Method for testing a highly automated driving controller
By combining information acquisition circuits and analysis and processing chips, the problem of fault detection in highly automated driving controllers was solved, enabling effective testing and troubleshooting of various circuits and improving product quality control.
Patent Information
- Application Number
- CN202310671318.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2023-06-07
- Publication Date
- 2026-01-02
- Estimated Expiration
- 2043-06-07
AI Technical Summary
The lack of effective testing methods for highly automated driving controllers in existing technologies makes it impossible to control product quality.
By combining information acquisition circuits and analysis processing chips, the system collects and analyzes feature information to determine whether there are faults in each circuit, including fault detection in camera and radar circuits, as well as data conversion detection in output circuits and storage modules.
It enables troubleshooting of various circuits in the highly automated driving controller, ensuring the normal operation of information acquisition and data conversion, and improving product quality control capabilities.
Smart Images
Figure CN116594377B_ABST
Abstract
Description
TECHNICAL FIELD
[0001] The present application relates to the technical field of automobiles, in particular to a test method of a highly autonomous driving controller. BACKGROUND
[0002] A highly autonomous driving controller (HAD) is a device responsible for decision-making and path planning. If the HAD controller fails, the entire system of the automobile will be at great risk.
[0003] In the prior art, there is a lack of test methods for HAD controllers, which leads to uncontrollable product quality. SUMMARY
[0004] The present application provides a highly autonomous driving controller to provide a test method of a highly autonomous driving controller to test whether each circuit of the highly autonomous driving controller has a fault.
[0005] According to an aspect of the present application, a test method of a highly autonomous driving controller is provided, the highly autonomous driving controller comprising an information acquisition circuit and an analysis processing chip.
[0006] The test method of the highly autonomous driving controller comprises:
[0007] The information acquisition circuit collects first feature information and generates first collection information.
[0008] The analysis processing chip determines whether the information acquisition circuit has a fault according to the first feature information and the first collection information.
[0009] Optionally, the information acquisition circuit comprises a camera circuit, the first feature information comprises first sub-feature information, and the first collection information comprises first sub-collection information.
[0010] The information acquisition circuit collects first feature information and generates first collection information, comprising:
[0011] The camera circuit collects the first sub-feature information and generates the first sub-collection information.
[0012] The analysis processing chip determines whether the information acquisition circuit has a fault according to the first feature information and the first collection information, comprising:
[0013] The analysis processing chip determines whether the camera circuit has a fault according to the first sub-feature information and the first sub-collection information.
[0014] Optionally, the first sub-feature information comprises picture information.
[0015] Optionally, the information acquisition circuit further comprises a radar circuit, the first characteristic information further comprises second sub-characteristic information, and the first acquisition information further comprises second sub-acquisition information.
[0016] The information acquisition circuit acquires first characteristic information and generates first acquisition information, including:
[0017] The radar circuit acquires the second sub-characteristic information and generates second sub-acquisition information.
[0018] The analysis processing chip determines whether the information acquisition circuit fails according to the first characteristic information and the first acquisition information, including:
[0019] The analysis processing chip determines whether the radar circuit fails according to the second sub-characteristic information and the second sub-acquisition information.
[0020] Optionally, the second sub-characteristic information comprises sound wave information.
[0021] Optionally, the high-level automatic driving controller further comprises an output circuit.
[0022] After the analysis processing chip determines that the information acquisition circuit is not faulty, the method further comprises:
[0023] The output circuit generates first display information according to the second characteristic information obtained by the analysis processing chip and displays the first display information to a display device, so that the accompanying measuring equipment determines whether the output circuit fails according to the second characteristic information and the first display information stored in advance.
[0024] Optionally, the output circuit generates first display information according to the second characteristic information stored by the analysis processing chip and displays the first display information to a display device, including:
[0025] The output circuit generates first display information according to the second characteristic information and outputs the first display information to the display device after protocol conversion.
[0026] Optionally, after it is determined that the output circuit is not faulty, the method further comprises:
[0027] The information acquisition circuit acquires the first characteristic information and generates the first acquisition information.
[0028] The analysis processing chip converts the first acquisition information into first characteristic format information.
