Infrared micro scanning mirror head displacement test system and method
By designing an infrared micro-scanning lens displacement testing system, and using a differential blackbody and a target to simulate an infrared target source, high-precision testing of the micro-displacement changes of the infrared micro-scanning lens was achieved. This solves the problem that existing technologies cannot directly test the displacement and provides data support for super-resolution reconstructed images.
Patent Information
- Application Number
- CN202211578623.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-07
- Publication Date
- 2026-03-03
- Estimated Expiration
- 2042-12-07
AI Technical Summary
Existing infrared micro-scanning lenses cannot directly test the micro-displacement changes in the image before and after micro-scanning; they can only be calculated indirectly, and cannot provide raw data support for high-quality super-resolution reconstructed images.
Design an infrared micro-scanning lens displacement testing system, including a target generation unit, a lens under test, an infrared sensor, and a display and control testing unit. Through optical axis alignment and multi-dimensional adjustment, the system uses a differential blackbody and a target to simulate an infrared target source, collects lens data, and determines the amount of micro-displacement change.
This technology enables high-precision testing of the micro-displacement changes of infrared micro-scanning lenses, providing raw data support for super-resolution image reconstruction and improving system performance.
Smart Images

Figure CN116183173B_ABST
Abstract
Description
Technical Field
[0001] This application relates to the field of optical technology, and in particular to an infrared micro-scanning lens displacement testing system and method. Background Technology
[0002] Infrared imaging boasts advantages such as long operating range, strong acquisition capability, good concealment performance, and all-weather operation, leading to the widespread application of high-resolution thermal imagers in various fields. However, pre-sampling spectral ambiguity (undersampling noise) is a common and unavoidable problem in infrared focal plane imaging systems. Microscanning, as an effective technique to suppress undersampling spectral ambiguity, can significantly improve the resolution of infrared focal plane imaging, enhance the quality of infrared imaging systems, and greatly improve system performance. Currently, microscanning technology can be used to acquire multiple frames of images for super-resolution reconstruction. This method is entirely based on existing detectors, has low cost, and produces good imaging results and detail. It is currently widely used in the field of infrared imaging both domestically and internationally.
[0003] Multi-frame super-resolution reconstruction requires the acquisition of multiple images with certain pixel offsets using optical and mechanical devices, followed by fusion of these images. Essentially, it's based on the sampling theorem, which states that when the sampling rate of a signal exceeds twice its highest frequency, the signal can be perfectly recovered from its samples. The significance of acquiring multiple frames lies in increasing the sampling rate. The optical micro-displacement mechanism of an infrared micro-scanning imaging system can achieve micro-displacement relative to the focal plane detector of the imaging device. Existing optical micro-scanning methods can be mainly categorized into mechanical translation, plate rotation, and mirror tilting methods.
[0004] Currently, for infrared micro-scanning lenses, the image quality of infrared lenses can only be tested and evaluated by testing the lens modulation transfer function (MTF) before and after micro-scanning. It is not possible to directly test the micro-displacement change of the image before and after micro-scanning. This displacement can only be indirectly calculated through the design model of the micro-scanning platform and image displacement. Summary of the Invention
[0005] This application provides an infrared micro-scanning lens displacement testing system and method, which provides a means of detecting the process of a micro-scanning system and provides raw data support and testing means for the system to acquire high-quality super-resolution reconstructed images.
[0006] This application provides an infrared micro-scanning lens displacement testing method, which is implemented based on a testing system. The testing system includes a target generation unit, a lens under test, an infrared sensor, and a display and control testing unit connected in sequence. The lens under test and the infrared sensor are respectively set on corresponding adjustment mechanisms to achieve optical axis alignment.
[0007] The target generation unit includes a differential blackbody and a target, used to simulate infrared target sources of different energy levels generating infrared targets of the required spatial size via the target;
[0008] The infrared sensor is used to collect data from the lens under test and transmit it to the display and control test unit;
[0009] The display and control test unit is used to determine the amount of micro-displacement change in the image plane of the lens based on the acquired data;
[0010] The infrared micro-scanning lens displacement testing method includes:
[0011] Auto-align the lens under test;
[0012] The infrared sensor is focused, and the digital video image of the infrared sensor with the focused plane adjusted is connected to the display and control test unit.
