A kind of integrated test system and method of strapdown side window infrared seeker

Abstract

The present application belongs to the technical field of whole machine test of infrared homing head, and specifically provides a kind of comprehensive test system and method of strapdown side window infrared homing head, and the present test system is used for the whole machine test of a kind of strapdown side window infrared homing head, and the test system is mainly composed of industrial computer containing 1553B control panel, host computer software, video acquisition card and electronic box containing fire control throw-out shell power supply, fire control analog load, decompression board and digital oscilloscope and printer.The 1553B communication control panel is used to simulate receiving and processing the communication instruction sent by missile in real time, and each test item of infrared homing head is executed by host computer software in the form of man-machine interface;Digital video and analog video are displayed by video test software and processed according to the protocol.The whole machine test simulation, detection and acceptance of side window infrared homing head are realized.Especially, it has the functions of throw-out shell, telemetry, 1553B real-time communication, real-time operation, one-key fast test, automatic storage and automatic output test report.

Description

Technical Field

[0001] This invention relates to the field of infrared seeker testing technology, and more specifically, to a strapdown side-window infrared seeker integrated testing system and method. Background Technology

[0002] Currently, there is no integrated testing system for infrared seeker products used in simulation and acceptance testing of hypersonic missile side-window infrared seekers. Especially for strapdown side-window infrared seekers, the only available testing systems and methods are target simulation-based. These systems require large, fixed equipment such as vibration tables, swing tables, and precision motion turntables, severely limiting their application space and limiting the range of tests performed. More comprehensive testing systems are typically temporary platforms, including a control computer, host computer, analog video monitor, digital and analog video acquisition cards, various power modules, oscilloscope, control function modules, and circuit boards. These single-target simulation testing systems and simplified testing platforms cannot meet the simulation testing requirements of modern hypersonic missile infrared seekers.

[0003] The existing testing system has the following main problems:

[0004] 1. Lack of a comprehensive, integrated side-window infrared seeker testing system;

[0005] 2. No 1553B real-time communication, real-time operation, one-click quick testing, automatic storage, and automatic output and printing of test data;

[0006] 3. No-discharge testing and telemetry functions;

[0007] 4. The temporary test platform environment is complex, the modules are scattered, and the workload is large;

[0008] 5. Temporary testing platforms have low stability and reliability;

[0009] 6. Inconvenient to carry and transport, and its use is restricted in certain situations. Summary of the Invention

[0010] This invention addresses the technical problem of limited functionality in existing testing systems for infrared seeker head products.

[0011] This invention provides a comprehensive testing system for a strapdown side-window infrared seeker. The test system is used to test a strapdown side-window infrared seeker for a hypersonic missile. The infrared seeker is rigidly connected to the missile body fairing and is installed inside the missile body. The optical window is naturally integrated with the outer surface of the fairing. The side window, which is the optical window of the infrared seeker, is installed in the first quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally.

[0012] The optical window of the infrared seeker is installed in the lower I quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally.

[0013] The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and the industrial control computer executes various test items of the infrared seeker through a human-machine interface. All test information is finally displayed on the display interface of the industrial control computer to show the target results.

[0014] Preferably, the 1553B interface of the infrared seeker communicates bidirectionally with the industrial control computer via a 1553B board. The industrial control computer performs a one-click test, stores the data in the storage unit, and automatically outputs the printed results.

[0015] Preferably, the system's 28V / 26A DC power supply simulates missile power supply to the infrared seeker's pyrotechnic power interface for shroud ejection, and then ignites the simulated load fixture to perform shroud ejection testing.

[0016] Preferably, the infrared seeker interface is connected to the industrial control computer of the image compression test fixture to complete the LVDS telemetry function. The industrial control computer of the fixture is equipped with image decompression software for host computer testing.

[0017] Preferably, the infrared seeker interface is connected to the tooling control computer and hard time synchronization interface to complete the synchronization 422 function.

