provides different methods for testing the anti-interference capability of power grid BeiDou equipment, proposes tests applicable to multiple test factors, and is universally applicable to different test methods and equipment. The test types, test scenarios, and test factors can be adjusted according to circumstances, providing a clear set of measures for evaluating the anti-interference capability of power grid BeiDou equipment.

[0035] Furthermore, based on the test results of different thresholds of the test factors, the anti-interference capability of the power Beidou equipment terminal under different test conditions can be obtained. Attached Figure Description

[0036] Figure 1 This is a system flowchart of the present invention;

[0037] Figure 2 This is a diagram of the test system used in the embodiments;

[0038] Among them, 1 is a microwave anechoic chamber; 2 is a test turntable and the device under test; 3 is a DC regulated power supply; 4 is an interference transmitting antenna; 5 is a satellite signal simulator; and 6 is a computer test system. Detailed Implementation

[0039] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. The terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Furthermore, unless otherwise explicitly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection or a detachable connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal connection of two elements. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0040] The present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments:

[0041] See Figure 1One of the embodiments of the present application discloses a method for evaluating the anti-interference test of power Beidou, first, according to the type of the anti-interference test of the power Beidou terminal, the test scene and the test factor are determined, then according to the type of the anti-interference test, the test is carried out combined with the test scene and the test factor, and the evaluation result of the interference test is obtained according to the test result of all test factors.

[0042] The specific steps of the above evaluation method include:

[0043] S1, determine the anti-interference test type.

[0044] The type of the anti-interference test of the power Beidou terminal includes: oppressive interference test and deception interference test.

[0045] The oppressive interference test is for testing oppressive interference, and the definition of the oppressive interference test is that the strength of the interference signal is much greater than the strength of the satellite signal, so that the front end of the receiving device is saturated and cannot work normally.

[0046] The deception interference test is for testing deception interference, and the definition of the deception interference test is that the transmitted interference signal is the same as or similar to the navigation signal, which causes the user equipment to produce false information or no information output.

[0047] S2, according to the type of the anti-interference test, determine the test scene and the test factor of each test type;

[0048] Each test type corresponds to the same test factor regardless of the test scene, the test factor type of the oppressive interference test includes the time length factor and the evaluation factor, and the test factor type of the deception interference test includes the time length factor and the step length factor. The time length factor is the time length of each test stage in the test process, the evaluation factor is the numerical value of the specific parameter of the test process, and the step length factor is the step length value of the signal.

[0049] Further, the time length factor of the oppressive interference test includes but is not limited to: device stable working time length factor, interference signal waiting time length factor and reset alarm waiting time length factor; the evaluation factor includes but is not limited to: interference signal size evaluation factor and interference azimuth angle evaluation factor.

[0050] The time length factor of the deception interference test includes but is not limited to: device stable working time length factor, interference signal waiting time length factor and reset alarm waiting time length factor; and the step length factor is a deception signal step length factor.

[0051] For the jamming test, there are two test scenarios, test scenario one and test scenario two. The test scenario one is that after the satellite signal is used to realize positioning, timing and speed measurement, the jamming signal is received for testing; the test scenario two is that the satellite signal and the jamming signal exist simultaneously for testing, and the satellite signal is used for positioning, timing and speed measurement.

[0052] For the deception jamming test, there are test scenarios, test scenario three and test scenario four. The test scenario three is that after the satellite signal is used to realize positioning, timing and speed measurement, the deception jamming signal is received for testing; the test scenario four is that the satellite signal and the deception jamming signal exist simultaneously for testing, and the satellite signal is used for positioning, timing and speed measurement.

[0053] S3, set the test equipment and the threshold of each test factor, and perform the test.

[0054] The specific test system and equipment can be set and selected by itself according to the actual situation, which is not limited here, but the test system, the test equipment and the test method need to meet the industry standards and requirements.

