A field effect transistor testing apparatus

Abstract

The application provides a field effect transistor testing device and relates to the field effect transistor testing device field. A guide assembly is in sliding connection with a connecting assembly. The connecting assembly comprises a mouth-shaped fixing frame, the mouth-shaped fixing frame is symmetrically provided with a first moving assembly and a second moving assembly, one end of the first moving assembly close to the second moving assembly and one end of the second moving assembly close to the first moving assembly are both provided with clamping grooves, the clamping grooves on the first moving assembly and the clamping grooves on the second moving assembly are symmetrically arranged, and connecting heads are clamped in the clamping grooves. The guide assembly can drive the connecting assembly to move up and down, so that the pins of the field effect transistor are located between the two symmetrically arranged connecting heads, the first moving assembly and the second moving assembly push the connecting heads to move close to each other until the two connecting heads clamp the pins, so that the field effect transistor is detected, and the staff can identify the unqualified field effect transistor by observing the testing assembly and remove the unqualified field effect transistor.

Description

Technical Field

[0001] This invention relates to the field of field-effect transistor (FET) testing equipment, and more specifically, to a field-effect transistor (FET) testing device. Background Technology

[0002] Field-effect transistors (FETs) are the building blocks of field-effect transistors, mainly divided into two types: structural FETs and metal-oxide-semiconductor FETs. FETs have advantages such as low noise, high resistance, low power consumption, and a wide safe operating area, and are widely used in circuits. Therefore, to ensure product quality, the testing of FETs is particularly important for products leaving the factory. Currently, FET testing is mostly done manually, which is inefficient.

[0003] Chinese patent CN202211000766.0 discloses a field-effect transistor (FET) reliability testing device, including a workbench, testing equipment, a gripping robot, a feeding device, and a lifting mechanism. The testing equipment and gripping robot are mounted on the workbench. The feeding device is located on one side of the workbench and can be used by the gripping robot to hold the FET. The feeding device has a limiting fixture, which is a rectangular groove with an internal concave shape. The bottom of the rectangular groove has semi-cylinders that align with the upward-protruding sides. After the FET is placed into the limiting fixture, the semi-cylinder groove on the FET corresponds to the semi-cylinder protrusion on the limiting fixture. The limiting fixture has a through rectangular opening at its bottom. The lifting mechanism is located directly below the limiting fixture on the feeding device, and the lifting process can be achieved through the bottom opening of the limiting fixture. The use of the limiting fixture prevents the FET from being bumped during feeding, reducing the possibility of accidental damage during testing.

[0004] Chinese patent CN216013566U discloses a reliability testing device for field-effect transistors. The device uses an electric gripper and a cylinder to clamp the field-effect transistor and insert it into the testing equipment. The characteristics of an electromagnet enable the automatic unloading of the field-effect transistor, saving time and manpower.

[0005] While existing technologies have achieved automated detection and unloading, they all employ a plug-and-play method for testing MOSFETs. The leads of the MOSFETs are very fragile; if there is a misalignment during mechanical testing, the leads cannot be accurately inserted into the testing holes, and may bend or break. Furthermore, existing MOSFET testing equipment generally performs only a single test, thus limiting its testing efficiency. Summary of the Invention

[0006] The purpose of this invention is to provide a field-effect transistor testing device that addresses the shortcomings of existing technologies and solves the problems mentioned in the background section.

[0007] To solve the above-mentioned technical problems, the technical solution adopted by the present invention is as follows:

[0008] A field-effect transistor testing device includes a worktable, on which a positioning component, a guiding component, a connecting component, and a testing component are arranged;

[0009] The guide component and the connecting component are slidably connected. The connecting component can move along the height direction of the guide component and is located above the positioning component. The connecting component includes a mouth-shaped fixing frame. A first moving component and a second moving component are symmetrically arranged inside the mouth-shaped fixing frame. A slot is provided at the end of the first moving component near the second moving component and at the end of the second moving component near the first moving component. The slots on the first moving component and the slots on the second moving component are symmetrically arranged. A connector is engaged in the slot. The connectors in the symmetrically arranged slots can abut against each other.

