Configuration information changing method, device, equipment, medium and program product

Abstract

The application relates to a configuration information changing method and device, equipment, medium and program product, and relates to the technical field of computers. The method can be used in the field of financial technology or other related fields. The method comprises the following steps: first, upgrading a test environment according to preset test configuration information to obtain an upgraded test environment, then obtaining reference bands of various test indexes of the test environment, and checking the various test indexes of the upgraded test environment through the reference bands, and if the various test indexes of the upgraded test environment are all checked, changing configuration information in a target production environment according to the test configuration information. The test environment is an environment that is completely identical to the basic configuration of the target production environment. The method can obtain accurate configuration information, thereby reducing the error rate of upgrading the target production environment.

Description

Technical Field

[0001] This application relates to the field of computer technology, and in particular to a method, apparatus, device, medium, and program product for changing configuration information. Background Technology

[0002] With the development of internet information technology, computer systems are becoming increasingly complex, and computer software needs to be updated frequently to upgrade the production environment of computer equipment.

[0003] In related technologies, upgrading a production environment typically involves editing and modifying the acquired configuration information within the production environment to complete the upgrade. In other words, each production upgrade is essentially a change to the configuration information; inaccurate configuration information can lead to unstable operation of the production environment.

[0004] However, the relevant technologies cannot obtain accurate configuration information, resulting in a high error rate during production environment upgrades. Summary of the Invention

[0005] Therefore, it is necessary to provide a configuration information change method, apparatus, equipment, medium, and program product to address the above-mentioned technical problems, thereby reducing the error rate of production environment upgrades by obtaining accurate configuration information.

[0006] Firstly, this application provides a method for changing configuration information, the method comprising:

[0007] The test environment is upgraded according to the preset test configuration information to obtain an upgraded test environment; the test environment is an environment with the same basic configuration as the target production environment.

[0008] Obtain the baseline bands for each test metric in the test environment, and verify and upgrade each test metric in the test environment according to the corresponding baseline bands.

[0009] If all test metrics of the upgraded test environment pass the verification, then the configuration information in the target production environment will be changed according to the test configuration information.

[0010] In one embodiment, the test environment is upgraded according to preset test configuration information to obtain an upgraded test environment, including:

[0011] In response to configuration information change commands in the target production environment, test configuration information is retrieved from the preset configuration information database based on the information identifier carried in the change command.

[0012] The test environment is upgraded by executing the test configuration information through the processor of the test environment.

[0013] In one of the embodiments, the method for obtaining the benchmark band of each test index of the test environment comprises:

[0014] obtaining a test data cluster center set of each test index of the test environment;

[0015] determining the benchmark band of each test index of the test environment according to the test data cluster center set.

[0016] In one of the embodiments, the method for obtaining the test data cluster center set of each test index of the test environment comprises:

[0017] obtaining test data of each test index of the test environment;

[0018] inputting each test data into a preset performance evaluation model to obtain the test data cluster center set.

[0019] In one of the embodiments, the method for determining the benchmark band of each test index of the test environment according to the test data cluster center set comprises:

[0020] for any test index, determining a maximum cluster center and a minimum cluster center from the test data cluster center set;

[0021] determining the maximum cluster center as an upper limit of the benchmark band of the test index and determining the minimum cluster center as a lower limit of the benchmark band of the test index;

[0022] obtaining the benchmark band of the test index according to the upper limit of the benchmark band of the test index and the lower limit of the benchmark band of the test index.

[0023] In one of the embodiments, the method for verifying and upgrading each test index of the test environment through the benchmark band comprises:

[0024] for any test index of the upgraded test environment, judging whether the value of the test index of the upgraded test environment is within the benchmark band of the corresponding test index;

[0025] if yes, determining that the test index of the upgraded test environment passes the verification.

[0026] In one of the embodiments, the method for changing the configuration information further comprises:

[0027] if the value of the test index of the upgraded test environment is not within the benchmark band of the corresponding test index, generating an artificial repair instruction; the artificial repair instruction is used to instruct to repair the test configuration information.

[0028] In one of the embodiments, the method for changing the configuration information according to the test configuration information in the target production environment comprises:

[0029] The test configuration information is migrated to the target production environment in full, and the change of the configuration information in the target production environment is completed by replacing original configuration information in the target production environment.

[0030] In a second aspect, the present application further provides a configuration information changing device, which comprises:

[0031] The upgrading module is configured to upgrade the test environment according to the preset test configuration information, and obtain an upgraded test environment; the test environment is an environment that is completely identical to the basic configuration of the target production environment;

[0032] The checking module is configured to obtain reference bands of each test index of the test environment, and check each test index of the upgraded test environment through the reference bands.

[0033] The changing module is configured to change the configuration information in the target production environment according to the test configuration information if each test index of the upgraded test environment is checked.

[0034] In a third aspect, the present application further provides a computer device, which comprises a memory and a processor, the memory stores a computer program, and the processor implements the steps of the method in any one of the embodiments of the first aspect when executing the computer program.

[0035] In a fourth aspect, the present application further provides a computer readable storage medium, which stores a computer program, and the computer program implements the steps of the method in any one of the embodiments of the first aspect when executed by a processor.

[0036] In a fifth aspect, the present application further provides a computer program product, which comprises a computer program, and the computer program implements the steps of the method in any one of the embodiments of the first aspect when executed by a processor.