[0055] S31, for the test of the test scenario one of the jamming test, the following steps are included:

[0056] S311, connect the power Beidou equipment and the test instrument according to the topology of the test system, simulate the satellite navigation signal and the user motion trajectory through the satellite signal, and the signal source strength is set, which is not described in detail here; after the satellite signal is used to realize positioning, timing and speed measurement, the jamming signal is received;

[0057] S312, set the threshold F1 of the device stable working time factor, the threshold F1 is determined according to the experience value of the device stable working; after the stable working F1 is set, the interference signal source in the test system sends the interference signal, and the strength and type of the interference signal are not described in detail here;

[0058] S313, set the threshold F2 of the interference signal waiting time factor, after the threshold F2 of the waiting time factor is passed, it is checked whether the power Beidou equipment identifies the interference signal power and the direction, and outputs the alarm information;

[0059] The threshold of the interference signal power size evaluation factor set in this step is F3, and the threshold of the interference signal direction angle evaluation factor set is F4, that is, the error of the interference signal power size identified by the device does not exceed F3, and the error of the interference signal direction angle does not exceed F4;

[0060] The threshold F2, the threshold F3 and the threshold F4 are set according to the experience value of the device identifying the interference signal.

[0061] If the situation of identifying the jamming signal meets the power size evaluation factor and the azimuth angle evaluation factor F3 and F4, and there is an alarm information output, then the suppressing jamming signal is closed, and the next step is entered, otherwise, it is determined that the test fails, the test step of the test scene is terminated, or the test is restarted, and step 4 is performed simultaneously;

[0062] If the test is restarted, the threshold value of the test failure is updated, that is, the threshold values F2, F3 and F4 of the test failure are updated, and the updated value can be selected arbitrarily, and preferably, the updated threshold value is a multiple of the previous threshold value.

[0063] S314, the threshold value of the reset alarm information waiting time factor is F5, which is a certain fixed value, and is determined according to the experience value of the device reset alarm; the power Beidou device should reset the alarm information within the time length of F5, otherwise it is determined as a failure, the test step of the test scene is terminated, or the test is restarted, and step 4 is performed simultaneously.

[0064] If the test is restarted, the threshold value F5 is updated, and the updated value can be selected arbitrarily, and preferably, the updated threshold value is a multiple of the previous threshold value.

[0065] In the above process, S313 and S314 are relatively independent steps, which can be tested separately when the other step meets the condition.

[0066] Through the above test process, the threshold value of each test factor of the power Beidou device terminal under the normal anti-interference condition in the test scene of the jamming test situation can be obtained.

[0067] S32, the test of the second test scene of the suppressing jamming test includes the following steps:

[0068] S321, connect the power Beidou device and the test instrument according to the topology of the test system, simulate the satellite navigation signal and the user motion trajectory through the satellite signal, and the signal source strength is not described in detail here;

[0069] S322, close the power Beidou device in the test system, set the threshold value F1 of the device stable working time factor, and the threshold value F1 is determined according to the experience value of the device stable working; after setting F1, the test system broadcasts the satellite signal and the suppressing jamming signal, and the strength and type of the jamming signal are not described in detail here;

[0070] S323, open the power Beidou device, set the threshold value F2 of the jamming signal waiting time factor, and after the threshold value F2 of the waiting time factor, check whether the power Beidou device identifies the jamming signal power and azimuth, and outputs the alarm information;

[0071] The threshold of the interference signal power size evaluation factor is set as F3, and the threshold of the interference signal azimuth angle evaluation factor is set as F4, that is, the error of the interference signal power size recognized by the device is not more than F3, and the error of the interference signal azimuth angle is not more than F4.

[0072] The threshold F2, the threshold F3 and the threshold F4 are set according to the experience value of the device recognizing the interference signal.

[0073] If the situation of recognizing the interference signal meets F3 and F4 of the power size evaluation factor and the interference signal azimuth angle evaluation factor, and the alarm information is output, the suppression of the interference signal is closed, and the next step is entered, otherwise, it is determined that the test fails, the test step of the test scene is terminated, or the test is restarted, and step 4 is executed.

[0074] If the test is restarted, the threshold of the test failure is updated, that is, the threshold of the test failure in the threshold F2, the threshold F3 and the threshold F4 is updated, and the updated value can be arbitrarily selected, and preferably, the updated threshold is a multiple of the previous threshold.

[0075] S324, the threshold of the reset alarm information waiting time factor is set as F5, which is a certain fixed value, and is determined according to the experience value of the device reset alarm; the power Beidou device should reset the alarm information within the time length of F5, otherwise it is determined as failure, the test step of the test scene is terminated, or the test is restarted, and step 4 is executed.

