Seal surface contact analysis method, device and computer equipment

Abstract

The embodiment of the application provides a sealing surface contact analysis method, device and computer equipment, the method comprises the following steps: obtaining original surface information of a sealing surface pair to be analyzed; the sealing surface pair to be analyzed comprises a first rough surface and a second rough surface which are in pressure contact; obtaining equivalent surface information of an equivalent surface pair corresponding to the sealing surface pair to be analyzed according to the original surface information; the equivalent surface pair comprises an equivalent rough surface and a rigid plane; and performing contact analysis on the sealing surface pair to be analyzed according to the equivalent surface information. Since the actual contact area of the sealing surface pair to be analyzed and the equivalent surface pair is the same under the same external force, the contact mechanics analysis of the sealing surface to be analyzed can be performed according to the equivalent surface information, the stress contact condition of the sealing surface pair to be analyzed is obtained, the contact mechanics analysis process between the two rough surfaces is simplified, and the analysis efficiency is improved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of sealing structure research, and particularly relates to a sealing surface contact analysis method and device and computer equipment. BACKGROUND

[0002] In a static sealing structure, the contact interface is usually two rough surfaces. The materials of the two rough surfaces can be the same or different. For example, in a double-cone sealing structure and a ball head sealing structure, the materials of the two contact rough surfaces are the same. In a flange sealing structure with an aluminum gasket or a copper gasket, the materials of the two contact rough surfaces can be a combination of a soft material and a hard material.

[0003] In addition, the current contact mechanics analysis algorithms such as the micro-asperity model, the Persson theory and the semi-analytical method are usually used to analyze the contact interface to determine the advantages and disadvantages of the sealing performance of the contact interface.

[0004] However, the above method can only be used to analyze the contact in the case where the contact interface includes one elastic-plastic surface and one rigid surface, for example, can only be used to analyze the contact between an elastic-plastic rough surface and a rigid plane or the contact between a rigid rough surface and an elastic-plastic plane, and cannot be used to analyze the contact between two strong elastic rough surfaces. Therefore, there is an urgent need for a solution that can analyze the contact between two elastic-plastic rough surfaces. SUMMARY

[0005] The present application provides a sealing surface contact analysis method, device and computer equipment, which can convert the contact problem of two rough surfaces into a contact problem of one rough surface and one rigid plane, and thus analyze the contact using a contact mechanics analysis algorithm.

[0006] In a first aspect, the present application provides a sealing surface contact analysis method, which comprises:

[0007] obtaining original surface information of a pair of sealing surfaces to be analyzed; the pair of sealing surfaces to be analyzed includes two first and second rough surfaces in contact under pressure;

[0008] According to the original surface information, obtaining equivalent surface information of an equivalent surface pair corresponding to the pair of sealing surfaces to be analyzed; the equivalent surface pair includes one equivalent rough surface and one rigid plane, and the actual contact area of the pair of sealing surfaces to be analyzed and the equivalent surface pair is the same under the same external force;

[0009] According to the equivalent surface information, analyzing the contact of the pair of sealing surfaces to be analyzed.

[0010] In a possible implementation, the original surface information includes a first surface height distribution function and a first material parameter of a first rough surface, and a second surface height distribution function and a second material parameter of a second rough surface;

[0011] The first material parameter and the second material parameter each include an elastic modulus, a Poisson's ratio, a yield strength, and a tangent modulus.

[0012] Correspondingly, the equivalent surface information includes an equivalent surface height distribution function and an equivalent material parameter of an equivalent rough surface, and the equivalent material parameter includes an equivalent elastic modulus, an equivalent Poisson's ratio, an equivalent yield strength, and an equivalent tangent modulus.

[0013] In a possible implementation, the obtaining, according to the original surface information, of the equivalent surface information of the equivalent surface pair to be analyzed from the sealing surface pair includes:

[0014] The contact type of the sealing surface pair to be analyzed is determined according to the original surface information.

[0015] The equivalent surface information of the equivalent surface pair is obtained according to the original surface information based on the contact type of the sealing surface pair to be analyzed.

[0016] In a possible implementation, the determination, according to the original surface information, of the contact type of the sealing surface pair to be analyzed includes:

[0017] If each parameter in the first material parameter and the second material parameter corresponds to the same within a preset error range, it is determined that the contact type of the sealing surface pair to be analyzed is symmetric contact.

[0018] If at least one parameter in the first material parameter and the second material parameter is different within the error range, it is determined that the contact type of the sealing surface pair to be analyzed is asymmetric contact.

[0019] In a possible implementation, if the contact type of the sealing surface pair to be analyzed is symmetric contact, the equivalent surface information of the equivalent surface pair is obtained according to the original surface information, including:

[0020] An absolute value of a function difference of the first surface height distribution function and the second surface height distribution function is obtained, and a product of the absolute value of the function difference and 0.5 is determined as the equivalent surface height distribution function of the equivalent rough surface.

[0021] An average value of the corresponding parameters in the first material parameter and the second material parameter is determined as the equivalent material parameter of the equivalent rough surface.

[0022] In a possible implementation, if the contact type of the sealing surface pair to be analyzed is asymmetric contact, the equivalent surface information of the equivalent surface pair is obtained according to the original surface information, including:

[0023] The absolute value of the difference between the first surface height distribution function and the second surface height distribution function is determined as the equivalent surface height distribution function of the equivalent rough surface.

[0024] The Poisson's ratio of the target rough surface is determined as the equivalent Poisson's ratio of the equivalent rough surface; the target rough surface is a rough surface with a smaller yield strength at the center of the sealing surface to be analyzed.

[0025] The yield strength of the target rough surface is determined as the equivalent yield strength of the equivalent rough surface.

[0026] The equivalent elastic modulus of the equivalent rough surface is calculated based on the Poisson's ratio and elastic modulus of the first rough surface and the Poisson's ratio and elastic modulus of the second rough surface.

[0027] The tangent modulus of the target rough surface is determined as the equivalent tangent modulus of the equivalent rough surface.

[0028] In one possible implementation, the formula for calculating the equivalent elastic modulus of the equivalent rough surface is:

[0029]

[0030] Among them, E * For the equivalent elastic modulus, v * For the equivalent Poisson's ratio, v1 is the Poisson's ratio of the target rough surface, v2 is the Poisson's ratio of the rough surface with the larger yield strength at the center of the sealing surface to be analyzed, E1 is the elastic modulus of the target rough surface, and E2 is the elastic modulus of the rough surface with the larger yield strength at the center of the sealing surface to be analyzed.

[0031] In one possible implementation, contact analysis is performed on the sealing surface pair to be analyzed, including at least one of the following contact mechanics analysis algorithms: micro-convexity model method, Persson theory method, semi-analytical method and finite element method.

[0032] Secondly, this application provides a sealing surface contact analysis device, the device comprising:

[0033] The information acquisition module is used to acquire the original surface information of the sealing surface pair to be analyzed; the sealing surface pair to be analyzed includes a first rough surface and a second rough surface under pressure contact;

[0034] The equivalent processing module is used to obtain the equivalent surface information of the equivalent surface pair corresponding to the sealing surface pair to be analyzed based on the original surface information. The equivalent surface pair includes an equivalent rough surface and a rigid plane. Under the same external force, the actual contact area between the sealing surface pair to be analyzed and the equivalent surface pair is the same.

[0035] The contact analysis module is used to perform contact analysis on the sealing surface pairs to be analyzed based on equivalent surface information.

