Pole piece defect detection system calibration method and pole piece defect detection system

Abstract

The application discloses a kind of polar piece defect detection system's calibration method and polar piece defect detection system, belong to visual inspection technical field.The system includes light source, image acquisition device and polar piece conveying mechanism, the method includes: obtaining the polar piece of the polar piece conveying mechanism transmission The angle of material walking;Based on the angle of material walking, the installation pose of the light source is adjusted, to make the light emitting surface of the light source perpendicular to the plane where the polar piece is located;The first target image of the light source is obtained by the image acquisition device;Based on the pixel information of the first target point in the first target image, the installation pose of the image acquisition device is adjusted;The second target image of the polar piece of the polar piece conveying mechanism transmission is obtained by the image acquisition device;Based on the second target image, the imaging parameter of the image acquisition device is adjusted.The method can effectively prevent calibration failure, improve detection precision.

Description

Technical Field

[0001] This application belongs to the field of visual inspection technology, and in particular relates to a calibration method and a electrode defect detection system. Background Technology

[0002] After coating and rolling, lithium battery electrode sheets need to be cut into tab shapes by a die-cutting machine before proceeding to the next process. When cutting lithium battery electrode sheets by the die-cutting machine, pinhole detection and dimensional accuracy detection are required.

[0003] In related technologies, the electrode material is directly calibrated at the backlight station. The calibration fails after changing to other types of materials. Furthermore, if the electrode of the same type shifts left or right during loading after the calibration is completed, the calibration also fails. This results in inaccurate measurement data of the electrode size. In addition, errors are prone to occur during the manual adjustment process, leading to a large range of measurement accuracy deviations in subsequent testing. Summary of the Invention

[0004] This application aims to address at least one of the technical problems existing in the prior art. To this end, this application proposes a calibration method and a electrode defect detection system, which can effectively prevent calibration failure and improve detection accuracy.

[0005] In a first aspect, this application provides a calibration method for an electrode defect detection system. The electrode defect detection system includes a light source, an image acquisition device, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey electrodes. The light source is located on a first surface of the electrode, and the image acquisition device is located on a second surface of the electrode. The calibration method for the electrode defect detection system includes:

[0006] Obtain the feed angle of the electrode sheet conveyed by the electrode sheet conveying mechanism;

[0007] Based on the feeding angle, adjust the mounting position of the light source so that the light emitting surface of the light source is perpendicular to the plane where the electrode is located;

[0008] The image acquisition device acquires a first target image of the light source, wherein the light source is provided with a first target point;

[0009] Based on the pixel information of the first target point in the first target image, adjust the installation posture of the image acquisition device;

[0010] The image acquisition device acquires a second target image of the electrode sheet transmitted by the electrode sheet transmission mechanism;

[0011] Based on the second target image, the imaging parameters of the image acquisition device are adjusted.

[0012] According to the calibration method of the electrode defect detection system of this application, by adjusting the relative pose between the light source and the image acquisition device, the imaging parameters of the image acquisition device are adjusted, and the calibration process of the electrode defect detection system is standardized. The calibration will not fail when the electrode material is changed, and the detection accuracy of the electrode defect detection system is high.

[0013] According to one embodiment of this application, the electrode transfer mechanism further includes a smoothing component, the smoothing component including two clamping arms, the inner surface of the electrode and one of the two clamping arms being on the same plane, a transparent substrate being clamped between the two clamping arms, the transparent substrate being located on the second side of the electrode, the transparent substrate being provided with a second target point, and the second target image including pixel information of the second target point.

[0014] According to one embodiment of this application, the pixel information of the second target point includes transition pixel information, and adjusting the imaging parameters of the image acquisition device based on the second target image includes:

[0015] If the transition pixel information in the second target image is determined to be greater than a pixel threshold, the imaging parameters of the image acquisition device are adjusted.

[0016] According to one embodiment of this application, the pixel information of the second target point includes pole size accuracy information, and adjusting the imaging parameters of the image acquisition device based on the second target image includes:

[0017] If the electrode size accuracy information in the second target image is determined to be greater than the size accuracy threshold, the imaging parameters of the image acquisition device are adjusted.

[0018] According to one embodiment of this application, the first target point includes a first target point and two second target points. The first target point is located at the center of the light source, and the two second target points are located on opposite sides of the light source. Adjusting the mounting pose of the image acquisition device based on the pixel information of the first target point in the first target image includes:

[0019] Based on the pixel information of the first target point and the two second target points in the first target image, the installation posture of the image acquisition device is adjusted so that the pixel information of the first target point is located at the center of the first target image, and the pixel information of the two second target points is located at the opposite edge of the first target image.

[0020] Secondly, this application provides an electrode defect detection system, which includes: a light source, an image acquisition device, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey the electrode. The light source is located on the first side of the electrode, and the image acquisition device is located on the second side of the electrode.

[0021] The controller is electrically connected to the light source, the image acquisition device, and the electrode conveying mechanism. The controller calibrates the electrode defect detection system based on the calibration method described above.

