Wide-angle and long-focus module compatible test structure and test device

Abstract

The application discloses a wide-angle and long-focus module compatible test structure and test equipment, and relates to the technical field of camera module testing. The wide-angle and long-focus module compatible test structure comprises a support seat, a position adjusting table, two first parallel light pipe assemblies and two rotating tables, the two first parallel light pipe assemblies are connected with the two rotating tables respectively, the rotating centers of the two rotating tables are coaxially arranged, the two rotating tables are connected with the support seat through connecting pieces, and a to-be-tested camera module is arranged on the position adjusting table and opposite to the first parallel light pipe assemblies. The test device comprises the wide-angle and long-focus module compatible test structure. The application can reach the test difficulty degree of 9 parallel light pipe assemblies or 5 parallel light pipe assemblies in the prior art, can test the field of view angles at different positions, has high test precision and is convenient to debug, and has lower cost than the prior art. The application can test the to-be-tested camera module with a field of view angle of 0-210 degrees, and has wide application range.

Description

Technical Field

[0001] This application belongs to the field of camera module testing technology, specifically relating to a test structure and test device compatible with wide-angle and telephoto modules. Background Technology

[0002] like Figure 1 As shown, in existing automotive camera module testing equipment, to ensure efficiency when performing SFR (Spatial Frequency Response) testing on camera modules, 9 or 5 collimators are typically used. When using 9 or 5 collimators, only 9 or 5 collimators can be fixed in a certain position each time to test the SFR of the automotive camera's field of view. Furthermore, it is not possible to use multiple collimators to test different field of view angles for telephoto camera modules. Moreover, after multiple collimators are installed, it is difficult to align the center of the collimators with the center of the camera module under test, resulting in problems such as high time consumption, troublesome debugging, and high cost.

[0003] Therefore, there is an urgent need to propose a test structure for vehicle camera modules that is simple in structure, can guarantee testing efficiency, and can automatically adjust to different angles for SFR testing of camera modules, thereby improving accuracy and reducing costs. Summary of the Invention

[0004] In view of the shortcomings or deficiencies of the prior art, the technical problem to be solved by this application is to provide a test structure and test device that is compatible with wide-angle and telephoto modules.

[0005] To solve the above-mentioned technical problems, this application provides the following technical solution:

[0006] This application proposes a test structure compatible with wide-angle and telephoto modules, comprising at least: a support base, an adjustment platform, two first collimator assemblies, and two turntables. The two first collimator assemblies are respectively connected to the two turntables, and the rotation centers of the two turntables are coaxially arranged. The two turntables are connected to the support base through connectors. The camera module under test is disposed on the adjustment platform and is disposed opposite to the first collimator assemblies.

[0007] Furthermore, the aforementioned test structure compatible with both wide-angle and telephoto modules further includes: a correspondingly configured trigger signal element and a sensing signal element, wherein the trigger signal element and the sensing signal element are respectively disposed on the two first collimator assemblies.

[0008] Furthermore, in the aforementioned test structure compatible with both wide-angle and telephoto modules, the support base is also provided with a stop for limiting the range of motion of the first collimator assembly.

[0009] Furthermore, in the aforementioned test structure compatible with both wide-angle and telephoto modules, the first collimator assembly is also equipped with an external light source.

[0010] Furthermore, the aforementioned test structure compatible with both wide-angle and telephoto modules also includes: a measuring tool, which is disposed on the support base and / or the turntable.

[0011] Furthermore, in the aforementioned test structure compatible with both wide-angle and telephoto modules, the adjustment stage includes a six-axis attitude adjustment component and a fixture, wherein the fixture is connected to the six-axis attitude adjustment component.

[0012] This application also proposes a testing apparatus, including the aforementioned wide-angle and telephoto module compatible testing structure.

[0013] Furthermore, the aforementioned testing apparatus further includes: a rotary table with at least two workstations, each workstation being equipped with the adjustment platform; the adjustment platform of the wide-angle and telephoto module compatible testing structure is located on the second workstation.

