Chip test probe

Abstract

The application discloses a chip test probe, which comprises a chip probe, a needle tube and a temperature change inlay core. The needle tube with the built-in spiral spring is located in a needle sleeve, the tail of the needle head is located in the needle tube, the head of the needle head extends out of the needle tube, the tail of the needle head has a hollow wide-mouth tube with a diameter larger than the needle head, the hollow wide-mouth tube is composed of a plurality of strip petals arranged at intervals in the circumferential direction, a plurality of the strip petals enclose a storage cavity, and a line groove is arranged between the adjacent strip petals; the temperature change inlay core is embedded in the storage cavity of the hollow wide-mouth tube, one end of the spiral spring is in contact with the temperature change inlay core, and the other end is in contact with the tail of the needle tube. The chip test probe improves the sensitivity and accuracy of the detection signal, avoids the risk of electric spark, improves the safety hidden danger, further improves the stability of the detection data, and improves the consistency and comparability of the data.

Description

Technical Field

[0001] This invention relates to a chip test probe, belonging to the field of chip testing technology. Background Technology

[0002] Currently, aging and testing are essential steps for many companies in the mass production of electronic products to ensure quality, eliminating components that fail early or have poor stability, thereby ensuring their reliability. The specific method of aging testing involves using an aging test furnace, heating the components with electricity to maintain a constant high temperature, and driving the components to operate for a period of time. If any components fail during this period, they are discarded and replaced.

[0003] Existing ambient temperature and high temperature chip testing systems suffer from unstable test signals and significant signal loss as the temperature rises within the aging test chamber. This results in relatively poor reliability and consistency of test data and may also pose a risk of electrical sparks, thus creating safety hazards. Summary of the Invention

[0004] The purpose of this invention is to provide a chip test probe that, as the temperature increases, improves the sensitivity and accuracy of the detection signal, avoids the risk of electrical sparks, reduces safety hazards, and further improves the stability of the detection data, thereby improving the consistency and comparability of the data.

[0005] To achieve the above objectives, the technical solution adopted by the present invention is as follows: a chip test probe, comprising a chip probe, which includes: a needle tip, a needle sleeve, and a helical spring located within the needle sleeve. The tail of the needle tip is located within the needle sleeve, and the head of the needle tip extends out from within the needle sleeve. It also includes: a needle tube and a thermochromic embedded core. The needle tube, incorporating the helical spring, is located within the needle sleeve. The tail of the needle tip is located within the needle tube, and the head of the needle tip extends out from within the needle tube. The tail of the needle tip has a hollow wide-mouth tube with a diameter larger than that of the needle tip. This hollow wide-mouth tube is composed of several circumferentially spaced strip-shaped lobes, which form a cavity. A groove is formed between adjacent strip-shaped lobes. The thermochromic embedded core is embedded within the cavity of the hollow wide-mouth tube. One end of the helical spring contacts the thermochromic embedded core, and the other end contacts the tail of the needle tube. The thermal expansion coefficient of the thermochromic embedded core is greater than the thermal expansion coefficients of the needle tip, needle tube, and needle sleeve.

[0006] The following are further improvements to the above technical solution:

[0007] 1. In the above scheme, the number of strip-shaped lobes in the hollow wide-mouth tube is 3 to 6.

[0008] 2. In the above scheme, the tail of the needle tube has a through hole.

[0009] 3. In the above scheme, the needle head has a constricted portion, the inner diameter of which is smaller than the diameter of the hollow wide-mouth tube of the needle.

[0010] 4. In the above scheme, the outer side of the needle sleeve has a flange.

[0011] 5. In the above scheme, the inner side of the needle sheath has an inner protrusion that contacts the tail of the needle tube.

