A temperature acquisition control system and a temperature acquisition method

Abstract

This application discloses a temperature acquisition and control system and a temperature acquisition method, relating to the field of temperature control technology. The temperature acquisition and control system includes an NTC temperature sensor, an enhanced linearity circuit, and an MCU. By pre-dividing the temperature acquisition range of the NTC temperature sensor into multiple temperature intervals and setting a corresponding reference voltage for each interval, the system continuously switches and quickly matches the corresponding reference voltage based on the current temperature interval during temperature changes. This allows the enhanced linearity circuit to appropriately amplify the electrical signal representing the current temperature according to the corresponding reference voltage, enabling the MCU to accurately generate the corresponding temperature value based on the amplified electrical signal. This ensures the accuracy of temperature acquisition and avoids the influence of the nonlinear characteristics of the NTC temperature sensor on temperature acquisition.

Description

Technical Field

[0001] This application relates to the field of temperature control technology, and in particular to a temperature acquisition and control system and a temperature acquisition method. Background Technology

[0002] Currently, in vitro diagnostic equipment aims to provide a constant temperature environment to facilitate reagent storage, sample reaction, and other necessary processes. Therefore, in vitro diagnostic equipment has specific requirements for temperature acquisition.

[0003] Current in vitro diagnostic equipment primarily uses platinum resistance temperature sensors for temperature acquisition. While platinum resistance temperature sensors offer very high accuracy, they are relatively expensive. Negative temperature coefficient (NTC) temperature sensors, on the other hand, are less expensive and can therefore be widely used. However, the resistance of NTC temperature sensors decreases with increasing temperature; the higher the temperature, the smaller the change in resistance. In other words, NTC temperature sensors exhibit non-linear temperature acquisition characteristics, and therefore their accuracy and temperature measurement range cannot yet meet the requirements of in vitro diagnostic equipment.

[0004] Given the above problems, how to solve the problem that the nonlinear characteristics of NTC temperature sensors cannot meet the requirements for accurate temperature acquisition is an urgent issue for technicians in this field. Summary of the Invention

[0005] The purpose of this application is to provide a temperature acquisition control system and a temperature acquisition method, which aims to solve the problem that the nonlinear characteristics of NTC temperature sensors cannot meet the requirements for accurate temperature acquisition.

[0006] To address the aforementioned technical problems, this application provides a temperature acquisition and control system, comprising: an NTC temperature sensor, an enhanced linearity circuit, and an MCU;

[0007] The NTC temperature sensor is connected to the first input terminal of the enhanced linearity circuit, and is used to convert the acquired temperature signal into an electrical signal and transmit the electrical signal to the enhanced linearity circuit.

[0008] The output terminal of the enhanced linearity circuit is connected to the analog signal input terminal of the MCU, and the second input terminal of the enhanced linearity circuit is connected to the analog signal output terminal of the MCU. It is used to receive the reference voltage transmitted by the MCU, amplify the electrical signal according to the reference voltage, and transmit the amplified electrical signal to the MCU.

[0009] The MCU is used to receive the amplified electrical signal and convert the amplified electrical signal into a corresponding temperature value; match the corresponding reference voltage according to the temperature range in which the temperature value is located, and send the reference voltage to the enhanced linearity circuit;

[0010] The MCU pre-divides the temperature acquisition range of the NTC temperature sensor into multiple temperature intervals, each of which has a corresponding reference voltage; the width of each temperature interval is negatively correlated with the temperature within that temperature interval.

[0011] On one hand, the enhanced linearity circuit includes: a first resistor, a second resistor, a third resistor, a fourth resistor, a first capacitor, a second capacitor, and a first operational amplifier;

[0012] The first end of the first resistor is connected to the first end of the first capacitor and the non-inverting input of the first operational amplifier; the second end of the first resistor and the second end of the first capacitor are both grounded; the first end of the second resistor is connected to the first end of the third resistor, the first end of the second capacitor, and the inverting input of the first operational amplifier; the second end of the third resistor and the second end of the second capacitor are both connected to the output of the first operational amplifier and the first end of the fourth resistor;

[0013] Wherein, the first end of the first resistor serves as the first input terminal of the enhanced linearity circuit, the second end of the second resistor serves as the second input terminal of the enhanced linearity circuit, and the second end of the fourth resistor serves as the output terminal of the enhanced linearity circuit.

[0014] On the other hand, it also includes: enhanced drive circuitry;

[0015] The input terminal of the enhanced drive circuit is connected to the analog signal output terminal of the MCU, and the output terminal of the enhanced drive circuit is connected to the second input terminal of the enhanced linearity circuit. It is used to receive and amplify the reference voltage output by the MCU, and transmit the amplified reference voltage to the enhanced linearity circuit.

[0016] On the other hand, the enhanced drive circuit includes: a fifth resistor, a third capacitor, and a second operational amplifier;

[0017] The inverting input terminal of the second operational amplifier is connected to the first terminal of the fifth resistor and the first terminal of the third capacitor; the second terminal of the fifth resistor and the second terminal of the third capacitor are both connected to the output terminal of the second operational amplifier.

[0018] The non-inverting input of the second operational amplifier serves as the input of the enhancement drive circuit, and the output of the second operational amplifier serves as the output of the enhancement drive circuit.

[0019] On the other hand, there are multiple NTC temperature sensors, which are respectively installed in each module of the in vitro diagnostic device;

[0020] The modules of the in vitro diagnostic device include at least a reagent cooling module, an incubation heating module, a DC pump valve module, and an ambient temperature detection module.