[0010] Positioning components are used to fix the field-effect transistor;

[0011] The guiding component, connecting component, and positioning component are all electrically connected to the test component.

[0012] Furthermore, the positioning component includes a positioning stage and a fixing seat in an n-shaped structure. The positioning stage has a positioning cavity that extends through the upper and lower ends of the positioning stage, and the lower end of the fixing seat is embedded in the positioning cavity.

[0013] The fixing base is provided with multiple fixing cavities at intervals, and the fixing cavities pass through the upper and lower ends of the fixing base;

[0014] The bottom of the fixed base is provided with a first limiting component, which is slidably connected to the fixed base. The first limiting component is used to open and close the bottom opening of the fixed cavity.

[0015] Furthermore, the first limiting component includes a sliding plate, a first telescopic member, and a guide strip with a groove;

[0016] The guide strips are installed at intervals at the bottom of the fixed base, and the two ends of the sliding plate are respectively located in the grooves of two adjacent guide strips. One end of the sliding plate is connected to the side wall of the fixed base through the first telescopic member.

[0017] Furthermore, a second limiting component is also provided inside the fixed base, and the second limiting component is slidably connected to the fixed base;

[0018] The second limiting component includes an electromagnetic device, two guide rods, an elastic element, and multiple fixing plates. The electromagnetic device is installed on one side of the fixing base and connected to the guide rods. The two guide rods are installed at intervals in the fixing base and are slidably connected to the fixing base. The fixing cavity is located between the two guide rods.

[0019] The elastic element is sleeved on the guide rod, with one end of the elastic element near the electromagnetic device abutting against the fixed base, and the other end of the elastic element connected to the guide rod.

[0020] Each of the multiple fixed cavities is equipped with a fixed plate, with both ends of the fixed plate passing through both ends of the fixed cavity and being fixedly connected to two guide rods respectively.

[0021] Furthermore, the first moving component includes a second telescopic member and a first card holder, the first card holder being connected to the inner wall of the mouth-shaped fixing frame via the second telescopic member;

[0022] The card slot is located on the side of the first card holder away from the second telescopic member, and the upper end, lower end and the end away from the second telescopic member of the card slot are all open.

[0023] The second moving component has the same structure as the first moving component.

[0024] Furthermore, the connector includes a clamping part and a connecting part, with the lower end of the connecting part connected to the upper end of the clamping part; three clearance grooves are provided at intervals on the two side walls of the two symmetrically arranged clamping parts that abut against each other, and a first metal plate is provided in the clearance groove of one of the clamping parts. The upper ends of the three first metal plates are laid at intervals on the top of the clamping part. The connecting part is provided with three mating interfaces, and a second metal plate is provided in each of the three mating interfaces. The second metal plates are arranged in a one-to-one correspondence with the first metal plates, and the lower end of the second metal plate abuts against the upper end of the first metal plate.

[0025] Furthermore, the guiding assembly includes a guide frame, on which a guide rail and a drive assembly are mounted. The connecting assembly is connected to the guide frame via the guide rail, and the drive assembly is rotatably connected to the connecting assembly.

[0026] Furthermore, the test components include test equipment and control equipment. The test equipment is electrically connected to the connection components, and the test equipment, positioning components, and guiding components are all electrically connected to the control equipment.

[0027] Preferably, a waste bin is provided at the bottom of the workbench, and an avoidance window is provided on the workbench, with the avoidance window located above the waste bin and the positioning component located above the avoidance window.