[0012] Due to the application of the above technical solution, the present invention has the following advantages compared with the prior art:

[0013] The present invention relates to a chip test probe, wherein the tail of the probe tip has a hollow wide-mouth tube with a diameter larger than that of the probe tip. This hollow wide-mouth tube is composed of several strip-shaped lobes spaced circumferentially, and the strip-shaped lobes form a cavity. There is a groove between adjacent strip-shaped lobes. A thermochromic embedded core is embedded in the cavity of the hollow wide-mouth tube. One end of a helical spring contacts the thermochromic embedded core, and the other end contacts the tail of the probe tube. The thermal expansion coefficient of the thermochromic embedded core is greater than that of the probe tip, probe tube, and probe sleeve, thereby improving the sensitivity and accuracy of the detection signal, reducing probe self-heating, avoiding the risk of electric sparks, improving safety hazards, and further improving the stability of the detection data, thereby improving the consistency and comparability of the data. Attached Figure Description

[0014] Appendix Figure 1 This is a three-dimensional structural diagram of the chip probe in the chip test probe of the present invention;

[0015] Appendix Figure 2 For the appendix Figure 1 A schematic diagram of the decomposed structure;

[0016] Appendix Figure 3 For the appendix Figure 2 A further breakdown diagram;

[0017] Appendix Figure 4 For the appendix Figure 3 A further breakdown diagram;

[0018] Appendix Figure 5 This is a three-dimensional structural diagram of the chip probe in the testing system of the present invention from another perspective;

[0019] Appendix Figure 6 For the appendix Figure 5 A partial structural diagram.

[0020] In the above attached diagram: 1. Needle tip; 2. Helical spring; 3. Needle sheath; 31. Flange; 32. Inner convex part; 4. Needle tube; 41. Closure part; 42. Through hole; 5. Temperature-sensitive inlaid core; 6. Hollow wide-mouth tube; 61. Strip-shaped petal; 62. Wire groove; 7. Storage cavity. Detailed Implementation

[0021] In the description of this patent, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used solely for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. The terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance. Furthermore, unless otherwise explicitly specified and limited, the terms "installed," "connected," and "linked" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this patent based on the specific circumstances.

[0022] Example 1: A chip test probe, comprising a chip probe, including: a needle tip 1, a needle sleeve 3, and a helical spring 2 located within the needle sleeve 3. The tail of the needle tip 1 is located within the needle sleeve 3, and the head of the needle tip 1 extends out from within the needle sleeve 3. The probe is characterized by further including: a needle tube 4 and a thermochromic embedded core 5. The needle tube 4, incorporating the helical spring 2, is located within the needle sleeve 3. The tail of the needle tip 1 is located within the needle tube 4, and the head of the needle tip 1 extends out from within the needle tube 4. The tail of the needle tip 1 has a diameter greater than... The hollow wide-mouth tube 6 of the needle 1 is composed of several strip-shaped lobes 61 arranged circumferentially. The strip-shaped lobes 61 form a cavity 7, and there is a groove 62 between adjacent strip-shaped lobes 61. The thermochromic inlay core 5 is embedded in the cavity 7 of the hollow wide-mouth tube 6. One end of the helical spring 2 is in contact with the thermochromic inlay core 5, and the other end is in contact with the tail of the needle tube 4. The coefficient of thermal expansion of the thermochromic inlay core 5 is greater than the coefficients of thermal expansion of the needle 1, the needle tube 4, and the needle sheath 3.

[0023] The hollow wide-mouth tube 6 has 3 strip-shaped lobes 61.

[0024] The needle tube 4 has a through hole 42 at its tail end, and the needle sleeve 3 has a flange 31 on its outer side.

[0025] The inner side of the needle sheath 3 has an inner protrusion 32 that contacts the tail of the needle tube 4.

[0026] Example 2: A chip test probe, comprising a chip probe, including: a needle tip 1, a needle sleeve 3, and a helical spring 2 located within the needle sleeve 3. The tail of the needle tip 1 is located within the needle sleeve 3, and the head of the needle tip 1 extends out from within the needle sleeve 3. The probe is characterized by further including: a needle tube 4 and a thermochromic embedded core 5. The needle tube 4, incorporating the helical spring 2, is located within the needle sleeve 3. The tail of the needle tip 1 is located within the needle tube 4, and the head of the needle tip 1 extends out from within the needle tube 4. The tail of the needle tip 1 has a diameter greater than... The hollow wide-mouth tube 6 of the needle 1 is composed of several strip-shaped lobes 61 arranged circumferentially. The strip-shaped lobes 61 form a cavity 7, and there is a groove 62 between adjacent strip-shaped lobes 61. The thermochromic inlay core 5 is embedded in the cavity 7 of the hollow wide-mouth tube 6. One end of the helical spring 2 is in contact with the thermochromic inlay core 5, and the other end is in contact with the tail of the needle tube 4. The coefficient of thermal expansion of the thermochromic inlay core 5 is greater than the coefficients of thermal expansion of the needle 1, the needle tube 4, and the needle sheath 3.