[0021] On the other hand, it also includes: level conversion circuit and driving circuit;

[0022] The input terminal of the level conversion circuit is connected to the driving terminal of the MCU, and the output terminal of the level conversion circuit is connected to the control terminal of the driving circuit. It is used to receive the PWM pulse signal generated by the MCU according to the temperature value and send the PWM pulse signal to the driving circuit.

[0023] The driving circuit is connected to the module and is used to drive the module to operate.

[0024] On the other hand, it also includes: CAN transceiver and CAN interface circuit;

[0025] One end of the CAN transceiver is connected to the MCU, and the other end of the CAN transceiver is connected to one end of the CAN interface circuit. It is used to receive the temperature value transmitted by the MCU, convert the temperature value into CANH signal and CANL signal and send it to the CAN interface circuit.

[0026] The other end of the CAN interface circuit is connected to the host computer, and is used to transmit the CANH signal and the CANL signal to the host computer, and receive the control commands transmitted by the host computer, so as to transmit the control commands to the MCU through the CAN transceiver.

[0027] On the other hand, the temperature acquisition and control system is connected to the power supply module;

[0028] The first power supply terminal of the power supply module is connected to the power supply terminal of the MCU and is used to supply power to the MCU; the second power supply terminal of the power supply module is connected to the power supply terminal of the host computer and is used to supply power to the host computer.

[0029] On the other hand, the power supply module includes: a switching power supply and a power distribution board;

[0030] The input terminal of the switching power supply is connected to the mains power, and the output terminal of the switching power supply is connected to the power distribution board, which is used to convert the mains power into a preset voltage.

[0031] The first output terminal of the power distribution board is connected to the power supply terminal of the MCU as the first power supply terminal of the power supply module, and the second output terminal of the power distribution board is connected to the power supply terminal of the host computer as the second power supply terminal of the power supply module, for supplying power to the MCU and the host computer respectively according to the preset voltage.

[0032] To address the aforementioned technical problems, this application also provides a temperature acquisition method, applied to a temperature acquisition and control system including an NTC temperature sensor, an enhanced linearity circuit, and an MCU; the method includes:

[0033] The temperature acquisition range of the NTC temperature sensor is divided into multiple temperature intervals;

[0034] A corresponding reference voltage is set for each of the temperature ranges; wherein the width of each temperature range is negatively correlated with the temperature within the corresponding temperature range.

[0035] The electrical signal transmitted by the enhanced linearity circuit is monitored; wherein the electrical signal is the signal converted by the NTC temperature sensor based on the collected temperature signal and amplified by the enhanced linearity circuit based on the reference voltage;

[0036] When the electrical signal is received, it is converted into a corresponding temperature value;

[0037] The reference voltage is matched according to the temperature range in which the temperature value is located, and the reference voltage is sent to the enhanced linearity circuit.

[0038] The temperature acquisition and control system provided in this application includes an NTC temperature sensor, an enhanced linearity circuit, and an MCU. The NTC temperature sensor is connected to the first input terminal of the enhanced linearity circuit, which converts the acquired temperature signal into an electrical signal and transmits the electrical signal to the enhanced linearity circuit. The output terminal of the enhanced linearity circuit is connected to the analog signal input terminal of the MCU, and the second input terminal of the enhanced linearity circuit is connected to the analog signal output terminal of the MCU. It receives a reference voltage transmitted by the MCU, amplifies the electrical signal according to the reference voltage, and transmits the amplified electrical signal to the MCU. The MCU receives the amplified electrical signal and converts it into a corresponding temperature value. It matches the corresponding reference voltage according to the temperature range in which the temperature value is located and sends the reference voltage to the enhanced linearity circuit. The MCU pre-divides the temperature acquisition range of the NTC temperature sensor into multiple temperature ranges, each with a corresponding reference voltage. The width of each temperature range is negatively correlated with the temperature within the corresponding temperature range. Therefore, the above solution pre-divides the temperature acquisition range of the NTC temperature sensor into multiple temperature intervals and sets a corresponding reference voltage for each temperature interval. As the temperature changes, it continuously switches and quickly matches the corresponding reference voltage based on the temperature interval in which the current temperature is located. This allows the enhanced linearity circuit to reasonably amplify the electrical signal representing the current temperature according to the corresponding reference voltage, so that the MCU can accurately generate the corresponding temperature value based on the amplified electrical signal. This ensures the accuracy of temperature acquisition and avoids the influence of the nonlinear characteristics of the NTC temperature sensor on temperature acquisition.

[0039] In addition, this application also provides a temperature acquisition method with the same effect as above. Attached Figure Description

[0040] To more clearly illustrate the embodiments of this application, the accompanying drawings used in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 A schematic diagram of a temperature acquisition and control system provided in an embodiment of this application;

[0042] Figure 2 A schematic diagram of an enhanced linearity circuit provided in an embodiment of this application;

[0043] Figure 3 A schematic diagram of another temperature acquisition and control system provided in an embodiment of this application;

[0044] Figure 4A schematic diagram of an enhanced driving circuit provided in an embodiment of this application;

[0045] Figure 5 This is a schematic diagram of an in vitro diagnostic device provided in an embodiment of this application;

[0046] Figure 6 A schematic diagram of a reagent cooling module provided in an embodiment of this application;

[0047] Figure 7 A schematic diagram of a heating module for incubation provided in an embodiment of this application;

[0048] Figure 8 A schematic diagram of a DC pump-valve module provided in an embodiment of this application;

[0049] Figure 9 A schematic diagram of a power supply module provided in an embodiment of this application;

[0050] Figure 10 This is a flowchart of a temperature acquisition method provided in an embodiment of this application.