[0076] If the test is restarted, the threshold F5 is updated, and the updated value can be arbitrarily selected, and preferably, the updated threshold is a multiple of the previous threshold.

[0077] In the above process, S323 and S324 are relatively independent steps, which can be tested separately when the other step meets the condition.

[0078] Through the above test process, the threshold of each test factor of the power Beidou device terminal under the test scene two of the interference test situation can be obtained when the device can normally perform anti-interference.

[0079] S33, the test of the test scene three for the spoofing interference test includes the following steps:

[0080] S331, according to the topological graph, the power Beidou device and the test instrument are connected, the satellite signal is used to simulate the satellite navigation signal and the user motion trajectory, and the signal source strength is not described in detail here; after positioning, timing and speed measurement are realized through the satellite signal, the spoofing interference signal is received.

[0081] S332, set the threshold F1 of the device stable working time factor, set to a certain fixed value, determined according to the experience value of the stable working of the device; after setting F1, the interference signal source in the test system sends the interference signal, and the strength and type of the interference signal are not described in detail here;

[0082] In this step, the threshold F6 of the spoof signal strength step factor is set, which can be set to a multiple of a certain fixed value, and the certain fixed value is determined according to the experience value of the device identifying the interference signal; it is required that the spoof signal is stronger than the navigation signal during the test, at least greater than the threshold F6; if the difference between the spoof signal and the navigation signal is less than the set threshold, the test step of this test scene is terminated, or the test is restarted, and step 4 is executed;

[0083] When the test is restarted, the threshold F6 is updated, and the updated value can be determined and adjusted according to the actual situation, and preferably, the updated value is a multiple of the previous threshold;

[0084] S333, set the threshold F2 of the interference signal waiting time factor, which can be set to a multiple of a certain fixed value, and the certain fixed value is determined according to the experience value of the device identifying the interference signal; during the test, after waiting for the threshold F2, it is checked whether the power Beidou device identifies the interference signal and outputs the alarm information;

[0085] If the interference signal is identified and the alarm information is output, the suppression of the interference signal is turned off, and the next step is entered, otherwise it is determined that the test fails, and the test step of this test scene is terminated, or the test is restarted, and step 4 is executed;

[0086] When the test is restarted, the threshold F2 is updated, and the updated value can be determined and adjusted according to the actual situation, and preferably, the updated value is a multiple of the previous threshold;

[0087] S334, set the threshold F5 of the reset alarm information waiting time factor, set to a certain fixed value, determined according to the experience value of the reset alarm of the device; the power Beidou device should reset the alarm information within the time F5, otherwise it is determined as a failure, and the test step of this test scene is terminated, or the test is restarted, and step 4 is executed;

[0088] When the test is restarted, the threshold F5 is updated, and the updated value can be determined and adjusted according to the actual situation, and preferably, the updated value is a multiple of the previous threshold.

[0089] In the above process, S333 and S334 are relatively independent steps, which can be tested separately when the other step meets the condition.

[0090] The threshold of each test factor of the Beidou power equipment terminal under the anti-interference of the test scene three in the test process can be obtained.

[0091] The test of the test scene four for the test of the deceptive jamming test includes the following steps.

[0092] S341, the Beidou power equipment and the test instrument are connected according to the topology of the test system, the satellite navigation signal and the user motion trajectory are simulated by the satellite signal, and the signal source strength is not described in detail here.

[0093] S342, the Beidou power equipment in the test system is closed, the threshold F1 of the stable working time factor of the equipment is set, the threshold F1 is determined according to the experience value of the stable working of the equipment; after the stable working set F1, the test system broadcasts the satellite signal and the deceptive jamming signal existing at the same time, the threshold F6 of the deceptive signal strength step factor is set, which can be set as a multiple of a certain fixed value, and the certain fixed value is determined according to the experience value of the equipment identifying the jamming signal; it is required that the deceptive signal is stronger than the navigation signal in the test process, at least greater than the threshold F6; if the difference between the deceptive signal and the navigation signal is less than the set threshold, the test steps of this test scene are terminated, or the test is restarted, and step 4 is performed.