[0013] The target is selected based on the target generation unit, and the target frequency is selected according to the set multiple of the sampling frequency.
[0014] Adjust the differential blackbody temperature of the target generation unit to the unsaturated imaging range of the infrared sensor, and test the first center position of the target image formed by the lens under test;
[0015] Adjust the lens under test to the position after micro-scanning, and test the second center position of the image of the target by the lens under test again;
[0016] The micro-displacement change of the image plane of the lens under test before and after micro-scan is determined based on the first center position and the second center position.
[0017] Optionally, focusing the infrared sensor includes:
[0018] Install the infrared sensor onto the guide rail;
[0019] Imaging is performed based on the infrared sensor, and the radial distance between the infrared sensor and the lens under test is adjusted in the radial direction of the guide rail to ensure that the imaging effect meets the clarity requirements.
[0020] Optionally, focusing the infrared sensor also includes:
[0021] Based on the lens under test, a target for focusing is selected using the target generation unit, wherein the selected target satisfies f N ~0.3f N , f N This represents the characteristic frequency of the lens under test after imaging by the infrared sensor, f is the focal length of the lens under test, and a is the pixel size of the infrared detector.
[0022] Optionally, the target frequency can be selected according to a set multiple of the sampling frequency, including:
[0023] The selected target frequency range meets the requirement of 0.02 to 0.05 times the sampling frequency f. s , f is the focal length of the lens being tested, and a is the pixel size of the infrared detector.
[0024] Optionally, testing the first center position of the image of the target by the lens under test includes:
[0025] Digital video signals are acquired using infrared sensors;
[0026] The digital video signal is stored as an image sequence in a specified format;
[0027] Based on the stored image sequence, the test obtains the first center position of the image of the target by the lens under test.
[0028] This application also proposes an infrared micro-scanning lens displacement testing system, including a target generation unit, a lens under test, an infrared sensor, and a display and control testing unit connected in sequence, wherein the lens under test and the infrared sensor are respectively mounted on corresponding adjustment mechanisms to achieve optical axis alignment.
[0029] The target generation unit includes a differential blackbody and a target, used to simulate infrared target sources of different energy levels generating infrared targets of the required spatial size via the target;
[0030] The infrared sensor is used to collect data from the lens under test and transmit it to the display and control test unit;
[0031] The display and control test unit is used to determine the amount of micro-displacement change in the image plane of the lens based on the acquired data;
[0032] The displacement test of the infrared micro-scanning lens is specifically implemented in the following manner:
[0033] Auto-align the lens under test;
[0034] The infrared sensor is focused, and the digital video image of the infrared sensor with the focused plane adjusted is connected to the display and control test unit.
[0035] The target is selected based on the target generation unit, and the target frequency is selected according to the set multiple of the sampling frequency.
[0036] Adjust the differential blackbody temperature of the target generation unit to the unsaturated imaging range of the infrared sensor, and test the first center position of the target image formed by the lens under test;
[0037] Adjust the lens under test to the position after micro-scanning, and test the second center position of the image of the target by the lens under test again;
[0038] The micro-displacement change of the image plane of the lens under test before and after micro-scan is determined based on the first center position and the second center position.
[0039] This application also proposes a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the infrared micro-scanning lens displacement testing method described above.
[0040] This application proposes a method for high-precision testing of lens displacement by setting up an infrared micro-scanning lens displacement testing and evaluation device in the laboratory, providing a process detection method for a micro-scanning system, and providing raw data support and testing methods for the system to acquire high-quality super-resolution reconstructed images.