[0051] Among them, 9 is the temperature acquisition and control system, 10 is the NTC temperature sensor, 11 is the enhanced linearity circuit, 12 is the MCU, 13 is the enhanced drive circuit, 14 is the level conversion circuit, 15 is the drive circuit, 16 is the CAN transceiver, 17 is the CAN interface circuit, 18 is the power supply module, 19 is the host computer, 20 is the reagent cooling module, 21 is the incubation heating module, 22 is the DC pump valve module, 23 is the ambient temperature detection module, 201 is the cooling chamber, 202 is the semiconductor cooling module, 211 is the incubation plate, 212 is the heating film, 221 is the DC pump, 222 is the pipeline, 181 is the switching power supply, and 182 is the power distribution board. Detailed Implementation

[0052] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of this application.

[0053] The core of this application is to provide a temperature acquisition and control system and a temperature acquisition method to solve the problem that the nonlinear characteristics of NTC temperature sensors cannot meet the requirements for accurate temperature acquisition.

[0054] To enable those skilled in the art to better understand the present application, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments.

[0055] Currently, temperature acquisition in most in vitro diagnostic devices relies on platinum resistance temperature sensors. While platinum resistance temperature sensors offer very high accuracy, they are relatively expensive. NTC temperature sensors, on the other hand, are less expensive and can be widely used. However, the resistance of NTC temperature sensors decreases with increasing temperature; the higher the temperature, the smaller the resistance change. This means that NTC temperature sensors exhibit non-linear temperature acquisition characteristics, thus their accuracy and temperature range cannot meet the requirements of in vitro diagnostic devices. In view of these problems, this application provides a temperature acquisition and control system designed to address the issue of the non-linear characteristics of NTC temperature sensors failing to achieve accurate temperature acquisition.

[0056] Figure 1 This is a schematic diagram of a temperature acquisition and control system provided in an embodiment of this application. Figure 1 As shown, the system includes: an NTC temperature sensor 10, an enhanced linearity circuit 11, and an MCU 12;

[0057] The NTC temperature sensor is connected to the first input terminal of the enhanced linearity circuit, which is used to convert the acquired temperature signal into an electrical signal and transmit the electrical signal to the enhanced linearity circuit.

[0058] The output terminal of the linearity enhancement circuit is connected to the analog signal input terminal of the MCU, and the second input terminal of the linearity enhancement circuit is connected to the analog signal output terminal of the MCU. It is used to receive the reference voltage transmitted by the MCU, amplify the electrical signal according to the reference voltage, and transmit the amplified electrical signal to the MCU.

[0059] The MCU is used to receive the amplified electrical signal and convert it into a corresponding temperature value; it matches the corresponding reference voltage according to the temperature range in which the temperature value is located, and sends the reference voltage to the linearity enhancement circuit.

[0060] The MCU pre-divides the temperature acquisition range of the NTC temperature sensor into multiple temperature ranges, each with its own reference voltage; the width of each temperature range is negatively correlated with the temperature within that range.

[0061] Specifically, the temperature acquisition and control system mainly consists of an NTC temperature sensor, an enhanced linearity circuit, and an MCU. The NTC temperature sensor is primarily used to acquire temperature signals from modules in the in vitro diagnostic equipment, converting the acquired temperature signals into electrical signals, and transmitting these electrical signals to the enhanced linearity circuit. In this embodiment, there are no restrictions on the number or specific location of the NTC temperature sensors; it depends on the specific implementation. In practice, the NTC temperature sensor can be connected to the enhanced linearity circuit via an interface circuit, such as a 2-pin board-side XH connector. Due to its small size, built-in locking function, and multiple user-friendly designs to prevent mistaken identification, this greatly improves the flexibility, stability, and reliability of temperature acquisition.

[0062] Furthermore, the output terminal of the linearity enhancement circuit is connected to the analog signal input terminal of the microcontroller unit (MCU), and the second input terminal of the linearity enhancement circuit is connected to the analog signal output terminal of the MCU. This is used to receive the reference voltage transmitted by the MCU, amplify the electrical signal based on the reference voltage, and then transmit the amplified electrical signal to the MCU. It should be noted that this embodiment does not impose restrictions on the circuit structure of the linearity enhancement circuit; it depends on the specific implementation.

[0063] The MCU is the core component of the temperature acquisition and control system. It receives amplified electrical signals and converts them into corresponding temperature values. Simultaneously, the MCU matches a reference voltage based on the temperature range in which the temperature value falls and sends the reference voltage to the linearity enhancement circuit.

[0064] It is important to note that for each input electrical signal AVin representing temperature, the enhanced linearity circuit has a unique amplified electrical signal AVout corresponding to it. However, the nonlinear characteristic of NTC temperature sensors is that the resistance gradually decreases as the temperature increases. Conventional resistance lookup tables assign a resistance value for every 1°C change. For temperature changes of 0.1°C or less, the resistance value corresponding to 1°C must be divided into ten or one hundred equal parts to obtain the corresponding temperature change, resulting in significant errors and requiring high resolution from the MCU's analog-to-digital (AD) converter. Therefore, this application adopts a formula method, as follows:

[0065] The resistance value of an NTC temperature sensor is measured within its temperature acquisition range (e.g., -40℃ to 150℃), and a resistance-temperature curve is generated. Based on this curve, a corresponding formula for resistance and temperature is derived. Unlike the resistance lookup table method, the formula method shows that the resistance changes continuously with temperature; for each temperature value, the corresponding temperature value can be calculated using the formula. It's important to note that the resistance-temperature relationship differs between different series and manufacturers of NTC temperature sensors, requiring specific formulas to be calculated for each type. After obtaining the temperature-resistance curve of the NTC temperature sensor, a linearity enhancement circuit is used to further address nonlinearity and the high resolution requirements of AD acquisition. For example, based on the derived formula, a unique and accurate temperature conversion value can be obtained for each resistor, thereby improving the accuracy of the resistance change corresponding to a unit temperature change; that is, for every 0.01℃ change, the corresponding resistance change is precise.

