Test method, device and electronic equipment

Abstract

The application discloses a test method, a test device and electronic equipment, and is applied to an external flash memory type microcontroller. The external flash memory type microcontroller comprises a target storage device. The target storage device is a random access memory. The method comprises the following steps: detecting whether the external flash memory type microcontroller is externally connected with an external flash memory device, and obtaining a detection result; in the case that the detection result indicates that the external flash memory type microcontroller is externally connected with the external flash memory device, performing storage test processing on the target storage device, and obtaining a target test result; wherein the storage test processing is used for performing storage verification on a storage unit in the target storage device, and the target test result is used for indicating whether the storage unit in the target storage device is abnormal; and storing the target test result to the external flash memory device. The method can efficiently realize test processing on the external flash memory type microcontroller without increasing additional costs.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of semiconductors, and in particular to a test method, device, electronic equipment and computer readable medium. BACKGROUND

[0002] In the related art, for an external flash type microcontroller, i.e., an external flash type MCU, which can also be referred to as an external flash type chip, when performing test processing on such an MCU in a mass production stage, for example, when performing memory built-in self test (MBIST) processing, it is usually necessary to design additional storage media in the chip to achieve storage of test results.

[0003] The above test method for the external flash type MCU in the related art can have the following problems: 1. Additional storage media needs to be designed in the MCU to store test results, which has a certain cost problem; on the other hand, certain specific tests, such as MBIST tests, are usually performed in the CP (Chip Probe) test stage, which wastes a large amount of test time and has the problem of low efficiency. SUMMARY

[0004] To this end, the present application provides a test method to efficiently implement test processing on an external flash type microcontroller without increasing additional costs.

[0005] To achieve the above-mentioned purpose, the present application provides a test method in a first aspect, applied to an external flash type microcontroller, wherein the external flash type microcontroller includes a target storage device, and the target storage device is a random access memory; the method comprises:

[0006] detecting whether the external flash type microcontroller is externally connected with an external flash device, to obtain a detection result;

[0007] in a case where the detection result indicates that the external flash type microcontroller is externally connected with the external flash device, performing storage test processing on the target storage device to obtain a target test result; wherein the storage test processing is used to perform storage verification on a storage unit in the target storage device, and the target test result is used to indicate whether the storage unit in the target storage device has an abnormality;

[0008] storing the target test result to the external flash device.

[0009] Optionally, the performing storage test processing on the target storage device to obtain a target test result comprises performing memory built-in self test (MBIST) processing on the target storage device to obtain the target test result.

[0010] Optionally, the external flash device is provided with a target storage area for storing the target test result; and the storing the target test result into the external flash device comprises writing the target test result into the target storage area.

[0011] Optionally, before the step of performing the storage test processing on the target storage device, the method further comprises: detecting whether the target test result is stored in the target storage area; and in a case where the target test result is not stored in the target storage area, performing the step of performing the storage test processing on the target storage device.

[0012] Optionally, after the storing the target test result into the external flash device, the method further comprises: performing storage address remapping processing on the target storage device based on the target test result, wherein the storage address remapping processing is used for performing storage address remapping processing on a storage unit in the target storage device that does not have an abnormality.

[0013] Optionally, the external flash device comprises an SPI Flash.

[0014] Optionally, before the step of detecting whether the external flash type microcontroller is externally connected with the external flash device to obtain a detection result, the method further comprises: in a case where it is detected that the external flash type microcontroller is powered on, performing the step of detecting whether the external flash type microcontroller is externally connected with the external flash device to obtain a detection result.