[0028] The present invention has at least the following advantages or beneficial effects:

[0029] 1. Compared with the prior art, this application uses a positioning component to fix and position the field-effect transistor (FET). The guide component can drive the connecting component to move up and down, so that the FET pins are located between two symmetrically arranged connectors. Then, the first and second moving components can push the connectors closer to each other until the two connectors clamp the pins. The FET is connected to the test component through the connectors, thereby testing the FET. The test results can be displayed on the test component. By observing the displayed results, the operator can identify and reject unqualified FETs.

[0030] 2. When the first limiting component is running, the test component can individually control the movement of each sliding plate, thereby controlling the opening and closing of the bottom of each fixed cavity. The bottom of the field-effect transistor abuts against the top surface of the sliding plate. The test equipment can transmit the test results to the control equipment. The control equipment controls the movement of the sliding plate below the defective field-effect transistor based on the test results. The field-effect transistor can then slide down from the fixed cavity and sequentially pass through the positioning cavity and the clearance window into the waste box.

[0031] 3. When the second limiting component is in operation, the fixing plate and the cavity wall of its fixed cavity cooperate to clamp the field-effect transistor, thereby fixing field-effect transistors of different specifications. Of course, when the first limiting component is in operation, the second limiting component stops working, and the guide rod moves under the tension of the elastic element, causing the fixing plate to separate from the field-effect transistor, no longer limiting the field-effect transistor.

[0032] 4. The connectors are available in various specifications to suit the field-effect transistors. The difference between the different specifications of the connectors lies in the spacing between the clearance slots. The structure is the same, which facilitates the connection of the upper end of the connector to the test equipment. Attached Figure Description

[0033] To more clearly illustrate the technical solutions of the embodiments of the present invention, the accompanying drawings used in the embodiments will be briefly introduced below. It should be understood that the following drawings only show some embodiments of the present invention and should not be regarded as a limitation on the scope. For those skilled in the art, other related drawings can be obtained based on these drawings without creative effort.

[0034] Figure 1 This is a schematic diagram of the structure of a field-effect transistor testing device provided by the present invention;

[0035] Figure 2 A schematic diagram of the structure of the first and second movable components provided by the present invention mounted on the mouth-shaped fixing frame;

[0036] Figure 3 This is a schematic diagram of the connector structure provided by the present invention;

[0037] Figure 4 A schematic diagram of the internal structure of the connector provided by the present invention installed in the slot;

[0038] Figure 5 A schematic diagram of the internal structure of the positioning component provided by the present invention;

[0039] Figure 6 A schematic diagram of the internal structure of the fixing base provided by the present invention;

[0040] Figure 7 A schematic diagram of the bottom structure of the fixing base provided by the present invention.

[0041] Icons: 100-Workbench; 101-Field-Effect Transistor; 103-Waste Bin; 105-Avoidance Window; 110-Positioning Component; 111-Positioning Stage; 112-Fixed Seat; 113-Positioning Cavity; 114-Fixed Cavity; 115-First Limiting Component; 116-Sliding Plate; 117-First Telescopic Component; 118-Guide Strip; 119-Slide Groove; 120-Second Limiting Component; 121-Electromagnetic Device; 123-Guide Rod; 125-Elastic Component; 127-Fixed Plate; 130-Guide Component; 131-Guide Frame; 133-Guide Rail; 135-Drive Component ; 137-Drive motor; 139-Ball screw pair; 150-Connecting assembly; 151-Mouth-shaped fixing bracket; 152-First moving assembly; 153-Second moving assembly; 154-Slot; 155-First slot; 156-Guide groove; 157-Second telescopic component; 158-Limiting strip; 170-Testing assembly; 171-Testing equipment; 173-Control equipment; 190-Connector; 191-Clamping part; 192-Connecting part; 193-First metal plate; 194-Mating interface; 195-Second metal plate; 196-Allowing groove; 197-Limiting groove. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0043] Please refer to Figures 1 to 7 As shown, a field-effect transistor (FET) testing device includes a worktable 100, on which a positioning component 110, a guide component 130, a connecting component 150, and a testing component 170 are disposed. The guide component 130 is slidably connected to the connecting component 150, and the connecting component 150 is movable along the height direction of the guide component 130. The connecting component 150 is located above the positioning component 110; the positioning component 110 is used to fix the FET 101. Both the guide component 130 and the connecting component 150 are electrically connected to the testing component 170.

