Device monitoring circuit and burn-in test device

Abstract

The application discloses a device monitoring circuit and an aging test device, wherein the device monitoring circuit comprises a communication transceiver, a monitoring circuit, a temperature control circuit and a main control circuit; the monitoring circuit is connected with the aging test device; the main control circuit is connected with the monitoring circuit; the main control circuit is also connected with the temperature control circuit; and the main control circuit is also connected with a mobile terminal in communication through the communication transceiver. In the application, the device parameters of the aging test device are detected by the monitoring circuit and the corresponding monitoring signals are output; then the device parameters corresponding to the monitoring signals are transmitted to the mobile terminal through the communication transceiver; when the device parameters corresponding to the monitoring signals are not within the preset device parameter range, the main control circuit outputs an alarm signal to the mobile terminal; and the temperature control circuit controls the temperature of the air in the aging test device according to the monitoring signals and the continuous working time of the aging test device, so that the working personnel can know the running state of the aging test device in time and the safety of the test products is ensured.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of high-temperature aging test of display driver integrated circuit, and particularly relates to an equipment monitoring circuit and an aging test equipment. BACKGROUND

[0002] Display driver integrated circuits will be subjected to high-temperature aging test before leaving factory, and only the products passing the aging test can be defined as good products. Generally, the high-temperature aging test will last for tens of hours, and the test equipment may fail due to long-time high-temperature work in the aging room, and the test personnel cannot stay in the aging room for a long time to monitor the test equipment, so that the running state of the test equipment cannot be known in time, which causes great safety problems and easily leads to product damage. SUMMARY

[0003] The main purpose of the present application is to provide an equipment monitoring circuit, which aims to solve the problem that the aging test equipment has great safety hazards and easily causes test product damage due to long-time high-temperature work in the aging room.

[0004] To achieve the above purpose, the present application provides an equipment monitoring circuit, which comprises:

[0005] a communication transceiver;

[0006] a monitoring circuit, which is connected with the aging test equipment, and is used for detecting the equipment parameters of the aging test equipment and outputting corresponding monitoring signals;

[0007] a temperature control circuit, which is used for temperature regulation of air in the aging test equipment when working;

[0008] a main control circuit, which is connected with the monitoring circuit, and is also connected with the temperature control circuit, and is also connected with a mobile terminal through the communication transceiver to establish a communication connection, so as to transmit the equipment parameters corresponding to the monitoring signals to the mobile terminal, and is also used for outputting an alarm signal to the mobile terminal when the equipment parameters corresponding to the monitoring signals are not within a preset equipment parameter range, and controlling the temperature control circuit to make corresponding temperature regulation of air in the aging test equipment according to the monitoring signals and the continuous working time of the aging test equipment.

[0009] In an embodiment, the monitoring circuit comprises a temperature detection circuit, which is arranged in the aging test equipment, and is connected with the main control circuit, and is used for collecting the temperature in the aging test equipment and outputting corresponding temperature detection signals to the main control circuit.

[0010] In one embodiment, the temperature detection circuit includes:

[0011] At least one temperature sensor is provided, the detection end of each temperature sensor is placed inside the aging test equipment, and the output end of each temperature sensor is connected to the main control circuit.

[0012] In one embodiment, the temperature control circuit includes:

[0013] A heat dissipation circuit is connected to the main control circuit. The heat dissipation circuit is used to dissipate heat from the air inside the aging test equipment when a cooling control signal is received.

[0014] The main control circuit is also specifically used to calculate the temperature difference between the temperature value corresponding to the temperature detection signal and the preset temperature threshold, so as to output the corresponding cooling control signal to the heat dissipation circuit according to the temperature detection signal, so as to adjust the temperature of the air in the aging test equipment accordingly.

[0015] In one embodiment, the main control circuit is further configured to control the temperature control circuit to adjust the temperature of the air inside the aging test equipment to a corresponding degree when the continuous working time of the aging test equipment reaches a preset duration and / or the temperature value corresponding to the temperature detection signal reaches a preset temperature threshold.

[0016] In one embodiment, the main control circuit is further configured to output a cooling control signal for each additional first preset unit of working time when the continuous working time of the aging test equipment reaches a preset duration and the temperature value corresponding to the temperature detection signal reaches a preset temperature threshold, so as to perform temperature regulation on the air inside the aging test equipment once.

