ATE spring probe semi-automatic pre-assembly device

Abstract

The present application relates to precision instruments and semiconductor manufacturing equipment technical field, specifically to a kind of ATE spring probe semi-automatic pre-assembly device;The ATE spring probe semi-automatic pre-assembly device includes blanking carousel and assembly mechanism;The blanking carousel is provided with needle tube blanking hole, needle tail blanking hole, spring blanking hole and needle head blanking hole, needle tube blanking hole, needle tail blanking hole, spring blanking hole and needle head blanking hole are all provided with upper gate and lower gate;The assembly mechanism is cylindrical structure, and the bottom of the cylindrical structure is provided with total gate;The present application can realize that needle head, spring and needle tail are automatically aligned and loaded into needle tube to complete pre-assembly, greatly shorten alignment time, improve pre-assembly efficiency;And through the structural design of upper carousel, upper gate fixing disc, middle carousel, lower gate fixing disc, lower fixing disc and total gate carousel, the logic realization of upper gate, lower gate and total gate opening and closing is completed;Meanwhile, parameter design method is also given.

Description

Technical Field

[0001] This invention relates to the field of precision instruments and semiconductor manufacturing equipment technology, specifically to a semi-automatic pre-assembly device for ATE spring probes. Background Technology

[0002] Before packaging, bare dies must be tested. The testing method involves placing the bare die in a test socket, with the ATE spring probes at the bottom of the test socket contacting the pads or bumps of the bare die. The ATE spring probes are used to establish an electrical connection between the Automatic Test Equipment (ATE) and the bare die. By programming the bare die and reading the program, the quality of the bare die can be determined.

[0003] To ensure effective electrical connection between the ATE and the bare core, the ATE spring probe is often designed with an elastic structure. The most common structure is as follows: Figure 1 As shown, the device includes a needle tube 1-1, a needle tail 1-2, a spring 1-3, and a needle tip 1-4. The needle tail 1-2 is inserted into the needle tube 1-1 and extends from the bottom of the needle tube 1-1. The spring 1-3 is also inserted into the needle tube 1-1 and is located above the needle tail 1-2. Similarly, the needle tip 1-4 is inserted into the needle tube 1-1 and is located above the spring 1-3. Inserting the needle tail 1-2, spring 1-3, and needle tip 1-4 into the needle tube 1-1 completes the pre-assembly of the ATE spring probe. The bottom of the needle tip 1-4 is designed with a groove. After the pre-assembly is completed, the needle tube 1-1 is hammered into the groove on a special device to fix the needle tip 1-4 relative to the needle tube 1-1 and to allow the needle tail 1-2 to move relative to the needle tube 1-1.

[0004] ATE spring probe assembly is a very narrow segment of the semiconductor industry chain, with only a handful of companies involved, resulting in relatively slow development of supporting equipment. Currently, ATE spring probe pre-assembly is still done manually, with assembly workers using tweezers to align the needle tail 1-2, spring 1-3, and needle tip 1-4 with the needle tube 1-1 and insert them. Because the ATE spring probe is extremely small, with a total length of only about 3.3mm and a diameter of only 0.3mm for the needle tube 1-1, this size exceeds the range of normal physiological hand tremors, posing significant difficulties for alignment and insertion, and severely reducing assembly efficiency.

[0005] A single test socket may contain anywhere from dozens to hundreds or even thousands of ATE spring probes. If the assembly efficiency of each ATE spring probe is low, it will inevitably reduce the overall manufacturing efficiency of the test socket and increase labor costs. To solve this problem, it is necessary to develop an ATE spring probe pre-assembly device; however, no similar products have yet appeared on the market. Summary of the Invention

[0006] To address the aforementioned technical requirements, this invention designs a semi-automatic pre-assembly device for ATE spring probes. Through the logical design of the opening and closing of the upper gate, lower gate, and main gate, it can automatically align the needle tip, spring, and needle tail and install them into the needle tube, completing the pre-assembly, saving labor costs, significantly shortening alignment time, and improving pre-assembly efficiency. Furthermore, through the structural design of the upper turntable, upper gate fixing plate, middle turntable, lower gate fixing plate, lower fixing plate, and main gate turntable, the logical implementation of the opening and closing of the upper gate, lower gate, and main gate is achieved. At the same time, a parameter design method is also provided, providing a theoretical basis for optimizing the gate structure parameters under different technical parameters.

