Method and device for collecting foreign particles and method for evaluating foreign particles

By using simulated gas to supply gas to the hydrogen injector and collecting working impurity particles, the problem of difficulty in evaluating the cleanliness of the hydrogen injector in the prior art is solved, and efficient collection and cleanliness evaluation of impurity particles is achieved, ensuring safety and cost benefit.

CN117030374BActive Publication Date: 2025-02-18FAW JIEFANG AUTOMOTIVE CO
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Patent Information

Application Number
CN202310933418.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2023-07-27
Publication Date
2025-02-18
Estimated Expiration
2043-07-27

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Abstract

The present application relates to a method and device for collecting impurity particles and a method for evaluating impurity particles. A method for collecting impurity particles, comprising a gas supply module supplying simulated gas into a hydrogen injector; the hydrogen injector ejecting the simulated gas to form a working gas; a collection module filtering the working gas and collecting working impurity particles by filtering. The hydrogen injector simulates its working conditions by using simulated gas, and uses the simulated gas as a cleaning medium to mix the impurities in the hydrogen injector into the working gas. The collection module filters the working gas to collect working impurity particles. The method for collecting impurity particles can efficiently collect impurity particles generated inside the hydrogen injector and during operation, and is easy to evaluate the cleanliness and level of impurity particles inside the hydrogen injector and during operation.
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Description

Technical Field

[0001] The present application relates to the technical field of hydrogen injectors, and in particular to a method and device for collecting impurity particles and a method for evaluating impurity particles. Background Art

[0002] With the continuous development of hydrogen fuel cell technology, hydrogen fuel cell vehicles have gradually become a major field of hydrogen energy application. The hydrogen injector is the core component of the hydrogen supply system in hydrogen fuel cells. Its main function is to provide hydrogen with appropriate pressure and flow to the fuel cell stack on demand through precise control of hydrogen pressure, flow and duration. As the source of energy for fuel cells, the purity and impurity content of hydrogen greatly affect the life, efficiency and safety of the battery. Excessive impurity content will not only cause fuel cell catalyst poisoning, but also seriously damage the durability of the fuel cell.

[0003] At present, the fuel electromagnetic industry generally controls the purity of hydrogen gas sources, has corresponding detection equipment, and has also formed corresponding detection standards. However, there are no corresponding detection means and methods for the impurity particles generated inside the hydrogen injector and during the working process of injecting hydrogen. Therefore, it is difficult to evaluate the cleanliness and impurity particle level inside the hydrogen injector and during the working process, and it is difficult to improve and enhance the cleanliness level of the hydrogen injector. Summary of the invention

[0004] Based on this, it is necessary to provide a method and device for collecting impurity particles and a method for evaluating impurity particles in order to solve the problem that it is difficult to evaluate the cleanliness and level of impurity particles inside and during the operation of a hydrogen injector.

[0005] The embodiment of the first aspect of the present application provides a method for collecting foreign particles, comprising:

[0006] The gas supply module supplies the simulated gas into the hydrogen injector;

[0007] The hydrogen injector ejects the simulated gas to form a working gas;

[0008] The collection module filters the working gas and collects working impurity particles through filtering.

[0009] According to the impurity particle collection method of the embodiment of the present application, a simulated gas is used to supply gas to the hydrogen injector. The hydrogen injector simulates its working conditions through the simulated gas, and uses the simulated gas as a cleaning medium to mix the impurities in the hydrogen injector together with the working gas. The collection module filters the working gas to collect the working impurity particles, which can simulate the impurity particles inside the hydrogen injector and during the working process, and then the cleanliness of the inside of the hydrogen injector and during the working process is evaluated through the working impurity particles. Since the simulated gas is used for the simulation test, the leakage hazard caused by direct hydrogen testing is avoided, and there is no need to set up an explosion-proof structure. The structure is simple, the cost is low, and the safety is good. The impurity particle collection method can efficiently collect the impurity particles generated inside the hydrogen injector and during the working process, and it is easy to evaluate the cleanliness and the level of impurity particles inside the hydrogen injector and during the working process.

[0010] In one embodiment, the simulated gas is configured as an inert gas or air.

[0011] In one embodiment, the simulation gas is configured as high-purity nitrogen.

