Test assembly and method of forming and testing

Abstract

A test assembly includes a liquid crystal cell and two conductive substrates. The liquid crystal cell includes a first conductive layer and a second conductive layer disposed opposite each other, and a liquid crystal layer disposed between the first conductive layer and the second conductive layer. Each conductive substrate has a material layer on a surface thereof. The liquid crystal cell is disposed between the two conductive substrates in a separable manner, and the first conductive layer and the second conductive layer are in contact with the material layers on the conductive substrates, respectively.

Description

Technical Field

[0001] The present invention relates to a test assembly, a forming method thereof and a testing method thereof, and in particular to a test assembly with a reusable liquid crystal box, a forming method thereof and a testing method thereof. Background Art

[0002] Display devices have been widely used in daily life, including various portable or non-portable electronic products, workplace equipment, smart home appliances, transportation, or public purposes, to provide relevant information and / or interactive modes to enhance the convenience and fun of users in life and work.

[0003] For example, color liquid crystal displays (LCDs) employ color filters to produce a colorful display. These filters consist of photoresist layers of various colors, such as red, green, blue, and black. The optical properties of these filters play a crucial role in the optical display quality of color LCDs. Summary of the Invention

[0004] Liquid crystal display devices operate by adjusting brightness and darkness by rotating liquid crystal molecules in response to changes in applied voltage. However, when many materials in display devices come into contact with liquid crystal, precipitates or free electrons are released into the liquid crystal to a greater or lesser extent. These free electrons can affect the operation of the liquid crystal, causing the liquid crystal molecules to rotate insufficiently or excessively, leading to abnormal color rendering in the display device.

[0005] To avoid the aforementioned issues, voltage holding ratio (VHR) and ion density measurements are performed during the display device manufacturing process. However, prior to performing VHR measurements, test kits must be manufactured, and current test kits are both expensive and time-consuming to produce.

[0006] Some embodiments of the present invention provide a test assembly comprising a liquid crystal cell and two conductive substrates. The liquid crystal cell comprises a first conductive layer and a second conductive layer disposed opposite each other, and a liquid crystal layer disposed between the first and second conductive layers. Each conductive substrate has a material layer on one surface. The liquid crystal cell is detachably disposed between the two conductive substrates, with the first and second conductive layers respectively contacting the material layers on the conductive substrates.

[0007] Some embodiments of the present invention provide a method for forming a test component, including providing a liquid crystal box, the liquid crystal box including a first conductive layer and a second conductive layer arranged opposite to each other, and a liquid crystal layer arranged between the first conductive layer and the second conductive layer; providing two conductive substrates; forming a material layer by coating a surface of each conductive substrate; and arranging the liquid crystal box between the two conductive substrates, wherein the material layers of the two conductive substrates are in contact with the first conductive layer and the second conductive layer, respectively.

[0008] Some embodiments of the present invention provide a testing method for a test component, including providing a liquid crystal box, the liquid crystal box including a first conductive layer and a second conductive layer arranged opposite to each other, and a liquid crystal layer arranged between the first conductive layer and the second conductive layer; providing two conductive substrates; coating a material layer on a surface of each conductive substrate; arranging and fixing the liquid crystal box between the two conductive substrates, and the material layers on the two conductive substrates contact the first conductive layer and the second conductive layer respectively; applying a voltage difference between the two conductive substrates and measuring the voltage holding ratio; and after the measurement, taking the liquid crystal box out from between the two conductive substrates.

[0009] The present invention will be described in detail below with reference to the accompanying drawings and specific embodiments, but this does not limit the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0010] Figure 1A is a schematic cross-sectional view of a liquid crystal cell according to some embodiments of the present invention.

[0011] Figure 1B yes Figure 1A A top view of the liquid crystal box.

[0012] Figure 2 The present invention provides a method for manufacturing a liquid crystal cell according to some embodiments of the present invention.

[0013] Figures 3A to 3E It is a three-dimensional schematic diagram of a method for manufacturing a liquid crystal cell according to some embodiments of the present invention.

[0014] Figure 4 is a cross-sectional schematic diagram of a test assembly according to some embodiments of the present invention.

[0015] Figure 5 The present invention provides a method for manufacturing a test assembly according to some embodiments of the present invention.

[0016] Figures 6A to 6D It is a three-dimensional or cross-sectional schematic diagram of a method for manufacturing a test assembly according to some embodiments of the present invention.

[0017] Figure 7is a flowchart of a testing method for a testing component according to some embodiments of the present invention.

[0018] Figures 8A to 8E is a cross-sectional schematic diagram of a testing method for a testing component according to some embodiments of the present invention.

[0019] Figure 9 A cross-sectional view of a test assembly of a comparative example.

[0020] Figure 10 This is a schematic diagram showing the voltage change over time during voltage holding ratio (VHR) measurement.

[0021] Wherein, the reference numerals:

[0022] 1: LCD box

[0023] 4,9: Test components

[0024] 11: first conductive layer

[0025] 12: Second conductive layer

[0026] 111, 121: first surface

[0027] 112,122: Second surface

[0028] 14: Adhesive layer

[0029] 16,96: Liquid crystal layer

[0030] 161:Liquid crystal molecules

[0031] 31,91: first conductive substrate

[0032] 32,92: second conductive substrate

[0033] 33: third conductive substrate

[0034] 34: fourth conductive substrate

[0035] 41: First material layer

[0036] 42: Second material layer

[0037] 43: The third material layer

[0038] 44: Fourth material layer

[0039] 50: fixture

[0040] 912,922: Glass substrate

[0041] 914,924: Indium tin oxide (ITO) layer

[0042] 93,94:Alignment film

[0043] RS: Enclosed Space

[0044] 200,500,700:Method

[0045] S201, S202, S203, S204, S205, S501, S502, S503, S504, S701, S702, S703, S704, S705, S706: Steps

[0046] T11, T12, T14, T31, T32: thickness

[0047] Vi: Set voltage (starting voltage)

[0048] Vt: End voltage DETAILED DESCRIPTION

[0049] The structural principle and working principle of the present invention are described in detail below with reference to the accompanying drawings:

[0050] Some embodiments of the present invention provide a test component (test device), a method for forming the test component, and a test method thereof. The test component proposed in the embodiment includes a liquid crystal cell arranged between two conductive substrates, and a material layer to be tested is coated on the surface of each conductive substrate. The material layer is, for example, any photosensitive resin composition, which can be used as a material for a pixel layer in a display device, such as a photoresist material for a color filter of a color liquid crystal display device. According to the embodiment, this liquid crystal cell is reusable. The test component proposed in some embodiments can detect the voltage holding ratio (VHR) of the material (such as the photosensitive resin composition) contained in the material layer, and has good reliability. Through the test component proposed in the embodiment of this case, it is possible to quickly, accurately and inexpensively detect whether the composition of the material layer will affect the performance of the display device in subsequent applications (for example, whether it affects the rotation of the liquid crystal molecules, thereby affecting the display effect).

[0051] Various embodiments are presented below for detailed description. These embodiments are intended only as examples and do not limit the scope of the present invention. The present invention may be implemented using other features, components, methods, and parameters. These embodiments are provided only to illustrate the technical features of the present invention and are not intended to limit the scope of the present invention. Those skilled in the art will be able to make equivalent modifications and variations based on the following description without departing from the spirit of the present invention.