[0044] Specifically, the connecting assembly 150 includes a mouth-shaped fixing frame 151, within which a first moving assembly 152 and a second moving assembly 153 are symmetrically arranged. Each of the first moving assembly 152 and the second moving assembly 153 has a slot 154 near the end of the first moving assembly 152 and the end of the second moving assembly 153 near the end of the second moving assembly 153, and the slots 154 on the first moving assembly 152 and the second moving assembly 153 are symmetrically arranged. A connector 190 is engaged within each slot 154.

[0045] The operator places the field-effect transistor 101 on the positioning component 110, which fixes and limits the position of the MOSFET 101. Then, the testing component 170 manipulates the first moving component 152 and the second moving component 153 to move in opposite directions. The testing component 170 then manipulates the guide component 130 to move, causing the connecting component 150 to move downwards until the pins of the MOSFET 101 are between the two connectors 190. Next, the first moving component 152 and the second moving component 153 are moved towards each other, causing the two connectors 190 to abut. At this point, the pins of the MOSFET 101 are clamped by the two connectors 190, thus connecting the MOSFET 101 to the testing component 170 for testing. The testing component 170 displays the test results, allowing the operator to reject any defective MOSFETs 101 by observing the results. This device uses a clamping method to connect the MOSFET 101 into the circuit, preventing damage to the pins of the MOSFET 101. Moreover, this device can detect multiple field-effect transistors 101 at the same time, which greatly improves working efficiency.

[0046] Specifically, the first moving component 152 includes a second telescopic member 157 and a first retainer 155. The first retainer 155 is connected to the inner wall of the mouth-shaped fixing frame 151 via the second telescopic member 157. Guide grooves 156 are provided on the two side walls of the mouth-shaped fixing frame 151 near both ends of the first retainer 155. Both ends of the first retainer 155 extend into the two guide grooves 156 and are slidably connected to the mouth-shaped fixing frame 151 via the guide grooves 156. A slot 154 is located on the side of the first retainer 155 away from the second telescopic member 157. The upper end, lower end, and the end away from the second telescopic member 157 of the slot 154 are all open. A limiting strip 158 is provided on the side wall of the slot 154. The limiting strip 158 can abut against the connector 190, thereby limiting the connector 190.

[0047] The second moving component 153 and the first moving component 152 are symmetrically arranged, and their structures are identical, so they will not be described in detail here. Both the second moving component 153 and the first moving component 152 are electrically connected to the test component 170, which can control their movement. The second telescopic component 157 is an electric cylinder.

[0048] Specifically, the connector 190 includes a clamping part 191 and a connecting part 192. Since the slots 154 are symmetrically arranged, the connectors 190 located within the slots 154 are also symmetrically arranged, as are the clamping parts 191. A limiting groove 197 is provided on the outer peripheral wall of the clamping part 191. The upper end of the limiting groove 197 is closed, and the lower end is open. The limiting groove 197 corresponds to the limiting strip 158. When the clamping part 191 is located within the slot 154, the limiting strip 158 is located within the limiting groove 197. Three clearance grooves 196 are provided at intervals on the two side walls where the two symmetrically arranged clamping parts 191 abut against each other. The three clearance grooves 196 correspond to the three electrodes of the field-effect transistor 101, and the three electrodes of the field-effect transistor 101 can be located within the three clearance grooves 196 respectively. Each of the three clamping portions 191 has a first metal sheet 193 embedded in a clearance groove 196. The upper ends of the three first metal sheets 193 are spaced apart and positioned on top of the clamping portion 191. Preferably, a spring is provided between the first metal sheets 193 and the clamping portion 191, and the clamping portion 191 is fixedly connected to the first metal sheets 193 by the spring. The connecting portion 192 has three mating interfaces 194, each containing a second metal sheet 195. The lower end of the second metal sheet 195 extends out of the mating interface 194 and is positioned below the connecting portion 192. The upper end of the second metal sheet 195 is connected to the test assembly 170 via a wire. Magnets are embedded in both the lower end of the connecting portion 192 and the upper end of the clamping portion 191, and the connecting portion 192 and the clamping portion 191 are connected by magnets. The second metal plate 195 is configured in a one-to-one correspondence with the first metal plate 193, and the lower end of the second metal plate 195 abuts against the upper end of the first metal plate 193. The test assembly 170 is connected to the three electrodes of the field-effect transistor 101 through wires, the first metal plate 193 and the second metal plate 195.