[0066] On the other hand, since the resistance change of the NTC temperature sensor is smaller and the voltage change is smaller at higher temperatures, in order to improve the accuracy of temperature acquisition, the MCU in this application pre-divides the temperature acquisition range of the NTC temperature sensor (e.g., -40℃ to 150℃) into multiple temperature intervals, each with its own reference voltage. The width of each temperature interval is negatively correlated with the temperature within that interval. It should be noted that this embodiment does not limit the specific process of dividing the temperature intervals. For example, the temperature range (-40℃ to 150℃) can be divided into eight temperature intervals: T0 (-40℃ to 0℃), T1 (0℃ to 40℃), T2 (40℃ to 60℃), T3 (60℃ to 75℃), ..., T8 (140℃ to 150℃). It can be seen that the higher the temperature, the narrower the temperature intervals. Furthermore, each temperature interval corresponds to a reference voltage Vref; for example, T0 corresponds to Vref0, T1 to Vref1, ..., T8 to Vref8. Generally, for each temperature range T, the voltage change corresponding to temperature variation is between 0 and 0.5V. However, with the corresponding reference voltage Vref, and by adding a linearity circuit, the voltage change can be amplified to 0–3.3V. This not only improves accuracy but also solves the problem of high AD resolution requirements. When the temperature changes, by continuously switching the reference voltage Vref, the MCU can quickly match the reference voltage Vref corresponding to the current temperature and send it to the linearity circuit. This allows the MCU to accurately generate the corresponding temperature value based on the amplified electrical signal from the linearity circuit, thus ensuring accuracy.

[0067] In this embodiment, the temperature acquisition and control system includes an NTC temperature sensor, an enhanced linearity circuit, and an MCU. The NTC temperature sensor is connected to the first input terminal of the enhanced linearity circuit, which converts the acquired temperature signal into an electrical signal and transmits the electrical signal to the enhanced linearity circuit. The output terminal of the enhanced linearity circuit is connected to the analog signal input terminal of the MCU, and the second input terminal of the enhanced linearity circuit is connected to the analog signal output terminal of the MCU. It receives the reference voltage transmitted by the MCU, amplifies the electrical signal according to the reference voltage, and transmits the amplified electrical signal to the MCU. The MCU receives the amplified electrical signal and converts it into a corresponding temperature value. It matches the corresponding reference voltage according to the temperature range in which the temperature value is located and sends the reference voltage to the enhanced linearity circuit. The MCU pre-divides the temperature acquisition range of the NTC temperature sensor into multiple temperature ranges, each with a corresponding reference voltage. The width of each temperature range is negatively correlated with the temperature within the corresponding temperature range. Therefore, the above solution pre-divides the temperature acquisition range of the NTC temperature sensor into multiple temperature intervals and sets a corresponding reference voltage for each temperature interval. As the temperature changes, it continuously switches and quickly matches the corresponding reference voltage based on the temperature interval in which the current temperature is located. This allows the enhanced linearity circuit to reasonably amplify the electrical signal representing the current temperature according to the corresponding reference voltage, so that the MCU can accurately generate the corresponding temperature value based on the amplified electrical signal. This ensures the accuracy of temperature acquisition and avoids the influence of the nonlinear characteristics of the NTC temperature sensor on temperature acquisition.

[0068] Figure 2 This is a schematic diagram of an enhanced linearity circuit provided in an embodiment of this application. Based on the above embodiments, in some embodiments, such as... Figure 2 As shown, the linearity enhancement circuit 11 includes: a first resistor R1, a second resistor R2, a third resistor R3, a fourth resistor R4, a first capacitor C1, a second capacitor C2, and a first operational amplifier U1;

[0069] The first terminal of the first resistor R1 is connected to the first terminal of the first capacitor C1 and the non-inverting input terminal of the first operational amplifier U1; the second terminals of the first resistor R1 and the first capacitor C1 are both grounded; the first terminal of the second resistor R2 is connected to the first terminal of the third resistor R3, the first terminal of the second capacitor C2 and the inverting input terminal of the first operational amplifier U1; the second terminals of the third resistor R3 and the second terminals of the second capacitor C2 are both connected to the output terminal of the first operational amplifier U1 and the first terminal of the fourth resistor R4.

[0070] In this circuit, the first end of the first resistor R1 serves as the first input terminal of the linearity enhancement circuit, the second end of the second resistor R2 serves as the second input terminal of the linearity enhancement circuit, and the second end of the fourth resistor R4 serves as the output terminal of the linearity enhancement circuit.

[0071] In practical implementation, the NTC temperature sensor converts the detected temperature signal into an electrical signal and transmits it to the first input terminal of the linearity enhancement circuit. The signal first passes through the filtering circuit of the linearity enhancement circuit. This filtering circuit is essentially a bypass filter capacitor C1, which filters out interference signals before sending the signal to the non-inverting input terminal of the first operational amplifier U1. The reference voltage Vref, from the MCU, combined with the filtered electrical signal, causes the first operational amplifier U1 to output an amplified voltage value AVout. This voltage value is then sent to the analog signal input terminal of the MCU. Further, the analog-to-digital converter (ADC) within the MCU converts this voltage value into an AD data value, which is then converted into the corresponding temperature value based on a formula. In this way, a temperature signal is converted into temperature data.

