A micrometer scale calibrator and a scale calibration method

Abstract

The present invention relates to a micrometer scale calibrator and a scale calibration method, which solve the problems in the prior art that when using a tool microscope for verification, the measurement result is not intuitive and it is easy to confuse the cases of line pressing and line off. The calibrator specifically includes a support, a scale plate and a magnifying member. The support includes a lapping cylinder, and an observation hole is axially arranged on the lapping cylinder. The scale plate is installed in the observation hole. The scale plate is made of transparent glass, and a first scale line is engraved on the scale plate. The first scale line includes a horizontal scale line and a vertical scale line. The range of the vertical scale line is 0 - 0.30 mm, and the range of the horizontal scale line is -0.05 - 0.30 mm. The width between any two adjacent scale lines in the horizontal scale line and the vertical scale line is 0.01 mm. Fine lines are respectively connected between the scale lines at 0.08 and 0.20, between the scale lines at 0.20 and 0.30, and between the scale lines at -0.05 and 0.10 of the horizontal scale line. The magnifying member is coaxially installed above the observation hole.

Description

Technical Field

[0001] The present invention relates to a precision measuring device, and particularly to a micrometer scale calibrator and a scale calibration method. Background Art

[0002] According to JJG 21-2008 "Verification Regulation of Micrometers", the items to be inspected are: item 6, scale width and width difference; item 9, relative position of the end face of the conical surface of the thimble and the millimeter scale on the fixed sleeve.

[0003] When carrying out item 6 to be inspected, the "Verification Regulation of Micrometers" requires that: the scale width of the thimble is 0.08 - 0.20 mm, the width difference between the scale on the fixed sleeve and the scale on the thimble should not be greater than 0.03 mm, the scale width of the scale disk with scale is 0.20 - 0.30 mm, and its scale width difference should not be greater than 0.05 mm; at the same time, the verification method given in the verification regulation is: verification on a tool microscope; at least 3 scales on the thimble or scale disk should be randomly inspected for the scale width, and this verification can also be carried out by other methods that meet the uncertainty requirements.

[0004] When carrying out item 9 to be inspected, the "Verification Regulation of Micrometers" requires that: when the lower limit of the micrometer measurement is adjusted correctly, when the zero scale on the thimble aligns with the longitudinal scale on the fixed sleeve, the end face of the thimble should be tangent to the right edge of the millimeter scale on the fixed sleeve. If not tangent, the pressure line should not be greater than 0.05 mm, and the off-line should not be greater than 0.1 mm; at the same time, the verification method given in the verification regulation is: when the lower limit of the micrometer measurement is adjusted correctly, when the end face of the conical surface of the thimble is tangent to the right edge of any millimeter scale on the fixed sleeve, read the offset of the zero scale on the thimble and the longitudinal scale on the fixed sleeve.

[0005] However, in the actual working process, when operating according to the verification method given in the verification regulation, it is not particularly intuitive, especially it is easy to confuse the pressure line and the off-line, which affects the verification quality. Summary of the Invention

[0006] The purpose of the present invention is to solve the problems existing in the prior art that when using a tool microscope for verification, the measurement result is not intuitive and it is easy to confuse the pressure line and the off-line, and to provide a micrometer scale calibrator and a scale calibration method.

[0007] To achieve the above purpose, the technical solution adopted by the present invention is as follows:

[0008] A micrometer scale calibrator, characterized in that:

[0009] It includes a support, a scale plate and a magnifying member;

[0010] The support includes a lapping cylinder;

[0011] The lapping cylinder is used to lap with the micrometer, and an observation hole is axially arranged on the lapping cylinder; the scale plate is installed in the observation hole and is perpendicular to the axis of the observation hole;

[0012] The scale plate is made of transparent glass material, and a first scale line is engraved on the scale plate;

