Automated imaging sensor testing and screening system and testing method

Abstract

An automated imaging sensor testing and screening system and method are disclosed, relating to the field of imaging sensor testing. This invention addresses the significant need for automated batch testing and screening. The system includes: an integrating sphere, a testing mechanism, an electric displacement stage servo controller, and a main control computer; the integrating sphere and the testing mechanism are located on the same horizontal plane; the testing mechanism includes: a sensor mounting mechanism, a precision electric rotary stage, a precision electric Y-axis displacement stage, and a precision electric X-axis displacement stage; a precision electric Y-axis displacement stage is mounted on the precision electric X-axis displacement stage, the bottom of the precision electric rotary stage is fixed to the precision electric Y-axis displacement stage, and the sensor mounting mechanism is placed on the precision electric rotary stage; the main control computer sends control signals to the electric displacement stage servo controller; the electric displacement stage servo controller receives the control signals and adjusts the testing mechanism and integrating sphere according to the control signals to perform batch testing of the sensors under test. This invention is applied in the field of remote sensing satellite imaging technology.

Description

Technical Field

[0001] This invention relates to the field of imaging sensor testing, and more particularly to an automated imaging sensor testing and screening system. Background Technology

[0002] Imaging sensor testing and screening utilizes laboratory integrating sphere light source and other equipment to perform laboratory radiation and spectral calibration tests on imaging sensor chips. Data processing of each test item yields performance information for the imaging sensor chip, thereby revealing its physical parameters. This information is used to understand and determine whether the sensor meets the requirements for usability.

[0003] In the field of remote sensing satellites, the selection of imaging sensors is the basis for evaluating whether the imaging sensor meets the requirements of the development project during the payload development phase, and it is also an important part of ensuring production quality.

[0004] The current status of imaging sensor testing and screening can be categorized into three stages: single-performance attribute testing, multi-performance attribute testing, and automated or semi-automated multi-performance attribute testing. The single-performance attribute testing stage primarily involves exploring testing methods, experimental environments, and calculation methods for a specific imaging sensor performance through laboratory radiation testing, ultimately obtaining actual data to represent that performance. The multi-performance attribute testing stage involves effectively merging testing methods after mastering various imaging sensor attribute tests, building a suitable testing environment, and achieving unified laboratory radiation calibration testing and screening data processing for multiple performance attributes. The automated or semi-automated multi-performance attribute testing stage involves fixing and integrating an integrated experimental environment into a small system, realizing a commercially viable testing system for one or more test attributes, achieving a certain level of automated testing and screening capabilities suitable for specific imaging sensor models.

[0005] However, since my country's imaging sensors have already broken through the stage of mass production, their applications are now widespread, with significant demand in areas such as high-performance cameras, remote sensing satellites, and security. Remote sensing satellites have even more stringent requirements for sensor performance parameters, demanding more precise testing environments and data accuracy. Due to the unique nature of remote sensing satellites—their operating environment is in space—if imaging sensors malfunction, they cannot be replaced or repaired. Therefore, the testing and screening of remote sensing-grade imaging sensors directly impacts the imaging quality and performance of satellites in orbit. Current remote sensing satellites are gradually moving towards mass production and miniaturization, with production efficiency improving year by year. Therefore, there is a significant need at this stage for automated batch testing and screening of remote sensing-grade imaging sensors. Summary of the Invention

[0006] This invention addresses the growing trend of miniaturization and mass production of remote sensing satellites, with increasing efficiency improvements year by year. Therefore, there is a significant need for automated batch testing and screening of remote sensing imaging sensors at this stage. This invention proposes an automated imaging sensor testing and screening system, comprising:

[0007] An automated imaging sensor testing and screening system, the system comprising:

[0008] Integrating sphere, testing mechanism, electric displacement stage servo controller and main control computer;

[0009] The integrating sphere and the testing mechanism are located on the same horizontal plane;

[0010] The testing mechanism includes: a sensor mounting mechanism, a precision electric rotary table, a precision electric Y-axis displacement stage, and a precision electric X-axis displacement stage;

[0011] The precision electric X-axis displacement stage is equipped with a precision electric Y-axis displacement stage, the bottom of the precision electric rotary stage is fixed on the precision electric Y-axis displacement stage, and the sensor mounting mechanism is placed on the precision electric rotary stage.

[0012] The main control computer is used to send control signals to the electric displacement table servo controller.

[0013] The electric displacement stage servo controller receives control signals and adjusts the test mechanism and integrating sphere according to the control signals to perform batch testing of the sensors under test.

[0014] Furthermore, a preferred embodiment is provided, wherein the system further includes: a male PoGoPIN magnetic spring pin connector and a female PoGoPIN magnetic spring pin connector. The male PoGoPIN magnetic spring pin connector is disposed inside the sensor mounting mechanism, and the female PoGoPIN magnetic spring pin connector is fixed in the non-rotating area of ​​the center circle of the precision electric rotary table, for converting the power supply interface and data transmission interface required by the test development board.

[0015] Furthermore, a preferred embodiment is provided in which the system further includes a regulated power supply for providing power to the testing mechanism, the electric displacement stage servo controller, and the main control computer.

