A method and system for testing the noise figure of frequency converters

Abstract

This invention discloses a method and system for testing the noise figure of frequency converter devices. The method includes: constructing a parameter configuration model for the noise figure testing system of frequency converter devices; wherein the objects of parameter configuration include the device under test (DUT) and the noise figure testing instrument; configuring the parameters of different parameter configuration objects according to the type of DUT to form different noise figure testing modes for different types of DUTs; and completing the noise figure testing of different types of DUTs based on different noise figure testing modes. Simultaneously, before performing the noise figure testing of the DUT, a calibration method for the frequency converter device noise figure testing system is also included. This invention supports noise figure testing of single frequency converter devices and cascaded frequency converter links with various frequency conversion mechanisms, solving the problems of complex measurement modes, difficult parameter configuration, and low testing efficiency in existing frequency converter device noise figure testing, simplifying the calibration method, and saving testing time for various types of frequency converter devices.

Description

Technical Field

[0001] This invention relates to the field of noise figure testing technology, and in particular to a method and system for testing the noise figure of frequency converters. Background Technology

[0002] Noise figure testing of frequency converters is one of the important measurement modes in the field of noise figure measurement. With the widespread application of noise figure testing in radar, navigation, wireless communication and other fields, the demand for testing the noise performance of frequency converters is increasing. Devices under test (DUTs) that can be used in frequency conversion measurement modes include mixers, receivers and transmitters. The DUT can be a single frequency converter or a multi-stage cascaded frequency converter assembly or system with multiple frequency conversion standards.

[0003] Rapid and effective measurement of the noise performance of frequency converters is crucial for improving the efficiency of noise figure testing for frequency converters or systems. However, the noise figure test of frequency converters requires complex parameter settings, including not only the port frequency information of the device under test, such as RF input frequency, IF output frequency, local oscillator frequency, and sidebands, but also the control modes of RF, IF, and local oscillator in these ports, as well as other control information in the system link. The measurement configuration conditions of the device under test are relatively numerous, and considering the different measurement modes, the combination configuration is even more complex.

[0004] Traditional noise figure testing for frequency converters only provides parameter configuration methods for a single stage of the converter. Some of the test parameters required for configuration are highly technical and difficult to understand, demanding a high level of technical expertise from the testers. Faced with such complex measurements and numerous input parameters, the lack of intuitive configuration guidance leaves testers at a loss, making direct configuration difficult and prone to errors, leading to erroneous measurement results. This has, to some extent, limited the accuracy of frequency converter noise figure testing. Furthermore, there are no direct configuration methods or measurement approaches for multi-stage cascaded frequency converter links, failing to meet the testing requirements for the noise figure of frequency converters.

[0005] In addition, existing methods for testing the noise figure of frequency converters often use the Y-factor method. However, before using this method to test the noise figure, the test system needs to be calibrated. The calibration includes parameters such as the type of device under test, the local oscillator mode of the device under test, the sideband type, the frequency range (RF, IF and LO) of the device under test, and the frequency mode. For each measurement mode and state of different types of devices under test, calibration is required when measuring the noise figure. Moreover, the calibration data is only applicable to the measurement state with the same settings, which makes the calibration and testing efficiency low. Summary of the Invention

[0006] To address the shortcomings of existing technologies, this invention provides a method and system for testing the noise figure of frequency converters. It supports noise figure testing of individual frequency converters and cascaded frequency converter links with various frequency conversion mechanisms. It integrates and simplifies the intuitive configuration of complex parameters, expands the application scope of frequency converter calibration, effectively reduces the difficulty of measurement and the technical requirements for operators, and solves the problems of complex measurement modes, difficult parameter configuration, and low testing efficiency in existing frequency converter noise figure testing. This enables rapid, reliable, and effective measurement of the noise figure of various frequency converters. Furthermore, based on the noise figure testing of frequency converters, a calibration method for the noise figure testing system is also provided, requiring only one calibration, which can save testing time for various types of frequency converters and improve the efficiency of noise figure testing.