[0037] The configuration information changing method, device, medium and program product change the configuration information in the target production environment according to the test configuration information, if the test indexes of the upgraded test environment all pass the verification, the configuration information in the target production environment is changed according to the test configuration information. The test environment is the same as the target production environment in the basic configuration. The test environment is upgraded according to the preset test configuration information, which is equivalent to the pre-evaluation of the configuration information change of the target production environment. After the test indexes of the test environment are obtained, the test indexes of the upgraded test environment are verified according to the test indexes, when the test indexes of the upgraded test environment all pass the verification, it is determined that the test environment is upgraded successfully, and the configuration information in the target production environment is changed according to the test configuration information. This means that during the process of changing the configuration information of the target production environment, the success or failure of the test environment upgrade is considered, that is, by verifying the test indexes of the upgraded test environment, the test configuration information that does not match the target production environment (that is, the test environment) is excluded, so as to ensure that the configuration information used to change the target production environment is accurate, and the error rate of the target production environment upgrade is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0038] Figure 1 The application environment diagram of the configuration information changing method in one embodiment;

[0039] Figure 2 The flowchart of the configuration information changing method in one embodiment;

[0040] Figure 3 The flowchart of the test environment upgrading step in one embodiment;

[0041] Figure 4 The flowchart of the change instruction generating step in one embodiment;

[0042] Figure 5 The flowchart of the test environment processor executing step in one embodiment;

[0043] Figure 6 The flowchart of the test index obtaining step in one embodiment;

[0044] Figure 7 The flowchart of the cluster center set obtaining step in one embodiment;

[0045] Figure 8A flowchart of the reference band acquisition step in another embodiment;

[0046] Figure 9 A flowchart of the test index verification step in an embodiment;

[0047] Figure 10 A flowchart of the configuration information change method in another embodiment;

[0048] Figure 11 A block diagram of the configuration information change device in an embodiment;

[0049] Figure 12 An internal structure diagram of the computer device in an embodiment. DETAILED DESCRIPTION

[0050] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not to limit the present application.

[0051] The configuration information change method provided by the embodiments of the present application can be applied in an application environment as shown in Figure 1 . The terminal 102 communicates with the computer device environment 104 through a network. The data storage system can store data that needs to be processed by the computer device environment 104. The data storage system can be integrated on the computer device environment 104, or placed on the cloud or other network servers. The terminal 102 can be, but is not limited to, various personal computers, notebook computers, smart phones, tablet computers, Internet of Things devices and portable wearable devices. The Internet of Things devices can be smart speakers, smart televisions, smart air conditioners, smart vehicle devices, etc. The portable wearable devices can be smart watches, smart bracelets, head-mounted devices, etc. The computer device environment 104 includes a production environment and a test environment that have exactly the same basic configurations, which can be implemented by two independent servers.

[0052] In an embodiment, as shown in Figure 2 , a configuration information change method is provided, which includes the following steps:

[0053] S202, upgrading the test environment according to the preset test configuration information to obtain an upgraded test environment; the test environment is an environment that has exactly the same basic configuration as the target production environment.

[0054] It should be noted that the target production environment refers to an environment that provides external services formally, and the test environment is obtained by cloning the target production base configuration, that is, the test environment and the target production environment in the embodiments of the present application both refer to the environment of a computer device, and the base configurations of the two, such as the model of the server, the version of the operating system, the database version, and the software contained in the base configuration, are completely the same.

[0055] The upgrade of the test environment is essentially a change of configuration information in the test environment, where the configuration information refers to a series of configuration files required for environment upgrade, such as version media and patch files. Since the target production environment refers to a real environment that provides external services formally, the requirement for configuration information is high. Generally, the target production environment is upgraded after the test environment is upgraded according to the preset test configuration information, so that the upgrade operation of the test environment according to the preset test configuration information is equivalent to the upgrade operation of the target production environment. Correspondingly, the effect of the upgraded test environment is the effect of the upgraded target production environment, so that the upgrade effect of the target production environment can be obtained by actually upgrading the test environment.

[0056] Exemplarily, the upgrade operation can be to replace the original configuration information with the preset test configuration information, or to execute the preset test configuration information through the server in the test environment.

[0057] S204, obtain the baseline of each test index of the test environment, and verify each test index of the upgraded test environment through the baseline.

[0058] Before upgrading the test environment, a series of test data of each test index in the test environment is obtained, and then the baseline of each test index is obtained based on the series of test data of each test index, where the baseline of each test index is the range of the series of test data corresponding to the test index. That is, for each test index, there is a baseline corresponding to the series of test data.

[0059] Optionally, the way to obtain the baseline of each test index of the test environment can be from the perspective of the test environment: first, a test tool matching the test environment is selected to test the test environment at one time, and a group of test data of each test index of the test environment is obtained in parallel; then, the test tool is used to test the test environment multiple times to obtain multiple groups of test data of each test index of the test environment; then, according to the category of the test index, a series of test data corresponding to each test index is extracted from the multiple groups of test data; finally, according to the series of test data corresponding to each test index, the baseline of each test index is obtained.

[0060] Optionally, the manner of obtaining the baseline of each test index of the test environment can be from the perspective of the test index: first, a plurality of test methods matching each test index are selected, and then the test environment is tested multiple times by using different test methods in turn. Then, the multiple test results obtained by each test method correspond to a series of test data of the test index. Then, the baseline of each test index can be obtained according to the series of test data corresponding to each test index.

[0061] After the test environment is upgraded, the upgraded test environment is obtained, and each test index of the upgraded test environment is obtained by testing the upgraded test environment. The test index of the upgraded test environment can be obtained by parallel testing of the test tool on the upgraded test environment, or can be obtained by testing the upgraded test environment in turn according to the test method corresponding to each test index.