[0017] In one embodiment, the heat dissipation circuit includes:

[0018] A fan, the fan being used to rotate during operation;

[0019] A fan drive circuit is provided, wherein the input terminal of the fan is connected to the power supply, the input terminal of the fan drive circuit is connected to the output terminal of the fan, the output terminal of the fan drive circuit is grounded, and the controlled terminal of the fan drive circuit is connected to the main control circuit. The fan drive circuit is used to adjust the speed of the fan according to the received cooling control signal.

[0020] In one embodiment, the monitoring circuit further includes a voltage detection circuit. The detection terminal of the voltage detection circuit is connected to the aging test equipment, and the output terminal of the voltage detection circuit is connected to the main control circuit. The voltage detection circuit is used to detect the output voltage of the aging test equipment and output a corresponding voltage detection signal to the main control circuit.

[0021] In an embodiment, the device monitoring circuit comprises:

[0022] an indication circuit, connected with the master circuit, used for outputting an indication signal when working;

[0023] The master circuit is further used for outputting an indication control signal to control the indication circuit to work when the device parameter corresponding to the monitoring signal is not within the preset device parameter.

[0024] The application further provides an aging test device comprising the device monitoring circuit.

[0025] The technical scheme of the application detects the device parameter of the aging test device through the monitoring circuit and outputs a corresponding monitoring signal, and then transmits the device parameter corresponding to the monitoring signal to the mobile terminal through the communication transceiver; the master circuit outputs an alarm signal to the mobile terminal when the device parameter corresponding to the monitoring signal is not within the preset device parameter range, and controls the temperature control circuit to make corresponding temperature regulation on the air in the aging test device according to the monitoring signal and the continuous working time of the aging test device, so that the working personnel can know the running state of the aging test device in time, and the safety of the aging test device and the tested product is improved. BRIEF DESCRIPTION OF DRAWINGS

[0026] In order to more clearly illustrate the technical scheme in the embodiments of the application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or the prior art description. Obviously, the drawings in the following description only show some embodiments of the application, and for those skilled in the art, other drawings can also be obtained according to the structures shown in the drawings without creative labor.

[0027] Figure 1 It is a whole block diagram of an embodiment of the device monitoring circuit of the application;

[0028] Figure 2 It is a module schematic diagram of another embodiment of the device monitoring circuit of the application;

[0029] Figure 3 It is a module schematic diagram of another embodiment of the device monitoring circuit of the application;

[0030] Figure 4 It is a circuit diagram of an embodiment of the heat dissipation circuit of the device monitoring circuit of the application.

[0031] Explanation of reference numerals:

[0032] Reference Name Reference Name 10 Aging test equipment 21 Temperature monitoring circuit 20 Monitoring circuit 22 Voltage detection circuit 30 Master control circuit 221 Temperature sensor 40 Communication transceiver 61 Heat dissipation circuit 50 Mobile terminal R1~R3 First to third resistors 60 Temperature control circuit Q1 First switch tube 70 Indication circuit

[0033] The objectives, functional features and advantages of the present application will be further described with reference to the embodiments in combination with the accompanying drawings. DETAILED DESCRIPTION

[0034] The technical solutions in the embodiments of the present application will be clearly and completely described with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all the other embodiments obtained by a person of ordinary skill in the art without creative work are within the protection scope of the present application.

[0035] In addition, the descriptions such as “first”, “second” and the like in the present application are only for the purpose of description, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined with “first”, “second” can explicitly or implicitly include at least one of the features. In addition, the technical solutions of various embodiments can be combined with each other, but it must be based on the fact that a person of ordinary skill in the art can realize it. When the combination of technical solutions contradicts each other or cannot be realized, it should be considered that the combination of technical solutions does not exist, and is not within the protection scope required by the present application.

[0036] The display driving integrated circuit will be subjected to high-temperature aging test before leaving the factory. Only the products passing the aging test can be defined as good products. Generally, the high-temperature aging test will last for tens of hours. The test equipment may fail in the aging room working at high temperature for a long time. The test personnel cannot stay in the aging room for a long time to watch the test equipment, and cannot know the running state of the test equipment in time, which has a great safety problem and easily leads to product damage.

[0037] In order to solve the above problems, the present application provides a device monitoring circuit applied to an aging test device 10.

