A temperature probe detection system and method for formation and formation capacity testing equipment

Abstract

The present invention provides a temperature probe detection system and method in the field of formation and formation capacity testing technology. The system includes a host computer, a middle computer, a pin bed, a temperature tooling, and a first temperature acquisition module; the host computer is respectively connected to the middle computer and the temperature tooling; the middle computer is respectively connected to the pin bed and the first temperature acquisition module; the pin bed is connected to the first temperature acquisition module; the pin bed is provided with a plurality of temperature probes, and each of the temperature probes is pressed on the temperature tooling. The advantages of the present invention are as follows: greatly improving the detection efficiency of the temperature probes of the formation and formation capacity testing equipment.

Description

Technical Field

[0001] The present invention relates to the technical field of formation and grading, and particularly to a temperature probe detection system and method for a formation and grading device. Background Art

[0002] Formation and grading is the most critical link in the latter process of lithium battery production. Since a lithium battery has no electricity when assembled, it must be charged and activated. The first charge is called formation, which is used to activate the active materials inside the lithium battery; grading is the process of charging and discharging the lithium battery after formation, and screening out qualified lithium batteries through capacity testing.

[0003] During the formation and grading process, it is necessary to detect the temperature of the battery cells that make up the lithium battery. Since the formation and grading device consists of multiple bins, each bin contains a mechanical unit for placing a certain number of battery cells, and each battery cell corresponds to a channel in the formation and grading device, so each formation and grading device has many channels. With the increasing mass production demand for battery cells by major manufacturers, there are higher requirements for the volume utilization rate and production efficiency of battery cells, which leads to each mechanical unit having dozens or more channels.

[0004] Due to the large number of channels, during the production, installation, or maintenance of the formation and grading device, it is possible that the temperature probes of each channel are connected to the wrong channel, or the temperature probes are not installed in place. Therefore, before the formation and grading device is put into use or after maintenance, it is necessary to calibrate the temperature probes of each channel to ensure that the wiring of the temperature probes of each channel is correct before use, otherwise the accuracy of the temperature acquisition data of each channel cannot be guaranteed. If the temperature data is inaccurately collected and the temperature of the battery cell is too high during charging and discharging of the battery cell and is not detected in time, safety accidents may occur.

[0005] For the detection of the temperature probes of the formation and grading device, traditionally, a temperature tooling is used to heat each channel separately in turn, compare the temperatures collected by the temperature tooling and the temperature probes, and determine the wire sequence and connection conditions of the temperature probes according to the difference between the two. However, when faced with a large number of channels, the traditional method has very low detection efficiency, which greatly affects the production or maintenance efficiency of the formation and grading device.

[0006] Therefore, how to provide a temperature probe detection system and method for a formation and grading device to improve the detection efficiency of the temperature probes of the formation and grading device has become an urgent technical problem to be solved. Summary of the Invention

[0007] The technical problem to be solved by the present invention is to provide a temperature probe detection system and method for a formation and grading device to improve the detection efficiency of the temperature probes of the formation and grading device.

[0008] In a first aspect, the present invention provides a temperature probe detection system for a formation and formation capacity testing device, comprising a host computer, a middle computer, a pin bed, a temperature tooling, and a first temperature acquisition module;

[0009] The host computer is respectively connected to the middle computer and the temperature tooling; the middle computer is respectively connected to the pin bed and the first temperature acquisition module; the pin bed is connected to the first temperature acquisition module;

[0010] The pin bed is provided with a plurality of temperature probes, and each of the temperature probes is pressed on the temperature tooling.

[0011] Further, the temperature tooling includes a switch, a control signal board, a channel heating control board, a 485-to-LAN port module, a second temperature acquisition module, a plurality of heating sheets, and a plurality of temperature sensors;

[0012] One end of the switch is connected to the host computer, and the other end is connected to the control signal board and the 485-to-LAN port module; one end of the channel heating control board is connected to the control signal board, and the other end is connected to the heating sheets; one end of the second temperature acquisition module is connected to the 485-to-LAN port module, and the other end is connected to the temperature sensors; one end of each of the heating sheets is respectively connected to a temperature sensor, and the other end is respectively abutted against a temperature probe.