[0018] Preferably, the infrared seeker's analog video interface is communicatively connected to the analog video capture card to realize the analog video display output function;

[0019] The infrared seeker interface connects with the digital video acquisition card and the industrial control computer to achieve digital video display output.

[0020] Preferably, the industrial computer, electronic box, oscilloscope, and printer are all integrated into a tightly sealed enclosure, and all test interfaces are concentrated on the panel of the enclosure.

[0021] This invention also provides a comprehensive testing method for a strapdown side-window infrared seeker. The method is used in a comprehensive testing system for strapdown side-window infrared seekers, and the test object is a hypersonic missile's strapdown side-window infrared seeker. It includes: a rigid connection between the infrared seeker and the missile body fairing; the infrared seeker is installed inside the missile body; and the optical window is naturally integrated with the outer surface of the fairing. The side window, i.e., the optical window of the infrared seeker, is installed in the first quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the missile body's axis, and the optical window laterally acquires target information.

[0022] The optical window of the infrared seeker is installed in the lower I quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally.

[0023] The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and the industrial control computer executes various test items of the infrared seeker through a human-machine interface. All test information is finally displayed on the display interface of the industrial control computer to show the target results.

[0024] The present invention also provides an electronic device, including a memory and a processor, wherein the processor is used to execute a computer management program stored in the memory to implement the steps of the strapdown side window infrared seeker integrated testing method as described above.

[0025] The present invention also provides a computer-readable storage medium storing a computer management program thereon, which, when executed by a processor, implements the steps of the strapdown side window infrared seeker integrated testing method as described above.

[0026] Beneficial Effects: This invention provides a comprehensive testing system and method for a strapdown side-window infrared seeker. The method includes: clamping the infrared seeker inside a fairing; connecting each interface of the infrared seeker to an electronic box via an interface on the fairing; performing comprehensive tests on the infrared seeker through the electronic box and sending the test data to an industrial control computer; and processing the data and displaying the test results on the interface of the industrial control computer. This solution is used for the overall testing simulation and acceptance of side-window infrared seekers. It realizes the overall testing simulation, inspection, and acceptance of side-window infrared seekers. In particular, it has functions such as fairing throw-out, telemetry, 1553B real-time communication, real-time operation, one-click rapid testing, automatic storage, and automatic output of test reports. The comprehensive testing system is easy to transport and carry, and can be quickly connected and set up, greatly improving the efficiency of scientific research and production, and saving valuable time, manpower, and other scientific research resources. The entire testing system has good reliability and stability, and is of great significance for the testing simulation, inspection, and production acceptance of side-window infrared seekers. Attached Figure Description

[0027] Figure 1 This is a schematic diagram of the installation of the strapdown side window infrared guide head provided by the present invention;

[0028] Figure 2 A schematic diagram of the radial cross-section of the projectile body of the strapdown side-window infrared seeker provided by the present invention.

[0029] Figure 3 A diagram illustrating the composition of the strapdown side-window infrared seeker integrated testing system provided by this invention;

[0030] Figure 4Flowchart of the integrated testing method for the strapdown side window infrared seeker provided by the present invention;

[0031] Figure 5 This is a schematic diagram of the test items for the host computer control software provided by the present invention;

[0032] Figure 6 A schematic diagram of the hardware structure of a possible electronic device provided by the present invention;

[0033] Figure 7 This is a schematic diagram of the hardware structure of a possible computer-readable storage medium provided by the present invention. Detailed Implementation

[0034] The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings and examples. The following examples are for illustrative purposes only and are not intended to limit the scope of the invention.

[0035] like Figures 1 to 5 As shown, this invention provides a comprehensive testing system for a strapdown side-window infrared seeker. The test object of the system is a strapdown side-window infrared seeker for a hypersonic missile. The infrared seeker is rigidly connected to the missile body fairing and is installed inside the missile body. The optical window is naturally integrated with the outer surface of the fairing. The side window, which is the optical window of the infrared seeker, is installed in the first quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally.