[0012] In one embodiment, the simulated gas is pre-filtered before being supplied to the hydrogen injector.

[0013] In one embodiment, the simulated gas is pre-filtered using a filter membrane to obtain clean gas, and the clean gas is supplied to the hydrogen injector.

[0014] In one of the embodiments, the pressure of the simulated gas is adjusted before being supplied into the hydrogen injector, so that the simulated gas is supplied into the hydrogen injector at a preset pressure.

[0015] In one of the embodiments, the flow rate of the working gas ejected by the hydrogen injector is monitored to obtain the gas outflow rate, and when the gas outflow rate reaches a preset flow rate, the operation of the hydrogen injector is stopped.

[0016] In one embodiment, the collection module performs graded filtration on the working gas to obtain the working impurity particles of different sizes.

[0017] The embodiment of the second aspect of the present application provides a foreign particle collection device, comprising:

[0018] A gas supply module, the gas supply module comprising a gas source, the gas source being capable of providing a simulation gas, the gas source being used to communicate with an input end of a hydrogen injector to supply the simulation gas into the hydrogen injector;

[0019] A collecting module is connected to the output end of the hydrogen injector, and filters the working gas ejected by the hydrogen injector to collect working impurity particles through filtering.

[0020] In the above-mentioned impurity particle collection device, the simulated gas provided by the gas source supplies gas to the hydrogen injector. The hydrogen injector simulates its working condition through the simulated gas, and uses the simulated gas as a cleaning medium to mix the impurities in the hydrogen injector together with the working gas. The collection module filters the working gas to collect the working impurity particles, which can simulate the impurity particles inside the hydrogen injector and during the working process, and then evaluate the cleanliness of the inside of the hydrogen injector and during the working process through the working impurity particles. Since the simulated gas is used for the simulation test, the leakage risk caused by direct hydrogen testing is avoided, and there is no need to set up an explosion-proof structure. The structure is simple, the cost is low, and the safety is good. The impurity particle collection device can efficiently collect the impurity particles generated inside the hydrogen injector and during the working process, and it is easy to evaluate the cleanliness and the level of impurity particles inside the hydrogen injector and during the working process.

[0021] In one embodiment, the simulated gas is configured as an inert gas or air.

[0022] In one embodiment, the air supply module further comprises:

[0023] A gas supply pipeline, the gas supply pipeline being connected to the gas source and an input end of the hydrogen injector;

[0024] A stop valve is provided on the gas supply pipeline, and the stop valve is used to control the opening or closing of the gas source; and / or

[0025] A pressure regulating valve is arranged on the gas supply pipeline and is located downstream of the stop valve. The pressure regulating valve is used to control the outflow pressure of the simulated gas.

[0026] In one of the embodiments, the gas supply module further includes a first pressure sensor, which is disposed on the gas supply pipeline and located downstream of the pressure regulating valve, and is used to monitor the pressure of the simulated gas after pressure regulation by the pressure regulating valve.

[0027] In one embodiment, the gas supply module further includes a pre-filtering device, which is connected to the gas source and an input end of the hydrogen injector, and the pre-filtering device pre-filters the simulated gas to obtain clean gas.

[0028] In one embodiment, the collection module includes an impurity collector, which is connected to the output end of the hydrogen injector. A filter membrane is arranged in the impurity collector, and the filter membrane filters the working gas to collect working impurity particles through the filter membrane.

[0029] In one embodiment, the collection module further includes:

[0030] An air collection pipeline, the air collection pipeline being connected to an output end of the hydrogen injector and the impurity collector;

[0031] A flow meter is arranged on the gas collection pipeline, and the flow meter is used to monitor the flow of the working gas and obtain the gas outflow.

[0032] In one embodiment, the hydrogen injector is provided with a driver, and the impurity particle collecting device further comprises a controller, and the controller is respectively connected to the driver and the flow meter signal;

[0033] When the gas outflow reaches a preset flow rate, the controller stops the operation of the hydrogen injector through the driver.

[0034] In one of the embodiments, the collection module further includes a second pressure sensor, which is disposed on the air collection pipeline and located upstream of the flow meter, and is used to monitor the pressure of the working gas.

