Photoelectric plate defect map preview display method, device, equipment and storage medium

Abstract

The application discloses a photovoltaic panel defect map preview display method and device, equipment and a storage medium, relates to the field of image display, and displays a defect preview interface, which comprises a panoramic display area and a preview display area. The panoramic display area displays a photovoltaic panel master map, and the preview display area displays a photovoltaic panel defect map. When a preview instruction of the defect map is received, a preview mode and a target master map are determined, a defect set is obtained from a database, and a defect map of a target number and a target size is displayed in the preview display area according to the preview mode. When a selection operation on a target defect map in the preview display area is received, the original defect map corresponding to the target defect map is displayed in the preview display area. According to the scheme, the number of defect maps and the image size of the preview display can be freely selected according to the number of defects of the photovoltaic panel, the original defect map is called to display, the zooming effect can be realized, the defect point detail information can be directly obtained from the original defect map, and the false detection rate is greatly reduced.

Description

Technical Field

[0001] This application relates to the field of image display, and in particular to a method, apparatus, device, and storage medium for previewing and displaying defect images of optoelectronic boards. Background Technology

[0002] Optoelectronic boards play a crucial role in the integrated circuit industry. For the manufactured optoelectronic boards, optical inspection and defect detection analysis must be performed using specialized equipment. Defect detection primarily involves scanning the optoelectronic board image using a line scanner above the machine, followed by image analysis by computer equipment to pinpoint defective locations. In actual industrial production, to maintain a certain yield rate, defective optoelectronic boards must undergo manual re-inspection for confirmation, ultimately determining whether they should be scrapped or undergo secondary processing.

[0003] The computer equipment or machine used for re-inspection needs to verify and re-inspect all detected defects one by one. This step is done manually. In the traditional way, the re-inspector checks the defect images captured by scanning one by one. This method will seriously slow down the re-inspection efficiency. Furthermore, for some grid-mode display of defect images, it is not conducive to scaling and checking the images, which affects the accuracy of the re-inspection. Summary of the Invention

[0004] This application provides a method, apparatus, device, and storage medium for previewing and displaying defect images of optoelectronic boards, which solves the problem that a large number of defect images requiring re-inspection affect the efficiency of re-inspection.

[0005] On one hand, this application provides a method for previewing and displaying defect images of a photoelectric board, the method comprising:

[0006] The defect preview interface includes a panoramic display area and a preview display area; the panoramic display area displays the master image of the photoelectric board, and the preview display area displays defect images of several photoelectric boards.

[0007] In response to receiving a preview command for a defect image, the system determines the preview mode and target master image corresponding to the preview command, retrieves a defect set from the database, and displays the target number and target size of defect images in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantities and sizes;

[0008] In response to receiving a selection operation for a target defect image in the preview display area, the original defect image corresponding to the target defect image is displayed in the preview display area; the original defect image is an original image identified and cropped from the master image of the photoelectric board, and the target defect image is a preview image after being scaled according to the target preview mode.

[0009] On the other hand, this application provides a device for previewing and displaying defects in a photoelectric board, the device comprising:

[0010] The first display module is used to display a defect preview interface, which includes a panoramic display area and a preview display area. The panoramic display area displays the master image of the photoelectric board, and the preview display area displays defect images of several photoelectric boards.

[0011] The second display module is used to respond to a received preview command for a defect image, determine the preview mode and target master image corresponding to the preview command, retrieve a defect set from the database, and display the target number and target size of defect images in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantities and sizes;

[0012] The third display module is used to respond to receiving a selection operation of the target defect image in the preview display area, and to display the original defect image corresponding to the target defect image in the preview display area; the original defect image is an original image identified and cropped from the master image of the photoelectric board, and the target defect image is a preview image after being scaled according to the target preview mode.

[0013] In another aspect, this application provides a computer device, the computer device including a processor and a memory, the memory storing at least one instruction, at least one program, code set or instruction set, the at least one instruction, the at least one program, the code set or instruction set being loaded and executed by the processor to implement the optoelectronic board defect image preview display method described above.