[0016] Furthermore, a preferred embodiment is provided, wherein the integrating sphere is composed of a hollow sphere and a halogen lamp source, the sphere is provided with a light outlet, and the inner wall of the sphere is coated with a white diffuse reflection coating.

[0017] Furthermore, a preferred embodiment is provided, wherein the male PoGoPIN magnetic spring pin connector includes: a male pin, a needle tube, and a spring, wherein the needle tube is disposed outside the male pin, and the spring is disposed inside the needle tube and sleeved on the male pin.

[0018] Furthermore, a preferred embodiment is provided in which the female PoGoPIN magnetic spring connector includes a female contact head, an external spring, and a fixing mechanism. The female contact head and the external spring are connected and fixed to the non-rotating area of ​​the center circle of the precision electric rotary table by the fixing mechanism.

[0019] Furthermore, a preferred embodiment is provided in which the system further includes a batch test placement disk mounted on a precision electric rotary table for supporting the sensor mounting mechanism.

[0020] Furthermore, a preferred embodiment is provided in which the system further includes a darkroom, in which the integrating sphere and the testing mechanism are placed.

[0021] Based on the same inventive concept, the present invention also provides an automated imaging sensor testing method, which is implemented based on the aforementioned automated imaging sensor testing and screening system, and includes:

[0022] The main control computer sends control signals to the electric displacement table servo controller;

[0023] The servo controller receives the control signal and adjusts the precision electric Y-axis displacement stage and the precision electric X-axis displacement stage to adapt to the distance between sensors of different sizes and the integrating sphere, as well as the distance between the center line of the light output window of the integrating sphere.

[0024] The main control computer sends a rotation signal to the electric displacement table servo controller;

[0025] The servo controller sends the rotation signal to the precision electric rotary table, which rotates to place the disk and completes the replacement of the sensor under test.

[0026] The main control computer sends a brightness control signal to the electric displacement stage servo controller;

[0027] The servo controller receives the brightness control signal and adjusts the brightness level of the integrating sphere;

[0028] The sensor parameters are set to control the imaging sensor's imaging, and the radiometric calibration test of the test items is combined with different integrating sphere brightness energy levels to obtain test imaging data.

[0029] The actual test performance parameters of the imaging sensor are obtained by processing the test imaging data.

[0030] Furthermore, a preferred embodiment is provided, wherein the precision electric rotary table includes: a base, a stepper motor, a ball screw, a turntable, a turntable gear, and an optocoupler switch;

[0031] The stepper motor is mounted on the base, the ball screw is mounted on the shaft of the stepper motor, and the turntable is mounted on the end of the ball screw; the turntable gear is located at the bottom of the turntable and meshes with the gear of the ball screw; the optocoupler switch is mounted on the base.

[0032] The advantages of this invention are:

[0033] This invention addresses the growing trend of remote sensing satellites towards mass production and miniaturization, with production efficiency improving year by year. Therefore, there is a significant need for automated batch testing and screening of remote sensing-level imaging sensors at this stage.

[0034] The automated imaging sensor testing and screening system described in this invention realizes functions such as automatic testing, automatic sensor replacement, and automatic data processing. It achieves high-efficiency testing of imaging sensors in high-precision testing environments, solves the problem of non-automatic replacement of multiple cables in batch testing, and addresses the testing uncertainties introduced by interference from multiple cables and fatigue damage caused by cable twisting. This system meets the demand for high-efficiency imaging sensor testing in the mass development of remote sensing satellites, provides effective data for the payload development stage, and effectively ensures the production quality of remote sensing satellites.

[0035] The automated imaging sensor testing and screening system described in this invention achieves a highly automated sensor testing process, reducing manual intervention and thus improving production efficiency. The use of a precision electric displacement stage and rotary table ensures accurate control of sensor position and angle, enabling high-precision testing and helping to ensure product quality. The system design is suitable for batch testing, allowing simultaneous testing of multiple sensors, significantly improving batch processing capabilities and shortening the testing cycle. Due to automated control, testing conditions are consistent in each test, ensuring repeatability and consistency of test results and helping to reduce uncertainties caused by product variations. Furthermore, it reduces errors and inaccuracies caused by manual operation, thereby improving the accuracy of test results. The system design is applicable to different types of imaging sensors, thus possessing versatility and adapting to sensor testing with varying specifications and requirements. The main control computer monitors the testing process in real time and records test data, facilitating timely identification and resolution of problems and improving quality control.

[0036] This invention is applied to the field of remote sensing satellite imaging technology. Attached Figure Description

[0037] Figure 1This is a schematic diagram of the automated imaging sensor batch testing and screening system described in Implementation Method 1;

[0038] Figure 2 This is a diagram showing the connection between the male and female PoGoPIN terminals as described in Embodiment 2.