[0036] Thirdly, this application provides a computer device including a memory and a processor. The memory stores a computer program, and the processor invokes and executes the computer program from the memory to implement the steps of the sealing surface contact analysis method shown in any of the first aspects above.

[0037] Fourthly, this application provides a computer storage medium storing a computer program that, when executed by a processor, implements the steps of the sealing surface contact analysis method shown in any of the first aspects above.

[0038] Fifthly, this application provides a computer program product comprising a computer program that, when executed by a processor, implements the steps of the sealing surface contact analysis method shown in any of the first aspects above.

[0039] The technical solution provided in this application can achieve at least the following beneficial effects:

[0040] The sealing surface contact analysis method, apparatus, and computer equipment provided in this application, for the first and second rough surfaces in a pair of sealing surfaces to be analyzed under pressure contact, firstly acquire the original surface information of the sealing surface pair to be analyzed, and then, based on the original surface information, acquire the equivalent surface pair corresponding to the sealing surface pair to be analyzed. The equivalent surface pair includes an equivalent rough surface and a rigid plane; then, based on the equivalent surface information, perform contact analysis on the sealing surface pair to be analyzed. Since the actual contact area of ​​the sealing surface pair to be analyzed and the equivalent surface pair is the same under the same external force, by performing contact mechanics analysis on the sealing surface pair to be analyzed through the equivalent surface information, the force contact situation between the first and second rough surfaces in the sealing surface pair to be analyzed can be obtained. In this way, the contact mechanics analysis process of sealing surface pairs is simplified, the application of elastoplastic contact mechanics analysis algorithms in engineering is expanded, and a bridge is established between contact mechanics analysis algorithms and practical engineering applications. Moreover, by analyzing the force-contact situation of equivalent surface pairs instead of directly analyzing the force-contact situation of the sealing surface pairs to be analyzed, the computational efficiency of the contact mechanics analysis algorithm is improved, thereby increasing the value of the contact mechanics analysis algorithm for sealing surface pairs in engineering applications. Attached Figure Description

[0041] Figure 1 This is a schematic diagram of the structure of a computer device shown in an exemplary embodiment of this application;

[0042] Figure 2This is a schematic flowchart illustrating a sealing surface contact analysis method according to an exemplary embodiment of this application;

[0043] Figure 3 This is a schematic diagram of the geometric morphology of a pair of sealing surfaces to be analyzed, as shown in an exemplary embodiment of this application;

[0044] Figure 4 This is a schematic diagram illustrating the stress-strain relationship of an elastoplastic material according to an exemplary embodiment of this application;

[0045] Figure 5 This is a schematic diagram of the geometric morphology of an equivalent contact surface pair shown in an exemplary embodiment of this application;

[0046] Figure 6 This is a schematic diagram illustrating a process for obtaining equivalent surface information, as shown in an exemplary embodiment of this application.

[0047] Figure 7 This is a schematic diagram of the geometric topography of an equivalent surface pair shown in an exemplary embodiment of this application;

[0048] Figure 8 This is a schematic diagram illustrating the influencing factors of the critical load ratio in the yield state, as shown in an exemplary embodiment of this application.

[0049] Figure 9 This is a schematic diagram illustrating the relationship between yield strength and actual contact area in an exemplary embodiment of this application;

[0050] Figure 10 This is a schematic diagram illustrating the relationship between yield strength and average contact gap in an exemplary embodiment of this application;

[0051] Figure 11 This is a schematic diagram of the geometric topography of another equivalent surface pair shown in an exemplary embodiment of this application;

[0052] Figure 12 This is a finite element model of a pair of sealing surfaces to be analyzed, as illustrated in an exemplary embodiment of this application;

[0053] Figure 13 This is a finite element model of an equivalent surface pair shown in an exemplary embodiment of this application;

[0054] Figure 14 This is a schematic diagram illustrating a pair of sealing surfaces to be analyzed, as shown in an exemplary embodiment of this application;

[0055] Figure 15 This is a schematic diagram illustrating the results of finite element method calculation of the contact behavior of the sealing surface pair and the equivalent surface pair to be analyzed, as shown in an exemplary embodiment of this application.

[0056] Figure 16 This is a schematic diagram illustrating the results of another finite element method calculation of the contact behavior of the sealing surface pair and the equivalent surface pair to be analyzed, as shown in an exemplary embodiment of this application.

[0057] Figure 17 This is a schematic diagram illustrating the results of a semi-analytical method for calculating the contact behavior of equivalent surface pairs, as shown in an exemplary embodiment of this application.

[0058] Figure 18 This is a schematic diagram of the structure of a sealed surface contact analysis device according to an exemplary embodiment of this application. Detailed Implementation

[0059] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be further described in detail below with reference to the accompanying drawings and embodiments.

[0060] Before explaining the sealing surface contact analysis method provided in the embodiments of this application, the application scenarios and implementation environment of the embodiments of this application will be introduced first.

[0061] In static sealing structures, the contact interface typically consists of two rough surfaces. The purpose of contact analysis on these rough surfaces is to determine the relationship between "contact pressure" and "actual contact area," thereby assessing the sealing performance of the static sealing structure based on the actual contact area. Therefore, rough surface contact analysis is an essential step in the design and optimization of static sealing structures.

[0062] When two rough surfaces are in contact, only some of the wave crests actually touch, and this contact area is invisible to the naked eye. That is, under pressure, the actual contact area between two rough surfaces is usually much smaller than the nominal contact area. For example, the actual contact area between two 1mm x 1mm rough surfaces is much smaller than 1mm². 2 .

[0063] Furthermore, contact mechanics analysis algorithms can be used to perform contact analysis on two rough surfaces under pressure. Currently, commonly used contact mechanics analysis algorithms include: the micro-convexity model method, the Persson theory method, the semi-analytical method, and the finite element method. Among these, the micro-convexity model method, the Persson theory method, and the semi-analytical method have high computational efficiency and can quickly model and calculate the contact behavior between two rough surfaces (specifically, the actual contact area and average contact gap), but they can only handle contact problems between one rough surface and one plane, and cannot handle contact problems between two rough surfaces. While the finite element method can handle contact problems between two rough surfaces, its modeling and computational efficiency is extremely low, and it has certain requirements for computer equipment configuration.

[0064] It should be understood that contact mechanics analysis algorithms can be categorized into algorithms for elastic surfaces and algorithms for elasto-plastic surfaces, based on the material type of the contact surface pair. That is, all four categories of contact mechanics analysis algorithms include algorithms for contact problems involving elastic rough surfaces and algorithms for contact problems involving elasto-plastic rough surfaces. For example, regarding the micro-protrusion model method, there are micro-protrusion model methods for contact analysis of elastic rough surfaces, and there are also micro-protrusion model methods for contact analysis of elasto-plastic rough surfaces.

[0065] It should be noted that since sealing problems are analyzed based on the contact between elasto-plastic surfaces, this application only uses two elasto-plastic roughened surfaces, the first and second, as the sealing surface pair to be analyzed to explain the technical solution provided in this application. However, the contact problem between two elastic roughened surfaces can also be analyzed using the technical concept of this application, which will not be detailed here.