[0014] In another aspect, this application provides a computer-readable storage medium storing at least one instruction, at least one program, code set, or instruction set, wherein the at least one instruction, the at least one program, the code set, or the instruction set is loaded and executed by a processor to implement the optoelectronic board defect image preview display method described above.

[0015] The beneficial effects of the technical solution provided in this application embodiment include at least the following: A defect preview interface is set up for the re-inspection of photoelectric boards, divided into a panoramic display area and a preview display area. The panoramic display area displays a panoramic master image of the photoelectric board, while the preview display area displays defect images identified and extracted from the master image, with defect annotations on the defect images for easy review by the re-inspector. To improve re-inspection efficiency, different numbers and sizes of defect images can be displayed in the preview display area by selecting different preview modes, facilitating rapid re-inspection by the re-inspector. For minor defects, the original defect image is retrieved and displayed in the preview display area based on the target defect image selected by the re-inspector, achieving an image magnification effect. Directly viewing the detailed information of the defect points through the original defect image can significantly reduce the false detection rate. Attached Figure Description

[0016] Figure 1 This is a schematic diagram of the system for previewing and displaying defect diagrams of optoelectronic boards provided in this application;

[0017] Figure 2 This is a flowchart of the method for previewing and displaying defect images of a photoelectric board provided in an embodiment of this application;

[0018] Figure 3 This is a schematic diagram of the defect preview interface provided in an embodiment of this application;

[0019] Figure 4 This is a schematic diagram showing the original defect image displayed in the defect preview interface;

[0020] Figure 5 This is a schematic diagram of the interface for creating a new defect filtering rule in the defect settings interface;

[0021] Figure 6 This is a schematic diagram of the interface for generating prompts and outline annotations in the preview display area;

[0022] Figure 7 This is a schematic diagram of the interface that displays image controls and zooms in on the image in the preview area;

[0023] Figure 8 This paper shows a schematic diagram of the structure of the optoelectronic board defect image preview display device provided in an embodiment of this application;

[0024] Figure 9 This is a structural block diagram of a computer device provided in an exemplary embodiment of this application. Detailed Implementation

[0025] To make the objectives, technical solutions, and advantages of this application clearer, the embodiments of this application will be described in further detail below with reference to the accompanying drawings.

[0026] In this article, "multiple" refers to two or more. "And / or" describes the relationship between related objects, indicating that three relationships can exist. For example, A and / or B can represent: A alone, A and B simultaneously, or B alone. The character " / " generally indicates that the preceding and following related objects have an "or" relationship.

[0027] Figure 1 This is a schematic diagram of the inspection and display system for the method of previewing and displaying defect images of photoelectric panels provided in this application. The system includes a computer device and an optical inspection machine equipped with a line scan camera. The photoelectric panel is scanned by the line scan camera through the optical inspection machine, and the scanned image is transmitted to the computer device. The computer device then embeds the scanned image into the master image of the photoelectric panel for defect detection. This application mainly focuses on the preview and display stage of defect detection results.

[0028] Figure 2This is a flowchart of a method for previewing and displaying defect images of a photoelectric board provided in an embodiment of this application, including the following steps:

[0029] Step 101: Display the defect preview interface, which includes a panoramic display area and a preview display area. The panoramic display area displays the master image of the photoelectric board, while the preview display area displays defect images of several photoelectric boards.

[0030] refer to Figure 3 As shown, the defect preview interface 300 is a screen displayed on the computer interface. The panoramic display area 310 and the preview display area 320 are located in two areas of this interface, such as the left and right sides or the top and bottom sides. The panoramic display area 310 displays the photoelectric board master image 311 formed by the computer receiving the scanned image and embedding it into the master image. The master image is used to input the defect detection model to identify defect points on the photoelectric board.