[0007] Firstly, this disclosure provides a method for testing the noise figure of frequency converters.

[0008] A method for testing the noise figure of a frequency converter includes the following steps:

[0009] Construct a parameter configuration model for a noise figure testing system for frequency converters; the objects of parameter configuration include the device under test and the noise figure testing instrument.

[0010] Based on the type of the test piece, different parameter configuration objects are configured to form different noise figure test modes for different types of test pieces;

[0011] Based on different noise figure test modes, noise figure tests were performed on different types of test components.

[0012] A further technical solution involves constructing the parameter configuration model by grouping and configuring all measurement parameters according to the parameter configuration object, based on the noise figure test connection sequence and guided by the connection diagram.

[0013] A further technical solution is that the parameters configured for the device under test include: the type of the device under test, the number of frequency conversion stages, the sideband, the LO mode, the external LO control status, the external LO power, the RF input frequency of the device under test, the intermediate frequency output frequency of the device under test, the local oscillator frequency of the device under test, and the local oscillator frequency conversion value of the device under test.

[0014] In a further technical solution, the noise figure testing instrument includes a frequency converter and a noise figure analyzer in the testing system.

[0015] A further technical solution is that the parameters configured for the frequency converter in the test system include: the status of the frequency converter in the test system, the local oscillator frequency of the frequency converter in the test system, the intermediate frequency frequency of the frequency converter in the test system, the sideband, the LO mode, the external LO control status, and the external LO power.

[0016] A further technical solution is that the parameters configured in the noise figure analyzer include: frequency type, frequency mode, and number of scan points.

[0017] Further technical solutions include the following types of devices under test: amplifiers, downconverters, upconverters, and multi-stage cascaded inverters.

[0018] A further technical solution involves configuring parameters for different types of test objects based on the type of the test device, thereby forming different noise figure test modes for different types of test devices. This specifically includes the following steps:

[0019] Step 1: Determine whether the device under test is an amplifier. If yes, proceed to step 2. Otherwise, determine whether the device under test is a downconverter or an upconverter.

[0020] If the device under test is determined to be a down-converter or up-converter, set the corresponding measurement mode parameters and execute step 3; otherwise, determine whether the device under test is a multi-stage cascaded inverter.

[0021] If the device under test is determined to be a multi-level cascaded frequency converter, then set the corresponding multi-level cascaded frequency converter measurement mode parameters, perform frequency conversion and link information processing of the device under test port, and execute step 3; otherwise, perform DUT type illegal error processing.

[0022] Step 2: Determine the status of the inverter in the test system. If the status is off, test the noise figure of the direct frequency device. Otherwise, set the spread spectrum mode parameters and proceed to step 4.

[0023] Step 3: Determine the status of the frequency converter under the test system. If the status is off, proceed to step 4; otherwise, set the current spread spectrum parameters and proceed to step 4.

[0024] Step 4: Automatically configure the sidebands according to the set parameters, calculate the measurement frequency, set the measurement channel, and measure the noise figure.

[0025] A further technical solution involves automatically configuring sidebands based on set parameters. Specifically, based on the frequency relationship between the RF frequency and local oscillator frequency of the device under test (DUT), the sideband type of the DUT is automatically determined using a noise figure analyzer.

[0026] A further technical solution, before conducting noise figure testing on the device under test, includes calibrating the noise figure testing system for the frequency converter, specifically including:

[0027] Connect the noise source to the calibration reference plane input port of the noise figure test instrument or test system, perform calibration, and establish a noise calibration reference plane;

[0028] Extract the frequency range of the input frequency of the noise figure test instrument or test system during calibration, and use it as the calibration frequency range.

[0029] Connect the device under test (DUT) to the calibration reference plane between the noise source and the noise figure test instrument or test system, configure the DUT parameters and determine the DUT noise figure test mode, and perform the noise figure test.