[0072] Figure 3 This is a schematic diagram of another temperature acquisition and control system provided in an embodiment of this application. Based on the above embodiments, in some embodiments, such as... Figure 3 As shown, the system also includes: an enhanced drive circuit 13;

[0073] The input terminal of the enhancement drive circuit is connected to the analog signal output terminal of the MCU, and the output terminal of the enhancement drive circuit is connected to the second input terminal of the enhancement linearity circuit. It is used to receive and amplify the reference voltage output by the MCU, and transmit the amplified reference voltage to the enhancement linearity circuit.

[0074] In practical implementations, the built-in digital-to-analog (DA) drive capability of the MCU may be insufficient. To better provide the reference voltage Vref for the enhanced linearity circuit, this embodiment also includes an enhanced drive circuit.

[0075] It is understood that the enhancement drive circuit can amplify the reference voltage Vref output by the MCU and transmit the amplified reference voltage Vref to the second input terminal of the enhancement linearity circuit. This embodiment does not limit the specific circuit structure of the enhancement drive circuit; it depends on the specific implementation.

[0076] Figure 4 This is a schematic diagram of an enhanced driving circuit provided in an embodiment of this application. In some embodiments, such as Figure 4 As shown, the enhanced drive circuit includes: a fifth resistor R5, a third capacitor C3, and a second operational amplifier U2;

[0077] The inverting input of the second operational amplifier U2 is connected to the first terminal of the fifth resistor R5 and the first terminal of the third capacitor C3; the second terminal of the fifth resistor R5 and the second terminal of the third capacitor C3 are both connected to the output terminal of the second operational amplifier U2.

[0078] In this circuit, the non-inverting input of the second operational amplifier U2 serves as the input of the enhancement drive circuit, and the output of the second operational amplifier U2 serves as the output of the enhancement drive circuit.

[0079] Understandably, in order to reduce the load requirements of the MCU's DA output drive capability, when there are multiple linearity enhancement circuits, the number of corresponding enhanced drive circuits can also be set to multiple.

[0080] Based on the above embodiments, in some embodiments, there are multiple NTC temperature sensors, which are respectively disposed in each module of the in vitro diagnostic device;

[0081] The modules of the in vitro diagnostic equipment include at least a reagent cooling module, an incubation heating module, a DC pump valve module, and an ambient temperature detection module.

[0082] Figure 5 This is a schematic diagram of an in vitro diagnostic device provided in an embodiment of this application. It can be understood that, in order to acquire temperature data from each module in the in vitro diagnostic device, multiple NTC temperature sensors are used, and each sensor is disposed in one of the modules of the in vitro diagnostic device. For example... Figure 5 As shown, the modules of the in vitro diagnostic equipment include at least a reagent cooling module, an incubation heating module, a DC pump valve module, and an ambient temperature detection module.

[0083] The reagent cooling module provides a near-zero temperature environment for reagent storage; the incubation heating module provides a near-human temperature environment for reagent reaction; the DC pump valve module drains the condensate generated during the reagent cooling module's operation; and the ambient temperature detection module monitors the ambient temperature of the equipment. It is understood that all of these modules are controlled by a temperature acquisition and control system. This temperature acquisition and control system is controlled by a host computer, which can send control commands to the temperature acquisition and control system to control each module.

[0084] Based on the above embodiments, in some embodiments, such as Figure 3 As shown, the system also includes: a level conversion circuit 14 and a driving circuit 15;

[0085] The input of the level conversion circuit is connected to the driver terminal of the MCU, and the output of the level conversion circuit is connected to the control terminal of the driver circuit. It is used to receive the PWM pulse signal generated by the MCU according to the temperature value and send the PWM pulse signal to the driver circuit.

[0086] The drive circuit connects to the module and is used to drive the module to operate.

[0087] It is understandable that the temperature acquisition and control system can not only acquire the temperature of each module, but also control each module. In this embodiment, the control module mainly consists of a level conversion circuit and a drive circuit, and the drive control is mainly achieved through PWM pulse signals.

[0088] Specifically, the PWM pulse signal generated by the MCU is used to control the level conversion circuit. In this embodiment, an optocoupler can be used as the level conversion circuit. Since the module load is usually powered by 24V DC, while the MCU is powered by 3.3V, a level conversion circuit is needed to convert the 3.3V voltage to 24V. The driving circuit is implemented using a MOSFET; the drain of the MOSFET is powered by 24V, and the output signal of the level conversion circuit controls the gate of the MOSFET. When the level is high, the MOSFET is turned on, and 24V forms a path through the module load, causing the module load to start working; when the level is low, the MOSFET is turned off, the power supply path to the module load is disconnected, and the module load stops working. In this way, the temperature acquisition and control system realizes the operation control of each module in the in vitro diagnostic equipment.

[0089] The following describes the control of each module by the temperature acquisition and control system:

[0090] (1) The reagent cooling module 20 consists of a cooling chamber 201, a semiconductor cooling module 202 and an NTC temperature sensor 10. Figure 6 This is a schematic diagram of a reagent cooling module provided in an embodiment of this application. Figure 6As shown, the refrigeration chamber is a sealed container. The NTC temperature sensor is located inside the chamber. The semiconductor refrigeration module is installed at the bottom of the chamber, with the cold surface inside the chamber and the hot surface outside the chamber. The NTC temperature sensor is connected to the enhanced linearity circuit, and the semiconductor refrigeration module is connected to the drive circuit. After setting the target temperature ColdT0, lower limit threshold ColdT0L, and upper limit threshold ColdT0H on the host computer, the drive circuit drives the semiconductor refrigeration module to operate. When the MCU detects that the current temperature ColdT1 of the refrigeration chamber > ColdT0 + ColdT0H, the MCU will activate the refrigeration function and adjust the semiconductor refrigeration module by outputting a PWM pulse signal at 100%; when the MCU detects that the current temperature ColdT1 of the refrigeration chamber < ColdT0 - ColdT0L, the MCU will turn off the refrigeration function until ColdT1 > ColdT0 - ColdT0L is satisfied; when the MCU detects that the refrigeration chamber is at ColdT0 - ColdT0L ≤ ColdT1 ≤ ColdT0 + ColdT0H, it will adjust the duty cycle of the output according to the magnitude of the difference between ColdT1 - ColdT0, and finally stabilize the temperature of the refrigeration chamber within ColdT0 ± 0.3°C.

