A laser addressing device, method and system of trapped particles

Abstract

The application discloses a laser addressing device, a method and a system of trapped particles, which can reduce the requirements and cost of a focusing lens, improve the scalability, and thus can meet laser addressing of more particles. The device comprises a first laser generation module, which is used for generating frequency-shifted light and emitting the frequency-shifted light to a first focusing module; the first focusing module is used for focusing the received frequency-shifted light, and emitting the focused frequency-shifted light to a plurality of particles in the system with the target particle as the center; the plurality of particles are irradiated by the frequency-shifted light and have different frequency shifts; a second laser generation module is used for generating control light and emitting the control light to a second laser control module; the second laser control module is used for controlling the frequency of the control light and emitting the control light to the target particle in the system in a sweep frequency light mode; the sweep frequency light is control light which is based on the original frequency of the target particle before the frequency shift and changes in a specified frequency range.

Description

Technical Field

[0001] This application relates to the field of quantum computing technology, and in particular to a laser addressing device, method and system for trapping particles. Background Technology

[0002] In the current field of quantum computing and quantum simulation, ion trap systems are one of the commonly used experimental platforms. Ion trap systems utilize ultra-high vacuum environments and employ electrodes of specific shapes to create radio frequency and electrostatic fields, thereby using the electric field to confine and trap charged ions. Bound by the electric field, the ions are stably trapped in the central region of the ion trap and arranged regularly into one-dimensional ion chains (e.g., ...). Figure 1 As shown, ions in a vacuum cavity can arrange themselves into a one-dimensional ionic chain structure or a two-dimensional ionic lattice. Figure 1 (Not shown), or even higher-dimensional ionic structures.

[0003] Ions typically have multiple energy levels. Generally, a specific pair of upper and lower energy levels can be chosen from these levels to represent the two states of a qubit, i.e., |0> or |1> (Dirac notation). For example, see [reference needed]. Figure 2 This diagram illustrates an ion energy level. By using a laser of a specific frequency, ions can undergo energy level transitions, for example, from a lower energy level to a higher energy level. In other words, by irradiating ions with a laser of a specific frequency, the qubits of an ion can be flipped between the states |0> and |1>. In practical applications, to manipulate the qubit state of a specific ion in an ion chain or ion crystal, laser addressing technology is required to ensure that the laser can affect only one specific ion.

[0004] Existing laser addressing methods generally involve first passing the laser through a lens group with strong focusing capabilities to focus the laser spot to a small level, making the spot diameter smaller than the distance between two ions. Then, by adjusting the laser's transmission direction, the center of the laser spot is aligned with the position of a specific ion, ensuring that the laser only illuminates that one ion and does not affect adjacent ions. However, current laser addressing methods are limited by the requirement for strong focusing, resulting in high demands on the focusing lens, high cost, and poor scalability due to a small working field of view. Summary of the Invention

[0005] This application provides a laser addressing device, method, and system for trapping particles, which can reduce the requirements and costs of focusing lenses, improve scalability, and thus meet the laser addressing needs of more particles (particles can be, for example, atoms or ions).

[0006] In a first aspect, embodiments of this application provide a laser addressing device applied to a particle trapping system (e.g., an ion trap system or an atomic trap system), comprising: a first laser generating module, a first focusing module, a second laser generating module, and a second laser control module; the first laser generating module is used to generate frequency-shifted light and emit the frequency-shifted light to the first focusing module; the first focusing module is used to focus the received frequency-shifted light and emit the focused frequency-shifted light to multiple particles centered on a target particle in the system; wherein, the multiple particles undergo different frequency shifts after being irradiated by the frequency-shifted light; the second laser generating module is used to generate modulation light and emit the modulation light to the second laser control module; the second laser control module is used to modulate the frequency of the modulation light and emit it to the target particle in the system using a frequency-sweeping light method; wherein, the frequency-sweeping light is a modulation light that varies within a specified frequency range based on the original frequency of the target particle before the frequency shift.

[0007] This device eliminates the need for a focusing module with high focusing capability. By irradiating multiple particles centered on a target particle with frequency-shifted light, frequency shifting of the irradiated particles can be achieved. Furthermore, since the frequency-shifted light is a Gaussian spot with varying intensity at different positions, the target particle irradiated by the frequency-shifted light will have a different frequency shift than other particles, thus distinguishing the target particle from others by frequency. Further, by controlling the frequency of the control light, it can be emitted as a frequency-sweeping beam onto the target particle in the trapped particle system. When the frequency of the control light matches the frequency of the particle irradiated by the frequency-shifted light, energy level transitions can occur, enabling laser addressing of target particles with different frequency shifts. Therefore, the laser addressing device provided in this application, compared to related technologies, reduces the requirements and cost of the focusing lens; and because the focusing module has low focusing capability, its working field of view can be expanded, thereby extending the area of ​​free movement of the laser spot and enabling laser addressing of more particles.