[0031] The computer is responsible for processing the master image, performing defect detection and analysis, and extracting defect images. For example, when a photoelectric board contains multiple defect points, corresponding screenshots will be taken to obtain the corresponding number of defect images, which will be temporarily stored in the computer's (database). The preview display area 320 is used to display defect images 321 for reviewers to browse and re-inspect.

[0032] Step 102: In response to receiving a preview instruction for a defect image, determine the preview mode corresponding to the preview instruction and retrieve the defect set from the database for the target master image, and display the defect image with the target quantity and target size in the preview display area according to the preview mode.

[0033] Because the line scan camera continuously scans and transmits data to the computer, the inspector selects the target master image from numerous photoelectric board master images according to requirements and displays the defect image according to the set preview mode. The preview mode fully considers the display quantity issue. Since the photoelectric board is relatively large, and the line scan camera scans and records data at a 1:1 scale, the number of defect points may be large. Therefore, the preview image needs to be displayed in a grid for easy viewing by the inspector.

[0034] Considering the varying number of defect images on different optoelectronic boards, this application sets the number and size of preview images displayed in different preview modes. This allows inspectors to select the appropriate preview mode based on the actual number of defects, improving inspection efficiency. Specifically, to enhance visualization, the defect image size in each preview mode is standardized, and the target size of the defect images in the target preview mode is negatively correlated with the number of images displayed. The display interface size is fixed; when a large number of defect images are displayed in this mode, the size of the defect images is relatively smaller, and vice versa.

[0035] When the inspector selects the target preview mode, multiple preview defect images will be displayed in the preview display area 320. Each defect image represents a defect point or flaw on the target master image. If the actual number of defect images exceeds the number displayed on the interface, a multi-page display is set up. That is, a selection control 330 is set at the bottom of the preview display area 320, allowing users to jump to the corresponding page to view all defect images.

[0036] Step 103: In response to receiving a selection operation on the target defect image in the preview display area, the original defect image corresponding to the target defect image is displayed in the preview display area.

[0037] While previewing defect images can improve the efficiency of re-inspection to some extent, it's inconvenient for inspectors to directly view minute defects or when the displayed defect image is relatively small. Therefore, this application also provides a targeted image magnification operation. The computer receives the inspector's selection of a target defect image in the preview display area. Based on the preview image displayed in the preview display area, the original defect image corresponding to the selected target defect image is then overlaid on the page. The original defect image is a 1:1 original image extracted from the target master image, while the target defect image is actually a preview image formed by scaling it according to the selected target preview mode. Especially when the preview image is small and it's inconvenient to display the defect details, this method can be used to pop up the original defect image, obtaining detailed information about the defect points and reducing the false positive rate.

[0038] like Figure 4 As shown, when the inspector selects one of the target defect images, a mask layer 430 will be generated in the preview display area 420, and the original defect image 440 corresponding to the target defect image will be displayed on the mask layer 430. The original defect image 440 displays the detailed features of the photoelectric board and the marked defect point information.

[0039] In summary, this application provides a defect preview interface for the re-inspection of optoelectronic boards, divided into a panoramic display area and a preview display area. The panoramic display area shows the panoramic master image of the optoelectronic board, while the preview display area shows defect images identified and extracted from the master image, with defect annotations for easy review by the re-inspector. To improve re-inspection efficiency, different preview modes can be selected to display different numbers and sizes of defect images in the preview display area, facilitating rapid re-inspection. For minor defects, the original defect image is retrieved and displayed in the preview display area based on the target defect image selected by the re-inspector, achieving a magnified image display effect. Directly viewing the detailed information of the defect points through the original defect image can significantly reduce the false detection rate.

[0040] In some embodiments, because the re-inspection of the photoelectric board requires database storage, the database of this application stores the photoelectric board master image and defect images in association, with one photoelectric board corresponding to one defect set. Each defect set stores all defect images identified and extracted from the master image. Correspondingly, the photoelectric board batch model corresponding to the target master image is displayed in the panoramic display area. When the computer device receives the preview command, it selects the target defect set from the database according to the photoelectric board batch model.