[0091] (2) The incubation heating module 21 consists of an incubation plate 211, a heating film 212, and an NTC temperature sensor 10. Figure 7 It is a schematic diagram of an incubation heating module provided by an embodiment of the present application. As Figure 7 shown, the incubation plate is located at the top of the incubation heating module. The probe of the NTC temperature sensor is inserted and installed on the incubation plate, and the heating film is closely attached to the bottom of the incubation plate. The NTC temperature sensor is connected to the enhanced linearity circuit, and the heating film is connected to the drive circuit. After setting the target temperature HeatT0, lower limit threshold HeatT0L, and upper limit threshold HeatT0H on the host computer, the drive circuit drives the heating film to operate. When the MCU detects that the current temperature HeatT1 of the incubation plate < HeatT0 - HeatT0L, the MCU will activate the heating function and adjust the heating film by outputting a PWM pulse signal at 100%; if the MCU detects that the current temperature HeatT1 of the incubation plate > HeatT0 + HeatT0H, the MCU will turn off the heating function until HeatT1 < HeatT0 - HeatT0L is satisfied; when the MCU detects that the current temperature HeatT1 of the incubation plate is at HeatT0 - HeatT0L ≤ HeatT1 ≤ HeatT0 + HeatT0H, it will adjust the duty cycle of the output according to the magnitude of the difference between HeatT1 - HeatT0, and finally stabilize the temperature of the incubation plate within HeatT0 ± 0.3°C.

[0092] (3) The DC pump valve module 22 consists of a DC pump 221 and a pipeline 222. Figure 8This is a schematic diagram of a DC pump-valve module provided in an embodiment of this application. Figure 8 As shown, the piping is located at the bottom of the cooling chamber. The power supply control terminal of the DC pump is connected to the drive circuit. When the reagent cooling membrane block is working, the MCU controls the DC pump to operate periodically, draining condensate from the cooling chamber. Normally, the MCU is set to drain water once every 8 hours by default; this time period can be set via a host computer.

[0093] (4) The environmental monitoring module consists of an NTC temperature sensor. The NTC temperature sensor is connected to the linearity enhancement module. When the in vitro diagnostic equipment is in certain harsh environments, the ambient temperature is used to provide compensation. In low-temperature environments, the incubation heating module is prone to temperatures falling below the target temperature. In this case, the compensation function is activated to raise the target temperature so that the actual temperature meets the reaction conditions of the reagent. In high-temperature environments, the reagent cooling module is prone to temperatures exceeding the target temperature. In this case, the compensation function is activated to lower the target temperature so that the reagent meets the storage requirements.

[0094] Based on the above embodiments, in some embodiments, such as Figure 3 As shown, the system also includes: a CAN transceiver 16 and a CAN interface circuit 17;

[0095] One end of the CAN transceiver is connected to the MCU, and the other end of the CAN transceiver is connected to one end of the CAN interface circuit. It is used to receive the temperature value transmitted by the MCU, convert the temperature value into CANH signal and CANL signal and send it to the CAN interface circuit.

[0096] The other end of the CAN interface circuit is connected to the host computer to transmit CANH and CANL signals to the host computer and receive control commands transmitted by the host computer, so as to transmit the control commands to the MCU through the CAN transceiver.

[0097] Specifically, the temperature acquisition and control system interacts with the host computer via a Controller Area Network (CAN) transceiver and CAN interface circuit. The MCU's temperature data is converted into CANH and CANL signals via the CAN transceiver and transmitted to the host computer through the CAN interface circuit. The host computer then sends control commands to the MCU via the CAN interface circuit and CAN transceiver.

[0098] Based on the above embodiments, in some embodiments, such as Figure 5 As shown, the temperature acquisition and control system 9 is connected to the power supply module 18;

[0099] The first power supply terminal of the power supply module is connected to the power supply terminal of the MCU to supply power to the MCU; the second power supply terminal of the power supply module is connected to the power supply terminal of the host computer 19 to supply power to the host computer.

[0100] Understandably, the power supply module primarily supplies power to the temperature acquisition and control system. Figure 9 This is a schematic diagram of a power supply module provided in an embodiment of this application. (See diagram below.) Figure 9 As shown, the power supply module includes: a switching power supply 181 and a power distribution board 182; the input terminal of the switching power supply is connected to the mains power, and the output terminal of the switching power supply is connected to the power distribution board to convert the mains power into a preset voltage; the first output terminal of the power distribution board is connected to the power supply terminal of the MCU as the first power supply terminal of the power supply module, and the second output terminal of the power distribution board is connected to the power supply terminal of the host computer as the second power supply terminal of the power supply module, to supply power to the MCU and the host computer respectively according to the preset voltage.

[0101] Figure 10 This is a flowchart illustrating a temperature acquisition method provided in an embodiment of this application. The method is applied to a temperature acquisition and control system including an NTC temperature sensor, an enhanced linearity circuit, and an MCU; such as... Figure 10 As shown, the method includes:

[0102] S10: Divide the temperature acquisition range of the NTC temperature sensor into multiple temperature ranges.