[0014] Furthermore, the aforementioned testing device further includes: a black and white field testing structure, which is correspondingly disposed on the third station; the black and white field testing structure includes: an integrating sphere light source module, a dark box module, a first lifting module, and a pushing module, the integrating sphere light source module is disposed on the first lifting module, and the integrating sphere light source module is disposed opposite to the adjustment platform located on the third station, the dark box module is connected to the pushing module, and the dark box module is disposed between the integrating sphere light source module and the adjustment platform on the third station.

[0015] Furthermore, the aforementioned testing device further includes: an electronic rearview mirror testing structure, which is correspondingly disposed on the third workstation; the electronic rearview mirror testing structure includes: a graphic card test piece and a second lifting module, the graphic card test piece is disposed on the second lifting module, and the graphic card test piece is disposed opposite to the adjustment platform located on the third workstation.

[0016] Furthermore, the aforementioned testing device further includes: a defocus curve and internal parameter calibration testing structure, which is correspondingly arranged on the fourth station; the defocus curve and internal parameter calibration testing structure includes: a second collimator assembly and a third lifting module, the second collimator assembly is arranged on the third lifting module, and the second collimator assembly is arranged opposite to the adjustment stage located on the fourth station.

[0017] Compared with the prior art, this application has the following technical effects:

[0018] This application achieves the same level of testing difficulty as existing technologies with 9 or 5 collimator assemblies, and can test the field of view at different positions. It also features high accuracy and convenient debugging with automatic rotation testing, and reduces costs compared to existing technologies.

[0019] This application can detect camera modules with a field of view of 0° to 210°, and has a wide range of applications. Attached Figure Description

[0020] Other features, objects, and advantages of this application will become more apparent from the following detailed description of non-limiting embodiments with reference to the accompanying drawings:

[0021] Figure 1 : A schematic diagram of the existing technology;

[0022] Figure 2 This application includes a schematic diagram of a test structure that is compatible with both wide-angle and telephoto modules according to an embodiment.

[0023] Figure 3 A partial schematic diagram of a test structure compatible with wide-angle and telephoto modules in one embodiment of this application;

[0024] Figure 4 A partial schematic diagram of a test structure compatible with wide-angle and telephoto modules in one embodiment of this application;

[0025] Figure 5 : A schematic diagram of the adjustment stage in one embodiment of this application;

[0026] Figure 6 : A schematic diagram of a test apparatus according to an embodiment of this application;

[0027] Figure 7 : An internal schematic diagram of a test apparatus according to an embodiment of this application;

[0028] Figure 8 A partial schematic diagram of the rotary seat in one embodiment of this application;

[0029] Figure 9 : A schematic diagram of the black and white field test structure in one embodiment of this application;

[0030] Figure 10 A partial schematic diagram of the black and white field test structure in one embodiment of this application;

[0031] Figure 11 : A schematic diagram of the defocus curve and internal parameter calibration test structure in one embodiment of this application;

[0032] In the diagram: Camera module under test 0, support base 1, first motor 101, second motor 102, adjustment platform 2, fixture 201, X-axis movement group 202, Y-axis movement group 203, Z-axis movement group 204, Z-axis rotation group 205, X-axis rotation group 206, Y-axis rotation group 207, connecting frame 208, first collimator assembly 3, turntable 4, rotation shaft 5, connector 6, trigger signal element 7, sensing signal element 8, stop block 9, external light source 10, measuring instrument 11, black and white field test Structure 12, integrating sphere light source module 1201, dark box module 1202, first lifting module 1203, pushing module 1204, defocus curve and internal parameter calibration test structure 13, second collimator assembly 1301, third lifting module 1302, rotating seat 14, first station 1401, second station 1402, third station 1403, fourth station 1404, rotating platform 1405, rotating column 1406, base 1407, connecting plate 1408 and housing 15. Detailed Implementation

[0033] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0034] like Figures 2 to 4 As shown in one embodiment of this application, a test structure compatible with wide-angle and telephoto modules includes at least: a support base 1, an adjustment platform 2, two first collimator assemblies 3, and two turntables 4. The two first collimator assemblies 3 are respectively connected to the two turntables 4. The rotation centers of the two turntables 4 are coaxially arranged. The two turntables 4 are connected to the support base 1 through connectors 6. The camera module 0 under test is disposed on the adjustment platform 2 and is disposed opposite to the first collimator assemblies 3.