[0066] Based on this, this application provides a method, apparatus, and computer device for contact analysis of sealed surfaces. It simplifies the contact problem between two rough surfaces in a pair of sealed surfaces to be analyzed into an equivalent contact problem between a rigid plane and an equivalent rough surface, and then performs contact analysis on it. This expands the engineering application of contact mechanics analysis algorithms such as the micro-convexity model method, Persson theory method, and semi-analytical method, which can only calculate contact problems between rigid surfaces and elastoplastic rough surfaces. Simultaneously, by using the equivalent surface information of the simplified equivalent surface pair, the computational efficiency of the finite element contact model can be significantly improved when performing contact analysis on the sealed surface pair, establishing a bridge between contact mechanics analysis algorithms and practical engineering applications.

[0067] In one exemplary embodiment, this application provides a sealing surface contact analysis method that can be applied to, for example... Figure 1 The computer device shown includes at least one processor 110, a memory 120, a communication bus 130, and at least one communication interface 140.

[0068] The processor 110 can be a general-purpose central processing unit (CPU), a network processor (NP), a microprocessor, or one or more integrated circuits for implementing the scheme of this application, such as an application-specific integrated circuit (ASIC), a programmable logic device (PLD), or a combination thereof. The aforementioned PLD can be a complex programmable logic device (CPLD), a field-programmable gate array (FPGA), a generic array logic (GAL), or any combination thereof.

[0069] Optionally, processor 110 may include one or more CPUs. Computer device 100 may include multiple processors 110. Each of these processors 110 may be a single-core processor (single-CPU) or a multi-core processor (multi-CPU).

[0070] It should be noted that the processor 110 here may refer to one or more devices, circuits, and / or processing cores used to process data (such as computer program instructions).

[0071] The memory 120 may be a read-only memory (ROM) or other type of static storage device capable of storing static information and instructions; it may also be a random access memory (RAM) or other type of dynamic storage device capable of storing information and instructions; it may also be an electrically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM) or other optical disc storage, optical disc storage (including compressed optical discs, laser discs, optical discs, digital universal optical discs, Blu-ray discs, etc.), magnetic disk storage media or other magnetic storage devices; or any other medium capable of carrying or storing desired program code in the form of instructions or data structures and accessible by a computer, but not limited thereto.

[0072] Alternatively, the memory 120 may exist independently and be connected to the processor 110 via the communication bus 130; the memory 120 may also be integrated with the processor 110.

[0073] Communication bus 130 is used to transfer information between components (such as between the processor and memory). Communication bus 120 can be divided into address bus, data bus, control bus, etc. For ease of representation, Figure 1 The diagram uses only one communication bus, but this does not mean that there is only one bus or one type of bus.

[0074] The communication interface 140 is used for the computer device 100 to communicate with other devices or communication networks. The communication interface 140 includes a wired communication interface or a wireless communication interface. The wired communication interface can be, for example, an Ethernet interface. The Ethernet interface can be an optical interface, an electrical interface, or a combination thereof. The wireless communication interface can be a Wireless Local Area Network (WLAN) interface, a cellular network communication interface, or a combination thereof.

[0075] In some embodiments, the computer device 100 may further include an output device 150 and an input device 160. Figure 1 (Not shown in the image). Output device 150 communicates with processor 110 and can display information in various ways. For example, output device 150 can be a liquid crystal display (LCD), a light-emitting diode (LED) display device, a cathode ray tube (CRT) display device, or a projector, etc. Input device 160 communicates with processor 110 and can receive user input in various ways. For example, input device 160 can be a mouse, keyboard, touch screen device, or sensor device, etc.

[0076] In some embodiments, the memory 120 is used to store a computer program for executing the scheme of this application, and the processor 110 can execute the computer program stored in the memory 120. For example, the computer device 100 can call and execute the computer program stored in the memory 120 through the processor 110 to implement the steps of the sealing surface contact analysis method provided in the embodiments of this application.

[0077] In one exemplary embodiment, such as Figure 2 As shown, this application provides a method for contact analysis of a sealing surface, which can be applied to the above-mentioned... Figure 1 The computer device 100 shown is used as an example. The method may include the following steps:

[0078] Step 210: Obtain the original surface information of the sealing surface pair to be analyzed.

[0079] The sealing surface pair to be analyzed includes a first rough surface and a second rough surface that are under pressure contact.

[0080] In some embodiments, the original surface information of the sealing surface pair to be analyzed includes a first surface height distribution function and a first material parameter for the first rough surface, and a second surface height distribution function and a second material parameter for the second rough surface. Both the first and second material parameters include elastic modulus, Poisson's ratio, yield strength, and tangent modulus.

[0081] The surface height distribution function can be used to describe the geometry of a rough surface; for example, the surface roughness of the rough surface.

[0082] As an example, see Figure 3 The first surface height distribution function of the first rough surface (i.e., the upper surface in the sealed surface pair to be analyzed) is h1(x,y), and the first material parameter is denoted as Material 1; the second surface height distribution function of the second rough surface (i.e., the lower surface in the sealed surface pair to be analyzed) is h2(x,y), and the second material parameter is denoted as Material 2. Then, in the sealed surface pair to be analyzed, the initial contact gap between the first rough surface and the second rough surface is g(x,y) = h1(x,y) - h2(x,y).

[0083] Because elastoplastic materials are homogeneous and isotropic, and incompressible under plastic deformation, they follow the von Mises yielding criterion and J2 flow theory. Therefore, when using a bilinear isotropic hardening model to represent the stress-strain relationship between two elastoplastic materials, see [reference needed]. Figure 4 The strain of the material before and after yielding increases linearly with increasing stress, but the linear slope is different in these two stages.

[0084] The slope of the elastic phase is the elastic modulus of the two materials (m and n) (denoted as E). m and E n The slope of the plastic stage is the tangent modulus of the material (denoted as T). m and T n Yield strength (σ) m and σ n The stress is the critical stress that distinguishes between the elastic and plastic ranges. The Poisson's ratios of the two materials are v0 and v0, respectively. m and v n .

[0085] Based on this, contact mechanics research has proposed a classic assumption: when the surface height gradient is small, the contact behavior of two rough surfaces is only related to the mechanical properties of the materials and the initial contact gap between the two rough surfaces, and is independent of the geometry of the two rough surfaces. This assumption can also be expressed as: even if the geometry of the rough surfaces in two contact surface pairs is completely different, as long as their material parameters and initial contact gap are the same, they can be approximately regarded as the same contact surface pair.

[0086] Therefore, without changing the material parameters of the contact pair, Figure 3 The sealing surface to be analyzed shown is approximately equivalent to Figure 5 The two equivalent contact surface pairs are shown. Figure 5 The equivalent contact surface pair shown in (a) has completely symmetrical geometry on its upper and lower surfaces, and its surface height distribution functions are labeled as g(x,y) / 2 and -g(x,y) / 2, respectively. Figure 5 The equivalent contact surface pair shown in (b) has a surface height distribution function of the upper surface labeled g(x,y) and a rigid plane on the lower surface.

[0087] Based on this assumption, when performing contact analysis on the sealing surface pair to be analyzed, this application can simplify the two rough surfaces by using their surface height distribution functions and material parameters to obtain the equivalent surface information of the equivalent surface pair corresponding to the sealing surface pair to be analyzed, thereby performing contact analysis on the sealing surface pair to be analyzed.

[0088] Step 220: Based on the original surface information, obtain the equivalent surface information of the equivalent surface pair corresponding to the sealing surface pair to be analyzed.

[0089] The equivalent surface pair includes an equivalent rough surface and a rigid plane. Under the same external force, the actual contact area of ​​the sealing surface pair to be analyzed and the equivalent surface pair is the same.