[0049] Preferably, the clamping part 191 is provided with various specifications. The clamping parts 191 of different specifications have the same external size, but the spacing between the three internal clearance grooves 196 is different. By replacing the clamping parts 191 of different specifications, the field effect transistors 101 of different specifications can be connected to the clamping part 191.

[0050] Furthermore, the positioning assembly 110 includes an n-shaped positioning platform 111 and a fixing seat 112. The lower end of the positioning platform 111 is fixedly connected to the worktable 100. The upper end of the positioning platform 111 has a positioning cavity 113 inside, which extends through the upper and lower ends of the positioning platform 111. A boss is provided on the inner side wall of the positioning cavity 113. The lower end of the fixing seat 112 is embedded in the positioning cavity 113, and the lower edge of the fixing seat 112 abuts against the top surface of the boss, thereby fixing the fixing seat 112 on the positioning platform 111.

[0051] Furthermore, the fixing base 112 is provided with multiple fixing cavities 114 at intervals, and the fixing cavities 114 penetrate through the upper and lower ends of the fixing base 112. The bottom of the fixing base 112 is provided with multiple first limiting components 115, which are slidably connected to the fixing base 112. Each fixing cavity 114 is provided with a first limiting component 115 below it, and the first limiting component 115 is used to open and close the bottom opening of the fixing cavity 114 above it.

[0052] Specifically, the first limiting component 115 includes a sliding plate 116, a first telescopic member 117, and guide bars 118 with grooves 119. Multiple guide bars 118 are spaced apart and installed at the bottom of the fixed base 112, with adjacent guide bars 118 located on either side of a fixed cavity 114. The two ends of the sliding plate 116 are respectively located within the grooves 119 of two adjacent guide bars 118, and the lower end of the field-effect transistor 101 abuts against the top surface of the sliding plate 116. One end of the sliding plate 116 is connected to the side wall of the fixed base 112 via the first telescopic member 117. The first telescopic member 117 is a conventional electric cylinder, and it is electrically connected to the test component 170. When the test component 170 detects a defective field-effect transistor 101, it can control the first telescopic member 117 below the field-effect transistor 101 to extend or retract, thereby opening the lower opening of the fixed cavity 114 where the field-effect transistor 101 is located. At this time, the field-effect transistor 101 is unsupported below, and under its own gravity, the field-effect transistor 101 falls and separates from the fixed cavity 114, thereby achieving the screening and classification of the field-effect transistor 101.