[0035] In this embodiment, two first collimator assemblies 3 are used, each positioned at one end of a turntable 4. The other ends of the two turntables 4 are rotatably mounted on a rotating shaft 5 and connected to a support base 1 via a connector 6. The camera module 0 under test is mounted on an adjustment platform 2, with the camera module 0 positioned opposite the two first collimator assemblies 3. Through this configuration, the two first collimator assemblies 3 can rotate independently and under the influence of the turntables 4, achieving a 270° rotation with an accuracy of + / -0.02mm. Simultaneously, the adjustment platform 2 can adjust the pose of the camera module 0 under test. Therefore, this embodiment achieves the testing efficiency of nine collimator assemblies in the prior art, i.e., the testing time for each camera module is 40-50 seconds, reducing costs compared to the prior art.

[0036] Optionally, the first collimator assembly 3 may include, but is not limited to, a 15° collimator or a 30° collimator.

[0037] Specifically, the first parallel light tube assembly 3 rotates under the drive of the first motor 101.

[0038] Optionally, the first motor 101 may include, but is not limited to, a stepper motor.

[0039] Specifically, the turntable 4 rotates under the drive of the second motor 102.

[0040] Optionally, the second motor 102 may include, but is not limited to, a servo motor.

[0041] Specifically, the adjustment stage 2 includes a six-axis attitude adjustment component and a fixture 201, wherein the fixture 201 is connected to the six-axis attitude adjustment component.

[0042] In this embodiment, the fixture 201 holds the camera module 0 under test and is connected to the six-axis attitude adjustment component, enabling the camera module 0 under test to achieve six-axis motion.

[0043] Optionally, the fixture 201 is a contouring fixture, and a contouring cavity is set according to the camera module 0 to be tested to ensure that the camera module is stably clamped in the fixture 201.

[0044] like Figure 5 As shown, the six-axis attitude adjustment component includes: an X-axis movement group 202, a Y-axis movement group 203, a Z-axis movement group 204, a Z-axis rotation group 205, an X-axis rotation group 206, and a Y-axis rotation group 207 connected in sequence. The Y-axis rotation group 207 is connected to the fixture 201 via a connecting frame 208, enabling six-axis movement of the fixture 201 with an accuracy of up to 5µm. Optionally, the six-axis attitude adjustment component can be configured for manual or electric attitude adjustment according to actual needs; this embodiment uses electric automatic attitude adjustment.

[0045] Optionally, the test structure for wide-angle and telephoto module compatibility also includes: a corresponding trigger signal element 7 and a sensing signal element 8, wherein the trigger signal element 7 and the sensing signal element 8 are respectively disposed on the two first collimator assemblies 3, thereby avoiding collisions caused by the two first collimator assemblies 3 being too close together.

[0046] In this embodiment, when the included angle between the two first parallel light tube assemblies 3 is less than 35°, the sensing signal element 8 can sense the trigger signal element 7, causing the two first parallel light tube assemblies 3 to stop moving when they reach a safe distance.

[0047] Specifically, the support base 1 is also provided with a stop 9 for limiting the range of motion of the first collimator assembly 3, so as to prevent the first collimator assembly 3 from colliding during movement.

[0048] Specifically, the first parallel light tube assembly 3 is also provided with an external light source 10.

[0049] In this embodiment, an external light source 10 is provided for the first collimator assembly 3. The external light source 10 is a ring light source so that the first collimator assembly 3 can accurately detect deviations and improve accuracy when physically calibrating the rotation center.

[0050] Optionally, the test structure compatible with wide-angle and telephoto modules further includes a gauge 11, which is disposed on the support base 1 and / or the turntable 4.

[0051] In this embodiment, measuring tools 11 are provided on both the support base 1 and the turntable 4 to help the first parallel light tube assembly 3 to be quickly adjusted to a vertical or horizontal position.

[0052] like Figure 6 and Figure 7 As shown, this application also proposes a testing device, including the aforementioned wide-angle and telephoto module compatible testing structure.

[0053] In this embodiment, a test structure compatible with both wide-angle and telephoto modules is housed within the housing 15 to facilitate integrated testing.

[0054] Specifically, the test structure for wide-angle and telephoto module compatibility is described above and will not be repeated here.