[0013] Further, the switch is an industrial Ethernet switch.

[0014] Further, the host computer is connected to the middle computer through a network port; the host computer is connected to the temperature tooling through a network port; the middle computer is connected to the pin bed through a network port.

[0015] In a second aspect, the present invention provides a temperature probe detection method for a formation and formation capacity testing device, comprising the following steps:

[0016] Step S1: Assume that n temperature probes of the pin bed correspond to n channels and are arranged in j rows and k columns, where j * k = n; press each temperature probe of the pin bed on a heating sheet respectively;

[0017] Step S2: The host computer records the initial temperature T1_n of each column of temperature probes and records the initial temperature T2_n of each column of temperature sensors;

[0018] Step S3: The host computer controls the heating sheets of each column to heat simultaneously, and after waiting for a first duration, records the temperature T3_n of each column of temperature probes after heating and records the temperature T4_n of each column of temperature sensors after heating;

[0019] Step S4: Detect the temperature probes based on the T1_n, T2_n, T3_n, and T4_n;

[0020] Step S5: The host computer records the initial temperature T5_n of each row of temperature probes and the initial temperature T6_n of each row of temperature sensors.

[0021] Step S6: The host computer controls the heating elements of each row to heat simultaneously. After waiting for the second time period, it records the temperature T7_n of each row of temperature probes after heating and the temperature T8_n of each row of temperature sensors after heating.

[0022] Step S7: Detect the temperature probes based on the T5_n, T6_n, T7_n, and T8_n.

[0023] Further, in the step S3, the first time period is 30 seconds.

[0024] Further, the step S4 is specifically:

[0025] Judge whether T4_n - T3_n ≤ 0.1℃, T3_n - T1_n ≥ 5℃, and T4_n - T2_n ≥ 5℃ are established. If so, the temperature probe sampling of the nth channel is normal; if not, the temperature probe sampling of the nth channel is abnormal.

[0026] Judge whether T3_n - T1_n ≈ 0℃ is established. If so, the temperature probe of the nth channel is connected to the wrong channel; if not, the temperature probe of the nth channel is not connected to the wrong channel.

[0027] Judge whether T4_n - T3_n ≥ 1℃ is established. If so, the temperature probe of the nth channel is not installed in place; if not, the temperature probe of the nth channel is installed in place.

[0028] Further, in the step S6, the second time period is 10 seconds.

[0029] Further, the step S7 is specifically:

[0030] Judge whether T8_n - T7_n ≤ 0.1℃, T7_n - T5_n ≥ 1℃, and T8_n - T6_n ≥ 1℃ are established. If so, the temperature probe sampling and wire sequence of the nth channel are normal; if not, the temperature probe sampling and wire sequence of the nth channel are abnormal.

[0031] Judge whether T7_n - T5_n ≈ 0℃ is established. If so, the temperature probe of the nth channel is connected to the wrong channel; if not, the temperature probe of the nth channel is not connected to the wrong channel.

[0032] The advantages of the present invention are:

[0033] One end of the first temperature acquisition module is connected to each temperature probe of the pin bed, and the other end is connected to the middle computer; one end of the middle computer is connected to the upper computer, and the other end is connected to the pin bed; the heating sheet, the channel heating control board, the control signal board, the switch, and the upper computer are connected in sequence; the temperature sensor, the second temperature acquisition module, the 485-to-LAN port module, and the switch are connected in sequence; one end of each heating sheet is respectively connected to a temperature sensor, and the other end is respectively abutted against a temperature probe; and each temperature probe is respectively pressed on the heated sheet, and each temperature probe is arranged in j rows and k columns; when detecting the temperature probe, the temperature values of the temperature probe and the temperature sensor before and after heating are respectively recorded for each row and each column, and based on the recorded temperature values, it can be quickly determined whether the temperature probe sampling is normal, whether the temperature probe is connected to the wrong channel, and whether the temperature probe is installed in place, that is, the detection is carried out in units of rows and columns, which greatly improves the detection efficiency of the temperature probe of the formation and capacitance equipment compared with the traditional one-by-one detection. Brief Description of the Drawings

[0034] The present invention will be further described below with reference to the accompanying drawings in conjunction with embodiments.