[0030] Obtain the input frequency of the calibration reference plane of the noise figure test instrument or test system in the current test mode, and determine whether the input frequency is within the calibration frequency range. If the input frequency is within the calibration frequency range, the calibration is valid; otherwise, the calibration is invalid and recalibration is required.

[0031] Secondly, this disclosure provides a noise figure testing system for frequency converters.

[0032] A noise figure testing system for frequency converters, comprising:

[0033] The parameter configuration model building module is used to construct the parameter configuration model of the frequency converter noise figure test system; the objects of parameter configuration include the device under test and the noise figure test instrument.

[0034] The noise figure test mode construction module is used to configure the parameters of different parameter configuration objects according to the type of the test device, forming different noise figure test modes for different types of test devices.

[0035] The noise figure test module is used to complete the noise figure test of different types of test devices based on different noise figure test modes.

[0036] The above technical solutions have the following beneficial effects:

[0037] 1. This invention provides a method for testing the noise figure of frequency converter devices, supporting noise figure testing of single frequency converter devices and cascaded frequency converter links with various frequency conversion mechanisms. It integrates and simplifies the intuitive configuration of complex parameters, expands the application scope of frequency converter calibration, effectively reduces the complexity of noise figure measurement of frequency converter devices and multi-stage frequency converter systems, effectively reduces the difficulty of measurement and the technical requirements for operators, and solves the problems of complex measurement modes, difficult parameter configuration, and low testing efficiency in existing frequency converter device noise figure testing. It enables rapid, reliable, and effective measurement of the noise figure of various frequency converter devices.

[0038] 2. Based on the noise figure test of frequency converter devices, this invention also provides a calibration method for the noise figure test system. By flexibly utilizing the input frequency range of the frequency converter measurement calibration reference plane, the calibration state of the frequency converter for noise figure measurement using the Y-factor method is simplified, the applicability of the noise figure calibration state in various measurement modes is expanded, and the testing efficiency of the noise figure of frequency converter devices is improved. Attached Figure Description

[0039] The accompanying drawings, which form part of this invention, are used to provide a further understanding of the invention. The illustrative embodiments of the invention and their descriptions are used to explain the invention and do not constitute an improper limitation of the invention.

[0040] Figure 1 This is a schematic diagram of the parameter configuration model of the frequency converter noise figure testing system according to an embodiment of the present invention;

[0041] Figure 2 This is a flowchart of the testing method described in an embodiment of the present invention;

[0042] Figure 3 This is a connection block diagram of the two-stage frequency converter in an embodiment of the present invention;

[0043] Figure 4 This is a connection block diagram of the test system for frequency conversion extended measurement in an embodiment of the present invention;

[0044] Figure 5 This is a connection block diagram for the calibration and testing of frequency converter devices in an embodiment of the present invention. Detailed Implementation

[0045] It should be noted that the following detailed descriptions are exemplary and intended to provide further illustration of the invention. Unless otherwise specified, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains.

[0046] It should be noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to limit the scope of exemplary embodiments according to the invention. As used herein, the singular form is intended to include the plural form as well, unless the context clearly indicates otherwise. Furthermore, it should be understood that when the terms "comprising" and / or "including" are used in this specification, they indicate the presence of features, steps, operations, devices, components, and / or combinations thereof.

[0047] Example 1

[0048] Existing noise figure analyzers have complex noise figure measurement modes for frequency converters, with measurement parameters scattered across different setting interfaces. This results in poor intuitiveness and operability. Furthermore, the configuration parameters for frequency converters and systems are often terminologically complex, requiring a high level of expertise from testers. This makes it difficult for testers to successfully configure the necessary parameters, and can even lead to errors in noise figure measurements in frequency converter modes. In addition, for each different frequency converter measurement mode, a calibration process is required for any change in measurement parameters, resulting in low measurement efficiency.

[0049] To address the aforementioned issues, this embodiment provides a method for testing the noise figure of frequency converters. It supports noise figure testing of individual frequency converters and cascaded frequency converter links with various frequency conversion mechanisms. It integrates and simplifies complex parameter configurations, effectively reducing the difficulty of noise figure measurement. At the same time, it expands the application of noise figure calibration data in the noise figure testing of frequency converters, improves testing efficiency, and facilitates users to perform fast and accurate noise figure testing of frequency converters.