[0035] The embodiment of the third aspect of the present application provides a method for evaluating foreign particles, including:

[0036] The working impurity particles are collected by using the impurity particle collection method described in any one of the above embodiments;

[0037] The collected working impurity particles are evaluated.

[0038] The above-mentioned impurity particle evaluation method uses the impurity particle collection method to collect working impurity particles, and the working impurity particles can simulate the impurity particles inside the hydrogen injector and during the working process, and then evaluate the cleanliness of the inside and working process of the hydrogen injector through the working impurity particles. The impurity particle evaluation method can efficiently collect the impurity particles generated inside the hydrogen injector and during the working process, and the method is easy to evaluate the cleanliness and impurity particle level of the inside and working process of the hydrogen injector.

[0039] In one of the embodiments, when evaluating the collected working impurity particles, the working impurity particles of different sizes are classified according to different size ranges, and the number of the working impurity particles within the corresponding size range is counted to obtain the amount of working impurity particles.

[0040] In one of the embodiments, the amount of impurity particles generated by the air supply module and the collection module itself is obtained, and the amount of impurity particles generated by the air supply module and the collection module itself is removed from the amount of working impurity particles to obtain the actual amount of impurity particles.

[0041] In one embodiment, obtaining the amount of the impurity particles includes:

[0042] removing the hydrogen injector so that the gas supply module is in communication with the collection module;

[0043] The gas supply module supplies the simulated gas to the collection module to obtain unworked gas; the collection module filters the unworked gas, collects the impurity particles generated by the gas supply module and the collection module itself through filtering, and counts the amount of the impurity particles.

[0044] In one of the embodiments, before the simulated gas is supplied into the hydrogen injector, the amount of the impurity particles is obtained.

[0045] In one embodiment, obtaining the amount of working impurity particles includes adopting methods such as manual counting and visual recognition counting. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 FIG. 1 is a flow chart of a method for collecting impurity particles according to an embodiment of the present application.

[0047] Figure 2 This is a schematic structural diagram of an impurity particle collection device in accordance with an embodiment of the present application when it is connected to a hydrogen injector.

[0048] Figure 3 FIG. 1 is a flow chart of a method for evaluating impurity particles according to an embodiment of the present application.

[0049] Figure 4 This is a schematic structural diagram of an impurity particle collection device according to an embodiment of the present application when it is not connected to a hydrogen injector.

[0050] Reference numerals:

[0051] 1. Nitrogen source; 2. Shut-off valve; 3. Pressure regulating valve; 4. First pressure sensor; 5. Filter device; 6. Hydrogen injector; 7. Second pressure sensor; 8. Flow meter; 9. Impurity collector; 10. Driver; 11. Controller. DETAILED DESCRIPTION

[0052] In order to make the above-mentioned purposes, features and advantages of the present application more obvious and easy to understand, the specific implementation methods of the present application are described in detail below in conjunction with the accompanying drawings. In the following description, many specific details are set forth to facilitate a full understanding of the present application. However, the present application can be implemented in many other ways different from those described herein, and those skilled in the art can make similar improvements without violating the connotation of the present application, so the present application is not limited by the specific embodiments disclosed below.

[0053] In the description of the present application, it should be understood that if the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc. appear, the orientation or position relationship indicated by these terms is based on the orientation or position relationship shown in the accompanying drawings, which is only for the convenience of describing the present application and simplifying the description, and does not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present application.

[0054] In addition, if the terms "first" or "second" appear, these terms are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include at least one of the features. In the description of this application, if the term "plurality" appears, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0055] In this application, unless otherwise clearly specified and limited, if the terms "installed", "connected", "connected", "fixed" and the like appear, these terms should be understood in a broad sense. For example, it can be a fixed connection, a detachable connection, or an integrated connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in this application can be understood according to the specific circumstances.

[0056] In the present application, unless otherwise clearly specified and limited, if there is a description that a first feature is "above" or "below" a second feature, etc., or similar descriptions appear, it may mean that the first and second features are in direct contact, or that the first and second features are in indirect contact through an intermediate medium. Moreover, the first feature being "above", "above" and "above" the second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. The first feature being "below", "below" and "below" the second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0057] It should be noted that if an element is referred to as being "fixed to" or "disposed on" another element, it may be directly on the other element or there may be a central element. If an element is considered to be "connected to" another element, it may be directly connected to the other element or there may be a central element at the same time. If any, the terms "vertical", "horizontal", "upper", "lower", "left", "right" and similar expressions used in this application are for illustrative purposes only and do not represent the only implementation method.