[0035] Figure 1 It is a circuit principle block diagram of a temperature probe detection system for a formation and capacitance equipment of the present invention.

[0036] Figure 2 It is a circuit principle block diagram of the temperature tooling of the present invention.

[0037] Figure 3 It is a flowchart of a temperature probe detection method for a formation and capacitance equipment of the present invention.

[0038] Figure 4 It is a schematic diagram of the channel arrangement of the present invention. Detailed Embodiments

[0039] The overall idea of the technical solution in the embodiments of the present application is as follows: each temperature probe is respectively pressed on the heated sheet, and each temperature probe is arranged in j rows and k columns; when detecting the temperature probe, the temperature values of the temperature probe and the temperature sensor before and after heating are respectively recorded for each row and each column, and based on the recorded temperature values, it can be quickly determined whether the temperature probe sampling is normal, whether the temperature probe is connected to the wrong channel, and whether the temperature probe is installed in place, that is, the detection is carried out in units of rows and columns to improve the detection efficiency of the temperature probe of the formation and capacitance equipment.

[0040] Please refer to Figures 1 to 4 As shown, a preferred embodiment of a temperature probe detection system for a formation and capacitance equipment of the present invention includes an upper computer, a middle computer, a pin bed, a temperature tooling, and a first temperature acquisition module;

[0041] The host computer is used to receive the operation instructions of the user and send them to the middle computer, receive the data uploaded by the middle computer, display the user-related interface, send instructions to the temperature tooling, control the heating of each channel of the temperature tooling, and receive the data uploaded by the temperature tooling; the middle computer is used to send instructions to the pin bed, control the lifting of the temperature probes of the pin bed, send instructions to the first temperature acquisition module for temperature acquisition, and receive the data uploaded by the first temperature acquisition module;

[0042] The host computer is respectively connected to the middle computer and the temperature tooling; the middle computer is respectively connected to the pin bed and the first temperature acquisition module; the pin bed is connected to the first temperature acquisition module;

[0043] The pin bed is provided with a plurality of temperature probes, and each of the temperature probes is pressed on the temperature tooling; each of the temperature probes is arranged in j rows and k columns, and is used to collect the temperature of the heating sheet; the pin bed is arranged in the formation and capacitance equipment.

[0044] The temperature tooling includes a switch, a control signal board, a channel heating control board, a 485-to-LAN port module, a second temperature acquisition module, a plurality of heating sheets and a plurality of temperature sensors;

[0045] By controlling the level change of the corresponding IO port of the control signal board, the power switch of the heating sheet of the corresponding channel of the channel heating control board is controlled; when the power switch on the channel heating control board is turned on, the corresponding heating sheet will be heated and the surface temperature will rise; the temperature sensor is used to collect the temperature of the heating sheet;

[0046] One end of the switch is connected to the host computer, and the other end is connected to the control signal board and the 485-to-LAN port module; one end of the channel heating control board is connected to the control signal board, and the other end is connected to the heating sheet; one end of the second temperature acquisition module is connected to the 485-to-LAN port module, and the other end is connected to the temperature sensor; one end of each of the heating sheets is respectively connected to a temperature sensor, and the other end is respectively abutted against a temperature probe.

[0047] The switch is an industrial Ethernet switch.

[0048] The host computer is connected to the middle computer through a network port; the host computer is connected to the temperature tooling through a network port; the middle computer is connected to the pin bed through a network port.

[0049] A preferred embodiment of a method for detecting temperature probes of a formation and capacitance equipment according to the present invention includes the following steps:

[0050] Step S1: Assume that n temperature probes of the pin bed correspond to n channels, and are arranged in j rows and k columns, j*k=n; each temperature probe of the pin bed is respectively pressed on a heating sheet;

[0051] Step S2: The host computer records the initial temperature T1_n of each column of temperature probes and the initial temperature T2_n of each column of temperature sensors.