[0007] The objective of this invention is achieved as follows:

[0008] A semi-automatic pre-assembly device for ATE spring probes is provided for assembling ATE spring probes, wherein the ATE spring probes include a needle tube, a needle tail, a spring, and a needle tip.

[0009] The ATE spring probe semi-automatic pre-assembly device includes a feeding turntable and an assembly mechanism;

[0010] The feeding turntable is divided into multiple fan-shaped cycles. Each fan-shaped cycle is provided with a needle tube feeding hole, a needle tail feeding hole, a spring feeding hole and a needle head feeding hole in sequence along the circumference. Each of the needle tube feeding hole, needle tail feeding hole, spring feeding hole and needle head feeding hole is provided with an upper gate and a lower gate.

[0011] The assembly mechanism is a cylindrical structure, and a main gate is provided at the bottom of the cylindrical structure.

[0012] In the aforementioned ATE spring probe semi-automatic pre-assembly device, the needle tube feeding hole, needle tail feeding hole, spring feeding hole, and needle head feeding hole are all V-shaped countersunk holes. The distance from the upper gate to the top of the V-shaped countersunk hole is less than the height of the material. The material is a needle tube, needle tail, spring, or needle head.

[0013] The above-mentioned semi-automatic pre-assembly device for ATE spring probes includes the following operating steps for the upper and lower gates:

[0014] Step a: The upper gate is closed, the lower gate is closed, and the material is located above the upper gate;

[0015] Step b: The upper gate opens and the lower gate closes, allowing the material to pass through the upper gate and enter above the lower gate.

[0016] Step c: The upper gate is closed, the lower gate is closed, and the material is located between the upper gate and the lower gate;

[0017] Step d: The upper gate is closed and the lower gate is opened, allowing the material to enter the assembly mechanism through the lower gate.

[0018] Further, after step b is completed, material is placed on the upper gate; specifically:

[0019] The syringe is placed in the syringe feeding hole of the feeding turntable;

[0020] The needle tail is placed in the needle tail feeding hole of the feeding turntable;

[0021] The spring is placed in the spring discharge hole of the discharge turntable;

[0022] The needle is placed in the needle feeding hole of the feeding turntable.

[0023] Furthermore, the upper and lower gates in the needle tube feeding hole, needle tail feeding hole, spring feeding hole, and needle head feeding hole sequentially undergo timing sequence a, timing sequence b, timing sequence c, and timing sequence d, so that the needle tube, needle tail, spring, and needle head enter the assembly mechanism in sequence, realizing that the needle head, spring, and needle tail are automatically loaded into the needle tube in sequence to complete the pre-assembly. After the pre-assembly is completed, the lower gate opens.

[0024] The beneficial effects of this invention are as follows:

[0025] Firstly, addressing the problem of low efficiency and difficulty in alignment and insertion caused by physiological hand tremors during the manual pre-assembly of ATE spring probes, this invention designs a semi-automatic pre-assembly device for ATE spring probes. Through the logical design of opening and closing upper gate, lower gate, and main gate, it can automatically align the needle tip, spring, and needle tail and insert them into the needle tube, completing the pre-assembly. This not only saves labor costs but also ensures that the needle tip, spring, and needle tail are strictly aligned with the needle tube through mechanical structure constraints. This solves the problem of low alignment and assembly efficiency caused by physiological hand tremors exceeding the assembly precision during the current manual assembly process. Therefore, it can significantly shorten the alignment time and improve the pre-assembly efficiency.

[0026] Secondly, the present invention also provides a gate structure for ATE spring probe pre-assembly. Through the structural design of the upper turntable, upper gate fixing plate, middle turntable, lower gate fixing plate, lower fixing plate and main gate turntable, the logic implementation of opening and closing of the upper gate, lower gate and main gate is completed.

[0027] Third, this invention not only provides a gate structure for ATE spring probe pre-assembly, but also gives a parameter design method, providing a theoretical basis for optimizing gate structure parameters under different technical parameters. Attached Figure Description

[0028] Figure 1 This is a schematic diagram of the ATE spring probe.