[0022] According to the electrode defect detection system of this application, by adjusting the relative pose between the light source and the image acquisition device, the imaging parameters of the image acquisition device are adjusted, and the calibration process of the electrode defect detection system is standardized. The calibration will not fail when the electrode material is changed, and the detection accuracy of the electrode defect detection system is high.

[0023] Thirdly, this application provides a calibration device for an electrode defect detection system. The electrode defect detection system includes a light source, an image acquisition device, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey electrodes. The light source is located on a first surface of the electrode, and the image acquisition device is located on a second surface of the electrode. The calibration device for the electrode defect detection system includes:

[0024] The first acquisition module is used to acquire the feed angle of the electrode sheet conveyed by the electrode sheet conveying mechanism;

[0025] The first processing module is used to adjust the mounting position of the light source based on the feeding angle, so that the light emitting surface of the light source is perpendicular to the plane where the electrode is located;

[0026] The second acquisition module is used to acquire a first target image of the light source through the image acquisition device, wherein the light source is provided with a first target point;

[0027] The second processing module is used to adjust the installation posture of the image acquisition device based on the pixel information of the first target point in the first target image;

[0028] The third acquisition module is used to acquire the second target image of the electrode transmitted by the electrode conveying mechanism through the image acquisition device;

[0029] The third processing module is used to adjust the imaging parameters of the image acquisition device based on the second target image.

[0030] According to the calibration device of the electrode defect detection system of this application, by adjusting the relative pose between the light source and the image acquisition device, the imaging parameters of the image acquisition device are adjusted, and the calibration process of the electrode defect detection system is standardized. The calibration will not fail when the electrode material is changed, and the detection accuracy of the electrode defect detection system is high.

[0031] Fourthly, this application provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the calibration method of the electrode defect detection system as described in the first aspect above.

[0032] Fifthly, this application provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the calibration method of the electrode defect detection system as described in the first aspect above.

[0033] In a sixth aspect, this application provides a computer program product, including a computer program that, when executed by a processor, implements the calibration method for the electrode defect detection system as described in the first aspect above.

[0034] Additional aspects and advantages of this application will be set forth in part in the description which follows, and in part will be obvious from the description, or may be learned by practice of this application. Attached Figure Description

[0035] The above and / or additional aspects and advantages of this application will become apparent and readily understood from the description of the embodiments taken in conjunction with the following drawings, in which:

[0036] Figure 1 This is one of the flowcharts illustrating the calibration method of the electrode defect detection system provided in the embodiments of this application;

[0037] Figure 2 This is a schematic diagram of the backlight station provided in an embodiment of this application;

[0038] Figure 3 This is a second schematic flowchart of the calibration method for the electrode defect detection system provided in the embodiments of this application;

[0039] Figure 4 This is one of the structural schematic diagrams of the electrode conveying mechanism provided in the embodiments of this application;

[0040] Figure 5 This is a second schematic diagram of the electrode conveying mechanism provided in the embodiments of this application;

[0041] Figure 6 This is a schematic diagram of the smoothing mechanism provided in the embodiments of this application;

[0042] Figure 7 This is a schematic diagram of the electrode defect detection device provided in the embodiments of this application;

[0043] Figure 8 This is a schematic diagram of the structure of the electronic device provided in the embodiments of this application.

[0044] Figure label:

[0045] Electrode 210, light source 220, image acquisition device 230, first guide roller 241, second guide roller 242, first clamping arm 251, second clamping arm 252, vernier caliper 310, angle ruler 320. Detailed Implementation

[0046] The technical solutions of the embodiments of this application will be clearly described below with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of this application. All other embodiments obtained by those skilled in the art based on the embodiments of this application are within the scope of protection of this application.

[0047] The terms "first," "second," etc., used in the specification and claims of this application are used to distinguish similar objects and not to describe a specific order or sequence. It should be understood that such use of data can be interchanged where appropriate so that embodiments of this application can be implemented in orders other than those illustrated or described herein, and the objects distinguished by "first," "second," etc., are generally of the same class and the number of objects is not limited; for example, a first object can be one or more. Furthermore, in the specification and claims, "and / or" indicates at least one of the connected objects, and the character " / " generally indicates that the preceding and following objects are in an "or" relationship.

[0048] The following is combined Figures 1-8 The calibration method, electrode defect detection system, calibration device, electronic device, and readable storage medium of the electrode defect detection system provided in this application are described in detail through specific embodiments and application scenarios.

[0049] The calibration method of the electrode defect detection system can be applied to the terminal, and can be executed by the hardware or software in the terminal.

[0050] The terminal includes, but is not limited to, portable communication devices such as mobile phones or tablets with touch-sensitive surfaces (e.g., touchscreen displays and / or touchpads). It should also be understood that, in some embodiments, the terminal may not be a portable communication device, but rather a desktop computer with touch-sensitive surfaces (e.g., touchscreen displays and / or touchpads).

[0051] The following embodiments describe a terminal including a display and a touch-sensitive surface. However, it should be understood that the terminal may include one or more other physical user interface devices such as a physical keyboard, mouse, and joystick.