[0029] The output circuit generates second display information according to the first characteristic format information and displays to a display device, so that the accompanying measuring device determines whether the analysis processing chip has a first data conversion failure according to the first characteristic information and the second display information.
[0030] Optionally, the highly automatic driving controller further comprises a storage module.
[0031] After determining that the output circuit is fault-free, further comprising:
[0032] The analysis processing chip converts third characteristic information pre-stored in the storage module into second characteristic format information.
[0033] The output circuit generates third display information according to the second characteristic format information and displays to a display device.
[0034] The information acquisition circuit collects the third display information and generates second collection information.
[0035] The analysis processing chip determines whether the analysis processing chip has a second data conversion failure according to the second collection information and the second characteristic format information.
[0036] Optionally, the third characteristic information comprises a preset RGB point number.
[0037] The embodiment of the application provides a test method of a highly automatic driving controller, which is used for controlling the highly automatic driving controller, wherein the highly automatic driving controller comprises an information acquisition circuit and an analysis processing chip, and the test method of the highly automatic driving controller comprises the following steps: the information acquisition circuit collects first characteristic information and generates first collection information; and the analysis processing chip determines whether the information acquisition circuit has a failure according to the first characteristic information and the first collection information.
[0038] It should be understood that the content described in this part is not intended to identify key or important features of the embodiments of the application, nor is it used to limit the scope of the application. Other features of the application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS
[0039] In order to make the technical solutions in the embodiments of the present application clearer, the drawings needed in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and all other drawings obtained by those skilled in the art without creative efforts should fall within the scope of the present application.
[0040] Figure 1 is a flowchart of a test method of a highly automatic driving controller provided by an embodiment of the present application;
[0041] Figure 2 is a flowchart of another test method of a highly automatic driving controller provided by an embodiment of the present application;
[0042] Figure 3 is a flowchart of another test method of a highly automatic driving controller provided by an embodiment of the present application;
[0043] Figure 4 is a flowchart of another test method of a highly automatic driving controller provided by an embodiment of the present application;
[0044] Figure 5 is a flowchart of another test method of a highly automatic driving controller provided by an embodiment of the present application;
[0045] Figure 6 is a flowchart of another test method of a highly automatic driving controller provided by an embodiment of the present application. DETAILED DESCRIPTION
[0046] In order to make the technical solutions in the embodiments of the present application clearer, the drawings needed in the embodiments will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and all other drawings obtained by those skilled in the art without creative efforts should fall within the scope of the present application.
[0047] It should be noted that the terms "first", "second", and the like in the description and in the claims of the present application and the above-described accompanying drawings are used to distinguish similar objects, and do not necessarily have to be used to describe a specific order or sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not have to be limited to only those steps or units clearly listed, but can include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.
[0048] Figure 1 A flowchart of a test method of a highly automatic driving controller provided for an embodiment of the present application, the embodiment can be applicable to the case of determining whether the components of the highly automatic driving controller are faulty, the method can be executed by the highly automatic driving controller, the highly automatic driving controller device can be realized in the form of hardware and software, and the highly automatic driving controller can be configured in a car. The highly automatic driving controller includes an information acquisition circuit and an analysis processing chip, as shown in Figure 1 The method includes:
[0049] S110: The information acquisition circuit collects first feature information and generates first collection information.
[0050] The information acquisition circuit is a circuit used by the highly automatic driving controller (hereinafter referred to as HAD controller) to collect external information. The first feature information is pre-set information, and the information acquisition circuit collects the pre-set first feature information outside the HAD controller, and generates the first collection information according to the first feature information. Illustratively, a picture is pre-set, and the picture can display a grassland and a tree located at a specific position on the grassland, and the first feature information can be the pre-set picture, and the first collection information can be a new picture generated according to the first feature information. Alternatively, the first feature information is a feature parameter corresponding to the pre-set picture, such as the position of the tree on the grassland, the height of the tree, etc., and the first collection information is the feature parameter generated after the information acquisition circuit collects the information on the pre-set picture.
[0051] S120: The analysis processing chip determines whether the information acquisition circuit is faulty according to the first feature information and the first collection information.
