Circuit board testing device

Abstract

The embodiment of the present application provides a circuit board testing device, comprising: a base assembly comprising a first mounting plate and a needle plate detachably connected to the first mounting plate; a carrier plate arranged on the needle plate, the carrier plate being provided with a first placement position for placing a first measured circuit board and a second placement position for placing a second measured circuit board; a testing interface arranged on the carrier plate, the testing interface being used for electrical connection with the first measured circuit board or the second measured circuit board; and a testing plug used for electrical connection with a testing machine and used for plugging on the testing interface. The circuit board testing device provided by the embodiment of the present application can realize the testing of two different measured circuit boards, without the need of developing and producing two different circuit board testing devices for the two different measured circuit boards, thereby reducing the development and production cost of the circuit board testing device.

Description

Technical Field

[0001] This invention relates to the field of circuit board testing technology, and in particular to circuit board testing apparatus. Background Technology

[0002] Functional Circuit Test (FCT) is a testing method that provides a simulated operating environment (stimuli and loads) to the target board, causing it to operate in various design states, thereby obtaining parameters for each state to verify the functionality of the target board.

[0003] Currently, a single circuit board testing device can only test one type of circuit board product. Different circuit board testing devices need to be developed for different circuit board products, which means that the research and development and production costs of circuit board testing devices are relatively high. Summary of the Invention

[0004] The purpose of this invention is to provide a circuit board testing device to solve the technical problem of high research and development and production costs of different circuit board testing devices for testing different circuit board products in the prior art. The specific technical solution is as follows:

[0005] An embodiment of the present invention provides a circuit board testing device, comprising:

[0006] The base assembly includes a first mounting plate and a pin plate detachably connected to the first mounting plate;

[0007] A carrier plate is disposed on the needle plate, and the carrier plate is provided with a first placement position for placing a first circuit board under test and a second placement position for placing a second circuit board under test;

[0008] A test interface is provided on the carrier board, and the test interface is used to electrically connect to the first circuit board under test or the second circuit board under test;

[0009] A test plug is used for electrical connection with a test machine, and the test plug is also used for insertion into the test interface.

[0010] Optionally, it also includes a top assembly hinged to the base assembly, the top assembly including a second mounting plate and a top plate module detachably connected to the second mounting plate, the top plate module including the test plug.

[0011] Optionally, the base assembly has a length direction, with the length direction of the base assembly as the first direction, and multiple first placement positions and multiple second placement positions are provided along the first direction. Multiple test interfaces are provided along the first direction, and the multiple test interfaces correspond one-to-one with the multiple first placement positions. The top plate module includes multiple test plug groups, and the multiple test plug groups correspond one-to-one with the multiple test interfaces.

[0012] Optionally, the top component has a width direction and a height direction, with the width direction of the top component as the second direction and the height direction of the top component as the third direction. The top plate module includes a pressure plate, and the pressure plate is provided with a moving component for driving the test plug group to move along the second direction and the third direction. The moving component is used to drive the test plug to be inserted into the test interface.

[0013] Optionally, the test plug assembly includes two test plugs, and the test machine includes a first test machine and a second test machine, with the two test plugs respectively used for electrical connection between the first test machine and the second test machine;

[0014] The top panel module also includes a plug connection plate, which is connected to the movable component. Two mounting components for mounting the two test plugs are fastened to the plug connection plate.

[0015] Optionally, the mounting component includes a first plug mounting block and a second plug mounting block. The first plug mounting block is fastened to the plug connecting plate. The side of the first plug mounting block facing away from the plug connecting plate is connected to the second plug mounting block by a spring. The test plug is mounted on the second plug mounting block.

[0016] Optionally, an interface fixing block is provided on the carrier plate, and the interface fixing block is provided with a plurality of interface mounting blocks for mounting a plurality of test interfaces respectively. The plurality of interface mounting blocks are spaced apart along the first direction, and the test interface is mounted on the side of the interface mounting block opposite to the first placement position.

[0017] Optionally, the base assembly includes a locking mechanism, which includes a first driving member and a locking member connected to the first driving member. The locking member has a locked state and an unlocked state. The top assembly has an open state and a closed state. When the locking member is in the locked state, the top assembly remains in the closed state. When the locking member is in the unlocked state, the top assembly can be opened by the second driving member.

[0018] The first mounting plate is also provided with a micro switch, which is electrically connected to the first driving component. When the top component rotates from the open state to the closed state, the second mounting plate triggers the micro switch, which sends an electrical signal to the first driving component, so that the first driving component drives the locking component to move from the unlocked state to the locked state.

[0019] Optionally, it also includes a first connecting flexible board, a first end of which is electrically connected to the test interface, a second end of which is used to be electrically connected to the first circuit board under test, and the second end of which is also used to be electrically connected to the second circuit board under test via a second connecting flexible board.

