Parameter configuration methods, equipment, and storage media for simulated load

Abstract

This application relates to the field of equipment testing, providing a method, device, and storage medium for configuring parameters of a simulated load. The method obtains the desired test parameters of the power supply device under test, performs a load test on the device based on these parameters, obtains measured data, and adjusts the resistance value of the simulated load device to determine the target setting parameters if the difference between the actual output power and the desired power value is greater than a preset threshold. Similarly, if the difference between the desired power value and the actual output power is greater than a preset threshold, the load power of the simulated load device is adjusted to determine the target setting parameters. This method, through code scripts, enables automated parameter setting of the simulated load device, avoiding human error and improving the efficiency of determining the target setting parameters.

Description

Technical Field

[0001] This application relates to the field of equipment testing technology, specifically to a parameter configuration method, equipment, and storage medium for simulating load. Background Technology

[0002] A residual current device (RCD) load is a non-linear simulated load used to test power supply equipment such as generator sets and uninterruptible power supplies (UPS) in data centers, understanding their ability to operate under non-linear loads. By accurately testing the output power and quality of the simulated load device, it is possible to avoid situations where it cannot drive the load or pollutes the power grid during actual use, thus ensuring power supply safety.

[0003] When testing energy storage devices using simulated load equipment, it is often necessary to try various combinations of resistors and capacitors to achieve the desired output power and meet specific conditions. However, manual experimentation is time-consuming. Therefore, how to automatically set the parameters of simulated load equipment has become an urgent technical problem to be solved. Summary of the Invention

[0004] This application provides a method, device, and storage medium for configuring parameters of a simulated load, in order to solve the technical problem of how to automatically set the parameters of a simulated load device.

[0005] A first aspect of this application provides a parameter configuration method for a simulated load, applied to a simulated load device connected to a power supply device under test. The method includes: acquiring desired test parameters of the power supply device under test; the desired test parameters include a desired power value; performing a load test on the power supply device under test based on the desired test parameters to obtain measured data; the measured data includes actual output power; if the difference between the actual output power and the desired power value is greater than a preset threshold, adjusting the resistance value of the simulated load device and determining a target setting parameter based on the adjusted resistance value; if the difference between the desired power value and the actual output power is greater than the preset threshold, adjusting the load power of the simulated load device and determining the target setting parameter based on the adjusted load power; wherein, the absolute value of the difference between the actual output power and the desired power value obtained by the simulated load device performing a load test on the power supply device under test according to the target setting parameter is less than or equal to the preset threshold.

[0006] In this application embodiment, when the actual output power does not meet the requirements, the target setting parameters can be adjusted to meet the requirements by adjusting the resistance value or load power of the simulated load device. This application enables automated setting of the parameters of the simulated load device through code scripts, replacing manual load debugging operations based on experience with automation. This avoids human error and improves the efficiency of determining the target setting parameters.

[0007] A second aspect of this application provides a parameter configuration device for a simulated load, operating on a simulated load device connected to a power supply device under test. The method includes: an acquisition unit for acquiring desired test parameters of the power supply device under test; the desired test parameters include a desired power value; a testing unit for performing a load test on the power supply device under test based on the desired test parameters to obtain measured data; the measured data includes actual output power; and an adjustment unit for adjusting the resistance value of the simulated load device if the difference between the actual output power and the desired power value is greater than a preset threshold, and determining a target setting parameter based on the adjusted resistance value; the adjustment unit is further configured to adjust the load power of the simulated load device if the difference between the desired power value and the actual output power is greater than the preset threshold, and determining the target setting parameter based on the adjusted load power; wherein the absolute value of the difference between the actual output power and the desired power value obtained by the simulated load device performing a load test on the power supply device under test according to the target setting parameter is less than or equal to the preset threshold.

[0008] A third aspect of this application provides a simulated load device, the simulated load device comprising: a memory for storing computer-readable instructions; and a processor for executing the computer-readable instructions stored in the memory to implement a parameter configuration method for the simulated load.

[0009] A fourth aspect of this application provides a computer-readable storage medium storing computer-readable instructions, which are executed by a processor in a simulated load device to implement a parameter configuration method for the simulated load. Attached Figure Description

[0010] Figure 1 This is an application scenario diagram of a parameter configuration method for simulating load provided in an embodiment of this application.

[0011] Figure 2 This is a flowchart of the parameter configuration method for simulated load provided in the embodiments of this application.

[0012] Figure 3 This is a detailed flowchart of adjusting the resistance value of a simulated load device provided in the embodiments of this application.

[0013] Figure 4 This is a flowchart of a parameter configuration method for simulated load provided in another embodiment of this application.

[0014] Figure 5 This is a flowchart of a parameter configuration method for simulated load provided in another embodiment of this application.

[0015] Figure 6 This is a functional block diagram of the parameter configuration device for simulated load provided in the embodiments of this application.

[0016] Figure 7 This is a schematic diagram of the structure of a simulated load device that implements the parameter configuration method for simulated load according to an embodiment of this application. Detailed Implementation

[0017] To make the objectives, technical solutions, and advantages of this application clearer, the application will be described in detail below with reference to the accompanying drawings and specific embodiments.

[0018] It should be noted that in this application, "at least one" means one or more, and "more than one" means two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone, where A and B can be singular or plural. The terms "first," "second," "third," "fourth," etc. (if present) in the specification, claims, and drawings of this application are used to distinguish similar objects, not to describe a specific order or sequence.