[0052] The analysis processing chip determines whether the information acquisition circuit is faulty according to consistency of the first characteristic information and the first collection information. If the characteristic parameter corresponding to the first characteristic information is consistent with the characteristic parameter corresponding to the first collection information, the information acquisition circuit is not faulty. If the characteristic parameter corresponding to the first characteristic information is not consistent with the characteristic parameter corresponding to the first collection information, the information acquisition circuit is faulty. For example, the characteristic parameter corresponding to the first characteristic information and the characteristic parameter corresponding to the first collection information is the position of a tree on a grassland. If the position of the tree on the grassland contained in the first collection information is the same as the position of the tree on the grassland in the set picture, it is determined that the information acquisition circuit is not faulty.
[0053] The analysis processing chip determines whether the information acquisition circuit is faulty according to consistency of the first characteristic information and the first collection information. If the characteristic parameter corresponding to the first characteristic information is consistent with the characteristic parameter corresponding to the first collection information, the information acquisition circuit is not faulty. If the characteristic parameter corresponding to the first characteristic information is not consistent with the characteristic parameter corresponding to the first collection information, the information acquisition circuit is faulty. For example, the characteristic parameter corresponding to the first characteristic information and the characteristic parameter corresponding to the first collection information is the position of a tree on a grassland. If the position of the tree on the grassland contained in the first collection information is the same as the position of the tree on the grassland in the set picture, it is determined that the information acquisition circuit is not faulty.
[0054] Optionally, the information acquisition circuit comprises a camera circuit, the first characteristic information comprises first sub-characteristic information, and the first collection information comprises first sub-collection information. Figure 2 Another flowchart of a test method of a highly automated driving controller is provided for the embodiment of the present application, as shown in the figure, the method comprises: Figure 2
[0055] S111: The camera circuit collects the first sub-characteristic information and generates the first sub-collection information.
[0056] Optionally, the first sub-characteristic information comprises picture information, and the camera circuit mainly collects information of a picture. Before testing, a picture used for testing the camera circuit is set in advance. For example, the picture used for testing the camera circuit in any step can be the picture described in S110, which will not be repeated here. The first sub-collection information is a new picture or a new characteristic parameter generated after the camera circuit collects the set picture used for testing.
[0057] S121: The analysis processing chip determines whether the camera circuit is faulty according to the first sub-characteristic information and the first sub-collection information.
[0058] The analysis processing chip determines whether the camera circuit is faulty according to consistency of the first sub-characteristic information and the first sub-collection information. For details, refer to S120, which will not be repeated here.
[0059] The analysis processing chip determines whether the camera circuit has a fault according to consistency between the first sub-feature information stored in advance and the first sub-acquisition information generated by the information acquisition circuit, and then can determine whether the camera circuit can normally acquire external information, so as to realize troubleshooting of the camera circuit.
[0060] Optionally, the information acquisition circuit further comprises a radar circuit, the first feature information further comprises second sub-feature information, and the first acquisition information further comprises second sub-acquisition information. Figure 3 Another flowchart of a test method of the highly automatic driving controller is provided for the embodiment of the present application, as shown in Figure 3 The method comprises the following steps.
[0061] S112: The radar circuit acquires second sub-feature information and generates second sub-acquisition information.
[0062] Optionally, the second sub-feature information comprises sound wave information. An obstacle for testing the radar circuit is set in advance, the radar circuit perceives the position and shape of the obstacle through ultrasonic signals, and generates the second sub-acquisition information after the perception. The second sub-acquisition information is information comprising feature parameters such as the position and shape of the obstacle.
[0063] S122: The analysis processing chip determines whether the radar circuit has a fault according to the second sub-feature information and the second sub-acquisition information.
[0064] The analysis processing chip determines whether the radar circuit has a fault according to consistency between the second sub-feature information and the second sub-acquisition information. The feature parameters comprise the position and shape of the obstacle. Specifically, if the analysis processing chip determines that the position and shape of the obstacle contained in the second sub-feature information are the same as the position and shape of the obstacle in the second sub-acquisition information, it is determined that the radar circuit has no fault. If the analysis processing chip determines that at least one of the position and shape of the obstacle contained in the second sub-feature information and the position and shape of the corresponding obstacle in the second sub-acquisition information is different, it is determined that the radar circuit has a fault.