[0062] After obtaining the baseline of each test index of the test environment and each test index of the upgraded test environment, since each test index corresponds to the baseline of each test index, each test index of the upgraded test environment can be verified according to the corresponding baseline. The verification process can be parallel verification or in turn verification, and the verification manner is not limited in the embodiments of the present application.

[0063] S206, if each test index of the upgraded test environment passes the verification, the configuration information in the target production environment is changed according to the test configuration information.

[0064] After verifying each test index of the upgraded test environment, the verification result of each test index is obtained. If each test index of the upgraded test environment passes the verification, it indicates that the upgrade of the test environment according to the preset test configuration information is successful, and then the upgrade of the target production environment according to the test configuration information is also successful. Therefore, the configuration information in the target production environment can be changed according to the test configuration information.

[0065] The change process can be that first, the test configuration information is compared with the original configuration information in the target production environment, and the different configuration information is taken as the distinguished configuration information. Then, the test configuration information corresponding to the distinguished configuration information is taken as the first distinguished configuration information, and the original configuration information in the target production environment corresponding to the distinguished configuration information is taken as the second distinguished configuration information. Finally, the first distinguished configuration information is replaced by the second distinguished configuration information, and the change of the configuration information in the target production environment is completed. The change process can also be that the test configuration information is replaced by the original configuration information in the target production environment, and the change of the configuration information in the target production environment is completed.

[0066] In the embodiment of the present application, first, the test environment is upgraded according to the preset test configuration information, the upgraded test environment is obtained, then the baseline of each test index of the test environment is acquired, and each test index of the upgraded test environment is verified through the corresponding baseline, if each test index of the upgraded test environment is verified, the configuration information in the target production environment is changed according to the test configuration information. Wherein, the test environment is an environment which is completely same as the basic configuration of the target production environment. Since the test environment is the same as the basic configuration of the target production environment, and the test environment is upgraded according to the preset test configuration information, it is equivalent to the pre-evaluation of the configuration information change of the target production environment. Moreover, after the baseline of each test index of the test environment is acquired, and each test index of the upgraded test environment is verified, when each test index of the upgraded test environment is verified, it is determined that the test environment is upgraded successfully, and the configuration information in the target production environment is changed according to the test configuration information. This means that during the process of changing the configuration information of the target production environment, the success or failure of the test environment upgrade is considered, that is, by verifying the test index of the upgraded test environment, the test configuration information which does not match the target production environment (that is, the test environment) is excluded, so as to ensure that the configuration information used to change the target production environment is accurate, and the error rate of the target production environment upgrade is reduced.

[0067] The test environment is upgraded, usually based on the test configuration information and the test environment combination or replacement operation, the upgraded test environment is acquired. Based on this, the acquisition steps of the upgraded test environment are described below through an embodiment.

[0068] In an embodiment, as shown in Figure 3 The test environment is upgraded according to the preset test configuration information, the upgraded test environment is obtained, including:

[0069] S302, in response to the change instruction of the configuration information in the target production environment, the test configuration information is acquired from the preset configuration information database according to the information identifier carried in the change instruction.

[0070] Wherein, the change instruction is generated based on the need of the target production environment to upgrade the environment, the change instruction carries the information identifier, which is used to indicate the position, number and other information of the test configuration information in the preset configuration information database. It should be noted that for large enterprise operation and maintenance of multiple applications and multiple environments, the preset configuration information database is usually independent, and has multiple software version information and management mechanism, so as to facilitate the registration and tracing of the full version of the test configuration information.

[0071] Exemplarily, the generation mode of the change instruction is as shown in Figure 4As shown, specifically comprising the following steps:

[0072] S402, release version upgrade instruction. Based on the change requirement of the target production environment, release version upgrade instruction.

[0073] S404, determine test configuration information, including patch type and version medium.

[0074] S406, combine patch type and version medium with version upgrade instruction.

[0075] S408, generate change instruction.

[0076] In response to the change instruction, the location of the test configuration information in the preset configuration information database is obtained according to the information identifier carried by the change instruction, and then the test configuration information is extracted from the preset configuration information database according to the location of the test configuration information.

[0077] S304, execute the test configuration information through the processor of the test environment, complete the upgrade of the test environment, and obtain the upgraded test environment.

[0078] The test environment in the embodiment of the application refers to the environment of a computer device, which includes processor, operating system and other infrastructure. After obtaining the test configuration information, the processor of the test environment executes the test configuration information, and the test environment corresponding to the test configuration information, i.e. the upgraded test environment, is obtained.

[0079] Exemplarily, the process of executing the test configuration information by the processor of the test environment is as shown in the following figure: Figure 5 As shown, comprising the following steps:

[0080] S502, obtain the preset test configuration information according to the change instruction.

[0081] S504, pull the test configuration information into the processor of the test environment, and the server of the test environment automatically executes the test configuration information.

[0082] S506, register the content of the test configuration information and the execution record, and complete the upgrade of the test environment.

[0083] In the embodiment of the application, the test configuration information for upgrading the test environment is generated based on the change instruction, which means that the test environment can correspondingly upgrade every change requirement, ensuring that the upgrade of the test environment can cover every change requirement, and the change instruction carries an information identifier, which facilitates quick acquisition of the test configuration information. Then, the test configuration information is executed by the processor of the test environment, which can directly complete the upgrade of the test environment, saving the time of upgrading the test environment.

[0084] The change of the configuration information in the target production environment is usually performed on the basis of the verification result of each test index of the upgraded test environment, and the objects of the verification process are respectively each test index of the upgraded test environment and the benchmark band of each test index of the test environment. The test environment includes a plurality of test indexes. Therefore, the acquisition step of the benchmark band of each test index of the test environment is described below through an embodiment.