[0041] Although defect points are marked on each defect image, the defect types identified by the machine require re-inspection, so text display is also needed for verification by the re-inspector. To address this, during the image recognition stage, for defect images where defects have been identified, corresponding defect labels are generated and embedded. Each defect label contains at least the photoelectric board number, defect number, and defect type. The defect labels and defect points correspond one-to-one. The label text content is displayed simultaneously when the preview image is generated.

[0042] This application divides the preview display into n levels of preview modes, namely, Level 1 preview mode, Level 2 preview mode, and so on up to Level n. In Level 1 preview mode, the higher the preview level, the more defective images are displayed, and the smaller the image size.

[0043] In one possible implementation, the preview display area displays defect preview images in a grid, including n-level preview modes. The number of defect images displayed in the grid in the (i+1)th level preview mode is greater than the number of defect images displayed in the grid in the i-th level preview mode, and the image size of the defect images is smaller than the image size in the (i-1)th level preview mode; where i is a positive integer not exceeding n.

[0044] This application uses the Level 4 preview mode as an example for illustration, and the defect diagram is displayed in grid mode. Figure 3 A photoelectric board selection control 310 is provided in the panoramic display area. In response to a trigger operation on the photoelectric board selection control 312, the corresponding photoelectric board master image with the specified number is selected from the database, and the corresponding photoelectric board information is displayed. Each target photoelectric board master image corresponds one-to-one with a target defect set. A mode preview control 322 is provided in the preview display area. Upon a trigger operation on the mode preview control 322, a defect image is displayed according to the corresponding target preview mode and target master image.

[0045] When the inspector selects the first-level preview mode, the preview area displays the defect image in a two-grid format, with each row and two columns representing a single defect.

[0046] When the re-inspector selects the second-level preview mode, the preview area displays the defect image in a three-grid format, with each row and two columns.

[0047] When the inspector selects the third-level preview mode, the preview area displays the defect diagram in a six-grid format, meaning the preview area shows the defect diagram in two rows and three columns.

[0048] When the inspector selects the fourth-level preview mode, the preview area displays the defect diagram in a two-row, four-column format when the eight-grid layout is used.

[0049] refer to Figure 5 and Figure 6 The diagrams show interface illustrations displaying defect images in two-grid and eight-grid layouts, respectively. The specific defects and text content of the defect labels are displayed in the grid images. Figure 5 The two defects are "white ink foreign matter". Figure 6 The defects are "white ink foreign matter" and "gold surface contamination". Considering the magnification effect of the selected target defect image, in the i+1 level preview mode, the image size after selecting the target defect image and displaying the original image is the same as the image size of the defect image displayed in the grid in the i level preview mode. That is, in the 3rd level preview mode, the pop-up window displaying the selected defect image is the same size as the defect image in the 2nd level mode, and so on for other levels.

[0050] In addition, to ensure the graphics are displayed proportionally and to avoid visual illusions affecting judgment, image controls are also displayed in the preview area when showing the original image, such as... Figure 7 As shown, in response to receiving a selection operation on the image control 710, the original image is scaled or rotated. Each time a zoom-in operation is clicked, the image is zoomed in to the size of the previous level defect image. That is, after displaying the original defect image in the 3rd level preview mode (the size is the same as the defect image in the 2nd level mode), the zoom-in operation makes it the same size as the defect image in the 1st level mode.

[0051] It should be noted that the original defect image is not necessarily larger than the corresponding defect preview image, because it is extracted at a 1:1 scale. The preview image in the two-grid mode may be an enlarged version of the original defect image, depending on the size of the defect points.

[0052] In summary, this two-level inspection mode can greatly improve the work efficiency of re-inspectors. When the defect points can be clearly seen, they can be directly confirmed. When the content cannot be directly seen, the original defect image can be obtained, and the size of the defect image can be zoomed in or out step by step through the control to learn about the defect details. This improves efficiency while minimizing the error rate.