[0065] The analysis processing chip determines whether the radar circuit has a fault according to consistency between the first sub-feature information stored in advance and the first sub-acquisition information generated by the information acquisition circuit, and then can determine whether the radar circuit can normally acquire external information, so as to realize troubleshooting of the radar circuit.
[0066] Optionally, the highly automatic driving controller further comprises an output circuit, Figure 4 Another flowchart of a test method of the highly automatic driving controller is provided for the embodiment of the present application, as shown in Figure 4 The test method comprises the following steps.
[0067] S113: The information acquisition circuit collects the first characteristic information and generates first collection information.
[0068] S123: The analysis processing chip determines whether the information acquisition circuit is faulty according to the first characteristic information and the first collection information.
[0069] S133: After the analysis processing chip determines that the information acquisition circuit is not faulty, the output circuit generates first display information according to the second characteristic information obtained by the analysis processing chip and displays the first display information to the display device, so that the accompanying measurement device determines whether the output circuit is faulty according to the pre-stored second characteristic information and the first display information.
[0070] The analysis processing chip determines that the information acquisition circuit is not faulty, which can be referred to S120 and will not be described here.
[0071] The HAD controller includes a storage module, and the second characteristic information can be a picture, such as a picture showing a prairie and a tree, wherein the picture includes a characteristic parameter of the position of the tree on the prairie. The second characteristic information can be pre-stored in the storage module of the HAD controller or in the storage module of the analysis processing chip, which is not specifically limited in the embodiment. The analysis processing chip reads the characteristic parameter from the second characteristic information and transmits the characteristic parameter to the output circuit. The output circuit generates first display information according to the characteristic parameter and displays the first display information to the display device. Specifically, the output circuit generates the first display information according to the second characteristic information, and outputs the first display information to the display device after protocol conversion. The output circuit displays the first display information to the display device such as a display screen through the GMSL protocol. The first display information can be a new picture containing the prairie and the tree and other factors generated according to a pre-set picture. The accompanying measurement device determines whether the output circuit is faulty according to the consistency of the first display information and the second characteristic information, that is, according to the consistency of the pre-set picture and the new picture generated by the output circuit of the display device, to determine whether the output circuit is faulty. It is worth noting that the consistency of the picture mainly refers to the consistency of the characteristic parameter, such as the position of the tree on the prairie. If they are consistent, it is determined that the output circuit is not faulty, and if they are not consistent, it is determined that the output circuit is faulty.
[0072] After the analysis processing chip determines that the information acquisition circuit is not faulty, the analysis processing chip determines whether the output circuit is faulty, so as to subsequently perform other hardware tests based on the fact that both the information acquisition circuit and the output circuit are not faulty.
[0073] Figure 5 Another flowchart of the test method of the highly automated driving controller provided in the embodiment is shown in FIG. 6. Figure 5 Optionally, the test method includes:
[0074] S114: The information acquisition circuit collects the first characteristic information and generates first collection information.
[0075] S124: The analysis processing chip determines whether the information acquisition circuit has a fault according to the first characteristic information and the first collection information.
[0076] S134: After the analysis processing chip determines that the information acquisition circuit has no fault, the output circuit generates first display information according to the second characteristic information obtained by the analysis processing chip and displays the first display information to the display device, so that the test device determines whether the output circuit has a fault according to the pre-stored second characteristic information and the first display information.
[0077] S144: After it is determined that the output circuit has no fault, the information acquisition circuit collects the first characteristic information and generates first collection information.
[0078] The information acquisition circuit includes a camera circuit and a radar circuit, the first characteristic information includes first sub-characteristic information and second sub-characteristic information, and the first collection information includes first sub-collection information. The information acquisition circuit collects the first characteristic information and generates the first collection information, specifically including:
[0079] The camera circuit collects the first sub-characteristic information and generates the first sub-collection information.
[0080] The radar circuit collects the second sub-characteristic information and generates the second sub-collection information.
[0081] S154: The analysis processing chip converts the first collection information into first characteristic format information.
[0082] When the information acquisition circuit includes the camera circuit and the radar circuit, because the first collection information includes the first sub-collection information and the second sub-collection information, the first characteristic format information includes first format information and second format information. The analysis processing chip converts the first collection information into the first characteristic format information, including:
[0083] The analysis processing chip converts the first sub-collection information into the first format information and converts the second sub-collection information into the second format information. The first characteristic format information is a data format that can be accepted by the output circuit, and the first format information and the second format information correspond to the same data format.