[0015] To achieve the above object, the second aspect of the present application provides a test device applied to an external flash type microcontroller, wherein the external flash type microcontroller comprises a target storage device, and the target storage device is a random access memory; and the test device comprises:

[0016] a detection module configured to detect whether the external flash type microcontroller is externally connected with an external flash device to obtain a detection result;

[0017] a test module configured to, in a case where the detection result indicates that the external flash type microcontroller is externally connected with the external flash device, perform storage test processing on the target storage device to obtain a target test result, wherein the storage test processing is used for performing storage verification on a storage unit in the target storage device, and the target test result is used for indicating whether the storage unit in the target storage device has an abnormality;

[0018] a storage module configured to store the target test result into the external flash device.

[0019] To achieve the above object, the third aspect of the present application further provides an electronic device comprising one or more flash memory type microcontrollers, which are used to implement the test method of the first aspect.

[0020] To achieve the above object, the fourth aspect of the present application further provides a computer readable medium, which stores a computer program, and the program is executed by a processor to implement the test method of the first aspect.

[0021] The present application has the following advantages: according to the embodiments of the present application, when testing the flash memory type microcontroller, especially when testing the target storage device, i.e. the random access memory (RAM) in the microcontroller, the storage test processing of the target storage device in the microcontroller can be performed after the flash memory type microcontroller is put into use, i.e. after the microcontroller is put into application, and the storage test processing is performed based on the detection result that the flash memory type microcontroller is externally connected with the external flash memory device, so as to check whether the storage unit in the target storage device is abnormal, and after obtaining the target storage result, the target storage result is stored in the external flash memory device.

[0022] Based on the test method provided by the embodiments of the present application, the target storage device, i.e. the RAM in the flash memory type microcontroller, does not need to be tested in the CP test phase, and the storage test processing of the target storage device in the microcontroller can be performed after the flash memory type microcontroller is put into use, i.e. after the microcontroller is put into application, and the storage test processing is performed based on the detection result that the flash memory type microcontroller is externally connected with the external flash memory device, so as to check whether the storage unit in the target storage device is abnormal, and after obtaining the target storage result, the target storage result is stored in the external flash memory device. BRIEF DESCRIPTION OF DRAWINGS

[0023] The accompanying drawings are included to provide a further understanding of the present application, and constitute a part of the specification, and together with the specific embodiments below, serve to explain the present application, but do not constitute a limitation of the present application.

[0024] Figure 1A flowchart of a test method provided for an embodiment of the present application is shown in FIG. 1.

[0025] Figure 2 A flowchart of a test process provided for an embodiment of the present application is shown in FIG. 2.

[0026] Figure 3 A block diagram of a test device provided for an embodiment of the present application is shown in FIG. 3. DETAILED DESCRIPTION

[0027] The specific embodiments of the present application will be described in detail below with reference to the accompanying drawings. It should be understood that the specific embodiments described herein are merely illustrative and explanatory and are not intended to limit the present application.

[0028] It should be noted that the terms "first", "second", and the like in the description and the claims of the present application and the above-described accompanying drawings are used to distinguish similar objects, and do not necessarily have to describe a specific order or sequence; and, in the case of no conflict, the embodiments of the present application and the features in the embodiments can be combined with each other at will.

[0029] As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0030] The terms used in the present application are used only to describe specific embodiments, and are not intended to limit the present application. As used herein, the singular forms "a" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.

[0031] When the terms "comprise" and / or "consist of" are used in the present application, it is specified that the features, integers, steps, operations, elements, and / or components exist, but it does not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0032] Unless otherwise defined, all terms used in the present application, including technical and scientific terms, have the same meaning as commonly understood by one of ordinary skill in the art. It will also be understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning that is consistent with their meaning in the context of the relevant art and the present application, and should not be interpreted in an idealized or overly formal sense, unless expressly so defined in the present application.

[0033] Micro Controller Unit (MCU), also known as Single Chip Microcomputer, refers to a chip-level computer formed by integrating CPU, RAM, ROM, timing counter and various I / O interfaces on a chip with the emergence and development of large-scale integrated circuits.

[0034] MCUs can be generally classified into MASK MCUs, OTP (One Time Programmable) MCUs and Flash MCUs according to their memory types, and the Flash MCUs can be further classified into on-chip Flash MCUs and off-chip Flash MCUs.