[0085] In one embodiment, as shown in Figure 6 the benchmark band of each test index of the test environment is acquired, including:

[0086] S602, acquiring a test data clustering center set of each test index of the test environment.

[0087] The test environment includes a plurality of test indexes. For each test index, a group of test data of the test index can be acquired through multiple tests, and then a plurality of clustering centers are acquired according to the group of test data of the test index, and the plurality of clustering centers are used as the test data clustering center set. Correspondingly, there are multiple groups of test data for the plurality of test indexes, and each test index corresponds to a test data clustering center set.

[0088] Optionally, for any test index, the median, mode and average value in the group of test data corresponding to the test index can be used as the test data clustering center set according to a data statistical rule.

[0089] Optionally, for any test index, the group of test data corresponding to the test index can be used as input data and input into a preset machine learning model, and the output result of the machine learning model is used as the test data clustering center set of the corresponding test index.

[0090] S604, determining the benchmark band of each test index of the test environment according to each test data clustering center set.

[0091] Each test data clustering center set includes a plurality of test data clustering centers. The value of the plurality of test data clustering centers is sorted to obtain a sorting result, and the test data range of each test index is determined according to the sorting result, such as determining the test data range of each test index according to the maximum value and the minimum value in the sorting result, determining the test data range of each test index according to the maximum value and the median in the sorting result, etc., and the test data range of each test index is used as the benchmark band of each test index.

[0092] In the embodiment of the application, the test data clustering center set of each test index covers a plurality of test data of each test index. The benchmark band acquired according to the test data clustering center set can objectively and truly reflect the test data range of each test index.

[0093] The above embodiments describe the acquisition of the reference band. The reference band of each test index is determined according to the test data cluster center set. In the actual acquisition process of the test data cluster center set, the test data is necessarily used to ensure the reliability of the test data cluster center set. Based on this, the acquisition steps of the test data cluster center set are described below through an embodiment.

[0094] In one embodiment, as shown in FIG. 7, the test data cluster center set of each test index of the test environment is acquired, including: Figure 7

[0095] S702, acquiring test data of each test index of the test environment.

[0096] The test environment includes multiple test indexes, such as test environment central processing unit (CPU) execution time, uptime, thread number, average response time, and peak response time. Each test index corresponds to a matching test algorithm, such as the CPU execution time corresponding to the clock frequency method, the uptime corresponding to the instruction execution speed method, and the like. After determining the test index and the corresponding test algorithm, the test algorithm is used to test the test environment multiple times to acquire multiple test data of each test index.

[0097] For example, the clock frequency method is used to test the test environment m times to acquire m test data of the CPU execution time of the test environment, and the instruction execution speed method is used to test the test environment n times to acquire n test data of the uptime of the test environment.

[0098] S704, inputting each test data to a preset performance evaluation model to obtain each test data cluster center set.

[0099] Each test index corresponds to a preset performance evaluation model. For any test index, the corresponding test data is input to the preset performance evaluation model to obtain the output result of the performance evaluation model, and the output result of the performance evaluation model is used as the test data cluster center of the test index. Obviously, there are multiple preset performance evaluation models for multiple test indexes. Through the output results of the preset performance evaluation models, the test data cluster center set can be determined. The category of the multiple preset performance evaluation models is not limited in the embodiments of the present application.

[0100] ​Exemplarily, the preset performance evaluation model can be a k-means clustering algorithm model. According to the k-means clustering algorithm model, the plurality of test data are subjected to clustering analysis: first, the plurality of test data are pre-divided into K groups, and K test data are randomly selected as initial clustering centers; then, the distance between each test data and each initial clustering center is calculated, each test data is assigned to the initial clustering center closest to the test data, the clustering center and the test data assigned to the clustering center are taken as a cluster, and each time a test data is assigned, the corresponding clustering center is updated; finally, the clustering center before and after each update is analyzed until the analysis result meets a preset termination condition, and then the update is stopped, and the clustering center generated by the k-means clustering algorithm model, i.e., the test data clustering center, is obtained. The termination condition can be that no (or a preset number of) test data is reassigned to a different clustering center, or that no (or a preset number of) clustering center is changed, or that the error sum of squares is locally minimized.

[0101] In the embodiments of the present application, the test data of each test index can be obtained by using various test algorithms to ensure the reliability of the test data, and then the test data clustering center set can be reliably obtained.

[0102] The foregoing embodiments describe the acquisition of the test data clustering center set. To further represent the test data range of the test index, the test data clustering centers in the test data clustering center set need to be processed to obtain the reference band of each test index. Based on this, the determination steps of the reference band are described below through an embodiment.

[0103] In one embodiment, as shown in Figure 8 According to the test data clustering center set, the reference band of each test index of the test environment is determined, including:

[0104] S802, for any test index, the maximum clustering center and the minimum clustering center are determined from the test data clustering center set.

[0105] For any test index, the test data clustering center set includes a plurality of test data clustering centers. The test data clustering center values are sorted, the maximum test data clustering center value is taken as the maximum clustering center, and the minimum test data clustering center value is taken as the minimum clustering center.

[0106] S804, the maximum clustering center is determined as the upper limit of the reference band of the test index, and the minimum clustering center is determined as the lower limit of the reference band of the test index.

[0107] The benchmark band of each test index represents the test data range of the corresponding test index in the normal state. Obviously, the benchmark band includes the upper limit and the lower limit. After obtaining the maximum clustering center and the minimum clustering center of the test index, the maximum clustering center is determined as the upper limit of the benchmark band of the test index, and the minimum clustering center is determined as the lower limit of the benchmark band of the test index.