[0084] S164: The output circuit generates second display information according to the first characteristic format information and displays the second display information to the display device, so that the test device determines whether the analysis processing chip has a first data conversion fault according to the pre-stored first characteristic information and the second display information.
[0085] The output circuit generates the second display information and outputs the second display information to the display device through the GSM L protocol to display. The second display information includes the first sub-display information and the second sub-display information. The output circuit generates the second display information according to the first characteristic format information and displays the second display information to the display device, so that the accompanying measuring device determines whether the analysis processing chip has the first data conversion fault according to the first characteristic information and the second display information stored in advance, including:
[0086] The output circuit generates the first sub-display information according to the first format information and displays the first sub-display information to the display device, so that the accompanying measuring device determines whether the analysis processing chip has the first data conversion fault according to the first sub-characteristic information and the first sub-display information stored in advance.
[0087] The output circuit generates the second sub-display information according to the second format information and displays the second sub-display information to the display device, so that the accompanying measuring device determines whether the analysis processing chip has the first data conversion fault according to the second sub-characteristic information and the second sub-display information stored in advance.
[0088] The first sub-characteristic information is a preset picture, the first sub-display information is a picture displayed by the display device, or the first sub-characteristic information is a characteristic parameter corresponding to the preset picture, and the first sub-display information is a characteristic parameter generated by the output circuit. Illustratively, the accompanying measuring device determines whether the analysis processing chip has the first data conversion fault according to the consistency of the first sub-characteristic information and the first sub-display information. The second sub-characteristic information is a preset obstacle, the second sub-display information is an obstacle displayed by the display device according to the information obtained by the information acquisition circuit, or the second sub-characteristic information is a characteristic parameter of the preset obstacle, and the second sub-display information is a characteristic parameter generated by the output circuit. The characteristic parameter can be the shape and position of the obstacle. The accompanying measuring device determines whether the analysis processing chip has the first data conversion fault according to the consistency of the shape and position of the preset obstacle and the shape and position of the obstacle displayed by the display device. Since it is determined in step S124 that the information acquisition circuit is fault-free and it is determined in step S134 that the output circuit is fault-free, if the first characteristic information and the second display information are inconsistent under the premise that the information acquisition circuit and the output circuit are both fault-free, it can be determined that the analysis processing chip has a fault when extracting the first collected information in the information acquisition circuit and converting the first collected information into the first characteristic format information. This fault is defined as the first data conversion fault.
[0089] On the basis that the information acquisition circuit and the output circuit are determined to be fault-free, the closed-loop test is performed in this embodiment, the analysis processing chip outputs the data converted according to the information collected by the information acquisition circuit to the output circuit, so that the output circuit outputs to the display device for display through the GMSL protocol, and whether the analysis processing chip has a fault when performing data conversion is determined according to the consistency between the information displayed by the display device and the information collected by the information acquisition circuit.
[0090] Figure 6 Another flowchart of the test method of the highly automated driving controller is provided in the embodiment of the application, referring to Figure 6 Optionally, the test method comprises:
[0091] S115: The information acquisition circuit collects the first characteristic information and generates first collected information.
[0092] S125: The analysis processing chip determines whether the information acquisition circuit has a fault according to the first characteristic information and the first collected information.
[0093] S135: After the analysis processing chip determines that the information acquisition circuit is fault-free, the output circuit generates first display information according to the second characteristic information obtained by the analysis processing chip and displays the first display information to the display device, so that the accompanying test equipment determines whether the output circuit has a fault according to the second characteristic information and the first display information stored in advance.
[0094] S145: After determining that the output circuit is fault-free, the analysis processing chip converts the third characteristic information stored in the storage module into second characteristic format information.
[0095] When the information acquisition circuit comprises a camera circuit and a radar circuit, the third characteristic information can comprise a pre-set picture corresponding to the camera circuit and pre-set obstacle information corresponding to the radar circuit, and it is worth noting that the pre-set picture and the obstacle information can correspond to the characteristic parameters extracted, for example, the characteristic parameters of the pre-set picture are the positions of the trees on the grassland, and the characteristic parameters corresponding to the obstacle information are the shapes and positions of the obstacles. The analysis processing chip converts the third characteristic information into a data format that can be accepted by the output circuit, that is, the second characteristic format information, and it is worth noting that the data format of the second characteristic format information is the same as the first characteristic format information mentioned in S154.