[0029] Figure 2 This is a top view of the material feeding turntable.

[0030] Figure 3This is a schematic diagram showing the relative positions of the feeding turntable and the assembly mechanism.

[0031] Figure 4 This is a schematic diagram of the material in the V-shaped countersink.

[0032] Figure 5 This is the timing diagram of the operation of the upper and lower gates.

[0033] Figure 6 It is a sequence diagram of the operation of the upper turntable, the upper gate fixing plate, the middle turntable, and the lower gate fixing plate.

[0034] Figure 7 This is the assembly process flow diagram for ATE spring probe 1.

[0035] Figure 8 This is a schematic diagram of the structure that enables the upper turntable, middle turntable, and main gate turntable to rotate synchronously and intermittently.

[0036] In the diagram: 1ATE spring probe, 1-1 needle tube, 1-2 needle tail, 1-3 spring, 1-4 needle head, 2 feeding turntable, 2-1 needle tube feeding hole, 2-2 needle tail feeding hole, 2-3 spring feeding hole, 2-4 needle head feeding hole, 3 assembly mechanism, 4 upper gate, 5 lower gate, 6 main gate, 7-1 upper turntable, 7-2 upper gate fixing plate, 7-3 middle turntable, 7-4 lower gate fixing plate, 7-5 lower fixing plate, 7-6 main gate turntable, 8 auxiliary plate, 9 extended end. Detailed Implementation

[0037] The specific embodiments of the present invention will be described in further detail below with reference to the accompanying drawings.

[0038] Method 1

[0039] The following are specific embodiments of the ATE spring probe semi-automatic pre-assembly device of the present invention.

[0040] The semi-automatic pre-assembly device for ATE spring probes in this specific embodiment is used to assemble ATE spring probes 1, which include a needle tube 1-1, a needle tail 1-2, a spring 1-3, and a needle tip 1-4, as shown below. Figure 1 As shown;

[0041] The ATE spring probe semi-automatic pre-assembly device includes a feeding turntable 2 and an assembly mechanism 3;

[0042] The feeding turntable 2 is divided into multiple fan-shaped cycles. Each fan-shaped cycle is provided with a needle tube feeding hole 2-1, a needle tail feeding hole 2-2, a spring feeding hole 2-3, and a needle head feeding hole 2-4 sequentially along the circumferential direction. Each of the needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3, and needle head feeding hole 2-4 is equipped with an upper gate 4 and a lower gate 5. In this specific embodiment, taking the feeding turntable 2 divided into two fan-shaped cycles as an example, the top view is as follows: Figure 2 As shown, it should be noted that Figure 2 The positions of needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3 and needle tip feeding hole 2-4 are only schematic representations and do not represent the actual relative positions.

[0043] The assembly mechanism 3 is a cylindrical structure, and a main gate 6 is provided at the bottom of the cylindrical structure.

[0044] The relative positions of the feeding turntable 2 and the assembly mechanism 3 are shown in the diagram below. Figure 3 As shown.

[0045] Method 2

[0046] The following are specific embodiments of the ATE spring probe semi-automatic pre-assembly device of the present invention.

[0047] The ATE spring probe semi-automatic pre-assembly device in this specific embodiment, based on method one, further specifies that: the needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3, and needle tip feeding hole 2-4 are all V-shaped countersunk holes; the distance from the upper gate 4 to the top of the V-shaped countersunk hole is less than the height of the material; and the material is the needle tube 1-1, needle tail 1-2, spring 1-3, or needle tip 1-4. Figure 4 As shown.

[0048] The V-shaped countersink design allows materials to easily enter the needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3, or needle tip feeding hole 2-4; the distance from the upper gate 4 to the top of the V-shaped countersink is less than the height of the material, making it easy to remove and reposition reversed materials.

[0049] Method 3

[0050] The following are specific embodiments of the ATE spring probe semi-automatic pre-assembly device of the present invention.

[0051] The ATE spring probe semi-automatic pre-assembly device in this specific embodiment, based on method one, further specifies that the working steps of the upper gate 4 and the lower gate 5 are as follows:

[0052] Step a: The upper gate 4 is closed, the lower gate 5 is closed, and the material is located above the upper gate 4;

[0053] Step b: The upper gate 4 is opened and the lower gate 5 is closed, allowing the material to pass through the upper gate 4 and enter above the lower gate 5.