[0052] The calibration method for the electrode defect detection system provided in this application embodiment can be executed by an electronic device or a functional module or entity in an electronic device that can implement the calibration method for the electrode defect detection system. The electronic devices mentioned in this application embodiment include, but are not limited to, mobile phones, tablets, computers, cameras and wearable devices. The calibration method for the electrode defect detection system provided in this application embodiment will be described below using an electronic device as the execution subject.

[0053] In this embodiment of the application, the electrode defect detection system includes a light source 220, an image acquisition device 230, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey the electrode 210. The light source 220 is located on the first side of the electrode 210, and the image acquisition device 230 is located on the second side of the electrode 210.

[0054] The light source 220 can be of various types, such as LED lights, incandescent lamps, or fluorescent lamps.

[0055] The image acquisition device 230 can be different types of industrial cameras. For example, the image acquisition device 230 can be a CCD (Charge Coupled Device) industrial camera or a CMOS (Complementary Metal Oxide Semiconductor) industrial camera.

[0056] Compared to consumer cameras, industrial cameras offer higher image stability, higher transmission capabilities, and stronger anti-interference capabilities.

[0057] like Figure 2 As shown, the light source 220 is located on the first surface of the electrode 210, and the image acquisition device 230 is located on the second surface of the electrode 210. The light source 220 and the image acquisition device 230 are located on opposite sides of the electrode 210. The electrode 210 is opaque, and the light-emitting surface of the light source 220 faces the image acquisition device 230. The image acquisition device 230 acquires an image of the electrode 210.

[0058] like Figure 1 As shown, the calibration method of the electrode defect detection system includes steps 110 to 160.

[0059] Step 110: Obtain the feed angle of the electrode 210 conveyed by the electrode conveying mechanism.

[0060] The feeding angle of electrode 210 refers to the angle between the feeding plane of electrode 210 and the horizontal plane when electrode 210 moves along the electrode conveying mechanism.

[0061] In some embodiments, the electrode conveying mechanism may include a conveyor belt, on which the electrode 210 moves. The plane on which the conveyor belt is located is the feeding plane, and the angle between the conveyor belt and the horizontal plane is the feeding angle. The feeding angle of the electrode 210 can be determined according to the tilt angle of the conveyor belt.

[0062] In other embodiments, the electrode conveying mechanism may include a guide roller assembly comprising at least two guide rollers for winding the electrode 210.

[0063] For example, the guide roller assembly may include a first guide roller 241 and a second guide roller 242, and the electrode 210 may move around the guide roller assembly in different directions in at least one of the following ways.

[0064] like Figure 4 As shown, in the first feeding scenario, the electrode 210 is arranged at the same end of the two guide rollers of the guide roller assembly. For example, the electrode 210 is arranged at the upper end of the two guide rollers. In this embodiment, the plane connecting the upper ends of the first guide roller 241 and the second guide roller 242 is the feeding plane of the electrode 210. The angle between the feeding plane and the horizontal plane can be measured using measuring tools such as an angle ruler 320, which is the feeding angle. At this time, the measured angle is equal to the value of the feeding angle.

[0065] In actual operation, one of the guide rollers can be clamped with a vernier caliper 310, with the arm of the vernier caliper 310 serving as the feeding plane, which facilitates the measurement of the feeding angle of the electrode sheet 210.

[0066] like Figure 4 As shown, the vernier caliper 310 is clamped at the upper end of the first guide roller 241, and the arm of the vernier caliper 310 is close to the upper end of the second guide roller 242. An angle ruler 320 is placed on the arm of the vernier caliper 310 to measure the feed angle of the electrode 210.

[0067] It should be noted that the accuracy of the angle gauge 320 is 0.05°, and when measuring the material feeding angle, the accuracy of the material feeding angle can be 0.1°.

[0068] like Figure 5 As shown, in the second material feeding case, the electrode 210 is arranged at different ends of the two guide rollers of the guide roller assembly. For example, one end of the electrode 210 is arranged at the upper end of the first guide roller 241, and the other end of the electrode 210 is arranged at the lower end of the second guide roller 242.

[0069] In this embodiment, the plane connecting the upper end of the first guide roller 241 and the lower end of the second guide roller 242 is the feeding plane of the electrode sheet 210, and the angle between the feeding plane and the horizontal plane is the feeding angle.

[0070] In actual operation, one of the guide rollers can be clamped by a vernier caliper 310, with the arm of the vernier caliper 310 as the feeding plane. At this time, the angle between the plane where the vernier caliper 310 is located and the horizontal plane is the measurement angle, and the angle between the plane where the vernier caliper 310 is located and the feeding plane is the calculation angle.

[0071] The angle between the plane of the vernier caliper 310 and the horizontal plane can be obtained using measuring tools such as an angle ruler 320; this angle is the measurement angle.

[0072] The diameters of the first guide roller 241 and the second guide roller 242, as well as the maximum distance between the first guide roller 241 and the second guide roller 242, are obtained using vernier calipers 310. Based on the diameters of the first guide roller 241 and the second guide roller 242, and the maximum distance between the first guide roller 241 and the second guide roller 242, the angle between the plane where the vernier calipers 310 is located and the material feeding plane is obtained through graphic simulation technology, which is the calculated angle.