[0013] The first scale line includes a horizontal scale line for calibrating the width of the second scale line on the fixed sleeve of the micrometer, the fourth scale line on the scale disk of the dial micrometer, or the third scale line on the thimble of the micrometer, and a vertical scale line for calibrating the offset of the zero scale line of the third scale line on the thimble from the second scale line of the fixed sleeve; the range of the vertical scale line is 0 - 0.30 mm; the range of the horizontal scale line is -0.05 - 0.30 mm;

[0014] The width between any adjacent scale lines among the horizontal scale line and the vertical scale line is 0.01 mm;

[0015] Fine lines are respectively connected between the 0.08 scale line and the 0.20 scale line, the 0.20 scale line and the 0.30 scale line, and the -0.05 scale line and the 0.10 scale line of the horizontal scale line;

[0016] The magnifying member is coaxially installed above the observation hole for magnifying and observing the first scale line, the second scale line, the third scale line, and the fourth scale line.

[0017] Further, the magnifying member is a 15 - fold magnifying glass.

[0018] Further, a slot with a side opening is provided at the lower end of the lapping cylinder;

[0019] The slot communicates with the observation hole, and the scale plate is inserted into the slot from the outside and enters the observation hole.

[0020] Further, the support also includes a hollow adjusting cylinder;

[0021] The adjusting cylinder is threadedly connected to the upper end of the lapping cylinder;

[0022] The magnifying member is arranged in the adjusting cylinder.

[0023] Further, the support also includes a light source assembly;

[0024] The light source assembly includes a light source, a switch, and a power supply;

[0025] The light source is installed inside the lapping cylinder;

[0026] The switch is arranged on the lapping cylinder for controlling the on - off of the light source;

[0027] The power supply is arranged on the lapping cylinder and is used to supply power to the light source.

[0028] Further, the lower end face of the lapping cylinder is an inwardly concave cylindrical surface; the inwardly concave cylindrical surface is matched with the large-end cylindrical surface of the differential cylinder of the micrometer;

[0029] Or the lower end face of the lapping cylinder is a flat surface; the flat surface is in contact with the scale surface of the scale micrometer in the micrometer.

[0030] The present invention also provides a method for calibrating the graduation lines of a micrometer, which is characterized in that: using the micrometer graduation line calibrator described in claim 1, and comprising the following steps:

[0031] Step 1: Lap the micrometer graduation line calibrator on the micrometer;

[0032] Step 2: Measure the micrometer according to the item to be inspected 6

[0033] 2.1) Measure the second graduation line and record the data, wherein the second graduation line includes vertical graduation lines and millimeter graduation lines;

[0034] Align the 0 graduation line of the horizontal graduation line with the left end of any graduation line on the second graduation line, and at the same time observe the position of the right end of this graduation line on the horizontal graduation line, record the data and determine whether the width of the graduation line meets the requirements;

[0035] 2.2) Measure the third graduation line or the fourth graduation line and record the data

[0036] Align the 0 graduation line of the vertical graduation line with the left end of any graduation line on the third graduation line, and at the same time observe the position of the right end of this graduation line on the vertical graduation line, record the data and determine whether the width of the graduation line meets the requirements;

[0037] Or align the 0 graduation line of the vertical graduation line or the 0 graduation line of the horizontal graduation line with the left end of any graduation line on the fourth graduation line, and at the same time observe the position of the right end of this graduation line on the vertical graduation line or the horizontal graduation line, record the data and determine whether the width of the graduation line meets the requirements;

[0038] 2.3) Determine whether the width differences of the graduation lines of the second graduation line, the third graduation line and the fourth graduation line meet the requirements

[0039] 2.3.1) Repeat steps 2.1 and 2.2 multiple times and record the obtained data;

[0040] 2.3.2) Subtract the minimum value from the maximum value of the data measured for the second graduation line, and determine whether the width difference of the graduation line of the second graduation line meets the requirements;

[0041] Subtract the minimum value from the maximum value of the data measured for the third graduation line, and determine whether the width difference of the graduation line of the third graduation line meets the requirements;

[0042] Take the difference between the maximum and minimum values of the data measured on the fourth scale line, and determine whether the scale line width difference of the fourth scale line meets the requirements.