[0052] Figure 1A is a schematic cross-sectional view of a liquid crystal cell according to some embodiments of the present invention. Figure 1B yes Figure 1A The top view of the liquid crystal cell 1 is shown. The liquid crystal cell 1 includes a first conductive layer 11 and a second conductive layer 12 disposed opposite to each other, and an adhesive layer 14 disposed at the edges of the surfaces of the first conductive layer 11 and the second conductive layer 12. The liquid crystal cell 1 also includes a liquid crystal layer 16 disposed between the first conductive layer 11 and the second conductive layer 12. In this example, Figure 1A As shown, the liquid crystal layer 16 is disposed between the first surface 111 of the first conductive layer 11 and the first surface 121 of the second conductive layer 12. Figure 1B As shown, viewed from above the liquid crystal cell 1, the adhesive layer 14 surrounds the opposing surfaces of the first conductive layer 11 and the second conductive layer 12, and defines an enclosed space RS between the first conductive layer 11 and the second conductive layer 12. The liquid crystal molecules 161 of the liquid crystal layer 16 fill the enclosed space RS.

[0053] Figure 2 2 is a method 200 for manufacturing a liquid crystal cell according to some embodiments of the present invention. Figures 3A to 3E 2 is a perspective diagram of a method for manufacturing a liquid crystal cell according to some embodiments of the present invention. Figure 1A 、 Figure 1B Please also refer to the liquid crystal cell 1 shown. Figure 2 and Figures 3A to 3E .

[0054] In some embodiments, the method 200 includes step S201. Referring to step S201 and Figure 3A First, a first conductive layer 11 and a second conductive layer 12 are provided. The materials of the first conductive layer 11 and the second conductive layer 12 may include metal, conductive polymer, or any material with good conductivity. The first conductive layer 11 and the second conductive layer 12 may be the same material or different materials. For example, the first conductive layer 11 and the second conductive layer 12 may both be metal layers, both be conductive polymer layers, or one may be a metal layer or a conductive polymer layer and the other may be a non-polymer conductive material layer.

[0055] In one example, the first conductive layer 11 and the second conductive layer 12 are conductive polymer layers. The conductive polymer material is, for example, (but not limited to) a polymer comprising polystyrene sulfonate, such as poly(3,4-ethylenedioxythiophene):poly(styrenesulfonate); also known as PEDOT:PSS, or any other suitable conductive polymer, or a combination of the aforementioned conductive materials.

[0056] Next, in some embodiments, the method 200 includes step S202. Referring to step S202 and Figure 3B , wherein an adhesive layer 14 is coated on the edge of the surface of one of the first conductive layer 11 and the second conductive layer 12. In this example, the adhesive layer 14 is coated on the edge of the first surface 111 of the first conductive layer 11 ( Figure 3B The adhesive layer 14 may be, for example, one or more photocurable colloids or one or more thermosetting colloids. In one example, the adhesive layer 14 is a UV-curable adhesive, and materials thereof include, for example, acrylic adhesives, epoxy adhesives, urethane adhesives, polyester adhesives, polyvinyl alcohol adhesives, polyolefin adhesives, modified polyolefin adhesives, polyvinyl alkyl ether adhesives, rubber adhesives, vinyl chloride-vinyl acetate adhesives, SEBS (styrene-ethylene-butylene-styrene copolymer) adhesives, vinyl adhesives such as ethylene-styrene copolymers, acrylate adhesives such as ethylene-methyl (meth)acrylate copolymers and ethylene-ethyl (meth)acrylate copolymers, and the like.

[0057] Then, in some embodiments, the method 200 includes step S203. Figure 3C The first conductive layer 11 and the second conductive layer 12 are aligned, and the adhesive layer 14 is cured. For example, the adhesive layer 14 is irradiated with light or heated to achieve curing. The cured adhesive layer 14 seals and bonds the first conductive layer 11 and the second conductive layer 12, and defines a closed space between the first conductive layer 11 and the second conductive layer 12.

[0058] According to an embodiment, the first conductive layer 11 and the second conductive layer 12 each have a sufficient thickness to ensure that the subsequently fabricated liquid crystal cell 1 has a certain thickness, making it easy to remove and reuse. The thickness T11 of the first conductive layer 11 can be approximately the same as or different from the thickness T12 of the second conductive layer 12. Furthermore, while thicker first and second conductive layers 11 and 12 increase their reusability, excessive thickness can result in poor test sensitivity. Considering high reusability and good test sensitivity, the thickness T11 of the first conductive layer 11 and the thickness T12 of the second conductive layer 12 can range, for example (but not limited to), from 50 μm to 500 μm. In some examples, the thickness T11 ranges from 50 μm to 300 μm; in some examples, the thickness T11 ranges from 100 μm to 300 μm. In this example, the thickness T11 of the first conductive layer 11 and the thickness T12 of the second conductive layer 12 are approximately the same. Furthermore, in some embodiments, the cured adhesive layer 14 has a thickness T14 , which is smaller than the thickness T11 of the first conductive layer 11 and smaller than the thickness T12 of the second conductive layer 12 .

[0059] Next, in some embodiments, the method 200 includes step S204. Figure 3D , wherein the liquid crystal is filled between the first conductive layer 11 and the second conductive layer 12, for example, the liquid crystal molecules 161 are filled in the closed space RS between the first conductive layer 11 and the second conductive layer 12 by a syringe. Figure 1B Depending on the arrangement and structure of the liquid crystal molecules, the liquid crystal molecules 161 can be nematic, smectic, cholesteric, or discotic. The type of liquid crystal molecules 161 filled in the liquid crystal cell 1 can be selected based on the liquid crystal type of the display device to be used after the material layer to be tested (e.g., the photosensitive resin composition). In one example, the liquid crystal molecules 161 are (but not limited to) twisted nematic (TN) liquid crystals.

[0060] Then, in some embodiments, the method 200 includes step S205. Figure 3E After the liquid crystal 161 is injected, a liquid crystal layer 16 can be formed between the first conductive layer 11 and the second conductive layer 12, and the Figure 3E The liquid crystal cell 1 is shown as an example.

[0061] While the above describes a method for fabricating the liquid crystal cell 1, other steps or processes for fabricating the liquid crystal cell 1 may also be applied. For example, in some other embodiments, the first conductive layer 11 and the second conductive layer 12 may be aligned, the liquid crystal molecules 161 may be injected, and the adhesive layer 14 may be used to seal the gap. Alternatively, the liquid crystal molecules 161 may be dripped onto the first conductive layer 11, the second conductive layer 12 may be aligned with the first conductive layer 11, and the adhesive layer 14 may be cured.

[0062] In the preparation Figure 1A 、 Figure 1B After the liquid crystal cell 1 is shown, a test device of the embodiment can be formed.

[0063] Figure 4 FIG4 is a schematic cross-sectional view of a test assembly 4 according to some embodiments of the present invention. The test assembly 4 of the embodiment includes a liquid crystal cell 1 and two conductive substrates located on the upper and lower sides of the liquid crystal cell 1. Each conductive substrate has a material layer coated on a surface adjacent to the liquid crystal cell 1, and these material layers are in contact with the conductive layer of the liquid crystal cell.