[0053] Figure 8 This invention provides a schematic diagram of the structure of a photoelectric board defect image preview display device according to an embodiment of the present application. The device includes:

[0054] The first display module 810 is used to display a defect preview interface, which includes a panoramic display area and a preview display area; the panoramic display area displays the master image of the photoelectric board, and the preview display area displays defect images of several photoelectric boards.

[0055] The second display module 820 is used to respond to a received preview command for a defect image, determine the preview mode and target master image corresponding to the preview command, retrieve a defect set from the database, and display the target number and target size of defect images in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantities and sizes;

[0056] The third display module 830 is used to respond to receiving a selection operation of the target defect image in the preview display area, and to display the original defect image corresponding to the target defect image in the preview display area; the original defect image is an original image identified and cropped from the master image of the photoelectric board, and the target defect image is a preview image after being scaled according to the target preview mode.

[0057] Furthermore, this application also provides a computer device, which includes a processor and a memory, wherein the memory stores at least one instruction, at least one program, a code set, or an instruction set, and the at least one instruction, the at least one program, the code set, or the instruction set is loaded and executed by the processor to implement the optoelectronic board defect image preview display method described above.

[0058] Furthermore, this application also provides a computer-readable storage medium storing at least one instruction, at least one program, code set, or instruction set, wherein the at least one instruction, the at least one program, the code set, or the instruction set is loaded and executed by a processor to implement the optoelectronic board defect image preview display method described above.

[0059] The optoelectronic board defect image preview display device provided in this application embodiment can be applied to the optoelectronic board defect image preview display method provided in the above embodiment. For relevant details, please refer to the above method embodiment. The implementation principle and technical effect are similar, and will not be repeated here.

[0060] It should be noted that the optoelectronic board defect image preview display device provided in this application embodiment is only illustrated by the above-mentioned division of functional modules / functional units during the gauge operation. In practical applications, the above functions can be assigned to different functional modules / functional units as needed, that is, the internal structure of the optoelectronic board defect image preview display device can be divided into different functional modules / functional units to complete all or part of the functions described above. In addition, the implementation method of the optoelectronic board defect image preview display method provided in the above method embodiment and the implementation method of the optoelectronic board defect image preview display device provided in this embodiment belong to the same concept. The specific implementation process of the optoelectronic board defect image preview display device provided in this embodiment is detailed in the above method embodiment, and will not be repeated here.

[0061] Figure 9 This illustration shows a structural block diagram of a computer device provided in an exemplary embodiment of this application. The device includes desktop computers, laptops, handheld computers, and cloud servers. This computer device may include, but is not limited to, a processor and memory. The processor and memory can be connected via a bus or other means. The processor may be a Central Processing Unit (CPU). The processor may also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, graphics processing units (GPUs), embedded neural network processing units (NPUs) or other dedicated deep learning coprocessors, discrete gate or transistor logic devices, discrete hardware components, or combinations of the above types of chips.

[0062] The processor may include one or more processing cores, such as a quad-core processor or an octa-core processor. The processor may be implemented using at least one hardware form selected from DSP (Digital Signal Processing), FPGA (Field-Programmable Gate Array), and PLA (Programmable Logic Array). The processor 1701 may also include a main processor and a coprocessor. The main processor, also known as a CPU (Central Processing Unit), is used to process data in the wake-up state; the coprocessor is a low-power processor used to process data in the standby state. In some embodiments, the processor may integrate a GPU (Graphics Processing Unit), which is responsible for rendering and drawing the content required to be displayed on the screen. In some embodiments, the processor may also include an AI (Artificial Intelligence) processor, which is used to handle computational operations related to machine learning.