[0096] S155: The output circuit generates third display information according to the second characteristic format information and displays the third display information to the display device.
[0097] The output circuit outputs data to the display device in the form of the GMSL protocol according to the second characteristic format information for display.
[0098] S165: The information acquisition circuit collects the third display information and generates second collection information.
[0099] In S155, the output circuit displays the third display information to the display device, and displays separately for different third characteristic information. Specifically, the output circuit generates the third display information according to the second characteristic format information converted by the camera circuit corresponding to the third characteristic information, and displays the third display information to the display device, wherein the third display information is a picture containing grassland and trees. The camera circuit collects the information displayed by the display device and generates corresponding second collection information.
[0100] The output circuit generates corresponding third display information according to the second characteristic format information converted by the radar circuit corresponding to the third characteristic information, and displays the third display information to the display device, wherein the third display information is a picture containing the shape and position of the obstacle. The radar circuit collects the information displayed by the display device and generates corresponding second collection information.
[0101] S175: The analysis processing chip determines whether the analysis processing chip has a second data conversion fault according to the second collection information and the second characteristic format information.
[0102] The analysis processing chip determines whether the analysis processing chip has a second data conversion fault according to the consistency of the second collection information and the second characteristic format information corresponding to the camera circuit. The analysis processing chip also determines whether the analysis processing chip has a second data conversion fault according to the consistency of the second collection information and the second characteristic format information corresponding to the radar circuit. Since it has been determined in step S125 that the information acquisition circuit has no fault, and it has been determined in step S135 that the output circuit has no fault, under the premise that both the information acquisition circuit and the output circuit have no fault, if the second collection information and the second characteristic format information are inconsistent, it can be determined that the analysis processing chip has a fault when extracting the third characteristic information in the storage module and converting it to the second characteristic format information. This fault is defined as a second data conversion fault.
[0103] Optionally, the third feature information includes a preset RGB point number. For example, the third feature information is an RGB point number corresponding to red. The output circuit reads out the RGB point number of red in the storage module and performs data format conversion, that is, generates second feature format information. The output circuit generates third display information according to the second feature format information and displays the third display information to the display device. At this time, the third display information is also an RGB point number, and the color picture displayed on the display device is an RGB point number. After the camera circuit collects the picture information on the display device, that is, the third display information, the second collection information is generated, wherein the second collection information is the RGB point number of the picture displayed on the display device. The analysis processing chip determines whether the analysis processing chip has a second data conversion fault according to the RGB point number corresponding to red and the RGB point number in the second collection information. Specifically, when the difference between the RGB point number corresponding to red and the RGB point number in the second collection information is less than a set threshold value, it is considered that the picture displayed on the display device is a red picture, and no fault occurs when the analysis processing chip obtains the data in the storage module. If the difference between the RGB point number corresponding to red and the RGB point number in the second collection information is greater than or equal to the set threshold value, it is considered that the picture displayed on the display device is a non-red picture, and a fault exists when the analysis processing chip obtains the data in the storage module.
[0104] In the embodiment, on the basis of determining that the information acquisition circuit and the output circuit are fault-free, a closed-loop test is performed, and the analysis processing chip determines whether a fault exists when the analysis processing chip extracts the information stored in the storage module according to the consistency between the information displayed by the display device and the third feature information pre-stored in the storage module.
[0105] Optionally, after it is determined that the information acquisition circuit and the output circuit are both fault-free, the test method further includes:
[0106] The analysis processing chip outputs the pre-stored algorithm model to the output circuit after format conversion;
[0107] The output circuit outputs the display information according to the algorithm model and displays the display information to the display device.
[0108] Taking an example of encountering an obstacle once per second and automatically avoiding the obstacle, the analysis processing chip identifies the data obtained by the camera circuit and the radar circuit, automatically turns to avoid the obstacle, and displays the scenes before and after avoiding the obstacle through the display device. The analysis processing chip further includes a plurality of calculation modules, and when the analysis processing chip displays the scenes before and after avoiding the obstacle through the display device, the loads of the calculation modules are recorded and synchronously displayed on the display device.