[0053] Preferably, a second limiting component 120 is further provided within the fixed base 112, and the second limiting component 120 is slidably connected to the fixed base 112. The second limiting component 120 includes an electromagnetic device 121, two guide rods 123, an elastic element 125, and multiple fixing plates 127. The electromagnetic device 121 is installed on one side of the fixed base 112 and connected to one end of the two guide rods 123. The two guide rods 123 are spaced apart within the fixed base 112 and are slidably connected to the fixed base 112, with a fixing cavity 114 located between the two guide rods 123. The elastic element 125 is sleeved on the guide rods 123, with one end of the elastic element 125 near the electromagnetic device 121 abutting against the side wall of the fixed base 112, and the other end of the elastic element 125 fixedly connected to the guide rod 123. A fixing plate 127 is provided in each of the multiple fixing cavities 114, with both ends of the fixing plate 127 penetrating through both ends of the fixing cavity 114 and fixedly connected to two guide rods 123 respectively. The fixed cavity 114 has sliding grooves on both sides of the fixed plate 127 penetrating through it, and the fixed plate 127 is located in the sliding grooves. The electromagnetic device 121 is electrically connected to the test assembly 170. In this embodiment, the electromagnetic device 121 is a conventional electromagnet, which can move the guide rod 123 toward the electromagnetic device 121 when energized. Under normal conditions, the fixed plate 127 is under tension from the elastic element 125 and abuts against the side wall of the fixed cavity 114 away from the electromagnetic device 121. When the operator places the field-effect transistor 101 into the fixed cavity 114, and the electromagnetic device 121 is energized by the test assembly 170, the guide rod 123 and the fixed plate 127 are moved toward the electromagnetic device 121 by the magnetic force of the electromagnetic device 121 until the side wall of the fixed plate 127 abuts against the side wall of the field-effect transistor 101. After the side wall of the fixed plate 127 and the cavity wall of the fixed cavity 114 clamp the field-effect transistor 101, the guide rod 123 and the fixed plate 127 stop moving.

[0054] Preferably, when the first limiting component 115 is running, the second limiting component 120 stops running. At this time, the fixed plate 127 moves away from the electromagnetic device 121 under the tension of the elastic element 125, thereby releasing the limiting of the field effect transistor 101 and ensuring the normal operation of the field effect transistor 101 screening and classification work.

[0055] Furthermore, the guide assembly 130 includes a guide frame 131, on which a guide rail 133 and a drive assembly 135 are vertically mounted. The guide rail 133 is an existing guide rail, and the connecting assembly 150 is connected to the guide frame 131 via the guide rail 133. The drive assembly 135 includes a drive motor 137 and a ball screw pair 139. The drive motor 137 is mounted on the upper end of the guide frame 131, and the output end of the drive motor 137 is connected to the upper end of the ball screw pair 139. The lower end of the ball screw is rotatably connected to the table surface of the worktable 100. The connecting assembly 150 is fixedly connected to the nut of the ball screw pair 139. When the drive motor 137 is running, the ball screw pair 139, under the limiting action of the guide rail 133, converts the circular motion into the up-and-down motion of the connecting assembly 150, thereby adjusting the position of the connecting assembly 150.

[0056] Furthermore, the test component 170 includes a test device 171 and a control device 173. The test device 171 is a conventional field-effect transistor (FET) measuring instrument. The control device 173 includes a microcontroller, a multi-line switch, and a signal receiving device. The test device 171 is electrically connected to the control device 173. The test device 171 transmits the test results to the control device 173. The control device 173 can compare the test results with preset values ​​to determine whether the FET 101 is qualified. If the FET 101 is unqualified, the control device 173 controls the first limit component 115 to operate and stops the second limit component 120 from operating, thereby rejecting the unqualified FET 101.

[0057] Preferably, a waste bin 103 is provided at the bottom of the workbench 100, and a clearance window 105 is provided on the workbench 100, with the clearance window 105 located above the waste bin 103 and the positioning table 111 located above the clearance window 105. Defective field-effect transistors 101 fall sequentially into the waste bin 103 through the positioning cavity 113 and the clearance window 105, thereby collecting the defective field-effect transistors 101.

[0058] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. Various modifications and variations can be made to the present invention by those skilled in the art. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention should be included within the scope of protection of the present invention.