[0108] S806, according to the upper limit of the benchmark band of the test index and the lower limit of the benchmark band of the test index, obtaining the benchmark band of the test index.

[0109] According to the upper limit of the benchmark band of the test index and the lower limit of the benchmark band of the test index, the test data range of the test index is determined, which is the benchmark band of the test index. Obviously, the benchmark band of the test index includes all the test data clustering centers.

[0110] In the embodiment of the application, the benchmark band of the test index is determined according to the maximum clustering center and the minimum clustering center of the test data clustering center set, which is equivalent to considering all the test data clustering centers when obtaining the benchmark band. Therefore, the benchmark band obtained is more comprehensive and objective, so as to truly reflect the performance parameters of each test index in the normal state.

[0111] The foregoing embodiment describes the obtaining steps of each benchmark band. The benchmark band reflects the normal test data range of each performance index of the test environment, and therefore each benchmark band can be used as a true value standard to verify other versions of the test environment to determine whether the other versions of the test environment are normal. Based on this, the specific steps of verifying each test index of the upgraded test environment through the benchmark band are described through an embodiment.

[0112] In one embodiment, as shown in Figure 9 , each test index of the upgraded test environment is verified through the corresponding benchmark band, including:

[0113] S902, for any test index of the upgraded test environment, determining whether the value of the test index of the upgraded test environment is in the benchmark band of the corresponding test index.

[0114] After obtaining the test index of any upgraded test environment and the benchmark band corresponding to the test index, it is determined whether the value of the test index is in the benchmark band of the corresponding test index. The value of the test index can be one or more.

[0115] Optionally, when a single test is performed on the upgraded test environment, that is, the test index of any upgraded test environment is a numerical value, the value of the test index is compared with the benchmark band of the corresponding test index to determine whether the value of the test index is in the benchmark band of the corresponding test index.

[0116] Optionally, when multiple tests are performed on the upgraded test environment, i.e., the test index of any upgraded test environment is multiple values, the values of the multiple test indexes are compared with the benchmark band of the corresponding test index to determine whether the value of the test index is within the benchmark band of the corresponding test index.

[0117] S904, if yes, it is determined that the test index of the upgraded test environment passes the verification.

[0118] When the value of the test index is within the benchmark band of the test index, it indicates that the corresponding test index of the upgraded test environment is still in a normal working state compared with the test environment before the upgrade, i.e., the test environment upgrade is successful, and the test index of the upgraded test environment passes the verification.

[0119] In the embodiments of the present application, on the basis of obtaining the benchmark band of each test index, each test index in the upgraded test environment is verified by the benchmark band, the corresponding verification process logic is clear and easy to implement, and the verification result obtained in this way is also more accurate.

[0120] The foregoing embodiments describe the verification process of each test index in the upgraded test environment. When the value of the test index is within the corresponding benchmark band, it is determined that the test index passes the verification, otherwise, the test index does not pass the verification. When the test index does not pass the verification, the test configuration information in the upgraded test environment needs to be repaired to ensure that the test configuration information can be used to upgrade the test environment. Based on this, the following embodiment describes the configuration information change method in the case where the test index does not pass the verification.

[0121] In one embodiment, the configuration information change method further comprises:

[0122] If the value of the test index of the upgraded test environment is not within the benchmark band of the corresponding test index, an artificial repair instruction is generated; the artificial repair instruction is used to instruct to repair the test configuration information.

[0123] If the value of the test index of the upgraded test environment is not within the benchmark band of the corresponding test index, it means that the test index does not pass the verification, i.e., there is a vulnerability in the test configuration information in the upgraded test environment, at which time an artificial repair instruction is generated to instruct the staff or repair code to repair the test configuration information.

[0124] It should be noted that the multiple test indexes of the upgraded test environment are all verified, and in the verification process, as long as the value of one test index is not within the benchmark band of the corresponding test index, an artificial repair instruction is generated.

[0125] In the embodiment, in the process of configuration information change, the value of the test index of the upgraded test environment is not in the corresponding benchmark band, which means that the problem of inaccurate test configuration information in the upgraded test environment is considered, and the artificial repair instruction is generated to repair the test configuration information, so that the matching degree of the test configuration information and the upgraded test environment is improved.

[0126] When the test index in the upgraded test environment is not in the corresponding benchmark band, the test configuration information needs to be repaired. When the test index in the upgraded test environment is in the corresponding benchmark band, it indicates that the test configuration information used for upgrading the test environment is accurate, and the configuration information in the target production environment can be changed according to the test configuration information. Based on this, the following embodiment is used to illustrate the change steps of the configuration information in the target production environment when the test index of the upgraded test environment is verified.

[0127] In one embodiment, the configuration information in the target production environment is changed according to the test configuration information, comprising:

[0128] The test configuration information is fully migrated to the target production environment, and the change of the configuration information in the target production environment is completed by replacing the original configuration information in the target production environment.

[0129] The basic configuration of the target production environment and the test environment is completely the same, so the test environment is upgraded according to the test configuration information to obtain the upgraded test environment, and each test index of the upgraded test environment is verified. It means that the test configuration information can make the test environment upgrade successfully, so the test configuration information can also make the target production environment upgrade successfully. By fully migrating the test configuration information to the target production environment, the operation of upgrading the test environment by the test configuration information is fully migrated to the target production environment, and the original configuration information in the target production environment is replaced by the test configuration information, that is, the change of the configuration information in the target production environment is completed.