[0043] Step 3: Measure the micrometer according to inspection item 9

[0044] After the lower limit adjustment of the micrometer is correct, align the 0 scale line on the third scale line with the vertical scale line of the second scale line, check whether the end face of the thimble is tangent to the right edge of the millimeter scale line of the second scale line of the fixed sleeve, record the data and determine whether it meets the requirements of the judgment standard.

[0045] Further, the judgment standard in step 2.1 is: If the scale line width of the second scale line on the fixed sleeve of the micrometer is within the range of 0.08 - 0.20 mm of the horizontal scale line, it can be judged that the scale line width meets the requirements;

[0046] The judgment standard in step 2 is: If the scale line width of the third scale line on the thimble is within the range of 0.08 - 0.20 mm of the vertical scale line, it can be judged that the scale line width meets the requirements;

[0047] Or: If the scale line width of the second scale line on the scale disk of the dial micrometer in the micrometer is within the range of 0.20 - 0.30 mm of the horizontal scale line or the vertical scale line, it can be judged that the scale line width meets the requirements.

[0048] Further, the judgment standard in step three is;

[0049] If the end face of the thimble is tangent to the right edge of the millimeter scale line of the second scale line of the fixed sleeve, then the inspection item meets the requirements;

[0050] If not tangent, align the 0 scale line of the horizontal scale line with the 0 scale line of the second scale line, and observe whether the end face of the thimble is within the range of -0.05 - 0.10 mm. If so, it can be judged that the inspection item meets the requirements.

[0051] Further, in step two, at least any three scale lines on the second scale line, the third scale line, and the fourth scale line are randomly selected for measurement.

[0052] The beneficial effects of the present invention are:

[0053] 1. A scale calibration device for a micrometer of the present invention, after being installed on the micrometer, can simultaneously complete the measurement work of inspection item 6 and inspection item 9 through the set scale plate, and quickly and accurately give: the scale line width and width difference; the relative position of the end face of the thimble conical surface and the millimeter scale line of the fixed sleeve.

[0054] 2. A scale calibration device for a micrometer of the present invention has low requirements for operators and is easy to operate.

[0055] 3. A vernier caliper graduation calibrator of the present invention has a simple structure and is convenient to use, and is suitable for wide promotion. BRIEF DESCRIPTION OF THE DRAWINGS

[0056] Figure 1 is a schematic structural diagram of an embodiment of the vernier caliper graduation calibration method of the present invention;

[0057] Figure 2 is a schematic structural diagram of an embodiment of the vernier caliper graduation calibration method of the present invention (dial vernier caliper);

[0058] Figure 3 is a schematic external structural diagram (I) of an embodiment of a vernier caliper graduation calibrator of the present invention;

[0059] Figure 4 is Figure 3 a cross-sectional view of the A-A plane in

[0060] Figure 5 is a schematic external structural diagram (II) of an embodiment of a vernier caliper graduation calibrator of the present invention;

[0061] Figure 6 is a schematic structural diagram of a graduation plate in an embodiment of the present invention;

[0062] Figure 7 is a schematic diagram of a first graduation line in an embodiment of the present invention;

[0063] Figure 8 is a cross-sectional view of an embodiment of a dial vernier caliper graduation calibrator of the present invention;

[0064] Figure 9 is a schematic structural diagram of a vernier caliper observation window in an embodiment of the present invention;

[0065] Figure 10 is a schematic structural diagram of a dial vernier caliper observation window in an embodiment of the present invention.