[0052] Step S3: The host computer controls the heating elements of each column to heat simultaneously. After waiting for the first time period, it records the temperature T3_n of each column of temperature probes after heating and the temperature T4_n of each column of temperature sensors after heating.

[0053] Step S4: Detect the temperature probes based on the T1_n, T2_n, T3_n, and T4_n.

[0054] Step S5: The host computer records the initial temperature T5_n of each row of temperature probes and the initial temperature T6_n of each row of temperature sensors.

[0055] Step S6: The host computer controls the heating elements of each row to heat simultaneously. After waiting for the second time period, it records the temperature T7_n of each row of temperature probes after heating and the temperature T8_n of each row of temperature sensors after heating.

[0056] Step S7: Detect the temperature probes based on the T5_n, T6_n, T7_n, and T8_n.

[0057] In the said step S3, the first time period is 30 seconds.

[0058] The said step S4 is specifically as follows:

[0059] Judge whether T4_n - T3_n ≤ 0.1°C, T3_n - T1_n ≥ 5°C, and T4_n - T2_n ≥ 5°C hold. If so, the temperature probe sampling of the n-channel is normal; if not, the temperature probe sampling of the n-channel is abnormal.

[0060] Judge whether T3_n - T1_n ≈ 0°C holds. If so, the temperature probe of the n-channel is connected to the wrong channel; if not, the temperature probe of the n-channel is not connected to the wrong channel.

[0061] Judge whether T4_n - T3_n ≥ 1°C holds. If so, the temperature probe of the n-channel is not installed in place; if not, the temperature probe of the n-channel is installed in place.

[0062] In the said step S6, the second time period is 10 seconds.

[0063] The said step S7 is specifically as follows:

[0064] Judge whether T8_n - T7_n ≤ 0.1°C, T7_n - T5_n ≥ 1°C, and T8_n - T6_n ≥ 1°C hold. If so, the temperature probe sampling and wire sequence of the n-channel are normal; if not, the temperature probe sampling and wire sequence of the n-channel are abnormal.

[0065] Determine whether T7_n-T5_n≈0°C is true. If so, the temperature probe of channel n is connected to the wrong channel; if not, the temperature probe of channel n is not connected to the wrong channel.

[0066] The present invention can effectively shorten the detection time, improve the detection efficiency, and quickly locate the fault point when the number of channels in the storage location of the chemical component capacity equipment increases, thereby improving the production efficiency. The original solution takes time T = 30n (s), the present invention takes time T = 30k + 10j (s), and the improved efficiency η = (1 / T - 1 / T) / 1 / T * 100%. If the storage location has 128 channels, arranged in 16 rows and 8 columns, T = 3840s, T = 400s, and η = 860%.

[0067] In summary, the advantages of the present invention are:

[0068] By setting one end of the first temperature acquisition module to be connected to each temperature probe of the needle bed, and the other end to be connected to the intermediate computer; one end of the intermediate computer is connected to the host computer, and the other end is connected to the needle bed; the heating plate, the channel heating control board, the control signal board, the switch, and the host computer are connected in sequence; the temperature sensor, the second temperature acquisition module, the 485 to LAN port module, and the switch are connected in sequence; one end of each heating plate is respectively connected to a temperature sensor, and the other end is respectively abutted against a temperature probe; and each temperature probe is pressed on the heated plate, and each temperature probe is arranged in j rows and k columns; when the temperature probe is detected, the temperature values ​​of the temperature probe and the temperature sensor in each row and column, before and after heating are recorded respectively, and based on the recorded temperature values, it can be quickly determined whether the temperature probe sampling is normal, whether the temperature probe is connected to the wrong channel, and whether the temperature probe is installed in place, that is, the detection is performed in rows and columns. Compared with the traditional one-to-one detection, the detection efficiency of the temperature probe of the chemical composition equipment is greatly improved.

[0069] Although the specific implementation modes of the present invention are described above, those skilled in the art should understand that the specific implementation modes described are only illustrative and are not intended to limit the scope of the present invention. Equivalent modifications and changes made by those skilled in the art in accordance with the spirit of the present invention should be included in the scope of protection of the claims of the present invention.