[0038] Reference Figure 1 In an embodiment of the present application, the device monitoring circuit comprises:

[0039] A communication transceiver 40;

[0040] A monitoring circuit 20 connected with the aging test device 10, the monitoring circuit 20 is used for detecting the device parameters of the aging test device 10 and outputting corresponding monitoring signals;

[0041] A temperature control circuit 60, which is used for temperature control of air in the aging test device 10 when working;

[0042] A main control circuit 30 is connected with the monitoring circuit 20, and is also connected with the temperature control circuit 60. The main control circuit 30 is also connected with the mobile terminal 50 through the communication transceiver 40 to transmit the device parameters corresponding to the monitoring signal to the mobile terminal 50. The main control circuit 30 is also used to output an alarm signal to the mobile terminal 50 when the device parameters corresponding to the monitoring signal are not within the preset device parameter range, and to control the temperature control circuit 60 to adjust the temperature of the air in the aging test equipment 10 according to the monitoring signal and the continuous working time of the aging test equipment 10.

[0043] In the embodiment, the monitoring circuit 20 can be implemented by a temperature detection circuit or a voltage detection circuit 22. It can be understood that the temperature detection circuit or the voltage detection circuit 22 can detect the temperature or the voltage of the aging test equipment 10 and output the corresponding monitoring signal to the main control circuit 30, so as to realize the monitoring of the state of the aging test equipment 10.

[0044] In the embodiment, the communication transceiver 40 can be implemented by one or a combination of Bluetooth, wifi or 433M wireless module. The communication transceiver 40 can be connected with the mobile terminal 50 to transmit the device parameters corresponding to the monitoring signal to the mobile terminal 50, so that the staff can know the running state of the aging test equipment 10 in real time.

[0045] In the embodiment, the main control circuit 30 can be implemented by a main controller, such as an MCU, a DSP (Digital Signal Process), an FPGA (Field Programmable Gate Array), an SOC (System On Chip), etc. In the embodiment, the temperature control circuit 60 can be implemented by a device with a cooling function, such as a fan, etc. It can be understood that when the device parameter corresponding to the monitoring signal is not within the preset device parameter range, the main controller outputs an alarm signal to the mobile terminal 50 to inform the staff that the aging test equipment 10 is working abnormally, so as to be checked in time to ensure that the aging test equipment 10 works normally. Specifically, the preset temperature is 70 degrees, and when the temperature value corresponding to the temperature detection signal output by the temperature detection circuit is 75 degrees, the temperature value exceeds the preset temperature, and the main controller outputs an alarm signal to the mobile terminal 50 to inform the staff that the aging test equipment 10 is abnormal. It should be noted that the number of mobile terminals 50 is at least one, that is, multiple staff can be notified at the same time to handle the situation that the aging test equipment 10 works abnormally in time. At the same time, the main controller can also control the temperature control circuit 60 to work according to the monitoring signal and the continuous working time of the aging test equipment 10, that is, to adjust the temperature of the air in the aging test equipment 10 by a corresponding size. Generally speaking, high-temperature aging test can last for tens of hours, so that the aging test equipment 10 is easy to fail when working in the aging room for a long time at high temperature. In the embodiment, the main controller can control the temperature control circuit 60 in combination with the monitoring signal and the continuous working time of the aging test equipment 10. Specifically, when the current temperature value (75 degrees) exceeds the preset temperature (70 degrees), the air in the aging test equipment 10 is adjusted to the first temperature regulation; when the current temperature value (60 degrees) does not exceed the preset temperature (70 degrees), the continuous working time of the aging test equipment 10 is one hour, that is, the air in the aging test equipment 10 is adjusted to the first temperature regulation; when the temperature value (75 degrees) exceeds the preset temperature (70 degrees), and the continuous working time of the aging test equipment 10 is one hour, the air in the aging test equipment 10 is adjusted to the second temperature regulation; when the current temperature value (75 degrees) exceeds the preset temperature (70 degrees), and the continuous working time of the aging test equipment 10 is two hours, the air in the aging test equipment 10 is adjusted to the third temperature regulation.When the temperature is too high, the main controller can control the temperature control circuit 60 to work according to the temperature difference between the current temperature value and the preset temperature threshold; or when the working time is too long, the main controller can control the temperature control circuit 60 to work according to the working time; or when the temperature reaches a certain threshold and the time reaches a certain threshold, the main controller can control the temperature control circuit 60 to work according to the temperature difference and the working time, so as to realize the temperature regulation of the air in the aging test equipment 10 by the temperature control circuit 60 according to the monitoring signal and the continuous working time of the aging test equipment 10.