[0066] In the figure, 1 - magnifying glass; 2 - adjusting cylinder; 3 - overlapping cylinder; 31, observation window; 32, cylinder body; 33, slot; 4 - light source; 5 - graduation plate; 6 - concave cylindrical surface; 7 - switch; 8 - power supply; 9 - vernier caliper; 10 - fixed sleeve; 11 - differential cylinder; 12 - graduation calibrator; 13 - observation hole; 14 - horizontal graduation line; 15 - vertical graduation line; 16, planar surface. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0067] To make the objectives, advantages, and features of the present invention clearer, the following further elaborates in detail on a micrometer scale calibrator and a scale calibration method proposed by the present invention in conjunction with the accompanying drawings and specific embodiments. According to the following specific implementation manners, the advantages and features of the present invention will be clearer. It should be noted that: the accompanying drawings are all in a very simplified form and use non-precise scales, only for conveniently and clearly assisting in explaining the objectives of the embodiments of the present invention; secondly, the structures shown in the accompanying drawings are often part of the actual structures.

[0068] In the description of the present invention, it should be noted that the terms "first" and "second" are only used for descriptive purposes and cannot be construed as indicating or implying relative importance.

[0069] The present invention will be described in detail below in conjunction with the accompanying drawings and specific implementation manners.

[0070] A micrometer scale calibrator in this embodiment, as Figure 3 、 Figure 4 and Figure 5 shown, includes a support, a scale plate 5, a light source assembly, a scale plate 5, and a magnifying member 1 using a 15-fold magnifying glass. The scale plate 5 is made of transparent glass material;

[0071] The support includes a lapping cylinder 3 and an adjusting cylinder 2. The lapping cylinder 3 includes an observation window 31 and a cylinder body 32 that are connected to each other. The light source assembly includes a light source 4, a switch 7, and a power supply 8.

[0072] On the scale plate 5, according to the verification principles of item 6 (scale width and width difference) and item 9 (relative position of the end face of the differential cylinder cone and the millimeter scale of the fixed sleeve) in the "Verification Regulation of Micrometers" JJG21-2008, the first scale lines are engraved. The first scale lines include horizontal scale lines 14 and vertical scale lines 15. The scale line spacing of the first scale lines covers the scale sizes of item 6 and item 9 in the verification items. The graduation value of the scale lines is 0.01 mm, and the scale accuracy is not greater than 3 μm.

[0073] According to the requirements of the "Verification Regulation of Micrometers": the scale width of the fixed sleeve should be 0.08 - 0.20 mm; the scale width of the scale disk should be 0.20 - 0.30 mm. Therefore, the 0.08 - 0.20 mm section and the 0.20 - 0.30 mm section on the horizontal scale line 14 are designed, and each section is connected by a thin line. When the two lower measurement limits of the micrometer 9 are adjusted correctly, when the zero scale line on the differential cylinder is aligned with the longitudinal scale line of the fixed sleeve, the end face of the differential cylinder should be tangent to the right edge of the millimeter scale of the fixed sleeve. If it is not tangent, the pressure on the line should not be greater than 0.05 mm, and the off-line should not be greater than 0.1 mm. Therefore, the -0.05 - 0.10 mm section on the designed horizontal scale line 14 is connected by a thin line.

[0074] According to the requirements of the "Micrometer Verification Regulation": the engraved line width of the thimble should be 0.08 - 0.20 mm; the engraved line width of the dial should be 0.20 - 0.30 mm. Therefore, the range of the vertical scale line 15 is designed to be 0 - 0.30 mm. In summary, the Figure 6 first scale line is obtained.

[0075] As Figures 3 - 5 shown, the specific connection relationship of each component is as follows:

[0076] An observation hole 13 is opened on the overlapping cylinder 3. A slot 33 is opened on the observation window 31. The scale plate 5 is inserted into the slot 33 from the outside to the inside. The scale plate 5 is installed in the observation hole 13 and is perpendicular to the axis of the observation hole 13. The upper end of the overlapping cylinder 3 is threadedly connected to the hollow adjustment cylinder 2. An enlarging member 1 is connected to the adjustment cylinder 2. By adjusting the height of the adjustment cylinder 2, the distance between the enlarging member 1 and the scale plate 5 can be adjusted.