[0050] This embodiment provides a method for testing the noise figure of frequency converter devices, including the following steps:

[0051] Construct a parameter configuration model for a noise figure testing system for frequency converters; the objects of parameter configuration include the device under test and the noise figure testing instrument.

[0052] Based on the type of the test piece, different parameter configuration objects are configured to form different noise figure test modes for different types of test pieces;

[0053] Based on different noise figure test modes, noise figure tests were performed on different types of test components.

[0054] The parameter configuration model of the above-mentioned frequency converter noise figure test system is as follows: Figure 1 As shown, unlike traditional noise figure analyzers that only list the input of frequency converter parameters, the model in this embodiment configures all measurement parameters according to the connection sequence of the noise figure test, guided by the connection diagram. The tester can define object attribute parameters, and the connection example diagram changes depending on the defined measurement mode parameters. Through the input settings of each parameter in the model, the noise figure of different modes of single-stage up-converters, down-converters, amplifiers, and multi-stage cascaded frequency converters can be measured.

[0055] The configurable measurement connection objects (i.e., parameter configuration objects) in the above model are divided into the device under test (DUT) and the noise figure testing instrument. The noise figure testing instrument includes the frequency converter and noise figure analyzer of the test system. The specific descriptions of each set of test parameters are as follows:

[0056] The parameters configured for the device under test include: the type of the device under test, the number of frequency conversion stages, the sideband, the LO mode, the external LO control status, the external LO power, the RF input frequency of the device under test, the intermediate frequency output frequency of the device under test, the local oscillator frequency of the device under test, and the local oscillator frequency conversion value of the device under test.

[0057] Specifically, the type of the device under test (DUT) includes amplifiers, downconverters, upconverters, and multi-stage converters. The number of conversion stages refers to the number of cascaded conversion stages when the DUT is a multi-stage cascaded converter. For example, if the input signal is cascaded twice, the number of conversion stages is 2. Sideband refers to the frequency position relationship between the input RF signal and the DUT's local oscillator signal, and is divided into lower sideband (LSB), upper sideband (USB), and double sideband (DSB). LO mode refers to... When the device under test (DUT) is not an amplifier, or when the DUT is an amplifier and the inverter in the test system is on, the frequency mode of the local oscillator (LO) signal required for mixing includes swept or fixed. The external LO control status refers to whether the external LO signal required for mixing is remotely controlled by the test instrument, which includes on or off. The external LO power refers to the external LO power value that needs to be remotely controlled by the test instrument when the external LO control status is on, in dBm, which is set to -10dBm in this embodiment.

[0058] The radio frequency input frequency (RF) of the device under test (DUT) refers to the RF input frequency of the DUT. Depending on the frequency mode selection, it can be a start frequency, an end frequency, or a fixed frequency. The intermediate frequency (IF) output frequency (IF) of the DUT refers to the IF output frequency of the DUT. Depending on the frequency mode selection, it can be a start frequency, an end frequency, or a fixed frequency. The local oscillator (LO) frequency of the DUT refers to the local oscillator signal (LO) frequency of the DUT. When the DUT is a multi-stage cascaded inverter, the LO frequency value for each stage of the DUT is set according to the number of cascaded stages. The DUT LO frequency conversion value is the DUT LO frequency conversion value. The LO conversion value refers to whether the local oscillator signal (LO) of the device under test is frequency multiplied or divided before being sent to the input of the internal mixer. The numerator A represents the frequency multiplication factor, and the denominator B represents the frequency division factor. For example, if the local oscillator signal is frequency multiplied by 2 before being sent to the input of the mixer, then the frequency multiplication factor A is equal to 2 and the frequency division factor B is equal to 1.