[0046] The technical scheme of the present application detects the device parameters of the aging test equipment 10 through the monitoring circuit 20 and outputs the corresponding monitoring signal, and then transmits the device parameters corresponding to the monitoring signal to the mobile terminal 50 through the communication transceiver 40; the main control circuit 30 outputs an alarm signal to the mobile terminal 50 when the device parameters corresponding to the monitoring signal are not within the preset device parameter range, and controls the temperature control circuit 60 to regulate the temperature of the air in the aging test equipment 10 according to the monitoring signal and the continuous working time of the aging test equipment 10, so that the operating personnel can know the running state of the aging test equipment 10 in time, and the safety of the aging test equipment 10 and the tested product is improved.

[0047] Referring to Figure 2 In an embodiment, the monitoring circuit 20 includes a temperature detection circuit, which is arranged in the aging test equipment 10 and connected with the main control circuit 30, and is used to collect the temperature in the aging test equipment 10 and output a corresponding temperature detection signal to the main control circuit 30.

[0048] In this embodiment, the temperature detection circuit is arranged in the aging test equipment 10 to detect the temperature in the aging test equipment 10 and output a corresponding temperature detection signal to the main control circuit 30, so as to realize the monitoring of the temperature in the aging test equipment 10.

[0049] In actual application, most of the existing detection devices are only provided with one temperature sensor 221, which can only detect the temperature at a certain moment. Since the temperature in the aging test equipment 10 changes with time and environment, the temperature data measured by only one temperature sensor 221 is not sufficient as a good basis to judge the temperature condition of the aging test equipment 10. In this embodiment, multiple temperature sensors 221 are arranged to detect the temperature of the water solution, so as to improve the accuracy of the data.

[0050] Therefore, referring to Figure 3In an embodiment, the temperature detection circuit comprises at least one temperature sensor 221, a detection end of each temperature sensor 221 is arranged in the aging test device 10, and an output end of each temperature sensor 221 is connected to the main control circuit 30.

[0051] In the embodiment, the temperature sensor 221 can be preferably a thermistor. Compared with a lead thermistor, the resistance of the thermistor changes about 10 times of the lead thermistor when the temperature changes the same, so that the thermistor is more sensitive to the temperature change. Therefore, the embodiment can improve the accuracy of the data by collecting the temperature in the aging test device 10 through the thermistor.

[0052] Referring to Figure 2 In an embodiment, the monitoring circuit 20 further comprises a voltage detection circuit 22, a detection end of the voltage detection circuit 22 is connected to the aging test device 10, an output end of the voltage detection circuit 22 is connected to the main control circuit 30, and the voltage detection circuit 22 is used for detecting the output voltage of the aging test device 10 and outputting a corresponding voltage detection signal to the main control circuit 30.

[0053] In the embodiment, the detection end of the voltage detection circuit 22 is connected to the aging test device 10 to detect the output voltage of the aging test device 10 and output a corresponding voltage detection signal to the main control circuit 30, so as to realize the detection of the voltage of the aging test device 10. In actual application, the voltage detection circuit 22 can be preferably a voltage dividing resistor, an input end of the voltage dividing resistor is connected to the aging test device 10, an output end of the voltage dividing resistor is connected to the main control circuit 30, the voltage dividing resistor divides the output voltage of the aging test device according to a preset voltage dividing ratio, and then outputs a voltage detection signal to the main control circuit 30, and then the main control circuit 30 transmits the voltage detection signal to the mobile terminal 50 through the communication transceiver 40, so that the worker can know the output voltage of the aging test device 10 in time, and when the output voltage of the aging test device 10 is not in the preset voltage range, the main control circuit 30 outputs an alarm signal to the mobile terminal 50 to remind the worker that the output voltage of the aging test device 10 is abnormal, so as to protect the safety of the aging test device 10 and the test product.

[0054] Referring to Figure 2 In an embodiment, the temperature control circuit 60 comprises:

[0055] A heat dissipation circuit 61, the heat dissipation circuit 61 is connected to the main control circuit 30, and the heat dissipation circuit 61 is used for working when receiving a cooling control signal to dissipate heat of air in the aging test device 10.

[0056] The main control circuit 30 is also specifically configured to calculate a temperature difference between a temperature value corresponding to the temperature detection signal and a preset temperature threshold, and output a corresponding cooling control signal to the heat dissipation circuit 61 according to the temperature detection signal, so as to make corresponding temperature regulation on the air in the aging test equipment 10.

