Test adapter module and test system

Abstract

The application discloses a test adapter module, which comprises a first connector for connecting a hub, a second connector for connecting a product under test and a detection circuit, the first connector comprises a first power port and a first data port; the second connector comprises a second power port, a second data port and a first channel configuration port, the second power port is connected to the first power port, and the second data port is connected to the first data port; the detection circuit comprises a first resistor, a second resistor, a first light emitting diode and a second light emitting diode, one end of the first resistor is connected to the second power port, the other end of the first resistor is grounded through the second light emitting diode, one end of the second resistor is connected to the first channel configuration port, the other end of the second resistor is connected between the first resistor and the second light emitting diode, and the first light emitting diode is connected to the first channel configuration port. The test adapter module can improve the performance test on the interface of the product under test, and has low cost.

Description

Technical Field

[0001] This application relates to the field of electronic product testing, and in particular to a test adapter module and a test system containing the test adapter module. Background Technology

[0002] USB (Universal Serial Bus) interfaces are commonly found in various electronic products, enabling rapid data transfer through plug-and-play connections. Based on differences in metal contacts, USB interfaces are divided into three types: Type-A (also known as USB-A), Type-B (also known as USB-B), and Type-C (also known as USB-C), and can be further subdivided according to their interface shape. Among these, the Type-C interface has become increasingly widely used due to its reversible insertion and higher data transfer rates. Currently, many mobile phones, laptops, and tablets on the market come standard with Type-C interfaces, supporting high-speed transfers of 10Gbps, 20Gbps, and 40Gbps. Another characteristic of Type-C is its small size, making it particularly suitable for consumer electronics. However, Type-A, being an earlier and longest-used USB type, is also known as standard Type-A USB. Many electronic products still within their lifespan may only have Type-A interfaces, while many new products may incorporate multiple interface types for compatibility.

[0003] Storage products with Type-C interfaces, such as portable hard drives with USB-C interfaces, require CC Logic (Configuration Channel Logic) and Vconn Switch functions in practical applications to enable master-slave switching, power switching, and channel switching. However, during mass production, testing, and inspection of storage products, the testing systems used are generally still Type-A interface-based. When connecting storage products to the testing system, a Type-C to Type-A adapter is required. However, the Type-A interface lacks a CC pin, making it impossible to detect the CC Logic and Vconn Switch functions of Type-C interface storage products. This means that the performance testing of the storage product interface is incomplete, and it cannot be guaranteed that the Type-C interface of storage products that pass this test is normal and complete. Storage products that pass this test can be used normally when connected to the Type-A interface of a device (such as a computer), but the Type-C interface of the device may not function properly, posing a significant functional risk.

[0004] The common solution to this problem is to replace the testing system so that storage products can be directly connected to the Type-C interface of the testing system for mass production, testing, and verification. However, the implementation of multi-line integration (HUB) technology based on the Type-C interface is too difficult. On the other hand, the testing system must use a hub because it needs to consider batch operation and efficiency issues. Therefore, directly modifying the testing system to use the Type-C interface is not only difficult, but also involves replacing a large number of chips, which increases costs. This is not a good solution for storage product manufacturers, thus restricting the mass industrial production of Type-C interface storage products.

[0005] In view of this, it is necessary to improve the testing of existing Type-C interface storage products or Type-C interface electronic products. Summary of the Invention

[0006] One of the objectives of this application is to provide a test adapter module that can reduce testing costs while supporting comprehensive testing functions, so as to solve the technical problem that low-cost testing systems in the prior art do not provide comprehensive product function testing.

[0007] A test adapter module includes a first connector, a second connector, and a detection circuit. The first connector is used to connect to a hub and includes a first power port and a first data port. The second connector is used to connect to a product under test (DUT) and includes a second power port, a second data port, and a first channel configuration port. The second power port is connected to the first power port, and the second data port is connected to the first data port. The detection circuit includes a first resistor, a second resistor, a first light-emitting diode (LED), and a second LED. One end of the first resistor is connected to the second power port, and the other end of the first resistor is grounded via the second LED. One end of the second resistor is connected to the first channel configuration port, and the other end of the second resistor is connected between the first resistor and the second LED. The first LED is connected to the first channel configuration port.