[0039] Figure 3 This is a schematic diagram of the male PoGoPIN magnetic spring pin connector described in Embodiment 5;

[0040] Figure 4 This is a schematic diagram of the female PoGoPIN magnetic spring pin connector described in Embodiment Six;

[0041] Figure 5 This is an assembly diagram of the batch test placement disks as described in Embodiment Seven;

[0042] Figure 6 This is a front view of the system composition of each part in the dark room as described in Embodiment 8;

[0043] Figure 7 This is a front view of the system composition of the various parts inside the darkroom as described in Embodiment 8;

[0044] Figure 8 This is a diagram of the sensor mounting mechanism described in Embodiment Nine;

[0045] Figure 9 This is a front sectional view of the precision electric rotary table described in Embodiment 10;

[0046] Figure 10 This is a front and top view of the precision electric rotary table described in Embodiment 10;

[0047] Figure 11 This is a front view of the precision electric Y-axis displacement stage described in Embodiment Nine;

[0048] Figure 12 This is a front view of the precision electric X-axis displacement stage described in Embodiment Nine;

[0049] Figure 13 This is a top view of the precision electric X-axis displacement stage described in Embodiment Nine;

[0050] Figure 14 This is a flowchart of the automated imaging sensor batch testing process described in Implementation Method Eleven;

[0051] Figure 15 The flowcharts for test schemes A and B as described in Implementation Method Eleven are shown below.

[0052] Figure 16 This is a flowchart of test scheme C as described in implementation method eleven;

[0053] Figure 17This is a flowchart of test scheme D as described in implementation method eleven;

[0054] Figure 18 The flowchart is for the test scheme E described in Implementation Method Eleven. Detailed Implementation

[0055] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments.

[0056] Implementation Method 1, see Figure 1 This embodiment describes an automated imaging sensor testing and screening system, which includes:

[0057] Integrating sphere 2, testing mechanism, electric displacement stage servo controller 10, and main control computer 12;

[0058] The integrating sphere 2 and the testing mechanism are located on the same horizontal plane;

[0059] The testing mechanism includes: a sensor mounting mechanism 3, a precision electric rotary table 7, a precision electric Y-axis displacement stage 8, and a precision electric X-axis displacement stage 9;

[0060] The precision electric X-axis displacement stage 9 is provided with a precision electric Y-axis displacement stage 8, the bottom of the precision electric rotary stage 7 is fixed on the precision electric Y-axis displacement stage 8, and the sensor mounting mechanism 3 is placed on the precision electric rotary stage 7.

[0061] The main control computer 12 is used to send control signals to the electric displacement table servo controller 10;

[0062] The electric displacement stage servo controller 10 receives control signals and adjusts the test mechanism and integrating sphere 2 according to the control signals to perform batch testing of the sensors under test.

[0063] In this embodiment, the integrating sphere is a spherical reflective surface used to uniformly distribute the light from the light source and guide it onto the imaging sensor under test. This ensures the stability and consistency of lighting conditions during testing. The testing mechanism includes a sensor mounting mechanism, a precision electric rotary stage, a precision electric Y-axis displacement stage, and a precision electric X-axis displacement stage. These components work together to control the position, angle, and displacement of the imaging sensor to simulate shooting scenarios under different conditions. The electric displacement stage servo controller receives instructions from the main control computer and then controls the movement of the testing mechanism, including the adjustment of the sensor's position and angle, to perform a series of tests and screening operations. The main control computer is the central hub of the system, responsible for sending control signals to the electric displacement stage servo controller and simultaneously monitoring and recording data during the testing process. The system described in this embodiment achieves a highly automated sensor testing process, reducing manual intervention and thus improving production efficiency. The use of the precision electric displacement stage and rotary stage ensures accurate control of the sensor's position and angle, thereby achieving high-precision testing and helping to ensure product quality. The system design is suitable for batch testing, allowing simultaneous testing of multiple sensors, significantly improving production batch processing capabilities and shortening the testing cycle. Due to automated control, test conditions are consistent in every test, ensuring repeatability and consistency of test results and helping to reduce uncertainties caused by product variations. Furthermore, it reduces errors and inconsistencies caused by manual operation, thereby improving the accuracy of test results. The system design described in this embodiment is applicable to different types of imaging sensors, thus possessing versatility and adaptable to sensor testing with varying specifications and requirements. The main control computer monitors the testing process in real time and records test data, facilitating timely identification and resolution of problems and improving quality control.

[0064] The automated imaging sensor testing and screening system of this embodiment features a high degree of automation, significantly improving sensor production efficiency and reducing production costs. Furthermore, high-precision motion control and a stable testing environment ensure more accurate test results, thereby improving sensor quality. The system's batch testing function allows for the simultaneous testing of multiple sensors, saving time and resources. Simultaneously, the system described in this embodiment reduces the need for manual operation, thus minimizing testing errors and inconsistencies caused by human factors. The system can monitor the testing process in real time, facilitating timely identification and resolution of problems, and improving quality control levels.

[0065] Implementation Method 2, see below Figure 2This embodiment further defines the automated imaging sensor testing and screening system described in Embodiment 1. The system also includes a male PoGoPIN magnetic spring connector 4 and a female PoGoPIN magnetic spring connector 5. The male PoGoPIN magnetic spring connector 4 is disposed inside the sensor mounting mechanism 3, and the female PoGoPIN magnetic spring connector 5 is fixed in the non-rotating area of ​​the center circle of the precision electric rotary table 7, used to connect the power supply interface and data transmission interface required by the test development board.