[0019] In the embodiments of this application, the terms "exemplary" or "for example" are used to indicate examples, illustrations, or descriptions. Any embodiment or design described as "exemplary" or "for example" in the embodiments of this application should not be construed as being more preferred or advantageous than other embodiments or design solutions. Specifically, the use of terms such as "exemplary" or "for example" is intended to present the relevant concepts in a specific manner. Unless otherwise specified, the following embodiments and features described herein can be combined with each other.

[0020] Combination Figure 1This application describes an application scenario for a simulated load parameter configuration method provided in this embodiment. The simulated load parameter configuration method is applied to a simulated load device 1, which is connected to a power supply device 2 under test. The simulated load device 1 can be used to test the working capacity of the power supply device 2 under load. The resistance value, load power value, and capacitance value of the simulated load device 1 can be set and adjusted on its load panel (e.g., a display screen). The resistance value can be set by adjusting the resistance value of the parallel circuit in the simulated load device 1; the load power value can be set by adjusting the resistance value of the carrying resistor in the simulated load device 1; and the capacitance value can be set by switching between parallel capacitors of different specifications in the simulated load device 1.

[0021] In this embodiment, the power supply device 2 under test can be a generator set or an uninterruptible power supply (UPS) for a data center. It can also be an energy storage device, such as a battery. The power supply device 2 can be used in various types of equipment. For example, it can be a battery pack, which can be used in self-moving devices such as automotive equipment, lawnmowers, sweeping equipment, mine clearance equipment, and cruise control equipment. It can also be used in energy storage devices such as mobile energy storage devices and home energy storage devices, or in other simulated load devices that require energy storage battery packs. No limitations are imposed here.

[0022] like Figure 2 The diagram shown is a flowchart of a method for configuring parameters of a simulated load according to an embodiment of this application. This method for configuring parameters of a simulated load is applied to a simulated load device (e.g., Figure 1 In the simulated load device 1), the order of steps in the flowchart can be changed according to different requirements, and some steps can be omitted.

[0023] 201. Obtain the expected test parameters of the power supply device under test; the expected test parameters include the expected power value.

[0024] In at least one embodiment of this application, the desired test parameters are the parameter values ​​that the user expects the power supply device under test to output. The desired test parameters include the power factor, output voltage, and frequency of the power supply device under test. The power factor represents the ratio of the active power to the apparent power of the power supply device under test; the higher the power factor, the more electrical energy provided by the power supply device under test can be utilized.

[0025] Here, the expected test parameters can be parameters input by the tester when operating the simulated load device, or parameters stored in the simulated load device and input by the tester. For example, when the simulated load device is connected to the power supply under test, the simulated load device obtains the identifier of the power supply under test by exchanging information with the power supply under test, and then reads historical expected test parameters from the database as the current expected test parameters for the power supply under test.

[0026] 202. Perform load testing on the power supply device under test based on the expected test parameters to obtain the measured data; the measured data includes the actual output power.

[0027] In this embodiment, the measured data refers to the data output by the power supply under test (DPDT) after testing based on the desired test parameters. Load testing of the DPDT refers to simulating the load of the DPDT using a simulated load device with the desired test parameters, and then having the DPDT discharge this simulated load. During this process, data from the discharge test, i.e., the measured data, can be collected using sensors or sampling circuits in the simulated load device.

[0028] It is easy to understand that the measured data can include current, voltage, actual output power, etc. during load testing, and can also include the actual power factor.

[0029] In at least one embodiment of this application, a simulated load device performs a load test on the power supply device under test based on desired test parameters to obtain measured data. This includes: the simulated load device using a preset calculation formula to determine initial configuration parameters based on the desired test parameters. These initial configuration parameters include the initial resistance value, initial load power value, and initial capacitance value of the simulated load device. The simulated load device then performs a load test on the power supply device under test according to the initial configuration parameters to obtain measured data.

[0030] It is easy to understand that since the expected test parameters are input by the tester, rather than the debugging parameters of the actual simulated load device, it is necessary to convert these expected test parameters to obtain the initial configuration parameters. In this embodiment, the expected test parameters are converted using a preset calculation formula, which can accurately determine the initial configuration parameters. Then, based on the initial configuration parameters, the power supply device under test is subjected to load testing, and the measured data can be directly obtained.

[0031] Specifically, the formula for calculating the initial resistance value is: Rs=pc1*U2 / P', pc1=k1 / k2*pf, P'=P / pf, where Rs represents the initial resistance value, U represents the output voltage of the power supply device under test, pf represents the expected power factor of the power supply device under test, P represents the expected power value, and k1 and k2 are preset constants. For example, k1 can be 0.04 and k2 can be 0.7.

[0032] The initial load power value is calculated using the following formula: P_R = (k3)2 / R1, R1 = U'2 / (pc2*P'), U' = U*k4, pc2 = k5 / k2*Pf, P' = P / pf, where P_R represents the initial load power value, U represents the output voltage of the power supply under test, pf represents the expected power factor of the power supply under test, P represents the expected power value, and k2, k3, k4 and k5 are preset constants. For example, k2 can be 0.7, k3 can be 220, k4 can be 1.22 and k5 can be 0.66.