[0041] The above description is only an overview of the technical solution of this application. In order to better understand the technical means of this application and to implement it in accordance with the contents of the specification, and to make the above and other objects, features and advantages of this application more obvious and understandable, the following are specific embodiments of this application. Attached Figure Description
[0042] Various other advantages and benefits will become apparent to those skilled in the art upon reading the following detailed description of preferred embodiments. The accompanying drawings are for illustrative purposes only and are not intended to limit the scope of this application. Furthermore, the same reference numerals denote the same parts throughout the drawings. In the drawings:
[0043] Figure 1 This is an example diagram of the basic architecture of the test system in an embodiment of this application;
[0044] Figure 2 This is an example of the target generation unit architecture in an embodiment of this application;
[0045] Figure 3 This is an example of the guide rail and multi-dimensional adjustment unit architecture in an embodiment of this application;
[0046] Figure 4 This is an example of an infrared sensor component architecture according to an embodiment of this application;
[0047] Figure 5 This is an example of the display and control test unit architecture in an embodiment of this application;
[0048] Figure 6 This is a schematic diagram of the infrared micro-scanning lens displacement test process according to an embodiment of this application;
[0049] Figure 7 This is a schematic diagram illustrating the process of testing the imaging of a target by the lens under test according to an embodiment of this application. Detailed Implementation
[0050] Exemplary embodiments of the present disclosure will now be described in more detail with reference to the accompanying drawings. While exemplary embodiments of the present disclosure are shown in the drawings, it should be understood that the present disclosure may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
[0051] This application provides an infrared micro-scanning lens displacement testing method, implemented based on a testing system, such as... Figure 1 As shown, the testing system includes a target generation unit 1, a lens under test, an infrared sensor 3, and a display and control testing unit 4 connected in sequence. The lens under test and the infrared sensor are respectively set on the corresponding adjustment mechanism (guide rail and multi-dimensional adjustment unit 2) to achieve optical axis alignment.
[0052] The target generation unit includes a differential blackbody and a target, used to simulate infrared target sources of different energy levels generating infrared targets of the required spatial size via the target. Specifically, as follows... Figure 2 As shown, the target generation unit mainly consists of a differential blackbody 21, a target 22, an autocollimating eyepiece 24, a target wheel 23, and an off-axis collimator 24. The differential blackbody 21 simulates infrared target sources of different energy levels, which, after passing through the target 22, generate infrared targets of the required spatial size for testing. These targets are then reflected by the off-axis collimator to form a parallel light image, generating a simulated far-infrared target. The target wheel 23 allows for switching the position of targets of different sizes. Before micro-displacement testing, the autocollimating eyepiece 24 aligns the optical axis of the lens under test with that of the off-axis collimator.
[0053] Specifically, a differential blackbody is placed behind the target to simulate infrared target sources of different energy levels, with a temperature range of 5°C to 80°C. The blackbody receives commands from the display and control system to set its temperature and provides real-time feedback of the blackbody temperature information to the control system. The target is placed on a target wheel with a circular target diameter ranging from 0.1mm to 5mm and a target wheel positioning accuracy of 10". Blackbody radiation passes through the target to generate infrared targets of different energy levels and spatial sizes required for the test. The radiation is then reflected by a reflective off-axis collimator to form a parallel light image, generating a simulated far-infrared target. The reflective off-axis collimator has a focal length of 3m, an aperture of 300mm, and a wavefront aberration of λ / 8. Before micro-displacement testing, an autocollimating eyepiece is used to align the optical axes of the lens under test, the infrared sensor, and the off-axis collimator, with an autocollimation accuracy of 10". The target generation unit has an autocollimation function and can simulate stationary infrared targets of different sizes and radiation energies at infinity.
[0054] After self-collimation adjustment, the infrared lens under test images the target at infinity onto the focal plane; the infrared sensor unit adjusts the infrared sensor onto the focal plane of the infrared lens, and the infrared detector converts the light signal into an electrical signal, which is then processed and converted into a digital video Cameralink signal output.
[0055] like Figure 3 As shown, the guide rail and multi-dimensional adjustment unit 2 mainly consists of a guide rail 31 and a two-dimensional adjustment device 32 for the lens under test. The two-dimensional adjustment device 32 adopts a mechanical adjustment method to adjust the horizontal and pitch angles of the lens under test, with an adjustment range of ±1°, which can realize the alignment of the optical axis of the lens under test with the collimator.
[0056] The infrared sensor is used to collect data from the lens under test and transmit it to the display and control test unit.