[0066] This implementation uses the PogoPin interface to achieve wireless contact between the power supply port and data transmission port of the imaging sensor development board in a one-to-many manner during batch imaging sensor testing and sensor replacement. This eliminates the need for separate cables for each sensor under test, preventing interference with the overall cable structure of the testing system and resolving the uncertainty caused by cable twisting during structural rotation. By combining and interfacing the PogoPin interface, data transmission functions are implemented using USB 3.0, USB 2.0, Type-ABC, Mini-AB, PS232, and NI series multi-pin data interfaces to adapt to the data transmission interfaces required by corresponding imaging sensor models.

[0067] Implementation Method 3: This implementation method further defines the automated imaging sensor testing and screening system described in Implementation Method 1. The system also includes a regulated power supply 11, which provides power to the testing mechanism, the electric displacement stage servo controller 10, and the main control computer 12.

[0068] The primary purpose of the regulated power supply in this embodiment is to provide stable power to the various components of the system. These components include the testing mechanism, the electric displacement stage servo controller 10, and the main control computer 12. Power supply is a fundamental requirement for the normal operation of these devices. The regulated power supply is designed to provide constant voltage and current to ensure a stable power supply to the devices in the system under different workloads. This is crucial for testing and control applications, as fluctuating power supplies can lead to inaccurate test results or system instability.

[0069] A regulated power supply can provide highly accurate voltage and current output, which is crucial for applications requiring precise control and measurement, such as sensor testing and displacement stage servo control. With a stable power supply, devices in the system can avoid voltage or current fluctuations, thereby improving system stability and reliability. This is essential for long-term testing and control tasks. Furthermore, regulated power supplies typically have overload and short-circuit protection functions, which help protect devices in the system from damage caused by power problems. This can extend equipment life and reduce maintenance costs.

[0070] Implementation Method 4: This implementation method further defines the automated imaging sensor testing and screening system described in Implementation Method 1. The integrating sphere 2 consists of a hollow sphere and a halogen lamp source. The sphere has a light outlet, and the inner wall of the sphere is coated with a white diffuse reflection coating.

[0071] In this embodiment, the integrating sphere, also known as the optical sphere, is a hollow, complete spherical shell. Its inner wall is coated with a white diffuse reflection paint, and the diffuse reflection is uniform at all points on the inner wall. After light is emitted from the light source, it undergoes diffuse reflection within the sphere wall before being emitted as uniform light from the light outlet. The illuminance produced by the light source at any point on the sphere wall is the sum of the illuminance produced by multiple reflections.

[0072] In this embodiment, the inner wall of the integrating sphere is coated with a white diffuse reflection paint. This means that the light becomes highly uniform after multiple diffuse reflections, resulting in highly uniform illuminance from the light outlet. This is crucial for sensor testing because it ensures consistent lighting conditions in the test environment. Furthermore, the uniform light source reduces shadows and glare, meaning the sensor under test receives similar illumination at different angles and positions, making test results more reliable and repeatable. The principle of multiple reflected light superposition ensures very stable illuminance in the test environment, which helps improve the accuracy and reliability of sensor performance testing.

[0073] The integrating sphere 2 described in this embodiment provides a stable and uniform light source to ensure that the sensor under test receives consistent illumination conditions at different positions and angles. This is to eliminate the influence of external factors on the test results, thereby ensuring the accuracy and repeatability of the test. The principle of the integrating sphere is based on diffuse reflection. When light enters the integrating sphere from the light source, it undergoes repeated diffuse reflection, constantly colliding with the inner wall of the sphere. Because the inner wall of the sphere is coated with a white diffuse reflection paint, the light is uniformly reflected at multiple points within the sphere. Each reflection causes a slight change in the direction of the light, ultimately resulting in the light being distributed in a very uniform manner on the inner wall of the sphere. This uniformly distributed light eventually converges at the light outlet of the integrating sphere, thus forming a highly uniform light source. This uniform light source can be used to test sensors because it ensures that sensors at different positions and angles receive similar illumination conditions, thereby eliminating test errors that may be introduced by differences in illumination.

[0074] Implementation Method 5, see below Figure 3 This embodiment is a further definition of the automated imaging sensor testing and screening system described in Embodiment 2. The male PoGoPIN magnetic spring connector 4 includes: a male needle, a needle tube, and a spring. The needle tube is disposed outside the male needle, and the spring is disposed inside the needle tube and is fitted onto the male needle.

[0075] The male PoGoPIN magnetic spring connector utilizes a magnetic spring mechanism for reliable connection and disconnection. This ensures the connector can be easily separated when not needed, while maintaining a tight physical contact when required. The spring pins of the male PoGoPIN magnetic spring connector connect to the test board of the sensor under test via a wired connection, while the female pins provide a physical contact connection to the power supply and host computer. This allows power supply and data transmission to occur without cables, avoiding cable interference and uncertainties, and improving the reliability and stability of the test system. The male PoGoPIN magnetic spring connector is designed to be compatible with various imaging sensor models because it supports multiple data transmission interfaces, such as USB 3.0, USB 2.0, Type-ABC, Mini-AB, PS232, and NI series multi-pin data interfaces.

[0076] The primary purpose of the male PoGoPIN magnetic spring connector 4 and the female PoGoPIN magnetic spring connector 5 is to achieve a reliable power supply and data transmission connection between the sensor under test (SUT) and the test development board, while avoiding the interference and uncertainties associated with traditional cable connections. Through these connectors, the test development board can provide the necessary power to the SUT to ensure its proper operation. The connectors allow for high-speed data transmission between the test development board and the SUT to acquire images and other test data generated by the sensor. Because the connectors support multiple data transmission interfaces, they can accommodate different sensor models, making the system more flexible and versatile.