[0058] See also Figure 1 , Figure 1 A schematic flow chart of a method for collecting impurity particles according to an embodiment of the present application is shown.

[0059] At least one embodiment disclosed in the present application provides a method for collecting foreign particles, comprising:

[0060] Step S210, the gas supply module supplies the simulated gas into the hydrogen injector 6;

[0061] Step S220, the hydrogen injector 6 injects the simulated gas to form the working gas;

[0062] Step S230: The collection module filters the working gas to collect working impurity particles through filtering.

[0063] According to the impurity particle collection method of the embodiment of the present application, a simulated gas is used to supply gas to the hydrogen injector 6. The hydrogen injector 6 simulates its working conditions through the simulated gas, and uses the simulated gas as a cleaning medium to mix the impurities in the hydrogen injector 6 together with the working gas. The collection module filters the working gas to collect the working impurity particles, which can simulate the impurity particles inside the hydrogen injector 6 and during the working process, and then the cleanliness of the inside and the working process of the hydrogen injector 6 is evaluated through the working impurity particles. Since the simulated gas is used for the simulation test, the leakage hazard caused by the direct hydrogen test is avoided, and there is no need to set up an explosion-proof structure, the structure is simple, the cost is low, and the safety is good. The impurity particle collection method can efficiently collect the impurity particles generated inside the hydrogen injector 6 and during the working process, and it is easy to evaluate the cleanliness and the level of impurity particles inside the hydrogen injector 6 and during the working process.

[0064] In some embodiments, the simulated gas is configured as an inert gas or air. Inert gas or air can be used as the simulated gas for the test experiment. Among them, the inert gas can provide better stability as a simulated gas due to its inactive characteristics, and has a better explosion-proof effect and higher reliability due to its non-flammable characteristics.

[0065] In some embodiments, the simulation gas is configured as high-purity nitrogen. Specifically, high-purity nitrogen refers to nitrogen with a purity greater than 99.999%. It is safer to use high-purity nitrogen for experiments. At the same time, the impurity content in high-purity nitrogen is extremely low, making the test results closer to real data and more accurate.

[0066] In some embodiments, the simulated gas is pre-filtered before being supplied to the hydrogen injector 6. On the one hand, the simulated gas is purified by pre-filtration, the impurity content in the simulated gas is reduced, and the influence of the impurity content of the simulated gas itself on the test results is avoided. On the other hand, after the purer simulated gas enters the hydrogen injector 6, it can better simulate the actual working condition of the hydrogen injector 6, and further make the test results closer to the real data and more accurate.

[0067] In some embodiments, a filter membrane is used to pre-filter the simulated gas to obtain clean gas, and the clean gas is supplied to the hydrogen injector 6. Specifically, the filter membrane can be a 0.45 μm microporous filter membrane, which can better pre-filter the simulated gas and improve the purity of the clean gas. In some embodiments, a double-layer filter membrane or a multi-layer filter membrane can be added to pre-filter the simulated gas in a double layer or a multi-layer manner to improve the filtering effect of the pre-filtration of the simulated gas.

[0068] In some embodiments, the simulated gas before being supplied to the hydrogen injector 6 is pressure-regulated so that the simulated gas is supplied to the hydrogen injector 6 at a preset pressure. By regulating the pressure, the simulated gas simulates the normal gas source pressure when the hydrogen injector 6 is working, thereby making the hydrogen injector 6 closer to the actual working condition, and making the test results closer to the actual data and more accurate.

[0069] In some embodiments, the flow rate of the working gas ejected by the hydrogen injector 6 is monitored to obtain the gas outflow rate, and when the gas outflow rate reaches a preset flow rate, the hydrogen injector 6 is stopped. In this way, each parameter in the impurity collection process can be controlled and consistent, ensuring that the process parameters of different hydrogen injectors 6 are consistent when collecting impurity particles, thereby improving the effectiveness of the analysis results.