[0008] In one possible design, the device further includes: a first laser control module; the first laser control module is located between the first laser generating module and the first focusing module, and is used to change the transmission direction of the frequency-shifted light from the first laser generating module and emit the frequency-shifted light to the first focusing module. This design allows for flexible irradiation of target particles with frequency-shifted light. Based on the position of the target particle within the trapped particle system, the transmission direction of the frequency-shifted light can be controlled to ensure that the frequency-shifted light irradiates the target particle more accurately, thereby improving the accuracy of laser addressing.

[0009] In one possible design, the first laser control module is further configured to split the frequency-shifted light into N sub-frequency-shifted light beams, where N is a positive integer; the first laser control module is configured to change the transmission direction of the frequency-shifted light from the first laser generation module, specifically by changing the transmission direction of each of the N sub-frequency-shifted light beams. This design allows for the simultaneous addressing of multiple target particles, thereby improving the efficiency of laser addressing.

[0010] In one possible design, the device further includes: a third laser control module and a second focusing module; the second laser control module is further configured to split the modulated light into M sub-modulated light beams, and emit the M sub-modulated light beams to the third laser control module, where M is a positive integer; the third laser control module is configured to change the transmission direction of the received M sub-modulated light beams respectively, and emit the M sub-modulated light beams to the second focusing module; the second focusing module is configured to focus the received M sub-modulated light beams, and emit the focused M sub-modulated light beams to the irradiation areas of the corresponding sub-frequency-shifting light beams respectively. This design corresponds to the multi-beam frequency-shifting light in the previous design, simultaneously achieving laser addressing of multiple target particles, thereby improving the efficiency of laser addressing.

[0011] In one possible design, the second laser control module is used to regulate the frequency of the control light and emit it onto the target particles in the system using a frequency-sweeping method. Specifically, it is used to: regulate the frequency of each of the M control light beams and emit them onto the irradiation areas of the corresponding sub-frequency-shifting beams in the system using a frequency-sweeping method. With this design, in scenarios involving laser addressing of multiple target particles, the frequency of the sub-control light can be adjusted individually, thereby enabling addressing of multiple target particles separately using the sub-control light.

[0012] In one possible design, the second laser control module is used to emit frequency-sweeping light onto the target particle in the system. Specifically, it is used to emit frequency-sweeping light onto multiple particles in the system, including the target particle. This design also allows for the control of light irradiating all particles in the system containing the trapped particle. By controlling the frequency of the control light, energy level transitions can be achieved on particles with the same frequency, enabling laser addressing of the target particle based on the resulting energy level transitions. It is understood that since the frequency-sweeping light irradiates the target particle, the target particle located in the central spot receives the strongest light intensity, resulting in a significant frequency shift. Thus, when the frequency-sweeping light irradiates the region containing the target particle, the frequency shift that causes energy level transitions in the target particle is large, and the excitation time is short. For example, if multiple particles may undergo energy level transitions during the process of the control light being emitted to the target particle in the system using a frequency-sweeping method, then the particle with the largest frequency offset of the control light relative to the original frequency of the particle or the shortest excitation time at the time of the energy level transition can be identified as the target particle.

[0013] In one possible design, the particle structure in the system is a particle chain structure (e.g., an ionic chain structure or an atomic chain structure); the device further includes a reflector; the reflector is used to reflect the control light from the second laser control module, so as to emit the reflected control light along the particle chain direction onto the multiple particles contained in the system. This design provides a specific implementation method that enables control light to irradiate all particles in a system containing trapped particles. In a scenario where the particles in the system constitute a one-dimensional particle chain structure, irradiation of all particles can be achieved by incident control light along the particle chain direction, thereby ensuring that the frequency-controlled control light can achieve laser addressing of the target particles.

[0014] Secondly, embodiments of this application provide a laser addressing method applied to a system for trapping particles, comprising: generating frequency-shifting light; focusing the frequency-shifting light and emitting the focused frequency-shifting light onto a plurality of particles in the system centered on a target particle; wherein the plurality of particles undergo different frequency shifts after being irradiated by the frequency-shifting light; generating modulation light; modulating the frequency of the modulation light and emitting it onto the target particle in the system using a frequency-sweeping light method; wherein the frequency-sweeping light is a modulation light that varies within a specified frequency range based on the original frequency of the target particle before the frequency shift.

[0015] In one possible design, before focusing the frequency-shifted light, the method further includes changing the transmission direction of the frequency-shifted light.

[0016] In one possible design, the method further includes: splitting the frequency-shifting light into N sub-frequency-shifting light beams, where N is a positive integer; and changing the transmission direction of the received frequency-shifting light beams includes: changing the transmission direction of each of the N sub-frequency-shifting light beams.

[0017] In one possible design, the method further includes: splitting the modulation light into M sub-modulation lights, where M is a positive integer; changing the transmission direction of the received M sub-modulation lights respectively; focusing the received M sub-modulation lights; and emitting the focused M sub-modulation lights to the illumination areas of the corresponding sub-frequency shift lights respectively.

[0018] In one possible design, the modulation of the frequency of the modulating light and its emission onto the target particle in the system using a frequency-sweeping method includes: modulating the frequency of each of the M beams of modulating light and emitting them onto the corresponding sub-frequency-shifting light irradiation areas in the system using a frequency-sweeping method.