[0033] The initial capacitance value is calculated using the following formula: C = k6 / (f*R1), R1 = U'2 / (pc2*P'), U' = U*k4, pc2 = k5 / k2*Pf, P' = P / pf, where C represents the initial capacitance value, f represents the frequency of the power supply under test, U represents the output voltage of the power supply under test, pf represents the desired power factor of the power supply under test, P represents the desired power value, and k2, k4, k5, and k6 are preset constants. For example, k2 can be 0.7, k4 can be 1.22, k5 can be 0.66, and k6 can be 7.5.

[0034] 203. Detect whether the difference between the actual output power and the expected power value is greater than the preset threshold.

[0035] In at least one embodiment of this application, the preset threshold can be set based on the maximum allowable power difference. For example, if the maximum allowable power difference between the actual output power and the desired power value is 1W, then the preset threshold can be set to 1. The simulated load device compares the difference between the actual output power and the desired power value with the preset threshold. If the difference between the actual output power and the desired power value is greater than the preset threshold, that is, even when the maximum allowable power difference exists, the actual output power is still greater than the desired power value.

[0036] 204. If the difference between the actual output power and the expected power value is less than or equal to the preset threshold, the initial configuration parameter is determined as the target setting parameter.

[0037] In this embodiment of the application, when the difference between the actual output power and the expected power value meets the maximum allowable power difference, the initial configuration parameters are directly determined as the target setting parameters. This can greatly shorten the test preparation time of the power supply under test while ensuring that the power supply under test reaches the expected power value.

[0038] 205. If the difference between the actual output power and the expected power value is greater than the preset threshold, the resistance value of the simulated load device is adjusted, and the target setting parameter is determined based on the adjusted resistance value. The simulated load device performs a load test on the power supply device under test according to the target setting parameter, and the absolute value of the difference between the actual output power and the expected power value is less than or equal to the preset threshold.

[0039] In at least one embodiment of this application, the specific process for adjusting the resistance value of the analog load device can be referred to below. Figure 3 Detailed explanation of the process shown. For example, the preset threshold is 20W, the expected power value is 400W, the output voltage of the power supply device under test is 120V, the expected power factor of the power supply device under test is 0.7, and the frequency of the power supply device under test is 60. Using the preset calculation formula, the initial resistance value is calculated to be 1.01Ω, the initial load power value is 852W, and the initial capacitance value is 2200F. Based on the calculated initial resistance value of 1.01Ω, the initial load power value of 852W, and the initial capacitance value of 2200F, the panel parameters of the load panel in the simulated load device are set (for example, the initial resistance value is set to 1Ω, the initial load power value is set to 500W+300W+50W, and the initial capacitance value is set to 1500F+600F+150F). Further load testing was conducted on the power supply device under test using the configured simulated load device. The actual output power was 430W, and the actual power factor was 0.68. Since the difference between the actual output power of 430W and the expected power value of 400W was greater than the preset threshold of 20W, the initial resistance value of the simulated load device was adjusted from 1Ω. After multiple adjustments, the resistance value was adjusted to 4Ω. The corresponding new actual output power was 384W, which meets the requirement that the absolute value of the difference between the new actual output power of 384W and the expected power value of 400W is less than the preset threshold of 20W. Therefore, the target setting parameters for the simulated load device are: resistance value set to 4Ω, initial load power value set to 500W+300W+50W, and initial capacitor value set to 1500F+600F+150F. In this embodiment, when the difference between the actual output power and the expected power value is greater than the maximum allowable power difference, adjusting the resistance value of the simulated load device can make the actual output power of the simulated load device meet the expected requirements, thereby realizing the parameter configuration of the simulated load device.

[0040] In at least one embodiment of this application, the simulated load device stores the target setting parameters as test cases for the power supply device under test in a preset database. Specifically, the simulated load device generates test cases based on the mapping relationship between the device type, expected power value, actual output power, actual power factor, and target setting parameters of the power supply device under test, and stores the test cases in the preset database. The device type may include information such as the specific model of the power supply device under test. The preset database can be an internal database of the simulated load device or an external database communicating with the simulated load device. This application does not limit the type of the preset database. By storing the target setting parameters in a preset database, the embodiments of this application allow the target setting parameters to be directly retrieved from the preset database in subsequent uses, thereby avoiding the time spent on parameter configuration.

[0041] In this application embodiment, when the actual output power does not meet the requirements, the target setting parameters can be adjusted to meet the requirements by adjusting the resistance value or load power of the simulated load device. This application enables automated setting of the parameters of the simulated load device through code scripts, replacing manual load debugging operations based on experience with automation. This avoids human error and improves the efficiency of determining the target setting parameters.

[0042] like Figure 3 The diagram shown is a detailed flowchart of adjusting the resistance value of a simulated load device according to an embodiment of this application. The method for adjusting the resistance value of a simulated load device is applied to a simulated load device (e.g., Figure 1 The simulated load device 1 in the middle. Figure 3 As shown, the specific steps include the following:

[0043] 2051, detect whether the initial resistance value is less than or equal to the preset resistance value.