[0090] In other words, under the same contact pressure, the actual contact area between the first rough surface and the second rough surface of the sealing surface to be analyzed is the same as the actual contact area between the equivalent rough surface and the rigid plane in the equivalent surface alignment.

[0091] Correspondingly, the equivalent surface information includes the equivalent surface height distribution function and equivalent material parameters of the equivalent rough surface. The equivalent material parameters include the equivalent elastic modulus, equivalent Poisson's ratio, equivalent yield strength, and equivalent tangent modulus.

[0092] In some embodiments, such as Figure 6 As shown, the implementation process of step 220 may include the following sub-steps:

[0093] Step 221: Based on the original surface information, determine the contact type of the sealing surface pair to be analyzed.

[0094] Specifically, the contact type of the sealing surface pair to be analyzed can be determined based on the first material parameters of the first rough surface and the second material parameters of the second rough surface.

[0095] In one possible implementation, if all parameters in the first material parameter and the second material parameter are the same, then the contact type of the sealing surface pair to be analyzed is determined to be symmetrical contact; if at least one parameter in the first material parameter and the second material parameter is different, then the contact type of the sealing surface pair to be analyzed is determined to be asymmetrical contact.

[0096] Furthermore, considering that there may be process errors in the preparation of the two rough surfaces in the sealing structure, the material parameters of the first rough surface and the second rough surface may differ. Therefore, when determining the contact type, it is necessary to eliminate process errors and then compare whether the material parameters of the two are the same.

[0097] In another possible implementation, if all parameters in the first material parameter and the second material parameter are the same within a preset error range, then the contact type of the sealing surface pair to be analyzed is determined to be symmetrical contact; if at least one parameter in the first material parameter and the second material parameter is different within the error range, then the contact type of the sealing surface pair to be analyzed is determined to be asymmetrical contact.

[0098] The error range can be flexibly set according to the process deviation of the sealing surface pair to be analyzed, and the embodiments of this application do not limit it.

[0099] As an example, the first material parameters of the first rough surface include the elastic modulus E1, Poisson's ratio v1, and yield strength σ. y1 The second material parameters of the second rough surface include the elastic modulus E2, Poisson's ratio v2, and yield strength σ, along with the tangent modulus T1. y2 And tangent modulus T2.

[0100] If within the error range, all parameters in the first and second material parameters are identical, i.e., E1 = E2, v1 = v2, σ y1 =σ y2 If T1 = T2, then the first rough surface and the second rough surface are in symmetrical contact; if, within the error range, at least one of the first material parameters and the second material parameters is different, i.e., E1 ≠ E2, or v1 ≠ v2, or σ y1 ≠σ y2 If T1≠T2, then it is determined that the first rough surface and the second rough surface are in asymmetric contact.

[0101] Step 223: Based on the contact type of the sealing surface pair to be analyzed, obtain the equivalent surface information of the equivalent surface pair according to the original surface information.

[0102] First, the implementation process of obtaining equivalent surface information of equivalent surface pairs under symmetrical contact type is explained in detail.

[0103] Contact problems between two rough surfaces made of the same elastoplastic material (i.e., with identical material parameters) are very common in engineering applications, such as bearings, gears, gasketless flange seals, double-cone seals, and ball-head conical seals.

[0104] When performing equivalent treatment on two symmetrically contacting rough surfaces, the two symmetrically contacting rough surfaces can be equivalently replaced with... Figure 5 The equivalent contact surface pair shown in (a) has geometric symmetry between its two equivalent surfaces. Since the material parameters of the two rough surfaces in the symmetrical contact are identical, the two rough surfaces in the equivalent contact surface pair are completely symmetrical about the geometric symmetry plane. Therefore, during the compressive contact process, the actual contact area will necessarily lie on the opposing plane.

[0105] Therefore, see Figure 7 The symmetrical contact can be equivalently treated according to the symmetry boundary conditions, simplifying the sealing surface pair to be analyzed into a contact between an equivalent rough surface and a rigid plane.

[0106] In one possible implementation, step 223 can be implemented as follows: obtaining the absolute value of the function difference between the first surface height distribution function and the second surface height distribution function, and determining the product of the absolute value of the function difference and 0.5 as the equivalent surface height distribution function of the equivalent rough surface; and determining the average value of the corresponding parameters in the first material parameter and the second material parameter as the equivalent material parameter of the equivalent rough surface.

[0107] As an example, the equivalent surface height distribution function of the equivalent rough surface can be calculated by the following formula (1):

[0108] h * (x,y)=[h1(x,y)-h2(x,y)] / 2 (1)

[0109] In the formula, h1(x,y) is the first surface height distribution function of the first rough surface aligned with the sealing surface to be analyzed, and h2(x,y) is the second surface height distribution function of the second rough surface aligned with the sealing surface to be analyzed. * (x,y) is the equivalent surface height distribution function of the equivalent rough surface.

[0110] As an example, the equivalent material parameters of an equivalent rough surface can be determined by the following formula (2):

[0111]

[0112]

[0113]

[0114]

[0115] In the formula, E * E1 is the equivalent elastic modulus of the equivalent rough surface, E2 is the elastic modulus of the first rough surface aligned with the sealing surface to be analyzed, and E2 is the elastic modulus of the second rough surface aligned with the sealing surface to be analyzed; v * v1 is the equivalent Poisson's ratio of the equivalent rough surface, v2 is the Poisson's ratio of the first rough surface to be analyzed when the sealing surface is aligned with the first rough surface, and v3 is the Poisson's ratio of the second rough surface to be analyzed when the sealing surface is aligned with the second rough surface. σ represents the equivalent yield strength of the equivalent rough surface. y1 To analyze the yield strength of the first rough surface at the center of the sealing surface, σ y2 The yield strength of the second rough surface aligned with the sealing surface to be analyzed; T * T1 is the equivalent tangent modulus of the equivalent rough surface, T2 is the tangent modulus of the sealing surface to be analyzed aligned with the first rough surface, and T2 is the tangent modulus of the sealing surface to be analyzed aligned with the second rough surface.

[0116] Next, we will explain in detail the implementation process of obtaining equivalent surface information of equivalent surface pairs under asymmetric contact type.

[0117] Typically, the contact between the rough surfaces of soft materials and hard materials is defined as asymmetric contact, which is commonly found at the sealing interface between steel flanges and gaskets.

[0118] Assume that the first rough surface (i.e., the upper surface of the sealing surface pair to be analyzed) is softer than the second rough surface (i.e., the lower surface of the sealing surface pair to be analyzed), i.e., σ y1 <σ y2The elastoplastic contact process of the sealing surface pair to be analyzed is as follows: When the softer first rough surface is pressed against the harder second rough surface, the maximum equivalent stress of the underlying solid increases with the increase of the pressure load, and the softer material first enters the yield state. After the softer material yields, the local contact pressure will continue to increase with the increase of the pressure load. However, due to the plastic deformation of the soft material, the rate of increase in local contact pressure is slowed down, and the rate of increase of the equivalent stress inside the harder material is slowed down. Compared with the purely elastic contact process, the harder material is more difficult to enter the yield state. As the pressure load continues to increase, and when the yield strength of the harder material is not much different from that of the softer material, the harder material may eventually also enter the yield state and undergo plastic deformation.

[0119] Therefore, the above contact process can be divided into three stages: the first contact stage, in which the first rough surface and the second rough surface come into contact, only elastic deformation occurs; the second contact stage, in which the rough surface with the smaller yield strength of the first rough surface and the second rough surface undergoes plastic deformation, while the rough surface with the larger yield strength continues to be in the pure elastic stage; the third contact stage, in which both the first rough surface and the second rough surface come into contact, plastic deformation occurs.