[0077] When the test development board and the sensor under test (DUT) are brought close together, the male pin is pushed out of the connector tube by the internal spring, making physical contact with the corresponding contact point on the sensor. This physical contact establishes an electrical connection, enabling the test development board to supply power to the sensor and transmit data. When the connection is no longer needed, the test development board and the DUT can be separated. When the thrust generated by the moment of inertia exceeds the magnetic attraction at the male and female connection points, the springs on the male and female ends of the connector retract the male pin and the female contact head into their respective structures, breaking the electrical connection. After the male and female ends are separated, the male pin and the female contact head return to their initial positions.

[0078] In summary, the male PoGoPIN magnetic spring connector 4 and the female PoGoPIN magnetic spring connector 5 achieve a reliable power supply and data transmission connection through spring pressure and physical contact, while reducing interference from cable connections, providing stability and flexibility for automated imaging sensor testing systems.

[0079] Implementation Method Six, see below Figure 4This embodiment further defines the automated imaging sensor testing and screening system described in Embodiment 2. The female PoGoPIN magnetic spring connector includes a female contact head, an external spring, and a fixing mechanism. The female contact head and the external spring are connected and fixed to the non-rotating area of ​​the center circle of the precision electric rotary table by the fixing mechanism.

[0080] This embodiment will be described in conjunction with Embodiment 5. The female PoGoPIN magnetic spring connector 5 is part of the PoGoPIN connector and is fixed to the non-rotating area of ​​the center circle of the precision electric rotary table 7 by a fixing mechanism. The female contact head has a set of PoGoPIN or spring pins, which are used to make physical contact with the corresponding pins on the male connector. An external spring wraps around the outside of the female contact head. The function of the spring is to provide pressure to maintain a tight physical contact between the pins of the female contact head and the pins of the male connector. This spring mechanism helps to ensure reliable connection and disconnection.

[0081] The male PoGoPIN magnetic spring pin connector 4 is located on the other side of the sensor mounting mechanism 3. The male pin has a set of PoGoPINs, or spring pins, used to establish physical contact and electrical connection. The pin tube is the outer sleeve of the male pin, providing protection and support. It helps ensure that the male pin is correctly aligned with the female connector during connection. The spring is located inside the pin tube and fits onto the male pin. The function of this spring is to provide pressure to ensure that the male pin makes firm contact with the pins of the female connector during connection.

[0082] When the male PoGoPIN magnetic spring connector 4 approaches the female PoGoPIN magnetic spring connector 5, the magnetism helps them automatically attract together, ensuring proper alignment. Simultaneously, the external spring provides pressure during this process, maintaining physical contact between the pins of the female and male contacts. This establishes an electrical connection. Once connected, data and power can be transmitted through these pins, allowing communication and power supply between devices. The primary purpose of this connection method is to provide a reliable physical connection while ensuring efficient data and power transmission. This is extremely useful in automated testing, data transmission, and other applications requiring reliable connections. The spring and magnetic features together ensure a fast, accurate, and stable connection, and allow for easy disconnection for maintenance or device replacement. Multiple sets of female and male PoGoPINs can be combined to provide alternative functions for various data transmission and power interfaces, enabling data transmission for USB 3.0, USB 2.0, Type-ABC, Mini-AB, PS232, NI series multi-pin data interfaces, etc., to adapt to the data transmission interfaces required by corresponding imaging sensors.

[0083] Implementation Method Seven, see below Figure 5 This embodiment further defines the automated imaging sensor testing and screening system described in Embodiment 1. The system also includes a batch testing placement disk 6, which is mounted on a precision electric rotary table 7 to support the sensor mounting mechanism 3.

[0084] The batch replacement of the tested sensors is achieved by controlling the rotation of the placement disk using a precision electric rotary table. This embodiment is explained in conjunction with embodiments five and six. A precise and stable male-female connector alignment is achieved through a magnetic attraction function. The combination of internal and external springs ensures that the connectors do not experience hard contact and damage during disk rotation, allowing for smooth transition to the next set of male-female connector alignment connections.

[0085] Implementation Method 8, see below Figure 6 and Figure 7 This embodiment further defines the automated imaging sensor testing and screening system described in Embodiment 1. The system also includes a darkroom 1, in which the integrating sphere 2 and the testing mechanism are placed.

[0086] In this embodiment, the environment in darkroom 1 is a laboratory radiation calibration test environment in which the integrating sphere and the sensor under test are completely isolated from external stray light.

[0087] Implementation Method Nine, see below Figure 8 , Figure 11 , Figure 12 and Figure 13 This embodiment describes an automated imaging sensor testing method. The method is implemented based on the automated imaging sensor testing and screening system described in any one of embodiments one through eight. The method includes:

[0088] The main control computer sends control signals to the electric displacement table servo controller 10;

[0089] The servo controller receives the control signal and adjusts the precision electric Y-axis displacement stage 8 and the precision electric X-axis displacement stage 9 to adapt to the distance between sensors of different sizes and the integrating sphere, as well as the distance between the center line of the light output window of the integrating sphere.