[0057] Specifically, such as Figure 4 As shown, the infrared sensor assembly consists of an infrared sensor 3, an infrared sensor three-dimensional electric adjustment device 42, a motor driver 43, and an electric control handle 44. The infrared sensor can be a cooled mid-wave infrared detector with specifications of 3µm-5µm wavelength, 640×512 pixel size, 15µm pixel dimensions, and an aperture of f / 2. The infrared sensor features non-uniformity correction, brightness / contrast adjustment, and polarity conversion functions, and can output standard analog PAL video and 16-bit digital Cameralink video signals. The three-dimensional adjustment device is driven by a stepper motor and can electrically adjust the translation, lifting, and radial displacement of the infrared sensor. The radial displacement adjustment range is 5cm, with an adjustment accuracy of 3µm, which can be used for precise focusing of the infrared sensor and the lens under test. The electric control handle allows for electric operation of the three-dimensional displacement, providing a simple and convenient adjustment method.
[0058] The display and control test unit 4 is used to determine the micro-displacement change of the lens image based on the acquired data.
[0059] Specifically, such as Figure 5 As shown, the display and control test unit 4 consists of a blackbody controller 51, a target wheel controller 52, a motor controller 54, and an industrial computer 53 (including a data acquisition card, display and control test program, and display). The host computer's control program communicates via an RS422 serial port and can complete the operation and control of the thermal imager, blackbody, and target wheel. The digital video signal of the thermal imager is acquired by the data acquisition card to generate an image sequence, and the lens image-side micro-displacement change can be obtained through the test module.
[0060] like Figure 6 As shown, the infrared micro-scanning lens displacement testing method includes:
[0061] The lens under test is autocollimated. Specifically, the autocollimating eyepiece is placed on the target wheel, the autocollimating eyepiece light source is turned on, the reflecting plane mirror is placed against the reference surface of the lens under test, and the lens under test is aligned with the optical axis of the collimator by adjusting the horizontal and vertical positions.
[0062] The infrared sensor is focused, and the digital video image from the focused infrared sensor is then connected to the display and control test unit. In specific implementations, focusing the infrared sensor can be divided into two steps. For example, in some embodiments, focusing the infrared sensor includes:
[0063] Install the infrared sensor onto the guide rail;
[0064] Imaging is performed based on the infrared sensor, and the radial distance between the infrared sensor and the lens under test is adjusted in the radial direction of the guide rail to ensure that the imaging effect meets the clarity requirements.
[0065] In this example, coarse focusing is performed on the infrared sensor. The infrared sensor assembly is placed on the guide rail, and the self-collimation accuracy of the infrared sensor is guaranteed by the mechanical positioning accuracy of the guide rail, requiring no further adjustment during each test. The infrared sensor is turned on, and its analog video is connected to the analog monitor. A low-frequency four-bar target is selected. After the infrared sensor images, the infrared target imaging is observed on the analog monitor. The radial distance between the infrared sensor and the lens under test is adjusted in the radial direction of the guide rail. When the image is relatively clear, the infrared sensor assembly is locked on the guide rail.
[0066] In some embodiments, fine focusing of the infrared sensor further includes:
[0067] Based on the lens under test, a target for focusing is selected using the target generation unit, wherein the selected target satisfies f N ~0.3f N , f N The value represents the characteristic frequency of the lens under test after imaging by the infrared sensor, in C / mrad; f is the focal length of the lens under test, in mm; and a is the pixel size of the infrared detector, in μm.
[0068] After selecting the target, adjust the blackbody temperature to the unsaturated imaging range of the infrared sensor; then use the electric control handle to adjust the four-bar target to the center position on the display, observe the four-bar target on the display, and adjust the radial position of the infrared sensor assembly. The clearest position of the target is the focal plane of the lens under test. The radial displacement adjustment accuracy is better than 3µm.
[0069] The target is selected based on the target generation unit, and the target frequency is selected according to the set multiple of the sampling frequency.
[0070] Adjust the differential blackbody temperature of the target generation unit to the unsaturated imaging range of the infrared sensor, and test the first center position of the target image formed by the lens under test.
[0071] Adjust the lens under test to the position after micro-scanning, and test the second center position of the image of the target by the lens under test again.
[0072] The micro-displacement change of the image plane of the lens under test before and after micro-scan is determined based on the first center position and the second center position.
[0073] This application proposes a method for high-precision testing of lens displacement by setting up an infrared micro-scanning lens displacement testing and evaluation device in the laboratory, providing a process detection method for a micro-scanning system, and providing raw data support and testing methods for the system to acquire high-quality super-resolution reconstructed images.