[0059] The parameters configured for the frequency converter in the test system include: the status of the frequency converter in the test system, the local oscillator frequency of the frequency converter in the test system, the intermediate frequency frequency of the frequency converter in the test system, the sideband, the LO mode, the external LO control status, and the external LO power.

[0060] Specifically, the state of the inverter under the test system refers to the state of the inverter under the test system (System). The status of the downconverter (LO) is on or off; the local oscillator frequency of the downconverter in the test system, i.e., the system downconverter (LO), refers to the local oscillator frequency value of the downconverter in the test system; the intermediate frequency (IF) of the downconverter in the test system, i.e., the system downconverter (IF), refers to the intermediate frequency value of the downconverter in the test system; the sideband refers to the frequency position relationship between the input RF signal and the local oscillator signal in the downconverter in the test system, which is divided into lower sideband (LSB), upper sideband (USB), and double sideband (DSB); the LO mode refers to the frequency mode of the local oscillator signal that needs to be mixed when the downconverter in the test system is on, including scanned (Swept) or fixed (Fixed); the external LO control status refers to the external LO control status of the downconverter in the test system, which includes off or on, and determines whether the external local oscillator signal of the downconverter in the test system is input locally or remotely controlled by the instrument; the external LO power refers to the external local oscillator power value that needs to be remotely controlled by the instrument when the external LO control status is on, in dBm, which is set to -10dBm in this embodiment.

[0061] The parameters configured in the noise figure analyzer include: frequency type, frequency mode, and number of scan points; frequency type refers to the type of frequency input on the panel, including: radio frequency input and intermediate frequency input; frequency mode refers to the mode of frequency input on the panel, including: scan, fixed, and list; number of scan points refers to the number of frequency points in the scan mode.

[0062] The types of devices under test (DUTs) mentioned above include amplifiers, downconverters, upconverters, and multi-stage cascaded inverters. Different parameter configurations are applied to different types of DUTs to create different noise figure test modes, such as... Figure 2 As shown, the specific steps include:

[0063] Step 1: Determine whether the device under test is an amplifier. If yes, proceed to step 2. Otherwise, determine whether the device under test is a downconverter or an upconverter.

[0064] If the device under test is determined to be a down-converter or up-converter, set the corresponding measurement mode parameters and execute step 3; otherwise, determine whether the device under test is a multi-stage cascaded inverter.

[0065] If the device under test is determined to be a multi-level cascaded frequency converter, then set the corresponding multi-level cascaded frequency converter measurement mode parameters, perform frequency conversion and link information processing of the device under test port, and execute step 3; otherwise, perform DUT type illegal error processing.

[0066] Step 2: Determine the status of the inverter in the test system. If the status is off, test the noise figure of the direct frequency device. Otherwise, set the spread spectrum mode parameters and proceed to step 4.

[0067] Step 3: Determine the status of the frequency converter under the test system. If the status is off, proceed to step 4; otherwise, set the current spread spectrum parameters and proceed to step 4.

[0068] Step 4: Automatically configure the sidebands according to the set parameters, calculate the measurement frequency, set the measurement channel, and measure the noise figure.

[0069] In this embodiment, in addition to being set directly by the tester as with traditional noise figure analyzers, the "sideband" parameters of the device under test (DUT) can also be automatically configured based on the set parameters. Specifically, based on the frequency relationship between the DUT's radio frequency (RF) and local oscillator (LO), the noise figure analyzer automatically determines the DUT's sideband type as a lower sideband, upper sideband, or double sideband. The sideband parameters do not require individual setting by the tester, thus solving the difficulty of noise figure testing caused by technical terminology that many testers find hard to understand.

[0070] In addition to traditional amplifiers, downconverters, and upconverters, the types of Device Under Test (DUTs) have been expanded to include multi-stage cascaded frequency converters. Figure 1 The cascading parameter settings within the model directly convert frequency measurement parameters based on the set information and perform validity checks on the input information, thereby enabling direct noise figure measurement of multi-stage cascaded frequency converter links, such as... Figure 3 The diagram shows a typical connection block diagram of a two-stage frequency converter.