[0020] Optionally, the second mounting plate is provided with a third driving member for driving the pressure plate to move along the third direction. The pressure plate is provided with a first pressing part for pressing the connection between the first connecting flexible board and the first circuit board under test and a second pressing part for pressing the connection between the second connecting flexible board and the second circuit board under test.

[0021] The circuit board testing device provided in this embodiment of the invention, through a test plug and a test interface, enables the tester to establish communication with either the first or second circuit board under test, thereby allowing testing of either the first or second circuit board under test placed on a carrier board. In other words, this single circuit board testing device can test two different types of circuit boards under test, eliminating the need to develop and manufacture two separate testing devices for each type, thus reducing the R&D and production costs of circuit board testing devices. Furthermore, in this embodiment, the pin plate is detachably connected to the first mounting plate, and the carrier plate is mounted on the pin plate. This allows the carrier plate and pin plate to be removed from the base assembly for replacement with new ones, enabling testing of other circuit board pairs and providing wide adaptability. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the accompanying drawings used in the description of the embodiments or the prior art will be briefly introduced below.

[0023] Figure 1 This is a schematic diagram of the circuit board testing device provided in an embodiment of the present invention when the top component is in the closed state;

[0024] Figure 2 This is a structural schematic diagram of the circuit board testing device provided in the embodiment of the present invention when the top component is in the open state;

[0025] Figure 3 This is a schematic diagram of the structure of the base assembly provided in an embodiment of the present invention. Figure 1 ;

[0026] Figure 4 This is a schematic diagram of the structure of the top component provided in an embodiment of the present invention;

[0027] Figure 5 This is a schematic diagram of the structure of the interface fixing block and the interface mounting block provided in the embodiment of the present invention;

[0028] Figure 6 This is a schematic diagram of the structure of the top panel module and the second mounting plate provided in an embodiment of the present invention;

[0029] Figure 7 This is a schematic diagram of the structure of the pressure plate, the moving component, and the plug connection plate provided in the embodiment of the present invention;

[0030] Figure 8 This is a schematic diagram of the plug connection plate and mounting components provided in an embodiment of the present invention;

[0031] Figure 9 This is a schematic diagram of the structure of the base assembly provided in an embodiment of the present invention. Figure 2 .

[0032] Figure label:

[0033] 10-Base assembly, 11-First mounting plate, 12-Pin plate, 13-Carrier plate, 14-Test interface, 15-Locking mechanism, 16-Micro switch, 17-Second driving component, 18-First connecting flexible board, 19-First side plate, 20-Top assembly, 21-Second mounting plate, 22-Top plate module, 23-Test plug, 24-Connecting plate, 25-Moving assembly, 26-Plug connecting plate, 27-Mounting component, 28-Pressure plate, 29-Third driving component, 131-First placement position, 132-Second placement position, 133-Interface fixing block, 134-Interface mounting block, 151-First driving component, 152-Locking component, 191-Start button, 241-Mating part, 251-First cylinder, 252-Second cylinder, 271-First plug mounting block, 272-Second plug mounting block. Detailed Implementation

[0034] The technical solutions of the present invention will now be described with reference to the accompanying drawings in the embodiments of the present invention.

[0035] The embodiments described herein are for illustrative purposes only and are not intended to limit the scope of the invention. The invention is described more specifically in the following paragraphs by way of example with reference to the accompanying drawings. It should be noted that the drawings are in a very simplified form and use non-precise proportions, and are only used to facilitate and clarify the illustration of the embodiments of the invention.

[0036] Reference Figures 1 to 9 The circuit board testing device provided in this embodiment of the invention includes: a base assembly 10, including a first mounting plate 11 and a pin plate 12 detachably connected to the first mounting plate 11; a carrier plate 13, disposed on the pin plate 12, the carrier plate 13 having a first placement position 131 for placing a first circuit board under test and a second placement position 132 for placing a second circuit board under test; a test interface 14, disposed on the carrier plate 13, the test interface 14 being used for electrical connection with the first circuit board under test or the second circuit board under test; and a test plug 23, used for electrical connection with a testing machine, the test plug 23 also being used for plugging into the test interface 14.

[0037] Specifically, the circuit board testing device is used for FCT testing of a first circuit board under test or a second circuit board under test. It can be used to test a single first circuit board under test or a single second circuit board under test, or it can be used to test multiple first circuit boards under test or multiple second circuit boards under test. The first circuit board under test and the second circuit board under test are circuit boards of different sizes and / or different types. For example, the first circuit board under test can be an MB (Motherboard) board, and the second circuit board under test can be an I / O board.