[0064] In this example, if Figure 4 As shown, a test component 4 includes Figure 1A The illustrated embodiment includes a liquid crystal cell 1, a first conductive substrate 31, a first material layer 41 disposed on a surface of the first conductive substrate 31, a second conductive substrate 32, and a second material layer 42 disposed on a surface of the second conductive substrate 32. The first material layer 41 contacts the first conductive layer 11 of the liquid crystal cell 1, and the second material layer 42 contacts the second conductive layer 12 of the liquid crystal cell 1. For example, the surface of the first material layer 41 directly contacts the entire second surface 112 of the first conductive layer 11 of the liquid crystal cell 1, and the surface of the second material layer 42 directly contacts the entire second surface 122 of the second conductive layer 12 of the liquid crystal cell 1.

[0065] According to some embodiments, the first conductive substrate 31 and the second conductive substrate 32 on the upper and lower sides of the liquid crystal cell 1 may include metal or any other material with good electrical conductivity.

[0066] According to some embodiments, the first material layer 41 on the surface of the first conductive substrate 31 and the second material layer 42 on the surface of the second conductive substrate 32 may include a photosensitive resin composition.

[0067] According to some embodiments, the material layers of the two conductive substrates are physically isolated from the liquid crystal layer 16 of the liquid crystal cell 1. Figure 4 As shown, the first material layer 41 on the first conductive substrate 31 is physically isolated from the liquid crystal layer 16 by the first conductive layer 11 , and the second material layer 42 on the second conductive substrate 32 is physically isolated from the liquid crystal layer 16 by the second conductive layer 12 .

[0068] According to some embodiments, the liquid crystal box 1 is detachably disposed between the first conductive substrate 31 and the second conductive substrate 32. Specifically, the liquid crystal box 1 is detachably disposed between the first material layer 41 and the second material layer 42. In other words, in the test assembly 4 of some embodiments, the first conductive layer 11 and the second conductive layer 12 of the liquid crystal box 1 are not bonded to the first material layer 41 and the second material layer 42. In some implementations, the first conductive substrate 31 and the second conductive substrate 32, as well as the liquid crystal box 1 located between the two conductive substrates, can be fixed by an external mechanical device, such as a clamping fixture or any clamping member or holding apparatus with a fixing function, so that the material layer (such as the first material layer 41 and the second material layer 42) can directly contact the conductive layer (such as the first conductive layer 11 and the second conductive layer 12) of the entire surface of the liquid crystal box 1. Therefore, as Figure 4As shown, there is no adhesive layer between the liquid crystal box 1 and the material layers (such as the first material layer 41 and the second material layer 42) disposed on the surfaces of the two conductive substrates, so that the liquid crystal box 1 can be easily and quickly removed after testing the material layer, and this liquid crystal box 1 can be reused to detect other material layers to be tested.

[0069] Figure 5 A method 500 of manufacturing a test assembly according to some embodiments of the present invention is provided. Figures 6A to 6D 5 is a three-dimensional or cross-sectional diagram of a method for manufacturing a test assembly according to some embodiments of the present invention. Figure 4 Test assembly 4 shown. Please also refer to Figure 5 and Figures 6A to 6D .

[0070] In some embodiments, as Figure 5 The method 500 shown includes step S501. Figure 6A First, a liquid crystal cell 1 is provided. Figure 1A The structural details and exemplary compositions of the components of the illustrated liquid crystal cell 1, such as the first conductive layer 11, the second conductive layer 12, the adhesive layer 14, and the liquid crystal layer 16, can be found above and will not be repeated here.

[0071] In some embodiments, as Figure 5 The method 500 shown includes step S502. Figure 6B , wherein two conductive substrates are provided, and a material layer is formed on one surface of each conductive substrate. In this example, a first material layer 41 is formed on the surface of a first conductive substrate 31, and a second material layer 42 is formed on the surface of a second conductive substrate 32.

[0072] According to some embodiments, the first conductive substrate 31 and the second conductive substrate 32 may comprise metal or any other material with good electrical conductivity. For example, the first conductive substrate 31 and the second conductive substrate 32 may be a metal substrate, a conductive carbon-based substrate, a conductive ceramic substrate, or a conductive polymer substrate.

[0073] Furthermore, the first conductive substrate 31 and the second conductive substrate 32 can be made of the same material or different materials. For example, in some examples, the first conductive substrate 31 and the second conductive substrate 32 are both metal substrates, both conductive carbon-based substrates, both conductive ceramic substrates, or both conductive polymer substrates. Alternatively, in one example, one of the first conductive substrate 31 and the second conductive substrate 32 is a metal substrate, and the other is one of the aforementioned example substrates other than the metal substrate. Alternatively, in another example, one of the first conductive substrate 31 and the second conductive substrate 32 is a conductive ceramic substrate, and the other is one of the aforementioned example substrates other than the conductive ceramic substrate. Alternatively, in yet another example, one of the first conductive substrate 31 and the second conductive substrate 32 is a conductive polymer substrate, and the other is one of the aforementioned example substrates other than the conductive polymer substrate. In one example, the first conductive substrate 31 and the second conductive substrate 32 are both indium tin oxide (ITO) substrates, which are highly conductive and transparent.

[0074] Furthermore, the thickness T31 of the first conductive substrate 31 can be substantially the same as or different from the thickness T32 of the second conductive substrate 32. The thickness T31 of the first conductive substrate 31 and the thickness T32 of the second conductive substrate 32 may range from, for example (but not limited to), 100 nm to 1000 nm. In some examples, the thickness T31 ranges from 100 nm to 500 nm. In this example, the thickness T31 of the first conductive substrate 31 and the thickness T32 of the second conductive substrate 32 are substantially the same.

[0075] Furthermore, in some embodiments, the thickness T11 of the first conductive layer 11 and the thickness T12 of the second conductive layer 12 of the liquid crystal cell 1 may be greater than the thickness T31 of the first conductive substrate 31 and the thickness T32 of the second conductive substrate 32. The liquid crystal cell 1 having a certain thickness can be easily removed from between the first conductive substrate 31 and the second conductive substrate 32 and reused.

[0076] Then, in some embodiments, as Figure 5 The method 500 shown includes step S503. Figure 6C , wherein the liquid crystal cell 1 is disposed between the first conductive substrate 31 and the second conductive substrate 32, and the material layers on the surfaces of the two conductive substrates face the liquid crystal cell 1 and contact the liquid crystal cell 1. Figure 6CAs shown, the first material layer 41 is in direct contact with the first conductive layer 11 of the liquid crystal cell 1, and the second material layer 42 is in direct contact with the second conductive layer 12 of the liquid crystal cell 1. Note that according to the test assembly of the embodiment, the first material layer 41 does not directly contact the liquid crystal layer 16 in the liquid crystal cell 1, being physically isolated by the first conductive layer 11 in between. The second material layer 42 also does not directly contact the liquid crystal layer 16 in the liquid crystal cell 1, being physically isolated by the second conductive layer 12 in between. Therefore, after the test assembly 4 performs relevant tests, the liquid crystal layer 16 in the liquid crystal cell 1 will not be contaminated by the materials of the first material layer 41 and the second material layer 42, and can be reused.