[0027] The hollow wide-mouth tube 6 has four strip-shaped lobes 61, and the tail of the needle tube 4 has a through hole 42.

[0028] The head of the needle tube 4 has a constricted portion 41, the inner diameter of which is smaller than the diameter of the hollow wide-mouth tube 6 of the needle 1.

[0029] The working principle of the chip probe in the chip test probe of this invention is as follows: In the aging test system, as the temperature rises inside the chamber, the helical spring, which generates compressive force through deformation, has a deformation that is much greater than its actual length along the helical direction. Therefore, its deformation is the largest relative to other components, resulting in a large and unstable change in compressive force. As the temperature rises inside the chamber, the temperature-sensitive embedded core 5, due to its large coefficient of thermal expansion, increases in volume. This radially pushes several strip-shaped petals 61 of the hollow wide-mouth tube 6 into contact with the inner wall of the needle tube 4. As the temperature rises, the contact pressure between the hollow wide-mouth tube 6 and the inner wall of the needle tube 4 increases, reducing the contact resistance between the needle tip 1 and the needle tube 4. This improves the sensitivity and accuracy of the detection signal, reduces probe self-heating, and avoids the risk of electric sparks, thus improving safety. It also significantly reduces the impact of the temperature deformation of the helical spring on the contact pressure between the needle tip 1 and the chip under test, thereby further improving the stability of the test data and enhancing data consistency and comparability.

[0030] The above embodiments are only for illustrating the technical concept and features of the present invention, and are intended to enable those skilled in the art to understand the content of the present invention and implement it accordingly. They should not be construed as limiting the scope of protection of the present invention. All equivalent changes or modifications made in accordance with the spirit and essence of the present invention should be covered within the scope of protection of the present invention.

Claims

1. A chip test probe, comprising a chip probe, the chip probe including: The device comprises a needle (1), a needle sleeve (3), and a helical spring (2) located inside the needle sleeve (3). The tail of the needle (1) is located inside the needle sleeve (3), and the head of the needle (1) extends out from inside the needle sleeve (3). The device is characterized by further comprising a needle tube (4) and a thermochromic inlay core (5). The needle tube (4) containing the helical spring (2) is located inside the needle sleeve (3). The tail of the needle (1) is located inside the needle tube (4), and the head of the needle (1) extends out from inside the needle tube (4). The tail of the needle (1) has a hollow wide-mouth tube (6) with a diameter larger than that of the needle (1). The hollow wide-mouth tube (6) is composed of several strip-shaped petals (61) spaced apart along the circumference. Several strip-shaped petals (61) form a storage cavity (7). There is a line groove (62) between adjacent strip-shaped petals (61). The thermochromic inlay core (5) is embedded in the storage cavity (7) of the hollow wide-mouth tube (6). One end of the spiral spring (2) is in contact with the thermochromic inlay core (5), and the other end is in contact with the tail of the needle tube (4). The thermal expansion coefficient of the thermochromic inlay core (5) is greater than the thermal expansion coefficients of the needle tip (1), the needle tube (4), and the needle sheath (3).

2. The chip test probe according to claim 1, characterized in that: The hollow wide-mouth tube (6) has 3 to 6 strip-shaped lobes (61).

3. The chip test probe according to claim 1, characterized in that: The needle (4) has a through hole (42) at its tail.

4. The chip test probe according to claim 1, characterized in that: The needle tube (4) has a constricted portion (41) at its head, the inner diameter of which is smaller than the diameter of the hollow wide-mouth tube (6) of the needle (1).

5. The chip test probe according to claim 1, characterized in that: The outer side of the needle sheath (3) has a flange (31).

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