[0094] When the test is restarted, the threshold F6 is updated, and the updated value can be determined and adjusted according to the actual situation, preferably, the updated value is a multiple of the previous threshold;

[0095] S343, the Beidou power equipment is started, the threshold F2 of the waiting time factor of the jamming signal is set, which can be set as a multiple of a certain fixed value, and the certain fixed value is determined according to the experience value of the equipment identifying the jamming signal; after the waiting threshold F2 in the test, it is checked whether the Beidou power equipment identifies the jamming signal and outputs the alarm information;

[0096] If the jamming signal is identified and the alarm information is output, the deceptive jamming signal is closed, the next step is entered, otherwise it is determined that the test fails, the test steps of this test scene are terminated, or the test is restarted, and step 4 is performed.

[0097] When the test is restarted, the threshold F2 is updated, and the updated value can be determined and adjusted according to the actual situation, preferably, the updated value is a multiple of the previous threshold;

[0098] S344, set the threshold F5 of the reset alarm information waiting time factor, set to a certain fixed value, determined according to the experience value of the device reset alarm; during testing, the power Beidou device should reset the alarm information within the threshold F5, otherwise it is judged as failure, the test steps of this test scene are terminated, or the test is restarted, and step 4 is executed at the same time;

[0099] When restarting the test, update the threshold F5, and the updated value can be determined and adjusted according to the actual situation, and preferably, the updated value is a multiple of the previous threshold.

[0100] In the above process, S33 and S34 are relatively independent steps, which can be tested separately when the other step meets the condition.

[0101] Through the above test process, the threshold of each test factor of the power Beidou device terminal can be obtained when the anti-interference is normal in the test scene four of the spoofing interference test.

[0102] The retest in any one of the above S31-S34 is based on the premise that the previous test fails. In actual application process, even if the previous test factor is successful, the threshold can also be continuously reduced for testing. When the threshold is reduced, it is also reduced by a multiple; when the threshold is reduced, the test condition is more stringent, and S4 is executed after the test.

[0103] S4, based on the test results of each test factor under the test type and the corresponding test scene, calculate the evaluation result under the test type and the corresponding test scene.

[0104] After testing in a certain scene under each type of interference test, whether each test factor can pass the test can be obtained. For a test that passes a certain test factor, the test result is 1; otherwise, the test fails, and the test result is 0. The final evaluation value R can be obtained by comprehensively calculating the result values of all test factors.

[0105] Preferably, the result value of the above test factor can be obtained by weighting method, that is, the result value of each test factor is multiplied by the corresponding weighting coefficient, and the sum of all multiplication results is added to obtain the evaluation value R. Specifically, as shown in the following formula (1):

[0106] R=m1F1+m2F2+m3F3+m n F n (1)

[0107] Wherein, m1, m2, m3...m n are weight coefficients, F1, F2, F3...F nThe test results of the test factors are 1 or 0, and the formula can obtain different evaluation values R of the test factors under different thresholds in each test type and each test scene, and the evaluation values R obtained under different thresholds of each test factor are listed to obtain the evaluation value R of the device under the test factor, and the anti-interference ability of the device under different thresholds of the test factor can be found from the list.

[0108] In formula (1), the weight coefficient is adjusted according to the importance of the test factor.

[0109] When the evaluation value R is greater, it represents that the Beidou terminal device has strong anti-interference test under very harsh test conditions; when the test factor value is greater or the evaluation value R is smaller, it represents that the Beidou terminal can meet the demand of anti-interference test under general test conditions, but cannot meet the requirement under harsh test conditions; and when the test factor value is greater and the evaluation value R is smaller, it represents that the anti-interference test is poor and cannot meet the general use demand.

[0110] One of the embodiments of the present application discloses an evaluation system for power Beidou anti-interference test, which comprises a type determination unit for determining the anti-interference test type of a power Beidou device terminal.

[0111] A scene determination unit is configured to determine test scenes and test factors according to the anti-interference test type.

[0112] A test unit is configured to perform anti-interference test on different thresholds of the test factors under the test scene of one anti-interference test type.

[0113] An evaluation unit is configured to obtain the test results of the test factors under different thresholds in each test scene, and obtain the evaluation results of the anti-interference ability of the power Beidou device terminal based on the test results of the test factors.