[0077] In some embodiments, as Figure 5 The method 500 shown includes step S504. Figure 6D , wherein the relevant components of the test assembly 4 are fixed, such as the liquid crystal box 1, the first material layer 41, the first conductive substrate 31, the second material layer 42 and the second conductive substrate 32. After the fixing is completed, the test assembly 4 can be prepared for relevant tests, such as the measurement of the voltage holding ratio. In this example, an external clamping device, such as a clamp 50 (which can be a binder clip, an alligator clip, or any fixing member with a clamping function) is provided to fix the two conductive substrates (i.e., the first conductive substrate 31 and the second conductive substrate 32), the two material layers (i.e., the first material layer 41 and the second material layer 42), and the liquid crystal box 1 located between the two material layers, so that the liquid crystal box 1 and the material layers on the upper and lower conductive substrates can be in direct contact with the entire surface without gaps.

[0078] Furthermore, the first material layer 41 on the surface of the first conductive substrate 31 and the second material layer 42 on the surface of the second conductive substrate 32 include, for example, a photosensitive resin composition. Photosensitive resin compositions are, for example, photoresist materials used in color liquid crystal display devices, such as red, green, and blue photoresist materials, to fabricate color filters. According to some embodiments, the first material layer 41 and the second material layer 42 in the test assembly 4 may include photosensitive resin compositions of the same composition to test whether free electrons released by the photosensitive resin compositions under an applied voltage adversely affect the rotation of liquid crystals (e.g., liquid crystal molecules 161 of the liquid crystal cell 1).

[0079] Furthermore, in some embodiments, the first material layer 41 and the second material layer 42 of the test assembly 4 may include photosensitive resin compositions of the same color. For example, the first material layer 41 and the second material layer 42 may both be red photosensitive resin compositions, green photosensitive resin compositions, or blue photosensitive resin compositions.

[0080] The following examples provide compositions of photosensitive resin compositions that can be used in display devices as photoresist layers for color filters. However, the present invention is not limited to the compositions shown below.

[0081] <Photosensitive Resin Composition>

[0082] In some embodiments, the photosensitive resin composition includes a colorant, an alkali-soluble resin, a polymerizable unsaturated compound, a photopolymerization initiator, and a solvent.

[0083] Coloring agents include, for example, red coloring agents, yellow coloring agents, blue coloring agents, green coloring agents, white coloring agents, etc. Red coloring agents may include diketopyrrolopyrrole pigments, anthraquinone pigments, or above-mentioned combinations, or other suitable substances. Green coloring agents may include halogenated phthalocyanine pigments, or other suitable substances. Blue coloring agents may include phthalocyanine pigments, or other suitable substances. Yellow coloring agents may include azomethine pigments, quinophthalein copper pigments, or above-mentioned combinations, or other suitable substances.

[0084] The colorant may include a pigment, for example, a red pigment such as CI Pigment Red 9, CI Pigment Red 97, CI Pigment Red 105, CI Pigment Red 122, CI Pigment Red 123, CI Pigment Red 144, CI Pigment Red 149, CI Pigment Red 166, CI Pigment Red 168, CI Pigment Red 175, CI Pigment Red 176, CI Pigment Red 177, CI Pigment Red 180, CI Pigment Red 192, CI Pigment Red 209, CI Pigment Red 215, CI Pigment Red 216, CI Pigment Red 224 , CI Pigment Red 242, CI Pigment Red 254, CI Pigment Red 255, CI Pigment Red 264, CI Pigment Red 265, CI Pigment Red 291,; Yellow pigments such as CI Pigment Yellow 3, CI Pigment Yellow 12, CI Pigment Yellow 13, CI Pigment Yellow 14, CI Pigment Yellow 15, CI Pigment Yellow 16, CI Pigment Yellow 17, CI Pigment Yellow 20, CI Pigment Yellow 24, CI Pigment Yellow 31, CI Pigment Yellow 53, CI Pigment Yellow 83, CI Pigment Yellow 86, CI Pigment Yellow 93, CI Pigment Yellow 94, CI Pigment Yellow 109, CI Pigment Yellow 110, CI Pigment Yellow 117, CI Pigment Yellow 125, CI Pigment Yellow 128, CI Pigment Yellow 137, CI Pigment Yellow 138, CI Pigment Yellow 139, CI Pigment Yellow 147, CI Pigment Yellow 148, CI Pigment Yellow 150, CI Pigment Yellow 153, CI Pigment Yellow 154, CI Pigment Yellow 166, CI Pigment Yellow 173, CI Pigment Yellow 185, CI Pigment Yellow 194, CI Pigment Yellow 214; blue pigments such as C CI Pigment Blue 15, CI Pigment Blue 15:3, CI Pigment Blue 15:4, CI Pigment Blue 15:6, CI Pigment Blue 16, CI Pigment Blue 60, CI Pigment Blue 80; green pigments such as CI Pigment Green 7, CI Pigment Green 36, CI Pigment Green 58, and CI Pigment Green 59; white pigments such as strontium titanate (SrTiO3), titanium dioxide, calcium carbonate, calcium sulfate, zinc oxide, barium sulfate, barium carbonate, silicon dioxide, aluminum hydroxide, magnesium carbonate, white hollow polymer microspheres; or any combination thereof. In some embodiments, octahedral metal oxide particles are materials similar to white pigments, such as titanium dioxide octahedral metal oxide particles, which can also serve as white colorants. In some embodiments, the pigments can be used alone or in combinations of two or more to increase color purity.

[0085] Coloring agent can comprise dyestuff, for example red dye, yellow dye, blue dye, green dye etc.Available dyestuff in the embodiment is not particularly limited, can use known dyestuff, for example can enumerate solvent dyes, acid dyes, direct dyes, mordant dye etc.As dyestuff, for example can enumerate the known dyestuff of recording in the compound, the dyeing notes (color dyeing society) that are classified as the material of tone beyond pigment in color index (The Society of Dyers and Colourists publishes).In addition, according to chemical structure, can enumerate azo dyes, cyanine dyes, triphenylmethane dyes, xanthene dyes, phthalocyanine dyes, naphthoquinone dyes, quinoneimine dyes, methine dyes, azomethine dyes, square acid dyes, acridine dyes, styryl dyes, coumarin dyes, cyanine dyes, anthraquinone dyes, azo dyes, square acid cyanine dyes, dipyrromethene dyes, quinoline dyes, porphyrin dyes, quinoline dyes and nitro dyes etc.

[0086] In some embodiments, the alkali-soluble resin of the colorant resin composition may include a resin monomer unit and a silane-based monomer unit, wherein the resin monomer unit contains an unsaturated double bond and / or an epoxy group.

[0087] In some embodiments, the alkali-soluble resin of the colorant resin composition may have an alkane or cycloalkane side chain structure, and the side chain structure may include an acid branch functional group or an unsaturated bond.