[0120] The critical loads that cause the softer and harder materials to begin yielding are denoted as F1 and F2, respectively. The ratio of the critical loads, F2 / F1, reflects the relative size of the ranges of the second contact stage and the first contact stage.

[0121] To investigate the influencing factors of F2 / F1, this application conducted finite element simulations on the contact problem between two spheres of different materials and radii. Simulation results show that the critical load ratio F2 / F1 is only affected by σ. y2 / σ y1 and T1 / E * Influence (where σ y2 / σ y1 T1 / E is the ratio of the yield strengths of the spheres corresponding to the first and second rough surfaces, respectively. * (This is the ratio of the tangent modulus to the equivalent elastic modulus of a softer material).

[0122] in, Figure 8 The display shows σ y2 / σ y1 and T1 / E * The effect of F2 / F1 shows that even though the yield strength of the harder material is only twice that of the softer material, F1 is hundreds or even thousands of times greater than F2, indicating that the second contact stage is the main stage of spherical contact (Hertz contact) between different elastoplastic materials.

[0123] It should be noted that, regarding the contact problem between two rough surfaces in a seal, although the two rough surfaces can be approximated as spherical micro-protrusions, and the second contact stage is assumed to be the dominant contact stage, the presence of very sharp protrusions in certain local areas can cause the elastoplastic contact in these localized regions to enter a third contact stage. Therefore, the impact of the third contact stage on the overall contact between the rough surfaces depends on the probability of the third contact stage existing, and this probability increases with σ. y2 / σ y1 The increase or T1 / E * The decrease is due to the reduction (e.g.) Figure 8 (As shown). Therefore, higher σ y2 / σ y1 or lower T1 / E * The value will reduce the impact of the third contact stage on the overall contact behavior of the rough surface pair.

[0124] Where, σ y2 / σ y1 The influence on the contact behavior of elastoplastic rough surfaces can be found in [reference needed]. Figure 9 and Figure 10 .Depend on Figure 9 It can be seen that when σ y2 / σ y1 When σ < 2, under the same contact pressure, as σ y2 / σ y1 As the temperature rises, the actual contact area gradually decreases; Figure 10 It can be seen that when σ y2 / σ y1 When σ < 2, under the same contact pressure, as σ y2 / σ y1 As σ increases, the average contact gap increases slowly. Therefore, when σ... y2 / σ y1 When σ < 2, under the same contact pressure, as σ y2 / σ y1 As σ increases, the probability of the third contact stage gradually decreases. y2 / σ y1 When σ ≥ 2, the probability of the third contact stage has decreased to a point where it can no longer significantly affect the contact behavior of the sealing surface pairs being analyzed. The actual contact area and average contact gap will no longer increase with σ. y2 / σ y1 The changes can cause significant fluctuations.

[0125] In industrial applications such as static sealing, for example in steel flanges with copper gaskets, when the two rough surfaces are composed of different elasto-plastic materials, the yield strength of the harder rough surface is typically several times that of the softer rough surface, while the tangential modulus of the softer material is only a few tens to a hundredth of the material's elastic modulus. The influence of the third contact stage on the overall contact behavior of the sealing surface pair under analysis in such a material combination is negligible.

[0126] Therefore, the influence of the third contact stage on the contact behavior of the sealing surface pair to be analyzed is almost negligible. It can be approximated that the contact process of the sealing surface pair to be analyzed only needs to be divided into two stages: the first contact stage and the second contact stage.

[0127] In the first contact stage, both the first and second rough surfaces undergo only elastic deformation; therefore, the elastoplastic contact can be considered a purely elastic contact. In the second contact stage, the softer first rough surface begins to undergo plastic deformation. As the average contact pressure increases, the maximum contact pressure at the contact interface remains constant or increases slowly. The plastic deformation of the softer rough surface gradually becomes the main component of surface deformation, while the elastic deformation of the harder rough surface is relatively small and can gradually be ignored.

[0128] In one possible implementation, step 223 can be implemented as follows: determining the absolute value of the difference between the first surface height distribution function and the second surface height distribution function as the equivalent surface height distribution function of the equivalent rough surface; determining the Poisson's ratio of the target rough surface as the equivalent Poisson's ratio of the equivalent rough surface; determining the yield strength of the target rough surface as the equivalent yield strength of the equivalent rough surface; calculating the equivalent elastic modulus of the equivalent rough surface based on the Poisson's ratio and elastic modulus of the first rough surface and the Poisson's ratio and elastic modulus of the second rough surface; and determining the tangent modulus of the target rough surface as the equivalent tangent modulus of the equivalent rough surface.

[0129] Among them, the target rough surface is a rough surface with a relatively small yield strength relative to the center of the sealing surface to be analyzed.

[0130] As an example, such as Figure 11 As shown, for the elastoplastic contact between two rough surfaces with different material parameters in asymmetric contact, it can be simplified to the contact between a rigid plane and an equivalent rough surface.

[0131] The equivalent surface height distribution function of the equivalent rough surface can be calculated using the following formula (3):

[0132] h * (x,y)=h1(x,y)-h2(x,y) (3)

[0133] As an example, the formula for calculating the equivalent elastic modulus of an equivalent rough surface is:

[0134]

[0135] Among them, E * For the equivalent elastic modulus, v * For the equivalent Poisson's ratio, v1 is the Poisson's ratio of the target rough surface, v2 is the Poisson's ratio of the rough surface with the larger yield strength at the center of the sealing surface to be analyzed, E1 is the elastic modulus of the target rough surface, and E2 is the elastic modulus of the rough surface with the larger yield strength at the center of the sealing surface to be analyzed.

[0136] It should be noted that softer materials begin to yield when the contact load reaches the critical load F1. In the equivalent simplification method for elastic contact pairs, the equivalent Poisson's ratio is typically 0 (v * =0). However, in the simplified contact method for elastoplastic rough surfaces, it is necessary to ensure that the subsurface stress field of the equivalent rough surface is consistent with that of the softer material to guarantee that both the equivalent rough surface and the softer surface enter the yielding state simultaneously. This is because when two surfaces are subjected to the same load, the subsurface stress field distribution is only related to the Poisson's ratio of the material.

[0137] Assuming the first rough surface is softer than the second rough surface, i.e., the first rough surface is the target rough surface, then to ensure that the equivalent surface and the softer surface yield simultaneously, the equivalent Poisson's ratio and equivalent yield strength of the equivalent rough surface can be determined by the following formula (5):

[0138] v * =v1

[0139]

[0140] Furthermore, during the second contact stage, the softer first rough surface begins to undergo plastic deformation. As the average contact pressure increases, the maximum contact pressure at the contact interface remains unchanged or increases slowly. The plastic deformation of the softer first rough surface will gradually become the main body of surface deformation, while the elastic deformation of the harder second rough surface is relatively small and can be gradually ignored.

[0141] At this point, the yield strength and tangent modulus of the softer first rough surface become the main parameters determining the material's plastic deformation and actual contact area. When simplifying the first contact stage, the equivalent yield strength of the equivalent material is defined to be consistent with the yield strength of the softer first rough surface. Therefore, based on the equivalent simplification of the first contact stage, assuming that the equivalent rough surface and the softer first rough surface have the same strain hardening coefficient, the tangent modulus of the softer first rough surface is determined as the equivalent tangent modulus of the equivalent rough surface.