[0054] Step c: The upper gate 4 is closed, the lower gate 5 is closed, and the material is located between the upper gate 4 and the lower gate 5;

[0055] Step d: The upper gate 4 is closed and the lower gate 5 is opened, allowing the material to enter the assembly mechanism 3 through the lower gate 5.

[0056] Taking syringe 1-1 as an example, the four steps are as follows: Figure 5 As shown.

[0057] Method 4

[0058] The following are specific embodiments of the ATE spring probe semi-automatic pre-assembly device of the present invention.

[0059] The ATE spring probe semi-automatic pre-assembly device in this specific embodiment, based on method three, further specifies that: after step b, materials are placed on the upper gate 4; specifically:

[0060] The syringe 1-1 is placed in the syringe feeding hole 2-1 of the feeding turntable 2;

[0061] The needle tail 1-2 is placed in the needle tail discharge hole 2-2 of the feeding turntable 2;

[0062] Springs 1-3 are placed in the spring discharge holes 2-3 of the discharge turntable 2;

[0063] Needles 1-4 are placed in the needle feeding holes 2-4 of the feeding turntable 2.

[0064] Method 5

[0065] The following are specific embodiments of the ATE spring probe semi-automatic pre-assembly device of the present invention.

[0066] The ATE spring probe semi-automatic pre-assembly device in this specific embodiment, based on mode three, further specifies that: the upper gate 4 and lower gate 5 in the needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3 and needle tip feeding hole 2-4 sequentially undergo timing sequence a, timing sequence b, timing sequence c and timing sequence d, so that the needle tube 1-1, needle tail 1-2, spring 1-3 and needle tip 1-4 sequentially enter the assembly mechanism 3, so that the needle tip 1-4, spring 1-3 and needle tail 1-2 are automatically loaded into the needle tube 1-1 in sequence to complete the pre-assembly. After the pre-assembly is completed, the lower gate 5 is opened.

[0067] Method Six

[0068] The following is a specific implementation of the gate structure for ATE spring probe pre-assembly according to the present invention.

[0069] The gate structure for pre-assembly of ATE spring probes in this specific embodiment is used to realize the unloading turntable 2 and the assembly mechanism 3. From top to bottom, it includes an upper turntable 7-1, an upper gate fixing plate 7-2, a middle turntable 7-3, a lower gate fixing plate 7-4, a lower fixing plate 7-5, and a main gate turntable 7-6. The through hole on the upper gate fixing plate 7-2 serves as the upper gate 4, and the through hole on the lower gate fixing plate 7-4 serves as the lower gate 5. The upper turntable 7-1, upper gate fixing plate 7-2, middle turntable 7-3, and lower gate fixing plate 7-4 constitute the unloading turntable 2. The lower fixing plate 7-5 and the main gate turntable 7-6 constitute the assembly mechanism 3. The through hole on the main gate turntable 7-6 serves as the main gate 6. Figure 5 The timing diagrams of the upper and lower gates shown become Figure 6 ;

[0070] The upper turntable 7-1 and the middle turntable 7-3 are provided with needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3 and needle head feeding hole 2-4 in the opposite direction of rotation; the needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3 and needle head feeding hole 2-4 are located on the same circumference and are spaced at the same distance;

[0071] The needle tube feeding holes 2-1 on the upper turntable 7-1 and the middle turntable 7-3 are coaxially arranged.

[0072] The needle tail feeding holes 2-2 on the upper turntable 7-1 and the middle turntable 7-3 are coaxially arranged.

[0073] The spring discharge holes 2-3 on the upper turntable 7-1 and the middle turntable 7-3 are coaxially arranged.

[0074] The needle feeding holes 2-4 on the upper turntable 7-1 and the middle turntable 7-3 are coaxially arranged.

[0075] The upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 rotate synchronously and intermittently.

[0076] The upper turntable 7-1 is provided with a V-shaped countersunk hole, the lower gate fixing plate 7-4 has a through hole, and the main gate turntable 7-6 has a through hole.

[0077] Method Seven

[0078] The following is a specific implementation of the gate structure for ATE spring probe pre-assembly according to the present invention.