[0008] In some embodiments, the second connector further includes a third power port, a third data port, and a second channel configuration port. The third power port is connected to the first power port, and the third data port is connected to the first data port. The detection circuit further includes a third resistor, a fourth resistor, a third light-emitting diode (LED), and a fourth LED. One end of the third resistor is connected to the third power port, and the other end of the third resistor is grounded via the third LED. One end of the fourth resistor is connected to the second channel configuration port, and the other end of the fourth resistor is connected between the third resistor and the third LED. The fourth LED is connected to the second channel configuration port.

[0009] In some embodiments, the negative terminals of the first light-emitting diode, the second light-emitting diode, the third light-emitting diode, and the fourth light-emitting diode are all grounded.

[0010] In some embodiments, the detection circuit further includes a fifth resistor and a sixth resistor, the fifth resistor being connected between the second light-emitting diode and the ground terminal, and the sixth resistor being connected between the fourth light-emitting diode and the ground terminal.

[0011] In some embodiments, the resistance value of the first resistor is greater than the resistance value of the second resistor, and the resistance value of the third resistor is greater than the resistance value of the fourth resistor.

[0012] In some embodiments, the resistance values ​​of the first resistor and the third resistor are both 2.47 kΩ, and the resistance values ​​of the second resistor and the fourth resistor are both 1.5 kΩ.

[0013] In some embodiments, the first and fourth light-emitting diodes are blue light-emitting diodes, and the second and third light-emitting diodes are green light-emitting diodes.

[0014] In some embodiments, a seventh resistor is further included between the second power port and the first power port.

[0015] In some embodiments, the first connector is a USB-A connector and the second connector is a USB-C connector.

[0016] Another objective of this application is to provide a testing system that can reduce testing costs while ensuring comprehensive testing functionality, thereby solving the technical problem of incomplete product function testing in existing low-cost testing systems.

[0017] A testing system includes: a test host; a hub connected to the test host, the hub including multiple interfaces; multiple test adapter modules respectively connected to the multiple interfaces, each test adapter module including a first connector, a second connector, and a detection circuit; the first connector is used to connect to the interfaces of the hub, the first connector including a first power port and a first data port; the second connector is used to connect to a product under test, the second connector including a second power port, a second data port, and a first channel configuration port, the second power port being connected to the first power port, the second data port being connected to the first data port; the detection circuit includes a first resistor, a second resistor, a first light-emitting diode (LED), and a second LED, one end of the first resistor being connected to the second power port, the other end of the first resistor being grounded via the second LED, one end of the second resistor being connected to the first channel configuration port, the other end of the second resistor being connected between the first resistor and the second LED, and the first LED being connected to the first channel configuration port.

[0018] According to the test adapter module and test system of this invention, the test adapter module is connected to the hub of the test system through a first connector, and is connected to the product under test (DUT) through a second connector that has data and power connections with the first connector. On the one hand, basic data transmission tests can be performed on the DUT connected to the test adapter module and having an interface that matches the second connector through the hub, which has an interface and chip that match the first connector. On the other hand, a detection circuit is connected to the first channel configuration port of the second connector. The first resistor, the second resistor, the first LED, and the second LED included in the detection circuit can detect open circuits, short circuits, poor contacts, excessive resistance to ground, and / or insufficient resistance to ground of the channel configuration pins of the DUT corresponding to the first channel configuration port. Thus, the performance of the channel configuration pins of the DUT can be tested using a simple resistor and diode combination. This enables a complete test of the interface performance of the DUT with an interface that matches the second connector, eliminating potential functional problems. Furthermore, the test adapter module does not use chips, resulting in lower overall costs. It also allows for the continued use of existing test equipment, which is beneficial for mass production testing of the product.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains.

[0020] The various features and implementations of this application mentioned in the foregoing aspects may be applied to other aspects with appropriate modifications, depending on the circumstances. Therefore, a specific feature in one aspect may be appropriately combined with specific features in other aspects.

