A signal testing device for millimeter-wave surface-mount standard waveguide devices

Abstract

This invention provides a signal testing device for millimeter-wave surface-mount standard waveguide devices, characterized by comprising a testing component and a calibration component. The testing device of this invention is smaller in size, simpler, and more convenient to use; it avoids the problems of complex installation and difficult assembly with testing devices in the testing process of surface-mount standard waveguide millimeter-wave devices; it avoids the problems of difficult calibration and inaccurate testing caused by the use of standard waveguide ports in surface-mount standard waveguide millimeter-wave devices; the testing device can perform non-destructive testing on surface-mount standard waveguide millimeter-wave devices, and the testing process is safe and reliable.

Description

Technical Field

[0001] This invention relates to the field of millimeter-wave device testing technology for surface-mount standard waveguides, specifically to a signal testing device for millimeter-wave surface-mount standard waveguide devices. Background Technology

[0002] With the development of millimeter-wave technology, new high-power millimeter-wave devices have become a key development direction. High-power millimeter-wave surface-mount devices generally use standard waveguide transmission. Due to the high frequency of these devices, their performance evaluation is greatly affected by the testing equipment, thus placing high demands on the testing equipment for these millimeter-wave devices. For ordinary large waveguide devices, waveguide-to-coaxial converters can be used directly for testing, and calibration is relatively convenient. However, for these millimeter-wave standard waveguide surface-mount devices, waveguide-to-coaxial converters cannot be used directly for testing. Although ordinary testing equipment can perform the tests, the testing process cannot calibrate the devices, and accurate testing and evaluation of these devices is not possible. Summary of the Invention

[0003] The present invention aims to overcome the shortcomings of the prior art by providing a signal testing device for millimeter-wave surface-mount standard waveguide devices.

[0004] This application provides the following technical solution:

[0005] A signal testing device for millimeter-wave surface-mount standard waveguide devices is characterized in that: it includes a testing component and a calibration component. The testing component includes a housing composed of a groove and a test PCB circuit board. A support is provided on the housing, and a lifting pressure plate assembly is provided on the support. Standard waveguide ports are correspondingly distributed on the PCB circuit board below the lifting pressure plate assembly. A set of limiting plates corresponding to the waveguide millimeter-wave devices are evenly distributed on the PCB circuit board outside the standard waveguide ports. A set of feeding springs corresponding to the waveguide millimeter-wave devices are also provided on the PCB circuit board. A set of feeding terminals that form a circuit connection with the feeding springs are provided on the PCB circuit board. An opening is provided on the groove.

[0006] The calibration assembly includes two symmetrically connected housings. Standard waveguide ports on the two housings are coaxially distributed to form long waveguide ports. Waveguide-to-coaxial converters are installed inside the housings, and the ports of the two waveguide-to-coaxial converters are connected to the two ends of the long waveguide ports, respectively. A vector network analyzer is provided on the outside of the two housings. Coaxial cables are connected to the vector network analyzers, and one end of the coaxial cable can extend into the two housings respectively and communicate with the connectors on the corresponding waveguide-to-coaxial converters.

[0007] One of the housings in the calibration assembly has a clearance hole for connecting screws.

[0008] The bracket includes a pair of vertically mounted support columns on a PCB circuit board, with a crossbeam spanning across the support columns.

[0009] The lifting pressure plate assembly includes a butterfly nut mounted on a bracket, a lifting screw threaded through the butterfly nut, and a pressure plate connected to the lower end of the lifting screw. Rotating the butterfly nut drives the lifting screw to move up and down longitudinally.

[0010] The limiting piece has a triangular structure.

[0011] The set of feed springs consists of four springs, which are distributed in pairs on both sides of the standard waveguide port, with one end of the feed springs extending toward the standard waveguide port.

