A monocular camera-based vertical pin guide method
By combining a monocular camera and an adjustment platform, and utilizing a multi-pattern positioning algorithm, the problems of inaccurate positioning and low efficiency in chip testing were solved, achieving high-precision automated chip testing and reducing costs.
Patent Information
- Application Number
- CN202310290452.7
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-03-23
- Publication Date
- 2026-01-09
- Estimated Expiration
- 2043-03-23
AI Technical Summary
In existing technologies, chip testing is inefficient, inaccurate in positioning, and costly, making it difficult to meet the needs of automated production. In particular, when chip processing errors exist, vertical probes cannot accurately observe and effectively land on the chip.
By using a monocular camera in conjunction with an adjustment platform, the system identifies the positional relationship between the openings on the adjustment platform and the test product. It then establishes a positioning algorithm using multiple pattern combinations to calculate the standard pin insertion position of the vertical probe. Finally, it achieves automatic positioning by combining visual recognition and mechanical adjustment.
It improves the accuracy of pin placement calculation, eliminates machining errors, achieves efficient and accurate chip testing, reduces costs, and improves system pin placement accuracy.
Smart Images

Figure CN116520127B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the technical field of vertical pin card guidance methods based on monocular cameras, and particularly to a vertical pin card guidance method based on monocular cameras. Background Technology
[0002] With the rapid development of integrated circuits, the demand for consumer electronics products such as mobile phones, watches, and computers has surged. Chip sizes are getting smaller and their functions are increasing. Chip functional testing has become an important standard for evaluating product qualification. Currently, one method for chip functional testing is manual testing using a microscope. This method is not only inefficient and has poor data stability, but also has high labor costs, making it difficult to adapt to today's increasingly automated production lines. Another testing method is to use a flying probe tester to inspect multiple points on the chip one by one. However, this method cannot meet the requirements of multi-point joint testing and has low testing efficiency. At the same time, current flying probe testers use vertical probes in conjunction with vision components to observe and test the chip from above. Since there is a slight dimensional error in the chip during actual manufacturing, a single top-down vision cannot accurately observe the dimensional error of the chip, making the vertical probe landing point invalid and reducing the effectiveness of the test. If multiple cameras are used to establish the relationship between the vertical probe and the product to improve the pin placement accuracy, it will lead to complex machine design and increased costs. Summary of the Invention
[0003] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and provide a vertical needle card guidance method that uses a monocular camera for rapid and accurate positioning and quickly performs needle testing by measuring the center position of the product.
[0004] The technical solution adopted in this invention is as follows: This invention includes a detection camera and an adjustment platform. The detection camera detects and coordinates with the adjustment platform and the test product, and transmits the data to an external data control mechanism. The adjustment platform is provided with several vertical probes, which are conductively engaged with the product. The adjustment platform has three openings. This vertical probe guidance method positions the test product according to the following steps:
[0005] Step S1. The detection camera visually identifies the positional relationship between the three openings in the adjustment platform and the test product. The three openings are points A, B, and C. When the test product is parallel to the adjustment platform, the line AB connecting points A and B passes through the center point of the product. The line AC connecting points A and C forms a certain angle with the line AB. The detection camera identifies the positional relationship between the reserved hole of the test product and the three openings.
[0006] Step S2. The adjustment platform rotates at a certain angle according to the visual recognition result of the detection camera, so that the plurality of vertical probes are perpendicular to the test product;
[0007] Step S3. If there is a deviation in the distance from the vertical center of the several vertical probes to the center of the test product, adjust the platform to correct the position of the product center point. After the test product is in place, the point where the vertical centers of the several vertical probes contact each other is set as P0.
[0008] Step S4. The adjustment platform drives several vertical probes to move continuously to the left, moving 0.01mm each time. Each movement performs a continuity test on the test product. If the product fails to conduct completely after three consecutive continuity tests, it is determined to be the left limit. The adjustment platform drives several vertical probes to reset to the P0 position. Then, the above actions are repeated to verify and record the limit positions in the right, up and down directions.
[0009] Step S5. Calculate the center in the X-axis direction using the obtained left and right extreme positions, and calculate the center in the Y-axis direction using the obtained upper and lower extreme positions, to obtain the product's needle center point P1.