[0103] S11: Set the corresponding reference voltage for each temperature range.

[0104] Among them, the width of each temperature range is negatively correlated with the temperature within the corresponding temperature range.

[0105] S12: Monitors the electrical signal transmitted by the enhanced linearity circuit.

[0106] The electrical signal is the signal converted from the collected temperature signal by the NTC temperature sensor and amplified by the linearity enhancement circuit based on the reference voltage.

[0107] S13: When an electrical signal is received, convert the electrical signal into the corresponding temperature value.

[0108] S14: Match the corresponding reference voltage according to the temperature range where the temperature value is located, and send the reference voltage to the enhanced linearity circuit.

[0109] Understandably, as higher temperatures result in smaller resistance and voltage changes for the NTC temperature sensor, the MCU pre-divides the NTC temperature sensor's acquisition range (e.g., -40℃ to 150℃) into multiple temperature intervals and sets a corresponding reference voltage for each interval. The width of each temperature interval is negatively correlated with the temperature within that interval. It's important to note that this embodiment does not limit the specific process of dividing the temperature intervals. For example, the temperature range (-40℃ to 150℃) can be divided into eight intervals: T0 (-40℃ to 0℃), T1 (0℃ to 40℃), T2 (40℃ to 60℃), T3 (60℃ to 75℃), ..., T8 (140℃ to 150℃). It can be seen that the higher the temperature, the narrower the temperature intervals become. Furthermore, each temperature range corresponds to a reference voltage Vref; for example, T0 corresponds to Vref0, T1 corresponds to Vref1, ..., T8 corresponds to Vref8.

[0110] Meanwhile, this application employs a formula-based method to improve the accuracy of resistance changes corresponding to unit temperature changes: The resistance value of the NTC temperature sensor is measured within its temperature acquisition range (e.g., -40℃ to 150℃), and then a resistance-temperature change curve is generated; based on the curve, the corresponding resistance-temperature formula is obtained. Unlike the resistance lookup table method, the formula method involves a continuous change in resistance with temperature; for each temperature value, the corresponding temperature value can be calculated using the formula. It should be noted that the resistance-temperature correspondence differs between different series and manufacturers of NTC temperature sensors, requiring the calculation of the corresponding formula based on the specific type. After obtaining the temperature-resistance correspondence curve of the NTC temperature sensor, the issues of nonlinearity and high AD acquisition resolution requirements are further addressed through an enhanced linearity circuit. For example, based on the obtained formula, a unique and accurate temperature conversion value can be obtained for each resistor, thereby improving the accuracy of resistance changes corresponding to unit temperature changes; that is, for every 0.01℃ change, the corresponding resistance change is precise.

[0111] Generally, for each temperature range T, the voltage change corresponding to temperature variation is between 0 and 0.5V. However, based on the above settings, and with the corresponding reference voltage Vref, by adding a linearity circuit, the voltage change can be amplified to 0–3.3V. This not only improves accuracy but also solves the problem of high AD resolution requirements. When the temperature changes, by continuously switching the reference voltage Vref, the MCU can quickly match the reference voltage Vref corresponding to the current temperature and send it to the linearity circuit. This allows the MCU to accurately generate the corresponding temperature value based on the amplified electrical signal from the linearity circuit, thus ensuring accuracy.

[0112] In this embodiment, the temperature acquisition range of the NTC temperature sensor is divided into multiple temperature intervals. A corresponding reference voltage is set for each temperature interval. The width of each temperature interval is negatively correlated with the temperature within that interval. The electrical signal transmitted by the enhanced linearity circuit is monitored. This electrical signal is the result of the NTC temperature sensor converting the acquired temperature signal, which is then amplified by the enhanced linearity circuit based on the reference voltage. When an electrical signal is received, it is converted into a corresponding temperature value. The corresponding reference voltage is matched according to the temperature interval where the temperature value is located, and the reference voltage is sent to the enhanced linearity circuit. Therefore, the above solution pre-divides the temperature acquisition range of the NTC temperature sensor into multiple temperature intervals and sets a corresponding reference voltage for each interval. During temperature changes, it continuously switches and quickly matches the corresponding reference voltage based on the current temperature interval. This allows the enhanced linearity circuit to reasonably amplify the electrical signal representing the current temperature according to the corresponding reference voltage, enabling the MCU to accurately generate the corresponding temperature value based on the amplified electrical signal. This ensures the accuracy of temperature acquisition and avoids the influence of the nonlinear characteristics of the NTC temperature sensor on temperature acquisition.

[0113] The temperature acquisition and control system and temperature acquisition method provided in this application have been described in detail above. The various embodiments in the specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple, and relevant parts can be referred to in the method section. It should be noted that those skilled in the art can make several improvements and modifications to this application without departing from the principles of this application, and these improvements and modifications also fall within the protection scope of the claims of this application.

[0114] It should also be noted that, in this specification, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

Claims

1. A temperature acquisition and control system, characterized in that, include: NTC temperature sensor (10), linearity enhancement circuit (11), and MCU (12); The NTC temperature sensor (10) is connected to the first input terminal of the enhanced linearity circuit (11) to convert the collected temperature signal into an electrical signal and transmit the electrical signal to the enhanced linearity circuit (11). The output terminal of the enhanced linearity circuit (11) is connected to the analog signal input terminal of the MCU (12), and the second input terminal of the enhanced linearity circuit (11) is connected to the analog signal output terminal of the MCU (12). It is used to receive the reference voltage transmitted by the MCU (12), amplify the electrical signal according to the reference voltage, and transmit the amplified electrical signal to the MCU (12). The MCU (12) is used to receive the amplified electrical signal and convert the amplified electrical signal into a corresponding temperature value; match the corresponding reference voltage according to the temperature range in which the temperature value is located, and send the reference voltage to the enhanced linearity circuit (11); The MCU (12) pre-divides the temperature acquisition range of the NTC temperature sensor (10) into multiple temperature intervals, and each temperature interval has a corresponding reference voltage; the interval width of each temperature interval is negatively correlated with the temperature within the corresponding temperature interval.