[0063] Memory, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs, non-transitory computer-executable programs, and modules, such as the program instructions / modules corresponding to the methods in the above embodiments of this application. The processor executes various functional applications and data processing by running the non-transitory software programs, instructions, and modules stored in the memory, thereby implementing the methods in the above embodiments. The memory may include a program storage area and a data storage area, wherein the program storage area may store the operating system and at least one application program required for a function; the data storage area may store data created by the processor, etc. Furthermore, the memory may include high-speed random access memory and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory may optionally include memory remotely located relative to the processor, and these remote memories can be connected to the processor via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, local area networks, mobile communication networks, and combinations thereof.

[0064] In some embodiments, the computer device may also optionally include: a peripheral device interface and at least one peripheral device. The processor, memory, and peripheral device interface can be connected via a bus or signal lines. Each peripheral device can be connected to the peripheral device interface via a bus, signal lines, or a circuit board. Specifically, the peripheral device includes at least one of: a radio frequency circuit, a display screen, and a keyboard.

[0065] Peripheral device interfaces can be used to connect at least one I / O (Input / Output) related peripheral device to the processor and memory. In some embodiments, the processor, memory, and peripheral device interface are integrated on the same chip or circuit board; in some other embodiments, any one or two of the processor, memory, and peripheral device interface can be implemented on separate chips or circuit boards, which is not limited in this embodiment.

[0066] The display screen is used to display the UI (User Interface). This UI can include graphics, text, icons, videos, and any combination thereof. When the display screen is a touch screen, it also has the ability to collect touch signals on or above the surface of the display. These touch signals can be input as control signals to a processor for processing. In this case, the display screen can also be used to provide virtual buttons and / or a virtual keyboard, also known as soft buttons and / or a soft keyboard. In some embodiments, there can be one display screen, located on the front panel of the computer device; in other embodiments, there can be at least two display screens, respectively located on different surfaces of the computer device or in a folded design; in still other embodiments, the display screen can be a flexible display screen, located on a curved or folded surface of the computer device. Furthermore, the display screen can be configured as a non-rectangular, irregular shape, i.e., a non-rectangular screen. The display screen can be made of materials such as LCD (Liquid Crystal Display) and OLED (Organic Light-Emitting Diode).

[0067] A power supply is used to power the various components in a computer device. The power supply can be alternating current (AC), direct current (DC), a disposable battery, or a rechargeable battery. When the power supply includes a rechargeable battery, the rechargeable battery can be a wired rechargeable battery or a wireless rechargeable battery. A wired rechargeable battery is charged via a wired connection, while a wireless rechargeable battery is charged via a wireless coil. The rechargeable battery can also be used to support fast charging technology.

[0068] Those skilled in the art will understand that Figure 9 The structure shown does not constitute a limitation on the computer device and may include more or fewer components than shown, or combine certain components, or use different component arrangements.

[0069] This application also discloses a computer-readable storage medium. Specifically, the computer-readable storage medium is used to store a computer program, which, when executed by a processor, implements the methods described in the above-described method embodiments. Those skilled in the art will understand that implementing all or part of the processes in the methods described above can be accomplished by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes described in the above-described method embodiments. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), random access memory (RAM), flash memory, hard disk drive (HDD), or solid-state drive (SSD), etc.; the storage medium can also include combinations of the above types of memory.

[0070] This specific embodiment is merely an explanation of the present invention and is not intended to limit the invention. After reading this specification, those skilled in the art can make modifications to this embodiment without contributing any inventive step, but such modifications are protected by patent law as long as they are within the scope of the claims of the present invention.