[0079] The gate structure for the pre-assembled ATE spring probe under this specific embodiment is further defined based on method six: the distance from the upper gate fixing plate 7-2 to the top of the V counterbore is less than the height of the material, and the material is needle tube 1-1, needle tail 1-2, spring 1-3 or needle head 1-4.

[0080] Method Eight

[0081] The following is a specific implementation of the gate structure for ATE spring probe pre-assembly according to the present invention.

[0082] The gate structure for the pre-assembly of ATE spring probes in this specific embodiment is further defined based on Method Six: the surfaces of the upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 are divided into multiple identical fan-shaped cycles. Each fan-shaped cycle is equally spaced with needle tube feeding holes 2-1, needle tail feeding holes 2-2, spring feeding holes 2-3, needle tip feeding holes 2-4, a first default station, a second default station, and a third default station. The through hole on the main gate turntable 7-6 is located at the first default station. The upper gate fixing plate 7-2, the lower gate fixing plate 7-4, and the lower fixing plate 7-5 are all provided with feeding holes. Along the rotation direction, the through holes on the gate fixing plate 7-2 and the lower gate fixing plate 7-4 are separated by one station, and the through holes on the lower gate fixing plate 7-4 and the lower fixing plate 7-5 are coaxially arranged.

[0083] Under the above structure, the assembly process flow diagram of ATE spring probe 1 is as follows: Figure 7 As shown, in Figure 7 middle,.

[0084] Method Nine

[0085] The following is a specific implementation of the gate structure for ATE spring probe pre-assembly according to the present invention.

[0086] The gate structure for the pre-assembly of the ATE spring probe in this specific embodiment, based on method eight, is further defined as follows: the diameters of the upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 are all d1; the diameters of the upper gate fixing plate 7-2, the lower gate fixing plate 7-4, and the lower fixing plate 7-5 are all d2, and d1 is greater than d2; and each station of the upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 is provided with a notch on its outer circumference. The depth of the opening is less than d1 / 2-d2 / 2. The assembly mechanism 3 also includes an auxiliary disk 8, on which an extension end 9 is provided. When the extension end 9 enters the opening, the upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 rotate. When the extension end 9 leaves the opening, the upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 remain stationary. The extension end 9 alternately enters and leaves the opening, so that the upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 rotate synchronously and intermittently.

[0087] The structural diagram illustrating the synchronous intermittent rotation of the upper turntable 7-1, the middle turntable 7-3, and the main gate turntable 7-6 is shown below. Figure 8 As shown, in Figure 8In the diagram, the positions of needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3, and needle tip feeding hole 2-4 are only schematic representations and do not represent their actual relative positions. The actual relative positions are as follows: Figure 7 As shown.

[0088] Method 10

[0089] The following is a specific implementation of the gate structure for ATE spring probe pre-assembly according to the present invention.

[0090] The gate structure for the pre-assembly of ATE spring probes in this specific embodiment is further defined based on Method Nine: Based on the number n of the fan-shaped cycles contained in the upper turntable 7-1, the needle tube feeding hole 2-1, needle tail feeding hole 2-2, spring feeding hole 2-3, and needle head feeding hole 2-4 are obtained. The central angle between two adjacent stations in the first default station, second default station, and third default station is 2π / n / 7. Based on the time T required to assemble one ATE spring probe, the rotation cycle of the auxiliary wheel is T / 7. Based on the dwell time t of the upper turntable 7-1, middle turntable 7-3, and main gate turntable 7-6 at each station, the central angle corresponding to the contact range between the auxiliary wheel and the upper turntable 7-1, middle turntable 7-3, or main gate turntable 7-6 is 14πt / T.

[0091] This approach provides parameter design methods for each key component, offering a theoretical basis for optimizing gate structure parameters under different technical parameters.

[0092] It should be noted that the above are merely specific embodiments of this application and are not intended to limit this application. Various modifications and variations can be made to this application by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of this application should be included within the protection scope of this application.

[0093] It should also be noted that all the technical features listed in the above specific embodiments can be arranged and combined, as long as they are not contradictory. Those skilled in the art can exhaustively calculate the result of each arrangement and combination based on the mathematical knowledge of permutations and combinations learned in high school. All the results of permutations and combinations should be understood as being disclosed in this application.