[0090] The main control computer sends a rotation signal to the electric displacement table servo controller 10;

[0091] The servo controller sends the rotation signal to the precision electric rotary table 7, which rotates to place the disk and completes the replacement of the sensor under test.

[0092] The main control computer sends a brightness control signal to the electric displacement stage servo controller 10;

[0093] The servo controller receives the brightness control signal and adjusts the brightness level of the integrating sphere;

[0094] The sensor parameters are set to control the imaging sensor's imaging, and the radiometric calibration test of the test items is combined with different integrating sphere brightness energy levels to obtain test imaging data.

[0095] The actual test performance parameters of the imaging sensor are obtained by processing the test imaging data.

[0096] In this embodiment, such as Figure 8 As shown, the mounting mechanism is used to mount test development boards of different sizes. The sensor under test (SUT) is fixed to the mounting mechanism with screws, allowing it to be stably mounted on the test development board according to the test direction for testing. This mounting mechanism incorporates a PoGoPIN connector male port, which can connect the power supply and data transmission interfaces required by the test development board to the male connector for mating with the PoGoPIN connector female port. Figure 11 As shown, a precision electric Y-axis displacement stage is used for vertical Y-axis height adjustment of the overall testing mechanism. Height control is achieved by using a stepper motor with a reduction gear to control the rotation of a ball screw, which in turn raises and lowers the displacement stage. Figure 12 and Figure 13 As shown, a precision electric X-axis displacement stage is used to adjust the left and right movement of the entire testing mechanism along the X-axis. The left and right movement is controlled by a stepper motor with a reduction gear that controls the rotation of a ball screw, which in turn moves the displacement stage.

[0097] This implementation utilizes an electric displacement stage servo controller, enabling the system to adjust the positions of the precision electric Y-axis and X-axis displacement stages to accommodate sensors of different sizes and the distance to the integrating sphere, ensuring correct imaging distance and centerline alignment. Using a precision electric rotary stage, the system can automatically rotate and replace different sensors, thus enabling continuous testing of multiple sensors. By sending brightness control signals, the system can adjust the brightness of the integrating sphere, which is crucial for different test items and radiometric calibration tests to obtain accurate test imaging data. The system uses sensor parameters to control the imaging sensor's imaging, then combines different integrating sphere brightness levels to perform radiometric calibration tests and acquire test imaging data. Finally, by processing this data, the actual test performance parameters of the imaging sensor can be obtained.

[0098] This embodiment automates imaging sensor testing, reducing the need for manual operation and improving testing efficiency. Through precise displacement adjustment and brightness control, the method ensures high precision and accuracy, thereby enhancing the reliability of test results. The system is adaptable to sensors of different sizes and various testing requirements, offering flexibility and versatility. Automated testing and sensor replacement enable high-throughput testing, meeting the batch production needs of remote sensing satellites.

[0099] This implementation transforms the traditional automated single-performance or semi-automated multi-performance testing process into a batch automated process, thereby significantly improving testing efficiency and accuracy. As the production scale of remote sensing satellites expands, automated batch testing and screening of imaging sensors becomes crucial. This method accelerates the remote sensing sensor production process, ensures consistent sensor performance, and reduces testing costs. In summary, this method meets the urgent needs of the remote sensing satellite industry for automated testing and improved production efficiency.

[0100] Implementation Method 10: This implementation method further defines the automated imaging sensor testing method described in Implementation Method 7. The precision electric rotary table 7 includes: a base, a stepper motor, a ball screw, a turntable, a turntable gear, and an optocoupler switch.

[0101] The stepper motor is mounted on the base, the ball screw is mounted on the stepper motor shaft, and the turntable is mounted on the end of the ball screw; the turntable gear is located at the bottom of the turntable and meshes with the ball screw gear; the optocoupler switch is mounted on the base. Figure 9 and Figure 10 As shown, a precision electric rotary table is used to rotate a disc for replacing the sensor being tested. A stepper motor with a reduction gear controls the rotation of a ball screw, which in turn drives the gears on the turntable, achieving electric rotation. An optocoupler switch detects a pointer on the disc to determine if it has completed one revolution, sending a signal to a servo controller to stop the rotation. The number of revolutions controlled by the stepper motor allows for continuous rotation of the turntable at equal intervals.

[0102] Implementation Method 11, see below Figures 13 to 18 This embodiment describes a specific example of the automated imaging sensor testing and screening system described in Embodiment 1, and also serves to explain Embodiments 2 to 8. Specifically:

[0103] This implementation method addresses the batch testing and screening of imaging sensors at the remote sensing satellite level. It enables automated laboratory radiometric calibration testing of multiple imaging sensors, adapting to sensors of different sizes and models. A main control computer controls a moving platform to precisely move along the X and Y axes to accommodate the distance between sensors of different sizes and the integrating sphere, as well as the distance from the center line of the integrating sphere's light-emitting window. The main control computer controls the rotation angle of the rotating platform to replace the sensor under test, achieving batch testing. The main control computer controls the integrating sphere to change the brightness energy level to achieve the required brightness for testing. The main control computer controls the imaging sensor parameters and imaging through the imaging development circuit board. Radiometric calibration testing is performed by combining different integrating sphere brightness energy levels with the test items. Finally, the actual test performance parameters of the imaging sensor are obtained directly through data processing of the test imaging data.