[0114] One of the embodiments of the present application discloses a computer terminal device, which comprises a processor and a memory for storing a computer program comprising program instructions, and the processor is used to execute the program instructions stored in the computer storage medium. The processor can be a central processing unit (CPU), and can also be other general-purpose processors, digital signal processors (DSP), application specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc., which are the computing core and control core of the terminal, and are suitable for implementing one or more instructions, and are particularly suitable for loading and executing one or more instructions to implement corresponding method processes or corresponding functions; the processor in the embodiment can be used to implement the steps of the power Beidou anti-interference capability evaluation method, which comprises: determining the anti-interference test type of the power Beidou device terminal; determining the test scene and test factor according to the anti-interference test type; performing anti-interference test on different threshold values of the test factor in the test scene of one anti-interference test type; obtaining the test results of the test factor at different threshold values in each test scene, and obtaining the evaluation result of the anti-interference capability of the power Beidou device terminal based on the test results of the test factor.

[0115] One of the embodiments of the present application discloses a storage medium, specifically a computer readable storage medium (Memory), which is a memory device in a terminal device, used for storing programs and data. It can be understood that the computer readable storage medium here can include the built-in storage medium in the terminal device, and of course can also include the expansion storage medium supported by the terminal device. The computer readable storage medium provides a storage space, which stores the operating system of the terminal. Moreover, one or more instructions suitable for being loaded and executed by the processor are also stored in the storage space, and these instructions can be one or more computer programs (including program codes). It should be noted that the computer readable storage medium here can be a high-speed RAM memory, or a non-volatile memory such as at least one disk memory.

[0116] The steps of the method for evaluating the anti-interference capability of the power Beidou device terminal in the above embodiments can be implemented by loading and executing one or more instructions stored in the computer readable storage medium by the processor, including: determining an anti-interference test type of the power Beidou device terminal; determining a test scene and a test factor according to the anti-interference test type; performing anti-interference tests on different threshold values of the test factor in the test scene of one anti-interference test type; obtaining test results of the test factor at different threshold values in each test scene, and obtaining an evaluation result of the anti-interference capability of the power Beidou device terminal based on the test results of the test factor.

[0117] Those skilled in the art will appreciate that embodiments of the application can be supplied as a method, a system, or a computer program product. Thus, the application can take the form of an entirely hardware embodiment, an entirely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, the application can take the form of a computer program product on one or more computer readable storage media (including, but not limited to, disk storage, CD-ROMs, optical storage devices, etc.) embodying computer readable program code thereon.

[0118] The present application is described in reference to the flowcharts and / or block diagrams of the methods, devices (systems) and computer program products according to embodiments of the present application. It should be understood that each flow and / or block in the flowcharts and / or block diagrams, and the combination of flows and / or blocks in the flowcharts and / or block diagrams can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general purpose computer, a special purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device produce the functions specified in the flowcharts and / or block diagrams of the methods, devices (systems) and computer program products according to embodiments of the present application. Figure 1 one or more flows and / or blocks Figure 1 an apparatus that performs the functions specified in one or more flows and / or blocks

[0119] These computer program instructions can also be stored in a computer readable storage medium that can direct the computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable storage medium produce a product including instruction apparatus, which implements the functions specified in the flowcharts and / or block diagrams of the methods, devices (systems) and computer program products according to embodiments of the present application. Figure 1 one or more flows and / or blocks Figure 1 an apparatus that performs the functions specified in one or more flows and / or blocks Figure 1 one or more flows and / or blocks Figure 1 an apparatus that performs the functions specified in one or more flows and / or blocks

[0120] The following is further illustrated in connection with specific embodiments.

[0121] Embodiment 1

[0122] S1, determine the anti-interference type as suppression type interference test;

[0123] S2, determine the test scene as test scene one;

[0124] S3, set the test equipment and the threshold value of each test factor.

[0125] According to the topology of the test system, the power Beidou equipment and the test instrument are connected, the satellite signal is simulated through the satellite navigation signal and the user motion trajectory, and the setting of the signal source strength is not described in detail here; the anti-interference test system is composed of seven parts: microwave darkroom 1, test turntable and measured equipment 2, interference signal source, direct current stabilized power supply 3, interference transmitting antenna 4, satellite signal simulator 5 and computer test system 6. The power Beidou equipment is placed in the test turntable of the darkroom, and the test topology is as shown in Figure 2 .

[0126] After positioning, time service and speed measurement are realized through the satellite signal, the suppression type interference signal is received, and the interference signal of each factor is shown in Table 1:

[0127] Table 1 Values of each test factor

[0128]

[0129] According to the values of the above test factors, test experiments are carried out, each test experiment is executed once, and S4 is executed. If a test factor fails during the test process, the test is continued after updating.