[0036] The optical window of the infrared seeker is installed in the lower I quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally.

[0037] The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and the industrial control computer executes various test items of the infrared seeker through a human-machine interface. All test information is finally displayed on the display interface of the industrial control computer to show the target results.

[0038] The side window and angled design, combined with the placement of active and passive radars and detection devices, avoids radar obstruction issues. Mounting the optical window of the infrared seeker in the first quadrant of the missile body allows for more accurate targeting of ground or water targets, such as... Figure 1 and Figure 2 As shown.

[0039] The test system in this study examines a strapdown side-window infrared seeker for a hypersonic missile. "Strapdown" indicates that the infrared seeker is rigidly connected to the missile's fairing; the seeker is mounted inside the missile body, and the optical window is seamlessly integrated with the fairing's outer surface. Figure 1As shown; the side window, i.e., the optical window of the infrared seeker, is installed in the first quadrant of the missile body. The optical window acquires target information laterally, and the optical axis of the infrared seeker forms a certain angle with the missile body's axis of rotation. The installation is as follows: Figure 2 As shown.

[0040] First, install the infrared seeker on the fairing, and then connect each interface of the infrared seeker to the electronic box through the interface on the fairing. Specifically, install the infrared seeker inside the side ejection shroud. The side of the side ejection shroud has a data cable slot, and the slot has a power interface, an analog video interface, a 1553B interface, an infrared integrated interface, and a power interface for the ejection pyrotechnics, etc.

[0041] Then, in the automatic test configuration interface of the industrial control computer's host software, the electronic box is automatically controlled to perform the test according to the user-configured test process. The industrial control computer, power supply, ignition simulation load fixture, monitor, etc. are connected to the infrared seeker inside the rectifier (side ejection fairing) according to the corresponding interfaces. An infrared thermal imager is also installed inside the side ejection fairing. The infrared thermal imager collects data from the infrared seeker during the test and then sends the data to the industrial control computer.

[0042] Finally, data from the infrared seeker and the electronic box are collected in real time and transmitted to the industrial control computer. The industrial control computer processes the data and displays the relevant test data on the interface, including infrared data and current signals.

[0043] The host computer control software installed on the industrial control computer interacts with the infrared thermal imager through the 1553B, collects the video transmitted by the thermal imager, displays it through the video testing software and processes the video according to the protocol, and provides a single-function test control interface and an automatic test configuration interface through the industrial control computer. It automatically executes the test according to the test process configured by the user and displays the test-related data on the interface.

[0044] The test fixture is connected to an external 28V / 4A power supply via a power interface, and to a display screen via an analog video interface for video display of test results and operation processes. The 1553B control board within the industrial PC connects to a 1553B card via a 1553B interface, enabling bidirectional communication between the 1553B card and the industrial PC. The industrial PC includes host computer software, a CameraLink card, and image decompression software. The industrial PC communicates with the infrared integrated interface via the CameraLink card. The LVDS interface of the infrared integrated interface packages and sends the test information from the image compression test fixture to the industrial PC. The industrial PC decompresses the packaged file and sends it to the LVDS telemetry. The test fixture board communicates with the infrared integrated interface via a 422 hard time synchronization interface and output radar synchronization signals.

[0045] This invention is used for the testing, simulation, and acceptance of a side-window infrared seeker head. It enables rapid setup, connection, and interface fixation of the test platform, exhibiting high environmental adaptability and excellent system reliability and stability. Specifically, it achieves 1553B real-time communication, real-time operation, one-click rapid testing, automatic storage, and automatic output / printing of test data; it also features shielding testing and telemetry capabilities; and an integrated design. Temporary, independent, and complex functional modules are integrated into a unified test system, allowing for rapid response and execution during the setup of the thermal imager test platform; it boasts good stability and high reliability. The standardized and ruggedized design enhances heat dissipation, vibration reduction, impact resistance, and dustproofing; it is highly portable, suitable for both indoor and outdoor testing, and easy to transport.