[0130] It should be noted that after the change of the configuration information in the target production environment is completed, in order to verify whether the target production environment is upgraded successfully, each test index of the target production environment can be re-verified according to the benchmark band of each test index in the upgraded test environment. If the value of the test index of the target production environment is not in the corresponding benchmark band of the test index, the artificial repair instruction is also generated to repair the test configuration information; if the value of the test index of the target production environment is in the corresponding benchmark band of the test index, it indicates that the target production environment is upgraded successfully. It should be noted that the verification process of the target production environment needs to be performed once.

[0131] In the embodiments of the present application, the test configuration information that passes the verification is used to replace the original configuration information in the target production environment, so as to complete the change of the configuration information in the target production environment. Since the test configuration information is obtained based on the test index of the upgrade test environment and passes the verification, the accuracy of the test configuration information can be ensured.

[0132] In one embodiment, as shown in Figure 10 a configuration information change method is provided, and the method comprises the following steps:

[0133] S1001, test the test index of the test environment, and obtain the benchmark band corresponding to each test index by using a clustering algorithm model. The test environment is an environment that is completely identical to the basic configuration of the target production environment.

[0134] S1002, in response to the change instruction of the configuration information, implement the preset test configuration information in the test environment, and obtain the upgrade test environment.

[0135] S1003, obtain each test index in the upgrade test environment.

[0136] S1004, compare each test index in S1003 according to the benchmark band of each test index in S1001.

[0137] S1005, determine whether each test index is within the benchmark band of the corresponding test index.

[0138] S1006, if the determination result of S1005 is no, generate a manual repair instruction, and the repair instruction is used to instruct to repair the test configuration information.

[0139] S1007, if the determination result of S1005 is yes, change the configuration information in the target production environment according to the test configuration information.

[0140] S1008, after the change of the configuration information in the target production environment, each test index in the target production environment can be checked again according to the benchmark band of each test index in S1001, and the operations of S1005-S1006 are executed.

[0141] In the embodiment of the present application, the test environment and the target production environment have the same basic configuration, and the upgrade is performed in the test environment according to the preset test configuration information, which is equivalent to the pre-evaluation of the configuration information change of the target production environment. Moreover, after the baseline of each test index of the test environment and the baseline of each test index of the upgraded test environment are obtained, the test index corresponding to the upgraded test environment is verified according to the baseline of each test index, and when each test index of the upgraded test environment is verified to be successful, it is determined that the upgrade of the test environment is successful, and the configuration information of the target production environment is changed according to the test configuration information. This means that during the process of changing the configuration information of the target production environment, the success or failure of the test environment upgrade is considered, and the test index of the upgraded test environment is verified, which excludes the test configuration information that does not match the target production environment (that is, the test environment), so as to ensure that the configuration information used to change the target production environment is accurate, thereby reducing the error rate of the target production environment upgrade.

[0142] In one embodiment, a configuration information change method is provided, and the method comprises:

[0143] 1. In response to a change instruction of configuration information in a target production environment, test configuration information is obtained from a preset configuration information database according to an information identifier carried in the change instruction.

[0144] 2. The test configuration information is executed by a processor of a test environment to complete the upgrade of the test environment, and an upgraded test environment is obtained; the test environment is an environment having the same basic configuration as the target production environment.

[0145] 3. Test data of each test index of the test environment is obtained.

[0146] 4. Each test data is input into a preset performance evaluation model to obtain a test data cluster center set.

[0147] 5. For any test index, the maximum cluster center and the minimum cluster center are determined from the test data cluster center set.

[0148] 6. The maximum cluster center is determined as the upper limit of the baseline of the test index, and the minimum cluster center is determined as the lower limit of the baseline of the test index.

[0149] 7. The baseline of the test index is obtained according to the upper limit of the baseline of the test index and the lower limit of the baseline of the test index.

[0150] 8. The baseline of each test index of the upgraded test environment is obtained according to steps 5-7.

[0151] 9. For each test index of the upgraded test environment, determine whether the value of the test index of the upgraded test environment is within the benchmark band of the corresponding test index.

[0152] 10. If yes, determine that the test index of the upgraded test environment passes the verification, and when all the test indexes of the upgraded test environment pass the verification, migrate the test configuration information in full to the target production environment, and complete the change of the configuration information in the target production environment by replacing the original configuration information in the target production environment.

[0153] 11. If the value of the test index of the upgraded test environment is not within the benchmark band of the corresponding test index, generate a manual repair instruction, which is used to instruct to repair the test configuration information.

[0154] In the embodiments of the present application, first, the test environment is upgraded according to the preset test configuration information to obtain an upgraded test environment, then the benchmark bands of the test indexes of the test environment are obtained, and the test indexes of the upgraded test environment are verified through the benchmark bands, if all the test indexes of the upgraded test environment pass the verification, the configuration information in the target production environment is changed according to the test configuration information. The test environment is an environment with the same basic configuration as the target production environment. Since the test environment and the target production environment have the same basic configuration, the upgrade of the test environment according to the preset test configuration information is equivalent to the pre-evaluation of the change of the configuration information of the target production environment. After the benchmark bands of the test indexes of the test environment are obtained and the test indexes of the upgraded test environment are verified, when all the test indexes of the upgraded test environment pass the verification, it is determined that the upgrade of the test environment is successful, and the configuration information in the target production environment is changed according to the test configuration information. This means that during the change of the configuration information of the target production environment, the success or failure of the upgrade of the test environment is considered, and the test indexes of the upgraded test environment are verified, which excludes the test configuration information that does not match the target production environment (i.e. the test environment), so as to ensure that the configuration information used to change the target production environment is accurate, thereby reducing the error rate of the upgrade of the target production environment.

