Fan control method for on-chip high-temperature burn-in test socket double heating rod

Abstract

The fan double-heating-rod control method of the on-chip high-temperature aging test socket belongs to the chip test and temperature control technical field; the method firstly sets a test environment target temperature and collects a test environment current temperature; then judges the sizes of the two, selects whether the fan works and the working modes of the two heating rods according to whether the test environment current temperature reaches the test environment target temperature; the method is based on the on-chip high-temperature aging test socket researched and developed by the company, gives the specific control strategies of the two heating rods, compares between different control strategies, summarizes the characteristics of various control strategies, and provides a theoretical basis for selecting a suitable control strategy according to test requirements.

Description

Technical Field

[0001] The invention discloses a control method for dual heating rods of a fan in an on-chip high-temperature aging test socket, and belongs to the technical field of chip testing and temperature control. Background Art

[0002] The high temperature storage life (HTSL) test of integrated circuits is an indispensable test link for consumer electronics and other products. This test is called high temperature aging test.

[0003] Traditional high-temperature aging test equipment is an aging furnace or aging room. In a laboratory environment, this type of equipment has the disadvantages of high cost, slow heating, large size, complex assembly, high requirements for supporting facilities, and low compatibility. To address the above shortcomings, the prior art has developed an on-chip chip high-temperature aging test socket, and based on the socket, developed an on-chip chip high-temperature aging test socket control system and control method, and developed a prototype, such as Figure 7 and Figure 8 shown.

[0004] In this technology, the on-chip chip high-temperature aging test socket has two heating rods, and it is pointed out that these two heating rods have two working states, one is that they use different control strategies, and the other is that they use the same control strategy. The test results show that the temperature control accuracy can reach ±1°C; although the PID control algorithm mentioned in the technology is a mature algorithm, technical personnel in this field can implement it according to their own understanding, but the specific algorithms, advantages and disadvantages of these two control strategies, and whether there are more advanced improvement solutions have not been discussed in depth. Summary of the Invention

[0005] The purpose of the present invention is to provide a specific control strategy for two heating rods based on an on-chip high-temperature aging test socket, compare different control strategies, summarize the characteristics of various control strategies, and provide a theoretical basis for selecting an appropriate control strategy according to test requirements.

[0006] The object of the present invention is achieved like this:

[0007] On-chip high-temperature aging test socket fan dual heating rod control method, the parameters are as follows: the temperature sampling period is T, within a temperature sampling period T, the fan operation can make the test environment temperature drop by T f , the radiator can reduce the test environment temperature by T r , the heating rod is fully loaded and can raise the test environment temperature by T s ;

[0008] The dual heating rod control method comprises the following steps:

[0009] Step a: Set the target temperature of the test environment to T d , collect the current temperature of the test environment as T t ,

[0010] Step b: Determine T d Is it greater than T t ,if:

[0011] If yes, go to step c;

[0012] No, go to step e;

[0013] Step c: The fan stops working, one heating rod is heated at full load, and the other heating rod is heated at a duty cycle of T t / T d PWM waveform controls heating;

[0014] Step d: According to the following formula:

[0015]

[0016] Calculate the current temperature of the test environment and proceed to step g;

[0017] Step e: The fan starts working, one heating rod is cut off from heating, and the other heating rod is controlled to heat with a PWM waveform with a constant duty cycle D;

[0018] Step f: According to the following formula:

[0019] T t =T t +D·T s -T r -T f

[0020] Calculate the current temperature of the test environment and proceed to step g;

[0021] Step g: Determine whether the chip-on-chip test is complete. If:

[0022] Yes, it’s over;

[0023] No, return to step b.

[0024] On-chip high-temperature aging test socket fan dual heating rod control method, the parameters are as follows: the temperature sampling period is T, within a temperature sampling period T, the fan operation can make the test environment temperature drop by T f , the radiator can reduce the test environment temperature by T r , the heating rod is fully loaded and can raise the test environment temperature by T s ;

[0025] The dual heating rod control method comprises the following steps:

[0026] Step a: Set the target temperature of the test environment to T d , collect the current temperature of the test environment as T t ,

[0027] Step b: Determine T d Is it greater than T t ,if:

[0028] If yes, go to step c;

[0029] No, go to step e;

[0030] Step c: The fan stops working and both heating rods are heated at full load;

[0031] Step d: According to the following formula:

[0032] T t =T t +2T s -T r

[0033] Calculate the current temperature of the test environment and proceed to step g;

[0034] Step e: The fan starts working and both heating rods are cut off from heating;

[0035] Step f: According to the following formula:

[0036] T t =T t -T r -T f

[0037] Calculate the current temperature of the test environment and proceed to step g;

[0038] Step g: Determine whether the chip-on-chip test is complete. If:

[0039] Yes, it’s over;

[0040] No, return to step b.