[0019] In one possible design, the emission of light to the target particle in the system using a frequency-sweeping method includes: emitting light to a plurality of particles contained in the system using a frequency-sweeping method, wherein the plurality of particles include the target particle.

[0020] In one possible design, the particle structure in the system is a particle chain structure; the method further includes: reflecting the control light to emit the reflected control light along the particle chain direction onto multiple particles contained in the system.

[0021] Thirdly, embodiments of this application provide a system for trapping particles, including a particle trapping module and a laser addressing device as in any possible design of the first aspect; the particle trapping module is used to trap particles.

[0022] For details on the beneficial effects of the second and third aspects, please refer to the beneficial effects of each possible design in the first aspect; they will not be repeated here. Attached Figure Description

[0023] Figure 1 The diagram shown is a schematic representation of the central region of an ion trap system.

[0024] Figure 2 This is a schematic diagram of a particle energy level;

[0025] Figure 3 This is a schematic diagram of a commonly used laser addressing method;

[0026] Figure 4 This is a schematic diagram of another commonly used laser addressing method;

[0027] Figure 5a This is one of the structural schematic diagrams of a laser addressing device provided in an embodiment of this application;

[0028] Figure 5b This is a second schematic diagram of the structure of a laser addressing device provided in an embodiment of this application;

[0029] Figure 6 The diagram shown is a schematic representation of a frequency-shifted light according to an embodiment of this application.

[0030] Figure 7 This is the third schematic diagram of a laser addressing device provided in the embodiments of this application;

[0031] Figure 8 Fourth schematic diagram of a laser addressing device provided in the embodiments of this application;

[0032] Figure 9 This is a schematic flowchart of a laser addressing method provided in an embodiment of this application. Detailed Implementation

[0033] The embodiments of this application can be applied to various technologies for laser addressing, such as in systems for trapping particles (e.g., ion trap systems, atomic trap systems, etc.) or in other forms of particle aggregates (e.g., particle sites in crystals), to achieve various technologies for laser addressing of particles.

[0034] The following embodiments use a system applied to trapping particles as an example to describe the embodiments of this application.

[0035] Based on the description in the background section, in order to manipulate the qubit state of a specific ion in an ion chain or ion crystal, laser addressing technology is required to ensure that the laser can affect only one specific ion. It should be noted that... Figure 2 The example shown is a particle (using an ion as an example) with two energy levels. In practical applications, a particle can have multiple energy levels; the energy level with the lowest energy can be called the "ground state", and the other energy levels can be called "excited states".

[0036] See Figure 3This diagram illustrates a commonly used laser addressing method. In this related technology, the laser beam is first focused to a small horizontal level by a lens group with strong focusing effect, making the laser spot diameter smaller than the distance between two ions. Then, by adjusting the laser's transmission direction, the center of the laser spot can be aligned with the position of a specific ion, ensuring that the laser only illuminates this one ion and does not affect adjacent ions. For example, suppose... Figure 3 In ion trap systems, the specific ion is the central ion of a one-dimensional ion chain. When the laser beam is transmitted to the one-dimensional ion chain in the vacuum cavity, it can be directed only to this central ion without affecting the adjacent ions, thus enabling laser addressing of the central ion. However, since the spacing between ions in ion trap systems is typically around a few micrometers, focusing the laser beam to such a small level places high demands on the focusing lens and is costly. Furthermore, with a large number of ions, even lenses with high focusing capabilities often have a small working field of view, meaning the area where the laser beam can move freely is small. This results in a limited number of tunable ions, hindering the expansion of the number of qubits.

[0037] and Figure 3 The principle of the laser addressing method shown is similar. Figure 4 A schematic diagram of another commonly used laser addressing method is shown. This related technology is... Figure 3 The method shown also requires a lens group with strong focusing capabilities to focus the laser spot to a small level. The difference lies in the shape of the laser spot, which can be elliptical, with the minor axis along the ion chain direction and the major axis perpendicular to it. However, along the ion chain direction, the laser spot diameter still needs to be smaller than the distance between two ions to ensure that the laser only illuminates one ion. Therefore, this related technology also suffers from high requirements for the focusing lens, high cost, and poor scalability due to a small working field of view.

[0038] In view of this, embodiments of this application provide a laser addressing device. This laser addressing device can be applied to a system for trapping particles as the control part for laser addressing of the system. Through multiple modules such as multiple laser generation modules, multiple laser control modules, and a focusing module, laser addressing of specific particles (hereinafter referred to as "target particles") in the vacuum cavity of the system for trapping particles can be realized.

[0039] The present application will now be described in further detail with reference to the accompanying drawings and several embodiments.

[0040] It should be noted that in this application, "at least one" refers to one or more, and "more than one" refers to two or more. It is understood that the various numerical designations used in this application are merely for descriptive convenience and are not intended to limit the scope of the embodiments of this application. The order of the process numbers described above does not imply the order of execution; the execution order of each process should be determined by its function and internal logic. The terms "first," "second," etc., are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence.