[0057] In this embodiment, the heat dissipation circuit 61 can be a fan to promote air circulation and heat exchange in the aging test equipment 10, so as to achieve cooling in the aging test equipment 10. Specifically, the heat dissipation circuit 61 includes: a fan configured to rotate when working; a fan driving circuit, an input end of the fan is connected with a power supply, an input end of the fan driving circuit is connected with an output end of the fan, an output end of the fan driving circuit is grounded, and a controlled end of the fan driving circuit is connected with the main control circuit 30, and the fan driving circuit is configured to adjust a rotating speed of the fan according to the cooling control signal received. The fan driving circuit can be implemented by using a MOS tube and the like which can drive the fan to work, wherein the fan driving circuit includes a first switch tube Q1, a first resistor R1, a second resistor R2 and a third resistor R3, and the specific connection relationship is shown in Figure 4 , M+ and M- are respectively connected with an anode and a cathode of the fan. It can be understood that the main control circuit 30 calculates a temperature difference between a temperature value corresponding to the temperature detection signal received and a preset temperature threshold, and then outputs a corresponding cooling control signal to the fan driving circuit according to the temperature detection signal, so as to make corresponding temperature regulation on the air in the aging test equipment 10, that is, to adjust the rotating speed of the fan according to the cooling control signal, so as to achieve heat dissipation of the air in the aging test equipment 10.

[0058] Referring to Figure 2 In an embodiment, the main control circuit 30 is also specifically configured to control the temperature control circuit 60 to make corresponding temperature regulation on the air in the aging test equipment 10 when a continuous working time length of the aging test equipment 10 reaches a preset time length and / or a temperature value corresponding to the temperature detection signal reaches a preset temperature threshold.

[0059] Generally, the high-temperature aging test lasts for tens of hours, and the aging test equipment 10 is prone to failure when working at high temperature for a long time in the aging room. In the embodiment, the master control circuit 30 controls the operation of the temperature control circuit 60 according to the temperature detection signal and / or the continuous working time of the aging test equipment 10, that is, the temperature control circuit 60 can be controlled to work when the temperature value corresponding to the temperature detection signal exceeds the preset temperature threshold, or when the continuous working time of the aging test equipment 10 reaches the preset time length, or when the temperature value corresponding to the temperature detection signal reaches the preset temperature threshold and the continuous working time of the aging test equipment 10 reaches the preset time length, thereby realizing temperature regulation of the air in the aging test equipment 10.

[0060] Referring to Figure 2 In an embodiment, the master control circuit 30 is further configured to output a cooling control signal to regulate the temperature of the air in the aging test equipment 10 every time the continuous working time of the aging test equipment 10 reaches a first preset unit working time when the temperature value corresponding to the temperature detection signal reaches a preset temperature threshold.

[0061] In the embodiment, the first preset unit working time is one hour. It can be understood that when the temperature value corresponding to the temperature detection signal exceeds the preset temperature threshold and the continuous working time of the aging test equipment 10 is one hour, the master control circuit 30 outputs a cooling control signal to regulate the temperature of the air in the aging test equipment 10 to the second temperature regulation level. When the temperature value corresponding to the temperature detection signal exceeds the preset temperature and the continuous working time of the aging test equipment 10 is two hours, the master control circuit 30 outputs a cooling control signal again to regulate the temperature of the air in the aging test equipment 10 to the third temperature regulation level. In this way, the master control circuit 30 controls the temperature control circuit 60 to regulate the temperature of the air in the aging test equipment 10 according to the temperature detection signal and the continuous working time of the aging test equipment 10, which can effectively avoid the situation that the temperature of the air in the aging test equipment 10 is too low due to the cooling regulation of the air in the aging test equipment 10 when the continuous working time is accumulated while the current temperature value does not exceed the preset temperature threshold (i.e., when the aging test equipment 10 is working normally), which causes the aging test equipment 10 to fail to work normally. Therefore, the control accuracy of the temperature control circuit 60 is improved to ensure that the aging test equipment 10 works normally.

[0062] Referring to Figure 2 In an embodiment, the device monitoring circuit comprises:

[0063] The indication circuit 70 is connected with the master control circuit 30, and the indication circuit 70 is configured to output an indication signal when working.

[0064] The main control circuit 30 is further configured to output an indication control signal to control the indication circuit 70 to work when the device parameter corresponding to the monitoring signal is not within the preset device parameter.

[0065] In actual application, there are cases that multiple mobile terminals 50 bound by the aging test device 10 are not near the aging test device 10, and thus the abnormal situation of the aging test device 10 cannot be handled in time after receiving the alarm signal. Therefore, the embodiment sets the indication circuit 70 to output an indication signal in time when the device parameter corresponding to the monitoring signal is not within the preset device parameter, so as to visually inform the staff near the aging test device 10 as soon as possible and handle the abnormal situation in time.