[0055] like Figure 8 As shown, the testing device also includes: a rotary table 14 with at least two stations, each station being equipped with the adjustment platform 2; the adjustment platform 2 of the wide-angle and telephoto module compatible testing structure is located on the second station 1402.

[0056] In this embodiment, the rotary base 14 is provided with four workstations, and those skilled in the art will be motivated to adapt the number of workstations by increasing or decreasing them. Each rotary base 14 with four workstations is provided with an adjustment platform 2. The first workstation 1401 is the loading and unloading workstation, in which the camera module 0 to be tested is placed in the fixture 201 of the adjustment platform 2 of the first workstation 1401, and rotated by the rotary base 14 to the second workstation 1402 for SFR (Spatial Frequency Response) testing, that is, testing is performed using the test structure that is compatible with wide-angle and telephoto modules as described above.

[0057] Optionally, the rotating seat 14 includes at least: a rotating platform 1405, a rotating column 1406, and a base 1407. The rotating platform 1405 is connected to the rotating column 1406, the adjusting platform 2 is disposed on the base 1407, and the base 1407 is connected to the rotating platform 1405 through a connecting plate 1408.

[0058] In this embodiment, four bases 1407 are provided, corresponding to four workstations. Driven by the motor, the rotating column drives the bases 1407 to rotate.

[0059] like Figure 9 and Figure 10 As shown, the testing device further includes a black and white field testing structure 12, which is correspondingly disposed on the third station 1403. The black and white field testing structure 12 includes an integrating sphere light source module 1201, a dark box module 1202, a first lifting module 1203, and a pushing module 1204. The integrating sphere light source module 1201 is disposed on the first lifting module 1203, and the integrating sphere light source module 1201 is disposed opposite to the adjusting platform 2 located on the third station 1403. The dark box module 1202 is connected to the pushing module 1204, and the dark box module 1202 is disposed between the integrating sphere light source module 1201 and the adjusting platform 2 on the third station 1403.

[0060] In this embodiment, after the camera module 0 under test undergoes SFR testing at the second station, it is moved to the third station 1403 by the rotating seat 14. The third station 1403 is equipped with a black and white field test structure 12. The first lifting module 1203 raises or lowers the integrating sphere light source module 1201 to perform white field testing. When the white field test is completed, the dark box module 1202, which is located below the integrating sphere light source module 1201, is moved to directly below the integrating sphere light source module 1201 by the pushing module 1204. That is, the dark box module 1202 and the camera module 0 under test are positioned opposite each other to perform black field testing.

[0061] Optionally, the pusher module 1204 includes, but is not limited to, a cylinder assembly.

[0062] like Figure 11 As shown, the testing device further includes a defocus curve and internal parameter calibration testing structure 13, which is correspondingly arranged on the fourth station 1404; the defocus curve and internal parameter calibration testing structure 13 includes a second collimator assembly 1301 and a third lifting module 1302, the second collimator assembly 1301 is arranged on the third lifting module 1302, and the second collimator assembly 1301 is arranged opposite to the adjustment stage 2 located on the fourth station 1404.

[0063] In this embodiment, after the black and white field test of the camera module 0 under test is completed at the third station, it is driven to the fourth station 1404 by the rotating seat 14. The fourth station 1404 is equipped with a defocus curve and internal parameter calibration test structure 13. The second parallel light tube assembly 1301 is disposed on the third lifting module 1302. The second parallel light tube assembly 1301 is moved by the rise or fall of the third lifting module 1302 to perform the defocus curve and internal parameter calibration test.

[0064] Optionally, the second collimator assembly 1301 includes, but is not limited to, a 30° collimator.

[0065] In another embodiment of this application, the third station 1403 of the testing device may also be configured as an electronic rearview mirror testing structure; the electronic rearview mirror testing structure includes: a pattern card test piece and a second lifting module, the pattern card test piece is disposed on the second lifting module, and the pattern card test piece is disposed opposite to the adjustment platform 2 located on the third station 1403.

[0066] In this embodiment, the third station 1403 is replaced with an electronic rearview mirror test structure to perform automotive CMS (Camera Monitor System) testing. Specifically, a graphic test piece (not shown in the figure) is placed on the second lifting module (not shown in the figure). The graphic test piece moves under the action of the rising or falling of the second lifting module to perform electronic rearview mirror testing.