[0035] In the related art, when the off-chip Flash MCU is tested, especially when the RAM in the off-chip Flash MCU is tested by MBIST in the CP test stage, in order to store the test results, an additional storage medium needs to be designed in the MCU, for example, an OTP (One Time Programmable) storage device is additionally designed to store the test results obtained after the MBIST test on the RAM in the MCU, which often increases the cost of the MCU. In addition, the MBIST test on the RAM in the MCU in the CP test stage often consumes a large amount of time, which on the one hand causes low test efficiency, and on the other hand further increases the manufacturing cost of the MCU.

[0036] In the implementation of the present application, the inventors found that for the off-chip Flash MCU, why an additional storage medium needs to be designed in the chip to store the test results of the MBIST test on the RAM in the chip is that after the MBIST test is completed, all the data stored in the RAM in the chip will be emptied when the storage address remapping processing on the RAM in the chip is performed, but the storage address remapping processing on the RAM in the chip needs to be performed based on the good or bad condition of each storage unit in the RAM indicated in the test results obtained by the MBIST test. However, the off-chip Flash MCU is usually not externally mounted with a storage chip in the production stage, especially in the CP test stage, which makes it necessary to design an additional storage medium in the chip, i.e. in the off-chip Flash MCU, to store the test results for the storage address remapping processing on the RAM in the chip based on the test results of the MBIST test in the CP test stage. However, in the production stage of the off-chip Flash MCU, even if part of the storage units in the RAM in the chip are abnormal, the impact is often small, so it can be considered to perform the storage test processing on the RAM in the chip in other stages to improve the test efficiency of the off-chip Flash MCU without additional cost.

[0037] To solve the problem of low efficiency in testing the external Flash type MCU in the prior art without increasing the cost, embodiments of the present application provide a testing method, please refer to Figure 1 , which is a flowchart of a testing method provided by the embodiments of the present application. The method can be applied to an external Flash type microcontroller, i.e. an external Flash type MCU, which includes a target storage device, which can be a random access memory (RAM).

[0038] It should be noted that the external Flash type microcontroller in the embodiments of the present application can be an MCU without a read-only memory (ROM) in the chip, i.e. it can be a pure functional chip to reduce the production cost.

[0039] As shown in Figure 1 , the testing method provided by the embodiments of the present application can include the following steps S101-S103, which will be described in detail below.

[0040] Step S101: detecting whether the external Flash type microcontroller is externally connected with an external flash device to obtain a detection result.

[0041] In the embodiments of the present application, the external flash device can be an SPI Flash, i.e. a flash device based on a serial peripheral interface (SPI). Of course, in some embodiments, the external Flash type microcontroller can also be externally connected with other types of storage devices, which are not specially limited here.

[0042] In some embodiments, before performing the step S101, the method further includes: performing the step S101 when it is detected that the external Flash type microcontroller is powered on.

[0043] That is, in the embodiments of the present application, in order to improve the testing efficiency of the external Flash type microcontroller, especially the testing efficiency of the external Flash type microcontroller in the CP testing stage of the production process, some specific testing processes for the external Flash type microcontroller, such as the MBIST testing process for the target storage device in the internal MCU, i.e. the RAM in the chip, can be performed in the stage when the external Flash type microcontroller is produced and put into use, so as to solve the problem that the testing efficiency is low and the testing cost is increased when the testing process is performed in the CP testing stage in the prior art because a lot of time is consumed.

[0044] That is, in actual implementation, after the external flash memory type microcontroller is applied in a client, for example, is applied in an electronic device, when the electronic device is powered on, the external flash memory type microcontroller executes the test method described in the embodiment of the application to execute the specific test processing, for example, the MBIST test for the on-chip RAM.