Claims

1. A semi-automatic pre-assembly device for ATE spring probes, used to assemble ATE spring probes (1), wherein the ATE spring probe (1) includes a needle tube (1-1), a needle tail (1-2), a spring (1-3), and a needle tip (1-4). Its features are, The ATE spring probe semi-automatic pre-assembly device includes a feeding turntable (2) and an assembly mechanism (3). The feeding turntable (2) is divided into multiple fan-shaped cycles. Each fan-shaped cycle is provided with a needle tube feeding hole (2-1), a needle tail feeding hole (2-2), a spring feeding hole (2-3), and a needle head feeding hole (2-4) in sequence along the circumferential direction. Each of the needle tube feeding hole (2-1), needle tail feeding hole (2-2), spring feeding hole (2-3), and needle head feeding hole (2-4) is provided with an upper gate (4) and a lower gate (5). The assembly mechanism (3) is a cylindrical structure, and a main gate (6) is provided at the bottom of the cylindrical structure. The ATE spring probe semi-automatic pre-assembly device also includes a gate structure for the pre-assembly of the ATE spring probe. The gate structure includes, from top to bottom, an upper turntable (7-1), an upper gate fixing plate (7-2), a middle turntable (7-3), a lower gate fixing plate (7-4), a lower fixing plate (7-5), and a main gate turntable (7-6). The through hole on the upper gate fixing plate (7-2) serves as the upper gate (4), and the through hole on the lower gate fixing plate (7-4) serves as the lower gate (5). The upper turntable (7-1), the upper gate fixing plate (7-2), the middle turntable (7-3), and the lower gate fixing plate (7-4) together form a feeding turntable (2). The lower fixing plate (7-5) and the main gate turntable (7-6) together form an assembly mechanism (3). The through hole on the main gate turntable (7-6) serves as the main gate (6).

2. The ATE spring probe semi-automatic pre-assembly device according to claim 1, characterized in that, The needle tube feeding hole (2-1), needle tail feeding hole (2-2), spring feeding hole (2-3) and needle tip feeding hole (2-4) are all V-shaped recessed holes. The distance from the upper gate (4) to the top of the V-shaped recessed hole is less than the height of the material. The material is a needle tube (1-1), needle tail (1-2), spring (1-3) or needle tip (1-4).

3. The ATE spring probe semi-automatic pre-assembly device according to claim 1, characterized in that, The working steps of the upper gate (4) and the lower gate (5) are as follows: Step a: The upper gate (4) is closed, the lower gate (5) is closed, and the material is located above the upper gate (4); Step b: The upper gate (4) is opened and the lower gate (5) is closed. The material passes through the upper gate (4) and enters above the lower gate (5). Step c: The upper gate (4) is closed, the lower gate (5) is closed, and the material is located between the upper gate (4) and the lower gate (5); Step d: the upper gate (4) is closed and the lower gate (5) is opened, and the material enters the assembly mechanism (3) through the lower gate (5).

4. The ATE spring probe semi-automatic pre-assembly device according to claim 3, characterized in that, After step b is completed, place the material on the upper gate (4); specifically: The syringe (1-1) is placed in the syringe feeding hole (2-1) of the feeding turntable (2). The needle tail (1-2) is placed in the needle tail feeding hole (2-2) of the feeding turntable (2). Springs (1-3) are placed in the spring discharge holes (2-3) of the discharge turntable (2); The needle (1-4) is placed in the needle feeding hole (2-4) of the feeding turntable (2).

5. The ATE spring probe semi-automatic pre-assembly device according to claim 3, characterized in that, The upper gate (4) and lower gate (5) in the needle tube feeding hole (2-1), needle tail feeding hole (2-2), spring feeding hole (2-3) and needle head feeding hole (2-4) sequentially go through timing a, timing b, timing c and timing d, so that the needle tube (1-1), needle tail (1-2), spring (1-3) and needle head (1-4) enter the assembly mechanism (3) in sequence, so that the needle head (1-4), spring (1-3) and needle tail (1-2) are automatically loaded into the needle tube (1-1) in sequence to complete the pre-assembly. After the pre-assembly is completed, the lower gate (5) opens.

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