[0041] See Figure 5a This is a schematic diagram of a laser addressing device provided in an embodiment of this application. The device can be applied to a particle trapping system to perform laser addressing of specific particles contained in the vacuum cavity 506 of the trapping system. The device may include: a first laser generation module 501, a first focusing module 503, a second laser generation module 504, and a second laser control module 505.

[0042] It should be understood that the laser addressing device is not limited during implementation. Figure 5a The modules included can contain more than Figure 5a The laser addressing device shown in this application includes more modules or units; furthermore, the modules or units included in the laser addressing device are merely a logical functional division, and there may be other division methods in actual implementation. For example, multiple modules or units may be combined or integrated into another system, or some specific functions may be ignored or not executed.

[0043] On one hand, the first laser generating module 501 can generate frequency-shifted light. For example, the first laser generating module 501 can be a laser or other device capable of generating frequency-shifted light. The frequency-shifted light can be a type of laser. In implementation, when the frequency-shifted light irradiates a particle, based on the Stark effect, Zeeman effect, etc., the frequency of the particle can be changed, causing a certain shift (or change) in the particle's frequency. For example, if a particle's original frequency is F, and after being irradiated by frequency-shifted light, the frequency shift is ΔF, then the shifted frequency of the particle can be F + ΔF. The change in particle frequency can be positively correlated with the intensity of the frequency-shifted light received by the particle. In other words, when a particle is irradiated by frequency-shifted light, the change in frequency increases with the increase of the intensity of the frequency-shifted light.

[0044] Laser beams are typically Gaussian beams, and the Gaussian spot corresponding to a Gaussian beam has different intensities at the center and edges. Frequency-shifted light, as a type of Gaussian beam, exhibits higher intensity in the central region of the Gaussian spot and lower intensity at the edges when illuminating multiple particles in a trapped particle system. Therefore, the frequency change of particles in the central region is greater than that of particles at the edges. For example, Figure 6 The diagram shown illustrates a frequency-shifted light according to an embodiment of this application. The frequency-shifted light emitted onto a one-dimensional particle chain can form a Gaussian spot. The diameter of this Gaussian spot can be larger than the distance between two particles, meaning the Gaussian spot can illuminate multiple particles; for example... Figure 6 A Gaussian light spot illuminates three particles. The central region of the Gaussian light spot has a stronger light intensity, illuminating the central particle of the one-dimensional particle chain; the edge region of the Gaussian light spot has a weaker light intensity than the central region, illuminating the adjacent particles of the central particle. It can be understood that because the light intensities of the Gaussian light spots differ between the central particle and its two adjacent particles, the frequencies of the particles after frequency shifting also differ, thus allowing them to be distinguished from other particles by the frequency of the central particle. In this application, after changing the particle frequency by frequency-shifting light, it can be combined with the control light generated by the second laser generation module 504 to achieve laser addressing of the target particles. The specific implementation method is described in detail in the following embodiments and will not be elaborated here.

[0045] It should be understood that frequency-shifted light can be a Gaussian beam or a laser with other distribution characteristics, as long as the multiple particles being irradiated have different frequency shifts.

[0046] The first focusing module 503 can receive frequency-shifted light from the first laser control module 502 and focus the frequency-shifted light. For example, the first focusing module 503 can be a focusing lens group, or a freeform surface with focusing capability, etc., and this application does not limit this. It should be understood that, in implementation of this application, it is not necessary for the first focusing module 503 to have a high focusing capability; the focused frequency-shifted light can be emitted onto multiple particles centered on the target particle in the trapped particle system. Thus, compared to the prior art, where the focusing lens needs to have a high focusing capability and the focused laser needs to be smaller than the distance between two particles to achieve the requirement of irradiating a single particle, this application can reduce the requirements for the focusing module, thereby reducing costs.

[0047] Furthermore, in implementation of this application, the focusing capability of the first focusing module 503 can be adjusted, and it can have non-fixed parameters such as focal length and working field of view, thereby allowing for adaptive adjustments according to different laser addressing scenarios. Therefore, the method provided by the embodiments of this application can improve the scalability of laser addressing.

[0048] Optionally, to improve the flexibility and accuracy of laser addressing of target particles by the frequency-shifted light from the first laser generation module 501, in this application, the laser addressing device can also control the transmission mode of the frequency-shifted light through the first laser control module 502. (See also...) Figure 5b This is a schematic diagram of another laser addressing device provided in an embodiment of this application. The first laser control module 502 can receive frequency-shifted light from the first laser generation module 501 and control the transmission direction of the frequency-shifted light. Optionally, the first laser control module 502 can regulate the frequency-shifted light based on the target particle to ensure that the transmission direction of the regulated frequency-shifted light can irradiate the target particle. For example, the first laser control module 502 can adjust the angle of the frequency-shifted light according to the position of the target particle in the vacuum cavity. Furthermore, when the frequency-shifted light does not accurately irradiate the target particle, it can also be adaptively adjusted according to the irradiation result of the frequency-shifted light. Exemplarily, the first laser control module 502 can be a mirror group or an acousto-optic deflector, etc., and this application does not limit it in this way.

[0049] On the other hand, the second laser generating module 504 can generate controllable light. For example, the second laser generating module 504 can be a laser, or other device capable of generating controllable light. The controllable light can be a laser.