[0038] The base assembly 10 includes a lower housing frame, which includes a first mounting plate 11. The base assembly 10 has mutually perpendicular height, length, and width directions. The length direction of the base assembly 10 can be referenced... Figure 3 The direction indicated by arrow A in the middle indicates the height direction of the base assembly 10. Figure 1 and Figure 3 The direction indicated by arrow B. The needle plate 12 can be placed directly on the first mounting plate 11, or it can be snapped or screwed onto the first mounting plate 11. The carrier plate 13 can be floatingly disposed on the needle plate 12, in which case the carrier plate 13 and the needle plate 12 are connected by a spring. The carrier plate 13 can be made of anti-static material.

[0039] Reference Figure 3The carrier plate 13 is provided with a first placement position 131 for placing a first circuit board under test and a second placement position 132 for placing a second circuit board under test. Each of the first and second placement positions 131 and 132 can be provided as a single position or multiple positions. The first and second placement positions 131 and 132 can be spaced apart along the width direction of the base assembly 10. The base assembly 10 includes a pin plate 12, a carrier plate 13, and other structures provided on the carrier plate 13. The pin plate 12 and the carrier plate 13 are replaceable; that is, the pin plate 12 and the carrier plate 13 can be removed from the base assembly 10 to replace them with new carrier plates 13 and pin plates 12, thus enabling testing of other circuit board pairs. It should be noted that different carrier plates 13 are used to place different circuit boards under test. For example, another carrier plate 13 can be provided with a third placement position for placing a third circuit board under test and a fourth placement position for placing a fourth circuit board under test, wherein the first, second, third, and fourth circuit boards under test are all different.

[0040] Test interface 14 can be a Type-C interface. Specifically, test interface 14 is indirectly connected to carrier board 13. The number of test interfaces 14 corresponds to the number of first placement positions 131 or second placement positions 132 on carrier board 13. The number of first placement positions 131 can be the same as the number of second placement positions 132. For example, if both first placement positions 131 and second placement positions 132 are set to two, then there are two test interfaces 14. During a single test, test interface 14 can only be electrically connected to the first or second circuit board under test placed on carrier board 13, meaning that only one type of circuit board can be tested at a time.

[0041] Test plug 23 is compatible with test interface 14 and can be plugged into test interface 14. There is an electrical connection between test plug 23 and test interface 14. Test plug 23 can also be electrically connected to an external testing device, such as a host computer, PC, or video capture card. Through the testing device, test plug 23, and test interface 14, testing of either the first or second circuit board under test can be performed.

[0042] The circuit board testing device provided in this embodiment of the invention, through the test plug 23 and the test interface 14, enables the tester to connect with the first circuit board under test or the second circuit board under test, thereby enabling the testing of the first circuit board under test or the second circuit board under test placed on the carrier board 13. That is, the circuit board testing device provided in this embodiment of the invention can perform testing of two different circuit boards under test without the need to develop and produce two different circuit board testing devices for two different circuit boards under test, thereby reducing the research and development and production costs of the circuit board testing device. In addition, in this embodiment of the invention, the pin plate 12 is detachably connected to the first mounting plate 11, and the carrier plate 13 is disposed on the pin plate 12. That is, the carrier plate 13 and the pin plate 12 can be removed from the base assembly 10 to replace the new carrier plate 13 and the pin plate 12, thereby enabling it to be applied to the testing of other circuit board pairs, with wide adaptability.

[0043] The circuit board testing device provided in this embodiment of the invention also includes a top component 20 hinged to the base assembly 10. The top component 20 includes a second mounting plate 21 and a top plate module 22 detachably connected to the second mounting plate 21. The top plate module 22 includes a test plug 23.

[0044] Specifically, the top assembly 20 is hinged to the base assembly 10. The top assembly 20 includes an upper housing frame, which includes a second mounting plate 21. The top assembly 20 has mutually perpendicular length, width, and height directions. The width direction of the top assembly 20 is referenced to... Figure 4 The direction indicated by the middle D arrow, and the height direction of the top component 20 are referenced. Figure 4 The direction indicated by arrow C. The top plate module 22 can be snap-fitted or screwed onto the second mounting plate 21. The number of test plugs 23 corresponds to the number of test interfaces 14. For example, if there are two test interfaces 14, each test interface 14 can be equipped with two test plugs 23, and the two test plugs 23 can test different functions. In this embodiment of the invention, the top plate module 22 is detachably connected to the second mounting plate 21, that is, the top plate module 22 can be removed from the top assembly 20 to replace it with a new top plate module 22, thereby adapting to the newly replaced carrier board 13 for testing other circuit board pairs, with wide adaptability; in addition, through the above settings, the other structures of the top assembly 20 in the circuit board testing device provided in this embodiment of the invention, except for the top plate module 22, can be adapted to different top plate modules 22, that is, there is no need to improve the other structures of the top assembly 20 except for the top plate module 22, thereby reducing the research and development and production costs of the circuit board testing device.