[0077] As Figure 6 shown in Figure 7 Figure, the range of the vertical scale line 15 is 0 - 0.30 mm; the range of the horizontal scale line 14 is -0.05 - 0.30 mm; the width between any adjacent scale lines of the horizontal scale line 14 and the vertical scale line 15 is 0.01 mm; the scale lines at 0.08 and 0.20, 0.20 and 0.30, -0.05 and 0.10 of the horizontal scale line 14 are respectively connected by thin lines.

[0078] The light source 4 is arranged inside the overlapping cylinder 3, and the power supply 8 and the switch 7 are arranged outside the cylinder body 32, which can not only supply power to the light source 4 but also control the switch of the light source 4.

[0079] As Figure 9 shown in

[0080] Figure, the lower end face of the observation window 31 is an inner concave cylindrical surface 6; the inner concave cylindrical surface 6 matches the large-end cylindrical surface of the thimble of the micrometer 9. Figure 8 Or as Figure 10 shown in

[0081] This embodiment also proposes a usage method of the micrometer scale calibrator. As Figure 1 shown in Figure 2 Figure, using the micrometer scale calibrator described in claim 1, it includes the following steps:

[0082] Step 1: Overlap the micrometer scale calibrator 12 on the micrometer 9;

[0083] Step 2: Measure the micrometer 9 according to the item to be inspected 6

[0084] 2.1) Measure and record the data of the second scale line, where the second scale line includes vertical scale lines and millimeter scale lines;

[0085] Align the 0 scale line of the horizontal scale line 14 with the left end of any scale line on the second scale line, and at the same time observe the position of the right end of this scale line on the horizontal scale line 14, record the data and determine whether the width of the scale line meets the requirements; among them, the second scale line is the scale line on the fixed sleeve 10;

[0086] If the width of the second scale line on the fixed sleeve 10 of the micrometer 9 is within the range of 0.08 - 0.20 mm of the horizontal scale line 14; then it can be judged that the width of this scale line meets the requirements; at least randomly select and measure three scale lines on the second scale line;

[0087] 2.2) Measure and record the data of the third scale line or the fourth scale line

[0088] Align the 0 scale line of the vertical scale line 15 with the left end of any scale line on the third scale line, and at the same time observe the position of the right end of this scale line on the vertical scale line 15, record the data and determine whether the width of the scale line meets the requirements;

[0089] If the width of the third scale line on the differential cylinder 11 is within the range of 0.08 - 0.20 mm of the vertical scale line 15, then it can be judged that the width of this scale line meets the requirements;

[0090] Or align the 0 scale line of the vertical scale line 15 or the horizontal scale line 14 with the left end of any scale line on the fourth scale line, and at the same time observe the position of the right end of this scale line on the vertical scale line 15 or the horizontal scale line 14, record the data and determine whether the width of the scale line meets the requirements;

[0091] If the width of the second scale line on the dial of the dial micrometer 9 is within the range of 0.20 - 0.30 mm of the vertical scale line 15 or the horizontal scale line 14, then it can be judged that the width of this scale line meets the requirements;

[0092] 2.3) Determine whether the width differences of the second scale line, the third scale line and the fourth scale line meet the requirements

[0093] 2.3.1) Repeat steps 2.1 and 2.2 multiple times and record the obtained data;

[0094] 2.3.2) Subtract the minimum value from the maximum value of the data measured for the second scale line and determine whether it meets the standard requirements for the width difference of the second scale line;

[0095] The standard for the width difference of the second scale line is: the width difference is not greater than 0.03 mm;

[0096] Take the difference between the maximum and minimum values of the data measured on the third scale line, and determine whether it meets the standard requirements for the line width difference of the third scale line;

[0097] The standard for the line width difference of the third scale line is: the width difference is not greater than 0.03 mm;

[0098] Take the difference between the maximum and minimum values of the data measured on the fourth scale line, and determine whether it meets the standard requirements for the line width difference of the fourth scale line;

[0099] The standard for the line width difference of the fourth scale line is: the width difference is not greater than 0.05 mm;

[0100] Randomly select at least three scale lines on the second, third, or fourth scale lines for measurement;