[0073] The feeding angle is numerically equal to the measured angle plus the calculated angle.

[0074] Step 120: Based on the feeding angle, adjust the mounting position of the light source 220 so that the light emitting surface of the light source 220 is perpendicular to the plane where the electrode 210 is located.

[0075] The mounting position of the light source 220 includes its mounting location and orientation, and the plane on which the electrode 210 is located is the feeding plane.

[0076] In this step, after the light source 220 is placed on the first surface of the electrode 210, the installation position of the light source 220 relative to the electrode 210 and the installation posture such as the pitch angle of the light source 220 are adjusted according to the feeding angle of the feeding plane and the horizontal plane of the electrode 210, so that the light emitting surface of the light source 220 is perpendicular to the plane where the electrode 210 is located, thus completing the adjustment of the light source 220 in the electrode defect detection system.

[0077] Step 130: Acquire the first target image of the light source 220 through the image acquisition device 230.

[0078] The light source 220 is provided with a first target point, which is a colored pixel point used to mark a certain position in the light source 220.

[0079] In actual execution, the first target point can be a black pixel with a size of less than 2mm*2mm.

[0080] In this embodiment, the first target point is set at a certain position of the light source 220, and the light source 220 is photographed by the image acquisition device 230 to obtain the first target image of the light source 220. The first target image includes the pixel information of the first target point.

[0081] Step 140: Adjust the mounting position of the image acquisition device 230 based on the pixel information of the first target point in the first target image.

[0082] The installation orientation of the image acquisition device 230 includes the installation position and orientation of the image acquisition device 230 relative to the light source 220.

[0083] In this step, the relative positional relationship between the image acquisition device 230 and the light source 220 is determined based on the pixel information of the first target point in the first target image, and then the installation position and installation posture of the image acquisition device 230 relative to the light source 220 are adjusted accordingly based on the preset positional relationship.

[0084] For example, based on the pixel information of the first target point in the first target image, it is determined that the image acquisition device 230 and the light source 220 are not aligned. By adjusting the installation position and posture of the image acquisition device 230, the image acquisition device 230 can be made to reach the preset aligned position.

[0085] Step 150: Acquire the second target image of the electrode 210 transmitted by the electrode transmission mechanism through the image acquisition device 230.

[0086] In this embodiment, the electrode 210 is placed on the electrode conveying mechanism, and the second target image of the electrode 210 is obtained by the image acquisition device 230 capturing the electrode 210 on the electrode conveying mechanism.

[0087] Step 160: Based on the second target image, adjust the imaging parameters of the image acquisition device 230.

[0088] The imaging parameters of the image acquisition device 230 include parameters such as field of view, resolution, depth of field, sensor size, and main magnification.

[0089] In this embodiment, based on the second target image of the electrode 210 acquired by the image acquisition device 230, it is determined whether the image acquisition device 230 can clearly capture the detailed information and size information on the electrode 210. The parameters such as the field of view, resolution, depth of field, sensor size and main magnification of the image acquisition device 230 are adjusted so that the image of the electrode 210 acquired by the image acquisition device 230 can accurately reflect the defect information and size information on the electrode 210, thereby realizing the detection of electrode defects.

[0090] In related technologies, lithium battery materials are directly calibrated at the backlight station. The calibration fails after changing to other types of materials. Furthermore, if the same type of lithium battery is offset to the left or right during loading after the calibration is completed, the calibration also fails. This results in inaccurate measurement data of the lithium battery material dimensions. In addition, errors are prone to occur during the manual adjustment process, leading to a large range of measurement accuracy deviations in subsequent testing.

[0091] In this embodiment, the pose of the light source 220 is adjusted by the feeding angle of the electrode 210, and then the image of the light source 220 is captured by the image acquisition device 230. The relative pose between the light source 220 and the image acquisition device 230 is adjusted. Finally, the image of the electrode 210 is captured by the image acquisition device 230, and the imaging parameters of the image acquisition device 230 are adjusted. This standardizes the calibration process of the electrode defect detection system. After calibrating the poses of the light source 220 and the image acquisition device 230, the calibration will not fail when the electrode material is changed, and the detection accuracy of the electrode defect detection system is high.

[0092] According to the calibration method of the electrode defect detection system provided in the embodiments of this application, by adjusting the relative pose between the light source 220 and the image acquisition device 230, the imaging parameters of the image acquisition device 230 are adjusted, and the calibration process of the electrode defect detection system is standardized. The calibration will not fail when the electrode material is changed, and the detection accuracy of the electrode defect detection system is high.

[0093] In some embodiments, the electrode transfer mechanism further includes a smoothing component, which includes two clamping arms. The inner surface of the electrode 210 and one of the two clamping arms is on the same plane. A transparent substrate is clamped between the two clamping arms. The transparent substrate is located on the second side of the electrode 210. The transparent substrate is provided with a second target point. The second target image includes pixel information of the second target point.

[0094] like Figure 6 As shown, the smoothing assembly includes a first clamping arm 251 and a second clamping arm 252. The electrode 210 is in close contact with the inner surface of the first clamping arm 251, and the plane on which the electrode 210 is located is the same plane as the plane on which the inner surface of the first clamping arm 251 is located.