[0050] The second laser control module 505 can receive the modulation light from the second laser generation module 504 and control the frequency of the modulation light. Optionally, the second laser control module 505 can emit frequency-sweeping light onto the target particle in the system; wherein the frequency-sweeping light is modulation light that varies within a specified frequency range based on the original frequency of the target particle before the frequency shift occurs.

[0051] For example, the second laser control module 505 can pre-acquire the original frequency of the target particle in the trapped particle system before frequency shift occurs (i.e., before irradiation by the frequency-shifting light), denoted as F0. Typically, the original frequencies of the particles in a trapped particle system are the same; therefore, the original frequency of any particle in the trapped particle system can be acquired to obtain the original frequency of the target particle. Secondly, the second laser control module 505 can determine the specified frequency range of the sweeping light based on the intensity of the frequency-shifting light generated by the first laser generation module 501. Wherein, the greater the intensity of the frequency-shifting light, the larger the specified frequency range of the sweeping light can be; assuming the specified frequency range can be represented by ±ΔF. The second laser control module 505 can control the frequency of the control light within the frequency range of [F0-ΔF, F0+ΔF], i.e., emit using a sweeping light method. Alternatively, the specified frequency range can also be pre-configured; this application does not limit this. In this way, when the particle frequency in the trapped particle system is the same as the frequency of the control light, an energy level transition can occur, which can then be detected, i.e., laser addressing can be achieved.

[0052] It should be noted that during the process of the second laser control module 505 emitting the control light to the target particle in the system of the trapped particles using a frequency-sweeping method, multiple particles may undergo energy level transitions. For example, if a particle has a frequency of F0 + ΔF / 2, an energy level transition will also occur when the frequency of the control light is F0 + ΔF / 2. In this application, the particle with the highest frequency of the control light corresponding to the energy level transition is determined from among the multiple particles that undergo energy level transitions as the target particle. For example, if a particle undergoes an energy level transition when the frequency of the control light is F0 + ΔF or F0 - ΔF, based on the foregoing description, the target particle will have the largest frequency shift after being irradiated by the frequency-shifting light. Therefore, the particle that undergoes an energy level transition at this time can be determined as the target particle, thereby enabling the addressing of the target particle.

[0053] The laser addressing device provided in this application embodiment eliminates the need for a focusing module with high focusing capability. Based on the irradiation of multiple particles centered on a target particle by frequency-shifted light, frequency shifting of the irradiated particles can be achieved. Furthermore, since the frequency-shifted light is a Gaussian spot with varying intensity at different positions, the target particle irradiated by the frequency-shifted light will have a different frequency shift than other particles, thus distinguishing the target particle from others by frequency. Further, by controlling the frequency of the control light, it can be emitted to the target particle in the trapped particle system using a frequency-sweeping method. When the frequency of the control light matches the frequency of the particle irradiated by the frequency-shifted light, energy level transitions can occur in the particle, enabling laser addressing of target particles with different frequency shifts. Therefore, the laser addressing device provided in this application embodiment, compared to related technologies, reduces the requirements and cost of the focusing lens; and because the focusing module has low focusing capability, its working field of view can be expanded, thereby extending the area of ​​free movement of the laser spot and satisfying laser addressing of more particles.

[0054] To better understand the laser addressing device provided in the embodiments of this application, the following provides a detailed description through two possible implementation methods.

[0055] An alternative implementation method is described in the following document. Figure 7 This is a schematic diagram of another laser addressing device provided in an embodiment of this application. On one hand, the first laser generating module 501 can generate frequency-shifted light and transmit it to the first laser control module 502. The first laser control module 502 can control the transmission direction of the frequency-shifted light according to the target particle.

[0056] Optionally, there can be multiple target particles. The first laser control module 502 can split the frequency-shifting light into N sub-frequency-shifting light beams, where N can be any positive integer. For example, the first laser control module 502 can be a multi-channel acousto-optic deflector. Figure 7 The first laser control module 502 divides the frequency-shifting light into three sub-frequency-shifting beams. The first laser control module 502 can adjust the transmission direction of each sub-frequency-shifting beam. For example, the transmission direction of the first sub-frequency-shifting beam can be adjusted to point to the top particle of the one-dimensional particle chain, the transmission direction of the second sub-frequency-shifting beam can be adjusted to point to the center particle of the one-dimensional particle chain, and the transmission direction of the third sub-frequency-shifting beam can be adjusted to point to the bottom particle of the one-dimensional particle chain.

[0057] Alternatively, the first laser control module 502 can also control the power and other parameters of each sub-frequency shift beam separately. This can be set according to the actual situation during implementation, and this application does not limit it.

[0058] Along the propagation direction of the frequency-shifted light, before it is emitted into the vacuum cavity of the system trapping the particles, in this embodiment, each sub-frequency-shifted light can be focused by the first focusing module 503, thereby converging the beams of the sub-frequency-shifted light and avoiding beam divergence caused by propagation. Then, after passing through the first focusing module 503, the sub-frequency-shifted light can be emitted separately onto multiple particles containing the target particle at the center of the particle trap. The particles irradiated by the frequency-shifted light can undergo different frequency shifts, thus obtaining target particles with frequencies different from other particles.