[0109] It should be understood that the various forms of flow shown above can be used to reorder, add, or remove steps. For example, the steps recited in the present application can be performed in parallel, in series, or in a different order, as long as the desired results of the technical solutions of the present application can be achieved, which are not limited herein.
[0110] The above detailed description does not constitute a limitation on the protection scope of the present application. Those skilled in the art should understand that various modifications, combinations, sub-combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent replacements, and improvements made within the spirit and principles of the present application shall be included in the protection scope of the present application.
Claims
1. A test method for a highly automated driving controller, characterized in that, The highly automated driving controller includes an information acquisition circuit and an analysis and processing chip; The testing method for the highly automated driving controller includes: The information acquisition circuit collects the first feature information and generates the first acquisition information; The analysis and processing chip determines whether the information acquisition circuit has malfunctioned based on the first feature information and the first acquired information; The highly automated driving controller also includes an output circuit; After the analysis and processing chip determines that the information acquisition circuit is fault-free, the method further includes: The output circuit generates first display information based on the second feature information obtained by the analysis and processing chip and displays it on the display device, so that the test device can determine whether the output circuit has malfunctioned based on the pre-stored second feature information and the first display information.
2. The test method for a highly automated driving controller according to claim 1, characterized in that, The information acquisition circuit includes a camera circuit, the first feature information includes first sub-feature information, and the first acquisition information includes first sub-acquisition information. The information acquisition circuit collects first feature information and generates first acquired information, including: The camera circuit acquires the first sub-feature information and generates the first sub-acquisition information; The analysis and processing chip determines whether the information acquisition circuit has malfunctioned based on the first feature information and the first acquired information, including: The analysis and processing chip determines whether the camera circuit is malfunctioning based on the first sub-feature information and the first sub-acquisition information.
3. The test method for a highly automated driving controller according to claim 2, characterized in that, The first sub-feature information includes image information.
4. The test method for a highly automated driving controller according to claim 2, characterized in that, The information acquisition circuit further includes a radar circuit, the first feature information further includes second sub-feature information, and the first acquisition information further includes second sub-acquisition information. The information acquisition circuit collects first feature information and generates first acquired information, including: The radar circuit acquires the second sub-feature information and generates the second sub-acquisition information; The analysis and processing chip determines whether the information acquisition circuit has malfunctioned based on the first feature information and the first acquired information, including: The analysis and processing chip determines whether the radar circuit has malfunctioned based on the second sub-feature information and the second sub-acquisition information.
5. The test method for a highly automated driving controller according to claim 4, characterized in that, The second sub-feature information includes acoustic wave information.
6. The test method for a highly automated driving controller according to claim 1, characterized in that, The output circuit generates first display information and displays it on the display device based on the second feature information stored in the analysis and processing chip, including: The output circuit generates first display information based on the second feature information, and outputs the first display information to the display device after protocol conversion.
7. The test method for a highly automated driving controller according to claim 1, characterized in that, After confirming that the output circuit is fault-free, the following steps are included: The information acquisition circuit collects the first feature information and generates the first collected information; The analysis and processing chip converts the first collected information into first feature format information; The output circuit generates second display information based on the first feature format information and displays it on the display device, so that the testing device can determine whether the analysis and processing chip has experienced a first data conversion failure based on the pre-stored first feature information and the second display information.
8. The test method for a highly automated driving controller according to claim 1, characterized in that, The highly automated driving controller also includes a storage module; After confirming that the output circuit is fault-free, the following steps are also included: The analysis and processing chip converts the third feature information pre-stored in the storage module into second feature format information; The output circuit generates third display information based on the second feature format information and displays it on the display device; The information acquisition circuit collects the third display information and generates second collected information; The analysis and processing chip determines whether a second data conversion failure has occurred based on the second acquired information and the second feature format information.
9. The test method for a highly automated driving controller according to claim 8, characterized in that, The third feature information includes a preset number of RGB points.
Citation Information
Patent Citations
Method, device and equipment for detecting vehicle environmental perception capacity, and storage medium
CN109738198A