[0044] In at least one embodiment of this application, the preset resistance value can be the maximum resistance value on the load panel of the simulated load device. Different models of simulated load devices have different preset resistance values. The simulated load device detects whether the initial resistance value is less than or equal to the preset resistance value. If the initial resistance value is equal to the preset resistance value, the simulated load device simultaneously reduces the initial load power value and the initial capacitance value to obtain the load power value and the target capacitance value; the ratio of the load power value to the target capacitance value satisfies a preset ratio. The specific process of the simulated load device simultaneously reducing the initial load power value and the initial capacitance value can be found in the detailed description of the process shown in step 2055 below.

[0045] 2052. If the initial resistance value is less than the preset resistance value, then increase the initial resistance value to obtain the resistance value.

[0046] In at least one embodiment of this application, a configuration resistance value can be set to filter the adjustment method of the initial resistance value. If the initial resistance value is less than the configuration resistance value, the initial resistance value is increased based on a preset value. If the initial resistance value is greater than or equal to the configuration resistance value and less than the preset resistance value, the initial resistance value is set to the preset resistance value to obtain the resistance value. The configuration resistance value is less than the preset resistance value. The configuration resistance value and the preset value can be set according to actual needs.

[0047] For example, if the preset resistance is 16Ω, the configured resistance is 8Ω, and the preset value is 0.2Ω, and the initial resistance is 6Ω, since the initial resistance of 6Ω is less than the configured resistance of 8Ω, the initial resistance is increased based on the preset value of 0.2Ω. If the initial resistance is 8Ω, then the initial resistance of 8Ω is set to the preset resistance of 16Ω, thus obtaining the resistance value. This embodiment compares the initial resistance value with the configured resistance value, and then, based on the comparison result, adopts different adjustment methods to increase the initial resistance value, thereby improving the rationality of the initial resistance value adjustment.

[0048] 2053, check whether the resistance value is equal to the preset resistance value, and whether the difference between the new actual output power and the expected power value is greater than the preset threshold; whereby the new actual output power is obtained by performing a load test on the power supply device under test using the resistance value.

[0049] In at least one embodiment of this application, after each adjustment of the resistance value, a simulated load device performs a load test on the power supply device under test based on the adjusted resistance value, the initial load power value, and the initial capacitance value to obtain a new actual output power.

[0050] 2054. If the resistance value is less than or equal to the preset resistance value, and the absolute value of the difference between the new actual output power and the expected power value is less than or equal to the preset threshold, the resistance value, the initial load power value, and the initial capacitance value will be used together as the target setting parameters.

[0051] 2055, if the resistance value is equal to the preset resistance value, and when the difference between the new actual output power and the expected power value is greater than the preset threshold, the initial load power value and the initial capacitance value are reduced simultaneously to obtain the load power value and the target capacitance value; the ratio of the load power value to the target capacitance value satisfies the preset ratio.

[0052] In at least one embodiment of this application, the ratio of the load power value to the target capacitance value is less than 1. By controlling the ratio of the load power value to the target capacitance value when reducing the initial load power value, embodiments of this application can protect the capacitor components of the analog load device.

[0053] In at least one embodiment of this application, the simulated load device calculates the change in load resistance based on the initial load power value and the load power value, and calculates the change in capacitance based on the change in load resistance, the initial capacitance value, and the initial load power value.

[0054] Furthermore, the simulated load device determines the target capacitance value based on the capacitance change and the initial capacitance value. Specifically, the formula for calculating the capacitance change is: Where ΔC represents the capacitance change, ΔR represents the load resistance change, C1 represents the initial capacitance value, and P R1 This represents the initial load power value. The initial load power value and its change are proportional to the change in load resistance. The target capacitance value is the difference between the initial capacitance value and the change in capacitance. Since the load power consumed by the simulated load device is achieved by adjusting the resistance value of the load-carrying resistor in the simulated load device, this embodiment of the application, by combining the initial load power value and the load power value, can determine the change in load resistance. Furthermore, by combining the change in load resistance value, the initial capacitance value, and the initial load power value, the target capacitance value can be determined, ensuring that the ratio of the load power value to the target capacitance value meets a preset ratio, thereby protecting the capacitor components of the simulated load device.

[0055] 2056 uses the resistance value, the load power value, and the target capacitance value together as the target setting parameters.

[0056] In this embodiment, when the actual output power does not meet the requirements, the initial resistance value is adjusted first. Then, when the difference between the new actual output power corresponding to the resistance value and the expected power value is greater than a preset threshold, the initial load power value and the initial capacitance value are further adjusted. This ensures that the adjusted target setting parameters meet the requirements. When adjusting the initial load power value and the initial capacitance value, the capacitor components of the analog load device are protected by ensuring that the preset ratio meets the preset requirements.

[0057] like Figure 4 The diagram shown is a flowchart of a parameter configuration method for a simulated load provided in another embodiment of this application. This parameter configuration method for a simulated load is applied to a simulated load device (e.g., Figure 1 The simulated load device 1 in the middle. Figure 4 As shown, the parameter configuration method for simulated load may include the following steps 401-405. Depending on different requirements, the order of the steps in this flowchart may be changed, and some may be omitted.

[0058] 401. Obtain the expected test parameters of the power supply device under test; the expected test parameters include the expected power value.

[0059] 402. Perform load testing on the power supply device under test based on the expected test parameters to obtain the measured data; the measured data includes the actual output power.

[0060] 403, Detect whether the difference between the expected power value and the actual output power is greater than a preset threshold.

[0061] Since the preset threshold can be set based on the maximum allowable power difference, the preset threshold in this embodiment can be related to... Figure 2 The preset thresholds shown are the same.