[0071] The above model also expands the application scope of the test system's down-converter mode. Besides setting the test system's down-converter to the on state in the original amplifier mode to become a spread spectrum measurement mode, the spread spectrum measurement mode can also be used when the DUT type is a down-converter, up-converter, or a multi-stage cascaded inverter. Figure 4 The typical test system shown is a frequency converter extended measurement connection.

[0072] When the device under test (DUT) is a downconverter, upconverter, or multi-stage cascaded inverter, the local oscillator conversion values ​​A and B of the DUT in the model can be set separately to determine whether the DUT's local oscillator signal is frequency multiplied or divided before being sent to the input of the internal mixer. Here, the numerator A represents the multiplication factor, and the denominator B represents the division factor; the default values ​​for A and B are 1. In multi-stage cascaded inverters, up to three cascaded inverter links can be set according to the number of cascaded stages, ranging from 1 to 3. The relationship between the RF input and IF output frequencies in the multi-stage cascaded inverter link is calculated step-by-step according to the mode of each inverter stage. Therefore, it is necessary to set the input and output parameters of each stage in the cascaded link. The inverter mode parameter settings for each stage are the same as the mode settings for a single inverter device. In this embodiment, each local oscillator source used in this mode can be externally controlled.

[0073] The parameter configuration model of the frequency converter noise figure testing system provided in this embodiment allows for customization of noise figure measurement methods for various frequency conversion mechanisms by the tester. This includes noise figure testing of a single frequency converter and multi-level cascaded frequency converter links. Each device under test (DUT) can be connected individually to a noise figure analyzer and noise source for direct noise figure measurement, or it can be connected together with the frequency converter, noise figure analyzer, and noise source within the system for direct noise figure measurement. For each frequency converter DUT, the instrument can automatically perform measurements in either fixed or sweep local oscillator modes. The integrated configuration interface allows for easy and simple setup of complex frequency converter test scenarios, providing repeatable and reliable test results. Based on the different noise figure testing modes described above, noise figure testing of different types of DUTs can be completed.

[0074] Before conducting noise figure tests on the device under test (DUT), calibration of the DUT noise figure testing system is also required. This involves flexibly utilizing the input frequency range of the noise figure analyzer's calibration reference plane to determine the validity of the calibration status during measurement, and expanding the applicability of calibration data in DUT noise figure measurement modes. Performing a single calibration can save testing time for various types of DUTs and improve the efficiency of noise figure testing for DUTs or systems.

[0075] During the calibration and measurement process, when the device under test is selected as a downconverter or upconverter, the output port of the noise source is directly connected to the signal input port of the noise figure tester during calibration, and the calibration reference plane is located at the signal input port of the noise figure tester.

[0076] As another implementation method, such as Figure 5As shown, when the device under test (DUT) type is selected as "System Down-Inverter On," the noise figure tester and the external system down-inverter form a test system. The signal first enters the signal input port of the system down-inverter and is then output to the input port of the noise figure tester. During calibration, the output port of the noise source is connected to the signal input port of the external system down-inverter, and the calibration reference plane is located at the signal input port of the external system down-inverter. At this time, press the calibration button on the panel of the noise figure tester or the calibration button in the menu to perform a calibration process. After calibration, the gain normalization display will show zero.

[0077] The above calibration methods specifically include:

[0078] Connect the noise source to the input port where the calibration reference plane of the noise figure test instrument or test system is located, perform calibration, and establish the noise calibration reference plane;

[0079] Extracting the input frequency F of the noise figure test instrument or test system's noise calibration reference surface during calibration. 校 The frequency range is used as the calibration frequency range;

[0080] Connect the device under test (DUT) to the calibration reference plane between the noise source and the noise figure test instrument or test system, configure the DUT parameters and determine the DUT noise figure test mode, and perform the noise figure test.