[0088] In some embodiments, the alkali-soluble resin of the colorant resin composition may include, but is not limited to, a (meth)acrylic acid-derived structural unit. In some embodiments, the alkali-soluble resin may include a carboxylic acid-unsaturated monomer, a copolymer of a carboxylic acid-unsaturated monomer and an ethylene-unsaturated monomer, or a combination thereof. For example, according to some embodiments, the carboxylic acid-unsaturated monomer may be selected from acrylic acid (AA) compounds, methacrylic acid compounds, or a combination thereof. According to some embodiments, the ethylenically unsaturated monomer may be selected from methyl acrylate, methyl methacrylate, benzyl acrylate, benzyl methacrylate, ethyl acrylate, ethyl methacrylate, 2-hydroxyethyl acrylate, 2-hydroxyethyl methacrylate, hydroxylpropyl acrylate, hydroxylpropyl methacrylate, isobutyl methacrylate, isobutyl methacrylate, ethylene glycol dimethacrylate, 1,4-butanediol diacrylate, 1,6-diol diacrylate, 1,7-diol diacrylate, 1,8-diol diacrylate, 1,9-diol diacrylate, 2,10-diol diacrylate, 2,11-diol diacrylate, 2,12-diol diacrylate, 2,13-diol diacrylate, 2,14-diol diacrylate, 2,15-diol diacrylate, 2,16-diol diacrylate, 2,17-diol diacrylate, 2,18-diol diacrylate, 2,19-diol diacrylate, 2,19-diol diacrylate, 2,18-diol diacrylate, 24butanediol diacrylate, diethyleneglycol diacrylate, pentaerythritol triacrylate, ethoxylated pentaerythritol tetraacrylate, ethoxylated trimethoxylated trimethylpropane triacrylate, dipentaerythritol pentaacrylate, pentaerythritol tetraacrylate, dipentaerythritol hexaacrylate, dihydrodicyclopentadienyl acrylate (DCPA), epoxy dicyclopentenyl acrylate (EDCPA), methacrylic acid (methacrylic acid), N-phenylmaleimide (N-benzyl maleimide), tricyclodecyl methacrylate (tricyclodecylmethacrylate), vinyl toluene (vinyl toluene) toluene), N-cyclohexylmaleimide, 2-ethylhexyl acrylate, glycidyl methacrylate, cyclohexyl methacrylate (cyclohexyl methacrylate), or combination of methacrylate tert-butyl ester. According to some embodiments, the alkali-soluble resin may be a resin in combination of monomeric EDCPA and monomeric AA. ,

[0089] According to some embodiments, the polymerizable unsaturated compound of the photosensitive resin composition may be a monomer polymerized by active radicals and / or acids produced by the photopolymerization initiator, such as, but not limited to, polymerizable ethylene unsaturated bonds, such as (meth)acrylate compounds.

[0090] In some embodiments, the polymerizable unsaturated compound is, for example, a photopolymerizable monomer, which may include but is not limited to at least one selected from the group consisting of: polymerizable compounds having one ethylenically unsaturated bond, such as nonylphenyl carbitol acrylate, 2-hydroxy-3-phenoxypropyl acrylate, 2-ethylhexyl carbitol acrylate, 2-hydroxyethyl acrylate, and N-vinyl pyrrolidone; polymerizable compounds having two ethylenically unsaturated bonds, such as 1,6-hexanediol di(meth)acrylate, ethylene glycol di(meth)acrylate, neopentyl glycol di(meth)acrylate, triethylene glycol di(meth)acrylate, bis(acryloyloxyethyl) ether of bisphenol A, and 3-methylpentanediol di(meth)acrylate; and polymerizable compounds having trimethylolpropane tri(meth)acrylate, pentaerythritol tri(meth)acrylate, and the like. The present invention also provides a polymerizable compound having three ethylenically unsaturated bonds, such as acrylate, pentaerythritol tetra(meth)acrylate, dipentaerythritol penta(meth)acrylate, dipentaerythritol hexa(meth)acrylate, tripentaerythritol octa(meth)acrylate, tripentaerythritol hepta(meth)acrylate, tripentaerythritol octa(meth)acrylate, four pentaerythritol deca(meth)acrylate, four pentaerythritol nona(meth)acrylate, tris(2-(meth)acryloyloxyethyl)isocyanate, ethylene glycol-modified pentaerythritol tetra(meth)acrylate, ethylene glycol-modified dipentaerythritol hexa(meth)acrylate, propylene glycol-modified pentaerythritol tetra(meth)acrylate, propylene glycol-modified dipentaerythritol hexa(meth)acrylate, caprolactone-modified pentaerythritol tetra(meth)acrylate, and caprolactone-modified dipentaerythritol hexa(meth)acrylate. In some embodiments, the polymerizable unsaturated compound is, for example, a compound having an ethylenically unsaturated double bond. In some embodiments, the polymerizable unsaturated compound is, for example, a polymerizable compound having three ethylenically unsaturated double bonds.

[0091] Examples of commercially available polymerizable unsaturated compounds include KAYARAD (registered trademark) DPHA (Nippon Kayaku Co., Ltd.) and "A-TMM-3LM-N" (pentaerythritol triacrylate; Shin-Nakamura Chemical Industry Co., Ltd.).

[0092] In some embodiments, the photopolymerization initiator of the photosensitive resin composition may include, but is not limited to, at least one selected from the group consisting of: O-acyloxime compounds, alkylphenyl ketone compounds, bisimidazole compounds, triazine compounds, acylphosphine oxides, benzoin compounds, diphenyl ketone compounds, quinone compounds, 10-butyl-2-chloroacridone, benzyl, methyl phenylformate, acetophenone, and titanium cyclopentadienyl compounds.

[0093] In some embodiments, the photopolymerization initiator preferably comprises at least one selected from the group consisting of: O-acyl oxime compounds, alkyl phenyl ketone compounds, bisimidazole compounds, acetophenone compounds, triazine compounds, acylphosphine oxide compounds, and bisimidazole compounds. For example, when an O-acyl oxime compound is used as the photopolymerization initiator (D), OXE-01 (BASF), Commercially available products include OXE-02 (from BASF) and N-1919 (from ADEKA).

[0094] In some embodiments, the solvent of the photosensitive resin composition may include, but is not limited to, at least one selected from the group consisting of: ester solvents (herein, solvents containing -COO- but not -O- in the molecule), ether solvents (herein, solvents containing -O- but not -COO- in the molecule), ether ester solvents (herein, solvents containing -COO- and -O- in the molecule), ketone solvents (herein, solvents containing -CO- but not -COO- in the molecule), alcohol solvents (herein, solvents containing OH but not -O-, -CO-, and -COO- in the molecule), aromatic hydrocarbon solvents, amide solvents, dimethyl sulfoxide, etc.

[0095] In addition, in some embodiments, the photosensitive resin composition may further include appropriate amounts of other additives, such as other polymer compounds, curing agents, tackifiers, UV absorbers, etc., according to application requirements.

[0096] Furthermore, according to some embodiments of the present invention, a testing method for a testing component is provided. The following example is used to illustrate some stages of one of the testing methods of the present invention.

[0097] Figure 7 is a flowchart of a testing method 700 for testing a component according to some embodiments of the present invention. Figures 8A to 8E 700 is a cross-sectional diagram of a test method for a test component according to some embodiments of the present invention. Figure 1A 、 Figure 1B The liquid crystal cell 1 shown is used to test different material layers. Please also refer to Figure 7 and Figures 8A to 8E .

[0098] In some embodiments, as Figure 7 The test method 700 shown includes step S701. Figure 8A , providing a liquid crystal cell. Can be made and used as Figure 1A 、 Figure 1BThe liquid crystal cell 1 shown. The structural details and exemplary compositions of the components of the liquid crystal cell 1, such as the first conductive layer 11, the second conductive layer 12, the adhesive layer 14 and the liquid crystal layer 16, can be found in the above description and will not be repeated here.

[0099] In some embodiments, as Figure 7 The test method 700 shown includes step S702. Figure 8B , wherein two conductive substrates (e.g., first conductive substrate 31 and second conductive substrate 32) are provided, and a material layer is coated on one surface of each conductive substrate (e.g., first material layer 41 and second material layer 42). The structural details and exemplary compositions of the conductive substrates and the material layers can be found above and are not repeated here.

