Chip pat parameter determination method and device, electronic equipment and storage medium

Abstract

The application provides a chip PAT parameter determination method and device, electronic equipment and a storage medium. The method comprises the following steps: obtaining chip sample data and a plurality of PAT parameter groups; the PAT parameter group comprises a test algorithm; determining a determination threshold of each PAT parameter group according to the test algorithm in each PAT parameter group and the chip sample data; determining the accuracy of each PAT parameter group according to the determination threshold of each PAT parameter group and the sample label of the chip sample data; and determining the PAT parameter in the PAT parameter group with the highest accuracy as the target PAT parameter. The application determines the accuracy of each PAT parameter group through the test algorithm in each PAT parameter group, the chip sample data and the sample label of the corresponding chip sample data, determines the target PAT parameter from the plurality of PAT parameter groups, and improves the accuracy of the chip PAT test.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of chip testing, in particular to a PAT parameter determination method and device for a chip, an electronic device and a storage medium. BACKGROUND

[0002] With the development of science and technology, chips are applied to mobile phones, notebooks, automobiles and household electrical appliances, and many other electronic products. In the use process of electronic products, the quality of the chip directly affects the overall quality of the electronic device, so the PAT (Part Average Testing) of the chip is particularly important.

[0003] At present, in the chip testing process, the test engineer determines the parameters for chip PAT testing according to previous experience. However, this manual and experience-based determination method often results in low accuracy of chip PAT testing due to the lack of experience of the test engineer. SUMMARY

[0004] Therefore, the purpose of the present application is to provide a PAT parameter determination method and device for a chip, an electronic device and a storage medium, which can determine the PAT parameters for chip PAT testing and improve the accuracy of chip PAT testing.

[0005] In a first aspect, the present application provides a PAT parameter determination method for a chip, which includes:

[0006] obtaining chip sample data and a plurality of PAT parameter groups; the PAT parameter group includes a test algorithm;

[0007] determining a determination threshold of each PAT parameter group according to the test algorithm in each PAT parameter group and the chip sample data;

[0008] determining the accuracy of each PAT parameter group according to the determination threshold of each PAT parameter group and the sample label of the chip sample data;

[0009] determining the PAT parameters in the PAT parameter group with the highest accuracy as the target PAT parameters.

[0010] In one possible implementation, determining the determination threshold of each PAT parameter group according to the test algorithm in each PAT parameter group and the chip sample data includes:

[0011] calculating the chip sample data according to a first test algorithm in the test algorithm to obtain a first value;

[0012] According to a second test algorithm in the test algorithm, the chip sample data is calculated to obtain a second value;

[0013] According to the first value and the second value, a determination threshold of the PAT parameter group is calculated.

[0014] In a possible implementation, according to the first value and the second value, the determination threshold of the PAT parameter group is calculated, including:

[0015] The determination threshold of the PAT parameter group is calculated by the following formula:

[0016] low limit = Center - lowThreshold * Spread;

[0017] high limit = Center + highThreshold * Spread;

[0018] Wherein, the low limit is a low threshold in the determination threshold of the PAT parameter group, the high limit is a high threshold in the determination threshold of the PAT parameter group, the lowThreshold is a preset low coefficient, the highThreshold is a preset high coefficient, the Center is the first value, and the Spread is the second value.

[0019] In a possible implementation, according to the determination threshold of each PAT parameter group and the sample label of the chip sample data, the accuracy of each PAT parameter group is determined, including:

[0020] The determination threshold of each PAT parameter group is compared with the chip sample data to determine the PAT test result of the chip sample data corresponding to each PAT parameter group;

[0021] According to the PAT test result of the chip sample data corresponding to each PAT parameter group and the sample label of the chip sample data, the accuracy of each PAT parameter group is determined.

[0022] In a possible implementation, according to the PAT test result of the chip sample data corresponding to each PAT parameter group and the sample label of the chip sample data, the accuracy of each PAT parameter group is determined, including:

[0023] The number of the PAT test result of the chip sample data corresponding to the PAT parameter group being consistent with the sample label of the chip sample data is counted to obtain a first value;

[0024] The ratio of the first value to the total number of the chip sample data is determined as the accuracy of the PAT parameter group.