[0095] In this embodiment, the transparent substrate can be a transparent acrylic sheet, which is located on the second side of the electrode 210 and is in close contact with the electrode 210.

[0096] In actual execution, the second target image acquired by the image acquisition device 230 includes pixel information of the electrode and pixel information of the second target point on the transparent substrate.

[0097] It is understandable that since the electrode 210 is opaque, if the second target point is directly set on the electrode 210, the image acquisition device 230 cannot accurately obtain the pixel information of the second target point on the electrode 210.

[0098] In this embodiment, by setting a transparent substrate, the second target point is set on the transparent substrate, and the transparent substrate is closely attached to the electrode 210, thereby ensuring that the second target image has both pixel information for calibration and will not affect the electrode 210.

[0099] In this embodiment, after the electrode 210 is placed in the electrode conveying mechanism, the image acquisition device 230 captures the electrode 210 located in the electrode conveying mechanism to obtain a second target image of the electrode 210, the second target image including pixel information of the second target point.

[0100] It should be noted that the pixel information of the second target point may include information such as transition pixel information and electrode size accuracy information. Based on different pixel information, different imaging parameters of the image acquisition device 230 can be adjusted.

[0101] In some embodiments, step 160, adjusting the imaging parameters of the image acquisition device 230 based on the second target image, may include:

[0102] If the transition pixel information in the second target image is determined to be greater than the pixel threshold, the imaging parameters of the image acquisition device 230 are adjusted.

[0103] Among them, the transition pixel information is the number of transition pixels near the second target point. Transition pixels refer to gray pixels whose pixel color is between white and black. The pixel threshold is a preset threshold that meets the requirements of sharpness detection.

[0104] For example, the pixel threshold can be set to 2. If the number of transition pixels near the second target point in the second target image is greater than 2, the image acquisition device 230's resolution-related imaging parameters should be adjusted. If the number of transition pixels near the second target point in the second target image is not greater than 2, there is no need to adjust the image acquisition device 230's resolution-related imaging parameters.

[0105] In this embodiment, based on the transition pixel information in the second target image, when the number of transition pixels in the second target image is greater than the pixel threshold, it indicates that the image clarity acquired by the image acquisition device 230 does not meet the requirements, and the image clarity-related imaging parameters in the image acquisition device 230 are adjusted.

[0106] When the transition pixel information in the second target image is less than or equal to the pixel threshold, it indicates that the image clarity acquired by the image acquisition device 230 meets the requirements, and there is no need to adjust the imaging parameters in the image acquisition device 230.

[0107] In this embodiment, the imaging parameters of the image acquisition device 230 adjusted according to the transition pixel information can be resolution parameters.

[0108] After the image acquisition device 230 acquires the second target image, the fewer the number of transition pixels near the second target point in the second target image, the better the imaging clarity of the image acquisition device 230. When performing the inspection, it is easier to detect whether there are small defects such as pinholes in the electrode 210.

[0109] In some embodiments, step 160, adjusting the imaging parameters of the image acquisition device 230 based on the second target image, may include:

[0110] If the polarimeter size accuracy information in the second target image is determined to be greater than the size accuracy threshold, the imaging parameters of the image acquisition device 230 are adjusted.

[0111] In this embodiment, the distance between two pixels in the second target image can be used to determine the spacing between the corresponding physical structures of the two pixels. Based on this spacing and the distance between the corresponding two points of the electrode 210, the imaging parameters related to the size accuracy of the image acquisition device 230 are adjusted.

[0112] For example, the distance between two pixels in the second target image is the first distance, the spacing between corresponding physical structures is the first spacing, and the distance between the two points corresponding to these two pixels in the electrode 210 is the second spacing. The difference between the first spacing and the second spacing is calculated. When the difference is greater than the corresponding size accuracy threshold, the imaging parameters of the image acquisition device 230 are adjusted.

[0113] In this embodiment, the second target image includes a first line and a second line. The first line corresponds to the third line in the electrode 210, and the second line corresponds to the fourth line in the electrode 210. The first line and the second line are far apart, and the third line and the fourth line are far apart.

[0114] The distance between the first line and the second line is the image distance. The first spacing can be obtained by proportionally magnifying the image distance according to the main magnification of the image acquisition device 230.

[0115] The distance between the third and fourth lines is the second spacing, where the electrode size accuracy information is the difference between the first and second spacings.

[0116] In actual implementation, an algorithm can be designed based on the second target image to obtain multiple sets of first lines and second lines in the second target image, determine multiple first spacings and second spacings, determine multiple electrode size accuracy information based on multiple first spacings and one second spacing, and obtain the size relationship between multiple electrode size accuracy information and size accuracy threshold.

[0117] When the absolute value of the electrode size accuracy information is greater than the size accuracy threshold, the main magnification of the image acquisition device 230 is adjusted until the size accuracy information of multiple electrodes is less than or equal to the size accuracy threshold.