[0045] The base assembly 10 has a length direction. Taking the length direction of the base assembly 10 as the first direction, multiple first placement positions 131 and second placement positions 132 are provided along the first direction. Multiple test interfaces 14 are provided along the first direction. The multiple test interfaces 14 correspond one-to-one with the multiple first placement positions 131. The top plate module 22 includes multiple test plug groups. The multiple test plug groups correspond one-to-one with the multiple test interfaces.

[0046] Specifically, referring to the above, the length direction of the base assembly 10, i.e., the first direction, can be referred to... Figure 3 The direction indicated by arrow A. The carrier plate 13 has multiple first placement positions 131, which are spaced apart along the first direction. The carrier plate 13 also has multiple second placement positions 132, which are spaced apart along the first direction. (See reference...) Figure 3 The carrier board 13 has two first placement positions 131 and two second placement positions 132. The first placement positions 131 match the first circuit board under test, and the first placement position 131 can be a slot structure. The second placement positions 132 match the second circuit board under test, and the second placement positions 132 can also be slot structures. The number of first placement positions 131 can be the same as the number of second placement positions 132.

[0047] The carrier board 13 is provided with multiple test interfaces 14, which are spaced apart along a first direction. Each test interface 14 corresponds one-to-one with a plurality of first placement positions 131. For example, if there are two first placement positions 131 and two second placement positions 132, then there are two test interfaces 14. The number of test plug groups is the same as the number of test interfaces 14. Each test plug group may include two test plugs 23, which correspond to one test interface 14 and can be sequentially plugged into that test interface 14. In this embodiment of the invention, by providing multiple first placement positions 131 and multiple second placement positions 132 along the first direction, multiple first test circuit boards or multiple second test circuit boards can be tested simultaneously, improving testing efficiency.

[0048] The top component 20 has a width direction and a height direction. The width direction of the top component 20 is the second direction, and the height direction of the top component 20 is the third direction. The top plate module 22 includes a pressure plate 28. The pressure plate 28 is provided with a moving component 25 for driving the test plug 23 group to move along the second direction and the third direction. The moving component 25 is used to drive the test plug 23 to be inserted into the test interface 14.

[0049] Specifically, referring to the above, the width direction of the top component 20, i.e., the second direction, is referenced. Figure 4 The direction indicated by the arrow D in the middle, the height direction of the top component 20, i.e., the third-party reference. Figure 4The direction indicated by arrow C. The pressure plate 28 can move along a third direction. When the test is not started, the test plug 23 is not inserted into the test interface 14; during the test, the top component 20 is as shown. Figure 1 As shown, when the test plug 23 is attached to the base assembly 10, it needs to be inserted into the test interface 14; after the test is completed, the test plug 23 needs to be removed from the test interface 14. The moving component 25 is used to move the test plug 23 into the test interface 14, and the moving component 25 is also used to move the test plug 23 out of the test interface 14. The moving component 25 corresponds one-to-one with the test plug group. The number of moving components 25 is equal to the number of test plug groups, as shown in the reference. Figure 6 When there are two test plug groups, there are also two moving components 25. Each moving component 25 is used to move the two test plugs included in its corresponding test plug group.

[0050] The moving component 25 is used to move the test plug 23 along a third direction so that the test plug 23 is at the same height as the test interface 14; the moving component 25 is also used to move the test plug 23 along a second direction so that the test plug 23 moves toward the test interface 14 until it is plugged into the test interface 14. In this embodiment of the invention, by setting the moving component 25, the test plug 23 can be automatically plugged into the test interface 14, or automatically unplugged from the test interface 14, thus improving testing efficiency. Of course, in other embodiments, the test plug 23 can also be manually plugged into the test interface 14.

[0051] Reference Figure 7 and Figure 8 The test plug assembly includes two test plugs 23, and the test machine includes a first test machine and a second test machine. The two test plugs 23 are used to electrically connect the first test machine and the second test machine, respectively. The top plate module 22 also includes a plug connection plate 26, which is connected to the moving component 25. Two mounting components 27, which are used to install the two test plugs 23, are fastened to the plug connection plate 26.

[0052] Specifically, the first tester and the second tester are different testers. The first tester can be a PC, used to perform testing of the first or second circuit board under test in Slave mode. The second tester can be a video capture card, used to perform testing of the first or second circuit board under test in Host mode. Two test plugs 23 are electrically connected to the first and second testers, respectively.