[0155] It should be understood that, although each step in the flowchart involved in the above embodiments is shown in sequence according to the arrow, these steps are not necessarily executed in the order indicated by the arrow. Unless otherwise specified herein, the execution of these steps is not strictly limited in sequence, and these steps can be executed in other orders. Moreover, at least part of the steps in the flowchart involved in the above embodiments can include multiple steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily sequential, but can be alternately executed with at least part of other steps or steps or stages in other steps.

[0156] Based on the same inventive concept, the embodiments of the present application also provide a configuration information changing device for implementing the above-mentioned configuration information changing method. The implementation scheme for solving the problem provided by the device is similar to the implementation scheme described in the above method, so the specific limitations in one or more configuration information changing device embodiments provided below can refer to the limitations of the configuration information changing method in the above text, which will not be repeated here.

[0157] In one embodiment, as shown in Figure 11 A configuration information changing device 1100 is provided, which includes an upgrading module 1120, a checking module 1140, and a changing module 1160, wherein:

[0158] The upgrading module 1120 is configured to upgrade the test environment according to the preset test configuration information, to obtain an upgraded test environment; the test environment is an environment that is completely identical to the basic configuration of the target production environment;

[0159] The checking module 1140 is configured to obtain a reference band of each test index of the test environment, and check each test index of the upgraded test environment through the corresponding reference band;

[0160] The changing module 1160 is configured to, if each test index of the upgraded test environment passes the check, change the configuration information in the target production environment according to the test configuration information.

[0161] In one embodiment, the upgrading module 1120 includes an information obtaining unit and an environment upgrading unit, wherein:

[0162] The information obtaining unit is configured to, in response to a changing instruction of the configuration information in the target production environment, obtain the test configuration information from the preset configuration information database according to an information identifier carried in the changing instruction;

[0163] The environment upgrading unit is configured to execute the test configuration information through a processor of the test environment, to complete the upgrading of the test environment, and to obtain the upgraded test environment.

[0164] In one embodiment, the checking module 1140 comprises a set obtaining unit and a reference band determining unit, wherein:

[0165] The set obtaining unit is configured to obtain a set of test data clustering centers of each test index of the test environment.

[0166] The reference band determining unit is configured to determine a reference band of each test index of the test environment according to the set of test data clustering centers.

[0167] In one embodiment, the set obtaining unit comprises a data obtaining subunit and a data processing subunit, wherein:

[0168] The data obtaining subunit is configured to obtain test data of each test index of the test environment.

[0169] The data processing subunit is configured to input each test data into a preset performance evaluation model to obtain the set of test data clustering centers.

[0170] In one embodiment, the reference band determining unit comprises a center determining subunit, a range determining subunit and a reference band obtaining subunit, wherein:

[0171] The center determining subunit is configured to determine a maximum clustering center and a minimum clustering center from the set of test data clustering centers for any test index.

[0172] The range determining subunit is configured to determine the maximum clustering center as an upper limit of the reference band of the test index and the minimum clustering center as a lower limit of the reference band of the test index.

[0173] The reference band obtaining subunit is configured to obtain the reference band of the test index according to the upper limit of the reference band of the test index and the lower limit of the reference band of the test index.

[0174] In one embodiment, the checking module 1140 further comprises an index judging unit and an index determining unit, wherein:

[0175] The index judging unit is configured to judge whether the value of the test index of the upgraded test environment is within the reference band of the corresponding test index for any test index of the upgraded test environment.

[0176] The index determining unit is configured to determine that the test index of the upgraded test environment passes the check if yes.

[0177] In one embodiment, the configuration information changing device 1100 comprises a repairing module, which is configured to generate a manual repairing instruction if the value of the test index of the upgraded test environment is not within the reference band of the corresponding test index, and the manual repairing instruction is configured to instruct to repair the test configuration information.

[0178] In one embodiment, the changing module 1160 includes a replacing unit configured to change the configuration information in the target production environment by replacing original configuration information in the target production environment.

[0179] Each module in the configuration information changing apparatus can be implemented by software, hardware, or a combination thereof. Each module can be embedded in or independent of a processor in a computer device in hardware form, or stored in a memory in a computer device in software form, so as to be invoked and executed by a processor to perform operations corresponding to each module.

[0180] In one embodiment, a computer device is provided, which can be a terminal. An internal structure diagram of the computer device can be as shown in Figure 12 The computer device includes a processor, a memory, an input / output interface, a communication interface, a display unit, and an input device. The processor, the memory, and the input / output interface are connected through a system bus. The communication interface, the display unit, and the input device are connected to the system bus through the input / output interface. The processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for running the operating system and the computer program in the non-volatile storage medium. The input / output interface of the computer device is configured to exchange information between the processor and external devices. The communication interface of the computer device is configured to perform wired or wireless communication with external terminals. The wireless communication can be achieved through WIFI, mobile cellular network, NFC (near field communication), or other technologies. The computer program is executed by the processor to implement a configuration information changing method. The display unit of the computer device is configured to form a visually visible picture, which can be a display screen, a projection device, or a virtual reality imaging device. The display screen can be a liquid crystal display screen or an electronic ink display screen. The input device of the computer device can be a touch layer overlaid on the display screen, or a key, trackball, or touchpad arranged on the shell of the computer device. The input device can also be an external keyboard, touchpad, or mouse, etc.

[0181] Those skilled in the art can understand that Figure 12 The structure shown in the above

[0182] In one embodiment, a computer device is provided, comprising a memory and a processor, the memory storing a computer program, and the processor implementing the technical solutions of the configuration information changing method provided in any of the above embodiments when executing the computer program.

[0183] The computer device provided in the above embodiments has similar implementation principles and technical effects to the above method embodiments, and thus detailed description is omitted here.