[0012] Advantages of the invention:

[0013] This invention has the following features:

[0014] 1) Compared with large millimeter-wave standard waveguide device testing equipment, this testing and evaluation equipment is smaller, simpler, and more convenient to use;

[0015] 2) It avoids problems such as complex installation and difficulty in assembling with the test device during the testing of surface-mount standard waveguide millimeter-wave devices;

[0016] 3) It avoids the problems of difficult calibration and inaccurate testing of surface-mount standard waveguide millimeter-wave devices due to the use of standard waveguide ports;

[0017] 4) This type of testing and evaluation device can perform non-destructive testing on surface-mount standard waveguide millimeter-wave devices, and the testing process is safe and reliable. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of the test component in this invention;

[0019] Figure 2 This is a top view of the test component in this invention;

[0020] Figure 3 This is a schematic diagram of the calibration component in this invention;

[0021] Figure 4 This is a schematic diagram of the waveguide-to-coaxial converter in this invention;

[0022] Figure 5 yes Figure 4 The left view. Detailed Implementation

[0023] like Figure 1-5As shown, a millimeter-wave surface-mount standard waveguide device signal testing device includes a testing component and a calibration component. The testing component includes a groove 5 with four side walls. A test PCB circuit board 6 is covered at the opening of the groove 5. The PCB circuit board 6 is detachably connected to the groove 5 by screws to form a housing 1 with an internal cavity.

[0024] A bracket 2 is connected to the PCB circuit board 6. The bracket 2 is a gate-shaped structure including a pair of support columns 3 vertically connected to the upper surface of the PCB circuit board 6, and a crossbeam 4 spans the top of the two support columns 3. A lifting pressure plate assembly 3 is connected to the crossbeam 4. The lifting pressure plate assembly 3 includes a butterfly nut 11 rotatably mounted on the crossbeam 4, a lifting screw 111 passing through the butterfly nut 11, and horizontally distributed pressure plates 112 connected to the lower end of the lifting screw 111. Rotating the butterfly nut 11 drives the lifting screw 111 to move up and down longitudinally.

[0025] A standard waveguide port 10 penetrating the board body is provided on the PCB circuit board 6 below the pressure plate 112. A set of limiting plates 12 corresponding to and cooperating with the waveguide millimeter wave device are evenly distributed on the PCB circuit board 6 outside the standard waveguide port 10.

[0026] The limiting plates 12 are triangular in structure, with four arranged in a rectangular pattern. Two pairs of symmetrically distributed feed springs 13 are also provided on the PCB circuit board 6 on both sides of the standard waveguide port 10. One end of each feed spring 13 extends towards the standard waveguide port 10 to connect with the waveguide millimeter-wave device under test. A set of feed terminals 7, forming a circuit connection with the feed springs 13, is connected to the PCB circuit board 6 outside the feed springs 13.

[0027] An opening 9 is provided on the groove 5, and waveguide-to-coaxial converters corresponding to the standard waveguide ports 10 are connected inside the groove 5.

[0028] The calibration assembly comprises two symmetrically distributed housings 1 connected together by connecting screws 19, such that two PCB circuit boards 6 on the two housings 1 are bonded together, and the standard waveguide ports 10 on the two PCB circuit boards 6 are coaxially distributed, thereby forming a long waveguide port 16. A connecting screw clearance hole 18 is provided on one of the housings 1. The housing 1 structure of the calibration assembly is the same as that of the test assembly.

[0029] A waveguide-to-coaxial converter 17 is installed inside each of the two connected housings 1. The ports 20 of the two waveguide-to-coaxial converters are connected to the two ends of the long waveguide port 16, respectively. A vector network analyzer 15 is provided on the outside of the two housings 1. Coaxial cables 21 are connected to the vector network analyzers 15, and one end of the coaxial cable 21 can extend into the two housings 1 respectively and communicate with the connector 14 on the corresponding waveguide-to-coaxial converter.

[0030] Due to various power losses in the testing device during the testing process, the test is inaccurate. Therefore, the testing device needs to be calibrated by a calibration component to calibrate the test PCB circuit board 6 on the housing 1.