[0021] Other advantages, objectives and features of this application will be partly apparent from the description below, and partly understood by those skilled in the art through study and practice of this application. Attached Figure Description

[0022] To more clearly illustrate the solutions in this application, the accompanying drawings used in the description of the embodiments of this application will be briefly introduced below. Obviously, the accompanying drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a circuit block diagram of a test system according to one embodiment of this application;

[0024] Figure 2 This is a circuit block diagram of a test adapter module according to one embodiment of this application;

[0025] Figure 3 This is a schematic diagram of the circuit structure of the first connector included in the test adapter module according to one embodiment of this application;

[0026] Figure 4 This is a schematic diagram of the circuit structure of the second connector included in the test adapter module according to one embodiment of this application;

[0027] Figure 5 This is a simplified circuit diagram of the product under test connected to the test system according to one embodiment of this application. Detailed Implementation

[0028] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application pertains; the terminology used herein in the specification is for the purpose of describing particular embodiments only and is not intended to limit the application; the terms "comprising" and "having," and any variations thereof, in the specification, claims, and accompanying drawings of this application are intended to cover non-exclusive inclusion. The terms "first," "second," etc., in the specification, claims, or accompanying drawings of this application are used to distinguish different objects, not to describe a specific order or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).

[0029] Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments. At the same time, the steps or actions in the method description can be rearranged or adjusted in a manner obvious to those skilled in the art. Therefore, the various orders in the specification and drawings are only for the clear description of a particular embodiment and do not imply a necessary order, unless otherwise stated that a particular order must be followed.

[0030] The present invention will now be described in further detail with reference to specific embodiments and accompanying drawings. In the following embodiments, many details are described to facilitate a better understanding of the present application. However, those skilled in the art will readily recognize that some features may be omitted in different situations, or may be replaced by other elements, materials, or methods. In some cases, certain operations related to the present application are not shown or described in the specification. This is to avoid obscuring the core parts of the present application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art.

[0031] Please refer to Figure 1 This is a circuit block diagram of a test system according to one embodiment of this application. The test system includes a test host 100, a hub 1, and multiple test adapter modules 2. For simplicity, only one test adapter module 2 is shown in the figure. The hub 1 is connected to the test host 100, which can be used to control the test process and display test data. The hub 1 includes multiple interfaces 10 and corresponding interface chips (not shown). Specifically, the multiple interfaces 10 can be USB-A interfaces. One end of the test adapter module 2 is connected to the interface 10, and the other end is connected to the product under test (DUT) 3. The interface type of the DUT 3 is different from that of the hub. For example, interface 10 is a USB-A interface, while the interface of the DUT 3 is a USB-C interface; for example, the DUT 3 is a USB-C interface memory. Through the test adapter module 2, performance testing can be performed on a DUT containing a second type of interface (e.g., a USB-C interface) using an interface of the first type (e.g., a USB-A interface).

[0032] Please refer to the following: Figure 2This is a circuit block diagram of a test adapter module according to an embodiment of this application. As an example of this application, the test adapter module 2 includes a first connector 21, a second connector 23, and a detection circuit 25. The first connector 21 is used to connect to the interface 10 of the hub 1, the second connector 23 is used to connect to the interface of the product under test 3 that matches the second connector 23, and the detection circuit 25 is connected to the second connector 23, thereby being able to connect to the interface of the product under test 3 that matches the second connector 23. On the one hand, the test adapter module 2 connects the product under test 3 to a hub with a USB-A interface to test the data transmission function of the interface of the product under test 3. On the other hand, the detection circuit 25 included in the test adapter module 2 performs supplementary testing on the product under test 3, thereby achieving a complete test of the interface performance of the product under test 3.