[0067] Optionally, the pattern test piece includes, but is not limited to, glass with colored pattern cards or glass with gray gradient pattern cards.

[0068] In the description of this application, unless otherwise expressly specified and limited, the terms "connected," "linked," and "fixed" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0069] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can include direct contact between the first and second features, or contact between the first and second features through another feature between them. Furthermore, "above," "over," and "on top" of the second feature includes the first feature being directly above or diagonally above the second feature, or simply indicates that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature includes the first feature being directly below or diagonally below the second feature, or simply indicates that the first feature is at a lower horizontal level than the second feature.

[0070] In the description of this embodiment, the terms "upper," "lower," "left," "right," etc., refer to the orientation or positional relationship shown in the accompanying drawings. They are used only for ease of description and simplification of operation, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. In addition, the terms "first" and "second" are used only for distinction in description and have no special meaning.

[0071] The above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. The preferred embodiments have been described in detail. Those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this application without departing from the spirit and scope of the technical solutions of this application, and all such modifications and substitutions should be covered within the scope of the claims of this application.

Claims

1. A test structure compatible with wide-angle and long-focus modules, characterized in that, At least comprising: a support seat, a positioning table, two first parallel light pipe assemblies and two rotating tables, the two first parallel light pipe assemblies are respectively connected with the two rotating tables, the rotating centers of the two rotating tables are coaxially arranged, the two rotating tables are connected with the support seat through a connecting piece, and a to-be-tested camera module is arranged on the positioning table and opposite to the first parallel light pipe assemblies; corresponding trigger signal pieces and sensing signal pieces are arranged on the two first parallel light pipe assemblies; when the included angle position of the two first parallel light pipe assemblies is less than 35°, the sensing signal pieces can sense the trigger signal pieces; an external light source is further arranged on the first parallel light pipe assemblies; the external light source is a ring-shaped light source, so that the first parallel light pipe assemblies can accurately find the deviation when the physical calibration rotating center is rotated, and the precision is improved; the rotating tables drive the first parallel light pipe assemblies to rotate by 270°; the positioning table comprises a six-axis attitude adjusting piece and a jig, and the jig is connected with the six-axis attitude adjusting piece; the jig is a profiling jig, a profiling cavity is arranged according to the to-be-tested camera module to ensure that the camera module is stably clamped in the jig; the jig is connected with the six-axis attitude adjusting piece, so that the to-be-tested camera module can realize six-axis movement; the test structure compatible with the wide-angle and long-focus modules detects the to-be-tested camera module with a field of view angle of 0° to 210°.

2. The wide and tele module compatible test structure of claim 1, wherein, a stopper for limiting the movement range of the first parallel light pipe assemblies is further arranged on the support seat.

3. The wide-angle and tele lens module compatible test structure of claim 1 or 2, wherein, Further comprising: a measuring tool arranged on the support seat and / or the rotating table.

4. A test device, characterized in that the test structure compatible with the wide-angle and long-focus modules of any one of claims 1 to 3; Further comprising: a rotating seat with at least four stations, each of which is provided with the positioning table; the positioning table of the test structure compatible with the wide-angle and long-focus modules is arranged on the second station; an electronic rearview mirror test structure is correspondingly arranged on the third station; the electronic rearview mirror test structure comprises a card test piece and a second lifting module, the card test piece is arranged on the second lifting module, and the card test piece is opposite to the positioning table on the third station; a defocus curve and internal parameter calibration test structure is correspondingly arranged on the fourth station; the defocus curve and internal parameter calibration test structure comprises a second parallel light pipe assembly and a third lifting module, the second parallel light pipe assembly is arranged on the third lifting module, and the second parallel light pipe assembly is opposite to the positioning table on the fourth station.

5. The test device of claim 4, wherein, Further comprising: a black field and white field test structure, which is correspondingly arranged on the third station; the black field and white field test structure comprises an integrating sphere light source module, a dark box module, a first lifting module and a pushing module, the integrating sphere light source module is arranged on the first lifting module, and the integrating sphere light source module is opposite to the positioning table on the third station, the dark box module is connected with the pushing module, and the dark box module is arranged between the integrating sphere light source module and the positioning table on the third station.

Images