[0070] In some embodiments, the collection module performs graded filtration on the working gas to obtain working impurity particles of different sizes. The collection module performs graded filtration on the working gas, and classifies the working impurity particles in order from large to small according to the outflow direction of the working gas. Specifically, multiple layers of filter membranes with different filtration grades can be selected, wherein the working gas first contacts with a filter membrane with larger filter pores, and the working impurity particles with larger sizes cannot pass through and are retained on the first filter membrane; after the working gas passes through the first filter membrane, it continues to contact the second filter membrane, and the filter pore size on the second filter membrane is smaller than the size of the first filter membrane. In the working gas, the second largest working impurity particles cannot pass through and are retained on the second filter membrane, and so on. By setting up graded filtration, the collection module not only filters and collects the working impurity particles in the working gas, but also can grade and filter the working impurity particles according to different sizes, which prepares for the subsequent evaluation of the working impurity particles and improves the efficiency of the subsequent evaluation.

[0071] See also Figure 2 , Figure 2 A schematic structural diagram of an impurity particle collecting device in an embodiment of the present application when connected to a hydrogen injector 6 is shown.

[0072] At least one embodiment disclosed in the present application proposes a device for collecting impurity particles, including a gas supply module and a collection module, wherein the gas supply module includes a gas source, the gas source can provide a simulated gas, and the gas source is used to communicate with the input end of the hydrogen injector 6 to supply the simulated gas into the hydrogen injector 6. The collection module is connected to the output end of the hydrogen injector 6, filters the working gas ejected by the hydrogen injector 6, and collects the working impurity particles by filtering.

[0073] In the above-mentioned impurity particle collection device, the simulated gas provided by the gas source supplies gas to the hydrogen injector 6. The hydrogen injector 6 simulates its working conditions through the simulated gas, and uses the simulated gas as a cleaning medium to mix the impurities in the hydrogen injector 6 together with the working gas. The collection module filters the working gas to collect the working impurity particles, which can simulate the impurity particles inside the hydrogen injector 6 and during the working process, and then evaluate the cleanliness of the inside and the working process of the hydrogen injector 6 through the working impurity particles. Since the simulated gas is used for the simulation test, the leakage risk caused by direct hydrogen testing is avoided, and there is no need to set up an explosion-proof structure. The structure is simple, the cost is low, and the safety is good. The impurity particle collection device can efficiently collect the impurity particles generated inside the hydrogen injector 6 and during the working process, and it is easy to evaluate the cleanliness and the level of impurity particles inside the hydrogen injector 6 and during the working process.

[0074] In some embodiments, the simulated gas is configured as an inert gas or air. The gas source in the impurity particle collection device can use an inert gas or air as the simulated gas for the test experiment. Among them, the inert gas can provide better stability as a simulated gas due to its inactive characteristics, and has a better explosion-proof effect and higher reliability due to its non-flammable characteristics.

[0075] In some embodiments, the gas supply module further includes a gas supply pipeline and a shutoff valve 2, wherein the gas supply pipeline is connected to the gas source and the input end of the hydrogen injector 6. The shutoff valve 2 is arranged on the gas supply pipeline, and the shutoff valve 2 is used to control the opening or closing of the gas source.

[0076] In some embodiments, the gas module further includes a pressure regulating valve 3 , which is disposed on the gas supply pipeline and located downstream of the stop valve 2 , and is used to control the outflow pressure of the simulated gas.

[0077] In some embodiments, the gas supply module further includes a first pressure sensor 4, which is disposed on the gas supply pipeline and located downstream of the pressure regulating valve 3, and is used to monitor the pressure of the simulated gas after the pressure regulating valve 3. When the first pressure sensor 4 detects that the simulated gas pressure is insufficient or excessive, correction and adjustment can be made in a timely manner to avoid insufficient simulated gas pressure to simulate the normal working condition of the hydrogen injector 6, and to avoid damage to downstream devices caused by excessive simulated gas pressure, thereby disrupting test data.

[0078] In some embodiments, the gas supply module further includes a pre-filtering device 5 , which connects the gas source with the input end of the hydrogen injector 6 , and pre-filtering device 5 pre-filters the simulated gas to obtain clean gas.