[0062] 404. If the difference between the expected power value and the actual output power is less than or equal to the preset threshold, the initial configuration parameter will be set as the target setting parameter.

[0063] For details on steps 401 to 404, please refer to the above text. Figure 2 The detailed descriptions of steps 201 to 204 in the previous section will not be repeated here.

[0064] 405. If the difference between the expected power value and the actual output power is greater than the preset threshold, the load power of the simulated load device is adjusted, and the target setting parameters are determined based on the adjusted load power. The simulated load device performs a load test on the power supply device under test according to the target setting parameters, and the absolute value of the difference between the actual output power and the expected power value is less than or equal to the preset threshold.

[0065] In at least one embodiment of this application, the simulated load device adjusts its load power and determines a target setting parameter based on the adjusted load power. This includes: increasing the initial load power value to obtain a load power, and increasing the initial capacitance value based on the load power to obtain a target capacitance value. The ratio of the load power value to the target capacitance value satisfies a preset ratio. Further, the simulated load device uses the initial resistance value, the load power value, and the target capacitance value together as the target setting parameter. The ratio of the load power value to the target capacitance value is less than 1. In this embodiment, by controlling the ratio of the load power value to the target capacitance value when increasing the initial load power value, the capacitor components of the simulated load device can be protected.

[0066] Specifically, the process of simulating the load device to increase the initial capacitance value based on the load power and obtain the target capacitance value includes: calculating the change in load resistance based on the initial load power value and the load power value, and calculating the change in capacitance based on the change in load resistance, the initial capacitance value, and the initial load power value. Further, the simulated load device determines the target capacitance value based on the change in capacitance and the initial capacitance value. Specifically, the formula for calculating the change in capacitance is: Where ΔC represents the capacitance change, ΔR represents the load resistance change, C1 represents the initial capacitance value, and P R1This represents the initial load power value. The initial load power value and its change are proportional to the change in load resistance. The target capacitance value is the sum of the initial capacitance value and its change.

[0067] Since the power consumed by the simulated load device is achieved by adjusting the resistance value of the load-carrying resistor in the simulated load device, the embodiments of this application can determine the change value of the load resistance by combining the initial load power value and the load power value. Furthermore, by combining the change value of the load resistance, the initial capacitance value, and the initial load power value, the target capacitance value can be determined, which can ensure that the ratio of the load power value to the target capacitance value meets the preset ratio, thereby protecting the capacitor components of the simulated load device.

[0068] In at least one embodiment of this application, the simulated load device stores the target setting parameters as test cases for the power supply device under test in a preset database. Specifically, the simulated load device generates test cases based on the mapping relationship between the device type, expected power value, actual output power, actual power factor, and target setting parameters of the power supply device under test, and stores the test cases in the preset database. The device type may include information such as the specific model of the power supply device under test. The preset database can be an internal database of the simulated load device or an external database communicating with the simulated load device. This application does not limit the type of the preset database. By storing the target setting parameters in a preset database, the embodiments of this application allow the target setting parameters to be directly retrieved from the preset database in subsequent uses, thereby avoiding the time spent on parameter configuration.

[0069] like Figure 5 The diagram shown is a flowchart of a parameter configuration method for a simulated load provided in another embodiment of this application. This parameter configuration method for a simulated load is applied to a simulated load device (e.g., Figure 1 The simulated load device 1 in the middle. Figure 5 As shown, the parameter configuration method for simulated load may include the following steps 501-509. Depending on different requirements, the order of the steps in this flowchart may be changed, and some may be omitted.

[0070] 501, Obtain the expected test parameters of the power supply device under test.

[0071] 502. Based on the expected test parameters, the power supply device under test is subjected to load testing to obtain the measured data; the measured data also includes the actual power factor.

[0072] For details on steps 501 to 502, please refer to the above text. Figure 2 The detailed descriptions of steps 201 to 202 in the previous section will not be repeated here.

[0073] 503, Detect whether the actual power factor is less than the preset power factor threshold.

[0074] In at least one embodiment of this application, the preset power factor threshold can be set according to actual needs. The larger the actual power factor, the higher the utilization rate of electrical energy by the simulated load device.

[0075] 504. If the actual power factor is greater than or equal to the preset power factor threshold, the initial configuration parameters will be set as the target settings parameters.

[0076] In this embodiment of the application, if the actual power factor is greater than or equal to the preset power factor threshold, it means that the utilization rate of electrical energy by the simulated load device meets the requirements. Therefore, by directly determining the initial configuration parameters as the target setting parameters, the testing time of the simulated load device can be shortened.

[0077] 505. If the actual power factor is less than the preset power factor threshold, the resistance value of the simulated load device is adjusted to obtain the resistance value.

[0078] In at least one embodiment of this application, if the initial resistance value of the simulated load device is less than the configured resistance value, the initial resistance value is increased based on the configured value. If the initial resistance value is greater than or equal to the configured resistance value and less than a preset resistance value, the initial resistance value is set to the preset resistance value to obtain the resistance value. The configured resistance value is less than the preset resistance value, and the configured resistance value and configured value can be set according to actual needs. For example, if the preset resistance value is 16Ω, the configured resistance value is 8Ω, and the configured value is 0.5Ω, and the initial resistance value is 6Ω, since the initial resistance value of 6Ω is less than the configured resistance value of 8Ω, the initial resistance value is increased based on the configured value of 0.5Ω. If the initial resistance value is 8Ω, the initial resistance value of 8Ω is set to the preset resistance value of 16Ω to obtain the resistance value. This embodiment of the application improves the rationality of the initial resistance value adjustment by comparing the initial resistance value with the configured resistance value and then increasing the initial resistance value using different adjustment methods based on the comparison result.