[0101] Step 3: Measure the micrometer 9 according to the inspected item 9

[0102] After correctly adjusting the lower limit of the micrometer 9, align the 0 scale line on the third scale line with the vertical scale line of the second scale line, check whether the end face of the thimble 11 is tangent to the right edge of the millimeter scale line of the second scale line of the fixed sleeve 10, record the data and determine whether it meets the judgment standard requirements;

[0103] If the end face of the thimble 11 is tangent to the right edge of the millimeter scale line of the second scale line of the fixed sleeve 10, then the inspected item meets the requirements;

[0104] If it is not tangent, align the 0 scale line of the horizontal scale line 14 with the 0 scale line on the second scale line, and observe whether the end face of the thimble is within the range of -0.05 to 0.10 mm. If so, it can be judged that the inspected item meets the requirements.

Claims

1. A micrometer scale calibrator, characterized in that: It includes a support, a scale plate (5) and a magnifying member (1); The support includes a lapping cylinder (3); The lapping cylinder (3) is used to lap with a micrometer (9), and an observation hole (13) is axially provided in the lapping cylinder (3); the scale plate (5) is installed in the observation hole (13) and is perpendicular to the axis of the observation hole (13); The scale plate (5) is made of transparent glass material, and a first scale line is engraved on the scale plate (5); The first scale line includes a second scale line for the fixed sleeve (10) on the micrometer (9), a horizontal scale line (14) for calibrating the width of the fourth scale line on the scale disk of the dial micrometer in the micrometer (9), and a vertical scale line (15) for calibrating the zero scale line of the third scale line on the differential cylinder (11) and the width of the third scale line on the differential cylinder (11) of the micrometer (9); the range of the vertical scale line (15) is 0 to 0.30 mm; the range of the horizontal scale line (14) is -0.05 to 0.30 mm; The width between any two adjacent scale lines in the horizontal scale line (14) and the vertical scale line (15) is 0.01 mm; Fine lines are respectively connected between the 0.08 scale line and the 0.20 scale line, the 0.20 scale line and the 0.30 scale line, and the -0.05 scale line and the 0.10 scale line of the horizontal scale line (14); The magnifying member (1) is coaxially installed above the observation hole (13) for magnifying and observing the first scale line, the second scale line, the third scale line and the fourth scale line; The lapping cylinder (3) includes an observation window (31) and a cylinder body (32) connected to each other.

2. The micrometer scale calibrator according to claim 1, wherein: The magnifying member (1) is a 15-fold magnifying glass.

3. The micrometer scale calibrator according to claim 2, characterized in that: A slot (33) with a side opening is provided in the observation window (31) at the lower end of the lapping cylinder (3); The slot (33) communicates with the observation hole (13), and the scale plate (5) is inserted into the slot (33) from the outside and enters the observation hole (13).

4. The micrometer scale calibrator according to claim 1 or 2 or 3, characterized in that: The support further includes a hollow adjusting cylinder (2); The adjusting cylinder (2) is threadedly connected to the upper end of the lapping cylinder (3); The magnifying member (1) is arranged in the adjusting cylinder (2).

5. The micrometer scale calibrator according to claim 4, characterized in that: The support further includes a light source assembly; The light source assembly includes a light source (4), a switch (7) and a power supply (8); The light source (4) is installed inside the lapping cylinder (3); The switch (7) is arranged on the cylinder body (32) of the lapping cylinder (3) for controlling the switch of the light source (4); The power supply (8) is arranged on the cylinder body (32) of the lapping cylinder (3) for supplying power to the light source (4).

6. The micrometer scale calibrator according to claim 5, characterized in that: The lower end surface of the observation window (31) of the lap joint cylinder (3) is a concave cylindrical surface (6); the concave cylindrical surface (6) matches the large-end cylindrical surface of the differential cylinder (11) of the micrometer (9); Or the lower end surface of the observation window (31) of the lap joint cylinder (3) is a flat surface (16); the flat surface (16) contacts the scale surface of the scale micrometer in the micrometer (9).