[0079] In some embodiments, the collection module includes an impurity collector 9, which is connected to the output end of the hydrogen injector 6. A filter membrane is provided in the impurity collector 9, which filters the working gas and collects the working impurity particles through the filter membrane. On the one hand, the simulated gas is purified by pre-filtration to reduce the impurity content in the simulated gas, thereby avoiding the influence of the impurity content of the simulated gas itself on the test results. On the other hand, after the purer simulated gas enters the hydrogen injector 6, it can better simulate the actual working condition of the hydrogen injector 6, and further make the collected working impurity particles closer to the actual working condition and more accurate.

[0080] In some embodiments, the collection module further includes a gas collection pipeline and a flow meter 8, wherein the gas collection pipeline is connected to the output end of the hydrogen injector 6 and the impurity collector 9. The flow meter 8 is arranged on the gas collection pipeline, and the flow meter 8 is used to monitor the flow of the working gas and obtain the gas outflow.

[0081] In some embodiments, the hydrogen injector 6 is provided with a driver 10, and the impurity particle collection device further comprises a controller 11, which is respectively connected to the driver 10 and the flow meter 8 by signals. When the gas outflow reaches a preset flow rate, the controller 11 stops the hydrogen injector 6 through the driver 10.

[0082] The flow meter 8 monitors the flow rate of the working gas ejected from the hydrogen injector 6 to obtain the gas outflow. When the gas outflow reaches the preset flow rate, the controller 11 stops the hydrogen injector 6 through the driver 10. In this way, the various parameters in the impurity collection process can be controlled and consistent, ensuring that the process parameters of different hydrogen injectors 6 are consistent when collecting impurity particles, thereby improving the effectiveness of the analysis results.

[0083] In some embodiments, the collection module further includes a second pressure sensor 7, which is disposed on the air collection pipeline and upstream of the flow meter 8, and is used to monitor the pressure of the working gas. During the entire process of collecting impurity particles, the first pressure sensor 4 continuously measures and monitors the pressure of the simulated gas entering the hydrogen injector 6, and the second pressure sensor 7 continuously measures and monitors the pressure of the working gas ejected from the hydrogen injector 6, ensuring that both pressure values ​​meet corresponding requirements.

[0084] See also Figure 3 , Figure 3 A schematic flow chart of a method for evaluating impurity particles according to an embodiment of the present application is shown.

[0085] At least one embodiment disclosed in the present application provides a method for evaluating foreign particles, including:

[0086] Step S200: Collect working impurity particles using the impurity particle collection method of any of the above embodiments;

[0087] Step S300: Evaluate the collected working impurity particles.

[0088] The above-mentioned impurity particle evaluation method uses the impurity particle collection method to collect the working impurity particles, and the working impurity particles can simulate the impurity particles inside the hydrogen injector 6 and during the working process, and then the cleanliness of the inside and the working process of the hydrogen injector 6 is evaluated through the working impurity particles. The impurity particle evaluation method can efficiently collect the impurity particles generated inside the hydrogen injector 6 and during the working process, and the method is easy to evaluate the cleanliness and the level of impurity particles inside the hydrogen injector 6 and during the working process.

[0089] In some embodiments, when evaluating the collected working impurity particles, the working impurity particles of different sizes are classified according to different size ranges, and the number of working impurity particles in the corresponding size range is counted to obtain the amount of working impurity particles. Specifically, the working impurity particles are classified according to the longest length size, and the number of working impurity particles in a certain length size range is counted. For example, the working impurity particles with a length size in the range of 0-50 μm are classified into one category, and the number of working impurity particles in this range is counted; the working impurity particles with a length size in the range of 50-100 μm are classified into one category, and the number of working impurity particles in this range is counted; the working impurity particles with a length size greater than 100 μm are classified into one category, and the number of working impurity particles in this range is counted. It can be understood that the staff can choose to design different size ranges according to the specific test requirements and the actual performance of the hydrogen injector 6 for further evaluation and research.

[0090] See also Figure 4 , Figure 4 A schematic structural diagram of the impurity particle collecting device according to an embodiment of the present application when it is not connected to the hydrogen injector 6 is shown.