[0118] For example, the size accuracy threshold can be set to 0.1 mm. When it is determined that the absolute values ​​of the size accuracy information of multiple electrodes obtained by the algorithm are all less than or equal to the size accuracy threshold, the imaging parameters of the image acquisition device 230 are adjusted.

[0119] In some embodiments, the first target point includes a first target point and two second target points. The first target point is located at the center of the light source 220, and the two second target points are located on opposite sides of the light source 220. Adjusting the mounting pose of the image acquisition device 230 based on the pixel information of the first target point in the first target image includes:

[0120] Based on the pixel information of the first target point and two second target points in the first target image, the mounting position of the image acquisition device 230 is adjusted so that the pixel information of the first target point is located at the center of the first target image, and the pixel information of the two second target points is located at the opposite edge of the first target image.

[0121] In actual execution, both the first target point and the second target point can be black pixels with a size of less than 2mm*2mm.

[0122] In this embodiment, the first target point is located at the center of the light source 220, corresponding to the center position in the first target image, and the second target point is located on the two opposite sides of the light source 220, corresponding to the two opposite edge positions in the first target image.

[0123] By matching the actual positions of the first and second target points in the electrode 210 with the positions of the first and second target points in the first target image, the relative positions between the image acquisition device 230 and the light source 220 can be accurately determined.

[0124] The following is a specific embodiment used to describe the calibration method of the electrode defect detection system of this application.

[0125] like Figure 3 As shown, adjusting the attitude and position of the light source 220 includes: adjusting the pitch of the light source 220 so that the light-emitting surface of the light source 220 is perpendicular to the feeding direction of the electrode 210, and setting a first target point at the center of the light source 220, and setting a second target point on each of the two opposite sides of the light source 220.

[0126] Adjusting the attitude and imaging position of the image acquisition device 230 includes: adjusting the pitch of the image acquisition device 230 and the image acquisition device 230 itself, to determine that the first target point can be seen in the center of the first target image acquired by the image acquisition device 230, and the second target point can be seen on both sides of the first target image, so that the center line of the target surface of the image acquisition device 230 is collinear with the center line of the light-emitting surface of the light source 220, and determining the attitude of the image acquisition device 230.

[0127] Adjust the imaging clarity of the image acquisition device 230, unify the brightness range of the light source 220 and the exposure time range of the image acquisition device 230, use the image acquisition device 230 to perform white balance on the light source 220, and adjust the brightness of the light source 220 and the exposure time of the image acquisition device 230 so that the image acquisition device 230 meets the preset imaging clarity requirements.

[0128] To fine-tune the imaging clarity, firstly, based on the lateral resolution of the center of the field of view of the first target image in the image acquisition device 230, it is determined whether the distance between the electrode 210 in the electrode transfer mechanism and the image acquisition device 230 meets the preset imaging clarity requirements. If the preset imaging clarity requirements are not met, the working position of the image acquisition device 230 is adjusted so that the lateral resolution of the image in the image acquisition device 230 meets the preset imaging clarity requirements.

[0129] The electrode 210 is located between the two clamping arms of the smoothing mechanism. A transparent substrate is provided between the two clamping arms. The transparent substrate is in close contact with the electrode 210. The second target point is set on the transparent substrate. The electrode 210 in the electrode transfer mechanism is photographed by the image acquisition device 230 to obtain the second target image. The resolution-related imaging parameters of the image acquisition device 230 are adjusted so that the number of transition pixels at the edge of the position corresponding to the second target point in the second target image is less than or equal to the pixel threshold.

[0130] If the number of transition pixels cannot be made less than or equal to the pixel threshold by adjusting the resolution-related imaging parameters of the image acquisition device 230, the image acquisition device 230 shall be returned for repair.

[0131] The accuracy of transverse and longitudinal dimension measurements is calibrated. The accuracy of longitudinal dimension measurements can be directly obtained from the calibration results of the roller surface station.

[0132] The calibration of the transverse dimension measurement accuracy first involves designing an algorithm calculation scheme to obtain the dimensional accuracy of multiple electrodes 2. When the electrode dimensional accuracy is greater than the dimensional accuracy threshold, the main magnification of the image acquisition device 230 is adjusted so that the electrode dimensional accuracy is less than or equal to the dimensional accuracy threshold.

[0133] The calibration method for the electrode defect detection system provided in this application can be executed by a calibration device for the electrode defect detection system. This application uses the calibration device for the electrode defect detection system executing the calibration method as an example to illustrate the calibration device for the electrode defect detection system provided in this application.

[0134] This application embodiment also provides a calibration device for an electrode defect detection system. The electrode defect detection system includes a light source 220, an image acquisition device 230, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey an electrode 210. The light source 220 is located on the first surface of the electrode 210, and the image acquisition device 230 is located on the second surface of the electrode 210.

[0135] like Figure 7 As shown, the electrode defect detection device includes:

[0136] The first acquisition module 710 is used to acquire the feeding angle of the electrode 210 conveyed by the electrode conveying mechanism;

[0137] The first processing module 720 is used to adjust the mounting position of the light source 220 based on the feeding angle so that the light emitting surface of the light source 220 is perpendicular to the plane where the electrode 210 is located.