7. A calibration method for micrometer graduations, characterized in that: Using the micrometer graduation calibrator described in claim 1, it includes the following steps: Step 1: Lap the micrometer graduation calibrator (12) on the micrometer (9); Step 2: Measure the micrometer (9) according to the inspection item 6 2.1) Measure and record the data of the second graduation line, where the second graduation line includes the longitudinal graduation line and the millimeter graduation line; Align the 0 graduation line of the horizontal graduation line (14) with the left end of any graduation line on the second graduation line, and at the same time observe the position of the right end of this graduation line on the horizontal graduation line (14), record the data and determine whether the graduation line width meets the requirements; 2.2) Measure and record the data of the third graduation line or the fourth graduation line Align the 0 graduation line of the vertical graduation line (15) with the left end of any graduation line on the third graduation line, and at the same time observe the position of the right end of this graduation line on the vertical graduation line (15), record the data and determine whether the graduation line width meets the requirements; Or align the 0 graduation line of the vertical graduation line (15) with the left end of any graduation line on the fourth graduation line, or align the 0 graduation line of the horizontal graduation line (14) with the left end of any graduation line on the fourth graduation line, and at the same time observe the position of the right end of this graduation line on the vertical graduation line (15) or the horizontal graduation line (14), record the data and determine whether the graduation line width meets the requirements; 2.3) Determine whether the graduation line width differences of the second graduation line, the third graduation line and the fourth graduation line meet the requirements 2.3.1) Repeat steps 2.1 and 2.2 multiple times and record the obtained data; 2.3.2) Subtract the minimum value from the maximum value of the data measured for the second graduation line, and determine whether the graduation line width difference of the second graduation line meets the requirements; Subtract the minimum value from the maximum value of the data measured for the third graduation line, and determine whether the graduation line width difference of the third graduation line meets the requirements; Subtract the minimum value from the maximum value of the data measured for the fourth graduation line, and determine whether the graduation line width difference of the fourth graduation line meets the requirements; Step 3: Measure the micrometer (9) according to the inspection item 9 After the lower limit adjustment of the micrometer (9) is correct, align the 0 graduation line on the third graduation line with the longitudinal graduation line of the second graduation line, and check whether the end face of the differential cylinder (11) is tangent to the right edge of the millimeter graduation line of the second graduation line of the fixed sleeve (10), record the data and determine whether it meets the determination standard requirements.

8. A micrometer graduation calibration method according to claim 7, characterized in that: The determination standard in step 2.1 is: If the graduation line width of the second graduation line on the fixed sleeve (10) of the micrometer (9) is within the range of 0.08 - 0.20 mm of the horizontal graduation line (14), it can be determined that the width of this graduation line meets the requirements; The judgment criterion in Step 2.2 is: If the engraved line width of the third scale line on the thimble (11) is within the range of 0.08 - 0.20 mm of the vertical scale line (15), it can be determined that the engraved line width meets the requirements; Or: If the engraved line width of the second scale line on the scale of the dial micrometer in the micrometer (9) is within the range of 0.20 - 0.30 mm of the horizontal scale line (14) or the vertical scale line (15), it can be determined that the engraved line width meets the requirements.

9. A micrometer scale calibration method according to claim 8, characterized in that: The judgment criterion in Step Three is; If the end face of the thimble (11) is tangent to the right edge of the millimeter engraved line of the second scale line of the fixed sleeve (10), the inspected item 9 meets the requirements; If not tangent, align the 0 scale line of the horizontal scale line (14) with the 0 scale line on the second scale line, and observe whether the end face of the thimble (11) is within the range of -0.05 - 0.10 mm. If so, it can be determined that the inspected item 9 meets the requirements.

10. A micrometer scale calibration method according to claim 9, characterized in that: In Step Two, at least three scale lines are randomly selected for inspection and measurement from the second scale line, the third scale line, and the fourth scale line.

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