[0053] Reference Figure 7The moving component 25 includes a first cylinder 251 and a second cylinder 252. The first cylinder 251 includes a first housing and a first telescopic shaft, and the second cylinder 252 includes a second housing and a second telescopic shaft. The first housing of the first cylinder 251 is fastened to the pressure plate 28, and the first telescopic shaft of the first cylinder 251 is connected to the housing of the second cylinder 252. The first cylinder 251 is used to drive the second cylinder 252 to move in a second direction. The second telescopic shaft of the second cylinder 252 is fastened to the plug connecting plate 26, and the second cylinder 252 is used to drive the plug connecting plate 26 to move in a third direction. (Refer to...) Figure 8 Two mounting components 27 are fastened to the plug connection plate 26, and the two mounting components 27 are respectively used to install two test plugs 23. In this embodiment of the invention, by setting up a test plug group including two test plugs 23, which are respectively used to electrically connect the first test machine and the second test machine, it is possible to realize the testing of different functions of the first circuit board under test or the second circuit board under test.

[0054] The mounting component 27 includes a first plug mounting block 271 and a second plug mounting block 272. The first plug mounting block 271 is fastened to the plug connecting plate 26. The side of the first plug mounting block 271 facing away from the plug connecting plate 26 is connected to the second plug mounting block 272 by a spring. The test plug 23 is mounted on the second plug mounting block 272.

[0055] Specifically, the first plug mounting block 271 is fastened to the plug connecting plate 26, such as by screwing the first plug mounting block 271 to the bottom of the plug connecting plate 26. The stretching direction of the spring during tension or the compression direction during compression is consistent with the second direction. The mounting component may also include a guide rod with a circular cross-section. The axial direction of the guide rod is consistent with the second direction. The first end of the guide rod is fixed to the side of the first plug mounting block 271 away from the plug connecting plate 26. The spring is sleeved on the guide rod and is located between the first plug mounting block 271 and the second plug mounting block 272. The second end of the guide rod passes through the second plug mounting block 272 and is connected to a limit block, allowing the second plug mounting block 272 to move along the second direction under force.

[0056] Initially, there is a gap between the first plug mounting block 271 and the second plug mounting block 272. The spring is located between the first plug mounting block 271 and the second plug mounting block 272, and the spring is in its original length state. The side of the second plug mounting block 272 facing away from the first plug mounting block 271 contacts the limiting block. When the test plug 23 is inaccurately aligned and directly contacts the interface mounting block 134 instead of being plugged into the test interface 14, the second plug mounting block 272 moves towards the first plug mounting block 271, and the spring is compressed to prevent the test plug 23 from being damaged due to inaccurate alignment.

[0057] An interface fixing block 133 is provided on the carrier board 13. The interface fixing block 133 is provided with a plurality of interface mounting blocks 134 for mounting a plurality of test interfaces 14. The plurality of interface mounting blocks 134 are spaced apart along a first direction. The test interfaces 14 are mounted on the side of the interface mounting block 134 away from the first placement position 131.

[0058] Specifically, the interface fixing block 133 is fastened to the carrier plate 13, such as by snap-fitting or screwing it onto the carrier plate 13. Multiple interface mounting blocks 134 are fastened to the interface fixing block 133. The interface mounting blocks 134 are used to mount the test interface 14, and the number of interface mounting blocks 134 is the same as the number of test interfaces 14. Along the width direction of the base assembly 10, the interface mounting blocks 134, the first placement position 131, and the second placement position 132 are arranged sequentially. In this embodiment of the invention, the arrangement of the interface fixing block 133 and the interface mounting block 134 ensures the stable installation of the test interface 14, thereby ensuring that the test plug 23 can be smoothly inserted into the test interface 14 and smoothly removed from the test interface 14.

[0059] The base assembly 10 includes a locking mechanism 15, which includes a first drive member 151 and a locking member 152 connected to the first drive member 151. The locking member 152 has a locked state and an unlocked state. The top assembly 20 has an open state and a closed state. When the locking member 152 is in the locked state, the top assembly 20 remains in the closed state. When the locking member 152 is in the unlocked state, the top assembly 20 can be opened by the second drive member 17. A micro switch 16 is also provided on the first mounting plate 11. The micro switch 16 is electrically connected to the first drive member 151. When the top assembly 20 rotates from the open state to the closed state, the second mounting plate 21 triggers the micro switch 16. The micro switch 16 sends an electrical signal to the first drive member 151, so that the first drive member 151 drives the locking member 152 from the unlocked state to the locked state.