[0079] 506, Check whether the resistance value is equal to the preset resistance value and whether the new actual power factor is less than the preset power factor threshold; whereby the new actual power factor is obtained by performing a load test on the power supply device under test using the resistance value.

[0080] In at least one embodiment of this application, after each adjustment of the resistance value, a simulated load device performs a load test on the power supply device under test based on the adjusted resistance value, the initial load power value, and the initial capacitance value to obtain a new actual power factor.

[0081] 507. If the resistance value is less than or equal to the preset resistance value, and the new actual power factor is greater than or equal to the preset power factor threshold, then the resistance value, the initial load power value, and the initial capacitance value will be used together as the target setting parameters.

[0082] 508. If the resistance value is equal to the preset resistance value, and when the new actual power factor is less than the preset power factor threshold, the load power value and capacitance value of the simulated load device are increased simultaneously to obtain the load power value and the target capacitance value; the ratio of the load power value to the target capacitance value satisfies the preset ratio.

[0083] In at least one embodiment of this application, if the resistance value is equal to a preset resistance value, and when the new actual power factor is less than a preset power factor threshold, the simulated load device synchronously increases the initial load power value and the initial capacitance value to obtain the load power value and the target capacitance value. The ratio of the load power value to the target capacitance value is less than 1. In this embodiment, by simultaneously increasing the initial capacitance value when increasing the initial load power value, the ratio of the load power value to the target capacitance value can be controlled, thereby protecting the capacitor components of the simulated load device.

[0084] Specifically, the process of simulating the load device by synchronously increasing its initial load power and initial capacitance to obtain the target load power and target capacitance includes: increasing the initial load power of the simulated load device to obtain the load power; calculating the change in load resistance based on the initial load power and the load power value; and calculating the change in capacitance based on the change in load resistance, the initial capacitance value, and the initial load power value. Further, the simulated load device determines the target capacitance value based on the change in capacitance and the initial capacitance value. Specifically, the formula for calculating the change in capacitance is: Where ΔC represents the capacitance change, ΔR represents the load resistance change, C1 represents the initial capacitance value, and P R1 This represents the initial load power value. The initial load power value and its change are proportional to the change in load resistance. The target capacitance value is the sum of the initial capacitance value and the change in capacitance. The power increment of the simulated load device's initial load power value can be randomly set; for example, the increment can be 50 watts. Since the load power consumed by the simulated load device is achieved by adjusting the resistance value of the load resistor, this embodiment, by combining the initial load power value and the load power value, can determine the change in load resistance. Further combining the change in load resistance value, the initial capacitance value, and the initial load power value, the target capacitance value can be determined, ensuring that the ratio of the load power value to the target capacitance value meets a preset ratio, thereby protecting the capacitor components of the simulated load device.

[0085] 509, the resistance value, the load power value, and the target capacitance value are used together as the target setting parameters.

[0086] In at least one embodiment of this application, the simulated load device stores the target setting parameters as test cases for the power supply device under test in a preset database. Specifically, the simulated load device generates test cases based on the mapping relationship between the device type, expected power value, actual output power, actual power factor, and target setting parameters of the power supply device under test, and stores the test cases in the preset database. The device type may include information such as the specific model of the power supply device under test. The preset database can be an internal database of the simulated load device or an external database communicating with the simulated load device. This application does not limit the type of the preset database. By storing the target setting parameters in a preset database, the embodiments of this application allow the target setting parameters to be directly retrieved from the preset database in subsequent uses, thereby avoiding the time spent on parameter configuration.

[0087] In this embodiment, when the actual power factor is less than a preset power factor threshold, the initial resistance value is adjusted first. Then, when the new actual power factor is still less than the preset power factor threshold, the initial load power value is increased to ensure that the actual power factor is greater than or equal to the preset power factor threshold, thereby ensuring the energy utilization rate of the simulated load device. At the same time, when the initial load power value is increased, the initial capacitance value is increased simultaneously to ensure that the ratio of the load power value to the target capacitance value meets the preset ratio, thereby protecting the capacitor components of the simulated load device.

[0088] like Figure 6 The diagram shown is a functional block diagram of a parameter configuration device for a simulated load provided in an embodiment of this application. The parameter configuration device 11 for a simulated load operates on a simulated load device 1 connected to a power supply device 2 under test. The parameter configuration device 11 for a simulated load includes an acquisition unit 110, a testing unit 111, an adjustment unit 112, a determination unit 113, and a storage unit 114. The module / unit referred to in this application refers to a series of computer-readable instruction segments that can be acquired by the processor 13 and perform a fixed function, and which are stored in the memory 12.