[0100] In some embodiments, as Figure 7 The test method 700 shown further includes step S703. Figure 8C , wherein the liquid crystal cell 1 is disposed and secured between two conductive substrates, and the material layers of the two conductive substrates are in contact with the two conductive layers of the liquid crystal cell, respectively. For example, the first material layer 41 on the first conductive substrate 31 is in direct contact with the first conductive layer 11 of the liquid crystal cell 1, and the second material layer 42 on the second conductive substrate 32 is in direct contact with the second conductive layer 12 of the liquid crystal cell 1. Furthermore, an external clamping device, such as a clamp 50, is used to secure the liquid crystal cell 1 between the two conductive substrates.

[0101] In some embodiments, as Figure 7 The test method 700 shown further includes step S704. Figure 8C , wherein a voltage difference can be applied between the first conductive substrate 31 and the second conductive substrate 32 to perform relevant measurements, such as voltage holding ratio (VHR) measurement. In the voltage holding ratio test, it can be measured whether the composition of the first material layer 41 and the second material layer 42 (such as a photosensitive resin composition) releases free electrons and moves through the first conductive layer 11 and the second conductive layer 12 of the liquid crystal cell 1, thereby affecting the rotation of the liquid crystal molecules 161. Furthermore, in this example, if Figure 8C As shown in the cross-section, the first conductive substrate 31 and the second conductive substrate 32 are arranged in a left-right offset manner relative to the liquid crystal box 1, so that a fixture 50 (such as a binder clip) that cooperates with the machine can be clamped to facilitate the measurement of the voltage holding ratio (VHR).

[0102] In some embodiments, as Figure 7 The test method 700 shown includes step S705. Figure 8D, wherein after the above-mentioned measurement is completed, the liquid crystal cell 1 is removed from between the two conductive substrates. In this example, for example, the clamp 50 is removed, so that the liquid crystal cell 1 can be separated from the two conductive substrates (e.g., the first conductive substrate 31 and the second conductive substrate 32). Specifically, the liquid crystal cell 1 is separated from the first material layer 41 on the first conductive substrate 31, and from the second material layer 42 on the second conductive substrate 32. Thereafter, the liquid crystal cell 1 is removed. In an example in which a binder clip is used as the clamp 50, after the measurement is completed, the binder clip can be loosened and removed, and then the upper and lower conductive substrates (e.g., the second conductive substrate 32 and the first conductive substrate 31) and the material layers (e.g., the second material layer 42 and the first material layer 41) can be peeled off to remove the liquid crystal cell 1.

[0103] In some embodiments, as Figure 7 The test method 700 shown includes step S706. Figure 8E , wherein the liquid crystal cell 1 can be reused and combined with two other conductive substrates having other material layers on their surfaces to perform relevant measurements. In this example, two other conductive substrates are provided, such as a third conductive substrate 33 and a fourth conductive substrate 34, and each of these two conductive substrates is coated with a material layer (such as a third material layer 43 and a fourth material layer 44). Then, operations similar to steps S703 to S705 are performed.

[0104] In this example, if Figure 8E As shown, a third conductive substrate 33 and a fourth conductive substrate 34 are provided, each coated with a third material layer 43 and a fourth material layer 44. The third material layer 43 faces and is in direct contact with the first conductive layer 11 of the liquid crystal cell 1, while the fourth material layer 44 faces and is in direct contact with the second conductive layer 12 of the liquid crystal cell 1. After being secured with a fixture 50, a voltage holding ratio (VHR) measurement is performed, for example. The voltage holding ratio test can measure whether the composition of the third material layer 43 and the fourth material layer 44 (e.g., a photosensitive resin composition different from the composition of the first material layer 41 and the second material layer 42) releases free electrons, which migrate through the first conductive layer 11 and the second conductive layer 12 of the liquid crystal cell 1, thereby affecting the rotation of the liquid crystal molecules 161.

[0105] To make the above and other objects, features, and advantages of the present invention more clearly understood, the following text specifically cites several test assemblies of embodiments and comparative examples as examples. The voltage holding ratio (VHR) of material layers (e.g., photosensitive resin compositions) in these test assemblies is measured. The reliability of the voltage holding ratio (VHR) measurements using the test assemblies proposed in the embodiments is then analyzed and evaluated.

[0106] In addition, the sample preparation used in the relevant experiments, such as the preparation method of the liquid crystal box and the conductive substrate in the test assembly of the embodiment, and the sample preparation of the test assembly of the comparative example, are briefly described as follows.

[0107] <Preparation of Liquid Crystal Cell>

[0108] In the test assembly of the embodiment, the structure of the liquid crystal cell 1 is as follows Figure 1A 、 Figure 1B The prepared liquid crystal cell 1 can be reused to detect material layers (such as photosensitive resin compositions) on different conductive substrates.

[0109] In the experiment, two conductive film layers were formed using conductive polymers to serve as the first conductive layer 11 and the second conductive layer 12 of the liquid crystal cell 1. One feasible (but non-limiting) method for preparing the conductive film layers is as follows.

[0110] Prepare a PEDOT / PSS resin material (conductive polymer). To synthesize it, first add 0.15 mg of 2,5-dibromo-3,4-ethylenedioxythiophene (DBEDOT) to 0.3 ml of methanol solution and stir evenly. Then, add 0.2 g of polystyrenesulfonate (PSS) and stir evenly. Next, polymerize the mixture on a hotplate at 120°C for 20 minutes. After completion, dissolve the polymerized PEDOT / PSS in pure water, add methanol, stir, and vacuum filter. Next, bake the filtered product in a vacuum oven at 45°C to obtain the resin material.

[0111] In addition to preparing it yourself, you can also directly purchase PEDOT / PSS resin materials, such as polystyrene sulfonate (containing PEDOT / PSS) manufactured by Taiwan Fluoro Technology, trade name TF-67A02.

[0112] Prepare or purchase a conductive polymer PEDOT:PSS resin material and spin-coat it onto glass to form a 100μm thick conductive film. Then, bake it at 80°C for 20 minutes to solidify it. Then, peel the solidified conductive film off the glass and cut it into 2.5cm×1.5cm pieces (as shown in the following example). Figure 1A Then, a UV curing adhesive with a thickness of about 10 μm is applied to the four sides of the cut conductive film, and the two conductive films are placed together and exposed to 1000 mJ in an exposure machine to cure the UV curing adhesive (forming a film as shown). Figure 1A 、 Figure 1BThen, the liquid crystal is injected into the gap between the two conductive films by syringe injection. After the liquid crystal is filled, a reusable liquid crystal box (such as Figure 1A 、 Figure 1B The liquid crystal cell 1 shown).

[0113] In the samples of the experimental example, the material of the ultraviolet curing adhesive used was SEKISUI Photolec A-780-180.

[0114] In the samples of the experimental example, the liquid crystal cell is filled with twisted nematic (TN) liquid crystal.

[0115] <Preparation of Test Components of Examples>

[0116] The structure of the test component 4 of the embodiment is as follows Figure 4 As shown. On multiple conductive substrates (such as Figure 4 A material layer to be tested (e.g., a photosensitive resin composition) is prepared on the first conductive substrate 31 and the second conductive substrate 32 shown. The aforementioned liquid crystal cell 1 (which can be reused) is placed between the material layers on the two conductive substrates to form the test assembly 4 of the embodiment.