[0033] Please refer to further details. Figure 3 This is a schematic diagram of the circuit structure of the first connector included in a test adapter module according to one embodiment of this application. The first connector 21 includes a first power port F1 and first data ports F2 and F3, wherein the first power port F1 is connected to the power pin VBUS of interface 10, and the first data ports F2 and F3 are used to transmit a set of differential data signals, such as... Figure 3 As shown, hub 1 includes interface 10, which is a USB 3.0 TYPE-A interface. Therefore, the first data ports F2 and F3 can correspond to the differential data signal pins D- and D+ of interface 10, respectively. In other embodiments, they can also correspond to the high-speed transmit differential pins SSTX- and SSTX+ of interface 10, or the high-speed receive differential pins SSRX- and SSRX+ of interface 10. It should be understood that the first data ports are not limited to F2 and F3; all data ports included in the first connector 21 can be defined as first data ports, such as F2, F3, F5, F6, F8, and F9. In one example, the first connector 21 can include 11 ports F1 to F11. When the first connector 21 is connected to interface 10, it is connected to the pins of interface 10 (including pins, tubes, metal contacts, wires, shielding shells, etc.), as shown in Table 1. It can be understood that each port included in the first connector 21 can also be a conductive structure in the form of metal contacts, wires, etc.

[0034] Table 1

[0035]

[0036] Please refer to Figure 4This is a schematic diagram of the circuit structure of the second connector included in the test adapter module according to one embodiment of this application. The second connector 23 includes a second power port A9, second data ports A6 and A7, and a first channel configuration port CC1. The second power port A9 is connected to the first power port F1, and the second data ports A7 and A6 are respectively connected to the first data ports F2 and F3. Both the first data port and the second data port are differential ports. The two ports F2 and F3 included in the first data port can be defined as the first negative data port F2 and the first positive data port, respectively. The two ports A7 and A6 included in the second data port can be defined as the second negative data port A7 and the second positive data port A6, respectively. In one example, the second negative data port A7 is connected to the first negative data port F2, and an eighth resistor R26 is also included between them. The second positive data port A6 is connected to the first positive data port F3, and a ninth resistor R27 is also included between them.

[0037] In one example, the second connector 23 may include 26 ports, specifically 12 ports A1-A12 of the first channel (A side), 12 ports B1-B12 of the second channel (B side), and 4 metal shielded ports 13-16. The data ports on the A side, including A2, A3, A6, A7, A10, and A11, can be defined as the second data ports. In this paper, the connection between the second data port (third data port) and the first data port refers to a direct or indirect connection between some or all of the ports contained in each port. When the second connector 23 is connected to the product under test 3, it connects to the pins (including pins, tubes, metal contacts, wires, shielding shells, etc.) of the interface (USB-C interface) contained in the product under test 3, as shown in Table 2. It can be understood that each port contained in the second connector 23 can also be a conductive structure in the form of metal contacts, wires, etc. Specifically, the second connector 23 and the first connector 21 can be connector heads or connector sockets containing multiple metal contacts or pins.

[0038] Table 2

[0039]

[0040]

[0041]

[0042] The detection circuit includes a first resistor R1, a second resistor R2, a first light-emitting diode D1, and a second light-emitting diode D2. One end of the first resistor R1 is connected to the second power port A9, and the other end of the first resistor R1 is grounded through the second light-emitting diode D2. One end of the second resistor R2 is connected to the first channel configuration port CC1, and the other end of the second resistor R2 is connected between the first resistor R1 and the second light-emitting diode D2. The first light-emitting diode D1 is connected to the first channel configuration port CC1.

[0043] Please refer to the following: Figure 5 This is a simplified circuit diagram of the product under test (DUT) connected to the test system according to one embodiment of this application. The first configuration pin CC_1 corresponding to the first configuration port CC1 and the second configuration pin CC_2 corresponding to the second configuration port CC2 in the USB-C interface of the DUT 3 are grounded via the first ground resistor Rcc1 and the second ground resistor Rcc2, respectively. When the first connector 21 of the test adapter module 2 is connected to the interface 10 and the second connector 23 is connected to the DUT 3, the interconnection between the first power port F1 and the second power ports A9 / A4 in the test adapter module 2 connects the power pins of the interface 10 in the hub 1 to the power pins of the interface of the DUT 3. Similarly, the interconnection between the first data port and the second data port in the test conversion module 2 creates a data interconnection channel between the interface 10 in the hub 1 and the interface of the DUT 3, thereby enabling testing of the power supply and data transmission performance of the DUT. Simultaneously, the detection circuit 25 can be used to test functions such as channel configuration.