Claims

1. A method for detecting a temperature probe of a formation and grading equipment, characterized in that: The method needs to use a temperature probe detection system for a formation and grading device as follows, including a host computer, a middle computer, a pin bed, a temperature tooling, and a first temperature acquisition module; The host computer is respectively connected to the middle computer and the temperature tooling; the middle computer is respectively connected to the pin bed and the first temperature acquisition module; the pin bed is connected to the first temperature acquisition module; The pin bed is provided with a plurality of temperature probes, and each of the temperature probes is pressed on the temperature tooling; The temperature tooling includes a switch, a control signal board, a channel heating control board, a 485-to-LAN port module, a second temperature acquisition module, a plurality of heating sheets, and a plurality of temperature sensors; One end of the switch is connected to the host computer, and the other end is connected to the control signal board and the 485-to-LAN port module; one end of the channel heating control board is connected to the control signal board, and the other end is connected to the heating sheet; one end of the second temperature acquisition module is connected to the 485-to-LAN port module, and the other end is connected to the temperature sensor; one end of each of the heating sheets is respectively connected to a temperature sensor, and the other end is respectively abutted against a temperature probe; The switch is an industrial Ethernet switch; The host computer is connected to the middle computer through a network port; the host computer is connected to the temperature tooling through a network port; the middle computer is connected to the pin bed through a network port; The method includes the following steps: Step S1: Assume that n temperature probes of the pin bed correspond to n channels and are arranged in j rows and k columns, where j*k = n; press each temperature probe of the pin bed on a heating sheet respectively; Step S2: The host computer records the initial temperature T1_n of each column of temperature probes and records the initial temperature T2_n of each column of temperature sensors; Step S3: The host computer controls the heating sheets of each column to heat simultaneously, and after waiting for the first duration, records the temperature T3_n of each column of temperature probes after heating and records the temperature T4_n of each column of temperature sensors after heating; Step S4: Detect the temperature probes based on the T1_n, T2_n, T3_n, and T4_n; Step S5: The host computer records the initial temperature T5_n of each row of temperature probes and records the initial temperature T6_n of each row of temperature sensors; Step S6: The host computer controls the heating sheets of each row to heat simultaneously, and after waiting for the second duration, records the temperature T7_n of each row of temperature probes after heating and records the temperature T8_n of each row of temperature sensors after heating; Step S7: Detect the temperature probes based on the T5_n, T6_n, T7_n, and T8_n.

2. The method for detecting a temperature probe of a formation and grading equipment according to claim 1, characterized in that: In the step S3, the first duration is 30 seconds.

3. The method for detecting a temperature probe of a formation and grading equipment according to claim 1, characterized in that: The step S4 is specifically: Judge whether T4_n - T3_n ≤ 0.1°C, T3_n - T1_n ≥ 5°C, and T4_n - T2_n ≥ 5°C are established. If so, the temperature probe sampling of the n channels is normal; if not, the temperature probe sampling of the n channels is abnormal; Judge whether T3_n - T1_n ≈ 0°C is established. If so, the temperature probes of the n channels are connected to the wrong channels; if not, the temperature probes of the n channels are not connected to the wrong channels; Judge whether T4_n - T3_n ≥ 1℃ holds. If so, the temperature probe of the n-th channel is not properly installed; if not, the temperature probe of the n-th channel is properly installed.

4. The method for detecting a temperature probe of a formation and grading equipment according to claim 1, characterized in that: In the step S6, the second duration is 10 seconds.

5. The method for detecting a temperature probe of a formation and grading equipment according to claim 1, characterized in that: The step S7 is specifically as follows: Judge whether T8_n - T7_n ≤ 0.1℃, T7_n - T5_n ≥ 1℃, and T8_n - T6_n ≥ 1℃ hold. If so, the sampling and wire sequence of the temperature probe of the n-th channel are normal; if not, the sampling and wire sequence of the temperature probe of the n-th channel are abnormal. Judge whether T7_n - T5_n ≈ 0℃ holds. If so, the temperature probe of the n-th channel is connected to the wrong channel; if not, the temperature probe of the n-th channel is not connected to the wrong channel.

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