[0025] In a possible implementation, the chip sample data and the plurality of PAT parameter groups are acquired, including:

[0026] receiving a data source input by a user and a corresponding filtering condition;

[0027] determining chip sample data in the data source that meets the filtering condition as target chip sample data.

[0028] In a second aspect, the embodiments of the present application further provide a chip PAT parameter determination device, which comprises:

[0029] an acquisition module, configured to acquire chip sample data and a plurality of PAT parameter groups; the PAT parameter group comprises a test algorithm;

[0030] a determination module, configured to determine a determination threshold of each PAT parameter group according to the test algorithm in each PAT parameter group and the chip sample data;

[0031] the determination module is further configured to determine an accuracy rate of each PAT parameter group according to the determination threshold of each PAT parameter group and a sample label of the chip sample data;

[0032] the determination module is further configured to determine a PAT parameter in a PAT parameter group with the highest accuracy rate as a target PAT parameter.

[0033] In a possible implementation, the determination module is specifically configured to calculate the chip sample data according to a first test algorithm in the test algorithm to obtain a first value; calculate the chip sample data according to a second test algorithm in the test algorithm to obtain a second value; and calculate the determination threshold of the PAT parameter group according to the first value and the second value.

[0034] In a possible implementation, the determination module is further configured to:

[0035] calculate the determination threshold of the PAT parameter group by the following formula:

[0036] low limit = Center - lowThreshold * Spread;

[0037] high limit = Center + highThreshold * Spread;

[0038] Wherein, the low limit is a low threshold of the determination threshold of the PAT parameter group, the high limit is a high threshold of the determination threshold of the PAT parameter group, the lowThreshold is a preset low coefficient, the highThreshold is a preset high coefficient, the Center is the first numerical value, and the Spread is the second numerical value.

[0039] In a possible implementation, the determining module is specifically configured to compare the determination threshold of each PAT parameter group with the chip sample data, to determine a PAT test result of the chip sample data corresponding to each PAT parameter group; and determine an accuracy rate of each PAT parameter group according to the PAT test result of the chip sample data corresponding to each PAT parameter group and the sample label of the chip sample data.

[0040] In a possible implementation, the determining module is specifically configured to count a number of the PAT test results of the chip sample data corresponding to the PAT parameter group that are consistent with the sample label of the chip sample data, to obtain a first numerical value; and determine the accuracy rate of the PAT parameter group as a ratio of the first numerical value to a total number of the chip sample data.

[0041] In a possible implementation, the obtaining module is specifically configured to receive a data source and a corresponding filtering condition input by a user; and determine chip sample data in the data source that meets the filtering condition as target chip sample data.

[0042] In a third aspect, an electronic device is also provided, which includes a processor, a storage medium, and a bus. The storage medium stores machine readable instructions executable by the processor. When the electronic device is running, the processor communicates with the storage medium through the bus. The processor executes the machine readable instructions to perform the steps of the PAT parameter determination method of any chip of the first aspect.

[0043] In a fourth aspect, a computer readable storage medium is also provided. The computer readable storage medium stores a computer program. When the computer program is run by a processor, the steps of the PAT parameter determination method of any chip of the first aspect are performed.

[0044] This application provides a method, apparatus, electronic device, and storage medium for determining PAT parameters of a chip. The method includes: acquiring chip sample data and multiple PAT parameter groups; each PAT parameter group includes a test algorithm; determining a judgment threshold for each PAT parameter group based on the test algorithm and chip sample data; determining the accuracy of each PAT parameter group based on the judgment threshold and sample labels of the chip sample data; and determining the PAT parameter in the PAT parameter group with the highest accuracy as the target PAT parameter. This application determines the accuracy of each PAT parameter group by using the test algorithm, chip sample data, and corresponding sample labels of the chip sample data in each PAT parameter group, thereby determining the target PAT parameter from multiple PAT parameter groups and improving the accuracy of chip PAT testing. Attached Figure Description