[0045] In some embodiments, the detection of whether the external flash memory type microcontroller is externally connected with the external flash memory device in step S101 obtains a detection result, which can be: the external flash memory type microcontroller performs communication processing with the external flash memory device based on a preset communication protocol, if the communication processing is successful, the detection result is set to information indicating that the external flash memory type microcontroller is externally connected with the external flash memory device; otherwise, the detection result is set to information indicating that the external flash memory type microcontroller is not externally connected with the external flash memory device.

[0046] In actual implementation, the preset communication protocol can be a self-defined communication protocol, and the communication processing based on the preset communication protocol with the external flash memory device can be: the external flash memory type microcontroller externally sends a detection data packet generated based on the preset communication protocol based on a preset pin; if the external flash memory type microcontroller is externally connected with the external flash memory device, the external flash memory device can send a response data packet generated based on the preset communication protocol to the external flash memory type microcontroller after receiving the detection data packet. Of course, this is only an example, and in actual implementation, other ways of communication processing with the external flash memory device can also be used to detect whether the external flash memory type microcontroller is externally connected with the external flash memory device, which is not specially limited here. For example, in some embodiments, the external flash memory type microcontroller can also perform an external reading processing after being powered on, if data can be successfully read, it indicates that it is externally connected with the external flash memory device, otherwise, it indicates that it is not externally connected with the external flash memory device.

[0047] Step S102, in the case where the detection result indicates that the external flash memory type microcontroller is externally connected with the external flash memory device, performing storage test processing on the target storage device to obtain a target test result; wherein the storage test processing is used to perform storage verification on the storage units in the target storage device, and the target test result is used to indicate whether the storage units in the target storage device are abnormal.

[0048] In the case where it is detected based on step S101 that the external flash memory type microcontroller is externally connected with the external flash memory device, for example, SPIFlash, some specific test processing can be performed on the external flash memory type microcontroller, for example, storage test processing on the on-chip target storage device, that is, RAM, to verify whether each storage unit in the RAM is abnormal.

[0049] In some embodiments, the storage test processing performed on the target storage device in step S102 to obtain the target test result can be a memory built-in self test (MBIST) processing performed on the target storage device to check whether each storage unit in the target storage device is abnormal.

[0050] The MBIST processing is used to test each storage unit in the target storage device to check whether each storage unit is abnormal.

[0051] In step S103, the target test result is stored in the external flash device.

[0052] In the embodiments of the present application, since the storage test processing is performed on the target storage device in the MCU in the case that the external flash device is externally connected to the MCU, after the target test result indicating whether each storage unit in the target storage device is abnormal is obtained, the target test result can be directly stored in the external flash device instead of being additionally stored in a storage medium in the MCU, so as to reduce the production cost of the MCU.

[0053] It can be seen that, based on the test method provided in the embodiments of the present application, the target storage device, i.e., the RAM, in the external flash MCU does not need to be tested in the CP test stage, and the storage test processing can be performed after the external flash MCU is put into use, i.e., after the MCU is put into application, and in the case that the MCU is externally connected to the external flash device, so as to improve the test efficiency of the MCU in the CP test stage. Meanwhile, since the external flash MCU is usually externally connected to the external flash device after being put into use, when the target storage device in the MCU is tested, the target test result does not need to be additionally stored in a storage medium in the MCU, but can be stored in the external flash device externally connected to the MCU, so as to test the external flash MCU without affecting the use of the MCU and without increasing the cost, and improve the test efficiency.

[0054] In some embodiments, a target storage area for storing the target test result can be set in the external flash device externally connected to the external flash MCU. In this embodiment, the step S103 of storing the target test result in the external flash device includes writing the target test result in the target storage area.