[0060] Specifically, the top component 20 has an open state and a closed state, as shown in the reference. Figure 1 , Figure 1 The top component 20 is in the closed state, and at this time, the length, width, and height directions of the top component 20 are aligned with the length, width, and height directions of the base component 10, respectively. (Refer to...) Figure 2 , Figure 2 The top component 20 is in the open state. The opening angle of the top component 20 can be set according to actual needs, such as setting it to greater than 50 degrees, so as to ensure that the first or second circuit board under test can be placed smoothly on the carrier board 13.

[0061] Reference Figure 3 and Figure 9The first driving member 151 may be located below the first mounting plate 11. The first driving member 151 may be a third cylinder, which includes a third telescopic shaft. The axis of the third telescopic shaft is aligned with the width direction of the base assembly 10. The third telescopic shaft is connected to a locking member 152, and the first driving member 151 drives the locking member 152 to move along the width direction of the base assembly 10. (Refer to...) Figure 4 The second mounting plate 21 is provided with a mating part 241 that cooperates with the locking member 152. The mating part 241 includes a first baffle and a second baffle spaced apart along the height direction of the top assembly 20. When the locking member 152 is in the locked state, it is located between the first baffle and the second baffle. When the top assembly 20 is opened, it is restricted by the locking member 152 and cannot be opened, that is, the top assembly 20 remains in the closed state. When the locking member 152 is in the unlocked state, it is located on one side of the mating part 241 along the width direction of the base assembly 10. At this time, the top assembly 20 can be opened normally.

[0062] Reference Figure 2 The top assembly 20 can be opened by a second drive member 17, which can be a fourth cylinder. One end of the fourth cylinder is hinged to the lower housing frame of the base assembly 10, and the other end is hinged to the second mounting plate 21. (Refer to...) Figure 3 A micro switch 16 is also securely connected to the first mounting plate 11. The micro switch 16 is electrically connected to the first driving member 151. When the top assembly 20 rotates from the open state to the closed state, the second mounting plate 21 triggers the micro switch 16. The micro switch 16 sends an electrical signal to the first driving member 151, causing the first driving member 151 to drive the locking member 152 to move along the width direction of the base assembly 10, so that the locking member 152 moves from the unlocked state to the locked state. In this embodiment of the invention, by setting the micro switch 16 and the locking mechanism 15, it is possible to ensure that when the top assembly 20 rotates from the open state to the closed state, the top assembly 20 can always remain in the closed state during testing, avoiding the impact of the test caused by opening the top assembly 20.

[0063] The circuit board testing device provided in this embodiment of the invention further includes a first connecting flexible board 18. The first end of the first connecting flexible board 18 is electrically connected to the test interface 14, and the second end of the first connecting flexible board 18 is used to electrically connect to the first circuit board under test. The second end of the first connecting flexible board 18 is also used to electrically connect to the second circuit board under test through the second connecting flexible board.

[0064] Specifically, refer to Figure 3The test interface 14 is electrically connected to a first connecting flexible circuit board 18. Both the first and second connecting flexible circuit boards can be flexible circuit boards. When testing the second circuit board under test, the first circuit board under test is placed in the first placement position 131. The second end of the first connecting flexible circuit board 18 can be located below the first circuit board under test. When the first placement position 131 is a slot structure, the second end of the first connecting flexible circuit board 18 can pass through the inside of the carrier board 13 and extend into the first placement position 131. The second end of the first connecting flexible circuit board 18 can be inserted into the first circuit board under test, or it can directly contact the contacts or pins on the first circuit board under test. When the second end of the first connecting flexible circuit board 18 directly contacts the contacts or pins on the first circuit board under test, the position of the second end of the first connecting flexible circuit board 18 can be fixed. This can be achieved by snapping or using adhesive tape to ensure that the position of the second end of the first connecting flexible circuit board 18 is fixed within the first placement position 131. The second end of the first connecting flexible circuit board 18 can also be located above the first circuit board under test.

[0065] When testing the second circuit board under test, the first circuit board under test is not placed. At this time, the second end of the first connecting flexible board 18 is used to electrically connect with the first end of the second connecting flexible board, and the second end of the second connecting flexible board is used to electrically connect with the second circuit board under test. When the second circuit board under test is placed in the second placement position 132, the second end of the second connecting flexible board can be located below the second circuit board under test. The second end of the first connecting flexible board 18 can be inserted into the second circuit board under test, clipped onto the second circuit board under test, or directly contacting the contacts or pins on the second circuit board under test. In this embodiment of the invention, the electrical connection between the first or second circuit board under test and the test interface 14 can be achieved through the arrangement of the first connecting flexible board 18 and the second connecting flexible board. Furthermore, when replacing the carrier board 13, i.e., replacing a different circuit board under test, only the first or second connecting flexible board needs to be replaced or adjusted, which is quick, convenient, and widely adaptable.