[0045] To more clearly illustrate the technical solutions of the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of this application and should not be regarded as a limitation of the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0046] Figure 1 A flowchart of a method for determining PAT parameters of a chip according to an embodiment of this application is shown;

[0047] Figure 2 A flowchart of another method for determining PAT parameters of a chip provided in an embodiment of this application is shown;

[0048] Figure 3 This illustration shows a schematic diagram of a chip PAT parameter determination device provided in an embodiment of this application;

[0049] Figure 4 A schematic diagram of the structure of an electronic device provided in an embodiment of this application is shown. Detailed Implementation

[0050] In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below with reference to the drawings in the embodiments of the present application. It should be understood that the drawings in the present application only serve the purpose of description and illustration, and are not used to limit the scope of protection of the present application. In addition, it should be understood that the schematic drawings are not drawn according to the actual proportions. The flowchart used in the present application shows the operations implemented according to some embodiments of the present application. It should be understood that the operations of the flowchart can not be implemented in sequence, and the steps without logical context relationship can be reversed in sequence or implemented simultaneously. In addition, one or more other operations can be added to the flowchart or one or more operations can be removed from the flowchart under the guidance of the content of the present application.

[0051] In addition, the described embodiments are only some of the embodiments of the present application, not all the embodiments. The components of the embodiments of the present application described and shown in the drawings herein can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present application provided in the drawings is not intended to limit the scope of the claimed present application, but only represents selected embodiments of the present application. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative labor fall within the scope of protection of the present application.

[0052] In order to enable those skilled in the art to use the content of the present application, the following implementation modes are given in combination with a specific application scenario "chip testing technology field". For those skilled in the art, the general principles defined herein can be applied to other embodiments and application scenarios without departing from the spirit and scope of the present application. Although the present application is mainly described in relation to the "chip testing technology field", it should be understood that this is only an exemplary embodiment.

[0053] It should be noted that the term "comprising" will be used in the embodiments of the present application to indicate the presence of the features declared thereafter, but does not exclude the addition of other features.

[0054] The chip PAT parameter determination method provided by the embodiments of the present application will be described in detail below.

[0055] Referring to Figure 1 The flowchart of the chip PAT parameter determination method provided by the embodiments of the present application is shown in FIG. 1. The specific execution process of the chip PAT parameter determination method is as follows:

[0056] S101, obtaining chip sample data and a plurality of PAT parameter groups; the PAT parameter group includes a test algorithm.

[0057] S102, determine a determination threshold of each PAT parameter group according to the test algorithm and the chip sample data in each PAT parameter group.

[0058] S103, determine an accuracy rate of each PAT parameter group according to the determination threshold of each PAT parameter group and a sample label of the chip sample data.

[0059] S104, determine a PAT parameter in a PAT parameter group with the highest accuracy rate as a target PAT parameter.

[0060] Embodiments of the present application provide a chip PAT parameter determination method and device, electronic equipment and storage medium. The method comprises: obtaining chip sample data and a plurality of PAT parameter groups; the PAT parameter group comprises a test algorithm; determining a determination threshold of each PAT parameter group according to the test algorithm and the chip sample data in each PAT parameter group; determining an accuracy rate of each PAT parameter group according to the determination threshold of each PAT parameter group and a sample label of the chip sample data; and determining a PAT parameter in a PAT parameter group with the highest accuracy rate as a target PAT parameter. The accuracy rate of each PAT parameter group is determined by the test algorithm and the chip sample data in each PAT parameter group and the sample label of the corresponding chip sample data, so as to determine the target PAT parameter from the plurality of PAT parameter groups, thereby improving the accuracy rate of the chip PAT test.

[0061] The following describes exemplary steps of embodiments of the present application:

[0062] S101, obtaining chip sample data and a plurality of PAT parameter groups; the PAT parameter group comprises a test algorithm.

[0063] In the embodiments of the present application, the chip sample data comprises test results of at least one test item of various chips, and the test item can be temperature, current, voltage, etc. The PAT parameter group comprises a test item identifier, a test algorithm, a preset low coefficient and a high coefficient.

[0064] The test item in the PAT parameter group can be at least one test item in the chip sample data.