[0104] Furthermore, during the batch testing and replacement of imaging sensors, the PogoPin interface is used to achieve wireless contact between the power supply port and data transmission port of the imaging sensor development board in a one-to-many manner. This eliminates the need for a separate cable for each sensor under test, preventing interference with the overall cable structure of the testing system and resolving the uncertainty caused by the back-and-forth twisting of cables during structural rotation. By combining and interfacing the PogoPin interface, data transmission functions are implemented using USB 3.0, USB 2.0, Type-ABC, Mini-AB, PS232, and NI series multi-pin data interfaces to adapt to the data transmission interfaces required by corresponding imaging sensor models.

[0105] The automated imaging sensor testing and screening system mainly consists of a darkroom (1), an integrating sphere (2), a sensor mounting mechanism (3), a male PoGoPIN magnetic spring connector (4), a female PoGoPIN magnetic spring connector (5), a batch testing placement disk (6), a precision electric rotary table (7), a precision electric Y-axis displacement stage (8), a precision electric X-axis displacement stage (9), an electric displacement stage servo controller (10), a regulated power supply (11), and a main control computer (12). The main control computer connects to the testing imaging development board to send and receive commands and signals to control the imaging of the testing development board; it connects to the integrating sphere to send and receive commands and signals to control the brightness changes of the integrating sphere; and it connects to the electric displacement stage servo controller to send and receive commands and signals to control the movement of the X-axis and Y-axis precision electric displacement stages and the rotation of the precision electric rotary table.

[0106] Batch imaging sensor testing methods, such as Figure 14 As shown, it includes:

[0107] Adjust the distance and height of the light output port of the integrating sphere;

[0108] The test development board is powered on.

[0109] The test begins according to the test methods for different test items. The process involves setting the integrating sphere brightness, setting sensor parameters, powering on the sensor and camera, imaging, saving the image, powering off the sensor and camera, allowing the imaging sensor to cool down, and then cycling back to the point where the integrating sphere brightness is set until the test ends.

[0110] Test development board powered off;

[0111] Adjust the placement of the rotating disk, and simultaneously process and filter the test data.

[0112] To proceed with testing the next imaging sensor.

[0113] The test plans designed based on the test items are summarized as follows:

[0114] Table 1 Comparison of Test Item Plans

[0115]

[0116]

[0117] Based on the development board provided by the manufacturer, area array imaging is performed. This test plan is designed according to the area array testing method, as follows: Figures 15 to 18 (Linear scan mode sets the number of image captures to 1):

[0118] Test Plan A (Responsivity Test): Acquire multiple frames (20 times) of image data under typical gain conditions with illumination levels of 10%, 30%, 50%, 60%, 80%, 95%, and 100% saturation. Simultaneously acquire dark field image data (20 times). Save the data in the typical gain condition folder according to the specified format. During the test, ensure that the sensor temperature remains consistent each time the brightness of the integrating sphere is changed before image acquisition begins.

[0119] Test Plan B (Responsivity Test): Acquire multiple frames (20 times) of image data under high-gain conditions with illumination levels of 10%, 30%, 50%, 60%, 80%, 95%, and 100% saturation. Simultaneously acquire dark-field image data (20 times). Save the data in the high-gain folder according to the specified format. During the test, ensure that the sensor temperature remains consistent each time the brightness of the integrating sphere is changed before image acquisition begins.

[0120] Test Plan C (Dark Current Test): Under high gain conditions, with the integrating sphere turned off and the sensor temperature at 40℃, the exposure time is gradually increased by changing the exposure time at certain intervals, and dark field image data is acquired (the exposure time is determined based on whether the dark field DN value can be separated by 1-2 DN saturation). The data is saved in the dark current folder according to the specified format.

[0121] Test Plan D (Repeatability Test): Under typical gain conditions and 50% saturation brightness, the sensor is powered on and off at 2-minute intervals, and one frame of image data is saved each time, looping 20 times. The data is saved in the repeatability folder according to the saving format. After each power-on, the sensor's initial temperature should be kept as consistent as possible.

[0122] Test Plan E (Temperature Drift Test): Under typical gain conditions, the sensor temperature recovers to room temperature, and continuous imaging is performed for 10 minutes in both bright and dark environments with sensor imaging reaching 60% ± 5% saturation. Image and temperature data are recorded. Data is saved to the "Temperature Drift" folder according to the specified format.

[0123] By processing the test results using the corresponding test item's data processing methods, test performance parameters such as conversion gain, full well capacity, responsivity, linearity, dynamic range, dark current, dark noise, dark signal non-uniformity, light response non-uniformity, repeatability, temperature drift, and defective pixels can be obtained.

[0124] The sensor selection process can be based on the required number of remote sensing satellites. After ensuring that other test parameters meet the usage requirements, multiple images are sorted and then comprehensively selected, with responsivity and dark field as the main factors.