[0041] Beneficial effects:

[0042] Based on the on-chip high-temperature aging test socket, the present invention provides a specific control strategy for two heating rods, and can compare different control strategies, summarize the characteristics of various control strategies, and provide a theoretical basis for selecting an appropriate control strategy according to test requirements. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 This is a flow chart of a first control method for dual heating rods of a fan in an on-chip high-temperature aging test socket of the present invention.

[0044] Figure 2 This is a flow chart of the second control method for the fan dual heating rods of the on-chip high-temperature aging test socket of the present invention.

[0045] Figure 3 These are the temperature control results of the dual heating rods of the present invention under different control strategies.

[0046] Figure 4 This is the comparison result between strategy one and strategy two.

[0047] Figure 5 This is the comparison result between strategy one and strategy three.

[0048] Figure 6 This is a screenshot of the simulation process.

[0049] Figure 7 This is a physical picture of the on-chip chip high-temperature aging test socket.

[0050] Figure 8 This is a photo of the temperature control unit connected to the on-chip high-temperature aging test socket. DETAILED DESCRIPTION

[0051] The specific embodiments of the present invention are further described in detail below with reference to the accompanying drawings. Specific implementation method 1

[0053] The following is a specific implementation of the on-chip chip high-temperature aging test socket fan dual heating rod control method of the present invention.

[0054] In this specific embodiment, the fan dual heating rod control method of the chip high temperature aging test socket has the following parameters: the temperature sampling period is T, and within a temperature sampling period T, the fan operation can reduce the test environment temperature by T f , the radiator can reduce the test environment temperature by T r , the heating rod is fully loaded and can raise the test environment temperature by T s ;

[0055] The dual heating rod control method is as follows: Figure 1 As shown, the following steps are included:

[0056] Step a: Set the target temperature of the test environment to T d , collect the current temperature of the test environment as T t ,

[0057] Step b: Determine T d Is it greater than T t ,if:

[0058] If yes, go to step c;

[0059] No, go to step e;

[0060] Step c: The fan stops working, one heating rod is heated at full load, and the other heating rod is heated at a duty cycle of T t / T d PWM waveform controls heating;

[0061] Step d: According to the following formula:

[0062]

[0063] Calculate the current temperature of the test environment and proceed to step g;

[0064] Step e: The fan starts working, one heating rod is cut off from heating, and the other heating rod is controlled to heat with a PWM waveform with a constant duty cycle D;

[0065] Step f: According to the following formula:

[0066] T t =T t +D·T s -T r -T f

[0067] Calculate the current temperature of the test environment and proceed to step g;

[0068] Step g: Determine whether the chip-on-chip test is complete. If:

[0069] Yes, it’s over;

[0070] No, return to step b. Specific implementation method 2

[0072] The following is a specific implementation of the on-chip chip high-temperature aging test socket fan dual heating rod control method of the present invention.

[0073] In this specific embodiment, the fan dual heating rod control method of the chip high temperature aging test socket has the following parameters: the temperature sampling period is T, and within a temperature sampling period T, the fan operation can reduce the test environment temperature by T f , the radiator can reduce the test environment temperature by T r , the heating rod is fully loaded and can raise the test environment temperature by T s ;

[0074] The dual heating rod control method is as follows: Figure 2 As shown, the following steps are included:

[0075] Step a: Set the target temperature of the test environment to T d , collect the current temperature of the test environment as T t ,

[0076] Step b: Determine T d Is it greater than T t ,if:

[0077] If yes, go to step c;

[0078] No, go to step e;

[0079] Step c: The fan stops working and both heating rods are heated at full load;

[0080] Step d: According to the following formula:

[0081] T t =T t +2T s -T r

[0082] Calculate the current temperature of the test environment and proceed to step g;

[0083] Step e: The fan starts working and both heating rods are cut off from heating;

[0084] Step f: According to the following formula:

[0085] T t =T t -T r -T f

[0086] Calculate the current temperature of the test environment and proceed to step g;

[0087] Step g: Determine whether the chip-on-chip test is complete. If:

[0088] Yes, it’s over;

[0089] No, return to step b. Specific implementation method three

[0091] The following is a specific implementation of the simulation comparison of different control strategies for the dual heating rods of the fan of the on-chip high-temperature aging test socket of the present invention.