[0059] On the other hand, the second laser generating module 504 can generate control light and emit the control light to the second laser control module 505.

[0060] The second laser control module 505 can regulate the frequency of the modulation light and emit it onto the target particle in the trapped particle system using a frequency-sweeping method. Optionally, based on the first laser control module 502 splitting the frequency-shifting light, the second laser control module 505 can also split the modulation light into M sub-modulation beams, where M is a positive integer. For example, the M sub-modulation beams can correspond one-to-one with N sub-frequency-shifting beams, i.e., M and N are equal; another example is that the M modulation beams can each have a corresponding sub-frequency-shifting beam. For example, the second laser control module 505 can be a multi-channel acousto-optic modulator. Figure 7 The second laser control module 505 can also divide the control light into three sub-control lights. The second laser control module 505 can control the frequency of the M-beam control light respectively, and emit them to the irradiation area of ​​the corresponding sub-frequency shift light in the system of the trapped particles in a frequency sweeping manner. For example, if it is determined that the particle at the top of the one-dimensional particle chain receives a stronger intensity of frequency-shifted light, then a sweep beam with a frequency range varying within a larger specified frequency range based on the particle's original frequency can be used, for example, the frequency range of the sweep beam could be [F0-3ΔF, F0+3ΔF]. If the particle in the middle of the one-dimensional particle chain receives a weaker intensity of frequency-shifted light, then a sweep beam with a frequency range varying within a medium specified frequency range based on the particle's original frequency can be used, for example, the frequency range of the sweep beam could be [F0-2ΔF, F0+2ΔF]. If the particle at the bottom of the one-dimensional particle chain receives the weakest intensity of frequency-shifted light, then a sweep beam with a frequency range varying within a smaller specified frequency range based on the particle's original frequency can be used, for example, the frequency range of the sweep beam could be [F0-ΔF, F0+ΔF]. Alternatively, if the intensities of the three frequency-shifted beams are the same, then a sweep beam with a frequency range varying within the same specified frequency range based on the particle's original frequency can be used; this application does not impose any limitations on this.

[0061] Then, the second laser control module 505 can emit the three beams of modulated light to the third laser control module 507 respectively. The third laser control module 507 can then control the transmission direction of the three beams of modulated light respectively. For example, combined with Figure 7 As shown, if the three beams of sub-control light have different frequency ranges, the third laser control module 507 can control the transmission direction of the sub-control light with a frequency range of [F0-3△F, F0+3△F] to point to the top particle of the one-dimensional particle chain, the sub-control light with a frequency range of [F0-2△F, F0+2△F] to point to the center particle of the one-dimensional particle chain, and the sub-control light with a frequency range of [F0-△F, F0+△F] to point to the bottom particle of the one-dimensional particle chain. Alternatively, if the three beams of sub-control light have the same frequency range, the third laser control module 507 can control the transmission direction of the three beams of sub-control light to point to the top particle of the one-dimensional particle chain, the center particle of the one-dimensional particle chain, and the bottom particle of the one-dimensional particle chain, respectively.

[0062] Similarly, along the transmission direction of the control light, before it is emitted into the vacuum cavity of the system trapping the particles, in this embodiment, each sub-control light can be focused by the second focusing module 508, thereby converging the beams of the sub-control light and avoiding beam divergence due to transmission. Then, after passing through the second focusing module 508, the sub-control light can be emitted onto multiple particles containing the target particle at the center of the particle trap. It is understood that in this embodiment, the focusing capability requirements of the second focusing module 508 are relatively low, thus reducing the cost of the focusing module.

[0063] It should be understood that during the process of the control light being emitted onto the target particle in the system of the trapped particle using a frequency-sweeping method, the control light and the frequency-shifting light can usually irradiate the same area, thereby enabling accurate and effective laser addressing of the target particle.

[0064] Another alternative implementation method is described in the following document. Figure 8 This is a schematic diagram of another laser addressing device provided in an embodiment of this application. In this embodiment, the processing method of the frequency-shifted light is similar to... Figure 7 The implementation method is similar, but the control of the light can be carried out without the need for beam splitting and transmission direction control.

[0065] For example, the second laser generating module 504 can generate control light and emit the control light to the second laser control module 505.

[0066] The second laser control module 505 can control the frequency of the control light and emit it to the target particle in the trapped particle system using a frequency-sweeping method. Figure 7 In the example, the second laser control module 505 can modulate the control light to obtain control light that varies within a specified frequency range based on the original frequency before the target particle undergoes a frequency shift.

[0067] Then, the second laser control module 505 can emit the control light in a frequency-sweeping manner onto all the particles in the trapped particle system. In this way, when the particles in the trapped particle system have the same frequency as the control light, energy level transitions can occur, which can be detected, that is, laser addressing of the particles can be achieved.