[0184] In one embodiment, a computer readable storage medium is provided, storing a computer program, and the computer program implementing the technical solutions of the configuration information changing method provided in any of the above embodiments when executed by a processor.

[0185] The computer readable storage medium provided in the above embodiments has similar implementation principles and technical effects to the above method embodiments, and thus detailed description is omitted here.

[0186] In one embodiment, a computer program product is provided, comprising a computer program, and the computer program implementing the technical solutions of the configuration information changing method provided in any of the above embodiments when executed by a processor.

[0187] The computer program product provided in the above embodiments has similar implementation principles and technical effects to the above method embodiments, and thus detailed description is omitted here.

[0188] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. The non-volatile memory can include read-only memory (Read-Only Memory, ROM), magnetic tape, floppy disk, flash memory, optical storage, high-density embedded non-volatile memory, resistive memory (ReRAM), magnetoresistive random access memory (Magnetoresistive Random Access Memory, MRAM), ferroelectric memory (Ferroelectric Random Access Memory, FRAM), phase change memory (Phase Change Memory, PCM), graphene memory, etc. The volatile memory can include random access memory (Random Access Memory, RAM) or external cache memory, etc. As an illustration but not limitation, the RAM can be in various forms, such as static random access memory (Static Random Access Memory, SRAM) or dynamic random access memory (Dynamic Random Access Memory, DRAM), etc. The database involved in the embodiments provided in the present application can include at least one of a relational database and a non-relational database. The non-relational database can include a distributed database based on a block chain, etc., without being limited thereto. The processor involved in the embodiments provided in the present application can be a general-purpose processor, a central processing unit, a graphics processing unit, a digital signal processor, a programmable logic device, a data processing logic device based on quantum computing, etc., without being limited thereto.

[0189] Any combination of the technical features of the above embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combination of the technical features does not exist contradictory, it should be considered as the scope of the present application.

[0190] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent of the present application. It should be noted that for those skilled in the art, without departing from the concept of the present application, some modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the appended claims.

Claims

1. A configuration information change method characterized by comprising: The method comprises: upgrading a test environment according to preset test configuration information to obtain an upgraded test environment; the test environment is an environment that is completely identical to the basic configuration of a target production environment; obtaining a benchmark of each test index of the test environment, and verifying each test index of the upgraded test environment through the benchmark; if each test index of the upgraded test environment passes the verification, changing configuration information in the target production environment according to the test configuration information; the method of obtaining the benchmark of each test index of the test environment comprises: obtaining a test data clustering center set of each test index of the test environment; determining the benchmark of each test index of the test environment according to each test data clustering center set.

2. The method of claim 1, wherein, The method of upgrading the test environment according to the preset test configuration information to obtain the upgraded test environment comprises: in response to a change instruction of the configuration information in the target production environment, obtaining the test configuration information from a preset configuration information database according to an information identifier carried in the change instruction; executing the test configuration information through a processor of the test environment to complete the upgrading of the test environment, and obtaining the upgraded test environment.

3. The method of claim 1, wherein, The method of obtaining the test data clustering center set of each test index of the test environment comprises: obtaining test data of each test index of the test environment; inputting each test data into a preset performance evaluation model to obtain each test data clustering center set.

4. The method of claim 1, wherein, The method of determining the benchmark of each test index of the test environment according to each test data clustering center set comprises: for any test index, determining a maximum clustering center and a minimum clustering center from the test data clustering center set; determining the maximum clustering center as an upper limit of the benchmark of the test index and determining the minimum clustering center as a lower limit of the benchmark of the test index; obtaining the benchmark of the test index according to the upper limit of the benchmark of the test index and the lower limit of the benchmark of the test index.

5. The method according to claim 1 or 2, characterized in that, The method of verifying each test index of the upgraded test environment through the benchmark comprises: for any test index of the upgraded test environment, judging whether the value of the test index of the upgraded test environment is within the benchmark of the corresponding test index; if yes, determining that the test index of the upgraded test environment passes the verification.

6. The method of claim 5, wherein, The method further comprises: if the value of the test index of the upgraded test environment is not within the benchmark of the corresponding test index, generating an artificial repair instruction; the artificial repair instruction is used to instruct to repair the test configuration information.

7. The method according to claim 1 or 2, characterized in that, The method of changing the configuration information in the target production environment according to the test configuration information comprises: migrating the test configuration information to the target production environment in full, and completing the change of the configuration information in the target production environment by replacing original configuration information in the target production environment.

8. A configuration information changing apparatus characterized by comprising: The device comprises: An upgrading module is configured to upgrade the test environment according to preset test configuration information, and obtain an upgraded test environment; the test environment is an environment identical to the basic configuration of the target production environment; A verification module is configured to obtain reference bands of each test index of the test environment, and verify each test index of the upgraded test environment through the reference bands; A changing module is configured to change the configuration information in the target production environment according to the test configuration information if each test index of the upgraded test environment is verified to be correct; The verification module comprises a set obtaining unit and a reference band determining unit; The set obtaining unit is configured to obtain a test data clustering center set of each test index of the test environment; The reference band determining unit is configured to determine the reference bands of each test index of the test environment according to each test data clustering center set. 9.A computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the computer device is configured to perform the method according to any one of claims 1-8 when the computer program is executed by the processor. The processor executes the computer program to implement the steps of the method in any one of claims 1 to 7.

10. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the method in any one of claims 1 to 7.

11. A computer program product comprising a computer program, characterized in that, The computer program is executed by the processor to implement the steps of the method in any one of claims 1 to 7.

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