[0092] In this specific embodiment, the control method for the dual-heating rod fan of the on-chip high-temperature aging test socket has the following parameters: the temperature sampling period is 0.02s. Within a temperature sampling period of 0.02s, the fan operation can reduce the test environment temperature by 0.1°C, the radiator can reduce the test environment temperature by 0.02°C, and the heating rod full-load heating can increase the test environment temperature by 0.5°C; the test environment target temperature is set to 150°C, and the current temperature of the test environment is collected as 20°C (room temperature);

[0093] The following three control strategies are executed respectively and sampled for 100s;

[0094] Strategy 1: One heating rod is heated at full load, and the other heating rod is heated at a duty cycle of T t / T d PWM waveform controls heating;

[0095] Strategy 2: Both heating rods are heated at full capacity;

[0096] Strategy 3: Both heating rods have a duty cycle of T t / T d PWM waveform controls heating;

[0097] Temperature control results are as follows Figure 3 As shown, from Figure 3 It can be seen that all three control strategies can make the test environment temperature reach 150°C and maintain it near this temperature. In terms of heating time, strategy three takes the longest time, and strategy two takes the shortest time, indicating that the heating rod adopts full-load heating mode, which is conducive to rapid temperature rise.

[0098] In order to compare the accuracy of strategy 1 and strategy 2, Figure 3 A partial zoom display is performed, that is, the test environment temperature is stable at the target temperature of 150°C from 80s to 100s, as shown in the figure. Figure 4 As shown, from Figure 4 It can be seen that the maximum absolute error of strategy 1 is slightly smaller than that of strategy 2, that is, strategy 1 has higher temperature control accuracy;

[0099] In order to compare the accuracy of strategy 2 and strategy 3, we also Figure 3 A partial zoom display is performed, that is, the test environment temperature is stable at the target temperature of 150°C from 60s to 100s, as shown in the figure. Figure 5 As shown, from Figure 5 It can be seen that the maximum absolute error of strategy 1 is slightly smaller than that of strategy 3, and the error change frequency of strategy 1 is higher, which means that strategy 1 not only has higher temperature control accuracy but also faster response;

[0100] In summary, both heating rods have a duty cycle of T t / T d The PWM waveform control heating has no advantages in terms of rapid heating or control accuracy. If rapid heating is required, strategy 1 is selected, that is, one heating rod is heated at full load and the other heating rod is heated at a duty cycle of T. t / T d The PWM waveform controls the heating; if precise control is required, select strategy 2, that is, both heating rods are heated at full load.

[0101] The above conclusions are simulated using Matlab R2014a program. The simulation interface is as follows: Figure 6 As shown, and the Matlab program is as follows:

[0102] close all

[0103] clear all

[0104] clc

[0105] T=0.2;% sampling period

[0106] Tf=0.1;% Fan causes the test environment temperature to drop

[0107] Tr=0.02;% radiator causes the test environment temperature to drop

[0108] Ts=0.5;%The first heating rod causes the test environment temperature to rise

[0109] %Strategy 1

[0110] % The two heating rods work in different ways

[0111] Td=150;%test environment target temperature

[0112] Tt=20;%Current temperature of the test environment

[0113] for i=1:500

[0114] if Td>Tt

[0115] Tt=Tt+Ts+Tt / Td*Ts-Tr;

[0116] else

[0117] Tt=Tt+0.1*Ts-Tr-Tf;

[0118] end

[0119] TT1(i)=Tt;

[0120] end

[0121] plot(0.2:0.2:100,TT1,'k')

[0122] %Strategy 2

[0123] % Both heating rods work in full load heating cut-off mode

[0124] Td=150;%test environment target temperature

[0125] Tt=20;%Current temperature of the test environment

[0126] for i=1:500

[0127] if Td>Tt

[0128] Tt=Tt+2*Ts-Tr;