[0046] refer to Figure 3 and Figure 4 The infrared seeker used in this application is a side-window infrared seeker for a hypersonic missile. The side-window infrared seeker is mounted on a fairing, and the data lines are led out through slots on the side of the fairing. The test system mainly includes an industrial control computer, an electronic enclosure, a digital oscilloscope, and expansion modules.

[0047] The connections between the modules of the test system are as follows Figure 5 As shown, the main structure of the industrial control computer adopts a reinforced aluminum alloy computer, and each function is based on a microcomputer system, integrating a 1553B communication control board, video acquisition card, host computer software, digital video testing software, etc.

[0048] The main structure of the electronic box module adopts a standard aluminum alloy chassis. The chassis includes power supplies for the infrared seeker head, fire control ejection shield, and decompression board, as well as a 1553B coupler and a fire control simulation load fixture. These are used to power the infrared seeker head and ejection shield, power the decompression fixture board, couple the 1553B communication data bus, and perform fire control ejection shield load tests.

[0049] The digital oscilloscope module is used to acquire the current signal of the electronic box during the fire control shield test, and to display, store and analyze it in real time.

[0050] Extension modules, such as printers, are used to output test record text stored in the host computer control software. Test reports can be output manually or automatically.

[0051] The video transmitted from the thermal imager is acquired via analog and digital video capture cards, and then displayed and processed according to protocols by video testing software. The 1553B control board is used to receive and send communication commands in real time. The host computer control software interacts with the infrared thermal imager through the 1553B, providing a single-function test control interface and an automatic test configuration interface. It can automatically execute tests according to the user-configured test process and display relevant test data on the interface.

[0052] The 1553B control board inside the host computer connects to an external 1553B board via an interface to exchange data. The 1553B board is used to simulate receiving and processing communication commands sent from the infrared seeker in real time, and executes various test items for the infrared seeker through a human-machine interface via the host computer control software. Specific test items that can be executed include... Figure 6 As shown, the test items include: A-channel bus check, B-channel bus check, self-test and one-key test, hard time clear, soft time synchronization, thermal imager non-uniform parameter calibration, mask throwing, parameter preset, auxiliary navigation, LVDS telemetry, real-time communication and operation, test data storage, etc.

[0053] The electronic box contains various power modules that provide 28V / 4A power to the infrared seeker, 28V / 26A power to the fire control shield test, and 24V power to the decompression board. It also performs simulation tests on each power interface of the infrared seeker to check whether the infrared seeker can start normally after power supply.

[0054] The host computer upgrade software also interacts with the infrared thermal imager through the 1553B to upgrade the software versions of various hardware modules of the lower computer. It executes according to the protocol provided by the hardware module and upgrades and reads back the infrared thermal imager software through the 1553B bus.

[0055] In a specific implementation scenario, the implementation process of each test function is as follows:

[0056] The host computer's 1553B control board enables real-time communication, real-time operation, one-click rapid testing, and automatic storage and printing of test data.

[0057] Function implementation chain, such as Figure 4 As shown: The 1553B interface of the infrared seeker communicates bidirectionally with the industrial computer via the 1553B board. The industrial computer performs one-click testing and stores the results in the storage unit, and automatically outputs and prints the results.

[0058] Shielding function: The implementation chain, such as Figure 3 As shown: The system's 28V / 26A DC power supply simulates missile power supply to the infrared seeker's pyrotechnic power interface for shroud ejection, and then ignites the simulated load fixture to perform shroud ejection testing.

[0059] Telemetry function: Function implementation link, such as Figure 4 As shown: The infrared seeker interface is connected to the industrial control computer of the image compression test fixture (with image decompression software installed, and the host computer is used for testing) to complete the LVDS telemetry function.