[0066] It should be noted that, in other embodiments, a second connecting flexible circuit board may be omitted, and instead a third connecting flexible circuit board may be provided. The first end of the third connecting flexible circuit board is electrically connected to the test interface 14, and the other end of the third connecting flexible circuit board is used for electrical connection to the second circuit board under test.

[0067] The second mounting plate 21 is provided with a third driving member 29 for driving the pressure plate 28 to move in a third direction. The pressure plate 28 is provided with a first pressing part for pressing the connection between the first connecting flexible plate 18 and the first circuit board under test and a second pressing part for pressing the connection between the second connecting flexible plate and the second circuit board under test.

[0068] Specifically, refer to Figure 6The top plate module 22 also includes a connecting plate 24, which is fastened to the top of the pressure plate 28. The third driving component 29 can be a fifth cylinder, which includes a fifth housing and a fifth telescopic shaft. The fifth housing is fastened to the pressure plate 28, and the fifth telescopic shaft is detachably connected to the connecting plate 24. The fifth cylinder can drive the connecting plate 24 and the pressure plate 28 to move together in a third direction. When testing the first circuit board under test, after the top component 20 is in the closed state, the third driving component 29 can drive the pressure plate 28 to move downward, so that the first pressing part presses the connection between the first connecting flexible plate 18 and the first circuit board under test. When testing the second circuit board under test, after the top component 20 is in the closed state, the third driving component 29 can drive the pressure plate 28 to move downward, so that the first pressing part presses the connection between the first connecting flexible plate 18 and the second connecting flexible plate, and the second pressing part presses the connection between the second connecting flexible plate and the second circuit board under test. In this embodiment of the invention, the stability of the electrical connection between the first or second circuit board under test and the test interface 14 can be ensured by setting the first clamping part and the second clamping part.

[0069] The circuit board testing device provided in this embodiment of the invention is also externally connected to a touch screen display, enabling human-machine interaction through the human-machine interface displayed on the touch screen, making operation convenient and quick. (See also...) Figure 1 The lower housing frame of the base assembly 10 also includes a first side plate 19, on which two start buttons 191 are provided. Only when both start buttons 191 are simultaneously touched will the second drive member 17 operate to open or close the top assembly 20. The circuit board testing device provided in this embodiment may also include a controller, which can be a microcontroller, etc., and can be electrically connected to the two start buttons 191, the first drive member 151, the second drive member 17, the third drive member 29, the first cylinder 251, and the second cylinder 252. Initially, the top assembly 20 is in a closed state. When both start buttons 191 are simultaneously touched, a first signal is sent to the controller. The controller controls the first drive member 151 to operate according to the first signal, causing the locking member 152 to move from a locked state to an unlocked state, and controls the second drive member 17 to operate according to the first signal, causing the top assembly 20 to open.

[0070] Taking the testing of the first circuit board under test, with the top component 20 initially in a closed state as an example, the testing procedure of the circuit board testing device provided in this embodiment of the invention is as follows:

[0071] The circuit board testing device is powered on;

[0072] Pressing both start buttons 191 simultaneously activates the first drive unit 151, causing the locking member 152 to move from the locked state to the unlocked state. The second drive unit 17 then activates, opening the top assembly 20.

[0073] Place the first circuit board under test in the first placement position 131;

[0074] Press both start buttons 191 simultaneously again, the second drive unit 17 works, the top component 20 covers the base component 10, and the top component 20 is in the closed state.

[0075] The second mounting plate 21 triggers the micro switch 16, and the micro switch 16 sends an electrical signal to the first drive member 151, so that the first drive member 151 drives the locking member 152 from the unlocked state to the locked state.

[0076] The third driving component 29 operates, driving the pressure plate 28 to move downward, so that the first pressing part presses the connection between the first circuit board under test and the first connecting flexible board 18.

[0077] The moving component 25 operates so that the two test plugs 23 included in the test plug group are sequentially plugged into the test interface 14 to perform the test on the first circuit board under test.

[0078] After the test is completed, the third drive component 29 operates, causing the pressure plate 28 to move upward;

[0079] Pressing both start buttons 191 simultaneously activates the first drive unit 151, causing the locking member 152 to move from the locked state to the unlocked state. The second drive unit 17 then activates, opening the top assembly 20.

[0080] Remove the first circuit board under test.

[0081] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0082] It should be noted that when a component is described as "fixed to" another component, it can be directly on the other component or may have a component in between. When a component is considered "connected to" another component, it can be directly connected to the other component or may have a component in between. When a component is considered "set on" another component, it can be directly set on the other component or may have a component in between. The terms "vertical," "horizontal," "left," "right," and similar expressions used in this document are for illustrative purposes only.