[0031] Since the test PCBs in both the test and calibration components have the same thickness, the power loss of the calibration component is tested via a vector network analyzer 15. Because the structure measured in the calibration component is twice the thickness of the test PCB in both test components, the test loss of the calibration component is also twice that of the test component. Therefore, the test component loss is LOSS1, and the actual loss of a single PCB is LOSS2 = LOSS1 / 2, thus ultimately achieving the calibration of the test component.

[0032] During the testing process, the calibration kit is first used to calibrate the dual PCB circuit boards. Half of the measured loss is the loss LOSS2 of the single PCB circuit board in the test kit. Then, the kit is used to test the surface-mount standard waveguide millimeter-wave device. The output power Pout1 is added to the loss LOSS2 obtained from the calibration kit, i.e., Pout = Pout1 + LOSS2. Pout is the more accurate test result for the surface-mount standard waveguide millimeter-wave device.

Claims

1. A signal testing device for millimeter-wave surface-mount standard waveguide devices, characterized in that: It includes a test component and a calibration component. The test component includes a housing (1) consisting of a groove (5) and a test PCB circuit board (6). A bracket (2) is provided on the housing (1). A lifting plate assembly (3) is provided on the bracket (2). Standard waveguide ports (10) are distributed on the PCB circuit board (6) below the lifting plate assembly (3). A set of limiting plates (12) corresponding to waveguide millimeter-wave devices are evenly distributed on the PCB circuit board (6) outside the standard waveguide ports (10). A set of feeding springs (13) corresponding to waveguide millimeter-wave devices are also provided on the PCB circuit board (6). A set of feeding terminals (7) forming a circuit connection with the feeding springs (13) is provided on the PCB circuit board (6). An opening (9) is provided on the groove (5). Waveguide to coaxial devices corresponding to the standard waveguide ports (10) are provided on the housing (1). The calibration assembly includes two symmetrically connected housings (1). Standard waveguide ports (10) on the two housings (1) are coaxially distributed to form long waveguide ports (16). Waveguide-to-coaxial converters are installed in the housings (1). The ports (20) of the two waveguide-to-coaxial converters are connected to the two ends of the long waveguide ports (16). A vector network analyzer (15) is provided on the outside of the two housings (1). Coaxial cables (21) are connected to the vector network analyzer (15). One end of the coaxial cable (21) can be inserted into the two housings (1) and connected to the connector (14) on the corresponding waveguide-to-coaxial converter.

2. The signal testing device for millimeter-wave surface-mount standard waveguide devices according to claim 1, characterized in that: A connecting screw clearance hole (18) is provided on one of the housings (1) of the calibration assembly.

3. The signal testing device for millimeter-wave surface-mount standard waveguide devices according to claim 1, characterized in that: The bracket (2) includes a pair of support columns (3) vertically arranged on the PCB circuit board (6), and a crossbeam (4) is connected across the support columns (3).

4. The signal testing device for millimeter-wave surface-mount standard waveguide devices according to claim 1, characterized in that: The lifting pressure plate assembly (3) includes a butterfly nut (11) mounted on a bracket (2), a lifting screw (111) passing through the butterfly nut (11), and a pressure plate (112) connected to the lower end of the lifting screw (111). By rotating the butterfly nut (11), the lifting screw (111) is driven to move up and down longitudinally.

5. The signal testing device for millimeter-wave surface-mount standard waveguide devices according to claim 1, characterized in that: The limiting piece (12) is a triangular structure.

6. The signal testing device for millimeter-wave surface-mount standard waveguide devices according to claim 1, characterized in that: The set of feeding springs (13) corresponding to the waveguide millimeter-wave device consists of four pieces, which are distributed in pairs on both sides of the standard waveguide port (10), with one end of the feeding spring (13) extending toward the standard waveguide port (10).

Images