[0065] S102, determine a determination threshold of each PAT parameter group according to the test algorithm and the chip sample data in each PAT parameter group.

[0066] In the embodiments of the present application, each PAT parameter group corresponds to a calculated decision threshold; the test algorithm includes a first test algorithm and a second test algorithm. The first test algorithm and the second test algorithm can be any one of the following algorithms: average algorithm, median algorithm, summation algorithm, interquartile range IQR algorithm, and Robust_Sigma algorithm. The decision threshold of the PAT parameter group is used to determine the PAT test result of the chip sample data.

[0067] Specifically, according to the first test algorithm in the test algorithm, the chip sample data is calculated to obtain a first value.

[0068] In the embodiments of the present application, the first value is used to represent the central value of all chip sample data, and the calculation method of the first value is to perform the first test algorithm on all parameter values corresponding to the test item identifier in the PAT parameter group in the chip sample data; specifically, if the first test algorithm is the average algorithm, the average of the sum of all parameter values corresponding to the test item identifier in the PAT parameter group in the chip sample data is taken as the first value; if the first test algorithm is the median algorithm, the median of all parameter values corresponding to the test item identifier in the PAT parameter group in the chip sample data is taken as the first value; the summation algorithm, the interquartile range IQR algorithm, and the Robust_Sigma algorithm are the same as the average algorithm and the median algorithm.

[0069] For example, the test identifier in the PAT parameter group is A, and the chip sample data includes parameter values a1 and a2 corresponding to the test item identifier A, and parameter values b1 and b2 corresponding to the test item identifier B, then the parameter values a1 and a2 corresponding to the test item identifier A are calculated by the first test algorithm to obtain the calculation method of the first value.

[0070] Specifically, according to the second test algorithm in the test algorithm, the chip sample data is calculated to obtain a second value.

[0071] In the embodiments of the present application, the second value is used to represent the distance of the chip sample data spreading outward from the central value as the central position, and the calculation of the first value is the same, that is, the second test algorithm is performed on all parameter values corresponding to the test item identifier in the PAT parameter group in the chip sample data to obtain the second value.

[0072] Specifically, according to the first value and the second value, the decision threshold of the PAT parameter group is calculated.

[0073] In the embodiments of the present application, the decision threshold is used to determine the PAT test result of the chip sample data.

[0074] The decision threshold of the PAT parameter group is calculated by the following formula:

[0075] low limit = Center - lowThreshold * Spread;

[0076] high limit = Center + highThreshold * Spread;

[0077] wherein, the low limit is a low threshold in the determination threshold of the PAT parameter group, the high limit is a high threshold in the determination threshold of the PAT parameter group, the lowThreshold is a preset low coefficient, the highThreshold is a preset high coefficient, the Center is a first numerical value, and the Spread is a second numerical value.

[0078] S103, determining the accuracy of each PAT parameter group according to the determination threshold of each PAT parameter group and the sample label of the chip sample data.

[0079] In the embodiments of the present application, each PAT parameter group corresponds to an accuracy.

[0080] I, comparing the determination threshold of each PAT parameter group with the chip sample data to determine the PAT test result of the chip sample data corresponding to each PAT parameter group;

[0081] In the embodiments of the present application, it is judged whether the parameter value corresponding to the test item identifier in the PAT parameter group in the chip sample data is within the determination threshold of the PAT parameter group; if the parameter value corresponding to the test item identifier in the chip sample data is within the determination threshold of the PAT parameter group, the PAT test result of the chip sample data is determined to be passed; otherwise, the PAT test result of the chip sample data is determined to be failed.

[0082] II, determining the accuracy of each PAT parameter group according to the PAT test result of the chip sample data corresponding to each PAT parameter group and the sample label of the chip sample data.

[0083] Specifically, the number of the PAT test result of the chip sample data corresponding to the PAT parameter group consistent with the sample label of the chip sample data is counted to obtain a first numerical value.