[0044] Specifically, the first resistor R1 can be a 2.49K ohm resistor, the second resistor R2 can be a 1.5K ohm resistor, the power supply Vbus is 5V, and the first ground resistor Rcc1 of the first configuration pin CC_1 is a 5.1K ohm resistor. When the first ground resistor Rcc1 is open or the first configuration pin CC_1 has poor contact and is open, the first resistor R1 and the second resistor R2 constitute a current-limiting resistor (R1+R2=3.99K ohms). The forward voltage of the first LED D1 is 5V, which is greater than the driving voltage of the first LED D1, so the first LED D1 lights up. The first resistor R1 is a pull-up resistor, and the second resistor R2 and the first LED D1 are pull-down resistors. The forward voltage of the second LED D2, Vd2+=R2 / (R1+R2)*Vbus=1.879V, is lower than 2.5V, while the driving voltage of the second LED D2 is ≥2.6V, therefore the second LED D2 does not light up.

[0045] When the first configuration pin CC_1 is short-circuited to ground or the resistance of the first ground resistor Rcc1 is too low, the voltage at the D+ terminal (positive terminal or anode) of the first LED D1 is pulled low, meaning the forward voltage Vd1+ of LED D1 is 0V, and therefore the first LED D1 does not light up. Simultaneously, the forward voltage Vd2+ of the second LED D2 is R2 / (R1+R2)*Vbus = 1.879V, and the second LED D2 is also not lit.

[0046] When the resistance value of the first resistor to ground, Rcc1, of the first configuration pin CC_1 is too large, for example, the resistance value of the first resistor to ground, Rcc1, is 10K ohms, the forward voltage of the second LED, D2, is Vd2+ = R2 / (R1+R2)*Vbus = 1.879V, and the second LED, D2, does not light up. The first resistor, R1, and the second resistor, R2, form a current-limiting resistor (R1+R2 = 3.99K ohms), and the forward voltage of the first LED, D1, is 5V, which is greater than the driving voltage of the first LED, so the first LED, D1, lights up.

[0047] When the circuit is in normal operation, both the first LED D1 and the second LED D2 emit light.

[0048] In some embodiments, the second connector 23 further includes a third power port B4, a third data port B6 and B7, and a second channel configuration port CC2. The third power port B4 is connected to the first power port F1, and the third data ports B7 and B6 are respectively connected to the first data ports F2 and F3. The detection circuit 25 further includes a third resistor R3, a fourth resistor R4, a third light-emitting diode D3, and a fourth light-emitting diode D4. One end of the third resistor R3 is connected to the third power port B4, and the other end of the third resistor R3 is grounded via the third light-emitting diode D3. One end of the fourth resistor R4 is connected to the second channel configuration port CC2, and the other end of the fourth resistor R4 is connected between the third resistor R3 and the third light-emitting diode D3. The fourth light-emitting diode D4 is connected to the second channel configuration port CC2. By providing a detection circuit composed of resistors and light-emitting diodes on both sides of the second connector 23, performance testing of the channel configuration and VCCONSwitch function of the USB-C front and back of the product under test 3 can be achieved. The operating states of the third LED D3 and the fourth LED D4 can be referenced from the operating states of the first LED D1 and the second LED D2 described above. For a clearer visual representation, the lighting states of the detection circuit 25 can be seen in Table 3. It should be noted that although the table only shows the test of the CC pin (CC Logic), those skilled in the art will understand that when the USB-C interface is plugged in, one side, i.e., one channel, such as channel 1, uses the CC pin as the channel configuration pin, while the CC pin on the other channel automatically uses it as the VCONN pin. VCONN is the power supply for the EMARKER chip on the cable. Therefore, testing the CC pin can actually complete the test of the VCONN Switch function, which will not be described in detail here.

[0049] Table 3

[0050]

[0051] In the aforementioned detection circuit 25, the negative terminals of the first LED D1, the second LED D2, the third LED D3, and the fourth LED D4 are all grounded.

[0052] In some embodiments, the detection circuit 25 further includes a fifth resistor R5 and a sixth resistor R6. The fifth resistor R5 is connected between the second light-emitting diode D2 and the ground terminal GND, and the sixth resistor R6 is connected between the fourth light-emitting diode D4 and the ground terminal GND. The values ​​of the fifth resistor R5 and the sixth resistor R6 are 4.7 kΩ.