Claims

1. A method for previewing and displaying defect images of a photoelectric board, characterized in that, The method includes: The defect preview interface includes a panoramic display area and a preview display area; the panoramic display area displays the master image of the photoelectric board, and the preview display area displays defect images of several photoelectric boards. In response to receiving a preview command for a defect image, the system determines the preview mode and target master image corresponding to the preview command, retrieves a defect set from the database, and displays the target number and target size of defect images in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantities and sizes; In response to receiving a selection operation for a target defect image in the preview display area, a mask layer is generated in the preview display area, and the original defect image corresponding to the target defect image is displayed on the mask layer; the original defect image is an original image identified and cropped from the master image of the photoelectric board, including the detailed features of the board and the marked defect point information, and the target defect image is a preview image after being scaled according to the target preview mode; The panoramic display area also displays the photoelectric board batch model corresponding to the target master image; in response to receiving the preview command, a target defect set is selected from the database according to the photoelectric board batch model; the target defect set contains all defect images identified and cropped from the target master image; The defect diagram contains built-in defect labels, and each defect label includes at least the photoelectric board number, defect number, and defect type; each defect label corresponds one-to-one with a defect point. The preview display area displays defect preview images in a grid, including n-level preview modes. The number of defect images displayed in the grid in the (i+1)th level preview mode is greater than the number of defect images displayed in the grid in the i-th level preview mode, and the image size of the defect images is smaller than the image size in the (i-1)th level preview mode; where i is a positive integer not exceeding n.

2. The method according to claim 1, characterized in that, The preview display area is equipped with a mode preview control. In response to receiving a trigger operation on the mode preview control, a defect image is displayed according to the corresponding target preview mode and target master image. The panoramic display area is equipped with a photoelectric board selection control. In response to receiving a trigger operation on the photoelectric board selection control, the corresponding photoelectric board master image is selected from the database; the target photoelectric board master image corresponds one-to-one with the target defect set.

3. The method according to claim 1, characterized in that, The image size after selecting the target defect image and displaying the original image in the (i+1)th level preview mode is the same as the image size of the defect image displayed in the grid in the i-th level preview mode; When the original image is displayed in the preview display area, an image control is also displayed. In response to receiving a selection operation on the image control, the original image is scaled or rotated.

4. The method according to claim 1, characterized in that, The defect image is marked with defect areas, and when the defect image is displayed in the preview display area, the defect labels in the defect image are read and displayed in the grid.

5. A device for previewing and displaying defects in a photoelectric board, characterized in that, The device includes: The first display module is used to display a defect preview interface, which includes a panoramic display area and a preview display area. The panoramic display area displays the master image of the photoelectric board, and the preview display area displays defect images of several photoelectric boards. The second display module is used to respond to a received preview command for a defect image, determine the preview mode and target master image corresponding to the preview command, retrieve a defect set from the database, and display the target number and target size of defect images in the preview display area according to the preview mode; different preview modes correspond to different image preview display quantities and sizes; The third display module is used to respond to receiving a selection operation of the target defect image in the preview display area, generate a mask layer in the preview display area, and display the original defect image corresponding to the target defect image on the mask layer; the original defect image is an original image identified and cropped from the master image of the photoelectric board, including the detailed features of the board and the marked defect point information, and the target defect image is a preview image after being scaled according to the target preview mode; The panoramic display area also displays the photoelectric board batch model corresponding to the target master image; in response to receiving the preview command, a target defect set is selected from the database according to the photoelectric board batch model; the target defect set contains all defect images identified and cropped from the target master image; The defect diagram contains built-in defect labels, and each defect label includes at least the photoelectric board number, defect number, and defect type; each defect label corresponds one-to-one with a defect point. The preview display area displays defect preview images in a grid, including n-level preview modes. The number of defect images displayed in the grid in the (i+1)th level preview mode is greater than the number of defect images displayed in the grid in the i-th level preview mode, and the image size of the defect images is smaller than the image size in the (i-1)th level preview mode; where i is a positive integer not exceeding n.

6. A computer device, characterized in that, The computer device includes a processor and a memory, wherein the memory stores at least one instruction, at least one program, a code set, or an instruction set, and the at least one instruction, the at least one program, the code set, or the instruction set is loaded and executed by the processor to implement the optoelectronic board defect image preview display method as described in any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that, The readable storage medium stores at least one instruction, at least one program, code set, or instruction set, wherein the at least one instruction, the at least one program, the code set, or instruction set is loaded and executed by a processor to implement the optoelectronic board defect image preview display method as described in any one of claims 1 to 4.

Images