[0055] Generally, the MBIST test process for the RAM in the external flash type microcontroller is only needed once in the mass production stage, therefore, in the embodiment of the present application, to avoid the test process being executed every time the external flash type microcontroller is powered on after it is put into use, a target storage area in the external flash device attached to the external flash type microcontroller is set for storing the MBIST test result for the RAM in the microcontroller, and after the MBIST test process for the RAM in the microcontroller is executed, the target test result obtained is written into the target storage area for permanent storage, so as to avoid the target test result written into the external flash device being erased.

[0056] In this way, after the MBIST test for the target storage device in the microcontroller is executed once when the external flash type microcontroller is powered on, after it is powered off and powered on again, it can be determined whether the target test result is stored in the target storage area in the external flash device attached to the external flash type microcontroller, and if the target test result is stored, the test process does not need to be executed again.

[0057] That is, in some embodiments, before the step of executing the storage test process for the target storage device in step S102 is executed, the method further comprises: detecting whether the target test result is stored in the target storage area; and if the target test result is not stored in the target storage area, executing the step of executing the storage test process for the target storage device.

[0058] In addition, it can be understood that, in some embodiments, after the target test result is stored in the external flash device based on step S103, the method can further comprise: based on the target test result, executing a storage address remapping process for the target storage device, wherein the storage address remapping process is used for performing storage address remapping for the storage units in the target storage device that do not have an abnormality.

[0059] That is, after the MBIST test process is executed for the target storage device, i.e. the RAM, in the external flash type microcontroller, based on the target test result obtained, which indicates whether each storage unit in the target storage device has an abnormality, storage address mapping is performed for each storage unit that does not have an abnormality, so as to establish a logical connection relationship for the plurality of storage units that do not have an abnormality, thereby improving the storage efficiency.

[0060] In actual implementation, the storage address remapping process executed for the target storage device based on the target test result can be executed by a preset hardware circuit in the external flash type microcontroller based on the target test result, and the detailed process is not described herein.

[0061] Please refer to Figure 2, which is a flowchart of a test processing provided by an embodiment of the present application. In order to facilitate understanding of the test method provided by the embodiment of the present application, the following will be described in combination with Figure 2 , which is a flowchart of a test method provided by an embodiment of the present application.

[0062] Specifically, as shown in Figure 2 , for the external flash memory type microcontroller to be tested, after the external flash memory type microcontroller is put into use, for example, is applied in an electronic device, for example, a mobile phone, a tablet computer or the like, after the external flash memory type microcontroller is powered on, step S201 can be executed to detect whether the external flash memory type microcontroller is externally mounted with an SPI FLASH; that is, whether the external flash memory type microcontroller is externally mounted with an external flash memory device.

[0063] As shown in Figure 2 , if the detection result obtained based on the S201 indicates that the external flash memory type microcontroller is not externally mounted with an SPI FLASH, the processing can be ended, otherwise, step S202 can be executed to detect whether the target storage area of the SPI FLASH stores a target test result; wherein the target test result can be information generated based on a custom protocol to indicate whether each storage unit in the RAM in the external flash memory type microcontroller is abnormal.

[0064] Please continue to refer to Figure 2 , if the target storage area of the SPI FLASH stores the target test result based on the step S202, it indicates that the storage test processing, that is, the MBIST processing, has been performed on the target storage device in the chip, at this time, the target storage area of the SPI FLASH can end the test processing, that is, end the self-checking, and execute the subsequent step S205; otherwise, if the target storage area of the SPI FLASH does not store the target test result based on the step S202, step S203 is executed to perform the MBIST processing on the target storage device to obtain the target test result; and after step S203, step S204 is executed to store the target test result to the target storage area of the SPI FLASH.

[0065] Please continue to refer to Figure 2 , after step S204, the external flash memory type microcontroller can also execute step S205 to perform a storage address remapping processing on the target storage device based on the target test result to logically link the storage spaces of the storage units in the RAM in the chip which do not exist abnormal.

[0066] It can be understood that after step S205 is executed, the external flash memory type microcontroller can execute internal program transfer and run the program based on the target storage device, that is, the RAM after the remapping processing.