[0129] else

[0130] Tt=Tt-Tr-Tf;

[0131] end

[0132] TT2(i)=Tt;

[0133] end

[0134] hold on

[0135] plot(0.2:0.2:100,TT2,'k--')

[0136] %Strategy Three

[0137] % Both heaters work in PWM control mode

[0138] Td=150;%test environment target temperature

[0139] Tt=20;%Current temperature of the test environment

[0140] for i=1:500

[0141] if Td>Tt

[0142] Tt=Tt+2*Tt / Td*Ts-Tr;

[0143] else

[0144] Tt=Tt+2*0.1*Ts-Tr-Tf;

[0145] end

[0146] TT3(i) = Tt;

[0147] end

[0148] hold on

[0149] plot(0.2:0.2:100,TT3,'k-.')

[0150] xlabel('time / s')

[0151] ylabel('Temperature / ℃')

[0152] grid on

[0153] legend('The two heaters work in different ways', 'Both heaters work in full-load heating cut-off mode', 'Both heaters work in PWM control mode')

[0154] % Comparison of Strategy 1 and Strategy 2 (partially enlarged image)

[0155] figure

[0156] plot(90:0.2:100,TT1(450:500),'k')

[0157] hold on

[0158] plot(90:0.2:100,TT2(450:500),'k--')

[0159] xlabel('time / s')

[0160] ylabel('Temperature / ℃')

[0161] grid on

[0162] legend('The two heating rods work in different ways', 'Both heating rods work in full-load heating cut-off mode')

[0163] % Comparison of Strategy 2 and Strategy 3 (partially enlarged image)

[0164] figure

[0165] plot(80:0.2:100,TT1(400:500),'k')

[0166] hold on

[0167] plot(80:0.2:100,TT3(400:500),'k-.')

[0168] xlabel('time / s')

[0169] ylabel('Temperature / ℃')

[0170] grid on

[0171] legend('The two heaters work in different ways', 'Both heaters work in PWM control mode')

[0172] The above is the Matlab program.

Claims

1. On-chip high-temperature aging test socket fan dual heating rod control method, the parameters are as follows: the temperature sampling period is T, within a temperature sampling period T, the fan operation can make the test environment temperature drop by T f , the radiator can reduce the test environment temperature by T r , the heating rod is fully loaded and can raise the test environment temperature by T s ; It is characterized in that The dual heating rod control method comprises the following steps: Step a: Set the target temperature of the test environment to T d , collect the current temperature of the test environment as T t , Step b: Determine T d Is it greater than T t ,if: If yes, go to step c; No, go to step e; Step c: The fan stops working, one heating rod is heated at full load, and the other heating rod is heated at a duty cycle of T t / T d PWM waveform controls heating; Step d: According to the following formula: Calculate the current temperature of the test environment and proceed to step g; Step e: The fan starts working, one heating rod is cut off from heating, and the other heating rod is controlled to heat with a PWM waveform with a constant duty cycle D; Step f: According to the following formula: T t =T t +D·T s -T r -T f Calculate the current temperature of the test environment and proceed to step g; Step g: Determine whether the chip-on-chip test is complete. If: Yes, it’s over; No, return to step b.

2. On-chip high-temperature aging test socket fan dual heating rod control method, the parameters are as follows: the temperature sampling period is T, within a temperature sampling period T, the fan operation can make the test environment temperature drop by T f , the radiator can reduce the test environment temperature by T r , the heating rod is fully loaded and can raise the test environment temperature by T s ; It is characterized in that The dual heating rod control method comprises the following steps: Step a: Set the target temperature of the test environment to T d , collect the current temperature of the test environment as T t , Step b: Determine T d Is it greater than T t ,if: If yes, go to step c; No, go to step e; Step c: The fan stops working and both heating rods are heated at full load; Step d: According to the following formula: T t =T t +2T s -T r Calculate the current temperature of the test environment and proceed to step g; Step e: The fan starts working and both heating rods are cut off from heating; Step f: According to the following formula: T t =T t -T r -T f Calculate the current temperature of the test environment and proceed to step g; Step g: Determine whether the chip-on-chip test is completed. If yes, terminate. No, return to step b.

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