[0138] The second acquisition module 730 is used to acquire a first target image of the light source 220 through the image acquisition device 230, wherein the light source 220 is provided with a first target point;

[0139] The second processing module 740 is used to adjust the installation pose of the image acquisition device 230 based on the pixel information of the first target point in the first target image.

[0140] The third acquisition module 750 is used to acquire the second target image of the electrode 210 transmitted by the electrode conveying mechanism through the image acquisition device 230;

[0141] The third processing module 760 is used to adjust the imaging parameters of the image acquisition device 230 based on the second target image.

[0142] According to the electrode defect detection device provided in the embodiments of this application, by adjusting the relative pose between the light source 220 and the image acquisition device 230, the imaging parameters of the image acquisition device 230 are adjusted, and the calibration process of the electrode defect detection system is standardized. The calibration will not fail when the electrode material is changed, and the detection accuracy of the electrode defect detection system is high.

[0143] In some embodiments, the electrode transfer mechanism further includes a smoothing component, which includes two clamping arms. The inner surface of the electrode 210 and one of the two clamping arms is on the same plane. A transparent substrate is clamped between the two clamping arms. The transparent substrate is located on the second side of the electrode 210. The transparent substrate is provided with a second target point. The second target image includes pixel information of the second target point.

[0144] In some embodiments, the third processing module 760 is used to adjust the imaging parameters of the image acquisition device 230 when it is determined that the transition pixel information in the second target image is greater than a pixel threshold.

[0145] In some embodiments, the third processing module 760 is used to adjust the imaging parameters of the image acquisition device 230 when it is determined that the electrode size accuracy information in the second target image is greater than the size accuracy threshold.

[0146] In some embodiments, the second processing module 740 is used to adjust the mounting pose of the image acquisition device 230 based on the pixel information of the first target point and two second target points in the first target image, so that the pixel information of the first target point is located at the center of the first target image and the pixel information of the two second target points is located at the opposite edge of the first target image.

[0147] This application also provides an electrode defect detection system.

[0148] The system includes a light source 220, an image acquisition device 230, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey the electrode 210. The light source 220 is located on the first side of the electrode 210, and the image acquisition device 230 is located on the second side of the electrode 210.

[0149] The controller is electrically connected to the light source 220, the image acquisition device 230, and the electrode conveying mechanism. The controller calibrates the electrode defect detection system based on the calibration method of the electrode defect detection system described above.

[0150] According to the electrode defect detection system provided in this application embodiment, by adjusting the relative pose between the light source 220 and the image acquisition device 230, the imaging parameters of the image acquisition device 230 are adjusted, and the calibration process of the electrode defect detection system is standardized. The calibration will not fail when the electrode material is changed, and the detection accuracy of the electrode defect detection system is high.

[0151] The electrode defect detection device in this application embodiment can be an electronic device or a component of an electronic device, such as an integrated circuit or a chip. The electronic device can be a terminal or other devices besides a terminal. For example, the electronic device can be a mobile phone, tablet computer, laptop computer, PDA, in-vehicle electronic device, mobile internet device (MID), augmented reality (AR) / virtual reality (VR) device, robot, wearable device, ultra-mobile personal computer (UMPC), netbook, or personal digital assistant (PDA), etc. It can also be a server, network attached storage (NAS), personal computer (PC), television (TV), ATM, or self-service machine, etc. This application embodiment does not specifically limit the specific type of device.

[0152] The electrode defect detection device in this application embodiment can be a device with an operating system. This operating system can be Android, iOS, or other possible operating systems; this application embodiment does not specifically limit it.

[0153] The electrode defect detection device provided in this application embodiment can achieve... Figures 1 to 6 The various processes implemented in the method implementation examples will not be described again here to avoid repetition.

[0154] In some embodiments, such as Figure 8 As shown, this application embodiment also provides an electronic device 800, including a processor 801, a memory 802, and a computer program stored in the memory 802 and executable on the processor 801. When the program is executed by the processor 801, it implements the various processes of the above-described electrode defect detection method embodiment and can achieve the same technical effect. To avoid repetition, it will not be described again here.

[0155] It should be noted that the electronic devices in the embodiments of this application include the mobile electronic devices and non-mobile electronic devices described above.

[0156] This application also provides a non-transitory computer-readable storage medium storing a computer program. When the computer program is executed by a processor, it implements the various processes of the above-described electrode defect detection method embodiments and achieves the same technical effect. To avoid repetition, it will not be described again here.

[0157] The processor is the processor in the electronic device described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0158] This application also provides a computer program product, including a computer program that, when executed by a processor, implements the above-described electrode defect detection method.

[0159] The processor is the processor in the electronic device described in the above embodiments. The readable storage medium includes computer-readable storage media, such as computer read-only memory (ROM), random access memory (RAM), magnetic disk, or optical disk.

[0160] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes that element. Furthermore, it should be noted that the scope of the methods and apparatuses in the embodiments of this application is not limited to performing functions in the order shown or discussed, but may also include performing functions substantially simultaneously or in the reverse order, depending on the functions involved. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Additionally, features described with reference to certain examples may be combined in other examples.