[0117] First, a substrate with an ITO layer (referred to as an ITO substrate) is used as a conductive substrate. A colored photosensitive resin composition is applied to the ITO substrate by spin coating to a thickness of 1 μm to 3 μm. Next, after exposure and development, the photosensitive resin composition is cured by baking at 230°C for 20 minutes. After curing, two ITO substrates coated with the photosensitive resin composition are placed with the surface of the photosensitive resin composition facing the liquid crystal cell prepared above. The liquid crystal cell is positioned between the conductive substrates and secured with a fixture. This completes the test assembly of one embodiment, allowing for voltage holding ratio (VHR) measurements in related experiments.

[0118] After a set of samples has been measured, the liquid crystal cell of the test component can be taken out (e.g. Figure 8D ), and reused on other groups of samples (as shown in Figure 8E The third material layer 43 on the third conductive substrate 33 and the fourth material layer 44 on the fourth conductive substrate 34 are shown), and then the voltage holding ratio (VHR) is measured.

[0119] <Preparation of Test Component of Comparative Example>

[0120] In this experiment, a conventional test assembly was used as a comparative test assembly. The conventional test assembly was prepared as follows.

[0121] After coating the glass with a colored photosensitive resin composition, it is exposed, developed, and cured by baking at 230°C for 20 minutes. Next, the photosensitive resin composition is scraped off with a scraper to form a powder. This powder is then mixed with liquid crystal in a weight ratio of 1:40. The mixture of the photosensitive resin composition powder and liquid crystal is then placed at a temperature of 100°C to 150°C for 1 to 3 hours. The liquid crystal and photosensitive resin composition powder are then separated by centrifugation for approximately 0.5 to 2 hours. Next, the clear liquid from the upper layer of the centrifuge tube is injected into the space between the ITO layers (an empty test assembly). Once the clear liquid fills the space, the opening of the test assembly is sealed with a UV-curable adhesive. Once the internal solution is confirmed to not leak, a conventional test assembly is obtained.

[0122] Figure 9 It is a cross-sectional view of a test component 9 of a comparative example. This test component 9 includes a first conductive substrate 91 and a second conductive substrate 92, and an upper and lower alignment films 93, 94 (for example, polyimide (PI)) and a liquid crystal layer 96 located between the first conductive substrate 91 and the second conductive substrate 92. The conductive substrate 91 / 92 includes, for example, a glass substrate 912 / 922 and an ITO layer 914 / 924. Among them, the liquid crystal layer 96 is in direct contact with the alignment films 93, 94, rather than with the conductive substrates 91, 92. Furthermore, in addition to liquid crystal molecules, the liquid crystal layer 96 also contains free electrons released by heating the photosensitive resin composition (also known as deterioration treatment), so the liquid crystal molecules of the liquid crystal layer 96 are not separated from the photosensitive resin composition to be tested. Therefore, it is impossible to reuse such as Figure 9 The test assembly 9 is shown to test different photosensitive resin compositions.

[0123] <Voltage Holding Ratio (VHR)>

[0124] In this experiment, the voltage holding ratio (VHR) of the test assemblies of the embodiment and the comparative example was tested.

[0125] To measure the voltage holding ratio (VHR), first connect the device electrodes to the electrodes of the test assembly of the embodiment / comparative example (i.e., the first conductive substrates 31, 91 and the second conductive substrates 32, 92 described above; there is no distinction between positive and negative polarity). Then, set the voltage and frequency in the program. Once these settings are complete, measurement can begin. Figure 10 This is a schematic diagram showing the voltage changes over time when measuring the voltage holding ratio (VHR). Figure 10 As shown in Figure 1, Vi is the set voltage, which is also the starting voltage, and Vt is the ending voltage. The set frequency is 1 / Hz. The voltage holding ratio (VHR) is calculated as follows:

[0126] Voltage holding ratio (%) = (end voltage (Vt) / start voltage (Vi))*100% ... Formula (1).

[0127] Generally speaking, the electric field generated by an applied voltage not only causes liquid crystal molecules to rotate, but also causes the liquid crystal material to dissociate and release ions. Free electrons from other material layers (such as alignment layers or photoresist layers) may also be injected into the liquid crystal layer. The presence of free electrons significantly impacts the display quality of liquid crystal displays, contributing to reduced voltage holding ratio and image sticking. Free electrons also reduce the contrast of displays.

[0128] Therefore, when these free electrons are present within the liquid crystal material, the liquid crystal material, which originally has an extremely high resistance and is close to being an insulator, will be unable to maintain the voltage at the peak value of the applied voltage pulse (i.e., the starting voltage Vi) until the next pulse input arrives. Therefore, the measured ending voltage Vt will be lower than the starting voltage Vi, causing the measured voltage holding ratio (VHR) to be less than 100%. This also affects the rotation angle of the liquid crystal molecules. For example, if the input starting voltage can cause the liquid crystal molecules to have a rotation angle θ1, but the liquid crystal molecules affected by the free electrons produce another rotation angle θ2 corresponding to the ending voltage Vt, the brightness of the displayed image will be different. The lower the voltage holding ratio (VHR), the more severe the impact on the liquid crystal molecules.

[0129] <Related Experiments and Results>

[0130] In this related experiment, the voltage holding ratio (VHR) of the test components of the embodiment and the comparative example was measured at 5V, 10V and 20V, and the voltage was adjusted at 60Hz. Figure 10 The set voltage (starting voltage) Vi in the experiment was 5V, 10V or 20V, and the set frequency was 1 / 60 second. The measurement results are listed in Table 1.

[0131] Table 1 lists the material layers (e.g., red, green, and blue photosensitive resin compositions) included in the test assemblies of various Examples and Comparative Examples, the input voltage (V), and the measured voltage holding ratio (VHR; %). The voltage holding ratio of the test assemblies of the Examples and Comparative Examples, which do not contain any material layers, was also measured. Specifically, the voltage holding ratio of the liquid crystal layer without interference from the photosensitive resin composition (referred to as pure liquid crystal in the table) was measured to provide a standard reference value. Furthermore, the voltage holding ratio (VHR) of the pure liquid crystal was measured at input voltages of 10V and 20V, but these results were not significantly different from the 5V results and are therefore omitted from Table 1.

[0132] Furthermore, in this experiment, the voltage holding ratio (VHR) was measured using a TOYO Model 6254. Measurements were performed at room temperature, with voltage regulation at 60 Hz. The applied voltages were 5V, 10V, and 20V. The results are shown in Table 1.

[0133] Table 1

[0134]

[0135] The voltage holding ratio (VHR) results indicate that the photosensitive resin compositions of the test assemblies of the Examples and Comparative Examples release free electrons when voltages (e.g., 5V, 10V, and 20V) are applied, which does affect the liquid crystal (e.g., affecting the rotation of the liquid crystal molecules). Furthermore, for both the test assemblies of the Examples and Comparative Examples, the voltage holding ratio (VHR) decreases with increasing applied voltage (indicating a more pronounced effect on the liquid crystal molecules).