[0084] In the embodiments of the present application, the sample label of the chip sample data includes two labels of pass and fail. If the sample label of the chip sample data and the PAT test result are both pass, the PAT test result of the chip sample data is consistent with the sample label of the chip sample data; if the sample label of the chip sample data and the PAT test result are both fail, the PAT test result of the chip sample data is consistent with the sample label of the chip sample data; if the sample label of the chip sample data is pass and the PAT test result is fail, the PAT test result of the chip sample data is inconsistent with the sample label of the chip sample data; if the sample label of the chip sample data is fail and the PAT test result is pass, the PAT test result of the chip sample data is inconsistent with the sample label of the chip sample data.

[0085] Then, for each PAT parameter group, the number of the PAT test results of the chip sample data corresponding to the PAT parameter group that are consistent with the sample labels of the chip sample data is counted.

[0086] Specifically, the ratio of the first value to the total number of chip sample data is determined as the accuracy of the PAT parameter group.

[0087] In the embodiments of the present application, the accuracy of the PAT parameter group indicates that the higher the accuracy of the PAT test result of the chip sample data determined by the PAT parameter group is.

[0088] S104, the PAT parameter in the PAT parameter group with the highest accuracy is determined as the target PAT parameter.

[0089] Referring to Figure 2 FIG. 2 shows a flowchart of another method for determining a PAT parameter of a chip provided by an embodiment of the present application, and the following exemplary steps of the embodiment of the present application are described:

[0090] S201, receiving a data source input by a user and corresponding filtering conditions.

[0091] In the embodiments of the present application, the user inputs the chip data source and the corresponding filtering conditions in the interactive interface; the data source can be original data Test Raw Data or message data MES Data. The filtering conditions include the factory, test program or test machine to which the chip sample data belongs, etc. That is, the data source refers to the database source of the chip sample data, and the filtering condition refers to the source of the chip sample data.

[0092] The number of filtering conditions is greater than or equal to zero.

[0093] S202, determining the chip sample data in the data source that meets the filtering conditions as target chip sample data.

[0094] In the embodiment of the present application, if the screening condition is the chip sample data of factory A, the chip sample data of factory A in the data source is taken as the target chip sample data.

[0095] The embodiment of the present application provides another method for determining the PAT parameter of a chip, which comprises the following steps: receiving a data source and a corresponding screening condition input by a user; and determining chip sample data in the data source that meets the screening condition as target chip sample data. Through the method, the chip sample data used for determining the PAT parameter can be selected.

[0096] Based on the same inventive concept, the embodiment of the present application further provides a device for determining the PAT parameter of a chip, which corresponds to the method for determining the PAT parameter of a chip. Since the principle of the device in the embodiment of the present application for solving the problem is similar to the method for determining the PAT parameter of a chip in the above embodiment of the present application, the implementation of the device can be referred to the implementation of the method, and the repeated parts will not be described here.

[0097] Referring to Figure 3 FIG. 1 is a schematic diagram of a device for determining the PAT parameter of a chip provided by the embodiment of the present application, which comprises the following:

[0098] The obtaining module 301 is configured to obtain chip sample data and a plurality of PAT parameter groups. The PAT parameter group comprises a test algorithm.

[0099] The determining module 302 is configured to determine a determination threshold of each PAT parameter group according to the test algorithm in each PAT parameter group and the chip sample data.

[0100] The determining module 302 is further configured to determine the accuracy rate of each PAT parameter group according to the determination threshold of each PAT parameter group and the sample label of the chip sample data.

[0101] The determining module 302 is further configured to determine the PAT parameter in the PAT parameter group with the highest accuracy rate as the target PAT parameter.

[0102] In a possible implementation, the determining module 302 is specifically configured to calculate the chip sample data according to a first test algorithm in the test algorithm to obtain a first value; calculate the chip sample data according to a second test algorithm in the test algorithm to obtain a second value; and calculate the determination threshold of the PAT parameter group according to the first value and the second value.

[0103] In a possible implementation, the determining module 302 is further configured to:

[0104] The determination threshold of the PAT parameter group is calculated by the following formula:

[0105] low limit = Center - lowThreshold * Spread;

[0106] high limit = Center + highThreshold * Spread;

[0107] wherein, the low limit is a low threshold of the determination threshold of the PAT parameter group, the high limit is a high threshold of the determination threshold of the PAT parameter group, the lowThreshold is a preset low coefficient, the highThreshold is a preset high coefficient, the Center is the first numerical value, and the Spread is the second numerical value.