[0010] Furthermore, if there is an angular offset error between the initial angle of the test product and the adjustment platform, step S4 is repeated until point P is obtained after N repetitions. N Approximately to the center point of the actual product.
[0011] Furthermore, in step S1, the rectangular pattern of the test product is identified in areas A and C, and the circular pattern of the test product is identified in area B.
[0012] The beneficial effects of this invention are as follows: Because this invention establishes a positioning algorithm by combining three sets of patterns (A, B, and C), and uses the method of combining the center of multiple patterns to jointly calculate the angle, it significantly improves the overall accuracy of needle placement calculation. This effectively avoids position and angle errors caused by overall size scaling during product processing. The standard needle placement search algorithm establishes a standard for needle placement calculation, effectively avoiding the impact of poor positioning accuracy and unstable needle placement testing caused by directly using needle blocks, differences between theoretical and actual dimensions in product drawings, etc. The organic combination of a single detection camera and adjustment platform, along with a vertical needle card guidance method, forms an automatic search effect for the standard needle placement position of the vertical probe. The actual probe and product contact search method strictly eliminates errors caused by machining, greatly improving the needle placement accuracy of the system. Attached Figure Description
[0013] Figure 1 This is a flowchart of the product center positioning process of the present invention;
[0014] Figure 2 This is a flowchart of the automatic standard needle center finding process of the present invention;
[0015] Figure 3 This is a schematic diagram illustrating the horizontal entry of the test product into the test environment according to the present invention;
[0016] Figure 4 This is a flowchart of the process by which the test product enters the test environment at any angle according to the present invention;
[0017] Figure 5 This is a schematic diagram of Embodiment 1 of the present invention;
[0018] Figure 6 This is the control flowchart of Embodiment 2 of the present invention. Detailed Implementation
[0019] Example 1
[0020] like Figures 1 to 6 As shown, in this embodiment, the present invention includes a detection camera and an adjustment platform. The detection camera detects the adjustment platform and the test product and transmits the data to an external data control mechanism. The adjustment platform is equipped with several vertical probes, which are conductively engaged with the product. The adjustment platform has three openings and is a UVW three-phase moving platform. This vertical probe guidance method positions the test product according to the following steps:
[0021] Step S1. The detection camera visually identifies the positional relationship between the three openings in the adjustment platform and the test product. The three openings are points A, B, and C. When the test product is parallel to the adjustment platform, point A and point B form a line AB that passes through the center point of the product. Point A and point C form a line AC that forms an angle with line AB. The detection camera identifies the positional relationship between the reserved hole on the test product and the three openings. Points A, B, and C are located at the three apex corners of the adjustment platform. The test product is equipped with a pattern for the detection camera to recognize. The product's own processing tolerance will cause a scaling tolerance between the produced product and the actual design size. If only one set of patterns A, B, and C is used... As the overall product's attitude positioning is crucial, test products with scaling tolerances experience inaccurate positioning due to positional changes during testing. Vertical probes cannot effectively perform connectivity tests on the test products. This demonstrates that processing errors in a single pattern can cause unidirectional error accumulation in the overall product positioning. However, if two diagonal patterns are used to establish the product position, the symmetry can eliminate the errors caused by scaling, ensuring that the product center does not shift. Using the center position of the diagonal rectangle's connecting line as the product center can eliminate the cumulative error caused by product scaling. Even if the angle of the test product changes, the center position of its diagonal connecting line remains unchanged. Using the side AC connecting line as the angle recognition calculation for the test product further eliminates the angle change error caused by scaling.
[0022] Step S2. The adjustment platform rotates at a certain angle according to the visual recognition result of the detection camera, so that the plurality of vertical probes are perpendicular to the test product;
[0023] Step S3. If there is a deviation in the distance from the vertical center of the several vertical probes to the center of the test product, adjust the platform to correct the position of the product center point. After the test product is in place, the point where the vertical centers of the several vertical probes contact each other is set as P0.