[0130] S4, calculate the evaluation value R1;

[0131] R1=F1+m2F2+m3F3+m4F4+m5F5 (2)

[0132] Wherein, m2, m3...m n are weight coefficients, F1, F2, F3...F n are test results of test factors, and the value range is 1 or 0;

[0133] In this step, R1 corresponding to different test factors can be obtained, list comparison can be carried out, and the anti-interference ability of the equipment under different threshold values can be determined.

[0134] Embodiment 2

[0135] S1, determine the anti-interference type as suppression type interference test;

[0136] S2, determining that the test scenario is test scenario two;

[0137] S3, setting the threshold of the test device and each test factor.

[0138] The power Beidou device and the test instrument are connected according to the topology of the test system, the satellite signal and the user motion track are simulated through the satellite signal, and the setting of the signal source strength is not described in detail here; the anti-interference test system is composed of seven parts, namely, a microwave darkroom 1, a test turntable and a device to be tested 2, an interference signal source, a DC stabilized power supply 3, an interference transmitting antenna 4, a satellite signal simulator 5 and a computer test system 6, the power Beidou device is placed on the test turntable in the darkroom, and the test topology is as shown in Figure 2

[0139] In the test of the simultaneous existence of satellite signals and suppressive interference signals, the interference signals of each factor are shown in Table 2 as follows:

[0140] Table 2 Values of each test factor

[0141]

[0142] According to the values of the above test factors, test experiments are carried out, each test experiment is executed once, and if a test factor fails during the test, the test is continued after being updated.

[0143] S4, calculating the evaluation value R2;

[0144] R1=F1+m2F2+m3F3+m4F4+m5F5 (3)

[0145] Wherein, m2, m3...m5 are weight coefficients, and F1, F2, F3...F5 are test results of test factors, and the value range is 1 or 0;

[0146] In this step, R2 corresponding to different test factors can be obtained, list comparison can be carried out, and then the anti-interference ability of the device under different thresholds can be determined.

[0147] Example 3

[0148] S1, determining that the anti-interference type is a deception interference test;

[0149] S2, determining that the test scenario is test scenario three;

[0150] S3, setting the threshold of the test device and each test factor.

[0151] ​The power Beidou device and the test instrument are connected according to the topology of the test system, satellite navigation signals and user motion trajectories are simulated through satellite signals, and the setting of signal source strength is not described in detail here; after positioning, timing and speed measurement are realized through satellite signals, the suppression type jamming signal is received. The anti-jamming test system is composed of seven parts: a microwave darkroom 1, a test turntable and a device under test 2, a jamming signal source, a DC stabilized power supply 3, a jamming transmitting antenna 4, a satellite signal simulator 5 and a computer test system 6. The power Beidou device is placed on the test turntable in the darkroom, and the test topology is as shown in Figure 2

[0152] The jamming signals of various factors are shown in Table 3:

[0153] Table 3 Values of various test factors

[0154]

[0155] According to the values of the above test factors, test experiments are carried out, and each time a test experiment is carried out, S4 is executed. If a test factor fails during the test process, the test is continued after being updated.

[0156] S4, calculate the evaluation value R3;

[0157] R3 = F1 + m2F2 + m5F5 + m6F6 (4)

[0158] Wherein, m2, m5, m6 are weight coefficients, F1, F2, F5 and F6 are test results of test factors, and the value range is 1 or 0.

[0159] In this step, R3 corresponding to different test factors can be obtained, list comparison can be carried out, and then the anti-jamming capability of the device under different threshold values can be determined.

[0160] Example 4

[0161] S1, determine that the anti-jamming type is spoofing jamming test;

[0162] S2, determine that the test scene is test scene four;

[0163] S3, set the threshold values of the test device and various test factors.

[0164] The power Beidou device and the test instrument are connected according to the topology of the test system, satellite navigation signals and user motion trajectories are simulated through satellite signals, and the setting of signal source strength is not described in detail here; the anti-jamming test system is composed of seven parts: a microwave darkroom 1, a test turntable and a device under test 2, a jamming signal source, a DC stabilized power supply 3, a jamming transmitting antenna 4, a satellite signal simulator 5 and a computer test system 6. The power Beidou device is placed on the test turntable in the darkroom, and the test topology is as shown in​Figure 2 As shown.