[0108] In a possible implementation, the determining module 302 is specifically configured to compare the determination threshold of each PAT parameter group with the chip sample data, to determine a PAT test result of the chip sample data corresponding to each PAT parameter group; and to determine the accuracy rate of each PAT parameter group according to the PAT test result of the chip sample data corresponding to each PAT parameter group and the sample label of the chip sample data.

[0109] In a possible implementation, the determining module 302 is specifically configured to count the number of the PAT test results of the chip sample data corresponding to the PAT parameter group that are consistent with the sample label of the chip sample data, to obtain a first numerical value; and to determine the accuracy rate of the PAT parameter group as the ratio of the first numerical value to the total number of the chip sample data.

[0110] In a possible implementation, the obtaining module 301 is specifically configured to receive a data source and a corresponding filtering condition input by a user; and to determine the chip sample data in the data source that meets the filtering condition as the target chip sample data.

[0111] This application provides a chip PAT parameter determination device, which includes: an acquisition module 301 for acquiring chip sample data and multiple PAT parameter groups; each PAT parameter group includes a test algorithm; a determination module 302 for determining a judgment threshold for each PAT parameter group based on the test algorithm and chip sample data; the determination module 302 is further used to determine the accuracy of each PAT parameter group based on the judgment threshold and sample labels of the chip sample data; and the determination module 302 is further used to determine the PAT parameter in the PAT parameter group with the highest accuracy as the target PAT parameter. This application determines the accuracy of each PAT parameter group by using the test algorithm, chip sample data, and corresponding sample labels of the chip sample data in each PAT parameter group, thereby determining the target PAT parameter from multiple PAT parameter groups and improving the accuracy of chip PAT testing.

[0112] like Figure 4 As shown in the embodiment of this application, an electronic device 400 includes a processor 401, a memory 402, and a bus. The memory 402 stores machine-readable instructions that can be executed by the processor 401. When the electronic device is running, the processor 401 communicates with the memory 402 through the bus. The processor 401 executes the machine-readable instructions to perform the steps of the PAT parameter determination method of the chip described above.

[0113] Specifically, the memory 402 and processor 401 mentioned above can be general-purpose memory and processor, without any specific limitations. When the processor 401 runs the computer program stored in the memory 402, it can execute the PAT parameter determination method of the chip mentioned above.

[0114] Corresponding to the above-mentioned method for determining PAT parameters of the chip, this application also provides a computer-readable storage medium storing a computer program, which is executed by a processor to perform the steps of the above-mentioned method for determining PAT parameters of the chip.

[0115] Those skilled in the art can clearly understand that, for the convenience and brevity of the description, the specific working process of the system and the device described above can refer to the corresponding process in the method embodiment, and will not be repeated in the present application. In the several embodiments provided in the present application, it should be understood that the disclosed system, device and method can be implemented by other means. The above-described device embodiments are only schematic, for example, the division of the modules is only a logical function division, and the actual implementation can have another division manner, for example, a plurality of modules or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the shown or discussed mutual elements can be indirect coupling or communication connection through some communication interface, device or module, which can be electrical, mechanical or other forms.

[0116] The modules described as separate components can or can not be physically separated, and the components shown as modules can or can not be physical units, i.e. can be located in one place or distributed to multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

[0117] In addition, the functional units in each embodiment of the present application can be integrated in one processing unit, or each unit can be physically present separately, or two or more units can be integrated in one unit.

[0118] If the functions are realized in the form of software function units and sold or used as independent products, they can be stored in a non-volatile computer readable storage medium executable by a processor. Based on this understanding, the technical solutions of the present application essentially or the parts that contribute to the prior art or parts of the technical solutions can be embodied in the form of software products. The computer software product is stored in a storage medium, including a plurality of instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the information processing method described in each embodiment of the present application. The foregoing storage medium includes: U disk, mobile hard disk, ROM, RAM, magnetic disk or optical disk and various program code storage media.