[0142] That is, the equivalent tangent modulus of the equivalent rough surface can be determined by the following formula (6):

[0143] T * =T1 (6)

[0144] Furthermore, due to σ y2 / σ y1 When σ ≥ 2, the probability of the third contact stage has decreased to the point where it can no longer significantly affect the contact behavior of the sealing surface pairs being analyzed, and the actual contact area and average contact gap will no longer increase with σ. y2 / σ y1 The yield strength of the surface can fluctuate significantly due to changes in the surface. Therefore, the equivalent treatment method provided in this application is more effective for asymmetrical contact sealing surface pairs when the ratio of the yield strength of the first rough surface to the second rough surface is greater than 2.

[0145] Step 230: Perform contact analysis on the sealing surface pair to be analyzed based on the equivalent surface information.

[0146] When performing contact analysis on the sealing surfaces to be analyzed, at least one of the following contact mechanics analysis algorithms can be used: micro-convexity model method, Persson theory method, semi-analytical method, and finite element method.

[0147] In one possible implementation, step 230 can be implemented as follows: using any of the above contact mechanics analysis algorithms, the relationship between the contact force and the actual contact area of ​​the equivalent surface pair is calculated according to the equivalent surface information, so as to obtain the actual contact area between the first rough surface and the second rough surface in the sealing surface pair to be analyzed under the same contact force.

[0148] In this embodiment, for the first and second rough surfaces in the pressure-contacting sealing surface pair to be analyzed, the original surface information of the sealing surface pair is first obtained. Then, based on the original surface information, the equivalent surface pair corresponding to the sealing surface pair to be analyzed is obtained. The equivalent surface pair includes an equivalent rough surface and a rigid plane. Then, based on the equivalent surface information, contact analysis is performed on the sealing surface pair to be analyzed. Since the actual contact area of ​​the sealing surface pair to be analyzed and the equivalent surface pair is the same under the same external force, by performing contact mechanics analysis on the sealing surface pair to be analyzed through the equivalent surface information, the force contact situation between the first and second rough surfaces in the sealing surface pair to be analyzed can be obtained. This simplifies the contact mechanics analysis process of the sealing surface pair, expands the application of elastoplastic contact mechanics analysis algorithms in engineering, and establishes a bridge between contact mechanics analysis algorithms and practical engineering applications. Moreover, by analyzing the force contact situation of the equivalent surface pair, rather than directly analyzing the force contact situation of the sealing surface pair to be analyzed, the computational efficiency of the contact mechanics analysis algorithm is improved, thereby increasing the value of the contact mechanics analysis algorithm for sealing surface pairs in engineering applications.

[0149] Furthermore, regarding the sealing surface contact analysis method shown in the above examples, in order to verify the effectiveness of the above equivalent treatment, this application uses the finite element method to establish finite element models of the sealing surface pairs to be analyzed, as follows: Figure 12 As shown; simultaneously, a finite element model of the equivalent surface pair was established, as follows. Figure 13 As shown.

[0150] exist Figure 12 In the first model, the finite element model of the sealed surface pair to be analyzed consists of two deformable elastoplastic entities (i.e., the first rough surface and the second rough surface). A contact pressure load is applied to the top surface of the model, a fixed constraint is applied to the bottom surface, and symmetrical constraints are applied to the four sides. The finite element model of the equivalent surface pair after simplification consists of a deformable elastoplastic entity (i.e., the equivalent rough surface) and a rigid plane. Similarly, a contact pressure load is applied to the top surface of the model, symmetrical constraints are applied to the four sides, and the fixed constraint is applied to the rigid plane.

[0151] Table 1 below shows the numbering, surface height distribution function, and material parameters of the four finite element models. Among them, the first and second rough surfaces in the sealing surface pair to be analyzed, numbered Contact pair 1-0, are in symmetrical contact, and the material parameters of the two rough surfaces are the same; the first and second rough surfaces in the sealing surface pair to be analyzed, numbered Contact pair 2-0, are in asymmetrical contact, and the material parameters of the two rough surfaces are different.

[0152] Correspondingly, Contact pair 1-1 is the equivalent surface pair of Contact pair 1-0, and Contact pair 2-1 is the equivalent surface pair of Contact pair 2-0. The equivalent surface height distribution function and equivalent material parameters of the equivalent rough surface in the equivalent surface pair are calculated according to the above formulas (1)-(6).

[0153] Table 1

[0154]

[0155] Among them, such as Figure 14 As shown, the upper and lower surfaces of the sealing surfaces to be analyzed, Contact pair 1-0 and Contact pair 2-0, are isotropic random rough surfaces with surface height distribution functions h1(x,y) and h2(x,y) respectively, and the surface roughness is approximately Rq1.3μm.

[0156] Solve the four finite element models in Table 1. Figure 15 The contact behavior of the sealed surface pair and the equivalent surface pair is shown when the first rough surface and the second rough surface in the sealed surface pair under analysis are in symmetrical contact.

[0157] Depend on Figure 15 As shown in (a), with the increase of contact pressure, the actual contact area between the first rough surface and the second rough surface also increases; and from Figure 15 As shown in (b), with the increase of contact pressure, the average contact gap between the first rough surface and the second rough surface decreases rapidly at first, but the rate of decrease becomes smaller and smaller.

[0158] Similarly, Figure 16 This demonstrates the contact behavior of the analyzed sealing surface pair and its equivalent surface pair when the first and second rough surfaces in the analyzed sealing surface pair are in asymmetric contact. Figure 16 As shown in (a), with the increase of contact pressure, the actual contact area between the first rough surface and the second rough surface also increases; and from Figure 16 As shown in (b), with the increase of contact pressure, the average contact gap between the first rough surface and the second rough surface decreases rapidly at first, but the rate of decrease becomes smaller and smaller.

[0159] Therefore, according to Figure 15 and Figure 16 As can be seen from the comparison, the contact behavior of the equivalent surface pair after the solution (i.e., the actual contact area and the average contact gap) is basically the same as that of the sealing surface pair to be analyzed, which proves that the equivalent simplification method for the contact problem of two elastoplastic rough surfaces under symmetrical and asymmetrical contact types provided in this application is accurate.

[0160] Furthermore, since the finite element model of the equivalent surface pair has fewer meshes than the finite element model of the sealed surface pair to be analyzed, the simulation calculation efficiency of the equivalent surface pair is higher and the configuration requirements of the computer equipment are lower.

[0161] Table 2 below shows the computation time consumed by the finite element models of the sealed surface pairs Contact pair 1-0 and Contact pair 1-1, and the equivalent surface pairs Contact pair 2-0 and Contact pair 2-1.

[0162] Table 2

[0163]

[0164] All the finite element models in Table 2 were modeled and solved on the same computer. For example, the computer had a quad-core 3.60GHz CPU.

[0165] It is evident that the computation time required to analyze the finite element model of the equivalent surface pair is 63.5%-75.3% less than that required to solve the finite element model of the sealing surface pair to be analyzed. This demonstrates that by using the equivalent simplification method provided in this application to perform contact analysis on the equivalent surface pair, rather than directly performing contact analysis on the sealing surface pair to be analyzed, the computational efficiency of the finite element method in contact mechanics calculations can be significantly improved.