[0024] Step S4. In step S3, the offset angle between the adjustment platform and the test product is detected to be 0 degrees. The adjustment platform drives several vertical probes to move continuously to the left, moving 0.01mm each time. Each movement performs a continuity test on the test product. When three consecutive continuity tests fail to achieve full continuity, it is determined to be the left limit. The adjustment platform drives several vertical probes to reset to the P0 position. Then, the above actions are repeated to verify and record the limit positions in the right, up, and down directions.
[0025] Step S5. Calculate the center in the X-axis direction using the obtained left and right extreme positions, and calculate the center in the Y-axis direction using the obtained upper and lower extreme positions, to obtain the product's needle center point P1.
[0026] Example 2
[0027] In this embodiment, steps S1-S3 are the same as in embodiment 1. In step S3, the detection camera identifies an angular offset in the test product. The operator manually moves the adjustment platform to a position where several vertical probes are fully conductive and sets this initial point as P0. The adjustment platform drives several vertical probes to move sequentially in four directions: left, right, up, and down. The distance between each landing point is 0.01mm. Three consecutive failures to achieve full conductivity are considered the left limit. After reaching the limit position each time, the probes are reset to the initial point P0, and the four limit positions (left, right, up, and down) are recorded. The midpoint between the left and right limits, and the midpoint between the upper and lower limits, is taken to obtain position P1. Then, using P1 as the reference point, the above actions are repeated to find the standard needle insertion position. The more repetitions, the higher the needle insertion point P1 becomes. N The closer the point is to the center of the needle placement position on the test product.
[0028] In this embodiment, in step S1, the rectangular pattern of the test product is identified in areas A and C, and the circular pattern of the test product is identified in area B.
[0029] Although the embodiments of the present invention are described with reference to actual solutions, they do not constitute a limitation on the meaning of the present invention. Modifications to the embodiments and combinations with other solutions based on this specification will be obvious to those skilled in the art.
Claims
1. A vertical pin card guidance method based on a monocular camera, characterized in that: It includes a detection camera and an adjustment platform. The detection camera detects the alignment between the adjustment platform and the test product and transmits the data to an external data control mechanism. The adjustment platform is equipped with several vertical probes, which are conductively engaged with the product. The adjustment platform has three openings. This vertical probe guidance method positions the test product according to the following steps: Step S1. The detection camera visually identifies the positional relationship between the three openings in the adjustment platform and the test product. The three openings are points A, B, and C. When the test product is parallel to the adjustment platform, a line AB is formed connecting points A and B, passing through the center point of the product. A line AC is formed connecting points A and C, forming an angle with line AB. The detection camera identifies the positional relationship between the reserved holes of the test product and the three openings. Specifically, the A and C areas identify a rectangular pattern of the test product, and the B area identifies a circular pattern of the test product. The detection camera identifies the positional relationship between the reserved holes of the test product and the three openings. Points A, B, and C are located at the three apex corners of the adjustment platform, and the test product is correspondingly equipped with patterns for the detection camera to identify. Step S2. The adjustment platform rotates at a certain angle according to the visual recognition result of the detection camera, so that the plurality of vertical probes are perpendicular to the test product; Step S3. If there is a deviation in the distance from the vertical center of the several vertical probes to the center of the test product, adjust the platform to correct the position of the product center point. After the test product is in place, the point where the vertical centers of the several vertical probes contact each other is set as P0. Step S4. The adjustment platform drives several vertical probes to move continuously to the left, moving 0.01mm each time. Each movement performs a continuity test on the test product. If the product fails to conduct completely after three consecutive continuity tests, it is determined to be the left limit. The adjustment platform drives several vertical probes to reset to the P0 position. Then, the above actions are repeated to verify and record the limit positions in the right, up and down directions. Step S5. Calculate the center in the X-axis direction using the obtained left and right extreme positions, and calculate the center in the Y-axis direction using the obtained upper and lower extreme positions, to obtain the product's needle center point P1.
2. The vertical pin card guidance method based on a monocular camera according to claim 1, characterized in that: If there is an angular offset error between the initial angle of the test product and the adjustment platform, repeat step S4 until point P is obtained after N repetitions. N Approximately to the center point of the actual product.
Citation Information
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