[0074] Lens image-side micro-displacement test: The digital video image from the infrared sensor with the focal plane adjusted is connected to the display and testing unit, for example, a circular target can be selected. In some embodiments, selecting the target frequency according to a set magnification of the sampling frequency includes:
[0075] The selected circular target frequency range satisfies 0.02 to 0.05 times the sampling frequency f. s , f is the focal length of the lens being tested, and a is the pixel size of the infrared detector.
[0076] In some embodiments, testing the first center position of the image of the target by the lens under test includes:
[0077] Adjust the differential blackbody temperature to the unsaturated imaging range of the infrared sensor, and acquire digital video signals based on the infrared sensor;
[0078] The digital video signal is stored as an image sequence in a specified format; for example, the test module can store the signal as a sequence of images in raw format.
[0079] Based on the stored image sequence, the test obtains the first center position (x1, y1) of the image of the target by the lens under test.
[0080] The specific processing procedure is as follows: Figure 7As shown, the image sequence is first averaged. Then, a gating system is used to select the target light spot image for image segmentation. This gating system selection minimizes the addition of other light spots or bright spots while preserving the complete light spot. A threshold is calculated using maximum entropy; areas above this threshold are considered the desired light spot or other bright spots, while areas below are considered background. The threshold divides the image into different regions, with the light spot located in the largest connected component. Finding the connected component where the light spot is located yields its shape, and Gaussian fitting is used to obtain the center of the light spot. The change in the center position of the light spot before and after displacement represents the micro-displacement of the lens image. This method achieves a displacement testing accuracy better than 0.05 pixels (15µm per pixel), or 0.75µm.
[0081] Similarly, adjusting the lens under test to the position after micro-scanning and then testing the second center position of the image of the target by the lens under test again includes:
[0082] Adjust the lens under test to the position after micro-scanning, and collect the digital video signal again. The test module stores the video signal as a sequence of images in raw format. The test obtains the center position (x2, y2) of the lens imaging the target, and thus obtains the amount of micro-displacement change on the image plane before and after the lens micro-scanning.
[0083] The method described in this application can simulate targets at infinity, acquire data using a mid-wave focal plane infrared sensor, and, through micro-displacement testing software, achieve high-precision testing of the micro-displacement of mid-wave infrared micro-scanning lenses. Compared with traditional lens MTF testing devices, the solution in this application can perform both micro-displacement change testing and lens MTF testing for infrared micro-scanning lenses, solving the current problem of not being able to test the displacement change of micro-scanning infrared lenses.
[0084] This application also proposes an infrared micro-scanning lens displacement testing system, including a target generation unit, a lens under test, an infrared sensor, and a display and control testing unit connected in sequence, wherein the lens under test and the infrared sensor are respectively mounted on corresponding adjustment mechanisms to achieve optical axis alignment.
[0085] The target generation unit includes a differential blackbody and a target, used to simulate infrared target sources of different energy levels;
[0086] The infrared sensor is used to collect data from the lens under test and transmit it to the display and control test unit;
[0087] The display and control test unit is used to determine the amount of micro-displacement change in the image plane of the lens based on the acquired data;
[0088] The displacement test of the infrared micro-scanning lens is specifically implemented in the following manner:
[0089] Auto-align the lens under test;
[0090] The infrared sensor is focused, and the digital video image of the infrared sensor with the focused plane adjusted is connected to the display and control test unit.
[0091] The target is selected based on the target generation unit, and the target frequency is selected according to the set multiple of the sampling frequency.
[0092] Adjust the differential blackbody temperature of the target generation unit to the unsaturated imaging range of the infrared sensor, and test the first center position of the target image formed by the lens under test;
[0093] Adjust the lens under test to the position after micro-scanning, and test the second center position of the image of the target by the lens under test again;
[0094] The micro-displacement change of the image plane of the lens under test before and after micro-scan is determined based on the first center position and the second center position.
[0095] This application also proposes a computer-readable storage medium storing a computer program, which, when executed by a processor, implements the steps of the infrared micro-scanning lens displacement testing method described above.
[0096] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element.
[0097] The sequence numbers of the embodiments in this application are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.
[0098] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk), and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.
[0099] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims. All of these forms are within the protection scope of this application.