[0091] In some embodiments, the amount of impurity particles generated by the gas supply module and the collection module itself is obtained, and the amount of impurity particles generated by the gas supply module and the collection module itself is removed from the amount of working impurity particles to obtain the actual amount of impurity particles. After the working impurity particles are collected, the amount of impurity particles generated by the gas supply module and the collection module itself is included. After removing this part, the remaining actual amount of impurity particles is closer to the amount of impurity particles generated by the hydrogen injector 6 itself when working, so that the data is more accurate and the evaluation result is closer to the actual work.

[0092] In some embodiments, when obtaining the amount of self-impurity particles, the hydrogen injector 6 is removed so that the gas supply module is connected to the collection module; the gas supply module supplies simulated gas into the collection module to obtain unworked gas; the collection module filters the unworked gas, collects the self-impurity particles generated by the gas supply module and the collection module itself through filtering, and counts the amount of self-impurity particles.

[0093] In some embodiments, before the simulated gas is supplied into the hydrogen injector 6 , the amount of impurity particles in the simulated gas is obtained.

[0094] In order to avoid the influence of the pipelines, connecting devices, flowmeter 8, etc. in the gas supply module and the collection module on the cleanliness of the hydrogen injector 6, before collecting the impurity particles of the hydrogen injector 6, first connect all the pipelines, connecting devices, flowmeter 8, etc. in the gas supply module and the collection module except the hydrogen injector 6, and use a simulated gas with the same flow rate as the impurities collected in the hydrogen injector 6 to pass through the entire collection device to obtain the cleanliness level of the gas supply module and the collection module itself, thereby effectively improving the analysis accuracy of the cleanliness of the impurity particles of the hydrogen injector 6.

[0095] In some embodiments, obtaining the amount of working impurity particles includes using manual counting, visual recognition counting and other methods. Specifically, manual counting is a staff member manually counting the number of working impurity particles. Visual recognition counting is using visual recognition technology, collecting images through a camera, and performing data analysis through measurement and analysis software to obtain the number of working impurity particles.

[0096] The impurity particle collection method, device and impurity particle evaluation method in the embodiment provided by the present application can not only safely realize the collection of impurity particles inside the hydrogen injector 6 and during the working process, but also can quantitatively collect the impurity particles of the hydrogen injector 6, and at the same time can eliminate the influence of the impurity particles of the gas supply module and the collection module itself on the final analysis result, and it is easy to evaluate the cleanliness and impurity particle level problems inside and during the working process of the hydrogen injector 6. In addition, the entire collection process is easy to operate and the cost of implementation is also low.

[0097] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0098] The above-described embodiments only express several implementation methods of the present application, and the descriptions thereof are relatively specific and detailed, but they cannot be construed as limiting the scope of the patent application. It should be pointed out that, for a person of ordinary skill in the art, several variations and improvements can be made without departing from the concept of the present application, and these all belong to the protection scope of the present application. Therefore, the protection scope of the patent application shall be subject to the attached claims.

Claims

1. A method for evaluating impurity particles, characterized in that: include: The working impurity particles are collected by using an impurity particle collection method, the impurity particle collection method comprising: a gas supply module supplies a simulated gas into a hydrogen injector; the hydrogen injector ejects the simulated gas to form a working gas; a collection module selects multiple layers of filter membranes with different filtration grades to filter the working gas, collects the working impurity particles by filtering, and the collection module performs graded filtration on the working gas to obtain the working impurity particles of different sizes; The collected working impurity particles are evaluated. When evaluating the collected working impurity particles, the working impurity particles of different sizes are classified according to different size ranges, and the working impurity particles are classified in order from large to small according to the outflow direction of the working gas. The number of the working impurity particles in the corresponding size range is counted to obtain the amount of working impurity particles, the amount of impurity particles generated by the gas supply module and the collection module itself is obtained, the amount of impurity particles themselves is eliminated from the amount of working impurity particles, and the actual amount of impurity particles is obtained.

2. The method for evaluating foreign particles according to claim 1, characterized in that: The simulation gas is configured as an inert gas or air.

3. The impurity particle evaluation method according to claim 2, characterized in that: The simulation gas is configured as high-purity nitrogen.

4. The method for evaluating foreign particles according to claim 1, characterized in that: The simulated gas was pre-filtered before being supplied to the hydrogen injector.