2. The temperature acquisition and control system according to claim 1, characterized in that, The enhanced linearity circuit (11) includes: a first resistor, a second resistor, a third resistor, a fourth resistor, a first capacitor, a second capacitor, and a first operational amplifier; The first end of the first resistor is connected to the first end of the first capacitor and the non-inverting input of the first operational amplifier; the second end of the first resistor and the second end of the first capacitor are both grounded; the first end of the second resistor is connected to the first end of the third resistor, the first end of the second capacitor, and the inverting input of the first operational amplifier; the second end of the third resistor and the second end of the second capacitor are both connected to the output of the first operational amplifier and the first end of the fourth resistor; Wherein, the first end of the first resistor serves as the first input terminal of the enhanced linearity circuit (11), the second end of the second resistor serves as the second input terminal of the enhanced linearity circuit (11), and the second end of the fourth resistor serves as the output terminal of the enhanced linearity circuit (11).

3. The temperature acquisition and control system according to claim 1, characterized in that, It also includes: enhanced drive circuit (13); The input terminal of the enhanced drive circuit (13) is connected to the analog signal output terminal of the MCU (12), and the output terminal of the enhanced drive circuit (13) is connected to the second input terminal of the enhanced linearity circuit (11). It is used to receive and amplify the reference voltage output by the MCU (12), and transmit the amplified reference voltage to the enhanced linearity circuit (11).

4. The temperature acquisition and control system according to claim 3, characterized in that, The enhanced drive circuit (13) includes: a fifth resistor, a third capacitor, and a second operational amplifier; The inverting input terminal of the second operational amplifier is connected to the first terminal of the fifth resistor and the first terminal of the third capacitor; the second terminal of the fifth resistor and the second terminal of the third capacitor are both connected to the output terminal of the second operational amplifier. The non-inverting input of the second operational amplifier serves as the input of the enhancement drive circuit (13), and the output of the second operational amplifier serves as the output of the enhancement drive circuit (13).

5. The temperature acquisition and control system according to claim 1, characterized in that, The number of NTC temperature sensors (10) is multiple, and they are respectively installed in each module of the in vitro diagnostic device; The in vitro diagnostic device includes at least a reagent cooling module (20), an incubation heating module (21), a DC pump valve module (22), and an ambient temperature detection module (23).

6. The temperature acquisition and control system according to claim 5, characterized in that, Also includes: Level conversion circuit (14) and driving circuit (15); The input terminal of the level conversion circuit (14) is connected to the driving terminal of the MCU (12), and the output terminal of the level conversion circuit (14) is connected to the control terminal of the driving circuit (15). It is used to receive the PWM pulse signal generated by the MCU (12) according to the temperature value and send the PWM pulse signal to the driving circuit (15). The driving circuit (15) is connected to the module and is used to drive the module to run.

7. The temperature acquisition and control system according to claim 6, characterized in that, Also includes: CAN transceiver and CAN interface circuit; One end of the CAN transceiver is connected to the MCU (12), and the other end of the CAN transceiver is connected to one end of the CAN interface circuit. It is used to receive the temperature value transmitted by the MCU (12), convert the temperature value into CANH signal and CANL signal and send it to the CAN interface circuit. The other end of the CAN interface circuit is connected to the host computer (19) for transmitting the CANH signal and the CANL signal to the host computer (19) and receiving the control commands transmitted by the host computer (19) so as to transmit the control commands to the MCU (12) through the CAN transceiver.

8. The temperature acquisition and control system according to claim 7, characterized in that, The temperature acquisition and control system is connected to the power supply module (18); The first power supply terminal of the power supply module (18) is connected to the power supply terminal of the MCU (12) and is used to supply power to the MCU (12); the second power supply terminal of the power supply module (18) is connected to the power supply terminal of the host computer (19) and is used to supply power to the host computer (19).

9. The temperature acquisition and control system according to claim 8, characterized in that, The power supply module (18) includes: a switching power supply (181) and a power distribution board (182); The input terminal of the switching power supply (181) is connected to the mains power, and the output terminal of the switching power supply (181) is connected to the power distribution board (182) to convert the mains power into a preset voltage. The first output terminal of the power distribution board (182) is connected to the power supply terminal of the MCU (12) as the first power supply terminal of the power supply module (18), and the second output terminal of the power distribution board (182) is connected to the power supply terminal of the host computer (19) as the second power supply terminal of the power supply module (18), and is used to supply power to the MCU (12) and the host computer (19) respectively according to the preset voltage.

10. A temperature acquisition method, characterized in that, Applied to a temperature acquisition and control system including an NTC temperature sensor, enhanced linearity circuitry, and an MCU; the method includes: The temperature acquisition range of the NTC temperature sensor is divided into multiple temperature intervals; A corresponding reference voltage is set for each of the temperature ranges; wherein the width of each temperature range is negatively correlated with the temperature within the corresponding temperature range. The electrical signal transmitted by the enhanced linearity circuit is monitored; wherein the electrical signal is the signal converted by the NTC temperature sensor based on the collected temperature signal and amplified by the enhanced linearity circuit based on the reference voltage; When the electrical signal is received, it is converted into a corresponding temperature value; The reference voltage is matched according to the temperature range in which the temperature value is located, and the reference voltage is sent to the enhanced linearity circuit.

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