[0081] Obtain the input frequency F of the calibration reference surface of the noise figure test instrument or test system in the current test mode. 测 Determine the input frequency F 测 Is it in F? 校 If the input frequency is within the calibration frequency range, the calibration is valid and no recalibration is required (regardless of whether the parameters of the device under test have changed); otherwise, the calibration is invalid and recalibration is required.

[0082] The aforementioned testing method supports noise figure testing of individual frequency converters and cascaded frequency converter links with various frequency conversion mechanisms. It integrates and simplifies the intuitive configuration of complex parameters, expands the application scope of frequency converter calibration, effectively reduces the complexity of noise figure measurement for frequency converters and multi-stage frequency converter systems, effectively reduces the difficulty of measurement and the technical requirements for operators, and solves the problems of complex measurement modes, difficult parameter configuration, and low testing efficiency in existing frequency converter noise figure testing. It enables rapid, reliable, and effective measurement of the noise figure of various frequency converters. Furthermore, based on the noise figure testing of frequency converters, a calibration method for the noise figure testing system is also provided. Only one calibration is required, which can save testing time for various types of frequency converters and improve the efficiency of noise figure testing for frequency converters.

[0083] Example 2

[0084] This embodiment proposes a noise figure testing system for frequency converters, including:

[0085] The parameter configuration model building module is used to construct the parameter configuration model of the frequency converter noise figure test system; the objects of parameter configuration include the device under test and the noise figure test instrument.

[0086] The noise figure test mode construction module is used to configure the parameters of different parameter configuration objects according to the type of the test device, forming different noise figure test modes for different types of test devices.

[0087] The noise figure test module is used to complete the noise figure test of different types of test devices based on different noise figure test modes.

[0088] The steps and methods involved in the above embodiment two correspond to those in embodiment one. For specific implementation details, please refer to the relevant description section of embodiment one.

[0089] The above description is merely a preferred embodiment of the present invention and is not intended to limit the invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

[0090] While the specific embodiments of the present invention have been described above in conjunction with the accompanying drawings, this is not intended to limit the scope of protection of the present invention. Those skilled in the art should understand that various modifications or variations that can be made by those skilled in the art without creative effort based on the technical solutions of the present invention are still within the scope of protection of the present invention.

Claims

1. A method for testing the noise figure of a frequency converter, characterized in that, include: Construct a parameter configuration model for a noise figure testing system for frequency converters; the objects of parameter configuration include the device under test and the noise figure testing instrument. Based on the type of the test piece, different parameter configuration objects are configured to form different noise figure test modes for different types of test pieces; Based on different noise figure test modes, noise figure tests were completed for different types of test components. Before conducting noise figure testing on the device under test, the calibration of the frequency converter noise figure testing system is also included, specifically: Connect the noise source to the calibration reference plane input port of the noise figure test instrument or test system, perform calibration, and establish a noise calibration reference plane; Extract the frequency range of the input frequency of the noise figure test instrument or test system during calibration, and use it as the calibration frequency range. Connect the device under test (DUT) to the calibration reference plane between the noise source and the noise figure test instrument or test system, configure the DUT parameters and determine the DUT noise figure test mode, and perform the noise figure test. Obtain the input frequency of the calibration reference plane of the noise figure test instrument or test system in the current test mode, and determine whether the input frequency is within the calibration frequency range. If the input frequency is within the calibration frequency range, the calibration is valid; otherwise, the calibration is invalid and recalibration is required.

2. The method for testing the noise figure of a frequency converter as described in claim 1, characterized in that, The construction of the parameter configuration model is specifically as follows: based on the connection sequence of the noise figure test, and guided by the connection diagram, all measurement parameters are grouped and configured according to the parameter configuration object; Among them, testers can define object attribute parameters, and the connection example diagram changes with the different measurement mode parameters defined. By inputting and setting the parameters in the model, the noise figure of different modes of single-stage up-converter, down-converter, amplifier and multi-stage cascaded frequency converter can be measured. The configurable measurement connection objects in the parameter configuration model are divided into the device under test (DUT) and the noise figure test instrument, which includes the system downconverter and the noise figure analyzer.