[0166] Furthermore, the semi-analytical method is designed for the contact problem between rigid and elasto-plastic surfaces and cannot be directly applied to the contact analysis of two elasto-plastic rough sealing interfaces. However, this application transforms the contact problem of the two elasto-plastic rough surfaces in the pair of sealing surfaces to be analyzed into the contact problem between a rigid plane and an equivalent elasto-plastic rough surface by obtaining the equivalent surface pair corresponding to the sealing surface pair to be analyzed. A semi-analytical contact mechanics model is then established, thereby realizing the application of the semi-analytical method in the contact mechanics of static sealing interfaces.

[0167] As an example, see Table 3 below for the contact analysis results of the small-strain sealing surface pairs to be analyzed and their equivalent surface pairs using a semi-analytical method.

[0168] Table 3

[0169]

[0170] Among them, the semi-analytical method cannot directly calculate the contact behavior of the small strain sealing surface to be analyzed with Contact pair 3-0 in Table 3, but it can indirectly calculate the contact behavior of the sealing surface to be analyzed with Contact pair 3-0 by performing contact analysis on the equivalent surface information of its equivalent surface with Contact pair 3-1.

[0171] Based on equivalent surface pairs, the actual contact area of ​​the equivalent surface pairs calculated using a semi-analytical method is as follows: Figure 17 As shown in (a), the average contact gap is as follows Figure 17 As shown in (b).

[0172] In summary, by studying the contact problems of two elastoplastic rough surfaces made of the same material and two elastoplastic rough surfaces made of different materials, the contact problem of two elastoplastic rough surfaces is simplified to the contact problem of a rigid plane and an equivalent rough surface. This enables the engineering application of elastoplastic contact mechanics calculation methods, such as semi-analytical methods, which can only calculate the contact problem between hard surfaces and elastoplastic rough surfaces, thus establishing a bridge between contact mechanics analysis algorithms and practical engineering applications. Moreover, using the finite element method to perform contact analysis on the simplified modeled equivalent surface pair can significantly improve the computational efficiency of finite element contact calculations.

[0173] Based on the above-mentioned sealing surface contact analysis method, using the same technical concept, such as Figure 18 As shown in the embodiments of this application, a rough surface contact analysis device is also provided for implementing the rough surface contact analysis method described above.

[0174] In one exemplary embodiment, such as Figure 18 As shown, this application embodiment also provides a rough surface contact analysis device, the device 1800 comprising:

[0175] The information acquisition module 1810 is used to acquire the original surface information of the sealing surface pair to be analyzed; the sealing surface pair to be analyzed includes a first rough surface and a second rough surface under pressure contact;

[0176] The equivalent processing module 1820 is used to obtain the equivalent surface information of the equivalent surface pair corresponding to the sealing surface pair to be analyzed based on the original surface information. The equivalent surface pair includes an equivalent rough surface and a rigid plane. Under the same external force, the actual contact area between the sealing surface pair to be analyzed and the equivalent surface pair is the same.

[0177] The contact analysis module 1830 is used to perform contact analysis on the sealing surface pair to be analyzed based on the equivalent surface information.

[0178] In one possible implementation, the original surface information includes a first surface height distribution function and a first material parameter for a first rough surface, and a second surface height distribution function and a second material parameter for a second rough surface;

[0179] The first and second material parameters both include elastic modulus, Poisson's ratio, yield strength, and tangent modulus.

[0180] Correspondingly, the equivalent surface information includes the equivalent surface height distribution function and equivalent material parameters of the equivalent rough surface. The equivalent material parameters include the equivalent elastic modulus, equivalent Poisson's ratio, equivalent yield strength, and equivalent tangent modulus.

[0181] In one possible implementation, the equivalent processing module 1820 includes:

[0182] The contact determination unit is used to determine the contact type of the sealing surface pair to be analyzed based on the original surface information.

[0183] The equivalent processing unit is used to obtain the equivalent surface information of the equivalent surface pair based on the contact type of the sealing surface pair to be analyzed and the original surface information.

[0184] In one possible implementation, the contact determination unit is specifically used for:

[0185] If all parameters in the first and second material parameters are the same within the preset error range, then the contact type of the sealing surface pair to be analyzed is determined to be symmetrical contact.

[0186] If, within the error range, at least one of the first material parameter and the second material parameter is different, then the contact type of the sealing surface pair to be analyzed is determined to be asymmetric contact.

[0187] In one possible implementation, if the contact type of the sealing surface pair to be analyzed is symmetrical contact, then the equivalent processing unit includes:

[0188] The first morphology analysis subunit is used to obtain the absolute value of the function difference between the first surface height distribution function and the second surface height distribution function, and the product of the absolute value of the function difference and 0.5 is determined as the equivalent surface height distribution function of the equivalent rough surface.

[0189] The first material analysis subunit is used to determine the average value of the corresponding parameters in the first material parameter and the second material parameter as the equivalent material parameter of the equivalent rough surface.

[0190] In one possible implementation, if the contact type of the sealing surface pair to be analyzed is asymmetric contact, then the equivalent processing unit includes:

[0191] The second morphology analysis subunit is used to determine the absolute value of the function difference between the first surface height distribution function and the second surface height distribution function as the equivalent surface height distribution function of the equivalent rough surface.

[0192] The second material analysis subunit is used to determine the Poisson's ratio of the target rough surface as the equivalent Poisson's ratio of the equivalent rough surface; the target rough surface is a rough surface with a smaller yield strength relative to the center of the sealing surface to be analyzed; the yield strength of the target rough surface is determined as the equivalent yield strength of the equivalent rough surface; the equivalent elastic modulus of the equivalent rough surface is calculated based on the Poisson's ratio and elastic modulus of the first rough surface and the Poisson's ratio and elastic modulus of the second rough surface; and the tangent modulus of the target rough surface is determined as the equivalent tangent modulus of the equivalent rough surface.

[0193] In one possible implementation, the formula for calculating the equivalent elastic modulus of the equivalent rough surface is:

[0194]

[0195] Among them, E * For the equivalent elastic modulus, v * For the equivalent Poisson's ratio, v1 is the Poisson's ratio of the target rough surface, v2 is the Poisson's ratio of the rough surface with the larger yield strength at the center of the sealing surface to be analyzed, E1 is the elastic modulus of the target rough surface, and E2 is the elastic modulus of the rough surface with the larger yield strength at the center of the sealing surface to be analyzed.

[0196] In one possible implementation, contact analysis is performed on the sealing surface pair to be analyzed, including at least one of the following contact mechanics analysis algorithms: micro-convexity model method, Persson theory method, semi-analytical method and finite element method.

[0197] It should be understood that the sealing surface contact analysis device provided in the above embodiments is only illustrated by the division of the above functional modules when performing contact analysis on the sealing surface to be analyzed. In actual applications, the above functions can be assigned to different functional modules as needed, that is, the internal structure of the device can be divided into different functional modules to complete all or part of the functions described above.

[0198] It should be understood that the embodiments of this application can be implemented in whole or in part by software, hardware, firmware, or any combination thereof. When implemented in software, it can be implemented in whole or in part as a computer program product. The computer program product includes a computer program. When the computer program is loaded and run on a computer device, the processes or functions shown in the embodiments of this application are generated in whole or in part.

[0199] The computer program may be stored in a computer-readable storage medium or transferred from one computer-readable storage medium to another. For example, the computer program may be transferred from one website, terminal, server or data center to another website, terminal, server or data center via wired or wireless means.

[0200] The computer-readable storage medium can be any available medium that can be accessed by a computer device, or a data storage device such as a server or data center that integrates one or more available media.