5. The method for evaluating foreign particles according to claim 4, characterized in that: The simulated gas is pre-filtered by using a filter membrane to obtain clean gas, and the clean gas is supplied to the hydrogen injector.

6. The method for evaluating foreign particles according to claim 1, characterized in that: The simulation gas is pressure-regulated before being supplied into the hydrogen injector, so that the simulation gas is supplied into the hydrogen injector at a preset pressure.

7. The method for evaluating foreign particles according to claim 1, characterized in that: The flow rate of the working gas ejected by the hydrogen injector is monitored to obtain the gas outflow rate, and when the gas outflow rate reaches a preset flow rate, the operation of the hydrogen injector is stopped.

8. The method for evaluating foreign particles according to claim 1, characterized in that: When obtaining the amount of the impurity particles, it includes: removing the hydrogen injector so that the gas supply module is in communication with the collection module; The gas supply module supplies the simulated gas to the collection module to obtain unworked gas; the collection module filters the unworked gas, collects the impurity particles generated by the gas supply module and the collection module itself through filtering, and counts the amount of the impurity particles.

9. The method for evaluating foreign particles according to claim 8, characterized in that: Before supplying the simulated gas into the hydrogen injector, the amount of the native impurity particles is obtained.

10. The method for evaluating foreign particles according to claim 1, characterized in that: Obtain the amount of working impurity particles, including using manual statistics and visual recognition statistics methods.

11. A device for collecting foreign particles, characterized in that: The method for evaluating impurity particles as claimed in any one of claims 1 to 10 comprises: A gas supply module, the gas supply module comprising a gas source, the gas source being capable of providing a simulation gas, the gas source being used to communicate with an input end of a hydrogen injector to supply the simulation gas into the hydrogen injector; A collecting module is connected to the output end of the hydrogen injector, and filters the working gas ejected by the hydrogen injector to collect working impurity particles through filtering.

12. The foreign particle collecting device according to claim 11, characterized in that: The simulation gas is configured as an inert gas or air.

13. The foreign particle collecting device according to claim 11, characterized in that: The air supply module also includes: A gas supply pipeline, the gas supply pipeline being connected to the gas source and an input end of the hydrogen injector; A stop valve is provided on the gas supply pipeline, and the stop valve is used to control the opening or closing of the gas source; and / or A pressure regulating valve is arranged on the gas supply pipeline and is located downstream of the stop valve. The pressure regulating valve is used to control the outflow pressure of the simulated gas.

14. The foreign particle collecting device according to claim 13, characterized in that: The gas supply module also includes a first pressure sensor, which is arranged on the gas supply pipeline and located downstream of the pressure regulating valve, and is used to monitor the pressure of the simulated gas after pressure regulation by the pressure regulating valve.

15. The foreign particle collecting device according to claim 11, characterized in that: The gas supply module further includes a pre-filtering device, which is connected to the gas source and an input end of the hydrogen injector, and the pre-filtering device pre-filters the simulated gas to obtain clean gas.

16. The foreign particle collecting device according to claim 11, characterized in that: The collection module comprises an impurity collector, which is communicated with the output end of the hydrogen injector. A filter membrane is arranged in the impurity collector, which filters the working gas and collects working impurity particles through the filter membrane.

17. The foreign particle collecting device according to claim 16, characterized in that: The collection module also includes: An air collection pipeline, the air collection pipeline being connected to an output end of the hydrogen injector and the impurity collector; A flow meter is arranged on the gas collection pipeline, and the flow meter is used to monitor the flow of the working gas and obtain the gas outflow.

18. The foreign particle collecting device according to claim 17, characterized in that: The hydrogen injector is provided with a driver, and the impurity particle collecting device further comprises a controller, and the controller is respectively connected to the driver and the flow meter signal; When the gas outflow reaches a preset flow rate, the controller stops the operation of the hydrogen injector through the driver.

19. The foreign particle collecting device according to claim 17, characterized in that: The collection module further includes a second pressure sensor, which is disposed on the air collection pipeline and located upstream of the flow meter, and is used to monitor the pressure of the working gas.

Citation Information

Patent Citations

  • Device and method for testing reliability of hydrogen injector of fuel cell

    CN115000459A