[0136] Furthermore, the voltage holding ratio (VHR) results of the test assembly according to the embodiment show a downward trend very similar to the voltage holding ratio (VHR) results of the test assembly according to the comparative example. That is, in the photosensitive resin compositions of different colors, the voltage holding ratio (VHR) values ​​of both the test assembly according to the embodiment and the test assembly according to the comparative example decrease as the voltage increases. Moreover, the voltage holding ratio of the test assembly according to the embodiment also shows a similar decrease as the voltage increases, and the VHR value of the embodiment is similar to the VHR value of the comparative example, indicating that the test assembly proposed in the embodiment has good reliability for the voltage holding ratio (VHR) measurement.

[0137] In addition to high reliability, the test assembly of the embodiment also allows for quick and cost-effective voltage holding ratio (VHR) measurements. Referring to Table 1, for this experiment, the production of nine test assembly samples from the comparative example (a conventional test assembly) took over 20 hours, while the production of nine test assembly samples from the embodiment took only three hours. Furthermore, the cost of a single test assembly sample from the comparative example (a conventional test assembly) exceeded 50 yuan, while the cost of a single test assembly sample from the embodiment was less than 2.5 yuan, a difference of more than 20 times.

[0138] Furthermore, in the nine test device samples of the comparative example (conventional test devices), the powder of the photosensitive resin composition to be measured was mixed with liquid crystals, and after a period of high temperature deterioration treatment, the mixture was centrifuged and the upper clear liquid (the liquid crystals affected by the photosensitive resin composition) was collected as the sample. Figure 9The liquid crystal layer 96 of the test assembly in the comparative example cannot be used repeatedly to test different photosensitive resin compositions, and the cost of testing increases exponentially with the number of samples to be tested. However, the test assembly proposed in the embodiment of the present case can be reused. Figure 1A 、 Figure 1B The liquid crystal cell shown is a combination of the liquid crystal cell 1 and two other conductive substrates coated with other material layers on their surfaces for testing.

[0139] In summary, compared to existing test assemblies, the test assemblies proposed in some embodiments of the present invention significantly reduce preparation time and manufacturing costs, and also offer the advantage of reusability. Furthermore, experiments have demonstrated that the test assemblies proposed in the embodiments have good reliability for voltage holding ratio (VHR) measurements. Therefore, using the test assemblies proposed in the embodiments, the required data can be quickly and accurately obtained in a cost-effective manner.

[0140] Of course, the present invention may have many other embodiments. Without departing from the spirit and essence of the present invention, those skilled in the art may make various corresponding changes and modifications based on the present invention, but these corresponding changes and modifications should all fall within the scope of protection of the claims attached to the present invention.

Claims

1. A test component, characterized in that: include: A liquid crystal cell comprising a first conductive layer and a second conductive layer disposed opposite to each other, and a liquid crystal layer disposed between the first conductive layer and the second conductive layer; as well as Two conductive substrates, each of which has a material layer to be detected on one surface; The liquid crystal box is detachably disposed between the two conductive substrates, and the first conductive layer and the second conductive layer are respectively in contact with the material layers to form the test component. The material layers of the two conductive substrates and the liquid crystal layer of the liquid crystal box are physically isolated by the first conductive layer and the second conductive layer, respectively. A voltage difference is applied between the two conductive substrates to detect the voltage holding rate of the test component.

2. The test assembly according to claim 1, wherein The first conductive layer and the second conductive layer respectively include metal, conductive polymer or a combination thereof.

3. The test assembly according to claim 2, wherein: The conductive polymer includes a polymer of poly (3,4-ethoxythiophene): polystyrene sulfonic acid) (PEDOT:PSS).

4. The test assembly according to claim 1, wherein: A clamp is used to fix the two conductive substrates and the liquid crystal box located between the two conductive substrates.

5. The test assembly according to claim 1, wherein: The first conductive layer and the second conductive layer of the liquid crystal cell are not bonded to the material layers, and the material layers include photosensitive resin compositions.

6. The test assembly according to claim 1, wherein: The two conductive substrates are a metal substrate, a conductive carbon-based substrate, a conductive ceramic substrate, a conductive polymer substrate or a combination thereof.

7. The test assembly according to claim 1, wherein: The conductive substrates include: a first conductive substrate, wherein a first material layer is coated on a surface of the first conductive substrate; and a second conductive substrate, wherein a second material layer is coated on a surface of the second conductive substrate; The first material layer is in direct contact with the first conductive layer of the liquid crystal box in its entirety, and the second material layer is in direct contact with the second conductive layer of the liquid crystal box in its entirety.

8. The test assembly according to claim 1, wherein: The liquid crystal box includes an adhesive layer disposed between the first conductive layer and the second conductive layer to seal the first conductive layer and the second conductive layer and surround the liquid crystal layer, wherein the adhesive layer is a light-curing colloid or a heat-curing colloid.

9. The test assembly according to claim 1, wherein: The thickness of at least one of the first conductive layer and the second conductive layer is greater than the thickness of at least one of the conductive substrates.

10. A method for forming a test assembly, characterized in that: include: A liquid crystal cell is provided, comprising a first conductive layer and a second conductive layer disposed opposite to each other, and a liquid crystal layer disposed between the first conductive layer and the second conductive layer; providing two conductive substrates; Coating a material layer to be detected on a surface of each of the conductive substrates; as well as The liquid crystal box is set between the two conductive substrates, wherein the two material layers to be tested are respectively in contact with the first conductive layer and the second conductive layer to form the test component, wherein a voltage difference is applied between the two conductive substrates to detect the voltage holding rate of the test component.

11. The method for forming a test assembly according to claim 10, wherein: The liquid crystal cell provided herein comprises: fabricating two conductive film layers to serve as the first conductive layer and the second conductive layer; Coating an adhesive layer on the edge of the first surface of one of the two conductive film layers; aligning the first conductive layer and the second conductive layer and curing the adhesive layer to bond the first conductive layer and the second conductive layer; and Liquid crystal is filled into a closed space defined by the adhesive layer between the first conductive layer and the second conductive layer to form the liquid crystal layer.

12. A method for testing a test component, characterized in that: include: A liquid crystal cell is provided, comprising a first conductive layer and a second conductive layer disposed opposite to each other, and a liquid crystal layer disposed between the first conductive layer and the second conductive layer; providing two conductive substrates; Coating a material layer on a surface of each of the conductive substrates; The liquid crystal cell is disposed and fixed between the two conductive substrates, and the material layers on the two conductive substrates are in contact with the first conductive layer and the second conductive layer respectively; applying a voltage difference between the two conductive substrates and performing electrical measurement; and After the measurement, the liquid crystal cell is taken out from between the two conductive substrates.

13. The testing method of the test component according to claim 12, wherein: Also includes: providing two other conductive substrates, each having another material layer on its surface; placing the removed liquid crystal cell between the two other conductive substrates, so that the material layers of the two other conductive substrates respectively contact the first conductive layer and the second conductive layer of the liquid crystal cell; and A second voltage difference is applied between the two other conductive substrates, and electrical property measurement is performed.

14. The testing method of the test component according to claim 13, wherein: The photosensitive resin compositions constituting the material layers of the two other conductive substrates are different from the photosensitive resin compositions of the material layers of the two conductive substrates tested previously.

15. The testing method of the testing component according to claim 12, wherein: The steps of setting and fixing the liquid crystal box between the two conductive substrates include: providing a clamp to fix the two conductive substrates and the liquid crystal box located between the two conductive substrates; and / or removing the liquid crystal box includes: removing the clamp to separate the liquid crystal box from the two conductive substrates, and extracting the liquid crystal box.

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