[0089] Acquisition unit 110 is used to acquire the expected test parameters of the power supply device under test; the expected test parameters include the expected power value; test unit 111 is used to perform load testing on the power supply device under test based on the expected test parameters to obtain measured data; the measured data includes the actual output power; adjustment unit 112 is used to adjust the resistance value of the simulated load device if the difference between the actual output power and the expected power value is greater than a preset threshold, and determine the target setting parameters based on the adjusted resistance value; adjustment unit 112 is also used to adjust the load power of the simulated load device if the difference between the expected power value and the actual output power is greater than a preset threshold, and determine the target setting parameters based on the adjusted load power; wherein, the absolute value of the difference between the actual output power and the expected power value obtained by the simulated load device performing load testing on the power supply device under test according to the target setting parameters is less than or equal to the preset threshold.

[0090] Furthermore, the measured data also includes the actual power factor; the adjustment unit 112 is also used to adjust the resistance value of the simulated load device if the actual power factor is less than the preset power factor threshold, to obtain the resistance value; the adjustment unit 112 is also used to simultaneously increase the load power value and capacitance value of the simulated load device if the resistance value is equal to the preset resistance value, and when the new actual power factor is less than the preset power factor threshold, to obtain the load power value and the target capacitance value; wherein, the new actual power factor is obtained by performing a load test on the power supply device under test using the resistance value; the ratio of the load power value to the target capacitance value satisfies the preset ratio; the determination unit 113 is used to take the resistance value, the load power value, and the target capacitance value as the target setting parameters.

[0091] Furthermore, the storage unit 114 is used to store the target setting parameters as test cases of the power supply device under test into a preset database.

[0092] In this application embodiment, when the actual output power does not meet the requirements, the target setting parameters can be adjusted to meet the requirements by adjusting the resistance value or load power of the simulated load device. This application enables automated setting of the parameters of the simulated load device through code scripts, replacing manual load debugging operations based on experience with automation. This avoids human error and improves the efficiency of determining the target setting parameters.

[0093] like Figure 7 The diagram shown is a structural schematic of a simulated load device that implements a parameter configuration method for simulated load according to an embodiment of this application.

[0094] In one embodiment of this application, the simulated load device 1 includes, but is not limited to, a memory 12, a processor 13, and computer-readable instructions stored in the memory 12 and executable on the processor 13, such as a parameter configuration program for the simulated load.

[0095] Those skilled in the art will understand that the schematic diagram is merely an example of the analog load device 1 and does not constitute a limitation on the analog load device 1. It may include more or fewer components than shown, or combine certain components, or different components. For example, the analog load device 1 may also include input / output devices, network access devices, buses, etc.

[0096] Processor 13 can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor can be a microprocessor or any conventional processor. Processor 13 is the computational core and control center of the analog load device 1, connecting various parts of the entire analog load device 1 through various interfaces and lines, and executing the operating system of the analog load device 1, as well as various installed application programs and program code.

[0097] For example, computer-readable instructions can be divided into one or more modules / units, one or more of which are stored in memory 12 and executed by processor 13 to complete this application. One or more modules / units can be a series of computer-readable instruction segments capable of performing a specific function, which describe the execution process of the computer-readable instructions in the simulated load device 1. For example, the computer-readable instructions can be divided into an acquisition unit 110, a testing unit 111, an adjustment unit 112, a determination unit 113, and a storage unit 114.

[0098] The memory 12 can be used to store computer-readable instructions and / or modules. The processor 13 implements various functions of the analog load device 1 by running or executing the computer-readable instructions and / or modules stored in the memory 12 and by calling the data stored in the memory 12. The memory 12 may mainly include a program storage area and a data storage area. The program storage area may store the operating system, application programs required for at least one function (such as sound playback function, image playback function, etc.), etc.; the data storage area may store data created according to the use of the analog load device, etc. The memory 12 may include non-volatile and volatile memory, such as: hard disk, memory, plug-in hard disk, smart media card (SMC), secure digital (SD) card, flash card, at least one disk storage device, flash memory device, or other storage devices.

[0099] The memory 12 can be the external memory and / or internal memory of the analog load device 1. Furthermore, the memory 12 can be a physical memory, such as a memory stick, a TF card (Trans-flash Card), etc.

[0100] If the modules / units integrated into the simulated load device 1 are implemented as software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, all or part of the processes in the methods of the above embodiments can also be implemented by instructing related hardware through computer-readable instructions. The computer-readable instructions can be stored in a computer-readable storage medium, and when executed by a processor, they can implement the steps of the various method embodiments described above.

[0101] Computer-readable instructions include computer-readable instruction code, which can be in the form of source code, object code, executable files, or certain intermediate forms. Computer-readable media can include: any entity or device capable of carrying computer-readable instruction code, recording media, USB flash drives, portable hard drives, magnetic disks, optical disks, computer memory, read-only memory (ROM), and random access memory (RAM).

[0102] Combination Figure 2-5 The memory 12 in the simulated load device 1 stores computer-readable instructions, and the processor 13 can execute the computer-readable instructions stored in the memory 12 to achieve, for example, Figure 2 The parameter configuration method for the simulated load is shown.

[0103] Specifically, the specific implementation method of the processor 13 for the above-mentioned computer-readable instructions can be found in [reference]. Figure 2-5 The descriptions of the relevant steps in the corresponding embodiments are not repeated here.

[0104] In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative; for instance, the division of modules is only a logical functional division, and other division methods may be used in actual implementation.

[0105] The modules described as separate components may or may not be physically separate. The components shown as modules may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the modules can be selected to achieve the purpose of this embodiment according to actual needs.