[0060] Synchronization 422 function: Function implementation link, such as Figure 4As shown: The infrared seeker interface is connected to the test fixture board (host computer test) and the hard time synchronization interface to complete the synchronization 422 function.

[0061] Analog video output function: Function implementation chain, such as Figure 4 As shown: The infrared seeker's analog video interface communicates with the analog video capture card to achieve analog video display output. Digital video output function: the function implementation link, such as... Figure 4 As shown: The infrared seeker interface is connected to the digital video capture card and the industrial control computer (Cameralink capture card software test) to achieve digital video display output.

[0062] Infrared seeker power supply function: Function implementation link, such as Figure 4 As shown: The test system supplies power to the infrared seeker via a 28V / 4A DC power supply through the infrared seeker's power interface.

[0063] like Figure 4 As shown, each interface of the infrared seeker is fixedly connected to each connection port of the test system.

[0064] This invention also provides a method for comprehensive testing of a strapdown side-window infrared seeker. The method is used in the aforementioned comprehensive testing system for a strapdown side-window infrared seeker. The test system tests a hypersonic missile's strapdown side-window infrared seeker. The infrared seeker is rigidly connected to the missile's fairing and is installed inside the missile body. The optical window is naturally integrated with the outer surface of the fairing. The side window, i.e., the optical window of the infrared seeker, is installed in the first quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the missile body's axis, and the optical window acquires target information laterally.

[0065] Includes: industrial PCs containing 1553B control boards, electronic boxes containing sprue power supplies and analog resistors, oscilloscopes, and printers;

[0066] The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and to execute various test items of the infrared seeker through the host computer software in a human-machine interface.

[0067] Digital and analog videos are displayed using video testing software and processed according to protocols.

[0068] All test information is ultimately displayed as the target result through the industrial control computer's display interface.

[0069] Please see Figure 6 This is a schematic diagram illustrating an embodiment of the electronic device provided in this invention. For example... Figure 6As shown, this embodiment of the invention provides an electronic device, including a memory 1310, a processor 1320, and a computer program 1311 stored in the memory 1310 and executable on the processor 1320. When the processor 1320 executes the computer program 1311, it performs the following steps: The test system tests a hypersonic missile strapdown side-window infrared seeker. The infrared seeker is rigidly connected to the missile body fairing and is installed inside the missile body. The optical window is naturally integrated with the outer surface of the fairing. The side window, which is the optical window of the infrared seeker, is installed in the first quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally.

[0070] Includes: industrial PCs containing 1553B control boards, electronic boxes containing sprue power supplies and analog resistors, oscilloscopes, and printers;

[0071] The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and to execute various test items of the infrared seeker through the host computer software in a human-machine interface.

[0072] Digital and analog videos are displayed using video testing software and processed according to protocols.

[0073] All test information is ultimately displayed as the target result through the industrial control computer's display interface.

[0074] Please see Figure 7 This is a schematic diagram illustrating an embodiment of a computer-readable storage medium provided by the present invention. (See diagram below.) Figure 7 As shown, this embodiment provides a computer-readable storage medium 1400, on which a computer program 1411 is stored. When the computer program 1411 is executed by a processor, it performs the following steps: The test system tests a hypersonic missile strapdown side-window infrared seeker. The infrared seeker is rigidly connected to the missile body fairing and is installed inside the missile body. The optical window is naturally integrated with the outer surface of the fairing. The side window, which is the optical window of the infrared seeker, is installed in the first quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally.

[0075] Includes: industrial PCs containing 1553B control boards, electronic boxes containing sprue power supplies and analog resistors, oscilloscopes, and printers;

[0076] The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and to execute various test items of the infrared seeker through the host computer software in a human-machine interface.

[0077] Digital and analog videos are displayed using video testing software and processed according to protocols.

[0078] All test information is ultimately displayed as the target result through the industrial control computer's display interface.