[0119] The above is only a specific embodiment of the present application, but the protection scope of the present application is not limited thereto, and any person skilled in the art can easily think of changes or replacements within the technical scope disclosed in the present application, which should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A method for determining the PAT parameters of a chip, characterized in that, The method for determining the PAT parameters of the chip includes: Acquire chip sample data and multiple PAT parameter sets; the PAT parameter sets include test algorithms; The judgment threshold for each PAT parameter group is determined based on the test algorithm in each PAT parameter group and the chip sample data. The accuracy of each PAT parameter group is determined based on the judgment threshold of each PAT parameter group and the sample label of the chip sample data. The PAT parameters in the PAT parameter group with the highest accuracy are identified as the target PAT parameters; The step of determining the judgment threshold of each PAT parameter group based on the test algorithm in each PAT parameter group and the chip sample data includes: calculating the chip sample data according to the first test algorithm in the test algorithm to obtain a first value; calculating the chip sample data according to the second test algorithm in the test algorithm to obtain a second value; and calculating the judgment threshold of the PAT parameter group using the following formula. ; ;in, This is the lower threshold among the decision thresholds in the PAT parameter group. This is the high threshold among the decision thresholds in the PAT parameter group. The preset low coefficient, For the preset high coefficient, The first value, This is the second value.

2. The method for determining the PAT parameters of a chip according to claim 1, characterized in that, The step of determining the accuracy of each PAT parameter group based on the judgment threshold of each PAT parameter group and the sample label of the chip sample data includes: The judgment threshold of each PAT parameter group is compared with the chip sample data to determine the PAT test result of the chip sample data corresponding to each PAT parameter group. The accuracy of each PAT parameter group is determined based on the PAT test results of the chip sample data corresponding to each PAT parameter group and the sample labels of the chip sample data.

3. The method for determining the PAT parameters of a chip according to claim 2, characterized in that, The step of determining the accuracy of each PAT parameter group based on the PAT test results of the chip sample data corresponding to each PAT parameter group and the sample labels of the chip sample data includes: The first value is obtained by counting the number of PAT test results of the chip sample data corresponding to the PAT parameter group that match the sample labels of the chip sample data. The ratio of the first value to the total number of chip sample data is determined as the accuracy of the PAT parameter group.

4. The method for determining the PAT parameters of a chip according to claim 1, characterized in that, The acquisition of chip sample data and multiple PAT parameter groups includes: Receive user input of the data source and corresponding filter conditions; Chip sample data that meet the filtering conditions in the data source are identified as target chip sample data.

5. A device for determining the PAT parameters of a chip, characterized in that, The PAT parameter determination device for the chip includes: The acquisition module is used to acquire chip sample data and various PAT parameter sets; the PAT parameter sets include test algorithms. The determination module is used to determine the judgment threshold for each PAT parameter group based on the test algorithm in each PAT parameter group and the chip sample data; The determining module is further configured to determine the accuracy of each PAT parameter group based on the judgment threshold of each PAT parameter group and the sample label of the chip sample data; The determining module is also used to determine the PAT parameter in the PAT parameter group with the highest accuracy as the target PAT parameter; Specifically, the determining module is used to: calculate the chip sample data according to the first test algorithm in the test algorithm to obtain a first value; calculate the chip sample data according to the second test algorithm in the test algorithm to obtain a second value; and calculate the judgment threshold of the PAT parameter group using the following formula. ; ;in, This is the lower threshold among the decision thresholds in the PAT parameter group. This is the high threshold among the decision thresholds in the PAT parameter group. The preset low coefficient, For the preset high coefficient, The first value, This is the second value.

6. An electronic device, characterized in that, include: The device includes a processor, a storage medium, and a bus, wherein the storage medium stores machine-readable instructions executable by the processor, and when the electronic device is running, the processor communicates with the storage medium via the bus, and the processor executes the machine-readable instructions to perform the steps of the PAT parameter determination method for a chip as described in any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that, when executed by a processor, performs the steps of the PAT parameter determination method for the chip as described in any one of claims 1 to 4.

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