3. The method for testing the noise figure of a frequency converter as described in claim 1, characterized in that, The parameters configured for the device under test include: device under test type, number of frequency conversion stages, sideband, LO mode, external LO control status, external LO power, RF input frequency of the device under test, IF output frequency of the device under test, local oscillator frequency of the device under test, and local oscillator frequency conversion value of the device under test; the device under test type includes amplifier, downconverter, upconverter, and multi-stage cascaded inverter.

4. The method for testing the noise figure of a frequency converter as described in claim 1, characterized in that, The noise figure testing instrument includes a frequency converter and a noise figure analyzer for the testing system.

5. The method for testing the noise figure of a frequency converter as described in claim 4, characterized in that, The parameters configured for the frequency converter in the test system include: the status of the frequency converter in the test system, the local oscillator frequency of the frequency converter in the test system, the intermediate frequency frequency of the frequency converter in the test system, the sideband, the LO mode, the external LO control status, and the external LO power.

6. The method for testing the noise figure of a frequency converter as described in claim 4, characterized in that, The parameters configured for the noise figure analyzer include: frequency type, frequency mode, and number of scan points.

7. The method for testing the noise figure of a frequency converter as described in claim 1, characterized in that, The process of configuring parameters for different types of test objects based on the type of test object to form different noise figure test modes for different types of test objects includes the following steps: Step 1: Determine whether the device under test is an amplifier. If yes, proceed to step 2. Otherwise, determine whether the device under test is a downconverter or an upconverter. If the device under test is determined to be a down-converter or up-converter, set the corresponding measurement mode parameters and execute step 3; otherwise, determine whether the device under test is a multi-stage cascaded inverter. If the device under test is determined to be a multi-level cascaded frequency converter, then set the corresponding multi-level cascaded frequency converter measurement mode parameters, perform frequency conversion and link information processing of the device under test port, and execute step 3; otherwise, perform DUT type illegal error processing. Step 2: Determine the status of the inverter in the test system. If the status is off, test the noise figure of the direct frequency device. Otherwise, set the spread spectrum mode parameters and proceed to step 4. Step 3: Determine the status of the frequency converter under the test system. If the status is off, proceed to step 4; otherwise, set the current spread spectrum parameters and proceed to step 4. Step 4: Automatically configure the sidebands according to the set parameters, calculate the measurement frequency, set the measurement channel, and measure the noise figure.

8. The method for testing the noise figure of a frequency converter as described in claim 7, characterized in that, The sidebands are automatically configured based on the set parameters. Specifically, the sideband type of the device under test is automatically determined using a noise figure analyzer based on the frequency relationship between the radio frequency and local oscillator frequency of the device under test.

9. A noise figure testing system for frequency converters, characterized in that, include: The parameter configuration model building module is used to construct the parameter configuration model of the frequency converter noise figure test system; the objects of parameter configuration include the device under test and the noise figure test instrument. The noise figure test mode construction module is used to configure the parameters of different parameter configuration objects according to the type of the test device, forming different noise figure test modes for different types of test devices. The noise figure test module is used to complete the noise figure test of different types of test devices based on different noise figure test modes; Before conducting noise figure testing on the device under test, the calibration of the frequency converter noise figure testing system is also included, specifically: Connect the noise source to the calibration reference plane input port of the noise figure test instrument or test system, perform calibration, and establish a noise calibration reference plane; Extract the frequency range of the input frequency of the noise figure test instrument or test system during calibration, and use it as the calibration frequency range. Connect the device under test (DUT) to the calibration reference plane between the noise source and the noise figure test instrument or test system, configure the DUT parameters and determine the DUT noise figure test mode, and perform the noise figure test. Obtain the input frequency of the calibration reference plane of the noise figure test instrument or test system in the current test mode, and determine whether the input frequency is within the calibration frequency range. If the input frequency is within the calibration frequency range, the calibration is valid; otherwise, the calibration is invalid and recalibration is required.

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