Claims
1. A method for testing the displacement of an infrared micro-scanning lens, characterized in that, Based on the test system implementation, The testing system includes a target generation unit, a lens under test, an infrared sensor, and a display and control testing unit connected in sequence. The lens under test and the infrared sensor are respectively mounted on corresponding adjustment mechanisms to achieve optical axis alignment. The target generation unit includes a differential blackbody and a target, used to simulate infrared target sources of different energy levels generating infrared targets of the required spatial size via the target; The infrared sensor is used to collect data from the lens under test and transmit it to the display and control test unit; The display and control test unit is used to determine the amount of micro-displacement change in the image plane of the lens based on the acquired data; The infrared micro-scanning lens displacement testing method includes: Auto-align the lens under test; The infrared sensor is focused, and the digital video image of the infrared sensor with the focused plane adjusted is connected to the display and control test unit. The target is selected based on the target generation unit, and the target frequency is selected according to the set multiple of the sampling frequency. Adjust the differential blackbody temperature of the target generation unit to the unsaturated imaging range of the infrared sensor, and test the first center position of the target image formed by the lens under test; Adjust the lens under test to the position after micro-scanning, and test the second center position of the image of the target by the lens under test again; The micro-displacement change of the image plane of the lens under test before and after micro-scan is determined based on the first center position and the second center position.
2. The infrared micro-scanning lens displacement testing method as described in claim 1, characterized in that, Focusing the infrared sensor includes: Install the infrared sensor onto the guide rail; Imaging is performed based on the infrared sensor, and the radial distance between the infrared sensor and the lens under test is adjusted in the radial direction of the guide rail to ensure that the imaging effect meets the clarity requirements.
3. The infrared micro-scanning lens displacement testing method as described in claim 2, characterized in that, Focusing the infrared sensor also includes: Based on the lens under test, a target for focusing is selected using the target generation unit, wherein the selected target satisfies f N ~0.3f N , f N This represents the characteristic frequency of the lens under test after imaging by the infrared sensor, f is the focal length of the lens under test, and a is the pixel size of the infrared detector.
4. The infrared micro-scanning lens displacement testing method as described in claim 1, characterized in that, Selecting the target frequency according to the set multiplier of the sampling frequency includes: The selected target frequency range meets the requirement of 0.02 to 0.05 times the sampling frequency fs. f is the focal length of the lens being tested, and a is the pixel size of the infrared detector.
5. The infrared micro-scanning lens displacement testing method as described in claim 1, characterized in that, The first center position of the image of the target by the lens under test includes: Digital video signals are acquired using infrared sensors; The digital video signal is stored as an image sequence in a specified format; Based on the stored image sequence, the test obtains the first center position of the image of the target by the lens under test.
6. An infrared micro-scanning lens displacement testing system, characterized in that, It includes a target generation unit, a lens under test, an infrared sensor, and a display and control test unit connected in sequence, wherein the lens under test and the infrared sensor are respectively mounted on corresponding adjustment mechanisms to achieve optical axis alignment; The target generation unit includes a differential blackbody and a target, used to simulate infrared target sources of different energy levels generating infrared targets of the required spatial size via the target; The infrared sensor is used to collect data from the lens under test and transmit it to the display and control test unit. The display and control test unit is used to determine the amount of micro-displacement change in the image plane of the lens based on the acquired data; The displacement test of the infrared micro-scanning lens is specifically implemented in the following manner: Auto-align the lens under test; The infrared sensor is focused, and the digital video image of the infrared sensor with the focused plane adjusted is connected to the display and control test unit. The target is selected based on the target generation unit, and the target frequency is selected according to the set multiple of the sampling frequency. Adjust the differential blackbody temperature of the target generation unit to the unsaturated imaging range of the infrared sensor, and test the first center position of the target image formed by the lens under test; Adjust the lens under test to the position after micro-scanning, and test the second center position of the image of the target by the lens under test again; The micro-displacement change of the image plane of the lens under test before and after micro-scan is determined based on the first center position and the second center position.
7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, implements the steps of the infrared micro-scanning lens displacement testing method as described in any one of claims 1 to 5.
Citation Information
Patent Citations
Testing method for modulation transfer function of linear array infrared detector of shape of Chinese character "pin"
CN109990985A
Optical lens comprehensive performance parameter testing device and method
CN112683494A