[0053] In some embodiments, the resistance of the first resistor R1 is greater than the resistance of the second resistor R2, and the resistance of the third resistor R3 is greater than the resistance of the fourth resistor R4. Specifically, the ratio of the resistance of the second resistor R2 to that of the first resistor R1 and the second resistor R2 is less than the ratio of the driving voltage of the second light-emitting diode D2 to the power supply voltage.

[0054] In some embodiments, the first LED D1 and the fourth LED D4 are blue LEDs, and the second LED D2 and the third LED D3 are green LEDs. The difference in color allows testing operators to quickly determine the specific nature of any interface malfunctions in the storage product under test.

[0055] In some embodiments, the third data ports B7 and B6 are connected to the first data ports F2 and F3 via the eighth resistor R26 and the ninth resistor R27, respectively.

[0056] In some embodiments, the first data port further includes a first high-speed data transmission negative port F5, a first high-speed data transmission positive port F6, a first high-speed data reception negative port F8, and a first high-speed data reception positive port F9. Correspondingly, the second data port further includes a second high-speed data reception positive port A2 and a second high-speed data reception negative port A3, and the third data port further includes a second high-speed data transmission negative port B10 and a second high-speed data transmission positive port B11, wherein the first high-speed data transmission negative port F5 is connected to the second high-speed data transmission negative port B10 via a first capacitor BC5, the first high-speed data transmission positive port F6 is connected to the second high-speed data transmission positive port B11 via a second capacitor BC6, the first high-speed data reception negative port F8 is connected to the second high-speed data reception negative port A3, and the first high-speed data reception positive port F9 is connected to the second high-speed data reception positive port A2.

[0057] The second connector 23 also includes a fourth power port A4 and a fifth power port B9, which are located on the A and B sides of the second connector 23, respectively. The fourth power port A4 is connected to the first power port F1, and the fifth power port B9 is connected to the first power port F1 via the seventh resistor R25.

[0058] In the aforementioned embodiments, the first connector 21 is a USB-A connector, and the second connector 23 is a USB-C connector. It should be understood that the first connector 21 and the second connector 23 included in the test adapter module 2 only contain conductive ports and do not include chips. The test adapter module 2 can integrate the first connector 21, the second connector 23, the detection circuit 25, and peripheral circuits (such as the seventh resistor R25, the eighth resistor R26, etc.) on a single circuit board, eliminating the need for expensive electronic components like chips on this circuit board.

[0059] According to the test adapter module 2 and test system of this invention, the test adapter module 2 is connected to the hub 1 of the test system through the first connector 21 included in the test adapter module 2, and is connected to the product under test 3 through the second connector 23 which has data connection and power connection with the first connector 21. On the one hand, basic data transmission tests can be performed on the product under test 3 connected to the test adapter module 2 and having an interface that matches the second connector 23 through the hub 1 which has an interface (and chip) that matches the first connector 21. On the other hand, it is connected to the first channel configuration port CC1 of the second connector 25 through the detection circuit 25. The first resistor R1, the second resistor R2, and the first light-emitting diode D1 and the second light-emitting diode D2 included in the detection circuit 25 can detect the open circuit, short circuit, poor contact, high resistance to ground and / or low resistance to ground of the channel configuration pins of the product under test corresponding to the first channel configuration port CC1. Thus, the CC Logic and Vconn related to the channel configuration pins of the product under test 3 can be detected by a simple resistor and diode combination. The switch performance test is completed, thereby enabling a full test of the interface performance of the product under test 3 with an interface that matches the second connector 23. This eliminates potential functional problems in the product, and the test adapter module 2 used does not require a chip, while still allowing the continued use of existing test equipment (such as the hub 1 with a USB-A interface and related test host). This avoids a significant increase in testing costs due to the obsolescence of test equipment with the previous generation interface, which is beneficial for mass production testing. This document describes various exemplary embodiments with reference to them. However, those skilled in the art will recognize that changes and modifications can be made to the exemplary embodiments without departing from the scope of this document. For example, various operational steps and the components used to perform these steps can be implemented differently depending on the specific application or any number of cost functions associated with the operation of the system (e.g., one or more steps can be deleted, modified, or combined with other steps).