[0201] It should be understood that the above are merely specific implementation methods of the embodiments of this application and are not intended to limit the protection scope of the embodiments of this application. Any modifications, equivalent substitutions, improvements, etc., made based on the technical solutions of the embodiments of this application should be included within the protection scope of the embodiments of this application.

Claims

1. A method for analyzing the contact of a sealed surface, characterized in that, include: Obtain the original surface information of the sealing surface pair to be analyzed; the sealing surface pair to be analyzed includes a first rough surface and a second rough surface under pressure contact; Based on the original surface information, the equivalent surface information of the equivalent surface pair corresponding to the sealing surface pair to be analyzed is obtained; the equivalent surface pair includes an equivalent rough surface and a rigid plane, and under the same external force, the actual contact area of ​​the sealing surface pair to be analyzed and the equivalent surface pair is the same. Based on the equivalent surface information, a contact analysis is performed on the sealing surface pair to be analyzed. The original surface information includes a first surface height distribution function and a first material parameter of the first rough surface, and a second surface height distribution function and a second material parameter of the second rough surface; Wherein, both the first material parameter and the second material parameter include elastic modulus, Poisson's ratio, yield strength and tangent modulus; Correspondingly, the equivalent surface information includes the equivalent surface height distribution function and equivalent material parameters of the equivalent rough surface, wherein the equivalent material parameters include the equivalent elastic modulus, equivalent Poisson's ratio, equivalent yield strength and equivalent tangent modulus; The step of obtaining the equivalent surface information of the equivalent surface pair corresponding to the sealed surface pair to be analyzed based on the original surface information includes: Based on the original surface information, determine the contact type of the sealing surface pair to be analyzed; If all parameters in the first material parameter and the second material parameter are the same within the preset error range, then the contact type of the sealing surface pair to be analyzed is determined to be symmetrical contact. If, within the error range, at least one of the first material parameters and the second material parameters is different, then the contact type of the sealing surface pair to be analyzed is determined to be asymmetric contact. Based on the contact type of the sealing surface pair to be analyzed, and according to the original surface information, the equivalent surface information of the equivalent surface pair is obtained. If the contact type of the sealing surface pair to be analyzed is asymmetric contact, then obtaining the equivalent surface information of the equivalent surface pair based on the original surface information includes: The absolute value of the difference between the first surface height distribution function and the second surface height distribution function is determined as the equivalent surface height distribution function of the equivalent rough surface. The Poisson's ratio of the target rough surface is determined as the equivalent Poisson's ratio of the equivalent rough surface; the target rough surface is the rough surface with the smaller yield strength at the center of the sealing surface to be analyzed. The yield strength of the target rough surface is determined as the equivalent yield strength of the equivalent rough surface; The equivalent elastic modulus of the equivalent rough surface is calculated based on the Poisson's ratio and elastic modulus of the first rough surface and the Poisson's ratio and elastic modulus of the second rough surface. The tangent modulus of the target rough surface is determined as the equivalent tangent modulus of the equivalent rough surface. The formula for calculating the equivalent elastic modulus of the equivalent rough surface is as follows: in, The equivalent elastic modulus, The equivalent Poisson's ratio, The Poisson's ratio of the target rough surface. The Poisson's ratio of the rough surface with the higher yield strength at the center of the sealing surface to be analyzed is given. The elastic modulus of the target rough surface. The elastic modulus is the rough surface with the larger yield strength at the center of the sealing surface to be analyzed.

2. The method according to claim 1, characterized in that, If the contact type of the sealing surface pair to be analyzed is symmetrical contact, then obtaining the equivalent surface information of the equivalent surface pair based on the original surface information includes: Obtain the absolute value of the function difference between the first surface height distribution function and the second surface height distribution function, and determine the product of the absolute value of the function difference and 0.5 as the equivalent surface height distribution function of the equivalent rough surface; The average value of the corresponding parameters in the first material parameter and the second material parameter is determined as the equivalent material parameter of the equivalent rough surface.

3. The method according to claim 1 or 2, characterized in that, The contact analysis of the sealing surface pair to be analyzed includes at least one of the following contact mechanics analysis algorithms: micro-convexity model method, Persson theory method, semi-analytical method and finite element method.

4. A sealed surface contact analysis device, characterized in that, include: The information acquisition module is used to acquire the original surface information of the sealing surface pair to be analyzed; The sealing surface pair to be analyzed includes a first rough surface and a second rough surface that are under pressure contact; The equivalent processing module is used to obtain the equivalent surface information of the equivalent surface pair corresponding to the sealing surface pair to be analyzed based on the original surface information; the equivalent rough surface pair includes an equivalent rough surface and a rigid plane, and under the same external force, the actual contact area of ​​the sealing surface pair to be analyzed and the equivalent surface pair is the same. The contact analysis module is used to perform contact analysis on the sealing surface pair to be analyzed based on the equivalent surface information. The original surface information includes a first surface height distribution function and a first material parameter of the first rough surface, and a second surface height distribution function and a second material parameter of the second rough surface; Wherein, both the first material parameter and the second material parameter include elastic modulus, Poisson's ratio, yield strength and tangent modulus; Correspondingly, the equivalent surface information includes the equivalent surface height distribution function and equivalent material parameters of the equivalent rough surface, wherein the equivalent material parameters include the equivalent elastic modulus, equivalent Poisson's ratio, equivalent yield strength and equivalent tangent modulus; The step of obtaining the equivalent surface information of the equivalent surface pair corresponding to the sealed surface pair to be analyzed based on the original surface information includes: Based on the original surface information, determine the contact type of the sealing surface pair to be analyzed; If all parameters in the first material parameter and the second material parameter are the same within the preset error range, then the contact type of the sealing surface pair to be analyzed is determined to be symmetrical contact. If, within the error range, at least one of the first material parameters and the second material parameters is different, then the contact type of the sealing surface pair to be analyzed is determined to be asymmetric contact. Based on the contact type of the sealing surface pair to be analyzed, and according to the original surface information, the equivalent surface information of the equivalent surface pair is obtained. If the contact type of the sealing surface pair to be analyzed is asymmetric contact, then obtaining the equivalent surface information of the equivalent surface pair based on the original surface information includes: The absolute value of the difference between the first surface height distribution function and the second surface height distribution function is determined as the equivalent surface height distribution function of the equivalent rough surface. The Poisson's ratio of the target rough surface is determined as the equivalent Poisson's ratio of the equivalent rough surface; the target rough surface is the rough surface with the smaller yield strength at the center of the sealing surface to be analyzed. The yield strength of the target rough surface is determined as the equivalent yield strength of the equivalent rough surface; The equivalent elastic modulus of the equivalent rough surface is calculated based on the Poisson's ratio and elastic modulus of the first rough surface and the Poisson's ratio and elastic modulus of the second rough surface. The tangent modulus of the target rough surface is determined as the equivalent tangent modulus of the equivalent rough surface. The formula for calculating the equivalent elastic modulus of the equivalent rough surface is as follows: in, The equivalent elastic modulus, The equivalent Poisson's ratio, The Poisson's ratio of the target rough surface. The Poisson's ratio of the rough surface with the higher yield strength at the center of the sealing surface to be analyzed is given. The elastic modulus of the target rough surface. The elastic modulus is the rough surface with the larger yield strength at the center of the sealing surface to be analyzed.

5. A computer device, characterized in that, The method includes a memory and a processor, the memory storing a computer program, characterized in that the processor invokes and executes the computer program from the memory to implement the steps of any one of claims 1-3.

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