[0125] The automated imaging sensor testing and screening system described in this invention realizes functions such as automatic testing, automatic sensor replacement, and automatic data processing. It achieves high-efficiency testing of imaging sensors in high-precision testing environments, solves the problem of non-automatic replacement of multiple cables in batch testing, and addresses the testing uncertainties introduced by interference from multiple cables and fatigue damage caused by cable twisting. This system meets the demand for efficient imaging sensor testing in the mass production of remote sensing satellites, provides effective data for the payload development stage, and effectively ensures the production quality of remote sensing satellites.

[0126] The technical solutions provided by the present invention have been described in further detail above with reference to the accompanying drawings in order to highlight their advantages and benefits, and are not intended to limit the present invention. Any modifications, combinations, improvements and equivalent substitutions of the present invention based on the spirit and principles of the present invention should be included within the protection scope of the present invention.

Claims

1. An automated imaging sensor testing and screening system, characterized in that, The system includes: Integrating sphere (2), testing mechanism, electric displacement stage servo controller (10) and main control computer (12); The integrating sphere (2) and the testing mechanism are located on the same horizontal plane; The testing mechanism includes: a sensor mounting mechanism (3), a precision electric rotary table (7), a precision electric Y-axis displacement stage (8), and a precision electric X-axis displacement stage (9). The precision electric X-axis displacement stage (9) is provided with a precision electric Y-axis displacement stage (8), the bottom of the precision electric rotary stage (7) is fixed on the precision electric Y-axis displacement stage (8), and the sensor mounting mechanism (3) is placed on the precision electric rotary stage (7). The main control computer (12) is used to send control signals to the electric displacement stage servo controller (10). The electric displacement stage servo controller (10) receives control signals and adjusts the test mechanism and integrating sphere (2) according to the control signals to perform batch testing of the sensors under test; The system also includes: a male PoGoPIN magnetic spring pin connector (4) and a female PoGoPIN magnetic spring pin connector (5). The male PoGoPIN magnetic spring pin connector (4) is located inside the sensor mounting mechanism (3), and the female PoGoPIN magnetic spring pin connector (5) is fixed in the non-rotating area of ​​the center circle of the precision electric rotary table (7) for connecting the power supply interface and data transmission interface required by the test development board. The male PoGoPIN magnetic spring pin connector (4) includes: a male pin, a pin tube and an inner spring. The pin tube is disposed outside the male pin, and the inner spring is disposed inside the pin tube and is sleeved on the male pin. The female PoGoPIN magnetic spring connector (5) includes: a female contact head, an external spring and a fixing mechanism. The female contact head and the external spring are connected and fixed in the non-rotating area of ​​the center circle of the precision electric rotary table by the fixing mechanism. When the test development board and the sensor under test are brought close together, the male end of the needle will be pushed out of the needle tube due to the spring inside the connector, so that it makes physical contact with the corresponding contact point of the sensor. When the thrust generated by the moment of inertia is greater than the magnetic attraction at the male and female connection points, the springs on the male and female ends of the connector retract the male pin and the female contact head into their respective structures, disconnecting the electrical connection. After the male and female ends are separated, the male pin and the female contact head return to their initial positions. The system also includes a batch test placement disk (6), which is mounted on a precision electric rotary table (7) to support multiple sensor mounting mechanisms (3).

2. The automated imaging sensor testing and screening system according to claim 1, characterized in that, The system also includes a regulated power supply (11) which provides power to the testing mechanism, the electric displacement stage servo controller (10), and the main control computer (12).

3. The automated imaging sensor testing and screening system according to claim 1, characterized in that, The integrating sphere (2) consists of a hollow sphere and a halogen lamp source. The sphere has a light outlet and the inner wall of the sphere is coated with a white diffuse reflection coating.

4. The automated imaging sensor testing and screening system according to claim 1, characterized in that, The system also includes a darkroom (1), in which the integrating sphere (2) and the testing mechanism are placed.

5. An automated imaging sensor testing method, characterized in that, The method is implemented based on the automated imaging sensor testing and screening system according to any one of claims 1 to 4, and the method includes: The main control computer sends control signals to the electric displacement stage servo controller (10). The servo controller receives the control signal and adjusts the precision electric Y-axis displacement stage (8) and the precision electric X-axis displacement stage (9) to adapt the distance between the sensor and the integrating sphere of different sizes, as well as the distance between the center line of the light output window of the integrating sphere; The main control computer sends a rotation signal to the electric displacement stage servo controller (10). The servo controller sends the rotation signal to the precision electric rotary table (7), which rotates to place the disk and completes the replacement of the sensor under test. The main control computer sends a brightness control signal to the electric displacement stage servo controller (10). The servo controller receives the brightness control signal and adjusts the brightness level of the integrating sphere; The sensor parameters are set to control the imaging sensor, and the radiometric calibration test of the test items is combined with different integrating sphere brightness energy levels to obtain test imaging data. The actual test performance parameters of the imaging sensor are obtained by processing the test imaging data.

6. The automated imaging sensor testing method according to claim 5, characterized in that, The precision electric rotary table (7) includes: a base, a stepper motor, a ball screw, a turntable, a turntable gear, and an optocoupler switch; The stepper motor is mounted on the base, the ball screw is mounted on the shaft of the stepper motor, and the turntable is mounted on the end of the ball screw; the turntable gear is located at the bottom of the turntable and meshes with the gear of the ball screw; the optocoupler switch is mounted on the base.

Images