[0161] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of this application, in essence, or the part that contributes to the prior art, can be embodied in the form of a computer software product. This computer software product is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) and includes several instructions to cause a terminal (which may be a mobile phone, computer, server, or network device, etc.) to execute the methods described in the various embodiments of this application.

[0162] The embodiments of this application have been described above with reference to the accompanying drawings. However, this application is not limited to the specific embodiments described above. The specific embodiments described above are merely illustrative and not restrictive. Those skilled in the art can make many other forms under the guidance of this application without departing from the spirit and scope of the claims, and all of these forms are within the protection scope of this application.

[0163] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "illustrative embodiment," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of this application. In this specification, the illustrative expressions of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples.

[0164] Although embodiments of this application have been shown and described, those skilled in the art will understand that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of this application, the scope of which is defined by the claims and their equivalents.

Claims

1. A calibration method for an electrode defect detection system, characterized in that, The electrode defect detection system includes a light source, an image acquisition device, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey electrodes. The light source is located on a first surface of the electrode, and the image acquisition device is located on a second surface of the electrode. The calibration method of the electrode defect detection system includes: Obtain the feed angle of the electrode sheet conveyed by the electrode sheet conveying mechanism; Based on the feeding angle, adjust the mounting position of the light source so that the light emitting surface of the light source is perpendicular to the plane where the electrode is located; The image acquisition device acquires a first target image of the light source, wherein the light source is provided with a first target point; Based on the pixel information of the first target point in the first target image, adjust the installation posture of the image acquisition device; The image acquisition device acquires a second target image of the electrode sheet transmitted by the electrode sheet transmission mechanism; Based on the second target image, the imaging parameters of the image acquisition device are adjusted.

2. The calibration method for the electrode defect detection system according to claim 1, characterized in that, The electrode transfer mechanism further includes a smoothing component, which includes two clamping arms. The first surface of the electrode and the inner surface of one of the two clamping arms are on the same plane. A transparent substrate is clamped between the two clamping arms. The transparent substrate is located on the second surface of the electrode. The transparent substrate is provided with a second target point. The second target image includes pixel information of the second target point.

3. The calibration method for the electrode defect detection system according to claim 2, characterized in that, The pixel information of the second target point includes transition pixel information. Adjusting the imaging parameters of the image acquisition device based on the second target image includes: If the transition pixel information in the second target image is determined to be greater than a pixel threshold, the imaging parameters of the image acquisition device are adjusted. The transition pixel information refers to the number of transition pixels, where each transition pixel is a gray pixel whose color is between white and black.

4. The calibration method for the electrode defect detection system according to claim 2, characterized in that, The pixel information of the second target point includes pole size accuracy information. Adjusting the imaging parameters of the image acquisition device based on the second target image includes: If the electrode size accuracy information in the second target image is determined to be greater than the size accuracy threshold, the imaging parameters of the image acquisition device are adjusted.

5. The calibration method for the electrode defect detection system according to any one of claims 1-4, characterized in that, The first target point includes a first target point and two second target points. The first target point is located at the center of the light source, and the two second target points are located on opposite sides of the light source. Adjusting the mounting pose of the image acquisition device based on the pixel information of the first target point in the first target image includes: Based on the pixel information of the first target point and the two second target points in the first target image, the installation posture of the image acquisition device is adjusted so that the pixel information of the first target point is located at the center of the first target image, and the pixel information of the two second target points is located at the opposite edge of the first target image.

6. A electrode defect detection system, characterized in that, include: The system includes a light source, an image acquisition device, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey electrode sheets. The light source is located on the first side of the electrode sheet, and the image acquisition device is located on the second side of the electrode sheet. The controller is electrically connected to the light source, the image acquisition device, and the electrode conveying mechanism. The controller calibrates the electrode defect detection system based on the calibration method of the electrode defect detection system according to any one of claims 1-5.

7. A calibration device for an electrode defect detection system, characterized in that, The electrode defect detection system includes a light source, an image acquisition device, and an electrode conveying mechanism. The electrode conveying mechanism is used to convey electrodes. The light source is located on the first side of the electrode, and the image acquisition device is located on the second side of the electrode. The calibration device of the electrode defect detection system includes: The first acquisition module is used to acquire the feed angle of the electrode sheet conveyed by the electrode sheet conveying mechanism; The first processing module is used to adjust the mounting position of the light source based on the feeding angle, so that the light emitting surface of the light source is perpendicular to the plane where the electrode is located; The second acquisition module is used to acquire a first target image of the light source through the image acquisition device, wherein the light source is provided with a first target point; The second processing module is used to adjust the installation posture of the image acquisition device based on the pixel information of the first target point in the first target image; The third acquisition module is used to acquire the second target image of the electrode transmitted by the electrode conveying mechanism through the image acquisition device; The third processing module is used to adjust the imaging parameters of the image acquisition device based on the second target image.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the program, it implements the calibration method of the electrode defect detection system as described in any one of claims 1-5.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that, When executed by a processor, the computer program implements the calibration method of the electrode defect detection system as described in any one of claims 1-5.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by the processor, it implements the calibration method of the electrode defect detection system as described in any one of claims 1-5.

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