[0165] In the test of the coexistence of satellite signals and suppression jamming signals, the jamming signals of each factor are shown in Table 4:

[0166] Table 4 Values of each test factor

[0167]

[0168] According to the values of the above test factors, test experiments are carried out, and each time a test experiment is carried out, S4 is executed, and if a test factor fails during the test, the test is continued after being updated.

[0169] S4, calculate the evaluation value R4;

[0170] R4=F1+m2F2+m5F5+m6F6 (5)

[0171] Wherein, m2, m5, m6 are weight coefficients, F1, F2, F5 and F6 are test results of test factors, and the value range is 1 or 0.

[0172] In this step, R4 corresponding to different test factors can be obtained, list comparison can be carried out, and then the anti-jamming test of the device can be determined.

[0173] The above only describes the preferred embodiments of the present application and is not used to limit the present application, and any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the protection scope of the present application.

Claims

1. A method for evaluating the anti-interference capability of power Beidou, characterized in that, The method comprises the steps of: determining the anti-interference test type of the power Beidou device terminal; the anti-interference test type is a suppression type interference test and a deception type interference test; determining the test scene and the test factor according to the anti-interference test type; the test scene of the suppression type interference test is test scene one or test scene two; the test scene one is that after positioning, timing and speed measurement are performed through a satellite signal, the suppression type interference test is received; the test scene two is that the satellite signal and the suppression type interference signal test exist simultaneously; positioning, timing and speed measurement are performed according to the satellite signal; the deception type interference test is test scene three or test scene four; the test scene three is that after positioning, timing and speed measurement are performed through a satellite signal, the deception type interference test is received; the test scene four is that the satellite signal and the deception type interference test exist simultaneously; positioning, timing and speed measurement are performed according to the satellite signal; in the test scene of one anti-interference test type, the anti-interference test is performed on different threshold values of the test factor; when the test is performed in one test scene, the test factor threshold value is set, if the test is successful, the evaluation result of the anti-interference capability of the power Beidou device terminal is directly calculated according to the test result, and the test is ended; if the test is not successful, the evaluation result of the anti-interference capability of the power Beidou device terminal is calculated according to the test result, the threshold value of the test failure is updated, and the test is continued; when the threshold value of the test failure is updated, the updated threshold value is an integral multiple of the previous test factor threshold value; different evaluation results can be obtained through the test results of different threshold values of the test factor, and the evaluation results of the anti-interference capability of the power Beidou device terminal under different test factor conditions are compared; the evaluation result of the anti-interference capability of the power Beidou device terminal is obtained based on the test results of the test factor, the test results of different threshold values of the test factor in each test scene are obtained; the evaluation result of the anti-interference capability is calculated by multiplying the test factor result by the weight of the test factor, adding all the products, and obtaining the evaluation result; the test factor result is 1 or 0.

2. The method of claim 1, wherein the method further comprises: the test factor of the suppression type interference test includes a device stable working time factor, an interference signal waiting time factor, a reset alarm waiting time factor, an interference signal size evaluation factor and an interference azimuth angle evaluation factor; the test factor of the deception type interference test includes a device stable working time factor, an interference signal waiting time factor, a reset alarm waiting time factor and a deception signal step factor.

3. A system for evaluating the anti-jamming capability of Beidou power, characterized in that, The method comprises the steps of: a type determination unit is configured to determine the anti-interference test type of the power Beidou device terminal; a scene determination unit is configured to determine the test scene and the test factor according to the anti-interference test type; a test unit is configured to perform the anti-interference test on different threshold values of the test factor in the test scene of one anti-interference test type; an evaluation unit is configured to obtain the test results of different threshold values of the test factor in each test scene, and obtain the evaluation result of the anti-interference capability of the power Beidou device terminal based on the test results of the test factor.

4. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, The processor executes the computer program to realize the steps of the power Beidou anti-interference capability evaluation method in any one of claims 1 to 2.

5. A computer-readable storage medium storing a computer program, the computer program comprising instructions that, when executed by a computer, cause the computer to perform the method of any one of claims 1 to 4. The computer program, when executed by a processor, implements the steps of the method for evaluating the anti-jamming capability of power Beidou according to any one of claims 1 to 2.

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