[0106] Furthermore, the functional modules in the various embodiments of this application can be integrated into one processing unit, or each unit can exist physically separately, or two or more units can be integrated into one unit. The integrated unit can be implemented in hardware or in the form of hardware plus software functional modules.

[0107] Therefore, the embodiments should be considered exemplary and non-limiting in all respects, and the scope of this application is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be embraced within this application. No appended diagram markings in the claims should be construed as limiting the scope of the claims.

[0108] Furthermore, it is clear that the word "including" does not exclude other units or steps, and the singular does not exclude the plural. Multiple units or devices can also be implemented by a single unit or device through software or hardware. Terms such as "first," "second," etc., are used to indicate names and do not indicate any specific order.

[0109] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of this application and are not intended to limit it. Although this application has been described in detail with reference to preferred embodiments, those skilled in the art should understand that modifications or equivalent substitutions can be made to the technical solutions of this application without departing from the spirit and scope of the technical solutions of this application.

Claims

1. A method for configuring parameters to simulate a load, characterized in that, The method, applied to a simulated load device connected to a power supply device under test, includes: Obtain the expected test parameters of the power supply device under test; the expected test parameters include the expected power value; The test involves performing a load test on the power supply device under test based on the desired test parameters to obtain measured data. This includes: determining initial configuration parameters according to the desired test parameters using a preset calculation formula; the initial configuration parameters include the initial resistance value, initial load power value, and initial capacitance value of the simulated load device; performing a load test on the power supply device under test according to the initial configuration parameters to obtain the measured data; the measured data includes the actual output power. If the difference between the actual output power and the expected power value is greater than a preset threshold, the resistance value of the simulated load device is adjusted, and the target setting parameters are determined based on the adjusted resistance value. This includes: if the resistance value is equal to a preset resistance value, and when the difference between the new actual output power and the expected power value is greater than the preset threshold, the initial load power value and the initial capacitance value are simultaneously reduced to obtain the load power value and the target capacitance value; wherein, the new actual output power is obtained by performing a load test on the power supply device under test using the resistance value; the ratio of the load power value to the target capacitance value satisfies a preset ratio; and the resistance value, the load power value, and the target capacitance value are collectively used as the target setting parameters. If the difference between the expected power value and the actual output power is greater than the preset threshold, the load power of the simulated load device is adjusted, and the target setting parameters are determined based on the adjusted load power. The simulated load device performs a load test on the power supply device under test according to the target setting parameters, and the absolute value of the difference between the actual output power and the expected power value is less than or equal to the preset threshold.

2. The parameter configuration method for simulated load as described in claim 1, characterized in that, The step of adjusting the resistance value of the simulated load device and determining the target setting parameters based on the adjusted resistance value also includes: If the initial resistance value is less than the preset resistance value, then the initial resistance value is increased to obtain the desired resistance value.

3. The parameter configuration method for simulated load as described in claim 1, characterized in that, The step of adjusting the load power of the simulated load device and determining the target setting parameters based on the adjusted load power includes: Increase the initial load power value to obtain the load power; The target capacitance value is obtained by increasing the initial capacitance value based on the load power; wherein the ratio of the load power value to the target capacitance value satisfies a preset ratio. The initial resistance value, the load power value, and the target capacitance value are used together as the target setting parameters.

4. The parameter configuration method for simulated load as described in claim 1, characterized in that, The measured data also includes the actual power factor; the method further includes: If the actual power factor is less than the preset power factor threshold, the resistance value of the simulated load device is adjusted to obtain the resistance value. If the resistance value is equal to the preset resistance value, and when the new actual power factor is less than the preset power factor threshold, the load power value and capacitance value of the simulated load device are increased simultaneously to obtain the load power value and the target capacitance value; wherein, the new actual power factor is obtained by performing a load test on the power supply device under test using the resistance value; the ratio of the load power value to the target capacitance value satisfies a preset ratio. The resistance value, the load power value, and the target capacitance value are used together as the target setting parameters.

5. The parameter configuration method for simulated load as described in claim 4, characterized in that, If the resistance value is equal to a preset resistance value, and when the new actual power factor is less than the preset power factor threshold, the load power value and capacitance value of the simulated load device are increased simultaneously to obtain the load power value and target capacitance value, including: If the resistance value is equal to the preset resistance value, and when the new actual power factor is less than the preset power factor threshold, the initial load power value and the initial capacitance value are increased simultaneously to obtain the load power value and the target capacitance value.

6. The parameter configuration method for simulated load as described in any one of claims 1 to 5, characterized in that, The method further includes: The target setting parameters are used as test cases for the power supply device under test and stored in a preset database.

7. The parameter configuration method for simulated load as described in claim 6, characterized in that, The ratio of the load power value to the target capacitance value satisfies a preset ratio, including: The ratio of the load power value to the target capacitance value is less than 1.

8. A simulated load device, characterized in that, include: Memory, used to store program instructions; and A processor is configured to read and execute the program instructions stored in the memory, wherein when the program instructions are executed by the processor, the simulated load device performs the parameter configuration method for the simulated load as described in any one of claims 1 to 7.

9. A computer storage medium, characterized in that, The computer storage medium stores program instructions that, when executed on the simulated load device, cause the simulated load device to perform the parameter configuration method for the simulated load as described in any one of claims 1 to 7.

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