[0068] Taking a one-dimensional particle chain as an example, the second laser control module 505 can direct the control light along the direction of the one-dimensional particle chain to ensure that all particles in the one-dimensional particle chain can be irradiated by the control light. Optionally, a mirror 509 can be used to control the transmission direction of the control light between the second laser control module 505 and the vacuum cavity of the particle-trapped system, so that all particles in the one-dimensional particle chain can be irradiated by the control light. For example, if the direction of the control light output by the second laser control module 505 is perpendicular to the direction of the one-dimensional particle chain, the transmission direction of the control light can be changed by using a mirror with a specified angle to the direction of the one-dimensional particle chain. In this way, the control light with a specific frequency can irradiate all particles in the particle-trapped system, but can only affect particles with the same frequency. Therefore, the embodiments of this application can achieve laser addressing of target particles by using frequency-shifting light and control light, and do not require a focusing lens with high focusing capability, thereby reducing the requirements and cost of the focusing lens.

[0069] Based on the same inventive concept, embodiments of this application provide a laser addressing method. See also... Figure 9 This may include the following steps:

[0070] Step 901: Generate frequency-shifted light.

[0071] In one possible example, the transmission direction of the frequency-shifted light can also be changed during implementation of this application. This allows for flexible irradiation of the target particle with frequency-shifted light. Based on the position of the target particle within the trapped particle system, the transmission mode of the frequency-shifted light can be adjusted to ensure accurate irradiation centered on the target particle, thereby improving the accuracy of laser addressing.

[0072] In another possible example, the frequency-shifted light can be split into N sub-frequency-shifted light beams, where N is a positive integer. This allows for simultaneous addressing of multiple target particles, thereby improving the efficiency of laser addressing.

[0073] In this example, changing the transmission direction of the frequency-shifted light can be implemented by changing the transmission direction of the received N sub-beams of frequency-shifted light respectively.

[0074] Step 902: Focus the frequency-shifting light and emit the focused frequency-shifting light onto multiple particles centered on the target particle in the system of trapped particles; wherein, the multiple particles undergo different frequency shifts after being irradiated by the frequency-shifting light.

[0075] Step 903: Generate modulated light.

[0076] Step 904: The frequency of the control light is controlled and emitted to the target particle in the system of the trapped particle using a frequency sweeping method; wherein, the frequency sweeping light is a control light that varies within a specified frequency range based on the original frequency of the target particle before the frequency shift occurs.

[0077] In one possible example, in the case of splitting the frequency-shifting light, this application can further split the control light into M sub-control lights, where M is a positive integer. In this example, the transmission direction of the received M sub-control lights is changed respectively; the received M sub-control lights are focused, and the focused M sub-control lights are emitted to the corresponding sub-frequency-shifting light illumination areas respectively. Further, the frequency modulation of the control light, emitting it to the target particle in the trapped particle system using a frequency-sweeping method, can be implemented by separately modulating the frequency of the M control lights and emitting them to the corresponding sub-frequency-shifting light illumination areas in the trapped particle system using a frequency-sweeping method.

[0078] In another possible example, in the case of splitting the frequency-shifting light, this application can also employ a frequency-sweeping light method to emit light onto multiple particles, including the target particle, within the system containing the trapped particles. This allows the control light to illuminate all particles within the system, ensuring that after frequency modulation, energy level transitions can occur in particles with the same frequency. This enables laser addressing of the target particle based on the resulting energy level transitions. It is understood that since the frequency-shifting light irradiates the target particle, the target particle located in the central spot receives the strongest light intensity, resulting in a significant frequency shift. Thus, when the frequency-modulated light irradiates the region containing the target particle, the frequency shift that causes the target particle to undergo an energy level transition is large, and the excitation time is short. For example, if multiple particles undergo energy level transitions during the frequency-sweeping light emission onto the target particle in the system, the particle with the highest control light frequency or the shortest excitation time at the time of the energy level transition is the target particle.

[0079] This application also provides a system for trapping particles, including a particle trapping module and any possible laser addressing device as described in the aforementioned device embodiments; the particle trapping module is used to trap particles.

[0080] In the various embodiments of this application, unless otherwise specified or in case of logical conflict, the terminology and / or descriptions of different embodiments are consistent and can be referenced by each other. The technical features of different embodiments can be combined to form new embodiments according to their inherent logical relationship.

[0081] Furthermore, the terms “comprising” and “having,” and any variations thereof, are intended to cover non-exclusive inclusion, such as including a series of steps or units. A method, system, product, or apparatus is not necessarily limited to those steps or units explicitly listed, but may include other steps or units not explicitly listed or inherent to those processes, methods, products, or apparatuses.

[0082] Furthermore, in this application, the term "exemplary" is used to mean as an example, illustration, or description. Any embodiment or design described as an "example" in this application should not be construed as being more preferred or advantageous than other embodiments or designs. Alternatively, it can be understood that the use of the term "example" is intended to present concepts in a specific manner and does not constitute a limitation of this application.

[0083] Although this application has been described in conjunction with specific features and embodiments, it is obvious that various modifications and combinations can be made therein without departing from the spirit and scope of this application. Accordingly, this specification and drawings are merely illustrative examples of the solutions defined by the appended claims and are to be considered as covering any and all modifications, variations, combinations, or equivalents within the scope of this application.