[0083] The various embodiments in this specification are described in a related manner. Similar or identical parts between embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, the system embodiments are basically similar to the method embodiments, so the description is relatively simple; relevant parts can be referred to the descriptions of the method embodiments.

[0084] The above description is merely a preferred embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention are included within the scope of protection of the present invention.

[0085] The circuit board testing device provided by the present invention has been described in detail above. Specific examples have been used to illustrate the principle and implementation of the present invention. The description of the above embodiments is only for the purpose of helping to understand the structure and core idea of ​​the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation and application scope based on the idea of ​​the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A circuit board testing device, characterized in that, include: The base assembly includes a first mounting plate and a pin plate detachably connected to the first mounting plate; A carrier board is disposed on the pin board, and the carrier board is provided with a first placement position for placing a first circuit board under test and a second placement position for placing a second circuit board under test; the first circuit board under test and the second circuit board under test are circuit boards of different sizes and / or different types. A test interface is disposed on the carrier board, and the test interface is used to electrically connect to the first circuit board under test or the second circuit board under test; the test interface, the first placement position, and the second placement position are arranged sequentially along the width direction of the base assembly; A test plug is used for electrical connection with the test machine, and the test plug is also used for plugging into the test interface; The circuit board testing device further includes a first connecting flexible board, the first end of which is electrically connected to the test interface. When testing the first circuit board under test, the second end of the first connecting flexible board is electrically connected to the first circuit board under test, and the second end of the first connecting flexible board is inserted into the first circuit board under test or contacts or pins on the first circuit board under test. When testing the second circuit board under test, the second end of the first connecting flexible board is electrically connected to the second circuit board under test through a second connecting flexible board, and the second end of the second connecting flexible board is inserted into the second circuit board under test or contacts or pins on the second circuit board under test. The circuit board testing device further includes a top assembly hinged to the base assembly. The top assembly includes a second mounting plate and a top plate module detachably connected to the second mounting plate. The top plate module includes the test plug. The top assembly has a width direction and a height direction, with the width direction of the top assembly as the second direction and the height direction of the top assembly as the third direction. The top plate module includes a pressure plate. The second mounting plate is provided with a third driving member for moving the pressure plate along the third direction. The pressure plate is provided with a first clamping part for clamping the connection between the first connecting flexible board and the first circuit board under test and a second clamping part for clamping the connection between the second connecting flexible board and the second circuit board under test. The test plug assembly includes two test plugs, and the test machine includes a first test machine and a second test machine. The two test plugs are used to electrically connect the first test machine and the second test machine, respectively. The pressure plate is provided with a moving component for driving the test plug assembly to move along a second direction and a third direction. The moving component is used to make the two test plugs included in the test plug assembly sequentially plug into the test interface.

2. The circuit board testing device according to claim 1, characterized in that, The base assembly has a length direction. Taking the length direction of the base assembly as the first direction, multiple first placement positions and multiple second placement positions are provided along the first direction. Multiple test interfaces are provided along the first direction. Each of the multiple test interfaces corresponds to one of the multiple first placement positions. The top plate module includes multiple test plug groups. Each of the multiple test plug groups corresponds to one of the multiple test interfaces.

3. The circuit board testing apparatus according to claim 1, characterized in that, The top panel module also includes a plug connection plate, which is connected to the movable component. Two mounting components for mounting the two test plugs are fastened to the plug connection plate.

4. The circuit board testing apparatus according to claim 3, characterized in that, The mounting components include a first plug mounting block and a second plug mounting block. The first plug mounting block is fastened to the plug connecting plate. The side of the first plug mounting block facing away from the plug connecting plate is connected to the second plug mounting block by a spring. The test plug is mounted on the second plug mounting block.

5. The circuit board testing apparatus according to claim 2, characterized in that, The carrier plate is provided with an interface fixing block, and the interface fixing block is provided with a plurality of interface mounting blocks for mounting a plurality of test interfaces respectively. The plurality of interface mounting blocks are spaced apart along the first direction, and the test interface is mounted on the side of the interface mounting block opposite to the first placement position.

6. The circuit board testing apparatus according to claim 1, characterized in that, The base assembly includes a locking mechanism, which includes a first driving member and a locking member connected to the first driving member. The locking member has a locked state and an unlocked state. The top assembly has an open state and a closed state. When the locking member is in the locked state, the top assembly remains in the closed state. When the locking member is in the unlocked state, the top assembly can be opened by a second driving member. The first mounting plate is also provided with a micro switch, which is electrically connected to the first driving component. When the top component rotates from the open state to the closed state, the second mounting plate triggers the micro switch, which sends an electrical signal to the first driving component, so that the first driving component drives the locking component to move from the unlocked state to the locked state.

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