[0066] In the embodiment, the preset device parameter is the device parameter of the normal working of the aging test device 10. When the aging test device 10 works, the device parameter corresponding to the monitoring signal is not within the preset device parameter. The main control circuit 30 judges that the aging test device 10 is in an abnormal working state, and then outputs an indication control signal to the indication circuit 70 to control the indication circuit 70 to work, so as to inform the staff that the aging test device 10 is in an abnormal working state.

[0067] The application further provides an aging test device 10, which comprises the device monitoring circuit described above. The specific structure of the device monitoring circuit is referred to the above embodiments. Since the aging test device 10 adopts all the technical solutions of the above embodiments, it has all the beneficial effects brought by the technical solutions of the above embodiments, which will not be described here.

[0068] The above is only the optional embodiment of the application, and does not limit the patent scope of the application. Any equivalent structural transformation, direct / indirect application in other related technical fields based on the inventive concept of the application and the content of the specification and drawings are included in the patent protection scope of the application.

Claims

1. A device monitoring circuit applied to an aging test device, characterized in that, The device monitoring circuit comprises: a communication transceiver; a monitoring circuit connected with the aging test device, the monitoring circuit being configured to detect device parameters of the aging test device and output corresponding monitoring signals; a temperature control circuit configured to regulate the temperature of air in the aging test device when the aging test device is in operation; a master control circuit connected with the monitoring circuit, the master control circuit also being connected with the temperature control circuit, the master control circuit also being configured to establish a communication connection with a mobile terminal through the communication transceiver to transmit the device parameters corresponding to the monitoring signals to the mobile terminal, the master control circuit also being configured to output an alarm signal to the mobile terminal when the device parameters corresponding to the monitoring signals are not within a preset device parameter range, and to control the temperature control circuit to regulate the temperature of air in the aging test device according to the monitoring signals and the continuous operation time of the aging test device; the monitoring circuit comprises a temperature detection circuit, the temperature detection circuit being arranged in the aging test device, the temperature detection circuit being connected with the master control circuit, the temperature detection circuit being configured to collect the temperature in the aging test device and output corresponding temperature detection signals to the master control circuit; the master control circuit is also specifically configured to output a cooling control signal to regulate the temperature of air in the aging test device once every time the continuous operation time of the aging test device reaches a preset time length and the temperature value corresponding to the temperature detection signals reaches a preset temperature threshold.

2. The device monitoring circuit of claim 1, wherein, The temperature detection circuit comprises: at least one temperature sensor, the detection end of each temperature sensor being arranged in the aging test device, the output end of each temperature sensor being connected with the master control circuit.

3. The device monitoring circuit of claim 1, wherein, The temperature control circuit comprises: a heat dissipation circuit connected with the master control circuit, the heat dissipation circuit being configured to work to dissipate heat from air in the aging test device when receiving the cooling control signal; the master control circuit is also specifically configured to calculate the temperature difference between the temperature value corresponding to the temperature detection signals and the preset temperature threshold, and to output corresponding cooling control signals to the heat dissipation circuit according to the temperature detection signals to regulate the temperature of air in the aging test device by a corresponding size.

4. The device monitoring circuit of claim 3, wherein, The heat dissipation circuit comprises: a fan configured to rotate when working; a fan driving circuit, the input end of the fan being connected with a power supply, the input end of the fan driving circuit being connected with the output end of the fan, the output end of the fan driving circuit being grounded, and the controlled end of the fan driving circuit being connected with the master control circuit, the fan driving circuit being configured to adjust the rotating speed of the fan according to the received cooling control signal.

5. The equipment monitoring circuit as described in claim 1, characterized in that, The monitoring circuit further comprises a voltage detection circuit, a detection end of the voltage detection circuit being connected with the aging test device, and an output end of the voltage detection circuit being connected with the main control circuit, the voltage detection circuit being configured to detect an output voltage of the aging test device and output a corresponding voltage detection signal to the main control circuit.

6. The device monitoring circuit of claim 1, wherein, The device monitoring circuit comprises: an indication circuit, the indication circuit being connected with the main control circuit, and the indication circuit being configured to output an indication signal when working; the main control circuit is further configured to output an indication control signal to control the indication circuit to work when the monitoring signal corresponds to a device parameter that is not within preset device parameters.

7. An aging test apparatus characterized by comprising: The aging test device comprises the device monitoring circuit according to any one of claims 1-6.

Images