[0079] It should be noted that the descriptions of each embodiment in the above embodiments have different focuses. For parts that are not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0080] Beneficial effects: Integrated design: The entire test system hardware composition, such as Figure 2 As shown: Industrial control computer + electronic enclosure + oscilloscope + printer; all the above hardware is integrated into a precision-engineered, enclosed enclosure, with all test interfaces located on the enclosure's front panel. Excellent portability: The entire test system enclosure is designed with a handle, weighs less than 50kg, and can be moved anytime, anywhere. All external interfaces are quick-connect, such as aviation connectors, enabling rapid connection.

[0081] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0082] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

Claims

1. A comprehensive testing system for a strapdown side-window infrared seeker, characterized in that, The test system tests the infrared seeker of a hypersonic missile with a strapdown side window. The infrared seeker is rigidly connected to the missile body fairing. The infrared seeker is installed inside the missile body, and the optical window is integrated with the outer surface of the fairing. The optical window of the infrared seeker is installed in the lower I quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally. The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and the industrial control computer executes various test items of the infrared seeker through a human-machine interface. All test information is finally displayed on the display interface of the industrial control computer to show the target results. The system's 28V / 26A DC power supply simulates missile power supply to the infrared seeker's pyrotechnic power interface for shroud ejection, and then ignites the simulated load fixture to perform shroud ejection tests. The infrared seeker interface is connected to the industrial control computer for image compression testing to complete the LVDS telemetry function. The industrial control computer is equipped with image decompression software for host computer testing. The infrared seeker's integrated interface is connected to the industrial computer's hard time synchronization interface to complete the synchronization 422 function; the infrared seeker's analog video interface is connected to the analog video acquisition card to realize the analog video display output function; the infrared seeker's integrated interface and the digital video acquisition card are connected to the industrial computer to realize the digital video display output.

2. The strapdown side-window infrared seeker integrated testing system according to claim 1, characterized in that, The 1553B interface of the infrared seeker communicates bidirectionally with the industrial computer via the 1553B board. The industrial computer performs one-click testing, stores the data in the storage unit, and automatically outputs and prints the results. Digital and analog videos are displayed through video testing software and processed according to protocols.

3. The strapdown side-window infrared seeker integrated testing system according to claim 1, characterized in that, The industrial control computer, electronic box, oscilloscope, and printer are all integrated into a precisely structured, enclosed enclosure, with all test interfaces concentrated on the panel of the enclosure.

4. A comprehensive testing method for a strapdown side-window infrared seeker, characterized in that, The method is used in the integrated testing system for a strapdown side-window infrared seeker as described in any one of claims 1-3. The test object is a strapdown side-window infrared seeker for a hypersonic missile, comprising: a rigid connection between the infrared seeker and the missile body fairing; the infrared seeker is installed inside the missile body; the optical window is naturally integrated with the outer surface of the fairing; the side window, i.e., the optical window of the infrared seeker, is installed in the first quadrant of the missile body; the optical axis of the infrared seeker forms a certain angle with the axis of the missile body; the optical window acquires target information laterally. The optical window of the infrared seeker is installed in the lower I quadrant of the missile body. The optical axis of the infrared seeker forms a certain angle with the axis of the missile body. The optical window collects target information laterally. The 1553B control board is used to simulate receiving and processing communication commands sent by the missile in real time, and the industrial control computer executes various test items of the infrared seeker through a human-machine interface. All test information is finally displayed on the display interface of the industrial control computer to show the target results.

5. An electronic device, characterized in that, It includes a memory and a processor, wherein the processor is used to implement the steps of the strapdown side window infrared seeker integrated test method as described in claim 4 when executing computer management programs stored in the memory.

6. A computer-readable storage medium, characterized in that, It stores a computer management program, which, when executed by a processor, implements the steps of the strapdown side window infrared seeker integrated test method as described in claim 4.

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