[0067] It should be noted that Figure 2 The test method described above is only illustrative, and is not limited in particular.

[0068] It should be noted that the steps of the above methods are only for clear description, and can be combined into one step or split into multiple steps during implementation, as long as the same logical relationship is included, and all are within the protection scope of the patent; adding insignificant modifications or introducing insignificant designs in the algorithm or process, but not changing the core design of the algorithm and process, are within the protection scope of the patent.

[0069] The embodiment of the application further provides a test device, as shown in the figure, the test device 300 is applied to an external flash memory type microcontroller, the external flash memory type microcontroller contains a target storage device, and the target storage device is a random access memory; the test device 300 can include a detection module 301, a test module 302 and a storage module 303. Figure 3

[0070] The detection module 301 is used for detecting whether the external flash memory type microcontroller is externally connected with an external flash memory device, and obtaining a detection result.

[0071] The test module 302 is used for executing storage test processing on the target storage device in the case that the detection result indicates that the external flash memory type microcontroller is externally connected with the external flash memory device, and obtaining a target test result, wherein the storage test processing is used for performing storage verification on a storage unit in the target storage device, and the target test result is used for indicating whether the storage unit in the target storage device is abnormal.

[0072] The storage module 303 is used for storing the target test result to the external flash memory device.

[0073] In some embodiments, a target storage area for storing the target test result is arranged in the external flash memory device; and the storage module 303 can be used for writing the target test result into the target storage area when storing the target test result to the external flash memory device.

[0074] In some embodiments, the test device 300 further includes a test result detection module, which is used for detecting whether the target test result is stored in the target storage area; and in the case that the target test result is not stored in the target storage area, the step of executing the storage test processing on the target storage device is executed.

[0075] ​In some embodiments, the test device 300 further comprises a mapping module configured to perform storage address remapping processing on the target storage device based on the target test result, wherein the storage address remapping processing is configured to perform storage address remapping processing on the storage unit in the target storage device that does not have an abnormality.

[0076] The test device provided by the embodiments of the present application has the functions or comprises the modules which can be used to execute the method described in the embodiments of the second aspect, and the specific implementation and technical effects can refer to the description of the method embodiments. In order to be brief, the description will not be repeated here.

[0077] It should be noted that each module involved in the present embodiment is a logical module. In actual application, one logical unit can be one physical unit, or a part of one physical unit, or realized by a combination of multiple physical units. In addition, in order to highlight the innovative part of the present application, some units that are not closely related to solving the technical problems proposed by the present application are not introduced in the present embodiment, but this does not mean that there are no other units in the present embodiment.

[0078] The embodiments of the present application also provide an electronic device, which can include: an external flash memory device; and one or more external flash memory microcontrollers configured to implement the test method described in the embodiments of the present application.

[0079] The present embodiment also provides a computer readable medium having a computer program stored thereon, wherein the program is executed by a processor to implement the test method in the embodiments of the present application.

[0080] Those skilled in the art can understand that all or some of the steps in the method, the functional modules / units in the system and the device described above can be implemented by software, firmware, hardware, or a combination thereof. In the hardware implementation, the division between the functional modules / units mentioned in the above description does not necessarily correspond to the division of physical components; for example, one physical component can have multiple functions, or one function or step can be performed by several physical components in cooperation. Some or all of the physical components can be implemented as software executed by a processor, such as a central processing unit, a digital signal processor, or a microprocessor, or as hardware, or as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on computer-readable media, which can include computer storage media (or non-transitory media) and communication media (or transitory media). As is well known to those skilled in the art, the term computer storage media includes volatile and non-volatile, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory or other memory technology, CD-ROM, digital versatile disks (DVD) or other optical disk storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage devices, or any other medium which can be used to store the desired information and which can be accessed by a computer. In addition, it is well known to those skilled in the art that communication media typically embodies computer readable instructions, data structures, program modules or other data in a modulated data signal such as a carrier wave or other transport mechanism and can include any information delivery media.