[0084] Obviously, those skilled in the art can make various modifications and variations to this application without departing from the spirit and scope of the invention. Therefore, if these modifications and variations of the embodiments of this application fall within the scope of the claims of this application and their equivalents, this application also intends to include these modifications and variations.

Claims

1. A laser addressing device, applied to a particle trapping system, characterized in that, include: The system comprises a first laser generating module, a first focusing module, a second laser generating module, and a second laser control module; The first laser generating module is used to generate frequency-shifted light and emit the frequency-shifted light to the first focusing module; The first focusing module is used to focus the received frequency-shifted light and emit the focused frequency-shifted light onto multiple particles centered on the target particle in the system; wherein the multiple particles undergo different frequency shifts after being irradiated by the frequency-shifted light; The second laser generating module is used to generate control light and emit the control light to the second laser control module; The second laser control module is used to control the frequency of the control light and emit it onto the target particle in the system using a frequency sweeping method; wherein the frequency sweeping light is a control light that varies within a specified frequency range based on the original frequency of the target particle before the frequency shift occurs.

2. The apparatus according to claim 1, characterized in that, The device further includes: a first laser control module; The first laser control module is located between the first laser generating module and the first focusing module, and is used to change the transmission direction of the frequency-shifted light from the first laser generating module and emit the frequency-shifted light to the first focusing module.

3. The apparatus according to claim 2, characterized in that, The first laser control module is further configured to split the frequency-shifting light into N sub-frequency-shifting light beams, where N is a positive integer; The first laser control module is used to change the transmission direction of the frequency-shifted light from the first laser generation module, specifically by changing the transmission direction of the N sub-beams of frequency-shifted light.

4. The apparatus according to claim 3, characterized in that, The device further includes: a third laser control module and a second focusing module; The second laser control module is further configured to split the control light into M sub-control lights, and emit the M sub-control lights to the third laser control module, where M is a positive integer; The third laser control module is used to change the transmission direction of the received M-beam modulated light and emit the M-beam modulated light to the second focusing module. The second focusing module is used to focus the received M-beam sub-modulated light and then emit the focused M-beam sub-modulated light to the irradiation area of ​​the corresponding sub-frequency shift light.

5. The apparatus according to claim 4, characterized in that, The second laser control module is used to control the frequency of the modulation light and emit it onto the target particle in the system using a frequency-sweeping method. Specifically, it is used for: The frequencies of the M-beams are adjusted and emitted into the corresponding sub-frequency-shifting beam irradiation areas in the system using a frequency-sweeping method.

6. The apparatus according to claim 3, characterized in that, The second laser control module is used to emit laser light into the target particle in the system using a frequency-sweeping method, specifically for: The target particle is emitted into the system using a frequency-sweeping method.

7. The apparatus according to claim 6, characterized in that, The particle structure in the system is a particle chain structure; the device also includes a reflector. The reflector is used to reflect the control light from the second laser control module, so as to emit the reflected control light along the particle chain direction onto the multiple particles contained in the system.

8. A laser addressing method applied to a particle trapping system, characterized in that, include: Generates frequency-shifted light; The frequency-shifted light is focused and then emitted onto multiple particles in the system centered on the target particle; wherein the multiple particles undergo different frequency shifts after being irradiated by the frequency-shifted light. Generate modulated light; The frequency of the control light is controlled and emitted onto the target particle in the system using a frequency sweeping method; wherein, the frequency sweeping light is a control light that varies within a specified frequency range based on the original frequency of the target particle before the frequency shift occurs.

9. The method according to claim 8, characterized in that, Before focusing the frequency-shifted light, the method further includes: Change the transmission direction of the frequency-shifted light.

10. The method according to claim 9, characterized in that, The method further includes: The frequency-shifted light is split into N sub-frequency-shifted light beams, where N is a positive integer; Changing the transmission direction of the received frequency-shifted light includes: The transmission direction of the received N beams of frequency-shifted light is changed respectively.

11. The method according to claim 10, characterized in that, The method further includes: The control light is split into M sub-control lights, where M is a positive integer; The transmission direction of the received M-beam modulated light is changed respectively; The received M-beam sub-modulated light is focused, and the focused M-beam sub-modulated light is emitted to the irradiation area of ​​the corresponding sub-frequency shift light.

12. The method according to claim 11, characterized in that, The step of controlling the frequency of the control light and emitting it onto the target particle in the system using a frequency-sweeping method includes: The frequencies of the M-beams are adjusted and emitted into the corresponding sub-frequency-shifting beam irradiation areas in the system using a frequency-sweeping method.

13. The method according to claim 10, characterized in that, The method of emitting light into the target particle in the system using a frequency-sweeping method includes: The target particle is emitted into the system using a frequency-sweeping method.

14. The method according to claim 13, characterized in that, The particle structure in the system is a particle chain structure; the method further includes: The control light is reflected so that the reflected control light is emitted along the direction of the particle chain onto the multiple particles contained in the system.

15. A system for trapping particles, characterized in that, It includes a particle trapping module and a laser addressing device as described in any one of claims 1-7; the particle trapping module is used to trap particles.

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