[0060] While the principles herein have been illustrated in various embodiments, numerous modifications to the structure, arrangement, proportions, elements, materials, and components, particularly suited to specific environmental and operational requirements, may be used without departing from the principles and scope of this disclosure. These modifications and other alterations or alterations will be included within the scope of this document.

[0061] The foregoing specific descriptions have been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, considerations for this disclosure are to be illustrative rather than restrictive, and all such modifications are to be included within its scope. Similarly, advantages, other advantages, and solutions to problems with respect to various embodiments have been described above. However, benefits, advantages, solutions to problems, and any elements that produce these, or make them more explicit, should not be construed as critical, essential, or necessary. The term “comprising” and any other variations thereof as used herein are non-exclusive inclusion, meaning that a process, method, or apparatus that includes a list of elements includes not only those elements but also other elements not expressly listed or not part of the process, method, system, or apparatus. Furthermore, the term “coupling” and any other variations thereof as used herein refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections, and / or any other connections.

[0062] Those skilled in the art will recognize that many changes can be made to the details of the above embodiments without departing from the basic principles of the invention. Therefore, the scope of the invention should be determined according to the following claims.

Claims

1. A test adapter module, characterized in that, include: A first connector for connecting a hub, the first connector including a first power port and a first data port; A second connector is used to connect the product under test. The second connector includes a second power port, a second data port and a first channel configuration port. The second power port is connected to the first power port and the second data port is connected to the first data port. The detection circuit includes: a first resistor, a second resistor, a first light-emitting diode (LED), and a second LED. One end of the first resistor is connected to the second power port, and the other end of the first resistor is grounded through the second LED. One end of the second resistor is connected to the first channel configuration port, and the other end of the second resistor is connected between the first resistor and the second LED. The first LED is connected to the first channel configuration port, and the negative terminal of the first LED is grounded.

2. The test adapter module according to claim 1, characterized in that, The second connector further includes a third power port, a third data port, and a second channel configuration port. The third power port is connected to the first power port, and the third data port is connected to the first data port. The detection circuit further includes a third resistor, a fourth resistor, a third light-emitting diode (LED), and a fourth LED. One end of the third resistor is connected to the third power port, and the other end of the third resistor is grounded via the third LED. One end of the fourth resistor is connected to the second channel configuration port, and the other end of the fourth resistor is connected between the third resistor and the third LED. The fourth LED is connected to the second channel configuration port, and the negative terminal of the fourth LED is grounded.

3. The test adapter module according to claim 2, characterized in that, The negative terminals of both the second and third LEDs are grounded.

4. The test adapter module according to claim 2, characterized in that, The detection circuit further includes a fifth resistor and a sixth resistor, the fifth resistor being connected between the second light-emitting diode and the ground terminal, and the sixth resistor being connected between the fourth light-emitting diode and the ground terminal.

5. The test adapter module according to claim 2, characterized in that, The resistance of the first resistor is greater than the resistance of the second resistor, and the resistance of the third resistor is greater than the resistance of the fourth resistor.

6. The test adapter module according to claim 5, characterized in that, The first resistor and the third resistor both have a resistance of 2.47 kΩ, and the second resistor and the fourth resistor both have a resistance of 1.5 kΩ.

7. The test adapter module according to claim 2, characterized in that, The first and fourth light-emitting diodes are blue light-emitting diodes, and the second and third light-emitting diodes are green light-emitting diodes.

8. The test adapter module according to claim 2, characterized in that, A seventh resistor is further included between the second power port and the first power port.

9. The test adapter module according to claim 1, characterized in that, The first connector is a USB-A connector, and the second connector is a USB-C connector.

10. A testing system, characterized in that, include: Test host; A hub connected to the test host, the hub including multiple interfaces; Multiple test adapter modules are respectively connected to the multiple interfaces, wherein the test adapter module is the test adapter module according to any one of claims 1-9, and the first connector of the test adapter module is connected to the interface.

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