[0081] It should be noted that the terms "comprising", "including", or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements recited, but can also include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element preceded by "comprises a" does not, without more constraints, foreclose the existence of additional identical elements in the process, method, article, or apparatus that comprises the element.

[0082] Those skilled in the art can understand that although some embodiments described herein include certain features included in other embodiments but not others, the combination of features of different embodiments means that it is within the scope of the embodiments and forms different embodiments.

[0083] It is understood that the above embodiments are only exemplary for illustrating the principles of the present application, and the present application is not limited thereto. Various modifications and improvements can be made by those skilled in the art without departing from the spirit and scope of the present application, and these modifications and improvements are also considered as the protection scope of the present application.

Claims

1. A testing method, characterized in that, The method is applied to an external flash memory-based microcontroller, wherein the external flash memory-based microcontroller includes a target storage device, which is a random access memory; the method includes: The detection method determines whether the external flash memory microcontroller has an external flash memory device connected to it, and obtains the detection result. The external flash memory microcontroller is in the stage where it has been manufactured and put into use. If the detection result indicates that the external flash memory microcontroller is connected to the external flash memory device, a storage test process is performed on the target storage device to obtain a target test result; wherein, the storage test process is used to perform storage verification on the storage cells in the target storage device, and the target test result is used to indicate whether there is an anomaly in the storage cells in the target storage device; The target test results are stored in the external flash memory device.

2. The method according to claim 1, characterized in that, The process of performing storage testing on the target storage device to obtain the target test results includes: The built-in memory self-test (MBIST) process is performed on the target storage device to obtain the target test result.

3. The method according to claim 1, characterized in that, The external flash memory device is provided with a target storage area for storing the target test results; The step of storing the target test results to the external flash memory device includes: Write the target test results into the target storage area.

4. The method according to claim 3, characterized in that, Prior to the step of performing storage testing on the target storage device, the method further includes: Detect whether the target test result is stored in the target storage area; If the target test result is not stored in the target storage area, the step of performing storage test processing on the target storage device is executed.

5. The method according to claim 1, characterized in that, After storing the target test results to the external flash memory device, the method further includes: Based on the target test results, a storage address remapping process is performed on the target storage device, wherein the storage address remapping process is used to remap the storage addresses of storage cells in the target storage device that do not have any abnormalities.

6. The method according to claim 1, characterized in that, Before performing the step of detecting whether the external flash memory microcontroller has an external flash memory device connected and obtaining the detection result, the method further includes: When the external flash memory microcontroller is detected to be powered on, the step of detecting whether the external flash memory microcontroller has an external flash memory device connected to it and obtaining the detection result is performed.

7. The method according to any one of claims 1-6, characterized in that, The external flash memory device includes SPIFlash.

8. A testing apparatus, characterized in that, It is applied to an external flash memory type microcontroller, wherein the external flash memory type microcontroller includes a target storage device, and the target storage device is a random access memory; The testing apparatus includes: The detection module is used to detect whether the external flash memory microcontroller has an external flash memory device connected to it, and to obtain the detection result, wherein the external flash memory microcontroller is in the stage of having been manufactured and put into use; The testing module is used to perform storage testing on the target storage device when the detection result indicates that the external flash memory microcontroller is connected to the external flash memory device, and obtain a target test result. The storage testing process is used to perform storage verification on the storage cells in the target storage device, and the target test result is used to indicate whether there is an anomaly in the storage cells in the target storage device. A storage module is used to store the target test results to the external flash memory device.

9. An electronic device, characterized in that, include: External flash memory devices; One or more external flash memory microcontrollers, wherein the one or more external flash memory microcontrollers are used to implement the test method according to any one of claims 1-7.

10. A computer-readable medium having a computer program stored thereon, the program being executed by a processor to implement the test method according to any one of claims 1-7.

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