Claims

1. A field-effect transistor testing device, comprising a workbench, characterized in that, The workbench is equipped with a positioning component, a guiding component, a connecting component, and a testing component; The guide component is slidably connected to the connecting component, and the connecting component is movable along the height direction of the guide component. The connecting component is located above the positioning component. The connecting component includes a mouth-shaped fixing frame, and a first moving component and a second moving component are symmetrically arranged inside the mouth-shaped fixing frame. The first moving component near the second moving component and the second moving component near the first moving component are both provided with a slot. A connector is engaged in the slot. The slots on the first moving component and the slots on the second moving component are symmetrically arranged. The connectors in the symmetrically arranged slots can abut. The first moving component includes a second telescopic member and a first card seat. The first card seat is connected to the inner sidewall of the mouth-shaped fixing frame through the second telescopic member. The card slot is located on the side of the first card holder away from the second telescopic member, and the upper end, lower end and the end away from the second telescopic member of the card slot are all open. The second moving component has the same structure as the first moving component; The connector includes a clamping part and a connecting part. The lower end of the connecting part is connected to the upper end of the clamping part. Three clearance grooves are provided on the two side walls of the two symmetrically arranged clamping parts that abut against each other. A first metal sheet is provided in each clearance groove of one of the clamping parts. The upper ends of the three first metal sheets are laid on the top of the clamping part at intervals. The connecting part is provided with three mating interfaces. A second metal sheet is provided in each of the three mating interfaces. The second metal sheet is arranged in a one-to-one correspondence with the first metal sheet, and the lower end of the second metal sheet abuts against the upper end of the first metal sheet. The positioning component is used to fix the field-effect transistor; The guiding component, the connecting component, and the positioning component are all electrically connected to the test component; The guiding assembly includes a guide frame, on which a guide rail and a driving assembly are provided. The connecting assembly is connected to the guide frame via the guide rail, and the driving assembly is rotatably connected to the connecting assembly.

2. The field-effect transistor testing device according to claim 1, characterized in that, The positioning component includes an n-shaped positioning platform and a fixed base. The positioning platform has a positioning cavity that extends through the upper and lower ends of the positioning platform. The lower end of the fixed base is embedded in the positioning cavity. The fixing base is provided with multiple fixing cavities at intervals, and the fixing cavities pass through the upper and lower ends of the fixing base; The bottom of the fixing base is provided with a first limiting component, which is slidably connected to the fixing base. The first limiting component is used to open and close the bottom opening of the fixing cavity.

3. The field-effect transistor testing device according to claim 2, characterized in that, The first limiting component includes a sliding plate, a first telescopic member, and a guide strip with a groove; The guide strips are installed at intervals at the bottom of the fixed base, and the two ends of the sliding plate are respectively located in the sliding grooves of two adjacent guide strips. One end of the sliding plate is connected to the side wall of the fixed base through the first telescopic member.

4. The field-effect transistor testing device according to claim 2, characterized in that, The fixed base is also provided with a second limiting component, which is slidably connected to the fixed base; The second limiting component includes an electromagnetic device, two guide rods, an elastic element, and multiple fixing plates. The electromagnetic device is installed on one side of the fixing base and connected to the guide rods. The two guide rods are installed at intervals in the fixing base and are slidably connected to the fixing base. The fixing cavity is located between the two guide rods. The elastic element is sleeved on the guide rod, with one end of the elastic element near the electromagnetic device abutting against the fixed base, and the other end of the elastic element connected to the guide rod; Each of the plurality of fixed cavities is provided with a fixed plate, the two ends of the fixed plate passing through the two ends of the fixed cavity and being fixedly connected to the two guide rods respectively.

5. The field-effect transistor testing device according to claim 1, characterized in that, The testing component includes a testing device and a control device. The testing device is electrically connected to the connection component, and the testing device, the positioning component, and the guiding component are all electrically connected to the control device.

6. The field-effect transistor testing device according to claim 1, characterized in that, The workbench has a waste bin at its bottom and an obstacle avoidance window on the workbench. The obstacle avoidance window is located above the waste bin, and the positioning component is located above the obstacle avoidance window.

Images